NLAST44599 [ONSEMI]
Low Voltage Single Supply Dual DPDT Analog Switch; 低电压单电源双DPDT模拟开关
| 型号： | NLAST44599 |
| 厂家： | 
ONSEMI |
| 描述： | Low Voltage Single Supply Dual DPDT Analog Switch |
| 文件： | 总12页 (文件大小：94K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
NLAST44599
Low Voltage Single Supply
Dual DPDT Analog Switch
The NLAST44599 is an advanced CMOS dual–independent
DPDT (double pole–double throw) analog switch, fabricated with
silicon gate CMOS technology. It achieves high–speed propagation
delays and low ON resistances while maintaining CMOS low–power
dissipation. This DPDT controls analog and digital voltages that may
http://onsemi.com
MARKING
vary across the full power–supply range (from V to GND).
CC
The device has been designed so the ON resistance (R ) is much
DIAGRAMS
ON
lower and more linear over input voltage than R of typical CMOS
ON
1
analog switches.
16
The channel–select input structure provides protection when
voltages between 0 V and 5.5 V are applied, regardless of the supply
voltage. This input structure helps prevent device destruction caused
by supply voltage – input/output voltage mismatch, battery backup,
hot insertion, etc.
T
ALYW
QFN–16
MN SUFFIX
CASE 485G
(TOP VIEW)
The NLAST44599 can also be used as a quad 2–to–1 multiplexer–
demultiplexer analog switch with two Select pins that each controls
two multiplexer–demultiplexers.
16
9
• Select Pins Compatible with TTL Levels
• Channel Select Input Over–Voltage Tolerant to 5.5 V
• Fast Switching and Propagation Speeds
16
NLAT
4459
ALYW
1
• Break–Before–Make Circuitry
TSSOP–16
DT SUFFIX
CASE 948F
1
• Low Power Dissipation: I = 2 m A (Max) at T = 25_C
CC
A
8
• Diode Protection Provided on Channel Select Input
• Improved Linearity and Lower ON Resistance over Input Voltage
• Latch–up Performance Exceeds 300 mA
A
L
Y
W
= Assembly Location
= Wafer Lot
= Year
• ESD Performance: HBM > 2000 V; MM > 200 V
• Chip Complexity: 158 FETs
= Work Week
ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 10 of this data sheet.
Semiconductor Components Industries, LLC, 2002
1
Publication Order Number:
August, 2002 – Rev. 5
NLAST44599/D
NLAST44599
QFN–16 PACKAGE
FUNCTION TABLE
Select AB
Select XY ON Channel
or CD
ON Channel
L
NC to COM
NO to COM
L
NC to COM
NO to COM
16
15
14
13
H
H
NC A
COM D
1
NO D
SAB
0
See TSSOP–16
Switch Configuration
SCD
NO B
0
NC C
COM B
1
5
6
7
8
U
SELECT AB
COM A
X1
0
NO A
0
U
U
U
U
U
U
1
2
NC A
NO B
1
0/1
0
TSSOP–16 PACKAGE
3
0
COM B
2/3
X1
NC B
1
SELECT CD
NO C
0
NO A
1
2
3
16
V
0
CC
U
U
U
U
1
2
NC C
NO D
1
COM C
COM D
0/1
2/3
COM A
15 NC D1
0
U
3
NC D
1
14
13
12
11
10
9
COM D
NC A
1
Figure 2. IEC Logic Symbol
ELECT AB
4
5
6
7
8
NO D0
NO B
SELECT CD
0
COM B
NC C
1
NC B
1
COM C
GND
NO C
0
Figure 1. Logic Diagram
http://onsemi.com
2
NLAST44599
MAXIMUM RATINGS
Symbol
Parameter
Value
Unit
V
V
V
V
Positive DC Supply Voltage
*0.5 to )7.0
CC
IS
Analog Input Voltage (V or V
)
*0.5 ≤ V ≤ V )0.5
V
NO
COM
IS
CC
Digital Select Input Voltage
*0.5 ≤ V ≤ )7.0
V
IN
I
I
DC Current, Into or Out of Any Pin
Power Dissipation in Still Air
Storage Temperature Range
$50
mA
mW
_C
_C
_C
IK
P
T
TSSOP–16
450
*65 to )150
260
D
STG
T
T
Lead Temperature, 1 mm from Case for 10 Seconds
Junction Temperature Under Bias
Moisture Sensitivity
L
J
150
MSL
Level 1
F
R
Flammability Rating
Oxygen Index: 30% – 35%
UL–94–VO (0.125 in)
V
ESD
ESD Withstand Voltage
Human Body Model (Note 1)
Machine Model (Note 2)
2000
200
V
Charged Device Model (Note 3)
1000
I
Latch–Up Performance
Thermal Resistance
Above V and Below GND at 125_C (Note 4)
$300
mA
LATCH–UP
CC
q
TSSOP–16
164
_C/W
JA
Absolute maximum continuous ratings are those values beyond which damage to the device may occur. Extended exposure to these conditions
or conditions beyond those indicated may adversely affect device reliability. Functional operation under absolute–maximum–rated conditions is
not implied. Functional operation should be restricted to the Recommended Operating Conditions.
1. Tested to EIA/JESD22–A114–A.
2. Tested to EIA/JESD22–A115–A.
3. Tested to JESD22–C101–A.
4. Tested to EIA/JESD78.
RECOMMENDED OPERATING CONDITIONS
Symbol
Parameter
Min
2.0
Max
5.5
Unit
V
V
DC Supply Voltage
CC
IN
V
V
Digital Select Input Voltage
Analog Input Voltage (NC, NO, COM)
Operating Temperature Range
Input Rise or Fall Time, SELECT
GND
GND
*55
5.5
V
V
CC
V
IS
T
A
)125
°C
ns/V
t , t
V
CC
V
CC
= 3.3 V $ 0.3 V
= 5.0 V $ 0.5 V
0
0
100
20
r
f
DEVICE JUNCTION TEMPERATURE VERSUS
TIME TO 0.1% BOND FAILURES
Junction
Temperature °C
FAILURE RATE OF PLASTIC = CERAMIC
UNTIL INTERMETALLICS OCCUR
Time, Hours
1,032,200
419,300
178,700
79,600
Time, Years
80
117.8
47.9
20.4
9.4
90
100
110
120
130
140
1
37,000
4.2
1
10
100
1000
17,800
2.0
TIME, YEARS
8,900
1.0
Figure 3. Failure Rate vs. Time Junction Temperature
http://onsemi.com
3
NLAST44599
DC CHARACTERISTICS – Digital Section (Voltages Referenced to GND)
Guaranteed Limit
Symbol
Parameter
Condition
V
*55_C to 25_C t85_C t125_C Unit
CC
V
Minimum High–Level Input
Voltage, Select Inputs
3.0
4.5
5.5
2.0
2.0
2.0
2.0
2.0
2.0
2.0
2.0
2.0
V
IH
IL
V
Maximum Low–Level Input
Voltage, Select Inputs
3.0
4.5
5.5
0.5
0.8
0.8
0.5
0.8
0.8
0.5
0.8
0.8
V
I
Maximum Input Leakage
Current, Select Inputs
V
= 5.5 V or GND
= 5.5 V or GND
IN
5.5
$0.2
$2.0
$2.0
m
A
IN
IN
I
I
Power Off Leakage Current
V
0
$10
$10
$10
m A
m A
OFF
Maximum Quiescent Supply Select and V = V or GND
5.5
4.0
4.0
8.0
CC
IS
CC
Current
DC ELECTRICAL CHARACTERISTICS – Analog Section
Guaranteed Limit
Symbol
Parameter
Condition
V
*55_C to 25_C t85_C t125_C Unit
CC
R
ON
Maximum “ON” Resistance
(Figures 17 – 23)
V
V
= V or V
2.5
3.0
4.5
5.5
85
45
30
25
95
50
35
30
105
W
IN
IL
IH
= GND to V
55
IS
CC
I
IN
I v 10.0 mA
40
35
R
(ON)
ON Resistance Flatness
(Figures 17 – 23)
V
= V or V
IH
4.5
4
4
5
W
FLAT
IN
IL
I
IN
I v10.0 mA
V
IS
= 1 V, 2 V, 3.5 V
I
I
NO or NC Off Leakage
Current (Figure 9)
V
V
= V or V
IH
5.5
5.5
1
1
10
10
100
100
nA
nA
NC(OFF)
IN
IL
or V = 1.0 V 4.5 V
COM
NO(OFF)
NO
NC
I
COM ON Leakage Current
(Figure 9)
V
V
V
V
= V or V
IL IH
COM(ON)
IN
1.0 V or 4.5 V with V floating or
NO
NO
COM
NC
1.0 V or 4.5 V with V floating
NO
= 1.0 V or 4.5 V
http://onsemi.com
4
NLAST44599
AC ELECTRICAL CHARACTERISTICS (Input t = t = 3.0 ns)
r
f
Guaranteed Maximum Limit
V
V
*55_C to 25_C
t85_C
t125_C
CC
IS
Symbol
Parameter
Turn–On Time
Test Conditions
R = 300 WC, = 35 pF
(V) (V)
Min Typ* Max Min Max Min Max Unit
t
t
t
2.5 2.0
3.0 2.0
4.5 3.0
5.5 3.0
5
5
2
2
23
16
11
9
35
24
16
14
5
5
2
2
38
27
19
17
5
5
2
2
41
30
22
20
ns
ns
ns
ON
L
L
(Figures 12 and 13)
(Figures 5 and 6)
Turn–Off Time
R = 300 WC, = 35 pF
2.5 2.0
3.0 2.0
4.5 3.0
5.5 3.0
1
1
1
1
7
5
4
3
12
10
6
1
1
1
1
15
13
9
1
1
1
1
18
16
12
11
OFF
BBM
L
L
(Figures 12 and 13)
(Figures 5 and 6)
5
8
Minimum Break–Before–Make
Time
V
IS
= 3.0 V (Figure 4)
2.5 2.0
3.0 2.0
4.5 3.0
5.5 3.0
1
1
1
1
12
11
6
1
1
1
1
1
1
1
1
R = 300 WC, = 35 pF
L
L
5
*Typical Characteristics are at 25_C.
Typical @ 25, VCC = 5.0 V
C
C
C
C
Maximum Input Capacitance, Select Input
Analog I/O (Switch Off)
8
pF
IN
or C
10
10
20
NO
NC
Common I/O (Switch Off)
COM
(ON)
Feedthrough (Switch On)
ADDITIONAL APPLICATION CHARACTERISTICS (Voltages Referenced to GND Unless Noted)
V
CC
Typical
Symbol
BW
Parameter
Condition
V
25_C
145
170
175
Unit
Maximum On–Channel *3 dB Bandwidth or
Minimum Frequency Response
V
V
= 0 dBm
3.0
4.5
5.5
MHz
IN
centered between V and GND
IN
CC
(Figure 11)
(Figure 7)
V
Maximum Feedthrough On Loss
V
V
= 0 dBm @ 100 kHz to 50 MHz
3.0
4.5
5.5
–3
–3
–3
dB
dB
pC
ONL
ISO
IN
centered between V and GND
IN
CC
(Figure 7)
V
Off–Channel Isolation
(Figure 10)
f = 100 kHz; V = 1 V RMS
3.0
4.5
5.5
–93
–93
–93
IS
V
IN
centered between V and GND
CC
(Figure 7)
Q
Charge Injection Select Input to Common I/O
(Figure 15)
V
V
to GND, F = 20 kHz
3.0
5.5
1.5
3.0
IN = CC
IS
t = t = 3 ns
r
f
R
IS
= 0 W, C = 1000 pF
L
Q = C * DV
(Figure 8)
L
OUT
THD
VCT
Total Harmonic Distortion
THD ) Noise
F
= 20 Hz to 100 kHz, R = Rgen = 600 W,
%
IS
L
L
C = 50 pF
V
= 5.0 V sine wave
5.5
0.1
IS
PP
(Figure 14)
Channel to Channel Crosstalk
f = 100 kHz; V = 1 V RMS
dB
IS
V
centered between V and GND
5.5
3.0
–90
–90
IN
CC
(Figure 7)
http://onsemi.com
5
NLAST44599
V
CC
DUT
Input
GND
V
Output
CC
V
OUT
0.1 m F
t
BMM
300 Ω
35 pF
90%
90% of V
OH
Output
Switch Select Pin
GND
Figure 4. tBBM (Time Break–Before–Make)
V
CC
DUT
Input
50%
50%
90%
V
CC
Output
0 V
V
OUT
0.1 m F
V
OH
Open
300 Ω
35 pF
90%
Output
V
OL
Input
t
t
OFF
ON
Figure 5. tON/tOFF
V
CC
V
CC
Input
50%
50%
DUT
0 V
300 Ω
Output
V
OUT
V
OH
Open
35 pF
Output
10%
10%
V
OL
Input
t
t
ON
OFF
Figure 6. tON/tOFF
http://onsemi.com
6
NLAST44599
50 Ω
DUT
Reference
Transmitted
Input
Output
50 Ω Generator
50 Ω
Channel switch control/s test socket is normalized. Off isolation is measured across an off channel. On loss is
the bandwidth of an On switch. V , Bandwidth and V are independent of the input signal direction.
ISO
ONL
V
V
OUT
IN
ǒ Ǔfor V
V
V
= Off Channel Isolation = 20 Log
at 100 kHz
IN
ISO
V
OUT
= On Channel Loss = 20 Log ǒ Ǔfor V
at 100 kHz to 50 MHz
ONL
IN
V
IN
Bandwidth (BW) = the frequency 3 dB below V
ONL
V
CT
= Use V
setup and test to all other switch analog input/outputs terminated with 50 W
ISO
Figure 7. Off Channel Isolation/On Channel Loss (BW)/Crosstalk
(On Channel to Off Channel)/VONL
DUT
V
CC
V
IN
Output
Open
GND
C
L
Output
Off
∆V
OUT
Off
On
V
IN
Figure 8. Charge Injection: (Q)
100
10
1
I
COM(ON)
0.1
0.01
I
COM(OFF)
V
CC
= 5.0 V
85
I
NO(OFF)
0.001
–55
–20
25
70
125
TEMPERATURE (°C)
Figure 9. Switch Leakage vs. Temperature
http://onsemi.com
7
NLAST44599
+15
+10
+5
0
0
–20
–40
–60
–80
–100
1.0
Bandwidth
(ON–RESPONSE)
2.0
3.0
0
PHASE SHIFT
4.0
5.0
6.0
7.0
8.0
–5
Off Isolation
–10
–15
–20
–25
V
CC
= 5.0 V
T = 25_C
A
V
= 5.0 V
CC
9.0
–30
–35
100 300
T = 25°C
A
10.0
0.01
0.1
1
10
0.01
0.1
1
10
100 200
FREQUENCY (MHz)
FREQUENCY (MHz)
Figure 10. Off–Channel Isolation
Figure 11. Typical Bandwidth and Phase Shift
30
25
20
15
10
30
V
CC
= 4.5 V
25
20
15
10
5
t
(ns)
ON
t
ON
t
t
(ns)
3.5
OFF
5
0
OFF
0
–55
2.5
3
4
4.5
5
–40
25
Temperature (°C)
85
125
V
CC
(VOLTS)
Figure 12. tON and tOFF vs. VCC at 255C
Figure 13. tON and tOFF vs. Temp
1
3.0
2.5
2.0
1.5
1.0
0.5
V
V
= 3.0 V
= 3.6 V
INpp
CC
V
CC
= 5 V
0.1
V
INpp
= 5.0 V
= 5.5 V
V
CC
V
CC
= 3 V
0
–0.5
0.01
1
10
FREQUENCY (kHz)
100
0
1
2
3
4
5
V
COM
(V)
Figure 14. Total Harmonic Distortion
Plus Noise vs. Frequency
Figure 15. Charge Injection vs. COM Voltage
http://onsemi.com
8
NLAST44599
100
80
60
40
20
0
100
10
V
= 2.0 V
CC
1
0.1
V
CC
= 2.5 V
0.01
V
= 3.0 V
V
= 3.0 V
CC
CC
V
= 4.0 V
5.0
0.001
0.0001
CC
V
= 5.0 V
V
CC
= 5.5 V
3.0
CC
0.00001
0.0
1.0
2.0
4.0
6.0
–40
–20
0
20
60
80
100
120
Temperature(°C)
V
IS
(VDC)
Figure 16. ICC vs. Temp, VCC = 3 V and 5 V
Figure 17. RON vs. VCC, Temp = 255C
100
90
80
70
60
50
40
30
20
10
0
100
90
80
70
60
50
40
30
20
10
0
125°C
25°C
25°C
–55°C
–55°C
85°C
85°C
0.5
125°C
0.0
1.0
1.5
(VDC)
2.0
2.5
0.0
0.5
1.0
1.5
V (VDC)
IS
2.0
2.5
3.0
V
IS
Figure 18. RON vs Temp, VCC = 2.0 V
Figure 19. RON vs. Temp, VCC = 2.5 V
30
25
20
15
10
5
50
45
40
35
30
25
20
15
10
5
125°C
125°C
85°C
25°C
85°C
25°C
–55°C
–55°C
0.5
0
0.0
0
1.0
1.5
2.0
(VDC)
2.5
3.0
3.5
0.0 0.5 1.0 1.5 2.0
2.5 3.0 3.5 4.0 4.5
(VDC)
V
IS
V
IS
Figure 21. RON vs. Temp, VCC = 4.5 V
Figure 20. RON vs. Temp, VCC = 3.0 V
http://onsemi.com
9
NLAST44599
25
20
15
10
5
25
125°C
20
15
10
5
125°C
25°C
25°C
–55°C
–55°C
85°C
85°C
0
0
0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0
0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5
V
IS
(VDC)
V
IS
(VDC)
Figure 22. RON vs. Temp, VCC = 5.0 V
Figure 23. RON vs. Temp, VCC = 5.5 V
DEVICE ORDERING INFORMATION
Device Nomenclature
Device Order
Number
Circuit
Indicator
Device
Function
Package
Suffix
Tape and Reel
Suffix
Technology
Package Type
QFN
Tape and Reel Size
7–inch/2500 Unit
13–inch/2500 Unit
124 Unit Rail
NLAST44599MNR2
NLAST44599DTR2
NLAST44599MN
NLAST44599DT
NL
NL
NL
NL
AS
AS
AS
AS
44599
44599
44599
44599
MN
DT
MN
DT
R2
R2
TSSOP
QFN
TSSOP
96 Unit Rail
PIN1/PRODUCT ORIENTATION CARRIER TAPE
USER DIRECTION OF FEED
Figure 24.
http://onsemi.com
10
NLAST44599
PACKAGE DIMENSIONS
QFN–16
MN SUFFIX
CASE 485G–01
ISSUE O
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
–X–
2. CONTROLLING DIMENSION: MILLIMETERS.
3. DIMENSION D APPLIES TO PLATED TERMINAL
AND IS MEASURED BETWEEN 0.25 AND 0.30 MM
FROM TERMINAL.
4. COPLANARITY APPLIES TO THE EXPOSED PAD
AS WELL AS THE TERMINALS.
A
M
–Y–
MILLIMETERS
DIM MIN MAX
3.00 BSC
3.00 BSC
INCHES
MIN MAX
A
B
C
D
E
F
0.118 BSC
0.118 BSC
B
0.80
1.00
0.28
1.85
1.85
0.031
0.039
0.011
0.073
0.073
0.23
1.75
1.75
0.009
0.069
0.069
N
G
H
J
0.50 BSC
0.020 BSC
0.875
0.925
0.034
0.036
0.25 (0.010) T
0.25 (0.010) T
0.20 REF
0.008 REF
K
L
0.00
0.35
0.05
0.45
0.000
0.014
0.002
0.018
M
N
P
R
1.50 BSC
1.50 BSC
0.059 BSC
0.059 BSC
0.875
0.60
0.925
0.80
0.034
0.024
0.036
0.031
J
R
C
SEATING
PLANE
–T–
0.08 (0.003) T
K
E
H
G
L
5
8
4
9
F
12
1
16
13
P
D NOTE 3
M
0.10 (0.004)
T
X Y
http://onsemi.com
11
NLAST44599
PACKAGE DIMENSIONS
TSSOP–16
DT SUFFIX
CASE 948F–01
ISSUE O
16X K REF
M
S
S
0.10 (0.004)
T U
V
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
S
0.15 (0.006) T U
K
K1
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSION A DOES NOT INCLUDE MOLD FLASH.
PROTRUSIONS OR GATE BURRS. MOLD FLASH
OR GATE BURRS SHALL NOT EXCEED 0.15 (0.006)
PER SIDE.
16
9
2X L/2
J1
4. DIMENSION B DOES NOT INCLUDE INTERLEAD
FLASH OR PROTRUSION. INTERLEAD FLASH OR
PROTRUSION SHALL NOT EXCEED
0.25 (0.010) PER SIDE.
5. DIMENSION K DOES NOT INCLUDE DAMBAR
PROTRUSION. ALLOWABLE DAMBAR
PROTRUSION SHALL BE 0.08 (0.003) TOTAL IN
EXCESS OF THE K DIMENSION AT MAXIMUM
MATERIAL CONDITION.
B
–U–
SECTION N–N
L
J
PIN 1
IDENT.
8
1
N
6. TERMINAL NUMBERS ARE SHOWN FOR
REFERENCE ONLY.
0.25 (0.010)
7. DIMENSION A AND B ARE TO BE DETERMINED AT
DATUM PLANE -W-.
S
0.15 (0.006) T U
A
M
–V–
MILLIMETERS
INCHES
MIN
DIM MIN
MAX
5.10
4.50
1.20
0.15
0.75
MAX
0.200
0.177
0.047
0.006
0.030
N
A
B
4.90
4.30
---
0.193
0.169
---
F
C
D
0.05
0.50
0.002
0.020
DETAIL E
F
G
H
0.65 BSC
0.026 BSC
0.18
0.09
0.09
0.19
0.19
0.28
0.20
0.16
0.30
0.25
0.007
0.004
0.004
0.007
0.007
0.011
0.008
0.006
0.012
0.010
J
–W–
J1
K
C
K1
L
0.10 (0.004)
6.40 BSC
0.252 BSC
0
M
0
8
8
_
_
_
_
DETAIL E
H
SEATING
PLANE
–T–
D
G
ON Semiconductor and
are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make
changes without further notice to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any
particular purpose, nor does SCILLC assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all
liability, including without limitation special, consequential or incidental damages. “Typical” parameters which may be provided in SCILLC data sheets and/or
specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be
validated for each customer application by customer’s technical experts. SCILLC does not convey any license under its patent rights nor the rights of others.
SCILLC products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications
intended to support or sustain life, or for any other application in which the failure of the SCILLC product could create a situation where personal injury or death
may occur. Should Buyer purchase or use SCILLC products for any such unintended or unauthorized application, Buyer shall indemnify and hold SCILLC and
its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees
arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that
SCILLC was negligent regarding the design or manufacture of the part. SCILLC is an Equal Opportunity/Affirmative Action Employer.
PUBLICATION ORDERING INFORMATION
Literature Fulfillment:
JAPAN: ON Semiconductor, Japan Customer Focus Center
2–9–1 Kamimeguro, Meguro–ku, Tokyo, Japan 153–0051
Phone: 81–3–5773–3850
Literature Distribution Center for ON Semiconductor
P.O. Box 5163, Denver, Colorado 80217 USA
Phone: 303–675–2175 or 800–344–3860 Toll Free USA/Canada
Fax: 303–675–2176 or 800–344–3867 Toll Free USA/Canada
Email: ONlit@hibbertco.com
Email: r14525@onsemi.com
ON Semiconductor Website: http://onsemi.com
For additional information, please contact your local
Sales Representative.
N. American Technical Support: 800–282–9855 Toll Free USA/Canada
NLAST44599/D
相关型号：
©2020 ICPDF网 联系我们和版权申明