TCP-3082N-QT [ONSEMI]
8.2 pF Passive Tunable Integrated Circuits;型号: | TCP-3082N-QT |
厂家: | ONSEMI |
描述: | 8.2 pF Passive Tunable Integrated Circuits |
文件: | 总7页 (文件大小:240K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
TCP-3082N
8.2 pF Passive Tunable
Integrated Circuits (PTIC)
Introduction
ON Semiconductor’s PTICs have excellent RF performance and
power consumption, making them suitable for any mobile handset or
radio application. The fundamental building block of our PTIC
product line is a tunable material called ParaScant, based on Barium
Strontium Titanate (BST). PTICs have the ability to change their
capacitance from a supplied bias voltage generated by the Control IC.
The 8.2 pF PTICs are available as wafer-level chip scale packages
(WLCSP) and in QFN packages for easy mounting directly on printed
circuit boards.
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WLCSP12
1.18x0.72
QFN6
1.6x1.2
CASE 567KE
CASE 485DX
Key Features
• High Tuning Range and Operation up to 20 V
• Usable Frequency Range: from 700 MHz to 2.4 GHz
• High Quality Factor (Q) for Low Loss
MARKING DIAGRAM
• High Power Handling Capability
X.XN
• Compatible with PTIC Control IC TCC-103
• WLCSP Package: 0.722 x 1.179 x 0.611 mm (12 pillar)
• QFN Package: 1.200 x 1.600 x 0.950 mm
• QFN: MSL−2 Moisture Sensitivity Level (per J−STD−020)
• These devices are Pb−Free and RoHS Compliant
X.X = 8.2
= Normal Tuning
N
FUNCTIONAL BLOCK DIAGRAM
Typical Applications
• Multi-band, Multi-standard, Advanced and Simple Mobile Phones
• Tunable Antenna Matching Networks
• Tunable RF Filters
PTIC
RF1
RF2
• Active Antennas
Bias
PTIC Functional Block Diagram
ORDERING INFORMATION
†
Device
Package
Shipping
TCP−3082N−DT
WLCSP12
(Pb−Free)
4000 Units /
7” Reel
TCP−3082N−QT
QFN6
(Pb−Free)
8000 Units /
13“ Reel
†For information on tape and reel specifications,
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specifications
Brochure, BRD8011/D.
© Semiconductor Components Industries, LLC, 2014
1
Publication Order Number:
October, 2014 − Rev. 0
TCP−3082N/D
TCP−3082N
TYPICAL SPECIFICATIONS
Representative Performance Data at 255C
Table 1. PERFORMANCE DATA
Parameter
Min
2.0
Typ
Max
20
Units
V
Operating Bias Voltage
Capacitance (V
Capacitance (V
= 2 V)
7.05
2.23
3.00
2.80
8.20
2.34
3.50
3.30
9.02
2.46
4.05
4.05
4.0
pF
bias
bias
= 20 V)
pF
Tuning Range (2 V - 20 V)
Tuning Range (20 V - 2 V)
Leakage Current (WLCSP)
Operating Frequency
mA
700
2400
MHz
Quality Factor @ 700 MHz, 10 V
100
70
Quality Factor @ 2.4 GHz, 10 V
[1,3]
IP3 (V
= 2 V)
70
dBm
dBm
dBm
dBm
dBm
dBm
ms
bias
bias
[1,3]
IP3 (V
= 20 V)
85
[2,3]
2nd Harmonic (V
2nd Harmonic (V
= 2 V)
-75
-85
-40
-70
80
bias
bias
bias
bias
[2,3]
= 20 V)
[2,3]
3rd Harmonic (V
3rd Harmonic (V
= 2 V)
[2,3]
= 20 V)
[4]
[4]
Transition Time (Cmin ³ Cmax)
Transition Time (Cmax ³ Cmin)
70
ms
1. f = 850 MHz, f = 860 MHz, Pin 25 dBm/Tone
1
2
2. 850 MHz, Pin +34 dBm
3. IP3 and Harmonics are measured in the shunt configuration in a 50 W environment
4. RF1 and RF2 are both connected to DC ground
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2
TCP−3082N
Representative performance data at 255C for 8.2 pF WLCSP Package
Figure 1. Capacitance
Figure 2. Harmonic Power
Figure 3. IP3
Figure 4. Q
Table 2. ABSOLUTE MAXIMUM RATINGS
Parameter
Rating
Units
dBm
V
Input Power
+40
+25 (Note 5)
Bias Voltage
Operating Temperature Range
Storage Temperature Range
ESD − Human Body Model
−30 to +85
°C
−55 to +125
°C
Class 1A JEDEC HBM Standard (Note 6)
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
5. WLCSP: Recommended Bias Voltage not to exceed 20 V
6. Class 1A defined as passing 250 V, but may fail after exposure to 500 V ESD pulse
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3
TCP−3082N
ASSEMBLY CONSIDERATIONS AND REFLOW PROFILE
Molding
The following assembly considerations should be observed:
The PTIC die is compatible for over-molding or
under-fill.
Cleanliness
These chips should be handled in a clean environment.
Electro-static Sensitivity
ON Semiconductor’s PTICs are ESD Class 1A sensitive.
The proper ESD handling procedures should be used.
Mounting
The WLCSP PTIC is fabricated for Flip Chip solder
mounting. Connectivity to the RF and Bias terminations on
the PTIC die is established through copper pillar posts
(53 mm nominal height) topped with lead-free SAC351
solder caps (28 mm nominal height). The PTIC die is
RoHS-compliant and compatible with lead-free soldering
profile.
Post-reflow Cleaning
Use of ultrasonic cleaning is not recommended for
pillared devices as it may lead to premature fatigue failure
of the pillars.
Figure 5. Reflow Profile
ORIENTATION OF THE PTIC FOR OPTIMUM LOSSES
RF
ANT
When configuring the PTIC in your specific circuit
RF1
(PTIC Pad)
design, at least one of the RF terminals must be connected
to DC ground. If minimum transition times are required, DC
ground on both RF terminals is recommended. To minimize
losses, the PTIC should be oriented such that RF2 is at the
lower RF impedance of the two RF nodes. A shunt PTIC, for
example, should have RF2 connected to RF ground.
RF2
(PTIC Pad)
Bias
Figure 6. PTIC Orientation Functional Block
Diagram
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4
TCP−3082N
PART NUMBER DEFINITION
Example: TCP−3082N−DT
TCP
-
30
82
N
-
D
T
Product
Family
Process Status
Process
Capacitor
Value
Tuning
Package /
Format
Packing
Generation
“blank” =
Production
10 = Gen 1.0
30 = Gen 3.0
T = T&R
27 = 2.7 pF
33 = 3.3 pF
39 = 3.9 pF
47 = 4.7 pF
56 = 5.6 pF
68 = 6.8 pF
82 = 8.2 pF
TCP
N = Normal
H = High
D = WLCSP
Q = QFN
X = Pilot
Production
S =
Special/Custom
P = Prototype
Table 3. PART NUMBERS
Capacitance
2 V
8.20
8.20
20 V
2.34
2.34
Part Number
TCP-3082N-DT
Package
12-Pillar WLCSP
6-Pin QFN
TCP-3082N-QT
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5
TCP−3082N
PACKAGE DIMENSIONS
WLCSP12, 1.18x0.72
CASE 567KE
ISSUE O
NOTES:
E
A
B
D
1. DIMENSIONING AND TOLERANCING PER
ASME Y14.5M, 1994.
2. CONTROLLING DIMENSION: MILLIMETERS.
3. COPLANARITY APPLIES TO SPHERICAL
CROWNS OF SOLDER BALLS.
PIN A1
REFERENCE
10X b1
10X b
0.05
0.03
MILLIMETERS
C
C
A B
DIM
A
A1
b
b1
D
MIN
0.590
0.069
0.079
0.044
MAX
0.639
0.093
0.129
0.094
DETAIL A
2X
0.05
0.05
C
1.179 BSC
E
e
e1
e2
e3
e4
0.722 BSC
0.150 BSC
0.159 BSC
0.300 BSC
0.460 BSC
0.425 BSC
2X
C
TOP VIEW
2X b
2X b1
0.05
C
C
A B
0.06
C
C
A
0.03
RECOMMENDED
SOLDERING FOOTPRINT*
DETAIL B
0.05
A1
SIDE VIEW
SEATING
PLANE
C
0.57
NOTE 3
2X
0.13
2X
0.15
A1
e3
DETAIL A
PACKAGE
OUTLINE
0.52
0.51
e
F
E
D
C
B
2X
0.75
e1
e2
2X
0.13
0.59
A
DIMENSIONS: MILLIMETERS
1
2
*For additional information on our Pb−Free strategy and soldering
details, please download the ON Semiconductor Soldering and
Mounting Techniques Reference Manual, SOLDERRM/D.
DETAIL B
e4
BOTTOM VIEW
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6
TCP−3082N
PACKAGE DIMENSIONS
QFN6 1.6x1.2, 0.5P
CASE 485DX
ISSUE O
NOTES:
D
A
B
L
L
1. DIMENSIONING AND TOLERANCING PER
ASME Y14.5M, 1994.
2. CONTROLLING DIMENSION: MILLIMETERS.
L1
MILLIMETERS
DIM
A
A1
A3
b
D
E
e
MIN
0.90
0.00
0.15 REF
0.22
1.60 BSC
1.20 BSC
0.50 BSC
MAX
1.00
0.05
DETAIL A
ALTERNATE TERMINAL
CONSTRUCTIONS
E
PIN ONE
IDENTIFIER
0.28
2X
0.05
C
EXPOSED Cu
MOLD CMPD
0.39
−−−
0.46
0.15
L
L1
2X
0.05
C
TOP VIEW
A
DETAIL B
DETAIL B
0.10
C
ALTERNATE
CONSTRUCTIONS
A3
A1
0.05
C
RECOMMENDED
MOUNTING FOOTPRINT*
SEATING
PLANE
C
SIDE VIEW
6X
0.60
6X b
PACKAGE
OUTLINE
DETAIL A
0.10
0.03
C
C
A
B
1
3
1.40
1
6X
0.30
0.50
PITCH
DIMENSIONS: MILLIMETERS
6
4
6X
L
*For additional information on our Pb−Free strategy and soldering
details, please download the ON Semiconductor Soldering and
Mounting Techniques Reference Manual, SOLDERRM/D.
e
BOTTOM VIEW
ParaScan is a trademark of Paratek Microwave, Inc.
ON Semiconductor and
are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC owns the rights to a number of patents, trademarks,
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limitation special, consequential or incidental damages. “Typical” parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications
and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. SCILLC
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TCP−3082N/D
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