TIL113SM [ONSEMI]
6 引脚 DIP 光电达林顿输出光耦合器;型号: | TIL113SM |
厂家: | ONSEMI |
描述: | 6 引脚 DIP 光电达林顿输出光耦合器 光电 |
文件: | 总14页 (文件大小:399K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
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December 2014
4N29M, 4N30M, 4N32M, 4N33M, H11B1M,TIL113M
6-Pin DIP General Purpose Photodarlington Optocoupler
Features
Description
■ High Sensitivity to Low Input Drive Current
The 4N29M, 4N30M, 4N32M, 4N33M, H11B1M, and
TIL113M have a gallium arsenide infrared emitter opti-
cally coupled to a silicon planar photodarlington.
■ Meets or Exceeds All JEDEC Registered
Specifications
■ Safety and Regulatory Approvals:
– UL1577, 4,170 VAC
for 1 Minute
RMS
■ DIN-EN/IEC60747-5-5, 850 V Peak Working
Insulation Voltage
Applications
■ Low Power Logic Circuits
■ Telecommunications Equipment
■ Portable Electronics
■ Solid State Relays
■ Interfacing Coupling Systems of Different Potentials
and Impedances
Schematic
ANODE 1
6 BASE
6
6
1
CATHODE
N/C
COLLECTOR
2
3
5
4
1
6
EMITTER
1
Figure 2. Package Outlines
Figure 1. Schematic
©2007 Fairchild Semiconductor Corporation
4NXXM, H11B1M, TIL113M Rev. 1.0.4
www.fairchildsemi.com
Safety and Insulation Ratings
As per DIN EN/IEC 60747-5-5, this optocoupler is suitable for “safe electrical insulation” only within the safety limit
data. Compliance with the safety ratings shall be ensured by means of protective circuits.
Parameter
Characteristics
< 150 V
< 300 V
I–IV
I–IV
Installation Classifications per DIN VDE
0110/1.89 Table 1, For Rated Mains Voltage
RMS
RMS
Climatic Classification
55/100/21
2
Pollution Degree (DIN VDE 0110/1.89)
Comparative Tracking Index
175
Symbol
Parameter
Value
Unit
Input-to-Output Test Voltage, Method A, V
x 1.6 = V
,
IORM
PR
1360
V
V
peak
peak
Type and Sample Test with t = 10 s, Partial Discharge < 5 pC
m
V
PR
Input-to-Output Test Voltage, Method B, V
x 1.875 = V
,
IORM
PR
1594
100% Production Test with t = 1 s, Partial Discharge < 5 pC
m
V
Maximum Working Insulation Voltage
Highest Allowable Over-Voltage
850
6000
≥ 7
V
V
IORM
peak
V
IOTM
peak
External Creepage
mm
mm
mm
mm
°C
External Clearance
≥ 7
External Clearance (for Option TV, 0.4" Lead Spacing)
Distance Through Insulation (Insulation Thickness)
≥ 10
≥ 0.5
175
350
800
DTI
(1)
T
Case Temperature
S
(1)
I
Input Current
mA
mW
Ω
S,INPUT
(1)
P
Output Power
S,OUTPUT
(1)
9
R
Insulation Resistance at T , V = 500 V
> 10
IO
S
IO
Note:
1. Safety limit values – maximum values allowed in the event of a failure.
©2007 Fairchild Semiconductor Corporation
4NXXM, H11B1M, TIL113M Rev. 1.0.4
www.fairchildsemi.com
2
Absolute Maximum Ratings
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.
In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.
The absolute maximum ratings are stress ratings only.
Symbol
Parameter
Value
Unit
TOTAL DEVICE
T
Storage Temperature
-40 to +125
-40 to +100
-40 to +125
260 for 10 seconds
270
°C
°C
STG
T
Operating Temperature
Junction Temperature
Lead Solder Temperature
OPR
T
°C
J
T
°C
SOL
Total Device Power Dissipation @ T = 25°C
mW
mW/°C
A
P
D
Derate Above 25°C
3.3
EMITTER
I
Continuous Forward Current
Reverse Voltage
80
3
mA
V
F
V
R
I (pk)
Forward Current – Peak (300 µs, 2% Duty Cycle)
3.0
120
2.0
A
F
LED Power Dissipation @ T = 25°C
mW
mW/°C
A
P
D
Derate above 25°C
DETECTOR
BV
BV
BV
Collector-Emitter Breakdown Voltage
Collector-Base Breakdown Voltage
Emitter-Collector Breakdown Voltage
30
30
V
V
CEO
CBO
ECO
5
V
Detector Power Dissipation @ T = 25°C
150
2.0
150
mW
mW/°C
mA
A
P
D
Derate Above 25°C
I
Continuous Collector Current
C
©2007 Fairchild Semiconductor Corporation
4NXXM, H11B1M, TIL113M Rev. 1.0.4
www.fairchildsemi.com
3
Electrical Characteristics
T = 25°C Unless otherwise specified.
A
Individual Component Characteristics
Symbol
EMITTER
Parameter
Test Conditions
Device
Min. Typ. Max. Unit
4NXXM
1.2
1.2
1.5
1.5
100
10
V
(2)
V
Input Forward Voltage
I = 10 mA
F
H11B1M,
TIL113M
F
0.8
V
V = 3.0 V
4NXXM
0.001
0.001
150
µA
µA
pF
R
(2)
I
Reverse Leakage Current
H11B1M,
TIL113M
R
V = 6.0 V
R
(2)
C
Capacitance
V = 0V, f = 1.0 MHz
All
F
DETECTOR
4NXXM,
TIL113M
30
25
30
5.0
7
60
60
V
V
V
V
V
Collector-Emitter Breakdown
Voltage
BV
BV
BV
I
I = 1.0 mA, I = 0
(2)
CEO
CBO
ECO
C
B
H11B1M
Collector-Base Breakdown
I = 100 µA, I = 0
All
100
10
(2)
C
E
Voltage
4NXXM
Emitter-Collector Breakdown
I = 100 µA, I = 0
(2)
H11B1M,
TIL113M
E
B
Voltage
10
Collector-Emitter Dark
V
= 10 V, Base Open
CE
All
1
100
nA
(2)
CEO
Current
Notes:
2. Indicates JEDEC registered data.
©2007 Fairchild Semiconductor Corporation
4NXXM, H11B1M, TIL113M Rev. 1.0.4
www.fairchildsemi.com
4
Electrical Characteristics (Continued)
T = 25°C Unless otherwise specified.
A
Transfer Characteristics
Symbol
Parameter
Test Conditions
Device
Min.
Typ. Max.
Unit
DC CHARACTERISTICS
4N32M,
4N33M
50 (500)
10 (100)
mA (%)
mA (%)
I = 10 mA, V = 10 V,
F
CE
I = 0
4N29M,
4N30M
B
Collector Output
Current
I
(3)(4)(5)
C(CTR)
I = 1 mA, V = 5 V
H11B1M
TIL113M
4NXXM
5 (500)
mA (%)
F
CE
I = 10 mA, V = 1 V
30 (300)
mA (%)
F
CE
1.0
1.25
1.0
V
V
V
I = 8 mA, I = 2.0 mA
F
C
(3)(5)
V
Saturation Voltage
TIL113M
H11B1M
CE(SAT)
I = 1 mA, I = 1 mA
F
C
AC CHARACTERISTICS
I = 200 mA, I = 50 mA,
4NXXM,
TIL113M
F
C
5.0
µs
µs
V
= 10 V, R = 100 Ω
CC
L
t
Turn-on Time
Turn-off Time
on
off
I = 10 mA, V = 10 V,
F
CE
H11B1M
25
R = 100 Ω
L
4N32M,
4N33M,
TIL113M
100
40
µs
µs
I = 200 mA, I = 50 mA,
F
C
V
= 10 V, R = 100 Ω
CC
L
t
4N29M,
4N30M
I = 10 mA, V = 10 V,
F
CE
H11B1M
18
30
µs
R = 100 Ω
L
(6)(7)
BW
Notes:
kHz
Bandwidth
3. Indicates JEDEC registered data.
4. The current transfer ratio(I / I ) is the ratio of the detector collector current to the LED input current.
C
F
5. Pulse test: pulse width = 300 µs, duty cycle ≤ 2.0% .
6. I adjusted to I = 2.0 mA and I = 0.7 mA rms.
F
C
C
7. The frequency at which I is 3 dB down from the 1 kHz value.
C
Isolation Characteristics
Symbol
Characteristic
Test Conditions
Min.
Typ.
Max.
Unit
V
C
R
Input-Output Isolation Voltage t = 1 Minute
4170
VAC
RMS
ISO
ISO
ISO
Isolation Capacitance
Isolation Resistance
V
V
= 0 V, f = 1 MHz
0.2
pF
I-O
I-O
11
= 500 VDC, T = 25°C
10
Ω
A
©2007 Fairchild Semiconductor Corporation
4NXXM, H11B1M, TIL113M Rev. 1.0.4
www.fairchildsemi.com
5
Typical Performance Curves
1.8
1.7
1.6
1.5
1.4
1.6
1.4
1.2
1.0
0.8
0.6
0.4
0.2
0.0
V
T
= 5.0 V
= 25°C
Normalized to
= 10 mA
CE
A
I
F
T
T
T
= -55°C
= 25°C
= 100°C
A
1.3
1.2
1.1
1.0
A
A
0
2
4
6
8
10
12
14
16
18
20
1
10
100
I
F
- LED FORWARD CURRENT (mA)
I - FORWARD CURRENT (mA)
F
Figure 4. Normalized CTR vs. Forward Current
Figure 3. LED Forward Voltage vs. Forward Current
1.4
1.2
1.0
0.9
0.8
0.7
0.6
0.5
0.4
0.3
0.2
0.1
0.0
I
F
= 20 mA
I
= 5 mA
F
I
F
= 10 mA
I
F
= 5 mA
1.0
0.8
0.6
0.4
0.2
I
= 10 mA
F
I
= 20 mA
F
V
= 5.0 V
CE
Normalized to
= 10 mA
I
F
T
A
= 25°C
-60
-40
-20
0
20
40
60
80
100
10
100
1000
T
A
- AMBIENT TEMPERATURE (°C)
R
- BASE RESISTANCE (kΩ)
BE
Figure 5. Normalized CTR vs. Ambient Temperature
Figure 6. CTR vs. RBE (Unsaturated)
100
10
1
1.0
0.9
T
A
= 25˚C
V
CE
= 0.3 V
0.8
0.7
0.6
0.5
0.4
0.3
0.2
0.1
0.0
I
= 20 mA
= 10 mA
F
I
F
= 2.5 mA
I
F
0.1
0.01
I
F
= 5 mA
I
F
= 20 mA
I
F
= 5 mA
I
F
= 10 mA
0.001
0.01
0.1
1
10
10
100
1000
I
C
- COLLECTOR CURRENT (mA)
R - BASE RESISTANCE (k Ω)
BE
Figure 7. CTR vs. RBE (Saturated)
Figure 8. Collector-Emitter Saturation Voltage
vs. Collector Current
©2007 Fairchild Semiconductor Corporation
4NXXM, H11B1M, TIL113M Rev. 1.0.4
www.fairchildsemi.com
6
Typical Performance Curves (Continued)
1000
5.0
4.5
4.0
3.5
3.0
2.5
2.0
1.5
1.0
0.5
I
V
T
= 10 mA
F
V
10 V
CC =
= 10 V
CC
= 25°C
I
R
= 2 mA
= 100 Ω
C
L
A
100
10
1
T
off
T
f
T
on
T
r
0.1
0.1
1
10
100
10
100
R
1000
10000
100000
R-LOAD RESISTOR (kΩ)
- BASE RESISTANCE (kΩ)
BE
Figure 9. Switching Speed vs. Load Resistor
Figure 10. Normalized t vs. R
on BE
10000
1000
100
10
1.4
V
= 10 V
C
CE
= 25°
1.3
1.2
1.1
1.0
0.9
0.8
0.7
0.6
0.5
0.4
0.3
0.2
0.1
T
A
1
V
10 V
= 2 mA
= 100 Ω
CC =
I
C
L
0.1
R
0.01
0.001
0
20
40
60
80
100
10
100
1000
10000
100000
R - BASE RESISTANCE (kΩ)
BE
T
A
- AMBIENT TEMPERATURE (°C)
Figure 11. Normalized t vs. R
Figure 12. Dark Current vs. Ambient Temperature
off
BE
Switching Time Test Circuit and Waveform
VCC = 10 V
INPUT PULSE
IC
IF
RL
10%
INPUT
OUTPUT
OUTPUT PULSE
90%
RBE
tr
tf
toff
ton
IF to produce IC = 2 mA
Adjust
Figure 13. Switching Time Test Circuit and Waveform
©2007 Fairchild Semiconductor Corporation
4NXXM, H11B1M, TIL113M Rev. 1.0.4
www.fairchildsemi.com
7
Reflow Profile
300
260°C
280
260
240
220
200
180
160
140
120
100
80
> 245°C = 42 s
Time above
183°C = 90 s
°C
1.822°C/s Ramp-up rate
60
40
33 s
20
0
0
60
120
180
270
360
Time (s)
Figure 14. Reflow Profile
©2007 Fairchild Semiconductor Corporation
4NXXM, H11B1M, TIL113M Rev. 1.0.4
www.fairchildsemi.com
8
Ordering Information
Part Number
Package
Packing Method
4N29M
DIP 6-Pin
Tube (50 Units)
4N29SM
SMT 6-Pin (Lead Bend)
SMT 6-Pin (Lead Bend)
Tube (50 Units)
4N29SR2M
4N29VM
Tape and Reel (1000 Units)
Tube (50 Units)
DIP 6-Pin, DIN EN/IEC60747-5-5 Option
4N29SVM
4N29SR2VM
4N29TVM
SMT 6-Pin (Lead Bend), DIN EN/IEC60747-5-5 Option
SMT 6-Pin (Lead Bend), DIN EN/IEC60747-5-5 Option
DIP 6-Pin, 0.4” Lead Spacing, DIN EN/IEC60747-5-5 Option
Tube (50 Units)
Tape and Reel (1000 Units)
Tube (50 Units)
Note:
8. The product orderable part number system listed in this table also applies to the 4N30M, 4N32M, 4N33M, H11B1M,
and TIL113M devices.
Marking Information
1
2
4N29
6
V X YY Q
5
3
4
Figure 15. Top Mark
Table 1. Top Mark Definitions
1
2
3
4
5
6
Fairchild Logo
Device Number
DIN EN/IEC60747-5-5 Option (only appears on component ordered with this option)
One-Digit Year Code, e.g., “4”
Digit Work Week, Ranging from “01” to “53”
Assembly Package Code
©2007 Fairchild Semiconductor Corporation
4NXXM, H11B1M, TIL113M Rev. 1.0.4
www.fairchildsemi.com
9
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are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.
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coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein.
ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.
Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards,
regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or
specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer
application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not
designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification
in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorized
application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and
expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such
claim alleges that ON Semiconductor was negligent regarding the design or manufacture of the part. ON Semiconductor is an Equal Opportunity/Affirmative Action Employer. This
literature is subject to all applicable copyright laws and is not for resale in any manner.
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