TIL113SM [ONSEMI]

6 引脚 DIP 光电达林顿输出光耦合器;
TIL113SM
型号: TIL113SM
厂家: ONSEMI    ONSEMI
描述:

6 引脚 DIP 光电达林顿输出光耦合器

光电
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December 2014  
4N29M, 4N30M, 4N32M, 4N33M, H11B1M,TIL113M  
6-Pin DIP General Purpose Photodarlington Optocoupler  
Features  
Description  
High Sensitivity to Low Input Drive Current  
The 4N29M, 4N30M, 4N32M, 4N33M, H11B1M, and  
TIL113M have a gallium arsenide infrared emitter opti-  
cally coupled to a silicon planar photodarlington.  
Meets or Exceeds All JEDEC Registered  
Specifications  
Safety and Regulatory Approvals:  
– UL1577, 4,170 VAC  
for 1 Minute  
RMS  
DIN-EN/IEC60747-5-5, 850 V Peak Working  
Insulation Voltage  
Applications  
Low Power Logic Circuits  
Telecommunications Equipment  
Portable Electronics  
Solid State Relays  
Interfacing Coupling Systems of Different Potentials  
and Impedances  
Schematic  
ANODE 1  
6 BASE  
6
6
1
CATHODE  
N/C  
COLLECTOR  
2
3
5
4
1
6
EMITTER  
1
Figure 2. Package Outlines  
Figure 1. Schematic  
©2007 Fairchild Semiconductor Corporation  
4NXXM, H11B1M, TIL113M Rev. 1.0.4  
www.fairchildsemi.com  
Safety and Insulation Ratings  
As per DIN EN/IEC 60747-5-5, this optocoupler is suitable for “safe electrical insulation” only within the safety limit  
data. Compliance with the safety ratings shall be ensured by means of protective circuits.  
Parameter  
Characteristics  
< 150 V  
< 300 V  
I–IV  
I–IV  
Installation Classifications per DIN VDE  
0110/1.89 Table 1, For Rated Mains Voltage  
RMS  
RMS  
Climatic Classification  
55/100/21  
2
Pollution Degree (DIN VDE 0110/1.89)  
Comparative Tracking Index  
175  
Symbol  
Parameter  
Value  
Unit  
Input-to-Output Test Voltage, Method A, V  
x 1.6 = V  
,
IORM  
PR  
1360  
V
V
peak  
peak  
Type and Sample Test with t = 10 s, Partial Discharge < 5 pC  
m
V
PR  
Input-to-Output Test Voltage, Method B, V  
x 1.875 = V  
,
IORM  
PR  
1594  
100% Production Test with t = 1 s, Partial Discharge < 5 pC  
m
V
Maximum Working Insulation Voltage  
Highest Allowable Over-Voltage  
850  
6000  
7  
V
V
IORM  
peak  
V
IOTM  
peak  
External Creepage  
mm  
mm  
mm  
mm  
°C  
External Clearance  
7  
External Clearance (for Option TV, 0.4" Lead Spacing)  
Distance Through Insulation (Insulation Thickness)  
10  
0.5  
175  
350  
800  
DTI  
(1)  
T
Case Temperature  
S
(1)  
I
Input Current  
mA  
mW  
Ω
S,INPUT  
(1)  
P
Output Power  
S,OUTPUT  
(1)  
9
R
Insulation Resistance at T , V = 500 V  
> 10  
IO  
S
IO  
Note:  
1. Safety limit values – maximum values allowed in the event of a failure.  
©2007 Fairchild Semiconductor Corporation  
4NXXM, H11B1M, TIL113M Rev. 1.0.4  
www.fairchildsemi.com  
2
Absolute Maximum Ratings  
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be  
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.  
In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.  
The absolute maximum ratings are stress ratings only.  
Symbol  
Parameter  
Value  
Unit  
TOTAL DEVICE  
T
Storage Temperature  
-40 to +125  
-40 to +100  
-40 to +125  
260 for 10 seconds  
270  
°C  
°C  
STG  
T
Operating Temperature  
Junction Temperature  
Lead Solder Temperature  
OPR  
T
°C  
J
T
°C  
SOL  
Total Device Power Dissipation @ T = 25°C  
mW  
mW/°C  
A
P
D
Derate Above 25°C  
3.3  
EMITTER  
I
Continuous Forward Current  
Reverse Voltage  
80  
3
mA  
V
F
V
R
I (pk)  
Forward Current – Peak (300 µs, 2% Duty Cycle)  
3.0  
120  
2.0  
A
F
LED Power Dissipation @ T = 25°C  
mW  
mW/°C  
A
P
D
Derate above 25°C  
DETECTOR  
BV  
BV  
BV  
Collector-Emitter Breakdown Voltage  
Collector-Base Breakdown Voltage  
Emitter-Collector Breakdown Voltage  
30  
30  
V
V
CEO  
CBO  
ECO  
5
V
Detector Power Dissipation @ T = 25°C  
150  
2.0  
150  
mW  
mW/°C  
mA  
A
P
D
Derate Above 25°C  
I
Continuous Collector Current  
C
©2007 Fairchild Semiconductor Corporation  
4NXXM, H11B1M, TIL113M Rev. 1.0.4  
www.fairchildsemi.com  
3
Electrical Characteristics  
T = 25°C Unless otherwise specified.  
A
Individual Component Characteristics  
Symbol  
EMITTER  
Parameter  
Test Conditions  
Device  
Min. Typ. Max. Unit  
4NXXM  
1.2  
1.2  
1.5  
1.5  
100  
10  
V
(2)  
V
Input Forward Voltage  
I = 10 mA  
F
H11B1M,  
TIL113M  
F
0.8  
V
V = 3.0 V  
4NXXM  
0.001  
0.001  
150  
µA  
µA  
pF  
R
(2)  
I
Reverse Leakage Current  
H11B1M,  
TIL113M  
R
V = 6.0 V  
R
(2)  
C
Capacitance  
V = 0V, f = 1.0 MHz  
All  
F
DETECTOR  
4NXXM,  
TIL113M  
30  
25  
30  
5.0  
7
60  
60  
V
V
V
V
V
Collector-Emitter Breakdown  
Voltage  
BV  
BV  
BV  
I
I = 1.0 mA, I = 0  
(2)  
CEO  
CBO  
ECO  
C
B
H11B1M  
Collector-Base Breakdown  
I = 100 µA, I = 0  
All  
100  
10  
(2)  
C
E
Voltage  
4NXXM  
Emitter-Collector Breakdown  
I = 100 µA, I = 0  
(2)  
H11B1M,  
TIL113M  
E
B
Voltage  
10  
Collector-Emitter Dark  
V
= 10 V, Base Open  
CE  
All  
1
100  
nA  
(2)  
CEO  
Current  
Notes:  
2. Indicates JEDEC registered data.  
©2007 Fairchild Semiconductor Corporation  
4NXXM, H11B1M, TIL113M Rev. 1.0.4  
www.fairchildsemi.com  
4
Electrical Characteristics (Continued)  
T = 25°C Unless otherwise specified.  
A
Transfer Characteristics  
Symbol  
Parameter  
Test Conditions  
Device  
Min.  
Typ. Max.  
Unit  
DC CHARACTERISTICS  
4N32M,  
4N33M  
50 (500)  
10 (100)  
mA (%)  
mA (%)  
I = 10 mA, V = 10 V,  
F
CE  
I = 0  
4N29M,  
4N30M  
B
Collector Output  
Current  
I
(3)(4)(5)  
C(CTR)  
I = 1 mA, V = 5 V  
H11B1M  
TIL113M  
4NXXM  
5 (500)  
mA (%)  
F
CE  
I = 10 mA, V = 1 V  
30 (300)  
mA (%)  
F
CE  
1.0  
1.25  
1.0  
V
V
V
I = 8 mA, I = 2.0 mA  
F
C
(3)(5)  
V
Saturation Voltage  
TIL113M  
H11B1M  
CE(SAT)  
I = 1 mA, I = 1 mA  
F
C
AC CHARACTERISTICS  
I = 200 mA, I = 50 mA,  
4NXXM,  
TIL113M  
F
C
5.0  
µs  
µs  
V
= 10 V, R = 100 Ω  
CC  
L
t
Turn-on Time  
Turn-off Time  
on  
off  
I = 10 mA, V = 10 V,  
F
CE  
H11B1M  
25  
R = 100 Ω  
L
4N32M,  
4N33M,  
TIL113M  
100  
40  
µs  
µs  
I = 200 mA, I = 50 mA,  
F
C
V
= 10 V, R = 100 Ω  
CC  
L
t
4N29M,  
4N30M  
I = 10 mA, V = 10 V,  
F
CE  
H11B1M  
18  
30  
µs  
R = 100 Ω  
L
(6)(7)  
BW  
Notes:  
kHz  
Bandwidth  
3. Indicates JEDEC registered data.  
4. The current transfer ratio(I / I ) is the ratio of the detector collector current to the LED input current.  
C
F
5. Pulse test: pulse width = 300 µs, duty cycle 2.0% .  
6. I adjusted to I = 2.0 mA and I = 0.7 mA rms.  
F
C
C
7. The frequency at which I is 3 dB down from the 1 kHz value.  
C
Isolation Characteristics  
Symbol  
Characteristic  
Test Conditions  
Min.  
Typ.  
Max.  
Unit  
V
C
R
Input-Output Isolation Voltage t = 1 Minute  
4170  
VAC  
RMS  
ISO  
ISO  
ISO  
Isolation Capacitance  
Isolation Resistance  
V
V
= 0 V, f = 1 MHz  
0.2  
pF  
I-O  
I-O  
11  
= 500 VDC, T = 25°C  
10  
Ω
A
©2007 Fairchild Semiconductor Corporation  
4NXXM, H11B1M, TIL113M Rev. 1.0.4  
www.fairchildsemi.com  
5
Typical Performance Curves  
1.8  
1.7  
1.6  
1.5  
1.4  
1.6  
1.4  
1.2  
1.0  
0.8  
0.6  
0.4  
0.2  
0.0  
V
T
= 5.0 V  
= 25°C  
Normalized to  
= 10 mA  
CE  
A
I
F
T
T
T
= -55°C  
= 25°C  
= 100°C  
A
1.3  
1.2  
1.1  
1.0  
A
A
0
2
4
6
8
10  
12  
14  
16  
18  
20  
1
10  
100  
I
F
- LED FORWARD CURRENT (mA)  
I - FORWARD CURRENT (mA)  
F
Figure 4. Normalized CTR vs. Forward Current  
Figure 3. LED Forward Voltage vs. Forward Current  
1.4  
1.2  
1.0  
0.9  
0.8  
0.7  
0.6  
0.5  
0.4  
0.3  
0.2  
0.1  
0.0  
I
F
= 20 mA  
I
= 5 mA  
F
I
F
= 10 mA  
I
F
= 5 mA  
1.0  
0.8  
0.6  
0.4  
0.2  
I
= 10 mA  
F
I
= 20 mA  
F
V
= 5.0 V  
CE  
Normalized to  
= 10 mA  
I
F
T
A
= 25°C  
-60  
-40  
-20  
0
20  
40  
60  
80  
100  
10  
100  
1000  
T
A
- AMBIENT TEMPERATURE (°C)  
R
- BASE RESISTANCE (kΩ)  
BE  
Figure 5. Normalized CTR vs. Ambient Temperature  
Figure 6. CTR vs. RBE (Unsaturated)  
100  
10  
1
1.0  
0.9  
T
A
= 25˚C  
V
CE  
= 0.3 V  
0.8  
0.7  
0.6  
0.5  
0.4  
0.3  
0.2  
0.1  
0.0  
I
= 20 mA  
= 10 mA  
F
I
F
= 2.5 mA  
I
F
0.1  
0.01  
I
F
= 5 mA  
I
F
= 20 mA  
I
F
= 5 mA  
I
F
= 10 mA  
0.001  
0.01  
0.1  
1
10  
10  
100  
1000  
I
C
- COLLECTOR CURRENT (mA)  
R - BASE RESISTANCE (k Ω)  
BE  
Figure 7. CTR vs. RBE (Saturated)  
Figure 8. Collector-Emitter Saturation Voltage  
vs. Collector Current  
©2007 Fairchild Semiconductor Corporation  
4NXXM, H11B1M, TIL113M Rev. 1.0.4  
www.fairchildsemi.com  
6
Typical Performance Curves (Continued)  
1000  
5.0  
4.5  
4.0  
3.5  
3.0  
2.5  
2.0  
1.5  
1.0  
0.5  
I
V
T
= 10 mA  
F
V
10 V  
CC =  
= 10 V  
CC  
= 25°C  
I
R
= 2 mA  
= 100 Ω  
C
L
A
100  
10  
1
T
off  
T
f
T
on  
T
r
0.1  
0.1  
1
10  
100  
10  
100  
R
1000  
10000  
100000  
R-LOAD RESISTOR (kΩ)  
- BASE RESISTANCE (kΩ)  
BE  
Figure 9. Switching Speed vs. Load Resistor  
Figure 10. Normalized t vs. R  
on BE  
10000  
1000  
100  
10  
1.4  
V
= 10 V  
C
CE  
= 25°  
1.3  
1.2  
1.1  
1.0  
0.9  
0.8  
0.7  
0.6  
0.5  
0.4  
0.3  
0.2  
0.1  
T
A
1
V
10 V  
= 2 mA  
= 100 Ω  
CC =  
I
C
L
0.1  
R
0.01  
0.001  
0
20  
40  
60  
80  
100  
10  
100  
1000  
10000  
100000  
R - BASE RESISTANCE (kΩ)  
BE  
T
A
- AMBIENT TEMPERATURE (°C)  
Figure 11. Normalized t vs. R  
Figure 12. Dark Current vs. Ambient Temperature  
off  
BE  
Switching Time Test Circuit and Waveform  
VCC = 10 V  
INPUT PULSE  
IC  
IF  
RL  
10%  
INPUT  
OUTPUT  
OUTPUT PULSE  
90%  
RBE  
tr  
tf  
toff  
ton  
IF to produce IC = 2 mA  
Adjust  
Figure 13. Switching Time Test Circuit and Waveform  
©2007 Fairchild Semiconductor Corporation  
4NXXM, H11B1M, TIL113M Rev. 1.0.4  
www.fairchildsemi.com  
7
Reflow Profile  
300  
260°C  
280  
260  
240  
220  
200  
180  
160  
140  
120  
100  
80  
> 245°C = 42 s  
Time above  
183°C = 90 s  
°C  
1.822°C/s Ramp-up rate  
60  
40  
33 s  
20  
0
0
60  
120  
180  
270  
360  
Time (s)  
Figure 14. Reflow Profile  
©2007 Fairchild Semiconductor Corporation  
4NXXM, H11B1M, TIL113M Rev. 1.0.4  
www.fairchildsemi.com  
8
Ordering Information  
Part Number  
Package  
Packing Method  
4N29M  
DIP 6-Pin  
Tube (50 Units)  
4N29SM  
SMT 6-Pin (Lead Bend)  
SMT 6-Pin (Lead Bend)  
Tube (50 Units)  
4N29SR2M  
4N29VM  
Tape and Reel (1000 Units)  
Tube (50 Units)  
DIP 6-Pin, DIN EN/IEC60747-5-5 Option  
4N29SVM  
4N29SR2VM  
4N29TVM  
SMT 6-Pin (Lead Bend), DIN EN/IEC60747-5-5 Option  
SMT 6-Pin (Lead Bend), DIN EN/IEC60747-5-5 Option  
DIP 6-Pin, 0.4” Lead Spacing, DIN EN/IEC60747-5-5 Option  
Tube (50 Units)  
Tape and Reel (1000 Units)  
Tube (50 Units)  
Note:  
8. The product orderable part number system listed in this table also applies to the 4N30M, 4N32M, 4N33M, H11B1M,  
and TIL113M devices.  
Marking Information  
1
2
4N29  
6
V X YY Q  
5
3
4
Figure 15. Top Mark  
Table 1. Top Mark Definitions  
1
2
3
4
5
6
Fairchild Logo  
Device Number  
DIN EN/IEC60747-5-5 Option (only appears on component ordered with this option)  
One-Digit Year Code, e.g., “4”  
Digit Work Week, Ranging from “01” to “53”  
Assembly Package Code  
©2007 Fairchild Semiconductor Corporation  
4NXXM, H11B1M, TIL113M Rev. 1.0.4  
www.fairchildsemi.com  
9
ON Semiconductor and  
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.  
ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent  
coverage may be accessed at www.onsemi.com/site/pdf/PatentMarking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein.  
ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability  
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.  
Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards,  
regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or  
specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer  
application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not  
designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification  
in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorized  
application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and  
expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such  
claim alleges that ON Semiconductor was negligent regarding the design or manufacture of the part. ON Semiconductor is an Equal Opportunity/Affirmative Action Employer. This  
literature is subject to all applicable copyright laws and is not for resale in any manner.  
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TIL114G

Transistor Output Optocoupler, 1-Element, 5300V Isolation, PLASTIC, DIP-6
ISOCOM