PE43702MLI-Z [PSEMI]

50 Ω RF Digital Attenuator 7-bit, 31.75 dB, DC-4.0 GHz; 50 Ω RF数字衰减器7位, 31.75分贝, DC- 4.0 GHz的
PE43702MLI-Z
型号: PE43702MLI-Z
厂家: Peregrine Semiconductor    Peregrine Semiconductor
描述:

50 Ω RF Digital Attenuator 7-bit, 31.75 dB, DC-4.0 GHz
50 Ω RF数字衰减器7位, 31.75分贝, DC- 4.0 GHz的

射频 微波 衰减器
文件: 总11页 (文件大小:465K)
中文:  中文翻译
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Product Specification  
PE43702  
50 RF Digital Attenuator  
7-bit, 31.75 dB, DC-4.0 GHz  
Product Description  
Features  
The PE43702 is a HaRP-enhanced, high linearity, 7-bit RF  
Digital Step Attenuator (DSA). This highly versatile DSA  
covers a 31.75 dB attenuation range in 0.25 dB steps. The  
Peregrine 50RF DSA provides both a serial and parallel  
CMOS control interface. It maintains high attenuation accuracy  
over frequency and temperature and exhibits very low insertion  
loss and low power consumption. Performance does not  
change with Vdd due to on-board regulator. This next  
generation Peregrine DSA is available in a 4x4 mm 24 lead  
QFN footprint.  
HaRP™-enhanced UltraCMOS™ device  
Attenuation: 0.25 dB steps to 31.75 dB  
High Linearity: Typical +57 dBm IIP3  
Excellent low-frequency performance  
3.3 V or 5.0 V Power Supply Voltage  
Fast switch settling time  
Programming Modes:  
Direct Parallel  
Latched Parallel  
Serial  
The PE43702 is manufactured on Peregrine’s UltraCMOS™  
process, a patented variation of silicon-on-insulator (SOI)  
technology on a sapphire substrate, offering the performance  
of GaAs with the economy and integration of conventional  
CMOS.  
High-attenuation state @ power-up (PUP)  
CMOS Compatible  
No DC blocking capacitors required  
Packaged in a 24-lead 4x4x0.85 mm QFN  
Figure 1. Package Type  
24-lead 4x4x0.85 mm QFN Package  
Figure 2. Functional Schematic Diagram  
RF Output  
RF Input  
7
Parallel Control  
Serial In  
Control Logic Interface  
CLK  
LE  
P/S  
Document No. 70-0244-03 www.psemi.com  
©2008-2009 Peregrine Semiconductor Corp. All rights reserved.  
Page 1 of 11  
PE43702  
Product Specification  
Table 1. Electrical Specifications @ +25°C, VDD = 3.3 V or 5.0 V  
Parameter  
Frequency Range  
Attenuation Range  
Insertion Loss  
Test Conditions  
Frequency  
Min  
Typical  
DC – 4  
0 – 31.75  
2.0  
Max  
Units  
GHz  
dB  
0.25 dB Step  
DC - 4 GHz  
2.5  
dB  
±(0.2 + 3%)  
±(0.3 + 4%)  
0 dB - 7.75 dB Attenuation settings  
8 dB - 31.75 dB Attenuation settings  
DC - 4 GHz  
DC - 4 GHz  
dB  
dB  
Attenuation Error  
Return Loss  
DC - 4 GHz  
DC - 4 GHz  
20 MHz - 4 GHz  
20 MHz - 4 GHz  
1MHz  
18  
44  
dB  
deg  
Relative Phase  
P1dB  
All States  
Input  
30  
32  
dBm  
dBm  
dBm  
mVpp  
IIP3  
Two tones at +18 dBm, 20 MHz spacing  
57  
Typical Spurious Value  
Video Feed Through  
-110  
10  
Switching Time  
RF Trise/Tfall  
50% DC CTRL to 10% / 90% RF  
10% / 90% RF  
650  
400  
ns  
ns  
RF settled to within 0.05 dB of final value.  
RBW = 5 MHz, Averaging ON.  
Settling Time  
4
µs  
Performance Plots  
Figure 3. 0.25dB Step Error vs. Frequency*  
Figure 4. 0.25dB Attenuation vs. Attenuation State  
200MHz  
900MHz  
1800MHz  
4000MHz  
2200MHz  
3000MHz  
35  
0.7  
0.6  
0.5  
0.4  
0.3  
0.2  
0.1  
0
900 MHz  
2200 MHz  
30  
3800 MHz  
25  
20  
15  
10  
5
0
0
2
4
6
8
10 12 14 16 18 20 22 24 26 28 30 32  
0
5
10  
15  
20  
25  
30  
35  
Attenuation Setting (dB.)  
Attenuation State  
*Monotonicity is held so long as Step-Error does not cross zero  
Figure 5. 0.25dB Major State Bit Error  
Figure 6. 0.25dB Attenuation Error vs. Frequency  
0.25dB State  
4dB State  
0.5 dB State  
8dB State  
1dB State  
16dB State  
2dB State  
31.75dB State  
200MHz  
2200MHz  
3000MHz  
4000MHz  
2
1.5  
1
2.00  
1.50  
1.00  
0.50  
0.00  
-0.50  
-1.00  
-1.50  
-2.00  
0.5  
0
-0.5  
-1  
-1.5  
-2  
0.0  
1.0  
2.0  
Frequency (GHz)  
3.0  
4.0  
0
5
10  
15  
20  
25  
30  
35  
Attenuation Setting (dB.)  
©2008-2009 Peregrine Semiconductor Corp. All rights reserved.  
Document No. 70-0244-03 UltraCMOS™ RFIC Solutions  
Page 2 of 11  
PE43702  
Product Specification  
Figure 7. Insertion Loss vs. Temperature  
Figure 8. Input Return Loss vs. Attenuation  
@ T = +25C  
0dB  
4dB  
0.25dB  
8dB  
0.5dB  
16dB  
1dB  
2dB  
-40C  
+25C  
+85C  
31.75dB  
0
-0.5  
-1  
0
-5  
-10  
-15  
-20  
-25  
-30  
-35  
-40  
-1.5  
-2  
-2.5  
-3  
-3.5  
0
1
2
3
4
5
6
7
8
9
0
1
2
3
4
5
6
7
8
9
Frequency (GHz.)  
Frequency (GHz.)  
Figure 10. Relative Phase vs. Frequency  
Figure 9. Output Return Loss vs. Attenuation  
@ T = +25C  
0dB  
4dB  
0.25dB  
8dB  
0.5dB  
16dB  
1dB  
31.75dB  
2dB  
0dB  
4dB  
0.25dB  
8dB  
0.5dB  
16dB  
1dB  
2dB  
31.75dB  
0
-5  
140  
120  
100  
80  
-10  
-15  
-20  
-25  
-30  
-35  
-40  
-45  
60  
40  
20  
0
0
1
2
3
4
5
6
7
8
9
0
1
2
3
4
5
6
7
8
Frequency (GHz.)  
Frequency(GHz.)  
Figure 12. Input IP3 vs. Frequency  
Figure 11. Attenuation Error vs. Temperature  
@ 4 GHz  
0dB  
4dB  
0.25dB  
8dB  
0.5dB  
16dB  
1dB  
31.75dB  
2dB  
-40C  
+25C  
+85C  
2
1.5  
1
70  
65  
60  
55  
50  
45  
40  
35  
30  
0.5  
0
-0.5  
-1  
-1.5  
-2  
0
5
10  
15  
20  
25  
30  
35  
0
500 1000 1500 2000 2500 3000 3500 4000 4500  
Attenuation Setting (dB.)  
Frequency (MHz)  
Document No. 70-0244-03 www.psemi.com  
©2008-2009 Peregrine Semiconductor Corp. All rights reserved.  
Page 3 of 11  
PE43702  
Product Specification  
Figure 13. Pin Configuration (Top View)  
Table 3. Operating Ranges  
Parameter  
Min  
Typ  
3.3  
5.0  
50  
Max  
Units  
VDD Power Supply Voltage  
3.0  
V
V
VDD Power Supply Voltage  
IDD Power Supply Current  
Digital Input High  
5.5  
350  
5.5  
1
C0.25  
VDD  
18  
17  
16  
SI  
µA  
V
2
3
4
CLK  
LE  
Exposed  
Solder  
Pad  
2.6  
P/S  
PIN Input power (50):  
15 GND  
14 RF2  
GND  
RF1  
1 Hz 20 MHz  
Fig. 14 dBm  
5
6
20 MHz 4 GHz  
+23  
dBm  
13  
GND  
GND  
T
OP Operating temperature range  
-40  
0
25  
85  
°C  
Digital Input Low  
1
V
Digital Input Leakage1  
15  
µA  
Note 1. Input leakage current per Control pin  
Table 2. Pin Descriptions  
Table 4. Absolute Maximum Ratings  
Pin No. Pin Name  
Description  
Symbol  
VDD  
Parameter/Conditions  
Power supply voltage  
Min  
-0.3  
-0.3  
-65  
Max  
6.0  
Units  
V
1
2
C0.25  
VDD  
Attenuation control bit, 0.25 dB  
Power supply pin  
VI  
Voltage on any Digital input  
Storage temperature range  
Input power (50)  
5.8  
V
3
P/S  
GND  
RF1  
GND  
RF2  
GND  
LE  
Serial/Parallel mode select  
Ground  
TST  
150  
°C  
4
5
RF1 port  
PIN  
1 Hz 20 MHz  
20 MHz 4 GHz  
ESD voltage (HBM)1  
ESD voltage (Machine Model)  
Fig. 14 dBm  
+23  
6 - 13  
14  
Ground  
dBm  
RF2 port  
500  
100  
V
V
VESD  
15  
Ground  
16  
Latch Enable input  
Note: 1. Human Body Model (HBM, MIL_STD 883 Method 3015.7)  
17  
CLK  
SI  
Serial interface clock input  
Serial Interface input  
Attenuation control bit, 16 dB  
Attenuation control bit, 8 dB  
Attenuation control bit, 4 dB  
Attenuation control bit, 2 dB  
Attenuation control bit, 1 dB  
Attenuation control bit, 0.5 dB  
Ground for proper operation  
Exceeding absolute maximum ratings may cause  
permanent damage. Operation should be restricted to  
the limits in the Operating Ranges table. Operation  
between operating range maximum and absolute  
maximum for extended periods may reduce reliability.  
18  
19  
C16  
C8  
20  
21  
C4  
22  
C2  
23  
C1  
Figure 14. Maximum Power Handling Capability  
24  
C0.5  
GND  
30.0  
25.0  
20.0  
15.0  
10.0  
5.0  
Paddle  
Exposed Solder Pad Connection  
The exposed solder pad on the bottom of the package  
must be grounded for proper device operation.  
Moisture Sensitivity Level  
The Moisture Sensitivity Level rating for the PE43702 in  
the 24-lead 4x4 QFN package is MSL1.  
0.0  
1.0E+03  
1.0E+04  
1.0E+05  
1.0E+06  
1.0E+07  
1.0E+08  
1.0E+09  
Hz  
Switching Frequency  
Electrostatic Discharge (ESD) Precautions  
The PE43702 has a maximum 25 kHz switching rate.  
Switching rate is defined to be the speed at which the  
DSA can be toggled across attenuation states.  
When handling this UltraCMOS™ device, observe the  
same precautions that you would use with other ESD-  
sensitive devices. Although this device contains  
circuitry to protect it from damage due to ESD,  
precautions should be taken to avoid exceeding the  
specified rating.  
Latch-Up Avoidance  
Unlike conventional CMOS devices, UltraCMOS™  
devices are immune to latch-up.  
©2008-2009 Peregrine Semiconductor Corp. All rights reserved.  
Document No. 70-0244-03 UltraCMOS™ RFIC Solutions  
Page 4 of 11  
PE43702  
Product Specification  
Table 5. Control Voltage  
Table 9. Serial Attenuation Word Truth Table  
State  
Bias Condition  
Attenuation Word  
Attenuation  
Setting  
RF1-RF2  
0 to +1.0 Vdc at 2 µA (typ)  
Low  
D0  
(LSB)  
D6  
D7  
D5  
D4  
D3  
D2  
D1  
+2.6 to +5 Vdc at 10 µA (typ)  
High  
X
X
X
X
X
X
X
X
X
L
L
L
L
L
L
L
H
H
L
L
L
L
L
L
H
L
H
L
L
L
L
L
H
L
L
H
L
L
L
L
H
L
L
L
H
L
L
L
H
L
L
L
L
H
L
L
H
L
L
L
L
L
H
L
H
L
L
L
L
L
L
H
Reference I.L.  
0.25 dB  
0.5 dB  
1 dB  
Table 6. Latch and Clock Specifications  
Shift Clock  
Latch Enable  
Function  
2 dB  
0
Shift Register Clocked  
4 dB  
Contents of shift register  
transferred to attenuator core  
X
8 dB  
16 dB  
Table 7. Parallel Truth Table  
31.75 dB  
Parallel Control Setting  
Attenuation  
Setting  
RF1-RF2  
D6  
D5  
D4  
D3  
D2  
D1  
D0  
L
L
L
L
L
L
L
H
H
L
L
L
L
L
L
H
L
H
L
L
L
L
L
H
L
L
H
L
L
L
L
H
L
L
L
H
L
L
L
H
L
L
L
L
H
L
L
H
L
L
L
L
L
H
L
H
L
L
L
L
L
L
H
Reference I.L.  
0.25 dB  
0.5 dB  
1 dB  
2 dB  
4 dB  
8 dB  
16 dB  
31.75 dB  
Table 8. Serial Register Map  
MSB (last in)  
LSB (first in)  
Q7  
Q6  
Q5  
Q4  
Q3  
Q2  
Q1  
Q0  
Bits can either be set to logic high or logic low  
D7  
D6  
D5  
D4  
D3  
D2  
D1  
D0  
Attenuation Word  
Attenuation Word is derived directly from the attenuation value. For example, to program the 12.5 dB state:  
Attenuation Word: Multiply by 4 and convert to binary 4 * 12.5 dB 50 X0110010  
Serial Input: X0110010  
Document No. 70-0244-03 www.psemi.com  
©2008-2009 Peregrine Semiconductor Corp. All rights reserved.  
Page 5 of 11  
PE43702  
Product Specification  
Programming Options  
The shift register must be loaded while LE is held  
LOW to prevent the attenuator value from  
changing as data is entered. The LE input should  
then be toggled HIGH and brought LOW again,  
latching the new data into the DSA. Attenuation  
Word truth table is listed in Table 9. A  
programming example of the serial register is  
illustrated in Table 8. The serial timing diagram is  
illustrated in Fig. 15. It is recommended that all  
parallel pins be grounded when the DSA is used  
in serial mode.  
Parallel/Serial Selection  
Either a parallel or serial interface can be used to  
control the PE43702. The P/S bit provides this  
selection, with P/S=LOW selecting the parallel  
interface and P/S=HIGH selecting the serial  
interface.  
Parallel Mode Interface  
The parallel interface consists of seven CMOS-  
compatible control lines that select the desired  
attenuation state, as shown in Table 7.  
Power-up Control Settings  
The parallel interface timing requirements are  
defined by Fig. 16 (Parallel Interface Timing  
Diagram), Table 11 (Parallel Interface AC  
Characteristics), and switching speed (Table 1).  
The PE43702 will always initialize to the maximum  
attenuation setting (31.75 dB) on power-up for  
both the serial and latched-parallel modes of  
operation and will remain in this setting until the  
user latches in the next programming word. In  
direct-parallel mode, the DSA can be preset to  
any state within the 31.75 dB range by pre-setting  
the parallel control pins prior to power-up. In this  
mode, there is a 400-µs delay between the time  
the DSA is powered-up to the time the desired  
state is set. During this power-up delay, the  
device attenuates to the maximum attenuation  
setting (31.75 dB) before defaulting to the user  
defined state. If the control pins are left floating in  
this mode during power-up, the device will default  
to the minimum attenuation setting (insertion loss  
state).  
For latched-parallel programming the Latch  
Enable (LE) should be held LOW while changing  
attenuation state control values, then pulse LE  
HIGH to LOW (per Fig. 16) to latch new  
attenuation state into device.  
For direct parallel programming, the Latch Enable  
(LE) line should be pulled HIGH. Changing  
attenuation state control values will change device  
state to new attenuation. Direct Mode is ideal for  
manual control of the device (using hardwire,  
switches, or jumpers).  
Serial Interface  
The serial interface is a 8-bit serial-in, parallel-out  
shift register buffered by a transparent latch. The  
8-bits make up the Attenuation Word that controls  
the DSA. Fig. 15 illustrates a example timing  
diagram for programming a state.  
The serial-interface is controlled using three  
CMOS-compatible signals: Serial-In (SI), Clock  
(CLK), and Latch Enable (LE). The SI and CLK  
inputs allow data to be serially entered into the  
shift register. Serial data is clocked in LSB first.  
©2008-2009 Peregrine Semiconductor Corp. All rights reserved.  
Document No. 70-0244-03 UltraCMOS™ RFIC Solutions  
Page 6 of 11  
PE43702  
Product Specification  
Figure 15. Serial Timing Diagram  
Bits can either be set to logic high or logic low  
DI[6:0]  
P/S  
TDISU  
TDIH  
TPSSU  
TPSH  
D[0]  
TCLKL  
D[1]  
D[2]  
D[3]  
D[4]  
D[5]  
D[6]  
SI  
TSISU  
TSIH  
CLK  
LE  
TCLKH  
TLESU  
TLEPW  
TPD  
VALID  
DO[6:0]  
Figure 16. Latched-Parallel/Direct-Parallel Timing Diagram  
P/S  
TPSSU  
TPSH  
VALID  
DI[6:0]  
TDISU  
TDIH  
LE  
TLEPW  
VALID  
TPD  
DO[6:0]  
TDIPD  
Table 10. Serial Interface AC Characteristics  
VDD = 3.3 or 5.0 V, -40° C < TA < 85° C, unless otherwise specified  
Table 11. Parallel and Direct Interface AC  
Characteristics  
VDD = 3.3 or 5.0 V, -40° C < TA < 85° C, unless otherwise specified  
Symbol  
Parameter  
Min Max Unit  
FCLK  
TCLKH  
TCLKL  
Serial clock frequency  
Serial clock HIGH time  
Serial clock LOW time  
-
10  
-
MHz  
ns  
Symbol  
Parameter  
Min Max Unit  
30  
30  
Latch Enable minimum  
pulse width  
TLEPW  
30  
-
ns  
-
ns  
Last serial clock rising edge  
setup time to Latch Enable  
rising edge  
TDISU  
TDIH  
TPSSU  
TPSIH  
Parallel data setup time  
Parallel data hold time  
Parallel/Serial setup time  
Parallel/Serial hold time  
100  
100  
100  
100  
-
-
-
-
ns  
ns  
ns  
ns  
TLESU  
10  
-
ns  
TLEPW  
TSISU  
TSIH  
Latch Enable min. pulse width  
Serial data setup time  
Serial data hold time  
30  
10  
-
-
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
10  
-
Digital register delay  
(internal)  
TDISU  
TDIH  
Parallel data setup time  
Parallel data hold time  
Address setup time  
100  
100  
100  
100  
100  
100  
-
-
TPD  
-
-
10  
5
ns  
ns  
-
Digital register delay  
(internal, direct mode only)  
TDIPD  
TASU  
TAH  
-
Address hold time  
-
TPSSU  
TPSH  
TPD  
Parallel/Serial setup time  
Parallel/Serial hold time  
Digital register delay (internal)  
-
-
10  
Note:  
fClk is verified during the functional pattern test. Serial  
programming sections of the functional pattern are clocked  
at 10 MHz to verify fclk specification.  
Document No. 70-0244-03 www.psemi.com  
©2008-2009 Peregrine Semiconductor Corp. All rights reserved.  
Page 7 of 11  
PE43702  
Product Specification  
Figure 17. Evaluation Board Layout  
Peregrine Specification 101-0310  
Evaluation Kit  
The Digital Attenuator Evaluation Kit board was  
designed to ease customer evaluation of the  
PE43702 Digital Step Attenuator.  
Direct-Parallel Programming Procedure  
For automated direct-parallel programming,  
connect the test harness provided with the EVK  
from the parallel port of the PC to the J1 & Serial  
header pin and set the D0-D6 SP3T switches to  
the ‘MIDDLE’ toggle position. Position the  
Parallel/Serial (P/S) select switch to the Parallel  
(or left) position. The evaluation software is  
written to operate the DSA in either Parallel or  
Serial-Addressable Mode. Ensure that the  
software is set to program in Direct-Parallel mode.  
Using the software, enable or disable each setting  
to the desired attenuation state. The software  
automatically programs the DSA each time an  
attenuation state is enabled or disabled.  
For manual direct-parallel programming,  
disconnect the test harness provided with the EVK  
from the J1 and Serial header pins. Position the  
Parallel/Serial (P/S) select switch to the Parallel  
(or left) position. The LE pin on the Serial header  
must be tied to VDD. Switches D0-D6 are SP3T  
switches which enable the user to manually  
program the parallel bits. When any input D0-D6  
is toggled ‘UP’, logic high is presented to the  
parallel input. When toggled ‘DOWN’, logic low is  
presented to the parallel input. Setting D0-D6 to  
the ‘MIDDLE’ toggle position presents an OPEN,  
which forces an on-chip logic low. Table 9 depicts  
the parallel programming truth table and Fig. 16  
illustrates the parallel programming timing  
diagram.  
Note: Reference Figure 18 for Evaluation Board Schematic  
as the parallel bits are applied. The user must  
then pulse LE from 0V to VDD and back to 0V to  
latch the programming word into the DSA. LE  
must be logic low prior to programming the next  
word.  
Serial Programming Procedure  
Position the Parallel/Serial (P/S) select switch to  
the Serial (or right) position. The evaluation  
software is written to operate the DSA in either  
Parallel or Serial Mode. Ensure that the software  
is set to program in Serial mode. Using the  
software, enable or disable each setting to the  
desired attenuation state. The software  
automatically programs the DSA each time an  
attenuation state is enabled or disabled.  
Latched-Parallel Programming Procedure  
For automated latched-parallel programming, the  
procedure is identical to the direct-parallel  
method. The user only must ensure that Latched-  
Parallel is selected in the software.  
For manual latched-parallel programming, the  
procedure is identical to direct-parallel except now  
the LE pin on the Serial header must be logic low  
©2008-2009 Peregrine Semiconductor Corp. All rights reserved.  
Document No. 70-0244-03 UltraCMOS™ RFIC Solutions  
Page 8 of 11  
PE43702  
Product Specification  
Figure 18. Evaluation Board Schematic  
Peregrine Specification 102-0379  
VDD  
D5  
D4  
D6  
D0  
D1  
D3  
D2  
P/S  
J1  
HEADER 14  
D0  
2
4
6
1
3
5
7
9
11  
13  
2
4
6
8
10  
12  
14  
1
3
5
7
9
D1  
D2  
8
D3  
D4  
D5  
D6  
10  
12  
14  
11  
13  
C5  
C7  
C6  
SERIAL  
100pF  
100pF  
100pF  
HEADER 4  
CLK  
DATA  
LE  
1
2
3
4
C1  
C2  
CLOCK  
DATA  
LE  
C4  
C3  
100pF  
100pF  
100pF  
100pF  
GND  
VDD  
J3  
CON2  
D0  
VDD  
P/S  
1
2
3
4
5
6
18  
17  
16  
15  
14  
13  
CP25  
VDD  
S/P  
SI  
CLK  
LE  
1
2
C9  
C10  
100pF  
U1  
C8  
100pF  
C13  
100pF  
C14  
100pF  
GND  
RF1  
GND  
RF2  
GND  
0.1µF  
43X0X DSA 50 Ohm 4x4 MLP24  
J5  
SMA  
J4  
SMA  
Z=50 Ohm  
1
GND  
1
Z=50 Ohm  
De-embeding trace  
Z=50 Ohm  
J6  
SMA  
J7  
SMA  
1
1
Note: Capacitors C1-C8, C13, & C14 may be omitted.  
Figure 19. Package Drawing  
Document No. 70-0244-03 www.psemi.com  
©2008-2009 Peregrine Semiconductor Corp. All rights reserved.  
Page 9 of 11  
PE43702  
Product Specification  
Figure 20. Tape and Reel Drawing  
Tape Feed Direction  
Pin 1  
A0 = 4.35  
B0 = 4.35  
K0 = 1.1  
Top of  
Device  
Device Orientation in Tape  
Figure 21. Marking Specifications  
43702  
YYWW  
ZZZZZ  
YYWW = Date Code  
ZZZZZ = Last five digits of Lot Number  
Table 12. Ordering Information  
Order Code Part Marking  
Description  
Package  
Shipping Method  
Bulk or tape cut from reel  
3000 units / T&R  
PE43702MLI  
PE43702MLI-Z  
EK43702-01  
43702  
43702  
43702  
PE43702 G - 24QFN 4x4mm-75A  
PE43702 G – 24QFN 4x4mm-3000C  
PE43702 G – 24QFN 4x4mm-EK  
Green 24-lead 4x4mm QFN  
Green 24-lead 4x4mm QFN  
Evaluation Kit  
1 / Box  
©2008-2009 Peregrine Semiconductor Corp. All rights reserved.  
Document No. 70-0244-03 UltraCMOS™ RFIC Solutions  
Page 10 of 11  
PE43702  
Product Specification  
Sales Offices  
The Americas  
Peregrine Semiconductor Corporation  
Peregrine Semiconductor, Asia Pacific (APAC)  
Shanghai, 200040, P.R. China  
Tel: +86-21-5836-8276  
Fax: +86-21-5836-7652  
9380 Carroll Park Drive  
San Diego, CA 92121  
Tel: 858-731-9400  
Fax: 858-731-9499  
Peregrine Semiconductor, Korea  
#B-2607, Kolon Tripolis, 210  
Geumgok-dong, Bundang-gu, Seongnam-si  
Gyeonggi-do, 463-943 South Korea  
Tel: +82-31-728-3939  
Europe  
Peregrine Semiconductor Europe  
Bâtiment Maine  
Fax: +82-31-728-3940  
13-15 rue des Quatre Vents  
F-92380 Garches, France  
Tel: +33-1-4741-9173  
Fax : +33-1-4741-9173  
Peregrine Semiconductor K.K., Japan  
Teikoku Hotel Tower 10B-6  
1-1-1 Uchisaiwai-cho, Chiyoda-ku  
Tokyo 100-0011 Japan  
Tel: +81-3-3502-5211  
Fax: +81-3-3502-5213  
High-Reliability and Defense Products  
Americas  
San Diego, CA, USA  
Phone: 858-731-9475  
Fax: 848-731-9499  
Europe/Asia-Pacific  
Aix-En-Provence Cedex 3, France  
Phone: +33-4-4239-3361  
Fax: +33-4-4239-7227  
For a list of representatives in your area, please refer to our Web site at: www.psemi.com  
Data Sheet Identification  
Advance Information  
The information in this data sheet is believed to be reliable.  
However, Peregrine assumes no liability for the use of this  
information. Use shall be entirely at the user’s own risk.  
The product is in a formative or design stage. The data  
sheet contains design target specifications for product  
development. Specifications and features may change in  
any manner without notice.  
No patent rights or licenses to any circuits described in this  
data sheet are implied or granted to any third party.  
Preliminary Specification  
Peregrine’s products are not designed or intended for use in  
devices or systems intended for surgical implant, or in other  
applications intended to support or sustain life, or in any  
application in which the failure of the Peregrine product could  
create a situation in which personal injury or death might occur.  
Peregrine assumes no liability for damages, including  
consequential or incidental damages, arising out of the use of  
its products in such applications.  
The data sheet contains preliminary data. Additional data  
may be added at a later date. Peregrine reserves the right  
to change specifications at any time without notice in order  
to supply the best possible product.  
Product Specification  
The data sheet contains final data. In the event Peregrine  
decides to change the specifications, Peregrine will notify  
customers of the intended changes by issuing a DCN  
(Document Change Notice).  
The Peregrine name, logo, and UTSi are registered trademarks  
and UltraCMOS, HaRP, MultiSwitch and DuNE are trademarks  
of Peregrine Semiconductor Corp.  
Document No. 70-0244-03 www.psemi.com  
©2008-2009 Peregrine Semiconductor Corp. All rights reserved.  
Page 11 of 11  

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