P3C1041-12TI

更新时间:2024-09-18 06:03:11
品牌:PYRAMID
描述:HIGH SPEED 256K x 16 (4 MEG) STATIC CMOS RAM

P3C1041-12TI 概述

HIGH SPEED 256K x 16 (4 MEG) STATIC CMOS RAM 高速256K ×16 ( 4 MEG )静态CMOS RAM SRAM

P3C1041-12TI 规格参数

是否无铅:含铅是否Rohs认证:不符合
生命周期:Active零件包装代码:TSOP2
包装说明:TSOP2,针数:44
Reach Compliance Code:compliantECCN代码:3A991.B.2.A
HTS代码:8542.32.00.41风险等级:5.84
Is Samacsys:N最长访问时间:12 ns
JESD-30 代码:R-PDSO-G44JESD-609代码:e0
长度:18.415 mm内存密度:4194304 bit
内存集成电路类型:STANDARD SRAM内存宽度:16
功能数量:1端子数量:44
字数:262144 words字数代码:256000
工作模式:ASYNCHRONOUS最高工作温度:85 °C
最低工作温度:-40 °C组织:256KX16
封装主体材料:PLASTIC/EPOXY封装代码:TSOP2
封装形状:RECTANGULAR封装形式:SMALL OUTLINE, THIN PROFILE
并行/串行:PARALLEL峰值回流温度(摄氏度):NOT SPECIFIED
认证状态:Not Qualified座面最大高度:1.1938 mm
最大供电电压 (Vsup):3.6 V最小供电电压 (Vsup):3 V
标称供电电压 (Vsup):3.3 V表面贴装:YES
技术:CMOS温度等级:INDUSTRIAL
端子面层:TIN LEAD端子形式:GULL WING
端子节距:0.8 mm端子位置:DUAL
处于峰值回流温度下的最长时间:NOT SPECIFIED宽度:10.16 mm
Base Number Matches:1

P3C1041-12TI 数据手册

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P3C1041  
HIGH SPEED 256K x 16 (4 MEG)  
STATIC CMOS RAM  
FEATURES  
Easy Memory Expansion Using CE and OE  
High Speed (Equal Access and Cycle Times)  
— 10/12/15/20 ns (Commercial)  
— 12/15/20 ns (Industrial)  
Low Power  
Inputs  
Fully TTL Compatible Inputs and Outputs  
Advanced CMOS Technology  
Fast tOE  
— 325 mW (max.)  
Automatic Power Down when deselected  
Packages  
Single 3.3V ± 0.3V Power Supply  
2.0V Data Retention  
—44-Pin SOJ, TSOP II  
DESCRIPTION  
The P3C1041 device provides asynchronous operation  
with matching access and cycle times. Memory loca-  
tions are specified on address pinsA0 toA17. Reading is  
accomplished by device selection (CE and output en-  
abling (OE) while write enable (WE) remains HIGH. By  
presenting the address under these conditions, the data  
in the addressed memory location is presented on the  
data input/output pins. The input/output pins stay in the  
HIGH Z state when either CE or OE is HIGH or WE is  
LOW.  
The P3C1041 is a 262,144 words by 16 bits high-speed  
CMOS static RAM. The CMOS memory requires no  
clocks or refreshing, and has equal access and cycle  
times. Inputs are fully TTL-compatible. The RAM oper-  
ates from a single 3.3V ± 0.3V tolerance power  
supply.  
Access times as fast as 10 nanoseconds permit greatly  
enhanced system operating speeds. CMOS is utilized  
to reduce power consumption to a low level. The P3C1041  
is a member of a family of PACE RAM™ products offer-  
ing fast access times.  
Package options for the P3C1041 include 44-pin SOJ  
and TSOP packages.  
PIN CONFIGURATION  
FUNCTIONAL BLOCK DIAGRAM  
SOJ  
TSOPII  
Document # SRAM130 REV OR  
Revised October 2005  
1
P3C1041  
MAXIMUMRATINGS(1)  
Symbol  
Parameter  
Value  
Unit  
Symbol  
Parameter  
Value  
Unit  
VCC  
Power Supply Pin with  
Respect to GND  
–0.5 to +4.6  
V
TBIAS  
TemperatureUnder  
Bias  
–55 to +125  
°C  
TerminalVoltagewith  
Respect to GND  
–0.5 to  
TSTG  
IOUT  
StorageTemperature  
DCOutputCurrent  
–65 to +150  
20  
°C  
mA  
VTERM  
TA  
VCC +0.5  
V
OperatingTemperature  
–55 to +125 °C  
CAPACITANCES(4)  
RECOMMENDED OPERATING  
VCC = 3.3V, TA = 25°C, f = 1.0MHz  
TEMPERATURE AND SUPPLY VOLTAGE  
Ambient  
VCC  
Grade(2)  
GND  
Parameter  
Typ.  
Symbol  
Conditions  
Unit  
Temperature  
–40°C to +85°C  
0°C to +70°C  
VIN = 0V  
pF  
pF  
CIN  
Input Capacitance  
Output Capacitance  
8
8
0V  
0V  
3.3V ± 0.3V  
3.3V ± 0.3V  
Industrial  
Commercial  
VOUT = 0V  
COUT  
DC ELECTRICAL CHARACTERISTICS  
Overrecommendedoperatingtemperatureandsupplyvoltage(2)  
P3C1041  
Symbol  
Parameter  
Test Conditions  
Unit  
Min  
Max  
VIH  
VIL  
2.0  
–0.3(3)  
VCC +0.3  
Input High Voltage  
Input Low Voltage  
V
V
0.8  
VOL  
Output Low Voltage  
(TTL Load)  
IOL = +8 mA, VCC = Min.  
IOH = –4 mA, VCC = Min.  
0.4  
V
VOH  
Output High Voltage  
(TTL Load)  
2.4  
-1  
V
+1  
+1  
µA  
VCC = Max.  
VIN = GND to VCC  
ILI  
Input Leakage Current  
Output Leakage Current  
µA  
-1  
VCC = Max.,  
CE = VIH,  
ILO  
VOUT = GND to VCC  
___  
40  
10  
mA  
CE VIH  
VCC= Max,  
f = Max., Outputs Open  
VIN VIH orVIN VIL  
Standby Power Supply  
ISB  
Current (TTL Input Levels)  
___  
mA  
CE VCC - 0.2V  
VCC= Max,  
Standby Power Supply  
Current  
ISB1  
f = 0, Outputs Open  
VIN VCC - 0.3V or  
VIN 0.3V  
(CMOS Input Levels)  
Document # SRAM130 REV OR  
Page 2 of 10  
P3C1041  
POWER DISSIPATION CHARACTERISTICS VS. SPEED  
Temperature  
Symbol  
Parameter  
Unit  
Range  
–12 –15 –20  
–10  
90  
N/A  
mA  
mA  
Commercial  
Industrial  
75  
85  
80  
ICC  
Dynamic Operating Current*  
85  
95  
90  
*VCC = 3.6V. Tested with outputs open. f = Max. Switching inputs are 0V and 3V. CE = VIL, OE = VIH.  
AC ELECTRICAL CHARACTERISTICS—READ CYCLE  
(VCC = 3.3V ± 0.3V, All Temperature Ranges)(2)  
-10  
-12  
-15  
-20  
Min Max  
Sym.  
Parameter  
Unit  
Min  
Max  
Max  
Min  
Max  
Min  
tRC  
tAA  
12  
10  
15  
ReadCycleTime  
20  
20  
ns  
ns  
12  
12  
Address Access Time  
10  
10  
15  
15  
tAC  
20  
ns  
Chip Enable Access Time  
OutputHoldfromAddressChange  
Chip Enable to Output in Low Z  
ns  
ns  
3
3
3
3
3
3
3
3
tOH  
tLZ  
tHZ  
tOE  
8
8
ns  
ns  
Chip Disable to Output in High Z  
Output Enable Low to Data Valid  
5
5
6
6
7
7
tOLZ  
tOHZ  
tPU  
ns  
ns  
ns  
Output Enable Low to Low Z  
Output Enable High to High Z  
Chip Enable to Power Up Time  
0
0
0
0
0
0
0
8
0
5
6
7
Chip Disable to Power Down Time  
Byte Enable to Data Valid  
tPD  
tBE  
tLZBE  
tHZBE  
ns  
ns  
10  
5
12  
6
15  
7
20  
8
0
0
Byte Enable to Low Z  
Byte Disable to High Z  
0
0
ns  
ns  
6
6
7
8
Document # SRAM130 REV OR  
Page 3 of 10  
P3C1041  
TIMING WAVEFORM OF READ CYCLE NO. 1  
TIMING WAVEFORM OF READ CYCLE NO. 2 (OE CONTROLLED)(5,6)  
Notes:  
1. Stresses greater than those listed under MAXIMUM RATINGS may  
cause permanent damage to the device. This is a stress rating only  
and functional operation of the device at these or any other conditions  
above those indicated in the operational sections of this specification  
is not implied. Exposure to MAXIMUM rating conditions for extended  
periods may affect reliability.  
4. This parameter is sampled and not 100% tested.  
5. WE is HIGH for READ cycle.  
6. CE is LOW and OE is LOW for READ cycle.  
7. ADDRESSmustbevalidpriorto,orcoincidentwithCE transitionLOW.  
8. Transition is measured ± 200 mV from steady state voltage prior to  
change, with loading as specified in Figure 1. This parameter is  
sampled and not 100% tested.  
2. Extended temperature operation guaranteed with 400 linear feet per  
minute of air flow.  
3. Transient inputs with VIL not more negative than –2.0V and  
9. Read Cycle Time is measured from the last valid address to the first  
transitioning address.  
VIH VCC + 0.5V, are permissible for pulse widths up to 20ns.  
Document # SRAM130 REV OR  
Page 4 of 10  
P3C1041  
AC CHARACTERISTICS—WRITE CYCLE  
(VCC = 3.3V ± 0.3V, All Temperature Ranges)(2)  
-10  
-12  
-15  
-20  
Parameter  
Unit  
Sym.  
Max  
Min  
10  
7
Max  
Min  
12  
8
Max  
Min  
15  
Min  
20  
Max  
tWC  
tCW  
Write Cycle Time  
ns  
ns  
Chip Enable Time to End of  
Write  
10  
10  
tAW  
tAS  
Address Valid to End of Write  
7
8
10  
10  
ns  
Address Set-up Time to Write  
Start  
Write Pulse Width  
0
7
0
5
0
8
0
6
0
10  
0
0
10  
0
ns  
ns  
ns  
ns  
tWP  
tAH  
tDW  
AddressHoldTime  
Data Valid to End of Write  
7
8
tDH  
tWZ  
DataHoldTime  
0
0
0
0
ns  
ns  
Write Enable to Output in High Z  
5
6
7
8
tOW  
Output Active from End of Write  
5
3
5
3
0
3
0
3
ns  
ns  
tLZWE WE High to Low Z  
tBW Byte Enable to End of Write  
7
8
10  
10  
ns  
TIMING WAVEFORM OF WRITE CYCLE NO. 1 (CE CONTROLLED)  
Document # SRAM130 REV OR  
Page 5 of 10  
P3C1041  
TIMING WAVEFORM OF WRITE CYCLE NO. 2 (BLE OR BHE CONTROLLED)  
TIMING WAVEFORM OF WRITE CYCLE NO. 3 (WE CONTROLLED, OE LOW)  
Document # SRAM130 REV OR  
Page 6 of 10  
P3C1041  
AC TEST CONDITIONS  
InputPulseLevels  
GND to 3.0V  
Input Rise and Fall Times  
InputTimingReferenceLevel  
OutputTimingReferenceLevel  
OutputLoad  
3ns  
1.5V  
1.5V  
See Figures 1 and 2  
Figure 1. Output Load  
Figure2. TheveninEquivalent  
* including scope and test fixture.  
Note:  
Because of the ultra-high speed of the P3C1041, care must be taken  
when testing this device; an inadequate setup can cause a normal  
functioning part to be rejected as faulty. Long high-inductance leads  
that cause supply bounce must be avoided by bringing the VCC and  
ground planes directly up to the contactor fingers. A 0.01 µF high  
frequency capacitor is also required between VCC and ground. To avoid  
signal reflections, proper termination must be used; for example, a 50Ω  
test environment should be terminated into a 50load with 1.73V  
(Thevenin Voltage) at the comparator input, and a 116resistor must  
be used in series with DOUT to match 166(Thevenin Resistance).  
TRUTH TABLE  
CE OE W E BLE BHE I/O0 - I/O7  
I/O8 - I/O15  
High Z  
DOUT  
Power  
Standby  
Active  
Active  
Active  
Mode  
H
L
X
L
X
H
X
L
X
L
High Z  
DOUT  
Power-down  
Read All Bits  
L
L
L
L
H
H
L
H
L
DOUT  
High Z  
DOUT  
Read Lower Bits Only  
Read Upper Bits Only  
Write All Bits  
H
High Z  
L
L
L
L
X
X
X
H
L
L
L
L
L
H
L
DIN  
DIN  
DIN  
High Z  
DIN  
Active  
Active  
Active  
Active  
Write Lower Bits Only  
L
H
H
X
High Z  
High Z  
Write Upper Bits Only  
Selected, Outputs Disabled  
X
High Z  
Document # SRAM130 REV OR  
Page 7 of 10  
P3C1041  
ORDERING INFORMATION  
Document # SRAM130 REV OR  
Page 8 of 10  
P3C1041  
SOJ SMALL OUTLINE IC PACKAGE  
Pkg #  
J8  
# Pins  
44 (400 mil)  
Symbol  
Min  
Max  
0.148  
-
0.023  
0.013  
1.130  
A
A1  
b
0.128  
0.082  
0.013  
0.007  
1.120  
C
D
e
0.050 BSC  
E
0.435  
0.395  
0.445  
0.405  
E1  
E2  
Q
0.370 BSC  
0.025  
-
TSOP II THIN SMALL OUTLINE PACKAGE  
Pkg #  
# Pins  
Symbol  
T2  
44  
Min  
Max  
A
A2  
b
0.039  
0.033  
0.012  
0.396  
0.721  
0.047  
0.042  
0.016  
0.404  
0.729  
D
E
e
HD  
0.0315 BSC  
0.462 0.470  
Document # SRAM130 REV OR  
Page 9 of 10  
P3C1041  
REVISIONS  
DOCUMENTNUMBER:  
DOCUMENTTITLE:  
SRAM130  
P3C1041 HIGH SPEED 256K x 16 (4 MEG) STATIC CMOS RAM  
ORIG. OF  
CHANGE  
ISSUE  
REV.  
DESCRIPTIONOFCHANGE  
DATE  
OR  
Oct-05  
JDB  
NewDataSheet  
Document # SRAM130 REV OR  
Page 10 of 10  

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