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IXFK27N80Q HiPerFET Power MOSFETs Q-CLASS
型号:   IXFK27N80Q
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描述:   HiPerFET Power MOSFETs Q-CLASS
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品牌   IXYS [ IXYS CORPORATION ]
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  浏览型号IXFK27N80Q的Datasheet PDF文件第2页  
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HiPerFET
TM
Power MOSFETs
Q-CLASS
Single MOSFET Die
IXFK 27N80Q
IXFR 27N80Q
IXFX 27N80Q
V
DSS
I
D25
R
DS(on)
= 800 V
=
27 A
= 300 mW
t
rr
£
250 ns
PLUS 247
TM
(IXFX)
N-Channel Enhancement Mode
Avalanche Rated, Low Qg, High dV/dt, Low t
rr
G
(TAB)
D
Symbol
V
DSS
V
DGR
V
GS
V
GSM
I
D25
I
DM
I
AR
E
AR
E
AS
dv/dt
P
D
T
J
T
JM
T
stg
T
L
M
d
Weight
Test Conditions
T
J
= 25°C to 150°C
T
J
= 25°C to 150°C; R
GS
= 1 MW
Continuous
Transient
T
C
= 25°C
T
C
= 25°C, pulse width limited by T
JM
T
C
= 25°C
T
C
= 25°C
T
C
= 25°C
I
S
£
I
DM
, di/dt
£
100 A/ms, V
DD
£
V
DSS
T
J
£
150°C, R
G
= 2
W
T
C
= 25°C
Maximum Ratings
800
800
±20
±30
27
108
27
60
2.5
5
500
-55 ... +150
150
-55 ... +150
V
V
V
V
A
A
A
mJ
J
V/ns
W
°C
°C
°C
°C
Nm/lb.in.
6
10
g
g
TO-264 AA (IXFK)
G
D
S
(TAB)
ISOPLUS 247
TM
(IXFR)
E153432
G
D
Isolated back surface*
G = Gate
S = Source
D = Drain
TAB = Drain
1.6 mm (0.063 in.) from case for 10 s
Mounting torque
TO-264
PLUS 247/ISOPLUS 247
TO-264
0.4/6
300
Features
• IXYS advanced low Q
g
process
• Low gate charge and capacitances
- easier to drive
- faster switching
• International standard packages
• Low R
DS (on)
• Rated for unclamped Inductive load
switching (UIS) rated
• Molding epoxies meet UL 94 V-0
flammability classification
Applications
• DC-DC converters
• Battery chargers
• Switched-mode and resonant-mode
power supplies
• DC choppers
• AC motor control
• Temperature and lighting controls
Advantages
• PLUS 247
TM
package for clip or spring
mounting
• Space savings
• High power density
98722 (05/22/00)
Symbol
Test Conditions
Characteristic Values
(T
J
= 25°C, unless otherwise specified)
min. typ. max.
800
2.0
V
4.5 V
±100
nA
100
mA
2 mA
300 mW
V
DSS
V
GS(th)
I
GSS
I
DSS
R
DS(on)
V
GS
= 0 V, I
D
= 250uA
V
DS
= V
GS
, I
D
= 4mA
V
GS
=
±20
V, V
DS
= 0
V
DS
= V
DSS
V
GS
= 0 V
V
GS
= 10 V, I
D
= 0.5 • I
D25
Note 1
T
J
= 125°C
IXYS reserves the right to change limits, test conditions, and dimensions.
© 2000 IXYS All rights reserved
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