2SJ408L [RENESAS]

50A, 60V, 0.028ohm, P-CHANNEL, Si, POWER, MOSFET, HDPAK-3;
2SJ408L
型号: 2SJ408L
厂家: RENESAS TECHNOLOGY CORP    RENESAS TECHNOLOGY CORP
描述:

50A, 60V, 0.028ohm, P-CHANNEL, Si, POWER, MOSFET, HDPAK-3

开关 脉冲 晶体管
文件: 总10页 (文件大小:61K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
2SJ408(L), 2SJ408(S)  
Silicon P-Channel MOS FET  
November 1996  
Application  
High speed power switching  
Features  
Low on-resistance  
High speed switching  
Low drive current  
4 V gate drive device can be driven from 5 V source  
Suitable for Switching regulator, DC - DC converter  
Avalanche Ratings  
Outline  
4
HDPAK  
4
3
1
2
D
1
2
3
G
1. Gate  
2. Drain  
3. Source  
4. Drain  
S
2SJ408(L), 2SJ408(S)  
Absolute Maximum Ratings  
(Ta = 25°C)  
Item  
Symbol  
VDSS  
Ratings  
–60  
Unit  
V
Drain to source voltage  
Gate to source voltage  
Drain current  
VGSS  
±20  
V
ID  
–50  
A
1
Drain peak current  
ID(pulse)  
IDR  
IAP*3  
EAR*3  
*
–200  
–50  
A
Body to drain diode reverse drain current  
Avalanche current  
A
–50  
A
Avalanche energy  
214  
mJ  
W
°C  
°C  
Channel dissipation  
Pch*2  
100  
Channel temperature  
Storage temperature  
Tch  
150  
Tstg  
–55 to +150  
Notes 1. PW 10 µs, duty cycle 1%  
2. Value at Tc = 25°C  
3. Value at Tch = 25°C, Rg 50 Ω  
2
2SJ408(L), 2SJ408(S)  
Electrical Characteristics  
(Ta = 25°C)  
Item  
Symbol Min  
Typ  
Max  
Unit  
Test conditions  
Drain to source breakdown  
voltage  
V(BR)DSS  
V(BR)GSS  
IGSS  
–60  
V
ID = –10 mA, VGS = 0  
Gate to source breakdown  
voltage  
±20  
V
IG = ±100 µA, VDS = 0  
Gate to source leak current  
±10  
µA  
µA  
V
VGS = ±16 V, VDS = 0  
VDS = –50 V, VGS = 0  
ID = –1 mA, VDS = –10 V  
Zero gate voltage drain current IDSS  
Gate to source cutoff voltage VGS(off)  
–250  
–2.25  
–1.0  
Static drain to source on state RDS(on)  
resistance  
0.015 0.02  
ID = –25 A  
VGS = –10 V*1  
30  
0.02  
50  
0.028  
ID = –25 A  
VGS = –4 V*1  
Forward transfer admittance  
Input capacitance  
|yfs|  
S
ID = –25 A  
VDS = –10 V*1  
Ciss  
8200  
pF  
VDS = –10 V  
VGS = 0  
f = 1 MHz  
Output capacitance  
Coss  
3650  
750  
55  
pF  
pF  
ns  
Reverse transfer capacitance Crss  
Turn-on delay time  
td(on)  
ID = –25 A  
VGS = –10 V  
RL = 1.2 Ω  
Rise time  
tr  
340  
ns  
ns  
ns  
V
Turn-off delay time  
Fall time  
td(off)  
tf  
1150  
620  
Body to drain diode forward  
voltage  
VDF  
–1.0  
IF = –50 A, VGS = 0  
Body to drain diode reverse  
recovery time  
trr  
250  
ns  
IF = –50 A, VGS = 0,  
diF/dt = 50 A/µs  
Note 1. Pulse Test  
3
2SJ408(L), 2SJ408(S)  
Power vs. Temperature Derating  
150  
100  
50  
0
50  
100  
150  
Case Temperature Tc (°C)  
Maximum Safe Operation Area  
–1000  
–300  
–100  
–30  
Operation in  
this area is  
limited by R  
–10  
DS(on)  
–3  
–1  
Ta = 25 °C  
–20  
–0.5 –1 –2  
–5 –10  
–50 –100  
Drain to Source Voltage  
V
(V)  
DS  
Typical Output Characteristics  
–100  
–80  
–60  
–40  
–20  
Pulse Test  
–10 V  
–6 V  
–4 V  
–3.5 V  
–3 V  
V
= –2.5 V  
–8  
GS  
0
–2  
–4  
–6  
–10  
(V)  
Drain to Source Voltage  
V
DS  
4
2SJ408(L), 2SJ408(S)  
Typical Transfer Characteristics  
–50  
–40  
–30  
–20  
–10  
V
= –10 V  
DS  
Pulse Test  
25°C  
Tc = 75°C  
–25°C  
0
–1  
–2  
–3  
–4  
GS  
–5  
Gate to Source Voltage  
V
(V)  
Drain to Source Saturation Voltage vs.  
Gate to Source Voltage  
–2.0  
–1.6  
–1.2  
–0.8  
–0.4  
Pulse Test  
I
= –50 A  
D
–20 A  
–10 A  
–4  
Gate to Source Voltage  
0
–2  
–6  
–8  
–10  
(V)  
V
GS  
Static Drain to Source on State Resistance  
vs. Drain Current  
100  
50  
V
GS  
= –4 V  
–10 V  
20  
10  
5
2
1
Pulse Test  
–3 –10 –30 –100 –300 –1000  
Drain Current (A)  
–1  
I
D
5
2SJ408(L), 2SJ408(S)  
Static Drain to Source on State Resistance  
vs. Temperature  
50  
Pulse Test  
40  
30  
20  
10  
I
= –50 A  
D
V
= –4 V  
–10 A  
–20 A  
GS  
–10 A  
–20 A  
–50 A  
–10 V  
0
–40  
0
40  
80  
120  
160  
Case Temperature Tc (°C)  
Forward Transfer Admittance vs.  
Drain Current  
100  
50  
Tc = –25 °C  
25 °C  
20  
10  
5
75 °C  
2
1
V
= –10 V  
DS  
Pulse Test  
0.5  
–0.3  
–30  
–0.1  
–1  
–3  
–10  
–100  
Drain Current  
I
(A)  
D
6
2SJ408(L), 2SJ408(S)  
Body to Drain Diode Reverse  
Recovery Time  
1000  
500  
200  
100  
50  
20  
10  
di / dt = 50 A / µs  
V
= 0, Ta = 25 °C  
GS  
–10  
–50  
–100  
–1 –2  
–5  
–20  
Reverse Drain Current  
I
(A)  
DR  
Typical Capacitance vs.  
Drain to Source Voltage  
100000  
V
GS  
= 0  
f = 1 MHz  
30000  
10000  
Ciss  
3000  
1000  
Coss  
Crss  
300  
100  
0
–10  
–20  
–30  
–40  
–50  
(V)  
Drain to Source Voltage  
V
DS  
Dynamic Input Characteristics  
0
–20  
–40  
–60  
0
V
= –10 V  
–25 V  
DD  
–50 V  
–4  
–8  
–12  
V
= –50 V  
–25 V  
DD  
V
DS  
–10 V  
V
GS  
–80  
–16  
–20  
I
= –50 A  
D
–100  
0
200  
400  
600  
800 1000  
Gate Charge Qg (nc)  
7
2SJ408(L), 2SJ408(S)  
Switching Characteristics  
= –10 V, V = –30 V  
5000  
V
GS  
DD  
PW = 5 µs, duty < 1 %  
2000  
1000  
500  
t
d(off)  
t
t
f
r
200  
100  
50  
t
d(on)  
–1 –2  
–5 –10 –20  
Drain Current  
–50 –100  
(A)  
I
D
Reverse Drain Current vs.  
Source to Drain Voltage  
–100  
–80  
–60  
–40  
–20  
Pulse Test  
–10 V  
–5 V  
V
= 0  
GS  
0
–0.4  
–0.8 –1.2 –1.6  
–2.0  
(V)  
Source to Drain Voltage  
V
SD  
Maximun Avalanche Energy vs.  
Channel Temperature Derating  
250  
200  
150  
100  
I
= –50 A  
AP  
V
= –25 V  
DD  
duty < 0.1 %  
Rg > 50  
50  
0
25  
50  
75  
100  
125  
150  
Channel Temperature Tch (°C)  
8
2SJ408(L), 2SJ408(S)  
Avalanche Test Circuit and Waveform  
1
V
DSS  
– V  
2
E
=
• L • I  
AP  
AR  
V
DSS  
DD  
2
L
V
DS  
Monitor  
I
AP  
V
(BR)DSS  
Monitor  
I
AP  
Rg  
V
V
DD  
D. U. T  
DS  
I
D
Vin  
–15 V  
50Ω  
V
DD  
0
Normalized Transient Thermal Impedance vs. Pulse Width  
3
1
Tc = 25°C  
D = 1  
0.5  
0.3  
0.1  
θ
θ
γ
θ
ch – c(t) = s (t) • ch – c  
ch – c = 1.25 °C/W, Tc = 25 °C  
PW  
T
P
DM  
D =  
0.03  
0.01  
PW  
T
10 µ  
100 µ  
1 m  
10 m  
100 m  
1
10  
Pulse Width PW (S)  
9
2SJ408(L), 2SJ408(S)  
When using this document, keep the following in mind:  
1. This document may, wholly or partially, be subject to change without notice.  
2. All rights are reserved: No one is permitted to reproduce or duplicate, in any form, the whole or part  
of this document without Hitachi’s permission.  
3. Hitachi will not be held responsible for any damage to the user that may result from accidents or any  
other reasons during operation of the user’s unit according to this document.  
4. Circuitry and other examples described herein are meant merely to indicate the characteristics and  
performance of Hitachi’s semiconductor products. Hitachi assumes no responsibility for any  
intellectual property claims or other problems that may result from applications based on the  
examples described herein.  
5. No license is granted by implication or otherwise under any patents or other rights of any third party  
or Hitachi, Ltd.  
6. MEDICAL APPLICATIONS: Hitachi’s products are not authorized for use in MEDICAL  
APPLICATIONS without the written consent of the appropriate officer of Hitachi’s sales company.  
Such use includes, but is not limited to, use in life support systems. Buyers of Hitachi’s products are  
requested to notify the relevant Hitachi sales offices when planning to use the products in MEDICAL  
APPLICATIONS.  
10  

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