CD40174BFMSR [RENESAS]

4000/14000/40000 SERIES, POSITIVE EDGE TRIGGERED D FLIP-FLOP, TRUE OUTPUT, CDIP16, FRIT SEALED, CERAMIC, DIP-16;
CD40174BFMSR
型号: CD40174BFMSR
厂家: RENESAS TECHNOLOGY CORP    RENESAS TECHNOLOGY CORP
描述:

4000/14000/40000 SERIES, POSITIVE EDGE TRIGGERED D FLIP-FLOP, TRUE OUTPUT, CDIP16, FRIT SEALED, CERAMIC, DIP-16

CD 输出元件 逻辑集成电路 触发器
文件: 总8页 (文件大小:71K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
CD40174BMS  
CMOS Hex ‘D’-Type Flip-Flop  
December 1992  
Features  
Pinout  
CD40174BMS  
TOP VIEW  
• High Voltage Type (20V Rating)  
• 5V, 10V and 15V Parametric Ratings  
• Standardized, Symmetrical Output Characteristics  
• 100% Tested for Quiescent Current at 20V  
CLEAR  
Q1  
1
2
3
4
5
6
7
8
16 VDD  
15 Q6  
14 D6  
13 D5  
12 Q5  
11 D4  
10 Q4  
• Maximum Input Current of 1µA at 18V Over Full Pack-  
D1  
age Temperature Range, 100nA at 18V and +25oC  
D2  
• Noise Margin (Over full Package Temperature Range):  
- 1V at VDD = 5V  
Q2  
D3  
- 2V at VDD = 10V  
Q3  
- 2.5V at VDD = 15V  
9
CLOCK  
VSS  
• Meets All Requirements of JEDEC Tentative Standard  
No. 13A, “Standard Specifications for Description of  
‘B’ Series CMOS Devices”  
Applications  
Functional Diagram  
• Shift Registers  
3
2
5
D1  
Q1  
Q2  
• Buffer/Storage Registers  
• Pattern Generators  
F/F1  
F/F2  
4
D2  
Description  
CD40174BMS consists of six identical ‘D’-Type flip-flops  
having independent DATA inputs. The CLOCK and CLEAR  
inputs are common to all six units. Data is transferred to the  
Q outputs on the positive going transition of the clock pulse.  
All six flip-flops are simultaneously reset by a low level on the  
CLEAR input.  
6
7
D3  
Q3  
Q4  
Q5  
Q6  
F/F3  
F/F4  
F/F5  
F/F6  
11  
10  
12  
15  
D4  
The CD40174BMS is supplied in these 16 lead outline pack-  
ages:  
13  
D5  
Braze Seal DIP  
Frit Seal DIP  
H4T  
H1E  
14  
D5  
Ceramic Flatpack H6W  
9
CLOCK  
1
CLEAR  
VSS = 8  
VDD = 16  
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.  
File Number 3359  
1-888-INTERSIL or 321-724-7143 | Copyright © Intersil Corporation 1999  
7-1384  
Specifications CD40174BMS  
Absolute Maximum Ratings  
Reliability Information  
DC Supply Voltage Range, (VDD) . . . . . . . . . . . . . . . -0.5V to +20V  
(Voltage Referenced to VSS Terminals)  
Thermal Resistance . . . . . . . . . . . . . . . .  
Ceramic DIP and FRIT Package . . . . . 80 C/W  
Flatpack Package . . . . . . . . . . . . . . . . 70 C/W  
θ
θ
jc  
ja  
o
o
20 C/W  
o
o
Input Voltage Range, All Inputs . . . . . . . . . . . . .-0.5V to VDD +0.5V  
DC Input Current, Any One Input . . . . . . . . . . . . . . . . . . . . . . . .±10mA  
20 C/W  
o
Maximum Package Power Dissipation (PD) at +125 C  
o
o
o
o
Operating Temperature Range. . . . . . . . . . . . . . . . -55 C to +125 C  
Package Types D, F, K, H  
For TA = -55 C to +100 C (Package Type D, F, K) . . . . . . 500mW  
o
o
For TA = +100 C to +125 C (Package Type D, F, K) . . . . .Derate  
Linearity at 12mW/ C to 200mW  
o
o
o
Storage Temperature Range (TSTG) . . . . . . . . . . . -65 C to +150 C  
o
Lead Temperature (During Soldering) . . . . . . . . . . . . . . . . . +265 C  
Device Dissipation per Output Transistor . . . . . . . . . . . . . . . 100mW  
For TA = Full Package Temperature Range (All Package Types)  
Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +175 C  
At Distance 1/16 ± 1/32 Inch (1.59mm ± 0.79mm) from case for  
10s Maximum  
o
TABLE 1. DC ELECTRICAL PERFORMANCE CHARACTERISTICS  
LIMITS  
MIN MAX UNITS  
GROUP A  
SUBGROUPS  
PARAMETER  
Supply Current  
SYMBOL  
CONDITIONS (NOTE 1)  
TEMPERATURE  
o
IDD  
VDD = 20V, VIN = VDD or GND  
1
+25 C  
-
2
200  
2
µA  
µA  
µA  
nA  
nA  
nA  
nA  
nA  
nA  
mV  
V
o
2
+125 C  
-
o
VDD = 18V, VIN = VDD or GND  
3
-55 C  
-
o
Input Leakage Current  
Input Leakage Current  
IIL  
VIN = VDD or GND  
VDD = 20  
1
+25 C  
-100  
-
o
2
+125 C  
-1000  
-
o
VDD = 18V  
VDD = 20  
3
-55 C  
-100  
-
o
IIH  
VIN = VDD or GND  
1
+25 C  
-
-
-
-
100  
1000  
100  
50  
-
o
2
+125 C  
o
VDD = 18V  
3
-55 C  
o
o
o
Output Voltage  
VOL15 VDD = 15V, No Load  
VOH15 VDD = 15V, No Load (Note 3)  
1, 2, 3  
+25 C, +125 C, -55 C  
o
o
o
Output Voltage  
1, 2, 3  
+25 C, +125 C, -55 C 14.95  
o
Output Current (Sink)  
Output Current (Sink)  
Output Current (Sink)  
IOL5  
IOL10  
IOL15  
VDD = 5V, VOUT = 0.4V  
VDD = 10V, VOUT = 0.5V  
VDD = 15V, VOUT = 1.5V  
1
+25 C  
0.53  
1.4  
3.5  
-
-
mA  
mA  
mA  
mA  
mA  
mA  
mA  
V
o
1
+25 C  
-
o
1
+25 C  
-
o
Output Current (Source) IOH5A VDD = 5V, VOUT = 4.6V  
Output Current (Source) IOH5B VDD = 5V, VOUT = 2.5V  
Output Current (Source) IOH10 VDD = 10V, VOUT = 9.5V  
Output Current (Source) IOH15 VDD = 15V, VOUT = 13.5V  
1
+25 C  
-0.53  
-1.8  
-1.4  
-3.5  
-0.7  
2.8  
o
1
+25 C  
-
o
1
+25 C  
-
o
1
1
+25 C  
-
o
N Threshold Voltage  
P Threshold Voltage  
Functional  
VNTH  
VPTH  
F
VDD = 10V, ISS = -10µA  
+25 C  
-2.8  
0.7  
o
VSS = 0V, IDD = 10µA  
1
+25 C  
V
o
VDD = 2.8V, VIN = VDD or GND  
VDD = 20V, VIN = VDD or GND  
VDD = 18V, VIN = VDD or GND  
VDD = 3V, VIN = VDD or GND  
VDD = 5V, VOH > 4.5V, VOL < 0.5V  
7
+25 C  
VOH > VOL <  
VDD/2 VDD/2  
V
o
7
+25 C  
o
8A  
8B  
1, 2, 3  
+125 C  
o
-55 C  
o
o
o
Input Voltage Low  
(Note 2)  
VIL5  
VIH5  
VIL15  
+25 C, +125 C, -55 C  
-
1.5  
V
V
V
V
o
o
o
Input Voltage High  
(Note 2)  
VDD = 5V, VOH > 4.5V,  
VOL < 0.5V  
1, 2, 3  
1, 2, 3  
1, 2, 3  
+25 C, +125 C, -55 C 3.5  
-
4
-
o
o
o
Input Voltage Low  
(Note 2)  
VDD = 15V, VOH > 13.5V,  
VOL < 1.5V  
+25 C, +125 C, -55 C  
-
o
o
o
Input Voltage High  
(Note 2)  
VIH15 VDD = 15V, VOH > 13.5V,  
VOL < 1.5V  
+25 C, +125 C, -55 C  
11  
NOTES: 1. All voltages referenced to device GND, 100% testing being 3. Foraccuracy, voltageismeasureddifferentiallytoVDD. Limit  
implemented.  
is 0.050V max.  
2. Go/No Go test with limits applied to inputs.  
7-1385  
Specifications CD40174BMS  
TABLE 2. AC ELECTRICAL PERFORMANCE CHARACTERISTICS  
LIMITS  
MIN  
GROUP A  
SUBGROUPS TEMPERATURE  
PARAMETER  
SYMBOL  
CONDITIONS (Note 1, 2)  
MAX  
300  
405  
200  
270  
200  
270  
-
UNITS  
ns  
o
Propagation Delay  
Clock to Output  
TPHL1 VDD = 5V, VIN = VDD or GND  
TPLH1  
9
10, 11  
9
+25 C  
-
o
o
+125 C, -55 C  
-
ns  
o
Propagation Delay  
CLEAR to Output  
TPHL2 VDD = 5V, VIN = VDD or GND  
+25 C  
-
ns  
o
o
10, 11  
9
+125 C, -55 C  
-
-
ns  
o
Transition Time  
TTHL  
TTLH  
VDD = 5V, VIN = VDD or GND  
VDD = 5V, VIN = VDD or GND  
+25 C  
ns  
o
o
10, 11  
9
+125 C, -55 C  
-
ns  
o
Maximum Clock Input  
Frequency  
FCL  
+25 C  
3.5  
MHz  
MHz  
o
o
10, 11  
+125 C, -55 C 3.5/1.35  
-
NOTES:  
1. CL = 50pF, RL = 200K, Input TR, TF < 20ns.  
o
o
2. -55 C and +125 C limits guaranteed, 100% testing being implemented.  
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS  
LIMITS  
PARAMETER  
Supply Current  
SYMBOL  
CONDITIONS  
NOTES  
TEMPERATURE  
MIN  
MAX  
1
UNITS  
µA  
o
o
IDD  
VDD = 5V, VIN = VDD or GND  
1, 2  
-55 C, +25 C  
-
-
-
-
-
-
-
o
+125 C  
30  
2
µA  
o
o
VDD = 10V, VIN = VDD or GND  
VDD = 15V, VIN = VDD or GND  
1, 2  
1, 2  
-55 C, +25 C  
µA  
o
+125 C  
60  
2
µA  
o
o
-55 C, +25 C  
µA  
o
+125 C  
120  
50  
µA  
o
o
Output Voltage  
Output Voltage  
Output Voltage  
Output Voltage  
Output Current (Sink)  
VOL  
VOL  
VDD = 5V, No Load  
VDD = 10V, No Load  
VDD = 5V, No Load  
VDD = 10V, No Load  
VDD = 5V, VOUT = 0.4V  
1, 2  
1, 2  
1, 2  
1, 2  
1, 2  
+25 C, +125 C,  
mV  
o
-55 C  
o
o
+25 C, +125 C,  
-
50  
-
mV  
V
o
-55 C  
o
o
VOH  
VOH  
IOL5B  
+25 C, +125 C,  
4.95  
9.95  
o
-55 C  
o
o
+25 C, +125 C,  
-
V
o
-55 C  
o
+125 C  
0.36  
-
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
o
-55 C  
0.64  
-
-
o
Output Current (Sink)  
Output Current (Sink)  
Output Current (Source)  
Output Current (Source)  
Output Current (Source)  
IOL10  
IOL15  
VDD = 10V, VOUT = 0.5V  
VDD = 15V, VOUT = 1.5V  
1, 2  
1, 2  
1, 2  
1, 2  
1, 2  
+125 C  
0.9  
o
-55 C  
1.6  
-
o
+125 C  
2.4  
-
o
-55 C  
4.2  
-
o
IOH5A VDD = 5V, VOUT = 4.6V  
IOH5B VDD = 5V, VOUT = 2.5V  
+125 C  
-
-
-
-
-
-
-0.36  
-0.64  
-1.15  
-2.0  
-0.9  
-1.6  
o
-55 C  
o
+125 C  
o
-55 C  
o
IOH10  
VDD = 10V, VOUT = 9.5V  
+125 C  
o
-55 C  
7-1386  
Specifications CD40174BMS  
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)  
LIMITS  
MIN  
PARAMETER  
SYMBOL  
CONDITIONS  
NOTES  
TEMPERATURE  
MAX  
-2.4  
-4.2  
3
UNITS  
mA  
o
Output Current (Source)  
IOH15  
VDD =15V, VOUT = 13.5V  
1, 2  
+125 C  
-
-
-
o
-55 C  
mA  
o
o
Input Voltage Low  
Input Voltage High  
VIL  
VDD = 10V, VOH > 9V,  
VOL < 1V  
1, 2  
1, 2  
+25 C, +125 C,  
V
o
-55 C  
o
o
VIH  
VDD = 10V, VOH > 9V,  
VOL < 1V  
+25 C, +125 C,  
+7  
-
V
o
-55 C  
o
Propagation Delay  
Clock to Output  
TPHL1 VDD = 10V  
1, 2, 3  
1, 2, 3  
1, 2, 3  
1, 2, 3  
1, 2, 3  
1, 2, 3  
1, 2, 3  
1, 2, 3  
1, 2, 3  
1, 2, 3  
1, 2, 3  
1, 2, 3  
1, 2, 3  
1, 2, 3  
1, 2, 3  
1, 2, 3  
1, 2, 3  
1, 2, 3, 4  
1, 2, 3, 4  
1, 2, 3, 4  
1, 2, 3  
1, 2, 3  
1, 2, 3  
1, 2, 3  
1, 2, 3  
1, 2, 3  
1, 2  
+25 C  
-
-
140  
100  
100  
80  
100  
80  
-
ns  
ns  
ns  
ns  
ns  
ns  
MHz  
MHz  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
µs  
µs  
µs  
ns  
ns  
ns  
ns  
ns  
ns  
pF  
pF  
TPLH1  
o
VDD = 15V  
+25 C  
o
Propagation Delay  
CLEAR to Output  
TPHL2 VDD = 10V  
VDD = 15V  
+25 C  
-
o
+25 C  
-
o
Transition Time  
TTHL  
TTLH  
VDD = 10V  
VDD = 15V  
VDD = 10V  
VDD = 15V  
VDD = 5V  
VDD = 10V  
VDD = 15V  
VDD = 5V  
VDD = 10V  
VDD = 15V  
VDD = 5V  
VDD = 10V  
VDD = 15V  
VDD = 5V  
VDD = 10V  
VDD = 15V  
VDD = 5V  
VDD = 10V  
VDD = 15V  
VDD = 5V  
VDD = 10V  
VDD = 15V  
CLEAR  
+25 C  
-
o
+25 C  
-
o
Maximum Clock Input  
Frequency  
FCL  
TS  
+25 C  
6
8
-
o
+25 C  
-
o
Minimum Data Setup  
Time  
+25 C  
40  
20  
10  
80  
40  
30  
130  
60  
40  
-
o
+25 C  
-
o
+25 C  
-
o
Minimum Data Hold Time  
TH  
+25 C  
-
o
+25 C  
-
o
+25 C  
-
o
Minimum Clock Pulse  
Width  
TW  
+25 C  
-
o
+25 C  
-
o
+25 C  
-
o
Maximum Clock Rise and  
Fall Time  
TRCL  
TFCL  
+25 C  
15  
15  
15  
-
o
+25 C  
-
o
+25 C  
-
o
Minimum CLEAR  
Removal Time  
TREM  
TW  
+25 C  
0
o
+25 C  
-
0
o
+25 C  
-
0
o
Minimum CLEAR Pulse  
Width  
+25 C  
-
100  
50  
40  
40  
7.5  
o
+25 C  
-
o
+25 C  
-
o
Input Capacitance  
NOTES:  
CIN  
+25 C  
-
o
All others  
1, 2  
+25 C  
-
1. All voltages referenced to device GND.  
2. The parameters listed on Table 3 are controlled via design or process and are not directly tested. These parameters are characterized  
on initial design release and upon design changes which would affect these characteristics.  
3. CL = 50pF, RL = 200K, Input TR, TF < 20ns.  
4. If more than one unit is cascaded, TRCL should be made less than or equal to the sumof the transition time and the fixed propagation  
delay of the output of the driving stage for the estimated capacitive load.  
7-1387  
Specifications CD40174BMS  
TABLE 4. POST IRRADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS  
LIMITS  
PARAMETER  
Supply Current  
SYMBOL  
IDD  
CONDITIONS  
NOTES  
1, 4  
TEMPERATURE  
MIN  
MAX  
7.5  
UNITS  
o
VDD = 20V, VIN = VDD or GND  
VDD = 10V, ISS = -10µA  
VDD = 10V, ISS = -10µA  
+25 C  
-
-2.8  
-
µA  
V
o
N Threshold Voltage  
VNTH  
VTN  
1, 4  
+25 C  
-0.2  
±1  
o
N Threshold Voltage  
Delta  
1, 4  
+25 C  
V
o
P Threshold Voltage  
VTP  
VSS = 0V, IDD = 10µA  
VSS = 0V, IDD = 10µA  
1, 4  
1, 4  
+25 C  
0.2  
-
2.8  
V
V
o
P Threshold Voltage  
Delta  
VTP  
+25 C  
±1  
o
Functional  
F
VDD = 18V, VIN = VDD or GND  
VDD = 3V, VIN = VDD or GND  
VDD = 5V  
1
+25 C  
VOH >  
VDD/2  
VOL <  
VDD/2  
V
o
Propagation Delay Time  
TPHL  
TPLH  
1, 2, 3, 4  
+25 C  
-
1.35 x  
ns  
o
+25 C  
Limit  
o
NOTES: 1. All voltages referenced to device GND.  
2. CL = 50pF, RL = 200K, Input TR, TF < 20ns.  
3. See Table 2 for +25 C limit.  
4. Read and Record  
O
TABLE 5. BURN-IN AND LIFE TEST DELTA PARAMETERS +25 C  
PARAMETER  
Supply Current - MSI-1  
Output Current (Sink)  
Output Current (Source)  
SYMBOL  
IDD  
DELTA LIMIT  
± 0.2µA  
IOL5  
± 20% x Pre-Test Reading  
± 20% x Pre-Test Reading  
IOH5A  
TABLE 6. APPLICABLE SUBGROUPS  
MIL-STD-883  
CONFORMANCE GROUP  
Initial Test (Pre Burn-In)  
Interim Test 1 (Post Burn-In)  
Interim Test 2 (Post Burn-In)  
PDA (Note 1)  
METHOD  
100% 5004  
100% 5004  
100% 5004  
100% 5004  
100% 5004  
100% 5004  
100% 5004  
Sample 5005  
Sample 5005  
Sample 5005  
Sample 5005  
GROUP A SUBGROUPS  
READ AND RECORD  
IDD, IOL5, IOH5A  
1, 7, 9  
1, 7, 9  
IDD, IOL5, IOH5A  
IDD, IOL5, IOH5A  
1, 7, 9  
1, 7, 9, Deltas  
Interim Test 3 (Post Burn-In)  
PDA (Note 1)  
1, 7, 9  
IDD, IOL5, IOH5A  
1, 7, 9, Deltas  
Final Test  
2, 3, 8A, 8B, 10, 11  
1, 2, 3, 7, 8A, 8B, 9, 10, 11  
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas  
1, 7, 9  
Group A  
Group B  
Subgroup B-5  
Subgroup B-6  
Subgroups 1, 2, 3, 9, 10, 11  
Subgroups 1, 2 3  
Group D  
1, 2, 3, 8A, 8B, 9  
NOTE: 1. 5% Parameteric, 3% Functional; Cumulative for Static 1 and 2.  
TABLE 7. TOTAL DOSE IRRADIATION  
TEST  
READ AND RECORD  
MIL-STD-883  
METHOD  
CONFORMANCE GROUPS  
PRE-IRRAD  
POST-IRRAD  
PRE-IRRAD  
POST-IRRAD  
Table 4  
Group E Subgroup 2  
5005  
1, 7, 9  
Table 4  
1, 9  
7-1388  
Specifications CD40174BMS  
TABLE 8. BURN-IN AND IRRADIATION TEST CONNECTIONS  
OSCILLATOR  
FUNCTION  
OPEN  
GROUND  
VDD  
9V ± -0.5V  
50kHz  
25kHz  
Static Burn-In 1  
(Note 1)  
2, 5, 7, 10, 12, 15 1, 3, 4, 6, 8, 9, 11,  
13, 14  
16  
Static Burn-In 2  
(Note 1)  
2, 5, 7, 10, 12, 15  
8
8
8
1, 3, 4, 6, 9, 11,  
13, 14, 16  
Dynamic Burn-In  
(Note 1)  
-
1, 16  
2, 5, 7, 10, 12, 15  
9
3, 4, 6, 11, 13, 14  
Irradiation  
(Note 2)  
2, 5, 7, 10, 12, 15  
1, 3, 4, 6, 9, 11,  
13, 14, 16  
NOTE:  
1. Each pin except VDD and GND will have a series resistor of 10K ± 5%, VDD = 18V ± 0.5V  
2. Each pin except VDD and GND will have a series resistor of 47K ± 5%; Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures,  
VDD = 10V ± 0.5V  
Logic Diagram  
CL  
p
CL  
p
Q
VDD  
D
n
n
3 (4, 6, 11, 13, 14)  
CL  
p
CL  
p
2 (5, 7, 10, 12, 15)  
CL  
CL  
n
n
CL  
CL  
VSS  
CLR*  
1
CL  
* All inputs (terms 1, 3, 4, 6, 9, 11, 13, 14)  
protected by COS/MOS protection network  
CLK*  
9
CL  
FIGURE 1. 1 OF 6 FLIP-FLOPS  
TRUTH TABLE FOR 1 OF 6 FLIP-FLOPS  
INPUTS  
OUTPUT  
CLOCK  
DATA  
CLEAR  
Q
0
0
1
1
1
1
0
1
X
X
NC  
0
X
1 = High Level  
2 = Low Level  
X = Don’t Care  
NC = No Change  
All Intersil semiconductor products are manufactured, assembled and tested under ISO9000 quality systems certification.  
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time without  
notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate  
and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which  
may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.  
For information regarding Intersil Corporation and its products, see web site http://www.intersil.com  
1389  
CD40174BMS  
Typical Performance Curves  
AMBIENT TEMPERATURE (TA) = +25oC  
AMBIENT TEMPERATURE (TA) = +25oC  
30  
25  
GATE-TO-SOURCE VOLTAGE (VGS) = 15V  
200  
SUPPLY VOLTAGE (VDD) = 5V  
150  
20  
15  
100  
50  
0
10V  
10V  
15V  
10  
5
5V  
0
5
10  
15  
0
20  
40  
60  
80  
100  
DRAIN-TO-SOURCE VOLTAGE (VDS) (V)  
LOAD CAPACITANCE (CL) (pF)  
FIGURE 2. TYPICAL TRANSITION TIME AS A FUNCTION OF  
LOAD CAPACITANCE  
FIGURE 3. TYPICAL OUTPUT LOW (SINK) CURRENT  
CHARACTERISTICS  
DRAIN-TO-SOURCE VOLTAGE (VDS) (V)  
AMBIENT TEMPERATURE (TA) = +25oC  
-15  
-10  
-5  
0
0
AMBIENT TEMPERATURE (TA) = +25oC  
GATE-TO-SOURCE VOLTAGE (VGS) = -5V  
-5  
15.0  
GATE-TO-SOURCE VOLTAGE (VGS) = 15V  
12.5  
-10  
-15  
-20  
-25  
-30  
10.0  
-10V  
10V  
7.5  
5.0  
-15V  
2.5  
5V  
0
5
10  
15  
DRAIN-TO-SOURCE VOLTAGE (VDS) (V)  
FIGURE 4. MINIMUM OUTPUT LOW (SINK) CURRENT  
CHARACTERISTICS  
FIGURE 5. TYPICAL OUTPUT HIGH (SOURCE) CURRENT  
CHARACTERISTICS  
105  
DRAIN-TO-SOURCE VOLTAGE (VDS) (V)  
AMBIENT TEMPERATURE (TA) = +25oC  
8
6
4
-15  
-10  
-5  
0
0
AMBIENT TEMPERATURE (TA) = +25oC  
2
SUPPLY VOLTAGE (VDD) = 15V  
104  
GATE-TO-SOURCE VOLTAGE (VGS) = -5V  
8
6
4
10V  
-5  
2
10V  
103  
8
5V  
6
4
-10V  
-10  
-15  
2
102  
CL = 50pF  
CL = 15pF  
8
6
-15V  
4
2
10  
2
4
6
8
10  
2
4
6
8
2
4
6
8
2
4
6
8
1
102  
103  
104  
CLOCK INPUT FREQUENCY (fCL) (kHz)  
FIGURE 6. MINIMUM OUTPUT HIGH (SOURCE) CURRENT  
CHARACTERISTICS  
FIGURE 7. TYPICAL DYNAMIC POWER DISSIPATION AS A  
FUNCTION OF CLOCK FREQUENCY  
7-1390  
CD40174BMS  
Typical Performance Curves (Continued)  
200  
175  
150  
125  
100  
75  
AMBIENT TEMPERATURE (TA) = +25oC  
SUPPLY VOLTAGE (VDD) = 5V  
10V  
15V  
50  
25  
0
0
10  
20  
30  
40  
50  
60  
70  
80  
90 100  
LOAD CAPACITANCE (CL) (pF)  
FIGURE 8. TYPICAL PROPAGATION DELAY TIME (CLOCK TO OUTPUT) AS A FUNCTION OF LOAD CAPACITANCE  
Waveform  
Pad Layout  
VDD  
tr CL  
CLOCK  
INPUT  
tf CL  
90%  
50%  
10%  
0
tH(HL)*  
tH(LH)*  
DATA  
INPUT  
VDD  
50%  
0
tSU(HL)*  
tTHL  
tSU(LH)*  
OUTPUT  
VDD  
tTLH  
90%  
50%  
10%  
0
tPLH  
tREM  
tPHL  
*(LH) OR (HL) OPTIONAL  
VDD  
CLEAR  
0
50%  
FIGURE 9. DEFINITION OF SETUP, HOLD, PROPAGATION  
DELAY, AND REMOVAL TIMES  
DIMENSIONS AND PAD LAYOUT FOR CD40174BMSH  
The photographs and dimensions of each CMOS chip represent a chip when  
it is part of the wafer. When the wafer is separated into individual chips, the an-  
gle of cleavage may vary with respect to the chip face for different chips. The  
actual dimensions of the isolated chip, therefore, may differ slightly from the  
nominal dimensions shown. The user should consider a tolerance of -3 mils to  
+16 mils applicable to the nominal dimensions shown.  
Dimension in parenthesis are in millimeters and are derived from the basic inch  
dimensions as indicated. Grid graduations are in mils (10-3 inch).  
METALLIZATION: Thickness: 11kÅ 14kÅ, AL.  
PASSIVATION: 10.4kÅ - 15.6kÅ, Silane  
BOND PADS: 0.004 inches X 0.004 inches MIN  
DIE THICKNESS: 0.0198 inches - 0.0218 inches  
7-1391  

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