CD4504BHMSR [RENESAS]

HEX TTL/CMOS TO CMOS TRANSLATOR, TRUE OUTPUT, UUC16, DIE-16;
CD4504BHMSR
型号: CD4504BHMSR
厂家: RENESAS TECHNOLOGY CORP    RENESAS TECHNOLOGY CORP
描述:

HEX TTL/CMOS TO CMOS TRANSLATOR, TRUE OUTPUT, UUC16, DIE-16

输出元件 接口集成电路 锁存器
文件: 总8页 (文件大小:62K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
CD4504BMS  
CMOS Hex Voltage Level Shifter for  
TTL-to-CMOS or CMOS-to-CMOS Operation  
December 1992  
Features  
Pinout  
CD4504BMS  
TOP VIEW  
• High Voltage Type (20V Rating)  
• Independence of Power Supply Sequence Consider-  
ations  
VCC  
AOUT  
AIN  
1
2
3
4
5
6
7
8
16 VDD  
- VCC can Exceed VDD  
15 FOUT  
14 FIN  
- Input Signals can Exceed Both VCC and VDD  
• Up and Down Level Shifting Capability  
BOUT  
BIN  
13 SELECT  
12 EOUT  
11 EIN  
• Shiftable Input Threshold for Either CMOS or TTL  
Compatibility  
COUT  
CIN  
• 100% Tested for Quiescent Current at 20V  
• 5V, 10V and 15V Parametric Ratings  
10 DOUT  
9
DIN  
VSS  
• Standardized Symmetrical Output Characteristics  
• Maximum Input Current of 1µA at 18V Over Full Pack-  
age Temperature Range; 100nA at 18V and +25oC  
• Meets All Requirements of JEDEC Tentative Standard  
No. 13B, “Standard Specifications for Description of  
‘B’ Series CMOS Devices”  
Functional Diagram  
VCC  
VDD  
Description  
* IN  
OUT  
CD4504BMS hex voltage level shifter consists of six circuits  
which shift input signals from the VCC logic level to the VDD  
logic level. To shift TTL signals to CMOS logic levels, the  
SELECT input is at the VCC HIGH logic state. When the  
SELECT input is at a LOW logic state, each circuit translates  
signals from one CMOS level to another.  
LEVEL  
SHIFTER  
(3, 5, 7, 9, 11, 14)  
(2, 4, 6, 10, 12, 15)  
VCC = PIN 1  
VDD = PIN 16  
VSS = PIN 8  
TTL/CMOS  
MODE SELECT  
*
SELECT  
13  
The CD4504BMS is supplied in these 16-lead outline packages:  
Frit Seal DIP  
H1F  
Ceramic Flatpack  
H6W  
VDD  
ALL INPUTS ARE PROTECTED  
BY CMOS PROTECTION  
NETWORK  
*
VSS  
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.  
File Number 3336  
1-888-INTERSIL or 321-724-7143 | Copyright © Intersil Corporation 1999  
7-1140  
Specifications CD4504BMS  
Absolute Maximum Ratings  
Reliability Information  
DC Supply Voltage Range, (VDD) . . . . . . . . . . . . . . . -0.5V to +20V  
(Voltage Referenced to VSS Terminals)  
Thermal Resistance . . . . . . . . . . . . . . . .  
Ceramic DIP and FRIT Package . . . . . 80 C/W  
Flatpack Package . . . . . . . . . . . . . . . . 70 C/W  
θ
θ
jc  
ja  
o
o
20 C/W  
o
o
Input Voltage Range, All Inputs . . . . . . . . . . . . .-0.5V to VDD +0.5V  
DC Input Current, Any One Input . . . . . . . . . . . . . . . . . . . . . . . .±10mA  
20 C/W  
o
Maximum Package Power Dissipation (PD) at +125 C  
o
o
o
o
Operating Temperature Range. . . . . . . . . . . . . . . . -55 C to +125 C  
Package Types D, F, K, H  
For TA = -55 C to +100 C (Package Type D, F, K) . . . . . . 500mW  
o
o
For TA = +100 C to +125 C (Package Type D, F, K) . . . . .Derate  
o
o
o
Storage Temperature Range (TSTG) . . . . . . . . . . . -65 C to +150 C  
Linearity at 12mW/ C to 200mW  
Device Dissipation per Output Transistor . . . . . . . . . . . . . . . 100mW  
For TA = Full Package Temperature Range (All Package Types)  
o
Lead Temperature (During Soldering) . . . . . . . . . . . . . . . . . +265 C  
At Distance 1/16 ± 1/32 Inch (1.59mm ± 0.79mm) from case for  
10s Maximum  
o
Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +175 C  
TABLE 1. DC ELECTRICAL PERFORMANCE CHARACTERISTICS  
LIMITS  
MIN MAX UNITS  
GROUP A  
SUBGROUPS  
PARAMETER  
Supply Current  
SYMBOL  
CONDITIONS (NOTE 1)  
TEMPERATURE  
o
IDD  
VDD = 20V, VIN = VDD or GND  
1
+25 C  
-
2
200  
2
µA  
µA  
µA  
nA  
nA  
nA  
nA  
nA  
nA  
mV  
V
o
2
+125 C  
-
o
VDD = 18V, VIN = VDD or GND  
3
-55 C  
-
o
Input Leakage Current  
Input Leakage Current  
IIL  
VIN = VDD or GND  
VIN = VDD or GND  
VDD = 20  
1
+25 C  
-100  
-
o
2
+125 C  
-1000  
-
o
VDD = 18V  
VDD = 20  
3
-55 C  
-100  
-
o
IIH  
1
+25 C  
-
-
-
-
100  
1000  
100  
50  
-
o
2
+125 C  
o
VDD = 18V  
3
-55 C  
o
o
o
Output Voltage  
VOL15 VDD = 15V, No Load  
VOH15 VDD = 15V, No Load (Note 3)  
1, 2, 3  
+25 C, +125 C, -55 C  
o
o
o
Output Voltage  
1, 2, 3  
+25 C, +125 C, -55 C 14.95  
o
Output Current (Sink)  
Output Current (Sink)  
Output Current (Sink)  
IOL5  
IOL10  
IOL15  
VDD = 5V, VOUT = 0.4V  
VDD = 10V, VOUT = 0.5V  
VDD = 15V, VOUT = 1.5V  
1
1
1
1
1
1
1
1
1
7
+25 C  
0.53  
1.4  
3.5  
-
-
mA  
mA  
mA  
mA  
mA  
mA  
mA  
V
o
+25 C  
-
o
+25 C  
-
o
Output Current (Source) IOH5A VDD = 5V, VOUT = 4.6V  
Output Current (Source) IOH5B VDD = 5V, VOUT = 2.5V  
Output Current (Source) IOH10 VDD = 10V, VOUT = 9.5V  
Output Current (Source) IOH15 VDD = 15V, VOUT = 13.5V  
+25 C  
-0.53  
-1.8  
-1.4  
-3.5  
-0.7  
2.8  
o
+25 C  
-
o
+25 C  
-
o
+25 C  
-
o
N Threshold Voltage  
P Threshold Voltage  
Functional  
VNTH  
VPTH  
F
VDD = 10V, ISS = -10µA  
VSS = 0V, IDD = 10µA  
+25 C  
-2.8  
0.7  
o
+25 C  
V
o
VDD = 4.5V, VCC = 2.8,  
VIN = VDD or GND  
+25 C  
VOH > VOL <  
VDD/2 VDD/2  
V
o
VDD = 4.5V, VCC = 3.0,  
VIN = VDD or GND  
8B  
8A  
8A  
8A  
7
-55 C  
o
VDD = 18V, VCC = 18V,  
VIN = GND or VCC  
+125 C  
o
VDD = 18V, VCC = 4.5V,  
VIN = VCC or GND  
+125 C  
o
VDD = 4.5V, VCC = 18V,  
VIN = VCC or GND  
+125 C  
o
VDD = 20V, VCC = 20V,  
VIN = GND or VCC  
+25 C  
o
VDD = 20V, VCC = 4.5V,  
VIN = VCC or GND  
7
+25 C  
o
VDD = 4.5V, VCC = 20V,  
VIN = VCC or GND  
7
+25 C  
7-1141  
Specifications CD4504BMS  
TABLE 1. DC ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)  
LIMITS  
MIN MAX UNITS  
GROUP A  
SUBGROUPS  
PARAMETER  
SYMBOL  
CONDITIONS (NOTE 1)  
TEMPERATURE  
o
o
o
Input Voltage Low  
(Note 2) TTL-CMOS  
VIL  
VDD = 15V, VOH > 13.5V, VOL < 1V  
VCC = 5V  
1, 2, 3  
+25 C, +125 C, -55 C  
-
2
-
0.8  
V
V
V
V
V
V
o
o
o
Input Voltage High  
(Note 2) TTL-CMOS  
VIH  
VIL  
VIH  
VIL  
VIH  
VDD = 15V, VOH > 13.5V, VOL < 1V  
VCC = 5V  
1, 2, 3  
1, 2, 3  
1, 2, 3  
1, 2, 3  
1, 2, 3  
+25 C, +125 C, -55 C  
-
1.5  
-
o
o
o
Input Voltage Low  
(Note 2) CMOS-CMOS  
VDD = 10V, VOH > 9V, VOL < 1V  
VCC = 5V  
+25 C, +125 C, -55 C  
o
o
o
Input Voltage High  
(Note 2)CMOS-CMOS  
VDD = 10V, VOH > 9V, VOL < 1V  
VCC = 5V  
+25 C, +125 C, -55 C 3.5  
o
o
o
Input Voltage Low  
(Note 2) CMOS-CMOS  
VDD = 15V, VOH > 13.5V, VOL <  
1.5V, VCC = 10V  
+25 C, +125 C, -55 C  
-
3
o
o
o
Input Voltage High  
(Note 2) CMOS-CMOS  
VDD = 15V, VOH > 13.5V, VOL <  
1.5V, VCC = 10V  
+25 C, +125 C, -55 C  
7
-
NOTES: 1. All voltages referenced to device GND, 100% testing being 3. Foraccuracy, voltageismeasureddifferentiallytoVDD. Limit  
implemented.  
is 0.050V max.  
2. Go/No Go test with limits applied to inputs.  
TABLE 2. AC ELECTRICAL PERFORMANCE CHARACTERISTICS  
GROUP A  
LIMITS  
PARAMETER  
SYMBOL  
CONDITIONS (NOTE 1, 2)  
SUBGROUPS TEMPERATURE  
MIN  
MAX  
280  
UNITS  
ns  
o
Propagation Delay  
TTL to CMOS  
VDD > VCC  
TPHL1 VDD = 10V, VIN = VCC or GND  
VCC = 5V  
9
+25 C  
-
-
o
o
10, 11  
+125 C, -55 C  
378  
ns  
o
Propagation Delay  
CMOS to CMOS VDD >  
VCC  
TPHL2 VDD = 10V, VIN = VCC or GND  
VCC = 5V  
9
+25 C  
-
-
240  
324  
ns  
ns  
o
o
10, 11  
+125 C, -55 C  
o
Propagation Delay  
CMOS to CMOS VCC >  
VDD  
TPHL3 VDD = 5V, VIN = VCC or GND  
VCC = 10V  
9
+25 C  
-
-
550  
743  
ns  
ns  
o
o
10, 11  
+125 C, -55 C  
o
Propagation Delay  
TTL to CMOS  
VDD > VCC  
TPLH1 VDD = 10V, VIN = VCC or GND  
VCC = 5V  
9
+25 C  
-
-
280  
378  
ns  
ns  
o
o
10, 11  
+125 C, -55 C  
o
Propagation Delay  
CMOS to CMOS VDD >  
VCC  
TPLH2 VDD = 10V, VIN = VCC or GND  
VCC = 5V  
9
+25 C  
-
-
240  
324  
ns  
ns  
o
o
10, 11  
+125 C, -55 C  
o
Propagation Delay  
CMOS to CMOS VCC >  
VDD  
TPLH3 VDD = 5V, VIN = VCC or GND  
VCC = 10V  
9
+25 C  
-
-
400  
540  
ns  
ns  
o
o
10, 11  
+125 C, -55 C  
o
Transition Time  
TTHL  
TTLH  
All Modes  
9
+25 C  
-
-
200  
270  
ns  
ns  
o
o
10, 11  
+125 C, -55 C  
NOTES:  
1. CL = 50pF, RL = 200K, Input TR, TF < 20ns.  
o
o
2. -55 C and +125 C limits guaranteed, 100% testing being implemented.  
7-1142  
Specifications CD4504BMS  
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS  
LIMITS  
PARAMETER  
Supply Current  
SYMBOL  
CONDITIONS  
NOTES  
TEMPERATURE  
MIN  
MAX  
1
UNITS  
µA  
o
o
IDD  
VDD = 5V, VIN = VDD or GND  
1, 2  
-55 C, +25 C  
-
-
-
-
-
-
-
o
+125 C  
30  
2
µA  
o
o
VDD = 10V, VIN = VDD or GND  
VDD = 15V, VIN = VDD or GND  
1, 2  
1, 2  
-55 C, +25 C  
µA  
o
+125 C  
60  
2
µA  
o
o
-55 C, +25 C  
µA  
o
+125 C  
120  
50  
µA  
o
o
Output Voltage  
Output Voltage  
Output Voltage  
Output Voltage  
Output Current (Sink)  
VOL  
VOL  
VOH  
VOH  
IOL5  
VDD = 5V, No Load  
VDD = 10V, No Load  
VDD = 5V, No Load  
VDD = 10V, No Load  
VDD = 5V, VOUT = 0.4V  
1, 2  
1, 2  
1, 2  
1, 2  
1, 2  
+25 C, +125 C,  
mV  
o
-55 C  
o
o
+25 C, +125 C,  
-
50  
-
mV  
V
o
-55 C  
o
o
+25 C, +125 C,  
4.95  
9.95  
o
-55 C  
o
o
+25 C, +125 C,  
-
V
o
-55 C  
o
+125 C  
0.36  
-
-
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
V
o
-55 C  
0.64  
o
Output Current (Sink)  
Output Current (Sink)  
Output Current (Source)  
Output Current (Source)  
Output Current (Source)  
Output Current (Source)  
IOL10  
IOL15  
VDD = 10V, VOUT = 0.5V  
VDD = 15V, VOUT = 1.5V  
1, 2  
1, 2  
1, 2  
1, 2  
1, 2  
1, 2  
+125 C  
0.9  
-
o
-55 C  
1.6  
-
o
+125 C  
2.4  
-
o
-55 C  
4.2  
-
o
IOH5A VDD = 5V, VOUT = 4.6V  
IOH5B VDD = 5V, VOUT = 2.5V  
+125 C  
-
-
-
-
-
-
-
-
-
-0.36  
-0.64  
-1.15  
-2.0  
-0.9  
-1.6  
-2.4  
-4.2  
0.8  
o
-55 C  
o
+125 C  
o
-55 C  
o
IOH10  
IOH15  
VDD = 10V, VOUT = 9.5V  
VDD =15V, VOUT = 13.5V  
+125 C  
o
-55 C  
o
+125 C  
o
-55 C  
o
o
Input Voltage Low  
TTL - CMOS  
VIL  
VIH  
VIL  
VIH  
VDD = 10V, VOH > 9V,  
VOL < 1V, VCC = 5V  
1, 2  
1, 2  
+25 C, +125 C,  
o
-55 C  
o
o
Input Voltage High  
TTL - CMOS  
VDD = 10V, VOH > 9V,  
VOL < 1V, VCC = 5V  
+25 C, +125 C,  
2
-
-
1.5  
-
V
V
o
-55 C  
o
o
Input Voltage Low  
CMOS - CMOS  
VDD = 15V, VOH > 13.5V,  
VOL < 1.5V, VCC = 5V  
1, 2  
+25 C, +125 C,  
o
-55 C  
o
o
Input Voltage High  
CMOS - CMOS  
VDD = 15V, VOH > 13.5V,  
VOL < 1.5V, VCC = 5V  
1, 2  
+25 C, +125 C,  
3.5  
-
V
o
-55 C  
o
Propagation Delay  
TPHL1 VDD = 15V, VCC = 5V  
1, 2, 3  
+25 C  
280  
ns  
TTL - CMOS, VDD > VCC  
o
Propagation Delay  
CMOS - CMOS,  
VDD > VCC  
TPHL2 VDD = 15V, VCC = 5V  
VDD = 15V, VCC = 10V  
1, 2, 3  
1, 2, 3  
+25 C  
-
-
240  
140  
ns  
ns  
o
+25 C  
o
Propagation Delay  
CMOS - CMOS,  
VCC > VDD  
TPHL3 VDD = 5V, VCC = 15V  
VDD = 10V, VCC = 15V  
1, 2, 3  
1, 2, 3  
+25 C  
-
-
550  
140  
ns  
ns  
o
+25 C  
o
Propagation Delay  
TPLH1 VDD = 15V, VCC = 5V  
1, 2, 3  
+25 C  
-
280  
ns  
TTL - CMOS, VDD > VCC  
7-1143  
Specifications CD4504BMS  
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)  
LIMITS  
PARAMETER  
SYMBOL  
CONDITIONS  
NOTES  
1, 2, 3  
1, 2, 3  
TEMPERATURE  
MIN  
MAX  
240  
UNITS  
ns  
o
Propagation Delay  
CMOS - CMOS,  
VDD > VCC  
TPLH2 VDD = 15V, VCC = 5V  
VDD = 15V, VCC = 10V  
+25 C  
-
-
o
+25 C  
140  
ns  
o
Propagation Delay  
CMOS - CMOS  
VCC > VDD  
TPLH3 VDD = 5V, VCC = 15V  
VDD = 10V, VCC = 15V  
1, 2, 3  
1, 2, 3  
+25 C  
-
-
400  
120  
ns  
ns  
o
+25 C  
o
Transition Time  
TTHL  
TTLH  
VDD = 10V  
VDD = 15V  
Any Input  
1, 2, 3  
1, 2, 3  
1, 2  
+25 C  
-
-
-
100  
80  
ns  
ns  
pF  
o
+25 C  
o
Input Capacitance  
NOTES:  
CIN  
+25 C  
7.5  
1. All voltages referenced to device GND.  
2. The parameters listed on Table 3 are controlled via design or process and are not directly tested. These parameters are characterized  
on initial design release and upon design changes which would affect these characteristics.  
3. CL = 50pF, RL = 200K, Input TR, TF < 20ns.  
TABLE 4. POST IRRADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS  
LIMITS  
PARAMETER  
Supply Current  
SYMBOL  
IDD  
CONDITIONS  
NOTES  
1, 4  
TEMPERATURE  
MIN  
MAX  
7.5  
UNITS  
o
VDD = 20V, VIN = VDD or GND  
VDD = 10V, ISS = -10µA  
VDD = 10V, ISS = -10µA  
+25 C  
-
-2.8  
-
µA  
V
o
N Threshold Voltage  
VNTH  
VTN  
1, 4  
+25 C  
-0.2  
±1  
o
N Threshold Voltage  
Delta  
1, 4  
+25 C  
V
o
P Threshold Voltage  
VTP  
VSS = 0V, IDD = 10µA  
VSS = 0V, IDD = 10µA  
1, 4  
1, 4  
+25 C  
0.2  
-
2.8  
V
V
o
P Threshold Voltage  
Delta  
VTP  
+25 C  
±1  
o
Functional  
F
VDD = 18V, VIN = VDD or GND  
VDD = 3V, VIN = VDD or GND  
VDD = 5V  
1
+25 C  
VOH >  
VDD/2  
VOL <  
VDD/2  
V
o
Propagation Delay Time  
TPHL  
TPLH  
1, 2, 3, 4  
+25 C  
-
1.35 x  
ns  
o
+25 C  
Limit  
o
NOTES: 1. All voltages referenced to device GND.  
2. CL = 50pF, RL = 200K, Input TR, TF < 20ns.  
3. See Table 2 for +25 C limit.  
4. Read and Record  
o
TABLE 5. BURN-IN AND LIFE TEST DELTA PARAMETERS +25 C  
PARAMETER  
Supply Current - MSI-1  
Output Current (Sink)  
Output Current (Source)  
SYMBOL  
IDD  
DELTA LIMIT  
± 0.2µA  
IOL5  
± 20% x Pre-Test Reading  
± 20% x Pre-Test Reading  
IOH5A  
TABLE 6. APPLICABLE SUBGROUPS  
MIL-STD-883  
CONFORMANCE GROUP  
Initial Test (Pre Burn-In)  
Interim Test 1 (Post Burn-In)  
Interim Test 2 (Post Burn-In)  
PDA (Note 1)  
METHOD  
100% 5004  
100% 5004  
100% 5004  
100% 5004  
GROUP A SUBGROUPS  
READ AND RECORD  
IDD, IOL5, IOH5A  
1, 7, 9  
1, 7, 9  
IDD, IOL5, IOH5A  
IDD, IOL5, IOH5A  
1, 7, 9  
1, 7, 9, Deltas  
7-1144  
Specifications CD4504BMS  
TABLE 6. APPLICABLE SUBGROUPS (Continued)  
MIL-STD-883  
CONFORMANCE GROUP  
Interim Test 3 (Post Burn-In)  
PDA (Note 1)  
METHOD  
100% 5004  
100% 5004  
100% 5004  
Sample 5005  
Sample 5005  
Sample 5005  
Sample 5005  
GROUP A SUBGROUPS  
READ AND RECORD  
IDD, IOL5, IOH5A  
1, 7, 9  
1, 7, 9, Deltas  
Final Test  
2, 3, 8A, 8B, 10, 11  
1, 2, 3, 7, 8A, 8B, 9, 10, 11  
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas  
1, 7, 9  
Group A  
Group B  
Subgroup B-5  
Subgroup B-6  
Subgroups 1, 2, 3, 9, 10, 11  
Subgroups 1, 2 3  
Group D  
1, 2, 3, 8A, 8B, 9  
NOTE: 1. 5% Parameteric, 3% Functional; Cumulative for Static 1 and 2.  
TABLE 7. TOTAL DOSE IRRADIATION  
TEST  
READ AND RECORD  
MIL-STD-883  
METHOD  
CONFORMANCE GROUPS  
PRE-IRRAD  
POST-IRRAD  
PRE-IRRAD  
POST-IRRAD  
Group E Subgroup 2  
5005  
1, 7, 9  
Table 4  
1, 9  
Table 4  
TABLE 8. BURN-IN AND IRRADIATION TEST CONNECTIONS  
OSCILLATOR  
FUNCTION  
OPEN  
GROUND  
VDD  
9V ± -0.5V  
50kHz  
25kHz  
Static Burn-In 1 2, 4, 6, 10, 12, 15  
(Note 1)  
3, 5, 7-9, 11, 14  
16  
1, 13  
Static Burn-In 2 2, 4, 6, 10, 12, 15  
(Note 1)  
8
8
8
16  
16  
1, 3, 5, 7, 9, 11,  
13, 14  
Dynamic Burn-  
In (Note 1, 3)  
-
1, 2, 4, 6, 10, 12,  
15  
3, 5, 7, 9, 11, 14  
Irradiation  
(Note 2)  
2, 4, 6, 10, 12, 15  
1, 3, 5, 7, 9, 11, 13,  
14, 16  
NOTES:  
1. Each pin except VCC, VDD and GND will have a series resistor of 10K ± 5%, VDD = 18V ± 0.5V  
2. Each pin except VCC, VDD and GND will have a series resistor of 47K ± 5%; Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures,  
VDD = 10V ± 0.5V  
3. Oscillator output to be VDD/2.  
7-1145  
CD4504BMS  
Typical Performance Characteristics  
AMBIENT TEMPERATURE (TA) = +25oC  
AMBIENT TEMPERATURE (TA) = +25oC  
15.0  
30  
25  
GATE-TO-SOURCE VOLTAGE (VGS) = 15V  
GATE-TO-SOURCE VOLTAGE (VGS) = 15V  
12.5  
10.0  
7.5  
20  
15  
10V  
10V  
5.0  
10  
5
2.5  
5V  
5V  
0
5
10  
15  
0
5
10  
15  
DRAIN-TO-SOURCE VOLTAGE (VDS) (V)  
DRAIN-TO-SOURCE VOLTAGE (VDS) (V)  
FIGURE 1. TYPICAL OUTPUT LOW (SINK) CURRENT  
CHARACTERISTICS  
FIGURE 2. MINIMUM OUTPUT LOW (SINK) CURRENT  
CHARACTERISTICS  
DRAIN-TO-SOURCE VOLTAGE (VDS) (V)  
DRAIN-TO-SOURCE VOLTAGE (VDS) (V)  
-15  
-10  
-5  
0
-15  
-10  
-5  
0
0
0
AMBIENT TEMPERATURE (TA) = +25oC  
AMBIENT TEMPERATURE (TA) = +25oC  
GATE-TO-SOURCE VOLTAGE (VGS) = -5V  
-5  
GATE-TO-SOURCE VOLTAGE (VGS) = -5V  
-10  
-15  
-20  
-25  
-30  
-5  
-10V  
-10V  
-10  
-15  
-15V  
-15V  
FIGURE 3. TYPICAL OUTPUT HIGH (SOURCE) CURRENT  
CHARACTERISTICS  
FIGURE 4. MINIMUM OUTPUT HIGH (SOURCE) CURRENT  
CHARACTERISTICS  
AMBIENT TEMPERATURE (TA) = +25oC  
*VSWITCH = INPUT VOLTAGE  
AT WHICH OUTPUT LEVEL  
IS 50% OF VDD - VSS  
VCC  
VCC  
10  
10  
VIN  
*VSWITCH  
VIN  
*VSWITCH  
VSS  
VCC = 15V  
VSS  
8
8
VDD  
VDD  
50%  
50%  
VOUT  
6
6
4
2
0
VOUT  
VSS  
VSS  
ENABLE = VCC  
VCC = 10V  
4
ENABLE = VCC  
2
0
VCC = 5V  
*VSWITCH = INPUT VOLTAGE  
AT WHICH OUTPUT LEVEL  
IS 50% OF VDD - VSS  
AMBIENT TEMPERATURE (TA) = +25oC  
2.5  
5
7.5  
10  
12.5  
15  
17.5  
20  
2.5  
5
7.5  
10  
12.5  
15  
17.5  
20  
SUPPLY VOLTAGE (VDD) (V)  
SUPPLY VOLTAGE (VDD) (V)  
FIGURE 5. TYPICAL INPUT SWITCHING AS A FUNCTION OF  
HIGH LEVEL SUPPLY VOLTAGE (SELECT AT  
VCC-CMOS MODE)  
FIGURE 6. TYPICAL INPUT SWITCHING AS A FUNCTION OF  
HIGH LEVEL SUPPLY VOLTAGE (SELECT AT  
VSS-TTL MODE)  
7-1146  
CD4504BMS  
Typical Performance Characteristics (Continued)  
AMBIENT TEMPERATURE  
(TA) = +25oC  
CMOS MODE =  
RECOMMENDED  
OPERATING  
CONDITIONS  
25  
20  
15  
10  
5
TTL MODE =  
0
5
10  
15  
20  
25  
SUPPLY VOLTAGE (VCC) (V)  
FIGURE 7. HIGH LEVEL SUPPLY VOLTAGE vs LOW LEVEL SUPPLY VOLTAGE  
Chip Dimensions and Pad Layout  
Dimensions in parenthesis are in millimeters and are  
derived from the basic inch dimensions as indicated.  
Grid graduations are in mils (10-3 inch).  
METALLIZATION: Thickness: 11kÅ 14kÅ, AL.  
PASSIVATION: 10.4kÅ - 15.6kÅ, Silane  
BOND PADS: 0.004 inches X 0.004 inches MIN  
DIE THICKNESS: 0.0198 inches - 0.0218 inches  
All Intersil semiconductor products are manufactured, assembled and tested under ISO9000 quality systems certification.  
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time without  
notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate  
and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which  
may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.  
For information regarding Intersil Corporation and its products, see web site http://www.intersil.com  
1147  

相关型号:

CD4504BK3

Interface IC
ETC

CD4504BKMSR

TTL-to-CMOS Translator
ETC

CD4504BKTR

CMOS Hex Voltage Level Shifter for TTL-to-CMOS or CMOS-to-CMOS Operation
INTERSIL

CD4504BM

CMOS Hex Voltage Level Shifter for TTL-to-CMOS or CMOS-to-CMOS Operation
TI

CD4504BM96

CMOS Hex Voltage Level Shifter for TTL-to-CMOS or CMOS-to-CMOS Operation
TI

CD4504BM96E4

CMOS Hex Voltage Level Shifter for TTL-to-CMOS or CMOS-to-CMOS Operation
TI

CD4504BM96G4

CMOS Hex Voltage Level Shifter for TTL-to-CMOS or CMOS-to-CMOS Operation
TI

CD4504BME4

CMOS Hex Voltage Level Shifter for TTL-to-CMOS or CMOS-to-CMOS Operation
TI

CD4504BMG4

CMOS Hex Voltage Level Shifter for TTL-to-CMOS or CMOS-to-CMOS Operation
TI

CD4504BMPWREP

CMOS HEX VOLTAGE-LEVEL SHIFTER FOR TTL-TO-CMOS or CMOS-TO-CMOS OPERATION
TI

CD4504BMS

CMOS Hex Voltage Level Shifter for TTL-to-CMOS or CMOS-to-CMOS Operation
INTERSIL

CD4504BMT

CMOS Hex Voltage Level Shifter for TTL-to-CMOS or CMOS-to-CMOS Operation
TI