HM65W8512LTT-15 [RENESAS]

512KX8 PSEUDO STATIC RAM, 150ns, PDSO32, 0.400 INCH, PLASTIC, TSOP2-32;
HM65W8512LTT-15
型号: HM65W8512LTT-15
厂家: RENESAS TECHNOLOGY CORP    RENESAS TECHNOLOGY CORP
描述:

512KX8 PSEUDO STATIC RAM, 150ns, PDSO32, 0.400 INCH, PLASTIC, TSOP2-32

光电二极管
文件: 总20页 (文件大小:160K)
中文:  中文翻译
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HM65W8512 Series  
4 M PSRAM (512-kword × 8-bit)  
2 k Refresh  
ADE-203-289C(Z)  
Rev. 3.0  
Nov. 1997  
Description  
The Hitachi HM65W8512 is a CMOS pseudo static RAM organized 512-kword × 8bit. It realizes higher  
density, higher performance and low power consumption by employing 0.8 µm Hi-CMOS process  
technology.  
It offers low power data retention by self refresh mode. It also offers easy non multiplexed address  
interface and easy refresh functions. HM65W8512 is suitable for handy systems which work with battery  
back-up systems.  
The device is packaged in a small 525-mil SOP (460-mil body SOP) or a 400 mil TSOP TYPE II.  
Features  
Single 3.3 V (±0.3V)  
High speed  
Access time  
CE access time: 120/150 ns (max)  
Cycle time  
Random read/write cycle time:  
190/230 ns (min)  
Low power  
Active: 100 mW (typ)  
Standby: 85 µW (typ)  
Directly TTL/CMOS compatible  
All inputs and outputs  
Simple address configuration  
Non multiplexed address  
Refresh cycle  
2048 refresh cycles: 32 ms  
HM65W8512 Series  
Easy refresh functions  
Address refresh  
Automatic refresh  
Self refresh  
Ordering Information  
Type No.  
Access time  
Package  
HM65W8512LFP-12  
HM65W8512LFP-15  
120 ns  
150 ns  
525-mil 32-pin plastic SOP (FP-32D)  
HM65W8512LFP-12V  
HM65W8512LFP-15V  
120 ns  
150 ns  
HM65W8512LTT-12  
HM65W8512LTT-15  
120 ns  
150 ns  
400-mil 32-pin plastic TSOP (TTP-32D)  
400-mil 32-pin plastic TSOP (TTP-32DR)  
HM65W8512LTT-12V  
HM65W8512LTT-15V  
120 ns  
150 ns  
HM65W8512LRR-12  
HM65W8512LRR-15  
120 ns  
150 ns  
HM65W8512LRR-12  
HM65W8512LRR-15V  
120 ns  
150 ns  
2
HM65W8512 Series  
Pin Arrangement  
HM65W8512FP Series  
1
32  
31  
30  
29  
28  
27  
26  
25  
24  
23  
22  
21  
20  
19  
18  
17  
V
CC  
A18  
A16  
A14  
A12  
A7  
2
A15  
A17  
WE  
3
4
5
A13  
A8  
6
A6  
7
A9  
A5  
8
A11  
OE/RFSH  
A10  
CE  
A4  
9
A3  
10  
11  
12  
13  
14  
15  
16  
A2  
A1  
I/O7  
I/O6  
I/O5  
I/O4  
I/O3  
A0  
I/O0  
I/O1  
I/O2  
VSS  
(Top view)  
HM65W8512TT Series  
A18  
1
32  
31  
30  
29  
28  
27  
26  
25  
24  
23  
22  
21  
20  
19  
18  
17  
VCC  
A16  
A14  
A12  
A7  
2
A15  
A17  
WE  
3
4
5
A13  
A8  
A9  
A6  
6
A5  
7
A4  
8
A11  
OE/RFSH  
A10  
CE  
I/O7  
I/O6  
I/O5  
I/O4  
I/O3  
A3  
9
A2  
10  
11  
12  
13  
14  
15  
16  
A1  
A0  
I/O0  
I/O1  
I/O2  
VSS  
(Top view)  
3
HM65W8512 Series  
Pin Arrangement (cont.)  
HM65W8512RR Series  
VCC  
A15  
A18  
A16  
A14  
A12  
A7  
32  
31  
30  
29  
28  
27  
26  
25  
24  
23  
22  
21  
20  
19  
18  
17  
1
2
A17  
3
WE  
4
A13  
5
A8  
A6  
6
A9  
A5  
7
A11  
A4  
8
OE/RFSH  
A10  
A3  
9
A2  
10  
11  
12  
13  
14  
15  
16  
CE  
A1  
I/O7  
I/O6  
I/O5  
I/O4  
I/O3  
A0  
I/O0  
I/O1  
I/O2  
VSS  
(Top view)  
Pin Description  
Pin name  
A0 to A18  
I/O0 to I/O7  
CE  
Function  
Address  
Input/ output  
Chip enable  
OE/RFSH  
WE  
Output enable/Refresh  
Write enable  
VCC  
Power supply  
Ground  
VSS  
4
HM65W8512 Series  
Block Diagram  
A0  
Address  
Latch  
Control  
Row  
Decoder  
Memory Matrix  
(2048 × 256) × 8  
A10  
Column I/O  
Input  
Data  
Control  
I/O 0  
I/O 7  
Column Decoder  
Address Latch Control  
A18  
A11  
Refresh  
Control  
CE  
OE/RFSH  
Timing Pulse Gen.  
Read Write Control  
WE  
Pin Functions  
CE: Chip Enable (Input)  
CE is a basic clock. RAM is active when CE is low, and is on standby when CE is high.  
A0 to A18: Address Inputs (Input)  
A0 to A10 are row addresses and A11 to A18 are column addresses. The entire addresses A0 to A18  
are fetched into RAM by the falling edge of CE.  
OE/RFSH: Output Enable/Refresh (Input)  
This pin has two functions. Basically it works as OE when CE is low, and as RFSH when CE is high  
(in standby mode). After a read or write cycle finishes, refresh does not start if CE goes high while  
OE/RFSH is held low. In order to start a refresh in standby mode, OE/RFSH must go high to reset the  
refresh circuits of the RAM. After the refresh circuits are reset, the refresh starts when OE/RFSH goes  
low.  
I/O0 to I/O7: Input/Output (Inputs and Outputs) These pins are data I/O pins.  
5
HM65W8512 Series  
WE: Write Enable (Input)  
RAM is in write mode when WE is low, and is in read mode when WE is high. I/O data is fetched into  
RAM by the rising edge of WE or CE (earlier timing) and the data is written into memory cells.  
Refresh  
There are three refresh modes : address refresh, automatic refresh and self refresh.  
(1) Address refresh: Data is refreshed by accessing all 2048 row addresses every 32 ms. A read is one  
method of accessing those addresses. Each row address (2048 addresses of A0 to A10) must be read at  
least once every 32 ms. In address refresh mode, OE/RFSH can remain high. In this case, the I/O pins  
remain at high impedance, but the refresh is done within RAM.  
(2) Automatic refresh: Instead of address refresh, automatic refresh can be used. RAM goes to automatic  
refresh mode if OE/RFSH falls while CE is high and it remains low for at least tFAP. One automatic  
refresh cycle is executed by one low pulse of OE/RFSH. It is not necessary to input the refresh  
address from outside since it is generated internally by an on-chip address counter. 2048 automatic  
refresh cycles must be done every 32 ms.  
(3) Self refresh: Self refresh mode is suitable for data retention by battery. In standby mode, a self refresh  
starts automatically when OE/RFSH stays low for more than 8 µs. Refresh addresses are automatically  
specified by the on-chip address counter, and the refresh period is determined by the on-chip timer.  
Automatic refresh and self refresh are distinguished from each other by the width of the OE/RFSH low  
pulse in standby mode. If the OE/RFSH low pulse is wider than 8 µs, RAM becomes into self refresh  
mode; if the OE/RFSH low pulse is less than 8 µs, it is recognized as an automatic refresh instruction.  
At the end of self refresh, refresh reset time (tRFS) is required to reset the internal self refresh operation of  
the RAM. During tRFS, CE and OE/RFSH must be kept high. If auto refresh follows self refresh, low  
transition of OE/RFSH at the beginning of automatic refresh must not occur during tRFS period.  
Notes on Using the HM65W8512  
Since pseudo static RAM consists of dynamic circuits like DRAM, its clock pins are more noise-sensitive  
than conventional SRAM’s.  
(1) If a short CE pulse of a width less than tCE min is applied to RAM, an incomplete read occurs and  
stored data may be destroyed. Make sure that CE low pulses of less than tCE min are inhibited. Note  
that a 10 ns CE low pulse may sometimes occur owing to the gate delay on the board if the CE signal is  
generated by the decoding of higher address signals on the board. Avoid these short pulses.  
(2) OE/RFSH works as refresh control in standby mode. A short OE/RFSH low pulse may cause an  
incomplete refresh that will destroy data. Make sure that OE/RFSH low pulse of less than tFAP min are  
also inhibited.  
(3) tOHC and tOCD are the timing specs which distinguish the OE function of OE/RFSH from the RFSH  
function. The tOHC and tOCD specs must be strictly maintained.  
6
HM65W8512 Series  
(4) Start the HM65W8512 operating by executing at least eight initial cycles (dummy cycles) at least 100  
µs after the power voltage reaches 3.0 V-3.6 V after power-on.  
Function Table  
CE  
L
OE/RFSH  
WE  
H
I/O pin  
Dout  
Mode  
Read  
Write  
L
L
X
H
L
L
High-Z  
High-Z  
High-Z  
High-Z  
L
H
H
H
X
Refresh  
Standby  
H
X
Note: X means H or L.  
Absolute Maximum Ratings  
Parameter  
Symbol  
VT  
Value  
Unit  
V
Terminal voltage with respect to VSS  
Power dissipation  
–0.5 to +6.0  
1.0  
PT  
W
Operating temperature  
Storage temperature  
Topr  
Tstg  
Tbias  
0 to +70  
°C  
°C  
°C  
–55 to +125  
–10 to +85  
Storage temperature under bias  
Recommended DC Operating Conditions (Ta = 0 to +70°C)  
Parameter  
Symbol  
VCC  
Min  
3.0  
0
Typ  
3.3  
0
Max  
3.6  
0
Unit  
V
Note  
Supply voltage  
VSS  
V
Input voltage  
VIH  
2.4  
–0.5  
5.6  
0.8  
V
VIL  
V
1
Note: 1. VIL min = –1.2 V for pulse width 30 ns  
7
HM65W8512 Series  
DC Characteristics (Ta = 0 to +70°C, VCC = 3.3 V ± 0.3 V, VSS = 0 V)  
Parameter  
Symbol Min Typ Max Unit Test conditions  
Operating power supply current ICC1  
Standby power supply current ISB1  
ISB2  
30  
15  
25  
50  
0.8  
30  
0.8  
50  
mA  
mA  
µA  
II/O = 0 mA  
tcyc = min  
CE = VIH , Vin 0 V  
OE/RFSH = VIH  
CE VCC – 0.2 V, Vin 0 V,  
OE/RFSH VCC – 0.2 V  
Operating power supply current ICC2  
in self refresh mode  
mA  
µA  
CE = VIH , Vin 0 V,  
OE/RFSH = VIL  
ICC3  
CE VCC – 0.2 V, Vin 0 V,  
OE/RFSH 0.2 V  
Input leakage current  
Output leakage current  
ILI  
–5  
–5  
5
5
µA  
µA  
VCC = 3.6 V, Vin = VSS to VCC  
ILO  
OE/RFSH = VIH  
VI/O = VSS to VCC  
Output voltage  
VOL  
VOH  
0.1  
0.4  
V
V
V
V
IOL = 100 µA  
IOL = 2 mA  
2.9  
2.4  
IOH = –100 µA  
IOH = –2 mA  
Capacitance (Ta = 25°C, f = 1 MHz)  
Parameter  
Symbol  
Cin  
Typ  
Max  
Unit  
pF  
Test conditions  
Input capacitance*1  
Input /output capacitance*1  
8
Vin = 0 V  
VI/O = 0 V  
CI/O  
10  
pF  
Note : This parameter is sampled and not 100% tested.  
8
HM65W8512 Series  
AC Characteristics (Ta = 0 to +70°C, VCC = 3.3 V ± 0.3 V, unless otherwise noted.)  
Test Conditions  
Input pulse levels: 0.6 V, 2.4 V  
Input rise and fall time: 5 ns  
Timing measurement level: 1.5 V  
Reference levels: VOH = 2.1 V, VOL = 0.9 V  
Output load: CL (50 pF) (Including scope and jig)  
HM65W8512-12 HM65W8512-15  
Parameter  
Symbol  
tRC  
Min  
190  
250  
0
Max  
Min  
230  
290  
0
Max  
Unit  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
Notes  
Random read or write cycle time  
Chip enable access time  
Read-modify- write cycle time  
Output enable access time  
Chip disable to output in high-Z  
Chip enable to output in low-Z  
Output disable to output in high-Z  
Output enable to output in low-Z  
Chip enable pulse width  
Chip enable precharge time  
Address setup time  
tCEA  
tRWC  
tOEA  
tCHZ  
tCLZ  
tOHZ  
tOLZ  
tCE  
120  
150  
60  
30  
80  
30  
1, 2  
2
20  
0
20  
0
30  
30  
1, 2  
2
120  
70  
0
10000  
150  
80  
0
10000  
tP  
tAS  
Address hold time  
tAH  
30  
0
30  
0
Read command setup time  
Read command hold time  
Write command pulse width  
Chip enable to end of write  
tRCS  
tRCH  
tWP  
0
0
35  
120  
0
35  
150  
0
tCW  
Chip enable to output enable delay  
time  
tOCD  
Output enable hold time  
tOHC  
15  
15  
ns  
9
HM65W8512 Series  
AC Characteristics  
(Ta = 0 to +70°C, VCC = 3.3 V ± 0.3 V, unless otherwise noted.) (cont.)  
HM65W8512-12 HM65W8512-15  
Parameter  
Symbol  
tDW  
Min  
30  
0
Max  
Min  
30  
0
Max  
Unit  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
Notes  
Data in to end of write  
Data in hold time for write  
Output active from end of write  
Write to output in high-Z  
Transition time (rise and fall)  
Refresh command delay time  
Refresh precharge time  
tDH  
tOW  
5
5
2
tWHZ  
tT  
tRFD  
tFP  
3
30  
3
30  
1, 2  
6
50  
50  
70  
40  
80  
80  
40  
80  
Refresh command pulse width for  
automatic refresh  
tFAP  
8000  
8000  
Automatic refresh cycle time  
tFC  
190  
8
230  
8
ns  
Refresh command pulse width for self tFAS  
refresh  
µs  
Refresh reset time from self refresh  
Refresh period  
tRFS  
tREF  
600  
600  
ns  
9
32  
32  
ms  
2048  
cycle  
Notes: 1. tCHZ, tOHZ, tWHZ are defined as the time at which the output achieves the open circuit condition.  
2. tCHZ, tCLZ, tOHZ, tOLZ, tWHZ and tOW are sampled under the condition of tT = 5 ns and not 100% tested.  
3. A write occurs during the overlap of low CE and low WE. Write end is defined at the earlier of  
WE going high or CE going high.  
4. If the CE low transition occurs simultaneously with or from the WE low transition, the output  
buffers remain in high impedance state.  
5. In write cycle, OE or WE must disable output buffers prior to applying data to the device and at  
the end of write cycle data inputs must be floated prior to OE or WE turning on output buffers.  
During this period, I/O pins are in the output state, therefore the input signals of opposite phase  
to the outputs must not be applied.  
6. Transition time tT is measured between VIH (min) and VIL (max). VIH (min) and VIL (max) are  
reference levels for measuring timing of input signals.  
7. After power-up, pause for more than 100 µs and execute at least 8 initialization cycles.  
8. 2048 cycles of burst refresh or the first cycle of distributed automatic refresh must be executed  
within 15 µs after self refresh, in order to meet the refresh specification of 32 ms and 2048  
cycles.  
9. At the end of self refresh, refresh reset time (tRFS) is required to reset the internal self refresh  
operation of the RAM. During tRFS, CE and OE/RFSH must be kept high. If automatic refresh  
follows self refresh, low transition of OE/RFSH at the beginning of automatic refresh must not  
occur during tRFS period.  
10  
HM65W8512 Series  
Timing Waveform  
Read Cycle  
t
RC  
t
CE  
CE  
t
P
t
t
AH  
AS  
Address  
A0 to A18  
Valid  
t
WE  
OE/RFSH  
Dout  
OHC  
t
t
t
CEA  
RCH  
RCS  
t
OEA  
t
CHZ  
t
OLZ  
t
OHZ  
Valid data out  
11  
HM65W8512 Series  
Write Cycle (1) (OE high)  
t
RC  
t
CE  
CE  
t
P
t
t
AH  
AS  
Address  
A0 to A18  
Valid  
t
CW  
t
WP  
WE  
OE/RFSH  
Din  
t
OCD  
t
t
DH  
DW  
Valid  
Data in  
t
t
WHZ  
OLZ  
t
CLZ  
t
OHZ  
t
OW  
Dout  
12  
HM65W8512 Series  
Write Cycle (2) (OE low)  
t
RC  
t
CE  
CE  
t
P
t
t
AH  
AS  
Address  
A0 to A18  
Valid  
t
DH  
t
CW  
t
WP  
WE  
OE/RFSH  
Din  
t
OHC  
t
t
DH  
DW  
Valid data in  
t
WHZ  
t
CLZ  
Dout  
13  
HM65W8512 Series  
Read-Modify-Write Cycle  
t
RWC  
t
CE  
t
P
CE  
t
t
AH  
AS  
Address  
A0 to A18  
Valid  
t
RCH  
t
RCS  
t
CW  
t
WP  
t
CEA  
WE  
OE/RFSH  
Din  
t
t
OHC  
OCD  
t
OEA  
t
t
t
DH  
DW  
Valid data in  
t
t
CHZ  
OLZ  
t
OHZ  
OW  
t
CLZ  
Valid  
data  
out  
Dout  
Automatic Refresh Cycle  
CE  
t
t
t
RFD  
FC  
FC  
t
t
FAP  
t
t
FP  
FAP  
FP  
OE/RFSH  
14  
HM65W8512 Series  
Self Refresh Cycle  
CE  
t
t
RFS  
RFD  
t
t
FAS  
FP  
OE/RFSH  
15  
HM65W8512 Series  
Low VCC Data Retention Characteristics (Ta = 0 to +70°C)  
This characteristics is guaranteed only for V-version.  
Parameter  
Symbol  
VDR  
Min  
2.0  
Typ  
Max  
3.6  
25  
Unit  
V
Test conditions  
VCC for data retention  
Self refresh current  
ICCDR  
µA  
VCC = 2.0 V,  
CE VCC – 0.2 V  
OE/RFSH 0.2  
Vin 0 V  
50  
µA  
VCC = 3.6 V,  
CE VCC – 0.2 V  
OE/RFSH 0.2  
Vin 0 V  
Refresh setup time  
tFS  
tFR  
0
5
ns  
Operation recovery time  
ms  
Low VCC Data Retention Timing Waveform  
Data Retention mode  
t
t
F
R
V
3.0V  
1.5V  
1.5V  
CC  
V
DR  
Vcc-0.2V  
CE  
CE  
t
RFD  
t
FR  
(in read/  
RFS  
t
FP  
t
t
write mode)  
FS  
t
FAS  
OE/RFSH  
0.2V  
OE/RFSH  
(in automatic  
refresh mode)  
16  
HM65W8512 Series  
Package Dimensions  
HM65W8512FP Series (FP-32D)  
Unit: mm  
20.45  
20.95 Max  
17  
32  
14.14 ± 0.30  
1.42  
1
16  
1.0 Max  
0 – 8 °  
0.10  
M
0.8  
1.27  
+ 0.10  
– 0.05  
0.40  
0.15  
HM65W8512TT Series (TTP-32D)  
Unit: mm  
20.95  
21.35 Max  
32  
17  
16  
1
1.27  
M
0.21  
11.76 ± 0.2  
0.40 ± 0.10  
1.15 Max  
0 – 5°  
0.10  
0.50 ± 0.10  
17  
HM65W8512 Series  
Package Dimensions (cont.)  
HM65W8512RR Series (TTP-32DR)  
Unit: mm  
20.95  
21.35 Max  
1
16  
17  
32  
1.27  
M
0.21  
11.76 ± 0.2  
0.40 ± 0.10  
1.15 Max  
0 – 5°  
0.10  
0.50 ± 0.10  
18  
HM65W8512 Series  
When using this document, keep the following in mind:  
1. This document may, wholly or partially, be subject to change without notice.  
2. All rights are reserved: No one is permitted to reproduce or duplicate, in any form, the whole or part of  
this document without Hitachi’s permission.  
3. Hitachi will not be held responsible for any damage to the user that may result from accidents or any  
other reasons during operation of the user’s unit according to this document.  
4. Circuitry and other examples described herein are meant merely to indicate the characteristics and  
performance of Hitachi’s semiconductor products. Hitachi assumes no responsibility for any intellectual  
property claims or other problems that may result from applications based on the examples described  
herein.  
5. No license is granted by implication or otherwise under any patents or other rights of any third party or  
Hitachi, Ltd.  
6. MEDICAL APPLICATIONS: Hitachi’s products are not authorized for use in MEDICAL  
APPLICATIONS without the written consent of the appropriate officer of Hitachi’s sales company.  
Such use includes, but is not limited to, use in life support systems. Buyers of Hitachi’s products are  
requested to notify the relevant Hitachi sales offices when planning to use the products in MEDICAL  
APPLICATIONS.  
Hitachi, Ltd.  
Semiconductor & IC Div.  
Nippon Bldg., 2-6-2, Ohte-machi, Chiyoda-ku, Tokyo 100, Japan  
Tel: Tokyo (03) 3270-2111  
Fax: (03) 3270-5109  
For further information write to:  
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Semiconductor & IC Div.  
2000 Sierra Point Parkway  
Brisbane, CA. 94005-1835  
U S A  
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Continental Europe  
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München  
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Northern Europe Headquarters  
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Maidenhead  
Hitachi Asia Pte. Ltd.  
16 Collyer Quay #20-00  
Hitachi Tower  
Singapore 0104  
Tel: 535-2100  
Tel: 415-589-8300  
Fax: 535-1533  
Fax: 415-583-4207  
Tel: 089-9 91 80-0  
Fax: 089-9 29 30 00  
Berkshire SL6 8YA  
United Kingdom  
Hitachi Asia (Hong Kong) Ltd.  
Unit 706, North Tower,  
World Finance Centre,  
Harbour City, Canton Road  
Tsim Sha Tsui, Kowloon  
Hong Kong  
Tel: 0628-585000  
Fax: 0628-778322  
Tel: 27359218  
Fax: 27306071  
19  
HM65W8512 Series  
Revision Record  
Rev. Date  
3.0 Nov. 1997  
Contents of Modification  
Change of Subtitle  
Drawn by Approved by  
20  

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