ISL6144IVZAT [RENESAS]

IC 2 A BUF OR INV BASED MOSFET DRIVER, PDSO16, ROHS COMPLIANT, PLASTIC, TSSOP-16, MOSFET Driver;
ISL6144IVZAT
型号: ISL6144IVZAT
厂家: RENESAS TECHNOLOGY CORP    RENESAS TECHNOLOGY CORP
描述:

IC 2 A BUF OR INV BASED MOSFET DRIVER, PDSO16, ROHS COMPLIANT, PLASTIC, TSSOP-16, MOSFET Driver

驱动 光电二极管 接口集成电路 驱动器
文件: 总30页 (文件大小:1179K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
ISL6144  
Data Sheet  
October 6, 2011  
FN9131.7  
High Voltage ORing MOSFET Controller  
Features  
The ISL6144 ORing MOSFET Controller and a suitably sized  
N-Channel power MOSFET(s) increases power distribution  
efficiency and availability when replacing a power ORing diode  
in high current applications.  
• Wide Supply Voltage Range +9V to +75V  
• Transient Rating to +100V  
• Reverse Current Fault Isolation  
• Internal Charge Pump Allows the use of N-Channel  
MOSFET  
In a multiple supply, fault tolerant, redundant power distribution  
system, paralleled similar power supplies contribute equally to  
the load current through various power sharing schemes.  
Regardless of the scheme, a common design practice is to  
include discrete ORing power diodes to protect against reverse  
current flow should one of the power supplies develop a  
catastrophic output short to ground. In addition, reverse current  
can occur if the current sharing scheme fails and an individual  
power supply voltage falls significantly below the others.  
• HS Comparator Provides Very Fast <0.3µs Response  
Time to Dead Shorts on Sourcing Supply. HS Comparator  
also has Resistor-adjustable Trip Level  
• HR Amplifier allows Quiet, <100µs MOSFET Turn-off for  
Power Supply Slow Shut Down  
• Open Drain, Active Low Fault Output with 120µs Delay  
• Provided in Packages Compliant to UL60950 (UL1950)  
Creepage Requirements  
Although the discrete ORing diode solution has been used for  
some time and is inexpensive to implement, it has some  
drawbacks. The primary downside is the increased power  
dissipation loss in the ORing diodes as power requirements for  
systems increase. Another disadvantage when using an ORing  
diode would be failure to detect a shorted or open ORing diode,  
jeopardizing power system reliability. An open diode reduces  
the system to single point of failure while a diode short might  
pose a hazard to technical personnel servicing the system  
while unaware of this failure.  
• QFN Package:  
- Compliant to JEDEC PUB95 MO-220  
QFN - Quad Flat No Leads - Package Outline  
- Near Chip Scale Package footprint, which improves  
PCB efficiency and has a thinner profile  
• Pb-Free (RoHS Compliant)  
Applications  
The ISL6144 can be used in 9V to 75V systems having similar  
power sources and has an internal charge pump to provide a  
floating gate drive for the N-Channel ORing MOSFET. The High  
Speed (HS) Comparator protects the common bus from  
individual power supply shorts by turning off the shorted feed’s  
ORing MOSFET in less than 300ns and ensuring low reverse  
current.  
• ORing MOSFET Control in Power Distribution Systems  
• N + 1 Redundant Distributed Power Systems  
• File and Network Servers (12V and 48V)  
Telecom/Datacom Systems  
An external resistor-programmable detection level for the HS  
Comparator allows users to set the N-Channel MOSFET  
“V  
- V ” trip point to adjust control sensitivity to power  
OUT  
IN  
supply noise.  
The Hysteretic Regulating (HR) Amplifier provides a slow turn-  
off of the ORing MOSFET. This turn-off is achieved in less than  
100μs when one of the sourcing power supplies is shutdown  
slowly for system diagnostics, ensuring zero reverse current.  
This slow turn-off mechanism also reacts to output voltage  
droop, degradation, or power-down.  
An open drain FAULT pin will indicate that a fault has occurred.  
The fault detection circuitry covers different types of failures;  
including dead short in the sourcing supply, a short of any two  
ORing MOSFET terminals, or a blown fuse in the power  
distribution path.  
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.  
1
1-888-INTERSIL or 1-888-468-3774 | Intersil (and design) is a trademark owned by Intersil Corporation or one of its subsidiaries.  
Copyright © Intersil Americas Inc. 2004, 2006-2011. All Rights Reserved  
All other trademarks mentioned are the property of their respective owners.  
ISL6144  
Ordering Information  
PART NUMBER  
(Notes 2, 3)  
PART  
MARKING  
TEMP. RANGE  
PACKAGE  
(Pb-free)  
PKG.  
DWG. #  
(°C)  
ISL6144IVZA (Note 1)  
ISL6144IRZA (Note 1)  
ISL6441EVAL1Z  
NOTES:  
ISL61 44IVZ  
-40 to +105  
-40 to +105  
16 Ld TSSOP  
20 Ld 5x5 QFN  
M16.173  
L20.5x5  
ISL6144 IRZ  
Evaluation Platform  
1. Add “-T*” suffix for tape and reel. Please refer to TB347 for details on reel specifications.  
2. These Intersil Pb-free plastic packaged products employ special Pb-free material sets, molding compounds/die attach materials, and 100% matte tin  
plate plus anneal (e3 termination finish, which is RoHS compliant and compatible with both SnPb and Pb-free soldering operations). Intersil Pb-free  
products are MSL classified at Pb-free peak reflow temperatures that meet or exceed the Pb-free requirements of IPC/JEDEC J STD-020.  
3. For Moisture Sensitivity Level (MSL), please see device information page for ISL6144. For more information on MSL please see techbrief TB363.  
Pinouts  
ISL6144  
(16 LD TSSOP)  
TOP VIEW  
ISL6144  
(20 LD 5x5 QFN)  
TOP VIEW  
1
2
3
4
5
6
7
8
16  
15  
14  
13  
12  
11  
10  
9
GATE  
VIN  
VOUT  
COMP  
VSET  
NC  
20 19 18 17 16  
1
2
3
4
5
15  
14  
13  
VIN  
HVREF  
NC  
VOUT  
COMP  
VSET  
HVREF  
NC  
NC  
NC  
NC  
12 NC  
11 NC  
NC  
NC  
NC  
NC  
NC  
6
7
8
9
10  
FAULT  
GND  
Pin Descriptions  
TSSOP  
PIN #  
QFN  
PIN #  
SYMBOL  
FUNCTION  
DESCRIPTION  
1
2
3
8
9
19  
1
GATE  
VIN  
External FET Gate Drive  
Power Supply Connection  
Allows active control of external N-Channel FET gate to perform ORing function.  
Chip bias input. Also provides a sensing node for external FET control.  
2
HVREF Chip High Voltage Reference Low side of floating high voltage reference for all of the HV chip circuitry.  
7
GND  
Chip Ground Reference  
Chip ground reference point.  
9
FAULT Fault Output  
Provides an open drain active low output as an indication that a fault has  
occurred: GATE is OFF (GATE < V + 0.37V) or other types of faults  
IN  
resulting in V - V  
IN  
> 0.41V.  
OUT  
14  
15  
16  
13  
14  
15  
VSET  
Low Side Connection for  
Trip Level  
Resistor connected to COMP provides adjustable “Vd - Vs” trip level along  
with pin COMP.  
COMP High Side Connection for HS Resistor connected to V  
provides sense point for the adjustable Vd - Vs  
OUT  
trip level along with pin VSET.  
Comparator Trip Level  
VOUT  
NC  
Chip Bias and Load  
Connection  
Provides the second sensing node for external FET control and chip output  
bias.  
4, 5, 6, 7, 3, 4, 5, 6, 8,  
No Connection  
10, 11,  
12, 13  
10, 11, 12,  
16, 17,  
18, 20  
FN9131.7  
October 6, 2011  
2
ISL6144  
General Application Circuit  
+
-
DC/DC  
1
AC/DC  
1
GATE  
GATE  
VIN  
VOUT  
COMP  
VSET  
VIN  
VOUT  
ISL6144  
ISL6144  
HVREF  
HVREF  
COMP  
5V  
5V  
FAULT  
FAULT  
VSET  
GND  
GND  
AC/DC  
N + 1  
DC/DC  
N + 1  
GATE  
GATE  
VIN  
VOUT  
ISL6144  
VIN  
VOUT  
ISL6144  
HVREF  
COMP  
HVREF  
COMP  
5V  
5V  
FAULT  
FAULT  
VSET  
VSET  
GND  
GND  
NOTES:  
4. AC/DC 1 through (N + 1) are multistage AC/DC converters which include AC/DC rectification stage and a DC/DC Converter with a +48VDC  
output (also might include a Power Factor Correction stage).  
5. DC/DC Converter 1 through (N + 1) are DC/DC converters to provide additional Intermediate Bus.  
6. Load “+12V” and Load “+48V” might include other DC/DC converter stages to provide lower voltages such as ±15V, ±5V, +3.3V, +2.5V,  
+1.8V etc.  
7. Fuse location might vary depending on power system architecture.  
FIGURE 1. ISL6144 GENERAL APPLICATION CIRCUIT IN A DISTRIBUTED POWER SYSTEM  
FN9131.7  
October 6, 2011  
3
ISL6144  
Simplified Block Diagram  
D *  
2
SOURCE 2  
9V TO 75V  
F2**  
R
C
2
C
1
1
VIN GATE  
VOUT  
COMP  
HVREF  
ISL6144  
R
2
VSET  
FAULT  
GND  
* D , D PARASITIC DIODES  
1
2
**F1, F2 FUSES COULD ALSO BE PLACED  
ON THE INPUT SIDE BEFORE THE VIN PIN. THIS  
PLACEMENT DEPENDS ON POWER SYSTEM  
ARCHITECTURE.  
D *  
1
F1**  
SOURCE 1  
VIN  
GATE  
9V TO 75V  
LOAD  
VOUT  
GATE LOGIC AND  
CHARGE PUMP  
C
1
FAULT  
DETECTION  
R
C
2
1
HIGH  
VOLTAGE  
PASS  
5.3V  
0.1mA  
5.5V  
20mV  
AND  
-
-
CLAMPING  
+
LEVEL  
SHIFT  
+
REG  
AMPLIFIER  
COMP  
VSET  
-
2A*  
5mA  
R
2
+
HS  
HVREF  
FAULT  
COMP  
-
0.6V  
BIAS  
AND  
REF  
DELAY  
100µs  
+
UV  
COMP  
0.2mA  
1.5mA  
GND  
1.5mA  
FN9131.7  
October 6, 2011  
4
ISL6144  
Absolute Maximum Ratings (Note 8) T = +25°C  
Thermal Information  
A
V
, V  
OUT  
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -0.3V to +100V  
Thermal Resistance (Typical)  
θ
(°C/W)  
θ
(°C/W)  
JC  
JA  
IN  
GATE . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -0.3V to V +12V  
HVREF. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -0.3V to V -5V  
IN  
COMP . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -0.3V to V  
VSET . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -0.3V to V  
FAULT . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -0.3V to 16V  
ESD Classification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Class 2  
IN  
TSSOP Package (Note 9) . . . . . . . . . .  
QFN Package (Notes 10, 11). . . . . . . .  
Maximum Junction Temperature (Plastic Package) . . . . . . . +150°C  
Maximum Storage Temperature Range. . . . . . . . . .-65°C to +150°C  
Pb-Free Reflow Profile. . . . . . . . . . . . . . . . . . . . . . . . .see link below  
http://www.intersil.com/pbfree/Pb-FreeReflow.asp  
90  
35  
N/A  
5
OUT  
-5V  
OUT  
Operating Conditions  
Supply Voltage Range . . . . . . . . . . . . . . . . . . . . . . . . . +9V to +75V  
Temperature Range (T ) . . . . . . . . . . . . . . . . . . . . -40°C to +105°C  
A
CAUTION: Do not operate at or near the maximum ratings listed for extended periods of time. Exposure to such conditions may adversely impact product reliability and  
result in failures not covered by warranty.  
NOTES:  
8. All voltages are relative to GND, unless otherwise specified.  
9. θ is measured with the component mounted on a high effective thermal conductivity test board in free air. See Tech Brief TB379 for details.  
JA  
10. θ is measured in free air with the component mounted on a high effective thermal conductivity test board with “direct attach” features. See  
JA  
Tech Brief TB379.  
11. For θ , the "case temp" location is the center of the exposed metal pad on the package underside.  
JC  
Electrical Specifications  
V
= 48V, T = -40°C to +105°C, Unless Otherwise Specified. Boldface limits apply over the operating  
A
IN  
temperature range, -40°C to +105°C.  
MIN  
MAX  
PARAMETER  
SYMBOL  
TEST CONDITIONS  
(Note 12)  
TYP  
(Note 12) UNITS  
BIAS “V  
IN  
POR Rising  
POR  
V
V
V
V
Rising to V > V + 7.5V  
GATE IN  
8.9  
-
-
-
-
-
V
L2H  
IN  
IN  
IN  
IN  
12V Bias Current  
48V Bias Current  
75V Bias Current  
GATE  
I
I
I
= 12V, V  
= 48V, V  
= 75V, V  
= V + V  
IN  
-
-
-
3.5  
4.5  
5
mA  
mA  
mA  
12V  
GATE  
GATE  
GATE  
GQP  
GQP  
GQP  
= V + V  
IN  
48V  
75V  
= V + V  
IN  
Charge Pump Voltage  
Gate Low Voltage Level  
Low Pull Down Current  
High Pull Down Current  
Slow Turn-off Time  
Fast Turn-off Time  
V
V
V
= 12V to 75V  
V
+ 9  
V
+ 10.5  
V
+ 12  
V
V
GQP  
IN  
IN  
IN  
IN  
IN  
V
- V  
< 0V  
-0.3  
V
IN  
V
+ 0.5  
GL  
OUT  
IN  
I
Cgs = 39nF, I  
Cgs = 39nF, I  
Cgs = 39nF  
= Cgs*dVgs/T  
tofs  
-
-
-
-
5
-
-
mA  
A
PDL  
PDL  
I
= Cgs*dVgs/T  
2
-
PDH  
PDH  
toff  
t
100  
µs  
ns  
toffs  
t
Turn-off from V  
= V + V  
IN  
to V + 1V with  
IN  
250  
300  
toff  
GATE  
GQP  
Cgs = 39nF (includes HS Comparator delay time)  
Start-up “Turn-On” Time  
t
I
Turn-on from V = V to V + 7.5V into 39nF  
-
-
1
1
-
-
ms  
ON  
ON  
GATE  
= 9V to 75V  
IN IN  
GATE Turn-On Current  
V
mA  
IN  
CONTROL AND REGULATION I/O  
HR Amplifier Forward Voltage  
Regulation  
V
ISL6144 controls voltage across FET Vds to  
during static forward operation at loads  
10  
0
20  
30  
mV  
V
FWD_HR  
V
FWD_HR  
resulting in I * r  
< V  
DS(ON)  
FWD_HR  
HS COMP Externally  
V
Externally programmable threshold for noise  
0.05  
5.3  
TH(HS)  
Programmable Threshold  
sensitivity (system dependent), typical 0.05V to 0.3V  
HS Comparator Offset Voltage  
V
-40  
0
25  
mV  
µA  
OS(HS)  
Comp Input Current  
(Bias Current)  
I
-
1.1  
-
COMP  
HVREF Voltage (V - HVREF)  
IN  
HV  
V
= 9V to 75V  
IN  
-
5.5  
-
V
REF(VZ)  
FN9131.7  
October 6, 2011  
5
ISL6144  
Electrical Specifications  
V
= 48V, T = -40°C to +105°C, Unless Otherwise Specified. Boldface limits apply over the operating  
IN  
A
temperature range, -40°C to +105°C.  
MIN  
MAX  
PARAMETER  
SYMBOL  
TEST CONDITIONS  
= 9V to 75V  
(Note 12)  
TYP  
(Note 12) UNITS  
VSET Voltage (V  
- VSET)  
V
V
V
-
-
5.3  
-
0.5  
-
V
V
OUT  
REF(VSET)  
IN  
IN  
Fault Low Output Voltage  
Fault Sink Current  
V
- V  
< 0V, V  
= V  
-
-
-
FLT_L  
FLT_SINK  
OUT  
GATE  
GL  
, V  
I
FAULT = V  
, V < V  
= V  
4
-
mA  
µA  
FLT_L IN  
OUT GATE  
GL  
Fault Leakage Current  
I
FAULT = ”V ”, V > V  
, V  
= V  
+
10  
FLT_LEAK  
FLT_H IN  
OUT GATE  
IN  
V
GQP  
GATE = V to FAULT V  
=
Fault Delay - Low to High  
NOTES:  
t
-
120  
-
µs  
FLT  
GL  
FLT_L  
12. Compliance to datasheet limits is assured by one or more methods: production test, characterization and/or design.  
FAULT  
Functional Pin Descriptions  
Open-Drain pull-down FAULT Output with internal on-chip  
filtering (tFLT). The ISL6144 fault detection circuitry will  
pull-down this pin to GND as soon as it detects a fault.  
Different types of faults and their detection mechanisms are  
discussed in more detail in the “Functional Block Description”  
on page 6.  
GATE  
This is the Gate Drive output of the external N-Channel  
MOSFET generated by the IC internal charge pump. Gate  
turn-on time is typically 1ms.  
VIN  
Input bias pin connected to the sourcing supply side (ORing  
MOSFET Source). Also serves as the sense pin to  
determine the sourcing supply voltage. The ORing MOSFET  
will be turned off when VIN becomes lower than VOUT by a  
value more than the externally set threshold.  
GND  
IC ground reference.  
Detailed Description  
The ISL6144 and a suitably sized N-Channel power  
MOSFET(s) increases power distribution efficiency and  
availability when replacing a power ORing diode in high current  
applications. Refer to “Application Considerations” on page 8  
for power saving when using ISL6144 with an N-channel ORing  
MOSFET compared to a typical ORing diode.  
VOUT  
Connected to the Load side (ORing MOSFET Drain). This is  
the VOUT sense pin connected to the load. This is the  
common connection point for multiple paralleled supplies.  
VOUT is compared to VIN to determine when the ORing  
FET has to be turned off.  
Functional Block Description  
HVREF  
Regulating Amplifier-Slow (Quiet) Turn-off  
Low side of the internal IC High Voltage Reference used by  
internal circuitry, also available as an external pin for  
additional external capacitor connection.  
A Hysteretic Regulating (HR) Amplifier is used for a  
Quiet/Slow turn-off mechanism. This slow turn-off is initiated  
when the sourcing power supply is turned off slowly for  
system diagnostics. Under normal operating conditions as  
COMP  
V
pulls up to 20mV below V (V - 20mV > V ), the  
This is the high side connection for the HS Comparator trip  
OUT  
IN IN OUT  
HR Amplifier regulates the gate voltage to keep the 20mV  
(VFWD_HR) forward voltage drop across the ORing MOSFET  
(Vs - Vd). This will continue until the load current exceeds  
the MOSFET ability to deliver the current with Vsd of 20mV.  
In this case, Gate will be charged to the full charge pump  
level setting (V  
). Resistor R , connected between  
along with resistor R , provides adjustable  
2
TH(HS)  
1
COMP and V  
OUT  
- V trip level (0V to 5V). This provides flexibility to  
V
OUT  
IN  
externally set the desired level depending on particular  
system requirement.  
voltage (V  
) to fully enhance the MOSFET. At this point,  
GQP  
VSET  
the MOSFET will be fully enhanced and behave as a  
constant resistor valued at the r . Once V starts to  
Low side connection for the HS Comparator trip level setting  
A second resistor R connected between VSET and COMP  
provides adjustable “V - V  
IN  
DS(ON)  
IN  
drop below V  
, regulation cannot be maintained and the  
2
OUT  
output of the HR Amp is pulled high and the gate is pulled  
” level along with R .  
1
OUT  
down to V slowly in less than a 100µs. As a result, the  
IN  
ORing FET is turned off, avoiding reverse current as well as  
voltage and current stresses on supply components.  
FN9131.7  
October 6, 2011  
6
ISL6144  
The slow turn-off is achieved in two stages. The first stage  
The fault can be detected and isolated by using the ISL6144  
and an N-Channel ORing MOSFET. V is compared to  
starts with a slow turn-off action and lasts for up to 20µs. The  
gate pull down current for the first stage is 2mA. The second  
slow turn-off stage completes the gate turn-off with a 10mA  
pull down current. The 20µs delay filters out any false trip off  
due to noise or glitches that might be present on the supply  
line.  
IN  
V
, and whenever:  
COMP  
V
V
V
< V  
;
where  
IN  
COMP  
= V  
V  
(EQ. 2)  
COMP  
TH(HS)  
OUT  
TH(HS)  
is defined below  
The gate turn-on and gate turn-off drivers have a 50kHz filter  
to reduce the variation in FET forward voltage drop (and FET  
gate voltage) due to normal SMPS system switching noises  
(typically higher than 50kHz). These filters do not affect the  
total turn-on or slow turn-off times.  
The fast turn-off mechanism will be activated and the  
MOSFET(s) will be turned off very quickly. The speed of this  
turn-off depends on the amount of equivalent gate loading  
capacitance. For an equivalent Cgs = 39nF. The gate turn-off  
time is <300ns and gate pull down current is 2A.  
Special system design precautions must be taken to insure  
that no AC mains related low frequency noise will be present  
at the input or output of ISL6144. Filters and multiple power  
conversion stages, which are part of any distributed DC  
power system, normally filter out all such noise.  
The level of V  
(HS Comparator trip level) is adjustable  
TH(HS)  
by means of external resistors R and R to a value  
1
2
theoretically ranging from 0V to 5.3V. Typical values are  
0.05V to 0.3V. This is done in order to avoid false turn-off  
due to noise or minor glitches present in the DC switching  
power supply. The threshold voltage is calculated as  
Equation 3:  
HS Comparator-Fast Turn-off  
There is a High Speed (HS) Comparator used for fast turn-  
off of the ORing MOSFET to protect the common bus  
against hard short faults at a sourcing power supply output  
(refer to Figure 1).  
R
1
-------------------------  
V
=
V
(EQ. 3)  
TH(HS)  
REF(VSET)  
(R + R )  
1
2
Where V  
is an internal zener reference (5.3V  
REF(VSET)  
During normal operation the gate of the ORing MOSFET is  
charge pumped to a voltage that depends on whether it is in  
the 20mV regulation mode or fully enhanced. In this case:  
typical) between V  
and VSET pins. R and R must be  
1 2  
OUT  
chosen such that their sum is about 50kΩ. An external  
capacitor, C , is needed between V and COMP pins to  
2
OUT  
provide high frequency decoupling. The HS comparator has  
an internal delay time on the order of 50ns, which is part of  
the <300ns overall turn-off time specification (with  
Cgs = 39nF).  
(EQ. 1)  
V
= V I  
r  
OUT DS(ON)  
OUT  
IN  
If a dead short fault occurs in the sourcing supply, it causes  
to drop very quickly while V is not affected as more  
V
IN  
OUT  
than one supply are paralleled. In the absence of the  
ISL6144 functionality, a very high reverse current will flow  
from Output to the Input supply pulling down the common  
DC Bus, resulting in an overall “catastrophic” system failure.  
Gate Logic and Charge Pump  
The IC has two charge pumps. The first charge pump  
generates the floating gate drive for the N-Channel  
MOSFET. The second charge pump output current opposes  
the pull down current of the slow turn-off transistor to provide  
regulation of the GATE voltage.  
FROM  
TO SHARED  
LOAD  
SOURCING  
SUPPLY  
The presence of the charge pump allows the use of an  
N-Channel MOSFET with a floating gate drive. The  
GATE  
VOUT  
VIN  
N-Channel MOSFETs normally have lower r  
mention cost saving) compared to P-Channel MOSFETs,  
allowing further reduction of conduction losses.  
(not to  
VIN  
V
DS(ON)  
TH(HS)  
R
1
COMP  
C
2
HV PASS  
AND  
CLAMP  
-
R
2
+
VSET  
BIAS  
2A*  
BIAS and REF  
5.3V  
HS  
COMP  
DRIVER  
Bias currents for the two internal zener supplies (HVREF  
and VSET) is provided by this block. This block also  
provides a 0.6V band-gap reference used in the UV  
detection circuit.  
R
+ R = 50kΩ  
2
1
Undervoltage Comparator  
FIGURE 1. HS COMPARATOR  
The undervoltage comparator compares HVREF to 0.6V  
internal reference. Once it falls below this level the UV  
circuitry pulls and holds down the gate pin as long as the  
HVREF UV condition is present. Voltage at both VIN and  
HVREF pins track each other.  
FN9131.7  
October 6, 2011  
7
ISL6144  
Application Considerations  
High Voltage Pass and Clamp  
A high voltage pass and clamping circuit prevents the high  
output voltage from damaging the comparators in case of  
ORing MOSFET Selection  
Using an ORing MOSFET instead of an ORing diode results  
in increased overall power system efficiency as losses  
across the ORing elements are reduced. The use of ORing  
MOSFETs becomes more important at higher current levels,  
as power loss across the traditionally used ORing diode is  
very high. The high power dissipation across these diodes  
requires special thermal design precautions such as heat  
sinks and forced airflow.  
quick drop in V . The comparators are running from the 5V  
supply between HVREF and V . These devices are rated  
IN  
IN  
for 5V and will be damaged if V  
is allowed to be present  
OUT  
(as the output is powered from other parallel supplies), and  
does not fall when V is falling. For example, if V falls to  
IN IN  
30V, V  
remains at 48V and the differential Voltage  
OUT  
between the “-” and “+” terminals of the comparator would be  
18V, exceeding the rating of the devices and causing  
permanent damage to the IC.  
For example, in a 48V, 40A (1+1) redundant system with  
current sharing, using a Schottky diode as the ORing  
(auctioneering) device (see Figure 3), the forward voltage  
drop is in the 0.4V to 0.7V range. Let us assume it is 0.5V,  
power loss across each diode is as shown in Equation 4:  
Fault Detection Block  
The fault detection block has two monitoring circuits (refer to  
Figure 2):  
I
1. Gate monitoring detects when the GATE < V + 0.37V  
IN  
OUT  
2
--------------  
P
= P  
=
V = 20A 0.5V = 10W  
loss(D1)  
loss(D2)  
F
2. V  
OUT  
monitoring detects when V - 0.41V > V  
IN OUT  
(EQ. 4)  
These two outputs are ORed, inverted, level shifted, and  
delayed using an internal filter (t  
Total power loss across the two ORing diodes is 20W.  
)
FLT  
DC/DC  
#1  
D
INPUT BUS 1  
1
The following failures can be detected by the fault detection  
circuitry:  
0.5V@ 20A  
36VDC TO 75 VDC  
+OUT1 = 48V  
+IN  
PC  
+OUT  
R
10  
pb1  
C
CIN1  
100µF  
d1  
+S  
1. ORing FET off due to dead short in the sourcing supply,  
220nF  
C
(Note 11)  
Figure 14  
cs1  
1nF  
SC  
leading to V < V  
IN OUT  
PR  
-IN  
2. Shorted terminals of the ORing FET  
3. Blown fuse in the power path of the sourcing supply  
4. Open Gate terminal  
-S  
VOUT  
(40A)  
-OUT  
5. HVREF UV  
SECONDARY  
GROUND  
DC/DC  
#2  
The FAULT pin is not latched off and the pull down will shut  
off as soon as the fault is removed and the pin becomes high  
impedance. Typically, an external pull-up resistor is  
connected to an external voltage source (for example 5V,  
3.3V) to pull the pin high, an LED can be used to indicate the  
presence of a fault.  
INPUT BUS 2  
36VDC TO 75 VDC  
+OUT2 = 48V  
+IN  
+OUT  
D
R
2
0.5V@ 20A  
pb2  
C
C
IN2  
100µF  
d2  
220nF  
10  
+S  
PC  
(Note 11)  
Figure 14  
SC  
C
cs2  
1nF  
PR  
-IN  
-S  
GATE  
-
+
-OUT  
+
-
FAULT  
PRIMARY GROUND  
0.37V  
VIN  
+
-
FIGURE 3. 1 + 1 REDUNDANT SYSTEM WITH DIODE ORing  
DELAY  
120µs  
+
-
If a 5mΩ single MOSFET per feed is used, the power loss  
across each MOSFET is as shown in Equation 5:  
0.41V  
VOUT  
LEVEL SHIFT  
2
I
OUT  
2
--------------  
P
P
= P  
=
r  
DS(ON)  
(EQ. 5)  
loss(M1)  
loss(M2)  
FIGURE 2. FAULT DETECTION BLOCK  
2
= (20A) ⋅ 5mΩ = 2W  
loss(M1)  
Total power loss across the two ORing MOSFETs is 4W.  
In case of failure of current sharing scheme, or failure of  
DC/DC #1, the full load will be supplied by DC/DC #2. ORing  
MOSFET M2 or ORing Diode D will be conducting the full  
2
FN9131.7  
October 6, 2011  
8
ISL6144  
load current. Power loss across the ORing devices is as  
shown in Equation 6:  
On the other hand, the most common failures caused by  
diode ORing include open circuit and short circuit failures. If  
one of these diodes (Feed A) has failed open, then the other  
Feed B will provide all of the power demand. The system will  
continue to operate without any notification of this failure,  
reducing the system to a single point of failure. A much more  
dangerous failure is where the diode has failed short. The  
system will continue to operate without notification that the  
short has occurred. With this failure, transients and failures  
on Feed B propagate to Feed A. Also, this silent short failure  
could pose a significant safety hazard for technical  
(EQ. 6)  
P
P
= I  
V = 40A 0.5V = 20W  
loss(D2)  
loss(M2)  
OUT  
F
2
2
= (I  
)
r  
= (40A) ⋅ 5mΩ = 8W  
DS(ON)  
OUT  
This shows that worst-case failure scenario has to be  
accounted for when choosing the ORing MOSFET. In this  
case we need to use two MOSFETs in parallel per feed to  
reduce overall power dissipation and prevent excessive  
temperature rise of any single MOSFET. Another alternative  
personnel servicing these feeds.  
would be to choose a MOSFET with lower r  
).  
DS(ON  
“ISL6144 + ORing FET” vs “Discrete ORing FET”  
Solution  
The final choice of the N-Channel ORing MOSFET depends  
on the following aspects:  
If we compare the ISL6144 integrated solution to discrete  
ORing MOSFET solutions, the ISL6144 wins in all aspects.  
The main ones are: PCB real estate saving, cost savings,  
and reduction in the MTBF of this section of the circuit as the  
overall number of components is reduced.  
1. Voltage Rating: The drain-source breakdown voltage  
V
has to be higher than the maximum input voltage  
DSS  
including transients and spikes. Also the gate to source  
voltage rating has to be considered, The ISL6144  
maximum Gate charge voltage is 12V, make sure the  
used MOSFET has a maximum V  
rating >12V.  
In brief, the solution offered by this IC enhances power  
system performance and protection while not adding any  
considerable cost. This solution provides both a PCB board  
real estate savings and a simple to implement integrated  
solution.  
GS  
2. Power Losses: In this application the ORing MOSFET is  
used as a series pass element, which is normally fully  
enhanced at high load currents; switching losses are  
negligible. The major losses are conduction losses, which  
depend on the value of the on-state resistance of the  
Setting the External HS Comparator Threshold  
Voltage  
MOSFET r  
, and the per feed load current. For an  
DS(ON)  
N + 1 redundant system with perfect current sharing, the  
per feed MOSFET losses are as shown in Equation 7:  
In general, paralleled modules in a redundant power system  
have some form of active current sharing, to realize the full  
benefit of this scheme, including lower operating  
2
I
LOAD  
----------------  
(EQ. 7)  
P
=
r  
DS(ON)  
loss(FET)  
N + 1  
temperatures, lower system failure rate, and better transient  
response when load step is shared. Current sharing is  
realized using different techniques; all of these techniques  
will lead to similar modules operating under similar  
The r  
valuealso depends on junction temperature;  
DS(ON)  
a curve showing this relationship is usually part of any  
MOSFET’s data sheet. The increase in the value of the  
r
over temperature has to be taken into account.  
DS(ON)  
conditions in terms of switching frequency, duty cycle, output  
voltage and current. When paralleled modules are current  
sharing, their individual output ripple will be similar in  
amplitude and frequency and the common bus will have the  
same ripple as these individual modules and will not cause  
any of the turn-off mechanisms to be activated, as the same  
3. Current handling capability, steady state and peak, are  
also two important parameters that must be considered.  
The limitation on the maximum allowable drain current  
comes from limitation on the maximum allowable device  
junction temperature. The thermal board design has to be  
able to dissipate the resulting heat without exceeding the  
MOSFET’s allowable junction temperature.  
ripple will be present on both sensing nodes (V and  
IN  
Another important consideration when choosing the ORing  
MOSFET is the forward voltage drop across it. If this drop  
V
). This would allow setting the high speed comparator  
OUT  
threshold (V  
) to a very low value. As a starting point, a  
TH(HS)  
approaches the 0.41V limit, which is used in the V  
fault  
V
of 50mV could be used, the final value of this TH  
OUT  
TH(HS)  
monitoring mechanism, then this will result in a permanent  
fault indication. Normally the voltage drop would be chosen  
not to exceed a value around 100mV.  
will be system dependent and has to be finalized in the  
system prototype stage. If the gate experiences false turn-off  
due to system noise, the V  
has to be increased.  
TH(HS)  
“ISL6144 + ORing FET” vs “ORing Diode” Solution  
The reverse current peak can be estimated as:  
V
+ V  
+ V  
SD OS(HS)  
“ISL6144 + ORing FET” solution is more efficient, which will  
result in simplified PCB and thermal design. It will also  
eliminate the need for a heat sink for the ORing diode. This  
will result in cost savings. In addition, the ISL6144 solution  
provides a more flexible, reliable and controllable ORing  
functionality and protects against system fault scenarios  
(refer to “Fault Detection Block” on page 8).  
TH(HS)  
(EQ. 8)  
------------------------------------------------------------------------  
I
=
reverseP  
r
DS(ON)  
where:  
is the MOSFET forward voltage drop.  
V
SD  
V
OS(HS) is the voltage offset of HS Comparator.  
FN9131.7  
October 6, 2011  
9
ISL6144  
The duration of the reverse current pulse is a few hundred  
nanoseconds and is normally kept well below current rating  
of the ORing MOSFET.  
Protecting VIN and VOUT from High dv/dt Events  
In hot swap applications lacking adequate VIN and VOUT  
bulk capacitance and where the ISL6144 is directly  
connected to a prebiased bus exposing either the VIN or  
VOUT pins directly to high dv/dt transients, these pins must  
be filtered to prevent catastrophic damage caused by the  
high dv/dt transients. A simple RC filter using a pin 2 series  
resistor, of 10 -100Ω and the 100nF or greater best design  
practices decoupling capacitor to ground. This will provide a  
>1µs rise time on the VIN pin to protect it. A resistor of ~3.3  
times the value should be added in series with the VOUT pin  
to reduce the introduced HS Vth error.  
Reducing the value of V  
current amplitude and reduces transients on the common  
bus output voltage.  
results in lower reverse  
TH(HS)  
HVREF and COMP Capacitor Values  
HVREF CAPACITOR (C1)  
this capacitor is necessary to stabilize the HV  
and a value of 150nF is sufficient. Increasing this value will  
result in gate turn-on time increase.  
supply  
REF(VZ)  
Alternately, the programmed HS Vth can be adjusted upward  
COMP CAPACITOR (C2)  
by the voltage across R  
as described on page 9.  
VIN  
Placed between V  
and COMP pins to provide filtering  
OUT  
Hot Swapped  
Input  
Q
1
and decoupling. A 10nF capacitor is adequate for most  
cases.  
R
in  
R
out  
~3.3X R  
10-100  
in  
2
16  
15  
14  
VOUT  
COMP  
VSET  
VIN  
3
8
HVREF  
GND  
C
1 >  
100nF  
ISL6144  
FN9131.7  
October 6, 2011  
10  
ISL6144  
Typical Performance Curves and Waveforms  
12  
11  
10  
32  
28  
24  
75V  
48V  
75V  
48V  
12V  
10V AND 12V  
9
8
7
20  
16  
12  
10V  
-40  
-20  
0
20  
40  
60  
80  
100  
120  
-40  
-20  
0
20  
40  
60  
80  
100  
120  
TEMPERATURE (°C)  
TEMPERATURE (°C)  
FIGURE 4. CHARGE PUMP VOLTAGE (V  
TEMPERATURE  
) vs  
GQP  
FIGURE 5. REG. AMP FORWARD REGULATION  
5.4  
6.0  
5.5  
5.0  
4.5  
4.0  
3.5  
3.0  
2.5  
2.0  
75V  
48V  
75V  
5.3  
5.2  
5.1  
5.0  
48V  
10V AND 12V  
12V  
10V  
-40  
-20  
0
20  
40  
60  
80  
100  
120  
-40  
-20  
0
20  
40  
60  
80  
100  
120  
TEMPERATURE (°C)  
TEMPERATURE (°C)  
FIGURE 7. VSET VOLTAGE  
FIGURE 6. I BIAS CURRENT vs TEMPERATURE  
HV  
REF(VZ)  
6.000  
1V/DIV  
75V  
48V  
10V/DIV  
5.875  
5.750  
5.625  
5.500  
5.375  
5.250  
V
G
V
IN  
10V/DIV  
10A/DIV  
10V AND 12V  
I
IN  
-40  
-20  
0
20  
40  
60  
80  
100  
120  
TEMPERATURE (°C)  
FIGURE 9. FIRST SUPPLY START-UP  
FIGURE 8. HVREF VOLTAGE  
FN9131.7  
October 6, 2011  
11  
Typical Performance Curves and Waveforms (Continued)  
r
= 19mΩ, QTOT = 70nC,  
r
= 19mΩ, QTOT = 70nC,  
DS(ON)  
EXTERNAL C  
DS(ON)  
EXTERNAL C  
= 33nF, V  
= 55mV  
= 33nF, V  
= 55mV  
GS  
TH(HS)  
GS  
TH(HS)  
I
I
IN2  
IN2  
5A/DIV  
5A/DIV  
V
V
OUT  
OUT  
IN2  
10V/DIV  
10V/DIV  
V
IN2  
V
10V/DIV  
5V/DIV  
10V/DIV  
5V/DIV  
V
GS2  
V
GS2  
FIGURE 11. HIGH SPEED TURN-OFF, V = 48V, COMMON  
IN  
FIGURE 10. HIGH SPEED TURN-OFF, V = 48V, COMMON  
IN  
LOAD IS SMPS (C  
= 100µF) WITH  
LOAD IS SMPS (C  
= 100µF) WITH  
LOAD  
LOAD  
EQUIVALENT 4A LOAD  
EQUIVALENT 1.3A LOAD  
I
IN2  
2A/DIV  
V
OUT  
V
OUT  
2V/DIV  
10V/DIV  
10V/DIV  
V
IN2  
V
GS2  
V
IN2  
5V/DIV  
2A/DIV  
V
GS2  
5V/DIV  
I
IN2  
FIGURE 13. SLOW SPEED TURN-OFF, V = 12V, COMMON  
IN  
FIGURE 12. SLOW SPEED TURN-OFF, V = 48V, COMMON  
IN  
LOAD IS SMPS (C  
= 100µF) WITH  
LOAD IS SMPS (C  
= 100µF) WITH  
LOAD  
LOAD  
EQUIVALENT 4A LOAD  
EQUIVALENT 4A LOAD  
Application Circuit  
FN9131.7  
October 6, 2011  
12  
ISL6144  
(NOTE 13)  
DC/DC  
#1  
INPUT BUS 1  
36V TO 75VDC  
F1 (NOTE 12)  
15A  
D (NOTE 10)  
1
+OUT1 = 48V  
+IN +OUT  
R
Sa  
pb1  
10  
Q
1
Sb  
C
100µF  
C
22µF  
IN1  
pb1  
FDB3632  
+S  
SC  
-S  
PC  
PR  
-IN  
C
C
C
1
d1  
220nF  
cs1  
1nF  
FROM  
CB  
GATE  
150nF  
VIN  
VOUT  
COMP  
R
C
2
10nF  
1
499  
HVREF U1  
COMMON BUS “CB”  
10A  
5V  
R
2
47.5k  
-OUT  
R
ISL6144  
3
VSET  
FAULT  
GND  
4.99k  
(NOTE 13)  
DC/DC  
#2  
D
(NOTE 10)  
F2 (NOTE 12)  
15A  
INPUT BUS 2  
2
+OUT2 = 48V  
Sa  
36V TO 75VDC  
+IN +OUT  
R
pb2  
10  
Q
2
Sb  
C
pb2  
C
IN2  
FDB3632  
+S  
PC  
100µF  
22µF  
C
FROM  
CB  
C
3
d2  
220nF  
SC  
GATE  
150nF  
VIN  
VOUT  
COMP  
C
4
10nF  
R
5
499  
PR  
-S  
C
cs2  
1nF  
U1  
ISL6144  
HVREF  
FAULT  
5V  
R
6
47.5k  
-IN  
-OUT  
R
4
VSET  
GND  
4.99k  
SECONDARY  
PRIMARY  
NOTES:  
10. D , D are parasitic MOSFET diodes.  
1
2
11. Remote Sense pin (+S) on both DC/DC converters has to be connected either directly at the module output (Sa closed) or to the CB point (Sb  
closed). Connecting to CB is not recommended as it might cause Fault propagation in case of short circuit on a PS output.  
12. F1, F2 are optional and can be eliminated depending on power system configuration and requirements.  
13. DC/DC #1, 2 configuration is based on Vicor V48B48C250AN3.  
FIGURE 14. APPLICATION CIRCUIT FOR A 1 + 1 REDUNDANT 48V SYSTEM  
FN9131.7  
October 6, 2011  
13  
ISL6144  
A circuit fault condition is indicated on an open drain FAULT  
Using the ISL6144EVAL1Z High Voltage  
ORing MOSFET Controller Evaluation  
Board  
pin. The fault detection circuitry covers different types of  
failures; including dead short in the sourcing supply, a  
dead-short of any two ORing MOSFET terminals, or a blown  
fuse in the power distribution path.  
In a multiple supply, fault tolerant, redundant power  
distribution system, paralleled power supplies contribute  
equally to the load current through various power sharing  
schemes. Regardless of the scheme, a common design  
practice is to include discrete ORing power diodes to protect  
against reverse current flow should one of the power  
supplies develop a catastrophic output short to ground. In  
addition, reverse current can occur if the current sharing  
scheme fails and an individual power supply voltage falls  
significantly below the others.  
Typical Application  
VIN1  
9V TO 75V  
Q
1
PS_1  
C *  
DC/DC  
1
6
C *  
5
GATE  
R
C
1
2
V
PU  
VIN  
VOUT  
COMP  
VSET  
U1  
ISL6144  
C1  
R
3
HVREF  
VOUT  
R
2
LED1  
Although the discrete ORing diode solution has been used  
for some time and is inexpensive to implement, it has some  
drawbacks. The primary downside is the increased power  
dissipation loss in the ORing diodes as power requirements  
for systems increase. In some systems this lack of efficiency  
results in a cost that surpasses the cost of the ISL6144 and  
power FET implementation. The power loss across a typical  
ORing diode with 20A is about 10W. Many diodes will be  
paralleled to help distribute the heat. In comparison, a FET  
with 5mΩ on-resistance dissipates 2W, which constitutes an  
80% reduction. When multiplied by the number of paralleled  
supplies, the power savings are significant. Another  
disadvantage when using an ORing diode would be failure to  
detect a shorted or open ORing diode, jeopardizing power  
system reliability. An open diode reduces the system to a  
single point of failure while a diode short might pose a  
hazard to technical personnel servicing the system while  
unaware of this failure.  
CS  
FAULT  
GND  
RED  
VIN2  
9V TO 75V  
Q
1
PS_2  
DC/DC  
2
C *  
7
C *  
8
GATE  
U2  
ISL6144  
HVREF  
R
6
V
4
PU  
VIN  
VOUT  
COMP  
VSET  
C
C
3
4
R
R
7
LED2  
FAULT  
GND  
RED  
R
R
R
= R = 499Ω (5%)  
1
6
= R = 47.5kΩ (5%)  
2
3
7
= R = 1.21kΩ (5%)  
4
C
C
= C = 150nF (10V)  
2
1
3
= C = 10nF (10V)  
4
The ISL6144 ORing MOSFET Controller and a suitably  
sized N-Channel power MOSFET(s) increase power  
distribution efficiency and availability when replacing a  
power ORing diode in high current applications. It can be  
used in +9V to +75V systems and has an internal charge  
pump to provide a floating gate drive for the N-Channel  
ORing MOSFET.  
C * TO C * = 100nF *(100V) Optional Decoupling Caps  
5
8
- LED1, LED2 are red LEDs to indicate a fault, different interfaces  
are possible to the FAULT pin.  
- V  
PU  
is an external pull up voltage source. Also, V  
can be  
OUT  
used as the pull up source. In this case if it is higher than 16V,  
use a zener diode from the FAULT pin to GND with a clamping  
voltage less than the rating of the FAULT pin which is 16V.  
The input/output differential trip point “V  
OUT  
- V ” can be  
IN  
programmed by two external resistors (R , R or R , R ).  
This trip point can be adjusted to avoid false gate trip off due  
1
2
6
7
Related Literature  
TB389 (PCB Land Pattern Design and Surface Mount  
Guidelines for QFN (MLFP) Packages)  
to power supply noise.  
The high speed comparator action protects the common bus  
from being affected due to individual power supply shorts by  
turning off the ORing MOSFET of the shorted feed in less  
than 300ns (when using an ORing MOSFET with equivalent  
gate to source capacitance equal to 39nF).  
• Manufacturer’s MOSFET data sheets  
The Hysteretic Regulating (HR) Amplifier provides a slow  
turn-off of the ORing MOSFET. This turn-off is achieved in  
less than 100µs when one of the sourcing power supplies is  
shutdown slowly for system diagnostics, ensuring zero  
reverse current. This slow turn-off mechanism also reacts to  
output voltage droop, degradation, or power-down.  
FN9131.7  
October 6, 2011  
14  
ISL6144  
DC/DC CONVERTERS (NOT PART OF THE EVAL BOARD)  
ISL6144EVAL1Z CONTROL BOARD  
FIGURE 15. TEST SETUP USING DC/DC MODULES  
the current if their respective voltages are close to each  
ISL6144 Evaluation Board Overview  
other). ORing MOSFET’s gate drive voltage, control and  
monitoring for each of these feeds are implemented using  
the ISL6144.  
This section of the data sheet serves as an instruction  
manual for the ISL6144EVAL1Z board. It also provides  
design guidelines and recommendations for using the  
ISL6144 for ORing MOSFET control. The ISL6144EVAL1Z  
Control Board has two parallel feeds connected to each  
other through N-channel ORing MOSFETs. Each ORing  
MOSFET has an ISL6144 connected to it. This board  
demonstrates the operation of Intersil’s ISL6144 HV ORing  
MOSFET Controller IC in a typical 1 + 1 redundant power  
system.  
The board has the following features:  
• Evaluation of the ISL6144 in a 1 + 1 redundant power  
system using a single board  
• Has footprint for a total of three parallel MOSFETs per  
feed. Number of MOSFETs used will depend on the load  
current (on the standard ISL6144EVAL1Z board only one  
MOSFET is populated per feed)  
To demonstrate the functionality of the ISL6144, two power  
supplies with identical output voltages are required as the  
input to the ISL6144EVAL1Z board. This will show the ability  
of the ISL6144 to provide the gate drive voltage for the  
ORing N-Channel MOSFET. The ISL6144 also monitors the  
• Allows the user to test turn-on, slow turn-off, fast turn-off  
and different fault scenarios  
• Visual fault indication with Red LEDs  
• Banana Connectors and test points for all inputs, outputs  
and IC pins  
drain (V  
), source (V ) and gate voltages in order to  
OUT  
IN  
provide reverse current protection and protection against  
power feeds’ related faults.  
• Can be easily connected to the power system prototype  
for initial evaluation  
Figure 15 shows a test setup used in the characterization of  
ISL6144 in a 1 + 1 redundant power system.  
Note that the board was designed to handle high load  
currents (up to 20A per feed) with the appropriate MOSFET  
selection.  
ISL6144EVAL1Z Control Board (Rev C)  
This board is configured with two input power feeds  
connected in parallel for redundancy using ORing  
MOSFETs. The ISL6144 allows the two rails to operate in  
active ORing mode (This means that both feeds can share  
FN9131.7  
October 6, 2011  
15  
ISL6144  
(depending on the output capacitance value of the power  
supply/module, a local loading resistor might be needed to  
help discharge the BPS output capacitor). An output  
Input Voltage Range (+9V to +75V)  
The ISL6144 can operate in equipment with voltages in the  
+9V to +75V range. The ISL6144 can also be used in  
systems with negative voltages -9V to -75V, but it has to be  
placed on the return (high) side. For example, in ATCA  
systems, an ORing of both the low (-48V) and high (-48V  
Return) sides is required. In this case the ISL6144 can be  
used on the high side.  
capacitor C  
(equivalent to the capacitor that will be used  
OUT  
in the final power system solution) is connected to the  
Common Bus point (V ). Different types of loads can be  
OUT  
used (power resistors, electronic load or simply another  
DC/DC converter).  
Option 2: Using a custom designed DC/DC converter Power  
Board which consists of two DC/DC modules connected in  
current sharing configuration, each DC/DC module output  
can be turned off slowly using the ON/OFF pin or can be  
shorted using on-board Power MOSFET (Refer to  
The ISL6144 draws bias from both the input and output  
sides. External bias voltage rail is not needed and cannot be  
used. As soon as the Input voltage reaches the minimum  
operational voltage, the internal charge pump turns on and  
provides gate voltage to turn-on the ORing FET.  
Figure 17). In this case also, similar considerations for C  
and type of load apply as in option 1.  
OUT  
Multiple Feed ORing (ISL6144EVAL1Z)  
In today’s high availability systems, two or more power  
supplies can be paralleled to provide redundancy and fault  
tolerance. These paralleled power supplies operate in an  
active ORing mode where all of these supplies share the  
load current, depending on the redundancy scheme  
implemented in the particular system. The power system  
must be able to continue its normal operation, even in the  
event of one or more failures of these power supplies. Faults  
occurring on the power supply side need to be isolated from  
the common bus point connected to the system critical  
loads. This fault isolation device is known as the ORing  
device. The function of the ORing device is to pass the  
forward supply current flowing from the power supply side  
and block the reverse fault current. A fault current might flow  
if a short occurs on the input side (typically this could be a  
power supply output capacitor short). In this case, the input  
voltage drops and current may flow in the reverse direction  
from the load to the input, causing the common bus to drop  
and the system to fail. Although ORing diodes are simple to  
implement in such systems, they suffer from many  
USED ONLY FOR POWERING THE LEDS  
AUX PS*  
5V  
+
-
PS1_V1 = V  
IN1  
J4  
V
+
J1  
5V_AUX  
Q
SHORT  
IN1  
PS1  
+48V  
PS1_V1RTN  
J6  
J2  
L
GND  
C
-
OUT  
V
O
A
D
OUT  
J3  
J7  
PS2_V2 = V  
IN2  
+
V
GND  
IN2  
PS2  
+48V  
J8  
PS2_V2RTN  
GND  
ISL6144EVAL1Z  
BENCH POWER  
SUPPLIES  
CONTROL  
BOARD  
*Auxiliary power supply is used to power the LED circuit. If V  
is  
is  
OUT  
(J5). If V  
less than 16V, J1 can be connected directly to V  
OUT  
OUT  
higher than 16V, we still can use V  
to replace AUX PS, but a  
OUT  
zener diode has to be connected from FAULT to GND to clamp the  
voltage across the pin to 16V or lower.  
FIGURE 16. TEST SETUP USING BENCH PS  
.
drawbacks, as outlined earlier.  
USED ONLY FOR POWERING THE LEDs  
+
AUX PS  
The ISL6144 (with an external N-Channel MOSFET)  
provides an integrated solution to perform the ORing  
function in high availability systems, while increasing power  
system efficiency at the same time.  
-
PS1_V1  
J4  
V
J4  
J1  
+
J1  
J2  
5V_AUX  
V
IN1  
OUT1  
PS1  
+48V  
DC/DC 1  
PS1_V1RTN  
J6  
J2  
J6  
GND  
L
O
A
D
-
PRI_GND  
CS  
V
Operating Instructions and Functional  
Tests  
Test setup for ISL6144EVAL1Z is shown in Figures 16 and  
17 with two options for the input power sources.  
C
OUT  
OUT  
GND  
J7  
PS2_V2  
J3  
J7  
+
J3  
V
V
IN2  
GND  
OUT2  
PS2  
+48V  
DC/DC 2  
J8  
PS2_V2RTN  
J8  
-
J9  
GND  
ISL6144EVAL1Z  
Option 1: Using two identical bench power supplies (BPS)  
connected directly to the ISL6144EVAL1Z Control Board  
(refer to Figure 16). Just make sure to program the voltages  
on PS1_V1 and PS2_V2 to identical values so that they  
GND  
PRI_GND  
BENCH POWER  
SUPPLIES  
POWER MODULES  
BOARD*  
CONTROL  
BOARD  
*Power Modules Board can be replaced by bench power supplies or  
any discrete DC/DC modules. Just make sure to adjust both V  
share the load current. A MOSFET (Q  
) is connected at  
short  
OUT1  
close to each other to allow current sharing between the  
and V  
the Input of one or both feeds as close as possible to the  
input connectors of the ISL6144EVAL1Z board. Slow turn-off  
of the input BPS can be performed by the on/off button  
OUT2  
two modules (Refer to option 1 and Figure17).  
FIGURE 17. TEST SETUP USING DC/DC MODULES  
FN9131.7  
October 6, 2011  
16  
ISL6144  
DC/DC Converter Power Board (not part of the  
ISL6144EVAL1Z board)  
Two-Feed Parallel Evaluation  
Two Feed parallel operation verification can be performed  
after completion of the single feed evaluations. Make sure  
that the two Input power supplies connected to the  
ISL6144EVAL1Z board are identical in voltage value.  
Identical input voltages are needed to enable the two feeds  
to share the load current (In real world power systems,  
current sharing is most likely insured by the power  
supplies/modules that have an active current sharing  
feature).  
The DC/DC converter board consists of two DC/DC  
converters with independent input voltage rails. In reality, two  
identical power supplies can be used in the test setup to  
replace this board (contact Intersil Applications Engineering  
if you need assistance in your test setup). This DC/DC  
converter board is configured for operation at different output  
voltage levels depending on the choice of DC/DC modules.  
Most evaluation results are provided for a mix of +48V and  
+12V input voltages. Any other voltage within the +9V to  
+75V range can also be used.  
1. Turn-on PS1 and PS2 in sequence (hot plugging is not  
recommended). Adjust V  
and V close to each  
IN1  
IN2  
other. Verify the input current of both feeds to be within  
acceptable current sharing accuracy (~10%). Current  
sharing accuracy will be very poor at light loads and  
becomes better with higher load currents.  
Each DC/DC converter has a low r  
DS(ON)  
MOSFET  
connected in parallel to the output terminals. This MOSFET  
is normally off. When turned on it simulates a short across  
the output. Another MOSFET is connected at the ON/OFF  
pin of the modules to simulate a slow turn-off of the module.  
2. Adjust the load current to different values and verify that  
both V  
(TP1 to TP2) and V  
(TP4 to TP5) are close  
SD1  
SD2  
Single-Feed Evaluation  
to each other. These two voltages might be different  
depending on the amount of load current passing through  
each of the two feeds.  
The ISL6144EVAL1Z is hooked up to two input power  
supplies using test setup shown in Figure 16 or Figure 17.  
Note that the ISL6144EVAL1Z is populated with one  
FDB3632 MOSFET per feed (Nominal value of the  
3. At light loads, I  
* r is less than 20mV, the  
Load DS(ON)  
ISL6144 operates in the forward regulation mode and  
gate voltage is modulated as a function of load current.  
MOSFET’s r  
DS(ON)  
is approximately 8mΩ at V = 10V).  
GS  
When I  
*r becomes higher than the regulated  
Load DS(ON)  
1. Connect the input power supplies, auxiliary 5V power  
supply, load and output capacitor to the ISL6144EVAL1Z.  
20mV, the charge pump increases and clamps the gate  
voltage to the maximum possible charge pump voltage,  
V
.
GQP  
2. Connect test equipment (Oscilloscope, DMM) to the  
signals of interest using on-board test points and scope  
probe jacks.  
4. Verify the Gate voltage of both MOSFETs V  
(TP13 to  
GS1  
(TP14 to TP21) with different load  
TP17) and V  
currents.  
GS2  
3. Turn-on PS1 with V  
IN1  
= +48V (V can be any voltage  
IN1  
within +9V to +75V). Turn-on the auxiliary power supply  
(AUX PS powering the LED circuit) with +5V. Adjust load  
current to 2A. Verify the main operational parameters  
such as the 20mV forward regulation at light loads, and  
gate voltage as a function of load current.  
5. Both LED1 and LED2 are off when both feeds are on.  
6. For I = 4A, turn-off V and note that V has  
Load  
IN2  
GS2  
has increased from  
turned off. LED2 is RED and V  
GS1  
around 4V to V  
.
GQP  
7. Turn V  
IN2  
back on and turn V  
off. V is now off.  
GS1  
IN1  
has increased to V  
4. The forward voltage drop across the MOSFET terminals  
LED1 is RED. V  
.
GS2  
GQP  
V
(TP1-TP2) is equal to the maximum of the 20mV  
SD1  
forward regulated voltage drop across the source-drain  
“V “ or the product of the load current and the  
Performance Tests  
FWD_HR  
MOSFET on-state resistance “I  
Performance tests can be carried out after the two feeds  
have been verified and found to be operational in active,  
1 + 1 redundancy (when two feeds share the load current,  
current sharing is ensured by the incoming power supplies.)  
These include gate turn-on at power supply start-up, fast  
speed turn-off (in case of fast dropping input rail), slow  
speed turn-off (in response to slow dropping input rail) and  
fault detection in response to different faults.  
* r  
”.  
Load DS(ON)  
5. For I  
= 2A, V  
SD1  
is equal to V = 20mV. The  
Load  
FWD_HR  
gate-source voltage is modulated as a function of load  
current and MOSFET transconductance. Gate-source  
voltage V  
(TP13 -TP17) is approximately 4V. In this  
GS1  
case, LED1 is off. LED2 will be RED as V  
is still off.  
IN2  
6. Increase the load current I  
to 4A. Note that V is  
Load  
DS1  
and operation in the 20mV  
increased to above V  
FWD_HR  
forward regulation cannot be maintained. The MOSFET  
cannot deliver the required load current with a 20mV  
Gate Start-Up Test  
constant V  
pumped to V  
. In this case, gate voltage is fully charge-  
(10.6V nominal).  
FIRST-FEED START-UP  
SD1  
GQP  
and turn-on V  
When the first feed is turned on, as V  
rises, conduction  
IN1  
7. Turn-off V  
IN1  
and repeat the same tests  
occurs through the body diode of the MOSFET. This only  
occurs for a short time until the MOSFET gate voltage can  
be charge-pumped on. This conduction is necessary for  
proper operation of the ISL6144. It provides bias for the gate  
IN2  
listed above. Make sure the ISL6144 is providing gate  
voltage, which is modulated based on the load current.  
V
is measured between (TP4-TP5), V is  
GS2  
SD2  
measured between (TP14-TP21).  
FN9131.7  
October 6, 2011  
17  
ISL6144  
hold off and other internal bias and reference circuitry. The  
charge pump circuitry starts functioning as the input voltage  
V
= 12V; RESISTIVE LOAD = 5A, C  
= 33nF  
IN  
GSEXT  
I
at the V pin reaches a value around 8V. The gate voltage  
depends on the load current (as explained in previous  
sections), The maximum gate voltage will be clamped to a  
IN1  
IN  
5A/DIV  
V
G1  
maximum of V  
when load current becomes too high to  
GQP  
5V/DIV  
be handled with 20mV across the source-drain terminals.  
Overall, it takes less than 1ms to reach the load-dependent  
final gate voltage value. Note that the Input voltage cannot  
V
be hot swapped and has to rise slowly. A rise time of at least  
1ms is recommended for the voltage at VIN pin.  
IN1  
5V/DIV  
V
V
= 48V; RESISTIVE LOAD = 4A, C  
= 33nF  
V
IN  
GSEXT  
WAVEFORMS  
OUT  
,V ,I  
and HV  
REF(VZ)  
5V/DIV  
IN1 G1 IN1  
HV  
REF(Vz)  
5V/DIV  
4A  
I
IN1  
2A/DIV  
V
0A  
G1  
FIGURE 19. FIRST FEED V  
START-UP (12V CASE)  
IN1  
10V/DIV  
The start-up tests were done with the addition of an external  
gate to source capacitor to demonstrate start-up time with a  
total equivalent gate-source capacitance around 39nF.  
V
IN1  
10V/DIV  
SECOND (CONSECUTIVE) FEED START-UP  
In this case, the ISL6144 for the second (consecutive) feed  
(U4) already has output bias voltage as the first parallel feed  
WHEN V REACHES ~ 8V AND HVREF REACHES  
IN  
3V to 4V, GATE CHARGE PUMP ACTION STARTS  
has been turned on and V  
is present on the common bus.  
OUT  
As V  
IN2  
rises, V rises with it (V is GATE2 voltage with  
G2 G2  
respect to GND). When V  
approaches V  
value, Gate 2 is  
IN2  
IN1  
turned. Second feed gate turn-on is faster than the first feed as  
V
, V , I  
IN1 G1 IN1  
and V  
WAVEFORMS  
OUT  
the HVREF capacitor (C ) is already charged.The second or  
3
consecutive power supply to be started can be turned on faster  
than the first power supply, a rise time of at least 200µs of the  
second rail is recommended.  
4A  
I
IN1  
5A/DIV  
0A  
V
= 48V; RESISTIVE LOAD = 4A, C  
= 33nF  
GS(EXT)  
IN  
V
OUT  
20V/DIV  
I
IN2  
2A/DIV  
V
OUT  
20V/DIV  
V
G1  
20V/DIV  
V
IN1  
20V/DIV  
IN THIS CASE GATE VOLTAGE IS MEASURED  
BETWEEN GATE2 AND GND  
V
SECOND GATE TURNS ON ONLY  
WHEN V REACHES V  
G2  
20V/DIV  
WHEN V REACHES ~ 8V  
AND HVREF REACHES 3V TO 4V  
IN  
IN2 IN1  
GATE CHARGE PUMP ACTION STARTS  
V
IN2  
20V/DIV  
POWER SUPPLY  
RELATED DELAY  
FIGURE 18. FIRST FEED V  
START-UP (48V CASE)  
IN1  
FIGURE 20. SECOND (CONSECUTIVE) FEED V  
IN2  
START-UP  
FN9131.7  
October 6, 2011  
18  
ISL6144  
t
is the High Speed Comparator internal worst-  
Gate Fast Turn-off Test  
DELAY(HS)  
case time delay. The setup in Figure 17 can be used to  
perform the Input dead-short test; a pulse generator is  
During normal operation, the ISL6144 provides gate drive  
voltage for the ORing MOSFET when the Input voltage  
exceeds the output voltage. The current flows in the forward  
direction from the input to the output. Now, what happens if  
the input voltage drops quickly below the output voltage as a  
result of a failure on the input sourcing power supply while  
the MOSFET remained on? The answer is: If the MOSFET is  
kept on, current starts to flow in the reverse direction from  
the output to the input. Of course this is not desired nor  
acceptable. It will lead to effectively shorting the output and  
causing an overall system failure. In order to block this  
reverse current, the ISL6144 senses the voltage at both VIN  
connected between Gate-Source of Q  
(use pulse  
SHORT1  
mode single shot, set the frequency to <10Hz and pulse  
width of approximately 10ms, t = 1µs). Follow steps 1  
RISE  
through 5 in the two feed parallel operation section. Make  
sure that both feeds operate in parallel current sharing  
mode. Proceed with the short test by applying the single  
pulse to the gate of Q  
. Once turned on, Q  
SHORT1 SHORT1  
shorts V  
causing it to fall quickly (in less than 10µs).  
IN1  
Figures 21, 22 and 23 show the results for different  
combinations of C and load current. Make sure to  
GS1  
shorting-MOSFET terminals as close as  
connect the V  
IN1  
and COMP pins (this is V  
voltage reduced by a resistor  
OUT  
programmable threshold (V  
possible to the V -GND (J4 to J6) terminals on the EVAL  
board to minimize lead impedance and reduce parasitic  
ringing.  
IN  
), it is programmed to  
TH(HS  
55mV on the EVAL board and could be adjusted by  
changing R1, R values for both feeds. If V drops below  
4
IN  
COMP (V  
- V  
), the High Speed Comparator turns  
OUT  
TH(HS  
V
= V  
= 48V;  
= 33nF  
IN1  
RESISTIVE LOAD = 6A, C  
IN2  
off the gate of the ORing MOSFET very quickly, the gate pull  
down current I is 2A. As a result the reverse current flow  
gs(ext)  
I
IN1  
PDH  
2A/DIV  
is prevented. The maximum turn-off time is less than 300ns  
when using an ORing MOSFET(s) with an equivalent gate-  
REVERSE CURRENT  
source capacitance of 39nF (equivalent to Q  
= 390nC at  
TOT  
V
= 10V).  
V
GS  
OUT  
10V/DIV  
On the ISL6144EVAL1Z board, FDB3632 has an equivalent  
gate-source capacitance of 8.4nF, some of the tests are  
performed while an external gate to source capacitance is  
added to demonstrate gate current sink capability.  
V
IN1  
10V/DIV  
V
GS1  
5V/DIV  
V
= V  
= 48V; RESISTIVE LOAD = 4A, C = 0nF  
GS(EXT)  
IN1  
IN2  
0.1µs/DIV  
V
G2  
10V/DIV  
FIGURE 22. FAST SPEED TURN-OFF (MOSFET WITH  
V
OUT  
Q
= 8.4nc) AND 33nF EXTERNAL C  
TOT  
GS  
I
IN1  
2A/DIV  
10V/DIV  
V
V
= V  
= 48V;  
= 33nF  
GS1  
IN1  
RESISTIVE LOAD = 6A, C  
IN2  
2V/DIV  
I
gs(ext)  
IN1  
2A/DIV  
REVERSE CURRENT DISSAPPEARS  
WHEN GATE IS COMPLETELY OFF  
V
G2  
10V/DIV  
0.1µs/DIV  
V
OUT  
10V/DIV  
FIGURE 21. FAST SPEED TURN-OFF  
(MOSFET WITH Q = 8.4nc)  
TOT  
V
GS1  
5V/DIV  
Worst-case turn-off time can be calculated as:  
V
0.1µs/DIV  
GS  
-------------  
t
t
= t  
+ C  
toff(WC)  
toff(WC)  
DELAY(HS)  
GS  
I
(EQ. 9)  
PDH  
12V  
----------  
= 50ns + 39nF  
= 284ns  
2A  
FIGURE 23. FAST SPEED TURN-OFF (MOSFET WITH  
= 8.4nc) AND 33nF EXTERNAL C  
Q
TOT  
gs  
FN9131.7  
October 6, 2011  
19  
ISL6144  
The ISL6144EVAL1Z board has V  
TH(HS)  
of 55mV. It can be  
Input Voltage is falling at a slow rate (Figure 24, top scope  
shot shows a 20ms fall time for the input voltage).  
changed if performance is found to be unacceptable with this  
value. V can affect the amplitude of the reverse current  
TH(HS)  
(short pulse) that might flow before the gate is effectively  
turned off (details on how to select V is included in a  
V
(Common Bus) remains almost unchanged at around  
OUT  
48V. It drops by a value equivalent to the increase in the  
portion of the load current passing through the remaining  
TH(HS)  
later section of this application note). The r  
and internal  
DS(ON)  
feed multiplied by the MOSFET’s r  
.
DS(ON)  
At the beginning of the slow turn-off, the gate drive Voltage  
V (measured between the Gate and Source of the  
GS1  
HS comp offset also contribute to the amplitude of the reverse  
current pulse. A short event on a single feed may cause  
ringing on the ground pins, the V , and on the V  
pins.  
IN OUT  
This ringing may cause false turn-off on the healthy feeds.  
Using decoupling capacitors both at the V and V pins  
help in filtering this high frequency ringing and prevent false  
turn-off of parallel feeds. Figure 23 shows that the gate of  
ORing MOSFET using a differential probe) starts to drop at a  
slower rate. This is attributed to the effect of the 20µs  
filtering-delay. Afterwards a stronger pull down current starts  
and finally the high-speed turn-off completes the gate turn-  
off. Current through the turned off feed is also shown to be  
positive and the turn-off is complete with no reverse current.  
IN OUT  
second feed V (measured with respect to ground) is not  
G2  
affected when feed 1 input is shorted.  
Figure 25 shows the same slow turn-off for a 12V input  
voltage case.  
Power Supply Slow Turn-off  
In many cases, a single power feed is turned off for  
diagnosis, maintenance or replacement. The Input voltage  
V
= V  
= 12V  
IN2  
IN1  
drops slowly (most probably in few ms). When voltage at V  
IN  
pin. The Hysteretic  
pin starts dropping with respect to V  
OUT  
Regulating Amplifier starts pulling down current (I  
)
PDL  
opposite to the charge pump current. This reduces the gate  
voltage gradually until the MOSFET is completely turned off.  
The slow turn-off is accomplished with zero reverse current.  
An internal 20µs delay filters out any false trip off due to  
noise or glitches that might be present on the supply line.  
The slow speed turn-off mechanism is shown in Figure 24:  
5ms/DIV  
V
= V  
= 48V  
IN2  
IN1  
ZOOMED IN VIEW  
I
IN2  
V
OUT  
V
OUT  
2V/DIV  
V
V
GS2  
IN2  
V
IN1  
2V/DIV  
V
GS1 (DIFF PROBE)  
5V/DIV  
5ms/DIV  
ZOOMED IN VIEW  
I
IN2  
2A/DIV  
V
OUT  
10V/DIV  
I
IN1  
2A/DIV  
20µs/DIV  
V
IN2  
10V/DIV  
V
GS2  
5V/DIV  
FIGURE 25. SLOW SPEED TURN-OFF (C  
GSTOT  
= 8.4nF + 33nF)  
20µs/DIV  
FIGURE 24. SLOW SPEED TURN-OFF (C  
= 8.4nF + 33nF)  
GSTOT  
FN9131.7  
October 6, 2011  
20  
ISL6144  
Fault 3: MOSFET Gate to Source Dead Short  
Detection of Power Feed Faults  
GATE voltage will be equal to V , GATE <V + 0.37V and a  
fault is indicated.  
The ISL6144 have two built-in mechanisms that monitor  
voltages at VIN, VOUT and GATE pins. The first mechanism  
monitors GATE with respect to VIN (with a 410mV threshold)  
IN IN  
V
= 12V, FAULT PULLED TO +5V  
and the second mechanism monitors V with respect to VOUT  
IN  
IN  
(with 370mV threshold). The open-drain FAULT pin will be  
pulled low when any of the two above conditions is met.  
FAULT  
5V/DIV  
V
Some of the typical system faults detected by the ISL6144 are:  
G1  
5V/DIV  
Fault 1: Open Fuse at the Input Side  
V
IN1  
5V/DIV  
(Fuse has to be placed before the V tap, between the  
IN  
power supply and the source of the ORing MOSFET), note  
that the EVAL board does not have footprint for installing this  
fuse. This feature can be tested by adding a fuse externally.  
The open fuse results in near zero current flow through the  
ORing MOSFET, only a very low current drawn by the IC  
bias will flow. The voltage at VIN pin is effectively  
V
OUT  
5V/DIV  
disconnected from the power source and will start dropping  
slowly. The regulated source-drain voltage falls below its  
20mV level and the gate of the MOSFET is pulled down and  
turned off. GATE will become low and a fault is indicated with  
TIME SCALE  
100µs/DIV  
FIGURE 27. MOSFET GATE TO SOURCE FAULT  
internal built in delay (t  
).  
Fault 2: Drain to Source Short  
In this case V is shorted to V , and in theory the voltage  
FLT  
Fault 4: ORing FET Off Condition  
IN OUT  
When V < V , the Gate is off to block reverse current  
IN OUT  
flow. This means that if an ORing feed is not sharing current,  
a fault will be indicated. Also if a feed (PS) is off while bias is  
drop across the shorted MOSFET terminals will be close to  
0V. The Gate will be pulled down and a fault will be  
indicated. The resistance of the Drain to Source short  
multiplied by the Drain short current must be low enough to  
applied from V  
to that feed, then a fault is also indicated.  
OUT  
Fault 5: MOSFET Gate to Drain Dead Short  
result in V < V  
(refer to data sheet for worst case  
values), Otherwise this fault cannot be detected.  
SD FWD_HR  
In this case, the following condition will be violated GATE  
<V + 0.37V and a fault is issued.  
IN  
V
= 12V, FAULT PULLED TO +5V  
IN  
V
= 12V, FAULT PULLED TO +5V  
IN  
FAULT  
5V/DIV  
FAULT  
5V/DIV  
V
G1  
5V/DIV  
V
G1  
5V/DIV  
V
IN1  
5V/DIV  
V
IN1  
5V/DIV  
V
OUT  
5V/DIV  
V
OUT  
5V/DIV  
TIME SCALE  
100µs/DIV  
TIME SCALE  
100µs/DIV  
FIGURE 26. MOSFET DRAIN TO SOURCE FAULT  
FIGURE 28. MOSFET GATE TO DRAIN FAULT  
FN9131.7  
October 6, 2011  
21  
ISL6144  
For example, in a 48V, 32A (1 + 1) redundant system with  
Fault 6: ORing FET Body Diode Conduction  
(V - 0.41V > V ). If the voltage drop across the  
MOSFET approaches 410mV, a fault will be indicated. Make  
sure the selection of the ORing MOSFET takes this fact into  
account.  
current sharing, using a Schottky diode as the ORing device  
(Refer to Figure 29), the forward voltage drop is in the 0.4V to  
0.7V range, (let us assume it is 0.5V). The power loss across  
each diode is shown in Equation 10:  
IN OUT  
I
OUT  
--------------  
Application Considerations and  
Component Selection  
P
= P  
=
V = 16A 0.5V = 8W  
loss(D1)  
loss(D2)  
F
2
(EQ. 10)  
“ISL6144 + ORing FET” vs “ORing Diode” Solution  
The total power loss across the two ORing diodes is 16W.  
“ISL6144 + ORing FET“ solution is more efficient than the  
“ORing Diode” Solution, which will result in simplified PCB  
and thermal design. It will also eliminate the need for a heat  
sink for the ORing diode. This will result in cost savings. In  
addition is the fact that the ISL6144 solution provides a more  
flexible, reliable and controllable ORing functionality and  
protects against system fault scenarios (Refer to the “Fault  
Detection Block” on page 8.)  
D
1
0.5V@ 16A  
INPUT BUS 1  
+IN1 = 48V  
DC/DC  
1
V
OUT  
(32A)  
CS  
D
2
0.5V @ 16A  
INPUT BUS 2  
+IN2 = 48V  
DC/DC  
2
On the other hand the most common failures caused by  
diode ORing include open circuit and short circuit failures. If  
one of these diodes (Feed A) has failed open, then the other  
Feed B will provide all of the power demand. The system will  
continue to operate without any notification of this failure,  
reducing the system to a single point of failure. A much more  
dangerous failure is where the diode has failed short. The  
system will continue to operate without notification that the  
short has occurred. With this failure, transients and failures  
on Feed B propagate to Feed A. Also, this silent short failure  
could pose a significant safety hazard for technical  
FIGURE 29. 1 + 1 REDUNDANT SYSTEM WITH DIODE ORING  
If we use a 4.5mΩ MOSFET (refer to Figure 30), the nominal  
Power loss across each MOSFET is:  
2
I
OUT  
2
--------------  
P
P
= P  
=
r  
DS(ON)  
loss(M1)  
loss(M2)  
(EQ. 11)  
2
= (16A) ⋅ 4.5mΩ = 1.152W  
lossNOM(M1)  
The total power loss across the two ORing MOSFETs is  
2.304W.  
personnel servicing these feeds.  
In case of failure of current sharing scheme, or failure of  
DC/DC 1, the full load will be supplied by DC/DC 2. ORing  
“ISL6144 + ORing FET” vs “Discrete ORing FET”  
Solution  
MOSFET M2 or ORing Diode D will be conducting the full  
2
If we compare the ISL6144 integrated solution to discrete  
ORing MOSFET solutions (with similar performance  
parameters), the ISL6144 wins in all aspects, the main ones  
being simplicity of an integrated solution, PCB real estate  
saving, cost savings, and reduction in the MTBF of this section  
of the circuit as the overall number of components is reduced.  
load current. Power lost across the ORing devices are:  
P
= I  
V = 32A 0.5V = 16W  
(EQ. 12)  
lossMAX(D2)  
lossMAX(M2)  
OUT  
F
2
2
P
= (I  
)
r  
= (32A) ⋅ 4.5mΩ = 4.6W  
DS(ON)  
OUT  
(EQ. 13)  
In brief, the solution offered by this IC enhances power  
system performance and protection while not adding any  
considerable cost, on the contrary saving PCB board real  
estate and providing a simple to implement integrated  
solution.  
M1  
4.5mΩ  
0.072V @ 16A  
INPUT BUS 1  
+IN1 = 48V  
DC/DC  
1
V
OUT  
(32A)  
CS  
M2  
ORing MOSFET Selection  
4.5mΩ  
0.072V@ 16A  
Using an ORing MOSFET instead of an ORing diode results  
in increased overall power system efficiency as losses across  
the ORing elements are reduced. The benefit of using ORing  
MOSFETs becomes even more significant at higher load  
currents as power loss and forward voltage drop across the  
traditionally used ORing diode is increased. The high power  
dissipation across these diodes requires paralleling of many  
diodes as well as special thermal design precautions such as  
heat sinks (heat dissipating pads) and forced airflow.  
INPUT BUS 2  
+IN2 = 48V  
DC/DC  
2
FIGURE 30. 1+1 REDUNDANT SYSTEM WITH MOSFET ORING  
FN9131.7  
October 6, 2011  
22  
ISL6144  
This shows that worst-case failure scenario has to be  
accounted for when choosing the ORing MOSFET. In both  
cases, more than one ORing MOSFET/diode has to be  
paralleled on each feed. Using parallel devices reduces  
power dissipation per device and limits the junction  
temperature rise to acceptable safe levels. Another  
• Current handling capability, steady state and peak, are  
also two important parameters that must be considered.  
The limitation on the maximum allowable drain current  
comes from limitation on the maximum allowable device  
junction temperature. The thermal board design has to be  
able to dissipate the resulting heat without exceeding the  
MOSFET’s allowable junction temperature.  
alternative is to choose a MOSFET with lower r  
(Refer to Tables 1 and 2 for some examples).  
DS(ON)  
Suppose P  
= 1W in a D2PAK MOSFET, junction to  
Loss  
ambient thermal resistance R  
2
= +43°C/W (with 1 inch  
θJA  
= +175°C, r  
If parallel MOSFETs are used on each feed, make sure to  
use the same part number. Also it is preferable to have parts  
from the same lot to insure load sharing between these  
paralleled devices.  
copper pad area), T  
= 4.5mΩ,  
JMAX  
DS(ON)  
maximum ambient board temperature = +85°C.  
We need to make sure that the MOSFET’s junction  
temperature during operation does not exceed the maximum  
allowable device junction temperature.  
The final choice of the N-Channel ORing MOSFET depends  
on the following aspects:  
T = T  
A_max  
+ P  
Loss  
• R  
θJA  
J
• Voltage Rating: The drain-source breakdown voltage  
V
has to be higher than the maximum input voltage,  
T = +85°C+1W. +43°C/W = +128°C  
J
DSS  
including transients and spikes. Also, the gate to source  
voltage rating has to be considered. The ISL6144  
maximum Gate charge voltage is 12V. Make sure the used  
T < T  
J
JMAX  
In the example of Figure 30 with a load of 32A, at least 3  
MOSFETs with r = 4.5mΩ are paralleled to limit the  
MOSFET has a maximum V  
rating >12V.  
GS  
DS(ON)  
dissipation to below 1W and operate with safe junction  
temperature.  
• Power Losses: In this application, the ORing MOSFET is  
used as a series pass element, which is normally fully  
enhanced at high load currents. Switching losses are  
negligible. The major losses are conduction losses, which  
depend on the value of the on-state resistance of the  
Tables 1 and 2 show MOSFET selection for some typical  
applications with different input voltages and load currents in  
a 1 + 1 redundant power system (a maximum of 1W of  
power dissipation across each MOSFET is assumed).  
MOSFET r  
, and the per feed load current. For an  
DS(ON)  
N + 1 redundant system with perfect current sharing, the  
per feed MOSFET losses are:  
For a 48V Input:  
2
I
LOAD  
N + 1  
(EQ. 14)  
----------------  
P
=
r  
DS(ON)  
loss(FET)  
TABLE 1. INPUT VOLTAGE = 48V  
I
MOSFET PART NUMBER  
N (Note 13)  
Load_Max  
• The final MOSFET selection has to be based on the worse  
case current when the system is reduced to N parallel  
supplies due to a permanent failure of one unit. The  
remaining units have to provide the full load current. In this  
case, losses across each remaining ORing MOSFET  
become Equation 15:  
8A  
FDB3632 (Note 14)  
SUM110N10-08 (Note 15)  
1
1
16A  
32A  
FDB3632 (Note 14)  
SUM110N10-08  
FDB045AN08A0 (Note 16)  
2
2
1
FDB3632 (Note 14)  
SUM110N10-08  
FDB045AN08A0  
4
4
3
2
I
LOAD  
N
----------------  
P
=
r  
DS(ON)  
(EQ. 15)  
loss(FET)  
NOTES:  
13. Number of parallel MOSFETs per feed  
• In the particular cases illustrated in the previous examples  
of Figures 29 and 30 with N = 1, each of the two ORing  
feeds have to be able to handle the full load current.  
14. V  
15. V  
16. V  
= 100V;I = 80A; r  
= 9mΩ  
DSS  
DSS  
DSS  
D
DS(ON)  
= 100V; I = 110A; r  
= 9.5mΩ  
D
DS(ON)  
= 4.5mΩ  
DS(ON)  
• The MOSFET’s r  
DS(ON)  
value also depends on junction  
= 75V; I = 80A; r  
D
temperature; a curve showing this relationship is usually  
part of any MOSFET’s data sheet. The increase in the  
value of the r  
account.  
over-temperature has to be taken into  
DS(ON)  
FN9131.7  
October 6, 2011  
23  
ISL6144  
For a 12V to 24V Input:  
The duration of the reverse current pulse is in the order of a  
few hundred nanoseconds and is normally kept well below  
the current rating of the ORing MOSFET.  
TABLE 2. INPUT VOLTAGE = 12V TO 24V  
I
MOSFET PART NUMBER  
N
Load_Max  
Reducing the value of V  
current amplitude and reduces transients on the common  
bus voltage.  
results in lower reverse  
TH(HS)  
15A  
IRF1503S (Note 17)  
SUM110N03-03P (Note 18)  
STB100NF03L-03 (Note 19)  
1
1
1
40A  
75A  
IRF1503S  
SUM110N03-03P  
STB100NF03L-03  
2
2
2
Just a reminder, this is not an operating scenario, but it is  
rather a fault scenario and should not occur frequently. As  
explained above, different power supplies have different  
IRF1503S  
SUM110N03-03P  
STB100NF03L-03  
3
3
3
noise spectrum and might need adjustment of the V  
.
TH(HS)  
The following procedure can be used for V  
selection:  
TH(HS)  
NOTES:  
Choose a value of V  
such that the net HS comparator  
TH(HS)  
threshold voltage is positive to allow turn-off only when V  
17. V  
18. V  
19. V  
= 30V; I = 190A; r  
= 3.3mΩ  
= 2.6mΩ  
= 3.2mΩ  
DSS  
DSS  
DSS  
D
DS(ON)  
DS(ON)  
DS(ON)  
IN  
is lower than COMP. Take into account the worst-case of the  
HS Comp offset (V = +25mV to -40mV). A good  
= 30V; I = 110A; r  
D
= 30V; I = 100A; r  
D
OS(HS)  
starting value is 55mV. The sum of R and R is not to  
20. All Above listed r  
DS(ON)  
values are at V  
= 10V  
GS  
1
2
exceed 50kΩ. It is suggested to choose R = 47.5kΩ and  
2
Another important consideration when choosing the ORing  
MOSFET is the forward voltage drop across the drain-  
source. If this drop approaches the 0.41V limit, (which is  
calculate R according to Equation 17:  
1
V
TH(HS)  
----------------------------------------------------------------  
R
=
R
(EQ. 17)  
1
2
V
V  
TH(HS)  
used in the V  
fault monitoring mechanism), this will  
REF(VSET)  
OUT  
result in a permanent fault indication. Normally, this voltage  
drop is chosen to be less than 100mV.  
R = 499Ω  
1
R resistor connected between VOUT and COMP pins  
Setting the External HS Comparator  
Threshold Voltage  
1
R resistor connected between COMP and VSET pins  
2
Typically, DC/DC modules used in redundant power systems  
have some form of active current sharing to realize the full  
benefit of this scheme including lower operating  
V
= 5.3V  
REF(VSET)  
1. Operate all parallel feeds in current sharing mode (either  
by using current sharing techniques or by simply  
adjusting the voltages very close to each other for natural  
current sharing).  
temperatures, lower system failure rate, as well as better  
transient response when load step is shared. Current  
sharing is realized using different techniques; all of these  
techniques will lead to similar modules operating under  
similar conditions in terms of switching frequency, duty cycle,  
output voltage and current. When paralleled modules are  
current sharing, their individual output ripple will be similar in  
amplitude and frequency and the common bus will have the  
same ripple as these individual modules and will not cause  
any of the turn-off mechanisms to be activated as the same  
2. Vary the load current from 1A to its maximum value,  
monitor the gate voltages, and make sure all gates are on  
(note that at very light loads the current sharing scheme  
might stop functioning and only one feed carries this light  
current, at this point gate voltages will be just above the  
gate threshold, and even maybe one gate will be on while  
the others are not).  
3. If at medium to maximum load currents all feeds have  
ripple will be present on both sensing nodes (V and  
IN  
their gates on, then the chosen V  
is suitable.  
TH(HS)  
V
). This would allow setting the high speed comparator  
OUT  
4. If only one feed has its gate on, the threshold value is too  
low and the gate is turning off due to power supply noise  
and needs to be increased. Also, the feeds may not be  
sharing the load current due to discrepancy in output  
voltages and current sharing failure.  
threshold (V  
) to a very low value. As a starting point, a  
TH(HS)  
V
of 55mV could be used, the final value of this TH  
TH(HS)  
will be system dependent and has to be finalized in the  
system prototype stage. If the gate experiences false turn-off  
due to system noise, the V  
has to be increased.  
TH(HS)  
5. Verify the current sharing scheme and output voltages. If  
the output voltages and currents of each feed are equal  
The reverse current peak can be estimated as:  
but one or more of the gates is still off, increase V  
TH(HS)  
by increasing R in 250Ω to 500Ω increments (this  
V
+ V ±V  
SD OS(HS)  
1
TH(HS)  
(EQ. 16)  
----------------------------------------------------------------------  
I
=
; where  
REVERSEP  
increases V  
by 25mV to 50mV) until all feeds have  
r
TH(HS)  
DS(ON)  
their FETs turned on.  
V
is the MOSFET forward voltage drop  
SD  
V
OS(HS) is the voltage offset of HS Comparator  
FN9131.7  
October 6, 2011  
24  
ISL6144  
Q
1
PRIME_PS  
START  
= 55mV  
C *  
5
C *  
6
SET V  
R
TH(HS)  
= 499Ω  
GATE  
R
1
VIN  
VOUT  
= 47.5kΩ  
5V  
2
C
2
C
ISL6144  
R
1
1
HVREF  
R
3
COMP  
VSET  
VOUT  
R
2
LED1  
FAULT  
GND  
RED  
OPERATE ALL FEEDS IN  
CURRENT SHARING MODE  
Q
2
BACKUP_PS  
C *  
(V  
IN1  
= V  
=...= V  
)
INn  
IN2  
n = N+1  
C *  
7
8
GATE  
VIN  
VOUT  
5V  
C
ISL6144  
HVREF  
R
C
3
6
4
R
4
COMP  
VSET  
R
7
LED2  
FAULT  
GND  
RED  
INCREASE  
NO  
COMPARE GATE-SOURCE  
VOLTAGES  
V
TH(HS)  
(BY INCREASING  
R1 ONLY)  
V
V  
GS2  
...V  
GS1  
GSn  
FIGURE 32. USING ISL6144 FOR BACKUP REDUNDANCY  
Remote Sense in Redundant Power  
Systems  
YES  
Remote output voltage sensing is a feature implemented in  
most of today’s power supplies. This feature is used to  
compensate for any resistive voltage drops between the  
power supply output and the load-connection point. The  
remote sensing pin (RS/+S) must be connected as close as  
possible to the load in order to compensate for any resistive  
voltage drops across the power path from the power supply  
output to the load. The output of many such power supplies  
can be connected in parallel to provide redundancy and fault  
tolerance. An ORing device (MOSFET/Diode) is typically  
used to provide the required isolation of any fault on the  
power supply side from propagating to the load side. In this  
case it is not recommended to connect the remote sense  
pins of the parallel units to the Common Bus point (at load  
terminals), as this can provide an alternative path for fault  
currents. The remote sense pins can be connected on the  
input side of the ORing device to compensate for any drop  
prior to it. Using an ORing MOSFET (compared to an ORing  
diode) reduces the forward voltage drop. By using a low  
STOP  
USE CURRENT VALUES of R  
1
AND V  
TH(HS)  
FIGURE 31. SELECTING V  
TH(HS)  
VALUE  
Configuring ISL6144 for Backup  
Redundancy (Rail Selector)  
The ISL6144 can be used as a rail selector in applications  
with backup redundancy. In this case, the backup power  
source voltage (for example battery) should be selected in  
such a manner that it is lower than the prime source voltage.  
Prime_PS  
> Backup_PS  
Also, the voltage difference between the two rails has to be  
higher than the High Speed Comparator threshold voltage.  
Prime_PS - Backup_PS >> V  
TH(HS)  
r
N-Channel ORing MOSFET in redundant power  
DS(ON)  
systems, the forward voltage drop can be reduced to less  
than 100mV. This is another advantage over the ORing  
diode solution (that has 400mV to 600mV drop) when tight  
regulation is imposed on the Common Bus voltage. If remote  
sense is absolutely required, one has to make sure that it will  
not lead to fault propagation when one power supply output  
is shorted. The remote sense configuration has to be looked  
at and design precautions has to be made to make sure the  
redundancy and fault tolerance are not compromised by the  
remote sense connection to the Common Bus.  
FN9131.7  
October 6, 2011  
25  
ISL6144  
SOURCE1 - TP1, TP17  
PCB Layout Considerations  
The ISL6144EVAL1Z uses a 4 layer PCB with 1oz external  
layers and 2oz internal layers, dedicated ground and power  
planes are used to insure good efficiency and EMC  
performance. Other layer stack-up and thickness is possible  
depending on the particular power system.  
DRAIN1 - TP2, TP18  
GATE1 - TP13  
HVREF1 - TP9  
COMP1 - TP11  
VSET1 - TP10  
FAULT1 - TP3  
The power traces are designed to handle at least 20A of  
load per feed. Power and ground planes are made of 2oz  
copper and external signal/power layers are 1oz copper.  
The loop area for all power traces is minimized to reduce  
parasitic inductance.  
V
2 - J7  
IN  
SOURCE2 - TP4, TP21  
DRAIN2 - TP5, TP22  
GATE2 - TP14  
A ground island can be created under the IC and connected  
to the power ground at a single point for reduction of noise  
that may be injected from the power ground into the IC  
ground.  
HVREF2 - TP8  
Component Selection Summary  
COMP2 -TP12  
Component selection is listed for one feed and is applicable  
for all other parallel feeds.  
VSET2 - TP7  
FAULT2 - TP6  
R , R - are resistors that define the HS comparator  
1
2
V
- J2 and J5 (connect to J1 when V  
replace LED  
OUT  
threshold voltage used in the high speed turn-off. The sum of  
OUT  
AUX PS)  
R1+ R2 50kΩ. R1 and R2 are found using Equation 17.  
GND - J3, J6, J8, TP24-TP27  
V+5V - (AUX PS for LEDs) - J1  
R - is a pull-up resistor on the FAULT pin that can be used if  
3
LED1 is not used. FAULT is an open drain that can be used  
to interface with an optocoupler, LED or directly to a logic  
circuit. This resistor is not populated on the EVAL board.  
R - is the FAULT pin LED current limit resistor, R4 is chosen  
4
to have an LED current of about 4mA.  
C - is the HVREF Capacitor, placed between VIN and  
1
HVREF pins, this capacitor is necessary to stabilize the  
HV  
supply and a value of 150nF is sufficient.  
Increasing this value will result in gate turn-on time increase.  
REF(VZ)  
C - is the COMP Capacitor, Placed between VOUT and  
2
COMP pins to provide filtering and decoupling. A 10nF  
capacitor is adequate for most cases.  
C , C - are VIN and VOUT local decoupling capacitors,  
5
6
help immunize the pins against transients that might result in  
case of fast speed gate turn-off.  
Q -Q - are ORing MOSFET(s), number of paralleled  
1
3
MOSFETs depends on device r  
, maximum allowable  
DS(ON)  
losses and junction temperature of the ORing MOSFETs.  
U3 - is Intersil’s ISL6144 High Voltage ORing MOSFET  
Controller IC.  
LED1 - is a red LED used to indicate first feed faults. When  
V
1 is off while V and auxiliary 5V supply are present  
OUT  
IN  
LED1 will be red.  
List of Test Points and Connectors  
1 - J4  
V
IN  
FN9131.7  
October 6, 2011  
26  
ISL6144  
ISL6144EVAL1Z Schematics  
DNP  
Q3  
V
AUX1  
J1  
EXTERNAL 5V  
DNP  
V + 5V  
Q
2
FDB3632  
VIN1  
DRAIN1  
TP18  
SOURCE1  
Q
1
TP17  
J4  
GATE1  
VIN1  
FROM PS1  
TP1  
U3  
TP2  
TP13  
2
VOUT  
COMP  
VIN  
C
10nF  
10V  
R
499  
2
1
V
AUX1  
C
1
TP28  
VIN1  
4
150nF  
15  
14  
13  
12  
3
10V  
TP9  
R
3
HVREF  
2
R
3
4.99k  
DNP  
R
47.5k  
TP11  
2
1.21k  
ISL6144  
4
J6  
LED1  
VSET  
NC8  
NC1  
NC2  
NC3  
NC4  
GND  
5
6
NC7  
C
7
100nF  
100V  
TP10  
11  
NC6  
NC5  
C
5
7
8
100nF  
100V  
TP3  
TP24  
10  
9
FAULT  
VOUT  
TP15  
FAULT INDICATION  
LED AND PULL UP  
Q
DNP  
6
2
4
VOUT  
TP25 TP28  
GND  
Q
5
DNP  
FDB3832  
SOURCE2  
VIN2  
J7  
Q
4
DRAIN2  
TP22  
VIN2  
FROM PS2  
TP4  
TP21  
TP5  
GATE2  
TP29  
VIN2  
4
2
TP14  
U4  
2
16  
15  
VOUT  
COMP  
VSET  
VIN  
V
AUX1  
R
C
4
10nF  
10V  
C
6
3
J8  
150nF  
10V  
499  
R
3
4
9
R
47.5k  
HVREF  
7
R
1.21k  
8
ISL6144  
C
TP12  
6
4.99k  
DNP  
14  
100nF  
C
8
NC1  
NC2  
NC3  
NC4  
GND  
TP8  
VOUT  
LED2  
13  
12  
11  
100V  
100nF  
100V  
J5  
TP7  
5
6
NC7  
NC6  
10  
9
7
8
TP6  
NC5  
TP27  
FAULT  
FN9131.7  
October 6, 2011  
27  
ISL6144  
Bill of Materials  
TABLE 3. BILL OF MATERIALS  
SIZE, VALUE, RATING  
COMPONENT  
NAME  
DESCRIPTION/COMMENTS  
CONTROL BOARD BOM  
R , R  
V
V
Programming Resistor  
Programming Resistor  
499Ω, RNC55, 1/8W  
47.5kΩ, 0603, 1/8W  
4.99kΩ, 0603, 1/8W  
TH on EVAL board, could be replaced by SMT  
1
6
7
8
9
TH(HS)  
TH(HS)  
R , R  
SMT, 0603  
2
R , R  
FAULT Pull-up Resistor  
SMT, 0603 (DNP)  
3
R , R  
FAULT LED Current Limit Resistor 1.21kΩ, 0603, 1/8W  
SMT, 0603 (used with LED connected to +5V)  
4
LED1  
LED2  
Feed 1 Fault Indication RED LED  
Feed 2 Fault Indication RED LED  
HVREF Capacitor  
Red LED, 0805 ceramic  
Red LED, 0805 ceramic  
150nF, SM1206, 10V  
SMT  
SMT  
SMT  
SMT  
SMT  
SMT  
C , C  
1
3
4
6
8
3
C , C  
COMP Decoupling Capacitor  
10nF, SM0805, 10V  
2
C , C  
V
Pin Decoupling Capacitor  
100nF, SM1206, 100V  
100nF, SM1206, 100V  
FDB3632, 100V, 9mΩ, D2PAK  
5
IN  
C , C  
V
Pin Decoupling Capacitor  
OUT  
7
Q -Q  
Feed 1 ORing MOSFET(s)  
Q2, Q3 - DNP (populate for higher current  
applications if needed)  
1
Q -Q  
Feed 2 ORing MOSFET(s)  
FDB3632, 100V, 9mΩ, D2PAK  
Q5, Q6 - DNP (populate for higher current  
applications if needed)  
4
6
U , U  
ORing MOSFET Controller  
ORing MOSFET Controller  
ISL6144IV, 10V to 75V  
ISL6144IR, 10V to 75V  
TSSOP16  
3
4
U , U  
20 Ld QFN 5x5 - DNP (alternative footprint)  
5
6
NOTE: DNP = Do Not Populate  
FN9131.7  
October 6, 2011  
28  
ISL6144  
Package Outline Drawing  
M16.173  
16 LEAD THIN SHRINK SMALL OUTLINE PACKAGE (TSSOP)  
Rev 2, 5/10  
A
1
3
5.00 ±0.10  
SEE DETAIL "X"  
9
16  
6.40  
PIN #1  
I.D. MARK  
4.40 ±0.10  
2
3
0.20 C B A  
1
8
B
0.09-0.20  
0.65  
TOP VIEW  
END VIEW  
1.00 REF  
-
0.05  
H
C
0.90 +0.15/-0.10  
1.20 MAX  
SEATING  
PLANE  
GAUGE  
PLANE  
0.25 +0.05/-0.06  
0.25  
5
0.10  
C B A  
M
0.10 C  
0°-8°  
0.60 ±0.15  
0.05 MIN  
0.15 MAX  
SIDE VIEW  
DETAIL "X"  
(1.45)  
NOTES:  
1. Dimension does not include mold flash, protrusions or gate burrs.  
Mold flash, protrusions or gate burrs shall not exceed 0.15 per side.  
2. Dimension does not include interlead flash or protrusion. Interlead  
flash or protrusion shall not exceed 0.25 per side.  
3. Dimensions are measured at datum plane H.  
(5.65)  
4. Dimensioning and tolerancing per ASME Y14.5M-1994.  
5. Dimension does not include dambar protrusion. Allowable protrusion  
shall be 0.08mm total in excess of dimension at maximum material  
condition. Minimum space between protrusion and adjacent lead  
is 0.07mm.  
(0.65 TYP)  
(0.35 TYP)  
6. Dimension in ( ) are for reference only.  
TYPICAL RECOMMENDED LAND PATTERN  
7. Conforms to JEDEC MO-153.  
FN9131.7  
October 6, 2011  
29  
ISL6144  
Quad Flat No-Lead Plastic Package (QFN)  
Micro Lead Frame Plastic Package (MLFP)  
L20.5x5  
20 LEAD QUAD FLAT NO-LEAD PLASTIC PACKAGE  
MILLIMETERS  
SYMBOL  
MIN  
NOMINAL  
MAX  
1.00  
0.05  
1.00  
NOTES  
A
A1  
A2  
A3  
b
0.80  
0.90  
-
-
-
0.02  
-
0.65  
9
0.20 REF  
9
0.23  
2.95  
2.95  
0.30  
0.38  
3.25  
3.25  
5, 8  
D
5.00 BSC  
-
D1  
D2  
E
4.75 BSC  
9
3.10  
7, 8  
5.00 BSC  
-
E1  
E2  
e
4.75 BSC  
9
3.10  
7, 8  
0.65 BSC  
-
k
0.20  
0.35  
-
0.60  
20  
5
-
-
L
0.75  
8
N
2
Nd  
Ne  
P
3
5
3
-
-
-
0.60  
12  
9
θ
-
9
Rev. 4 11/04  
NOTES:  
1. Dimensioning and tolerancing conform to ASME Y14.5-1994.  
2. N is the number of terminals.  
3. Nd and Ne refer to the number of terminals on each D and E.  
4. All dimensions are in millimeters. Angles are in degrees.  
5. Dimension b applies to the metallized terminal and is measured  
between 0.15mm and 0.30mm from the terminal tip.  
6. The configuration of the pin #1 identifier is optional, but must be  
located within the zone indicated. The pin #1 identifier may be  
either a mold or mark feature.  
7. Dimensions D2 and E2 are for the exposed pads which provide  
improved electrical and thermal performance.  
8. Nominal dimensionsare provided toassistwith PCBLandPattern  
Design efforts, see Intersil Technical Brief TB389.  
9. Features and dimensions A2, A3, D1, E1, P & θ are present when  
Anvil singulation method is used and not present for saw  
singulation.  
10. Compliant to JEDEC MO-220VHHC Issue I except for the "b"  
dimension.  
All Intersil U.S. products are manufactured, assembled and tested utilizing ISO9000 quality systems.  
Intersil Corporation’s quality certifications can be viewed at www.intersil.com/design/quality  
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design, software and/or specifications at any time without  
notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and  
reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result  
from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.  
For information regarding Intersil Corporation and its products, see www.intersil.com  
FN9131.7  
October 6, 2011  
30  

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