UPD4442182GF-C60Y [RENESAS]

Cache SRAM, 256KX18, 3.5ns, CMOS, PQFP100, 14 X 20 MM, 1.40 MM HEIGHT, PLASTIC, LQFP-100;
UPD4442182GF-C60Y
型号: UPD4442182GF-C60Y
厂家: RENESAS TECHNOLOGY CORP    RENESAS TECHNOLOGY CORP
描述:

Cache SRAM, 256KX18, 3.5ns, CMOS, PQFP100, 14 X 20 MM, 1.40 MM HEIGHT, PLASTIC, LQFP-100

静态存储器
文件: 总28页 (文件大小:209K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
PRELIMINARY DATA SHEET  
MOS INTEGRATED CIRCUIT  
µPD4442162-Y, 4442182-Y, 4442322-Y, 4442362-Y  
4M-BIT CMOS SYNCHRONOUS FAST SRAM  
PIPELINED OPERATION  
SINGLE CYCLE DESELECT  
Description  
The µPD4442162-Y is a 262,144-word by 16-bit, the µPD4442182-Y is a 262,144-word by 18-bit, µPD4442322-Y is  
a 131,072-word by 32-bit and the µPD4442362-Y is a 131,072-word by 36-bit synchronous static RAM fabricated with  
advanced CMOS technology using Full-CMOS six-transistor memory cell.  
The µPD4442162-Y, µPD4442182-Y, µPD4442322-Y and µPD4442362-Y integrates unique synchronous peripheral  
circuitry, 2-bit burst counter and output buffer as well as SRAM core. All input registers are controlled by a positive  
edge of the single clock input (CLK).  
The µPD4442162-Y, µPD4442182-Y, µPD4442322-Y and µPD4442362-Y are suitable for applications which require  
synchronous operation, high speed, low voltage, high density and wide bit configuration, such as cache and buffer  
memory.  
ZZ has to be set LOW at the normal operation. When ZZ is set HIGH, the SRAM enters Power Down State  
(“Sleep”). In the “Sleep” state, the SRAM internal state is preserved. When ZZ is set LOW again, the SRAM resumes  
normal operation.  
The µPD4442162-Y, µPD4442182-Y, µPD4442322-Y and µPD4442362-Y are packaged in 100-pin PLASTIC LQFP  
with a 1.4 mm package thickness for high density and low capacitive loading.  
Features  
3.3 V (A version) or 2.5 V (C version) Core Supply  
Synchronous operation  
Extended operating temperature (TA = –40 to +85 °C)  
Internally self-timed write control  
Burst read / write : Interleaved burst and linear burst sequence  
Fully registered inputs and outputs for pipelined operation  
Single-Cycle deselect timing  
All registers triggered off positive clock edge  
3.3 V or 2.5 V LVTTL Compatible : All inputs and outputs  
Fast clock access time : 2.5 ns (250 MHz), 2.8 ns (225 MHz), 3.0 ns (200 MHz), 3.5 ns (167 MHz)  
Asynchronous output enable : /G  
Burst sequence selectable : MODE  
Sleep mode : ZZ (ZZ = Open or Low : Normal operation)  
Separate byte write enable : /BW1 - /BW4 (µPD4442322-Y, µPD4442362-Y), /BW1 - /BW2 (µPD4442162-Y,  
µPD4442182-Y), /BWE  
Global write enable : /GW  
Three chip enables for easy depth expansion  
Common I/O using three state outputs  
The information in this document is subject to change without notice. Before using this document, please  
confirm that this is the latest version.  
Not all devices/types available in every country. Please check with local NEC representative for  
availability and additional information.  
Document No. M15503EJ2V0DS00 (2nd edition)  
Date Published May 2001 NS CP(K)  
Printed in Japan  
The mark ! shows major revised points.  
2001  
©
µPD4442162-Y, 4442182-Y, 4442322-Y, 4442362-Y  
Ordering Information  
Part number  
Access  
Time  
ns  
Clock  
Frequency  
MHz  
Core Supply  
Voltage  
V
I/O  
Package  
Remark  
Interface  
µPD4442162GF-A40Y  
2.5  
2.8  
3.0  
3.5  
2.5  
2.8  
3.0  
3.5  
2.5  
2.8  
3.0  
3.5  
2.5  
2.8  
3.0  
3.5  
2.8  
3.0  
3.5  
2.8  
3.0  
3.5  
2.8  
3.0  
3.5  
2.8  
3.0  
3.5  
3.0  
3.5  
3.0  
3.5  
3.0  
3.5  
3.0  
3.5  
250  
225  
200  
167  
250  
225  
200  
167  
250  
225  
200  
167  
250  
225  
200  
167  
225  
200  
167  
225  
200  
167  
225  
200  
167  
225  
200  
167  
200  
167  
200  
167  
200  
167  
200  
167  
3.3 ± 0.165  
3.3 V LVTTL  
100-pin PLASTIC  
A version  
µPD4442162GF-A44Y  
LQFP (14 × 20)  
µPD4442162GF-A50Y  
µPD4442162GF-A60Y  
µPD4442182GF-A40Y  
µPD4442182GF-A44Y  
µPD4442182GF-A50Y  
µPD4442182GF-A60Y  
µPD4442322GF-A40Y  
µPD4442322GF-A44Y  
µPD4442322GF-A50Y  
µPD4442322GF-A60Y  
µPD4442362GF-A40Y  
µPD4442362GF-A44Y  
µPD4442362GF-A50Y  
µPD4442362GF-A60Y  
µPD4442162GF-A44CY Note  
µPD4442162GF-A50CY Note  
µPD4442162GF-A60CY Note  
µPD4442182GF-A44CY Note  
µPD4442182GF-A50CY Note  
µPD4442182GF-A60CY Note  
µPD4442322GF-A44CY Note  
µPD4442322GF-A50CY Note  
µPD4442322GF-A60CY Note  
µPD4442362GF-A44CY Note  
µPD4442362GF-A50CY Note  
µPD4442362GF-A60CY Note  
µPD4442162GF-C50Y Note  
µPD4442162GF-C60Y Note  
µPD4442182GF-C50Y Note  
µPD4442182GF-C60Y Note  
µPD4442322GF-C50Y Note  
µPD4442322GF-C60Y Note  
µPD4442362GF-C50Y Note  
µPD4442362GF-C60Y Note  
3.3 ± 0.165  
2.5 V LVTTL  
!
!
!
!
!
!
!
!
!
!
!
!
2.5 ± 0.125  
2.5 V LVTTL  
C version  
Note Under development  
2
Preliminary Data Sheet M15503EJ2V0DS  
µPD4442162-Y, 4442182-Y, 4442322-Y, 4442362-Y  
Pin Configurations (Marking Side)  
/××× indicates active low signal.  
100-pin PLASTIC LQFP (14 × 20)  
[ µPD4442162GF-Y, µPD4442182GF-Y ]  
100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81  
NC  
NC  
NC  
1
80  
79  
78  
77  
76  
75  
74  
73  
72  
71  
70  
69  
68  
67  
66  
65  
64  
63  
62  
61  
60  
59  
58  
57  
56  
55  
54  
53  
52  
51  
A17  
NC  
NC  
2
3
V
DDQ  
4
V
V
DD  
Q
V
SS  
Q
5
SS  
Q
NC  
NC  
6
NC  
7
I/OP1, NC  
I/O8  
I/O9  
8
I/O10  
9
I/O7  
V
SS  
Q
Q
10  
11  
12  
13  
14  
15  
16  
17  
18  
19  
20  
21  
22  
23  
24  
25  
26  
27  
28  
29  
30  
V
V
SS  
Q
V
DD  
DD  
Q
I/O11  
I/O12  
NC  
I/O6  
I/O5  
V
SS  
V
DD  
NC  
NC  
V
DD  
V
SS  
I/O13  
I/O14  
ZZ  
I/O4  
I/O3  
V
DD  
Q
Q
V
V
DD  
Q
V
SS  
SS  
Q
I/O15  
I/O16  
I/O2  
I/O1  
NC  
I/OP2, NC  
NC  
NC  
V
SS  
Q
Q
V
V
SS  
Q
V
DD  
DD  
Q
NC  
NC  
NC  
NC  
NC  
NC  
31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50  
Remark Refer to Package Drawing for 1-pin index mark.  
3
Preliminary Data Sheet M15503EJ2V0DS  
µPD4442162-Y, 4442182-Y, 4442322-Y, 4442362-Y  
Pin Identifications  
[ µPD4442162GF-Y, µPD4442182GF-Y ]  
Symbol Pin No.  
Description  
Synchronous Address Input  
A0 - A17  
37, 36, 35, 34, 33, 32, 100, 99, 82, 81,  
44, 45, 46, 47, 48, 49, 50, 80  
I/O1 - I/O16  
58, 59, 62, 63, 68, 69, 72, 73, 8, 9, 12,  
Synchronous Data In,  
13, 18, 19, 22, 23  
Synchronous / Asynchronous Data Out  
Synchronous Data In (Parity),  
Synchronous / Asynchronous Data Out (Parity)  
Synchronous Burst Address Advance Input  
Synchronous Address Status Processor Input  
Synchronous Address Status Controller Input  
Synchronous Chip Enable Input  
Synchronous Byte Write Enable Input  
Synchronous Global Write Input  
Asynchronous Output Enable Input  
Clock Input  
I/OP1, NC Note  
74  
I/OP2, NC Note  
24  
/ADV  
83  
/AP  
84  
/AC  
85  
/CE, CE2, /CE2  
98, 97, 92  
/BW1, /BW2, /BWE  
93, 94, 87  
/GW  
/G  
88  
86  
89  
31  
CLK  
MODE  
Asynchronous Burst Sequence Select Input  
Do not change state during normal operation  
Asynchronous Power Down State Input  
Power Supply  
ZZ  
64  
VDD  
VSS  
15, 41, 65, 91  
17, 40, 67, 90  
Ground  
VDDQ  
VSSQ  
NC  
4, 11, 20, 27, 54, 61, 70, 77  
5, 10, 21, 26, 55, 60, 71, 76  
1, 2, 3, 6, 7, 14, 16, 25, 28, 29, 30, 38,  
39, 42, 43, 51, 52, 53, 56, 57, 66, 75,  
78, 79, 95, 96  
Output Buffer Power Supply  
Output Buffer Ground  
No Connection  
Note NC (No Connection) is used in the µPD4442162GF-Y.  
I/OP1 - I/OP2 are used in the µPD4442182GF-Y.  
4
Preliminary Data Sheet M15503EJ2V0DS  
µPD4442162-Y, 4442182-Y, 4442322-Y, 4442362-Y  
100-pin PLASTIC LQFP (14 × 20)  
[ µPD4442322GF-Y, µPD4442362GF-Y ]  
100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81  
I/OP2, NC  
I/O16  
I/OP3, NC  
I/O17  
1
80  
79  
78  
77  
76  
75  
74  
73  
72  
71  
70  
69  
68  
67  
66  
65  
64  
63  
62  
61  
60  
59  
58  
57  
56  
55  
54  
53  
52  
51  
2
I/O15  
I/O18  
3
V
V
DD  
Q
V
DD  
Q
Q
4
SS  
Q
V
SS  
5
I/O14  
I/O13  
I/O12  
I/O11  
I/O19  
I/O20  
I/O21  
I/O22  
6
7
8
9
V
V
SS  
Q
V
SS  
Q
Q
10  
11  
12  
13  
14  
15  
16  
17  
18  
19  
20  
21  
22  
23  
24  
25  
26  
27  
28  
29  
30  
DD  
Q
V
DD  
I/O10  
I/O9  
I/O23  
I/O24  
NC  
V
SS  
NC  
V
DD  
V
DD  
NC  
ZZ  
V
SS  
I/O25  
I/O26  
I/O8  
I/O7  
V
V
DD  
Q
V
DD  
Q
Q
SS  
Q
V
SS  
I/O6  
I/O5  
I/O4  
I/O3  
I/O27  
I/O28  
I/O29  
I/O30  
V
V
SS  
Q
V
SS  
Q
Q
DD  
Q
V
DD  
I/O2  
I/O31  
I/O32  
I/O1  
I/OP1, NC  
I/OP4, NC  
31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50  
Remark Refer to Package Drawing for 1-pin index mark.  
5
Preliminary Data Sheet M15503EJ2V0DS  
µPD4442162-Y, 4442182-Y, 4442322-Y, 4442362-Y  
[ µPD4442322GF-Y, µPD4442362GF-Y ]  
Symbol  
Pin No.  
Description  
Synchronous Address Input  
A0 - A16  
37, 36, 35, 34, 33, 32, 100, 99, 82, 81,  
44, 45, 46, 47, 48, 49, 50  
I/O1 - I/O32  
52, 53, 56, 57, 58, 59, 62, 63, 68, 69,  
Synchronous Data In,  
72, 73, 74, 75, 78, 79, 2, 3, 6, 7, 8, 9,  
Synchronous / Asynchronous Data Out  
12, 13, 18, 19, 22, 23, 24, 25, 28, 29  
I/OP1, NC Note  
I/OP2, NC Note  
I/OP3, NC Note  
I/OP4, NC Note  
/ADV  
51  
Synchronous Data In (Parity),  
80  
Synchronous / Asynchronous Data Out (Parity)  
1
30  
83  
Synchronous Burst Address Advance Input  
Synchronous Address Status Processor Input  
Synchronous Address Status Controller Input  
Synchronous Chip Enable Input  
Synchronous Byte Write Enable Input  
Synchronous Global Write Input  
Asynchronous Output Enable Input  
Clock Input  
/AP  
84  
/AC  
85  
/CE, CE2, /CE2  
/BWE1 - /BWE4, /BWE  
/GW  
98, 97, 92  
93, 94, 95, 96, 87  
88  
86  
89  
31  
/G  
CLK  
MODE  
Asynchronous Burst Sequence Select Input  
Do not change state during normal operation  
Asynchronous Power Down State Input  
Power Supply  
ZZ  
64  
VDD  
VSS  
15, 41, 65, 91  
17, 40, 67, 90  
Ground  
VDDQ  
VSSQ  
NC  
4, 11, 20, 27, 54, 61, 70, 77  
5, 10, 21, 26, 55, 60, 71, 76  
14, 16, 38, 39, 42, 43, 66  
Output Buffer Power Supply  
Output Buffer Ground  
No Connection  
Note NC (No Connection) is used in the µPD4442322GF-Y.  
I/OP1 - I/OP4 are used in the µPD4442362GF-Y.  
6
Preliminary Data Sheet M15503EJ2V0DS  
µPD4442162-Y, 4442182-Y, 4442322-Y, 4442362-Y  
Block Diagrams  
[ µPD4442162-Y, µPD4442182-Y ]  
18  
16  
18  
Address  
A0 - A17  
Registers  
A0, A1  
MODE  
/ADV  
CLK  
A1’  
Q1  
Binary  
Counter  
and Logic  
A0’  
/AC  
/AP  
Row and Column  
Decoders  
CLR  
Q0  
8/9  
8/9  
Memory Cell Array  
512 rows  
Byte 1  
Byte 1  
/BW1  
/BW2  
Write Register  
Write Driver  
Byte 2  
Write Register  
Byte 2  
Write Driver  
512 × 16 columns  
(4,194,304 bits)  
512 × 18 columns  
(4,718,592 bits)  
/BWE  
16/18  
/GW  
/CE  
16/18  
Enable  
Register  
Output  
Registers Buffers  
Output  
CE2  
/CE2  
Enable Delay  
Register  
/G  
Input  
Registers  
2
16/18  
I/O1 - I/O16  
I/OP1 - I/OP2  
Power Down Control  
ZZ  
Burst Sequence  
[ µPD4442162-Y, µPD4442182-Y ]  
Interleaved Burst Sequence Table (MODE = Open or VDD)  
External Address  
1st Burst Address  
2nd Burst Address  
3rd Burst Address  
A17 - A2, A1, A0  
A17 - A2, A1, /A0  
A17 - A2, /A1, A0  
A17 - A2, /A1, /A0  
Linear Burst Sequence Table (MODE = VSS)  
External Address  
1st Burst Address  
2nd Burst Address  
3rd Burst Address  
A17 - A2, 0, 0  
A17 - A2, 0, 1  
A17 - A2, 1, 0  
A17 - A2, 1, 1  
A17 - A2, 0, 1  
A17 - A2, 1, 0  
A17 - A2, 1, 1  
A17 - A2, 0, 0  
A17 - A2, 1, 0  
A17 - A2, 1, 1  
A17 - A2, 0, 0  
A17 - A2, 0, 1  
A17 - A2, 1, 1  
A17 - A2, 0, 0  
A17 - A2, 0, 1  
A17 - A2, 1, 0  
7
Preliminary Data Sheet M15503EJ2V0DS  
µPD4442162-Y, 4442182-Y, 4442322-Y, 4442362-Y  
[ µPD4442322-Y, µPD4442362-Y ]  
17  
15  
17  
Address  
A0 - A16  
Registers  
A0, A1  
MODE  
/ADV  
CLK  
A1’  
Q1  
Binary  
Counter  
and Logic  
A0’  
/AC  
/AP  
Row and Column  
Decoders  
CLR  
Q0  
8/9  
8/9  
8/9  
8/9  
Byte 1  
Byte 1  
Memory Cell Array  
512 rows  
/BW1  
/BW2  
/BW3  
Write Register  
Write Driver  
Byte 2  
Write Register  
Byte 2  
Write Driver  
256 × 32 columns  
(4,194,304 bits)  
Byte 3  
Write Register  
Byte 3  
Write Driver  
256 × 36 columns  
(4,718,592 bits)  
Byte 4  
Write Register  
Byte 4  
Write Driver  
/BW4  
/BWE  
32/36  
32/36  
Output  
Output  
Registers Buffers  
/GW  
/CE  
Enable  
Register  
CE2  
/CE2  
Enable delay  
Register  
Input  
Registers  
/G  
4
32/36  
I/O1 - I/O32  
I/OP1 - I/OP4  
Power Down Control  
ZZ  
[ µPD4442322-Y, µPD4442362-Y ]  
Interleaved Burst Sequence Table (MODE = Open or VDD)  
External Address  
1st Burst Address  
2nd Burst Address  
3rd Burst Address  
A16 - A2, A1, A0  
A16 - A2, A1, /A0  
A16 - A2, /A1, A0  
A16 - A2, /A1, /A0  
Linear Burst Sequence Table (MODE = VSS)  
External Address  
1st Burst Address  
2nd Burst Address  
3rd Burst Address  
A16 - A2, 0, 0  
A16 - A2, 0, 1  
A16 - A2, 1, 0  
A16 - A2, 1, 1  
A16 - A2, 0, 1  
A16 - A2, 1, 0  
A16 - A2, 1, 1  
A16 - A2, 0, 0  
A16 - A2, 1, 0  
A16 - A2, 1, 1  
A16 - A2, 0, 0  
A16 - A2, 0, 1  
A16 - A2, 1, 1  
A16 - A2, 0, 0  
A16 - A2, 0, 1  
A16 - A2, 1, 0  
8
Preliminary Data Sheet M15503EJ2V0DS  
µPD4442162-Y, 4442182-Y, 4442322-Y, 4442362-Y  
Asynchronous Truth Table  
Operation  
Read Cycle  
Read Cycle  
Write Cycle  
Deselected  
/G  
L
I/O  
Dout  
H
×
Hi-Z  
Hi-Z, Din  
Hi-Z  
×
Remark × : dont care  
Synchronous Truth Table  
Operation  
Deselected Note  
/CE  
H
L
CE2  
×
/CE2  
×
/AP  
×
/AC  
L
/ADV  
×
/WRITE  
CLK  
Address  
None  
×
×
×
×
×
×
H
H
H
H
H
L
L H  
L H  
L H  
L H  
L H  
L H  
L H  
L H  
L H  
L H  
L H  
L H  
L H  
L H  
L H  
L H  
Deselected Note  
L
×
L
×
×
None  
Deselected Note  
L
×
H
×
L
×
×
None  
Deselected Note  
L
L
H
H
L
L
×
None  
Deselected Note  
L
×
H
L
L
×
None  
Read Cycle / Begin Burst  
Read Cycle / Begin Burst  
Read Cycle / Continue Burst  
Read Cycle / Continue Burst  
Read Cycle / Suspend Burst  
Read Cycle / Suspend Burst  
Write Cycle / Begin Burst  
Write Cycle / Continue Burst  
Write Cycle / Continue Burst  
Write Cycle / Suspend Burst  
Write Cycle / Suspend Burst  
L
H
H
×
×
×
External  
External  
Next  
L
L
H
H
×
L
×
×
×
H
H
H
H
L
L
H
×
×
×
L
Next  
×
×
H
×
H
H
×
Current  
Current  
External  
Next  
H
L
×
×
H
×
L
H
H
×
×
×
H
H
H
H
L
L
H
×
×
×
L
L
Next  
×
×
H
×
H
H
L
Current  
Current  
H
×
×
L
Note Deselect status is held until new Begin Burstentry.  
Remarks 1. × : dont care  
2. /WRITE = L means any one or more byte write enables (/BW1, /BW2, /BW3 or /BW4) and /BWE are LOW  
or /GW is LOW.  
/WRITE = H means the following two cases.  
(1) /BWE and /GW are HIGH.  
(2) /BW1, /BW2 and /GW are HIGH, and /BWE is LOW. [ µPD4442162-Y, µPD4442182-Y ]  
/BW1, /BW2, /BW3, /BW4 and /GW are HIGH, and /BWE is LOW. [ µPD4442322-Y, µPD4442362-Y ]  
9
Preliminary Data Sheet M15503EJ2V0DS  
µPD4442162-Y, 4442182-Y, 4442322-Y, 4442362-Y  
Partial Truth Table for Write Enables  
[ µPD4442162-Y, µPD4442182-Y ]  
Operation  
Read Cycle  
/GW  
H
/BWE  
/BW1  
/BW2  
H
L
L
L
×
×
H
L
L
×
×
H
H
L
Read Cycle  
H
Write Cycle / Byte 1 Only  
Write Cycle / All Bytes  
Write Cycle / All Bytes  
H
H
L
×
Remark × : dont care  
[ µPD4442322-Y, µPD4442362-Y ]  
Operation  
Read Cycle  
/GW  
H
/BWE  
/BW1  
/BW2  
/BW3  
/BW4  
H
L
L
L
×
×
H
L
L
×
×
H
H
L
×
H
H
L
×
H
H
L
Read Cycle  
H
Write Cycle / Byte 1 Only  
Write Cycle / All Bytes  
Write Cycle / All Bytes  
H
H
L
×
×
×
Remark × : dont care  
Pass-Through Truth Table  
Previous Cycle  
Present Cycle  
/CEs /WRITE  
Next Cycle  
Operation  
Add /WRITE  
Ak  
I/O  
Dn(Ak)  
Operation  
Add  
Am  
/G  
L
I/O  
Operation  
Write Cycle  
L
Read Cycle  
(Begin Burst)  
Deselected  
L
H
Q1(Ak)  
Read Q1(Am)  
-
H
×
×
Hi-Z  
No Carry Over from  
Previous Cycle  
Remarks 1. × : dont care  
2. /WRITE = L means any one or more byte write enables (/BW1, /BW2, /BW3 or /BW4) and /BWE are LOW  
or /GW is LOW.  
/WRITE = H means the following two cases.  
(1) /BWE and /GW are HIGH.  
(2) /BW1, /BW2 and /GW are HIGH, and /BWE is LOW. [ µPD4442162-Y, µPD4442182-Y ]  
/BW1, /BW2, /BW3, /BW4 and /GW are HIGH, and /BWE is LOW. [ µPD4442322-Y, µPD4442362-Y ]  
/CEs = L means /CE is LOW, /CE2 is LOW and CE2 is HIGH.  
/CEs = H means /CE is HIGH or /CE2 is HIGH or CE2 is LOW.  
ZZ (Sleep) Truth Table  
ZZ  
0.2 V  
Chip Status  
Active  
Open  
Active  
VDD 0.2 V  
Sleep  
10  
Preliminary Data Sheet M15503EJ2V0DS  
µPD4442162-Y, 4442182-Y, 4442322-Y, 4442362-Y  
Electrical Specifications  
Absolute Maximum Ratings  
Parameter  
Supply voltage (A version)  
Supply voltage (C version)  
Output supply voltage  
Input voltage  
Symbol  
VDD  
VDD  
VDDQ  
VIN  
Conditions  
MIN.  
0.5  
0.5  
0.5  
0.5  
0.5  
40  
TYP.  
MAX.  
+4.0  
Unit Note  
V
V
V
+3.0  
VDD  
VDD + 0.5  
VDDQ + 0.5  
+85  
V
V
1, 2  
1, 2  
Input / Output voltage  
Operating ambient temperature  
Storage temperature  
VI/O  
TA  
°C  
°C  
Tstg  
55  
+125  
Notes 1. 2.0 V (MIN.) (Pulse width : 2 ns)  
2. VDDQ + 2.3 V (MAX.) (Pulse width : 2 ns)  
Caution  
Exposing the device to stress above those listed in Absolute Maximum Ratings could cause  
permanent damage. The device is not meant to be operated under conditions outside the limits  
described in the operational section of this specification. Exposure to Absolute Maximum Rating  
conditions for extended periods may affect device reliability.  
Recommended DC Operating Conditions (TA = –40 to +85 °C)  
(A version)  
Parameter  
Supply voltage  
Symbol  
VDD  
Conditions  
MIN.  
TYP.  
3.3  
MAX.  
3.465  
Unit  
V
3.135  
2.5 V LVTTL Interface  
Output supply voltage  
High level input voltage  
Low level input voltage  
3.3 V LVTTL Interface  
Output supply voltage  
High level input voltage  
Low level input voltage  
VDDQ  
VIH  
2.375  
1.7  
2.5  
2.9  
VDDQ + 0.3  
+0.7  
V
V
V
VIL  
0.3 Note  
VDDQ  
VIH  
3.135  
2.0  
3.3  
3.465  
VDDQ + 0.3  
+0.8  
V
V
V
VIL  
0.3 Note  
Note 0.8 V (MIN.) (Pulse Width : 2 ns)  
(C version)  
Parameter  
Supply voltage  
Symbol  
Conditions  
MIN.  
2.375  
2.375  
1.7  
TYP.  
2.5  
MAX.  
2.625  
Unit  
V
VDD  
VDDQ  
VIH  
Output supply voltage  
High level input voltage  
Low level input voltage  
2.5  
2.625  
V
VDDQ + 0.3  
+0.7  
V
VIL  
0.3 Note  
V
Note 0.8 V (MIN.) (Pulse Width : 2 ns)  
11  
Preliminary Data Sheet M15503EJ2V0DS  
µPD4442162-Y, 4442182-Y, 4442322-Y, 4442362-Y  
DC Characteristics (Recommended Operating Conditions Unless Otherwise Noted)  
Parameter  
Input leakage current  
I/O leakage current  
Symbol  
ILI  
Test condition  
MIN.  
2  
TYP.  
MAX.  
+2  
Unit  
µA  
Note  
VIN (except ZZ, MODE) = 0 V to VDD  
VI/O = 0 V to VDDQ, Outputs are disabled  
ILO  
2  
+2  
µA  
Operating supply current  
IDD  
Device selected,  
Cycle = MAX.  
-A40Y  
500  
460  
420  
375  
180  
mA  
!
!
!
!
-A44Y, -A44CY  
VIN VIL or VIN VIH, -A50Y, -A50CY, -C50Y  
II/O = 0 mA -A60Y, -A60CY, -C60Y  
IDD1  
Suspend cycle, Cycle = MAX.  
/AC, /AP, /ADV, /GW, /BWEs VIH,  
VIN VIL or VIN VIH, II/O = 0 mA  
Device deselected, Cycle = 0 MHz  
VIN VIL or VIN VIH, All inputs are static  
Device deselected, Cycle = 0 MHz  
VIN 0.2 V or VIN VDD 0.2 V,  
VI/O 0.2 V, All inputs are static  
Device deselected, Cycle = MAX.  
VIN VIL or VIN VIH  
Standby supply current  
ISB  
30  
12  
mA  
ISB1  
ISB2  
ISBZZ  
VOH  
VOL  
180  
12  
Power down supply current  
2.5 V LVTTL Interface  
High level output voltage  
ZZ VDD 0.2 V, VI/O VDDQ + 0.2 V  
mA  
V
IOH = 2.0 mA  
IOH = 1.0 mA  
IOL = +2.0 mA  
IOL = +1.0 mA  
1.7  
2.1  
Low level output voltage  
0.7  
0.4  
V
3.3 V LVTTL Interface  
High level output voltage  
Low level output voltage  
VOH  
VOL  
IOH = 4.0 mA  
2.4  
V
V
IOL = +8.0 mA  
0.4  
Remark These DC characteristics are in common regardless product classification.  
Capacitance (TA = 25 °C, f = 1MHz)  
Parameter  
Symbol  
CIN  
Test conditions  
MIN.  
TYP.  
MAX.  
4.5  
Unit  
pF  
Input capacitance  
VIN = 0 V  
VI/O = 0 V  
Vclk = 0 V  
Input / Output capacitance  
Clock Input capacitance  
CI/O  
7.0  
pF  
Cclk  
6.0  
pF  
Remark These parameters are not 100% tested.  
12  
Preliminary Data Sheet M15503EJ2V0DS  
µPD4442162-Y, 4442182-Y, 4442322-Y, 4442362-Y  
AC Characteristics (Recommended Operating Conditions Unless Otherwise Noted)  
AC Test Conditions  
2.5 V LVTTL Interface  
Input waveform (Rise / Fall time = 1 ns (20 to 80 %))  
2.4 V  
V
DDQ/2  
Test points  
V
V
DDQ/2  
V
SS  
Output waveform  
V
DDQ/2  
Test points  
DDQ/2  
3.3 V LVTTL Interface  
Input waveform (Rise / Fall time = 1 ns (20 to 80%))  
3.0 V  
1.5 V  
Test points  
1.5 V  
VSS  
Output waveform  
1.5 V  
Test points  
1.5 V  
Output load condition  
CL : 30 pF  
5 pF (TKHQX1, TKHQX2, TGLQX, TGHQZ, TKHQZ)  
Figure1 External load at test  
V
T
= +1.2 V / +1.5 V  
50 Ω  
ZO = 50 Ω  
I/O (Output)  
CL  
Remark CL includes capacitances of the probe and jig, and stray capacitances.  
13  
Preliminary Data Sheet M15503EJ2V0DS  
µPD4442162-Y, 4442182-Y, 4442322-Y, 4442362-Y  
Read and Write Cycle (1/2)  
Parameter  
Symbol  
-A40Y  
-A44Y, -A44CY  
(225 MHz)  
Unit  
Note  
!
(250 MHz)  
Standard  
Alias  
TCYC  
TCD  
TOE  
TDC1  
TDC2  
TOLZ  
TOHZ  
TCZ  
TCH  
TCL  
TAS  
TSS  
TDS  
TWS  
MIN.  
MAX.  
MIN.  
MAX.  
Cycle time  
TKHKH  
TKHQV  
TGLQV  
TKHQX1  
TKHQX2  
TGLQX  
TGHQZ  
TKHQZ  
TKHKL  
4.0  
4.4  
2.8  
2.8  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
Clock access time  
2.5  
2.5  
Output enable access time  
Clock high to output active  
Clock high to output change  
Output enable to output active  
Output disable to output high-Z  
Clock high to output high-Z  
Clock high pulse width  
Clock low pulse width  
Setup times Address  
Address status  
0
0
1.0  
0
1.0  
0
0
2.5  
2.5  
0
2.8  
2.8  
1.0  
1.7  
1.7  
0.8  
1.0  
1.8  
1.8  
1.2  
TKLKH  
TAVKH  
TADSVKH  
TDVKH  
TWVKH  
Data in  
Write enable  
Address advance TADVVKH  
Chip enable  
Address  
TEVKH  
TKHAX  
Hold times  
TAH  
TSH  
TDH  
TWH  
0.3  
0.4  
ns  
Address status  
Data in  
TKHADSX  
TKHDX  
Write enable  
TKHWX  
Address advance TKHADVX  
Chip enable  
TKHEX  
TZZE  
Power down entry time  
TZZE  
TZZR  
8.0  
8.0  
8.8  
8.8  
ns  
ns  
Power down recovery time  
TZZR  
14  
Preliminary Data Sheet M15503EJ2V0DS  
µPD4442162-Y, 4442182-Y, 4442322-Y, 4442362-Y  
Read and Write Cycle (2/2)  
Parameter  
Symbol  
-A50Y, -A50CY, -C50Y  
(200 MHz)  
-A60Y, -A60CY, -C60Y  
(167 MHz)  
Unit  
Note  
!
Standard  
Alias  
TCYC  
TCD  
TOE  
TDC1  
TDC2  
TOLZ  
TOHZ  
TCZ  
MIN.  
5.0  
MAX.  
MIN.  
6.0  
MAX.  
Cycle time  
TKHKH  
TKHQV  
TGLQV  
TKHQX1  
TKHQX2  
TGLQX  
TGHQZ  
TKHQZ  
TKHKL  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
Clock access time  
3.0  
3.0  
3.5  
3.5  
Output enable access time  
Clock high to output active  
Clock high to output change  
Output enable to output active  
Output disable to output high-Z  
Clock high to output high-Z  
Clock high pulse width  
Clock low pulse width  
Setup times Address  
Address status  
0
0
1.0  
0
1.0  
0
0
3.0  
3.0  
0
3.5  
3.5  
1.0  
2.0  
2.0  
1.5  
1.0  
2.0  
2.0  
1.5  
TCH  
TCL  
TKLKH  
TAVKH  
TADSVKH  
TDVKH  
TWVKH  
TAS  
TSS  
Data in  
TDS  
Write enable  
TWS  
Address  
advance  
TADVVKH  
Chip enable  
TEVKH  
TKHAX  
Hold times  
Address  
TAH  
TSH  
TDH  
TWH  
0.5  
0.5  
ns  
Address status  
Data in  
TKHADSX  
TKHDX  
Write enable  
TKHWX  
Address  
advance  
TKHADVX  
Chip enable  
TKHEX  
TZZE  
Power down entry time  
TZZE  
TZZR  
10.0  
10.0  
12.0  
12.0  
ns  
ns  
Power down recovery time  
TZZR  
15  
Preliminary Data Sheet M15503EJ2V0DS  
µPD4442162-Y, 4442182-Y, 4442322-Y, 4442362-Y  
16  
Preliminary Data Sheet M15503EJ2V0DS  
µPD4442162-Y, 4442182-Y, 4442322-Y, 4442362-Y  
17  
Preliminary Data Sheet M15503EJ2V0DS  
µPD4442162-Y, 4442182-Y, 4442322-Y, 4442362-Y  
18  
Preliminary Data Sheet M15503EJ2V0DS  
µPD4442162-Y, 4442182-Y, 4442322-Y, 4442362-Y  
19  
Preliminary Data Sheet M15503EJ2V0DS  
µPD4442162-Y, 4442182-Y, 4442322-Y, 4442362-Y  
20  
Preliminary Data Sheet M15503EJ2V0DS  
µPD4442162-Y, 4442182-Y, 4442322-Y, 4442362-Y  
21  
Preliminary Data Sheet M15503EJ2V0DS  
µPD4442162-Y, 4442182-Y, 4442322-Y, 4442362-Y  
Package Drawing  
100-PIN PLASTIC LQFP (14x20)  
A
B
80  
81  
51  
50  
detail of lead end  
S
C
D
R
Q
31  
30  
100  
1
F
M
G
J
H
I
K
P
S
N
S
L
M
NOTE  
ITEM MILLIMETERS  
Each lead centerline is located within 0.13 mm of  
its true position (T.P.) at maximum material condition.  
A
B
C
D
F
22.0±0.2  
20.0±0.2  
14.0±0.2  
16.0±0.2  
0.825  
G
0.575  
+0.08  
0.32  
H
0.07  
I
J
0.13  
0.65 (T.P.)  
1.0±0.2  
0.5±0.2  
K
L
+0.06  
0.17  
M
0.05  
N
P
Q
0.10  
1.4  
0.125±0.075  
+7°  
3°  
R
S
3°  
1.7 MAX.  
S100GF-65-8ET-1  
22  
Preliminary Data Sheet M15503EJ2V0DS  
µPD4442162-Y, 4442182-Y, 4442322-Y, 4442362-Y  
Recommended Soldering Condition  
Please consult with our sales offices for soldering conditions of the µPD4442162-Y, 4442182-Y, 4442322-Y and  
4442362-Y.  
Types of Surface Mount Devices  
µPD4442162GF-Y: 100-pin PLASTIC LQFP (14 × 20)  
µPD4442182GF-Y: 100-pin PLASTIC LQFP (14 × 20)  
µPD4442322GF-Y: 100-pin PLASTIC LQFP (14 × 20)  
µPD4442362GF-Y: 100-pin PLASTIC LQFP (14 × 20)  
23  
Preliminary Data Sheet M15503EJ2V0DS  
µPD4442162-Y, 4442182-Y, 4442322-Y, 4442362-Y  
[ MEMO ]  
24  
Preliminary Data Sheet M15503EJ2V0DS  
µPD4442162-Y, 4442182-Y, 4442322-Y, 4442362-Y  
[ MEMO ]  
25  
Preliminary Data Sheet M15503EJ2V0DS  
µPD4442162-Y, 4442182-Y, 4442322-Y, 4442362-Y  
[ MEMO ]  
26  
Preliminary Data Sheet M15503EJ2V0DS  
µPD4442162-Y, 4442182-Y, 4442322-Y, 4442362-Y  
NOTES FOR CMOS DEVICES  
1
PRECAUTION AGAINST ESD FOR SEMICONDUCTORS  
Note:  
Strong electric field, when exposed to a MOS device, can cause destruction of the gate oxide and  
ultimately degrade the device operation. Steps must be taken to stop generation of static electricity  
as much as possible, and quickly dissipate it once, when it has occurred. Environmental control  
must be adequate. When it is dry, humidifier should be used. It is recommended to avoid using  
insulators that easily build static electricity. Semiconductor devices must be stored and transported  
in an anti-static container, static shielding bag or conductive material. All test and measurement  
tools including work bench and floor should be grounded. The operator should be grounded using  
wrist strap. Semiconductor devices must not be touched with bare hands. Similar precautions need  
to be taken for PW boards with semiconductor devices on it.  
2
HANDLING OF UNUSED INPUT PINS FOR CMOS  
Note:  
No connection for CMOS device inputs can be cause of malfunction. If no connection is provided  
to the input pins, it is possible that an internal input level may be generated due to noise, etc., hence  
causing malfunction. CMOS devices behave differently than Bipolar or NMOS devices. Input levels  
of CMOS devices must be fixed high or low by using a pull-up or pull-down circuitry. Each unused  
pin should be connected to VDD or GND with a resistor, if it is considered to have a possibility of  
being an output pin. All handling related to the unused pins must be judged device by device and  
related specifications governing the devices.  
3
STATUS BEFORE INITIALIZATION OF MOS DEVICES  
Note:  
Power-on does not necessarily define initial status of MOS device. Production process of MOS  
does not define the initial operation status of the device. Immediately after the power source is  
turned ON, the devices with reset function have not yet been initialized. Hence, power-on does  
not guarantee out-pin levels, I/O settings or contents of registers. Device is not initialized until the  
reset signal is received. Reset operation must be executed immediately after power-on for devices  
having reset function.  
27  
Preliminary Data Sheet M15503EJ2V0DS  
µPD4442162-Y, 4442182-Y, 4442322-Y, 4442362-Y  
The information in this document is current as of May, 2001. The information is subject to change  
without notice. For actual design-in, refer to the latest publications of NEC's data sheets or data  
books, etc., for the most up-to-date specifications of NEC semiconductor products. Not all products  
and/or types are available in every country. Please check with an NEC sales representative for  
availability and additional information.  
No part of this document may be copied or reproduced in any form or by any means without prior  
written consent of NEC. NEC assumes no responsibility for any errors that may appear in this document.  
NEC does not assume any liability for infringement of patents, copyrights or other intellectual property rights of  
third parties by or arising from the use of NEC semiconductor products listed in this document or any other  
liability arising from the use of such products. No license, express, implied or otherwise, is granted under any  
patents, copyrights or other intellectual property rights of NEC or others.  
Descriptions of circuits, software and other related information in this document are provided for illustrative  
purposes in semiconductor product operation and application examples. The incorporation of these  
circuits, software and information in the design of customer's equipment shall be done under the full  
responsibility of customer. NEC assumes no responsibility for any losses incurred by customers or third  
parties arising from the use of these circuits, software and information.  
While NEC endeavours to enhance the quality, reliability and safety of NEC semiconductor products, customers  
agree and acknowledge that the possibility of defects thereof cannot be eliminated entirely. To minimize  
risks of damage to property or injury (including death) to persons arising from defects in NEC  
semiconductor products, customers must incorporate sufficient safety measures in their design, such as  
redundancy, fire-containment, and anti-failure features.  
NEC semiconductor products are classified into the following three quality grades:  
"Standard", "Special" and "Specific". The "Specific" quality grade applies only to semiconductor products  
developed based on a customer-designated "quality assurance program" for a specific application. The  
recommended applications of a semiconductor product depend on its quality grade, as indicated below.  
Customers must check the quality grade of each semiconductor product before using it in a particular  
application.  
"Standard": Computers, office equipment, communications equipment, test and measurement equipment, audio  
and visual equipment, home electronic appliances, machine tools, personal electronic equipment  
and industrial robots  
"Special": Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster  
systems, anti-crime systems, safety equipment and medical equipment (not specifically designed  
for life support)  
"Specific": Aircraft, aerospace equipment, submersible repeaters, nuclear reactor control systems, life  
support systems and medical equipment for life support, etc.  
The quality grade of NEC semiconductor products is "Standard" unless otherwise expressly specified in NEC's  
data sheets or data books, etc. If customers wish to use NEC semiconductor products in applications not  
intended by NEC, they must contact an NEC sales representative in advance to determine NEC's willingness  
to support a given application.  
(Note)  
(1) "NEC" as used in this statement means NEC Corporation and also includes its majority-owned subsidiaries.  
(2) "NEC semiconductor products" means any semiconductor product developed or manufactured by or for  
NEC (as defined above).  
M8E 00. 4  

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