SN7422N3 [ROCHESTER]
NAND Gate, TTL/H/L Series, 2-Func, 4-Input, TTL, PDIP14, DIP-14;
| 型号： | SN7422N3 |
| 厂家： | 
Rochester Electronics |
| 描述： | NAND Gate, TTL/H/L Series, 2-Func, 4-Input, TTL, PDIP14, DIP-14 栅 光电二极管 逻辑集成电路 |
| 文件： | 总6页 (文件大小：898K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
REI Datasheet
SN5422, SN54LS22, SN54S22
SN7422, SN74LS22, SN74S22
Dual 4-Input Positive-NAND Gates with Open-Collector Outputs
These devices contain two independent 4-input NAND gates. The open-collector outputs require
pull-up resistors to perform correctly. They may be connected to other open-collector outputs to
implement active-low wired-OR or active-high wired-AND functions. Open-collector devices are often
used to generate higher VOH levels.
Quality Overview
Rochester Electronics
Manufactured Components
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ISO-9001
AS9120ꢀcertification
QualifiedꢀManufacturersꢀListꢀ(QML)ꢀMIL-PRF-38535
ꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀClassꢀQꢀMilitary
ꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀClassꢀVꢀSpaceꢀLevel
QualifiedꢀSuppliersꢀListꢀofꢀDistributorsꢀ(QSLD)
ꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀRochesterꢀisꢀaꢀcriticalꢀsupplierꢀtoꢀDLAꢀand
ꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀꢀmeetsꢀallꢀindustryꢀandꢀDLAꢀstandards.
Rochester branded components are
manufactured using either die/wafers
purchased from the original suppliers
or Rochester wafers recreated from the
originalꢀIP.ꢀAllꢀrecreationsꢀareꢀdoneꢀwithꢀ
theꢀapprovalꢀofꢀtheꢀOCM.ꢀ
Partsꢀ areꢀ testedꢀ usingꢀ originalꢀ factoryꢀ
test programs or Rochester developed
test solutions to guarantee product
meetsꢀorꢀexceedsꢀtheꢀOCMꢀdataꢀsheet.
RochesterꢀElectronics,ꢀLLCꢀisꢀcommittedꢀtoꢀsupplyingꢀ
products that satisfy customer expectations for
quality and are equal to those originally supplied by
industry manufacturers.
The original manufacturer’s datasheet accompanying this document reflects the performance
and specifications of the Rochester manufactured version of this device. Rochester Electronics
guarantees the performance of its semiconductor products to the original OEM specifications.
‘Typical’ values are for reference purposes only. Certain minimum or maximum ratings may be
based on product characterization, design, simulation, or sample testing.
© 2013 Rochester Electronics, LLC. All Rights Reserved 12022013
To learn more, please visit www.rocelec.com
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