MNA142CN472MK [ROHM]
ISOLATED C NETWORK, 25V, X7R, 0.0047uF, SURFACE MOUNT, CHIP-8, CHIP;
| 型号： | MNA142CN472MK |
| 厂家： | 
ROHM |
| 描述： | ISOLATED C NETWORK, 25V, X7R, 0.0047uF, SURFACE MOUNT, CHIP-8, CHIP 电容器 |
| 文件： | 总9页 (文件大小：118K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
MNA14
Ceramic capacitors
Multi-layer ceramic chip capacitor
networks
MNA14 (1608 (0603) × 4 size, chip capacitor networks)
!External dimensions (Units : mm)
!Features
1) Area ratio is approximately 55% smaller than that of
the MCH18, enabling high - density mounting.
2) Mounting costs are reduced.
3) Use of convex electrodes prevents solder bridging
during mounting, and makes it easy to perform
a visual inspection of the mounted piece.
Also facilitates automatic inspection.
4) Barrier layer and end terminations to improve
solderability.
0.55 0.1
0.7 0.2
5) Each element is independent to ensure a wide
range of circuit applications.
6) Can be packed on tape.
0.85 0.1
0.8 0.1
3.2 0.2
0.8 0.1
∗
Land pattern in 0.8mm pitch between each electrode is recommended.
!Structure
!Equivalent circuits
C1
C2
C3
C4
C1
= C
2
= C
3
= C
4
External electrode ΙΙΙ (coating layer)
Internal electrode
Ceramic element
External electrode ΙΙ (barrier layer)
External electrode Ι (thick membrane layer)
∗The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification.
MNA14
Ceramic capacitors
!Product designation
Code Product thickness Packaging specifications
0.8mm
Reel (φ180mm) : compatible with EIAJ ET-7200A
Reel
Basic ordening unit (pcs.)
K
Paper tape (width 8 mm, pich 4 mm) φ180mm
(
7in.
)
4,000
Part No.
Packaging style
M N A 1 4 5 A 1 0 1 K K
Rated voltage
Nominal
Capacitance tolerance
Capacitance-temperature characteristics
capacitance
Voltage
25V
50V
Code
2
5
Code EIA code Operating temperature range (°C) Temp. coefficient or percent change
Code
tolerace
10%
A
C0G
−55 ~ +125
0
30ppm / °C
K
3-digit designation
according IEC
20%
CN
X7R
−55 ~ +125
15%
M
!Capacitance range
Product name
MNA 14
Temperature characteristic
A (C0G)
CN (X7R)
50V
25V
Capacitance (pF)
Rated voltage
Tolerance
K ( 10%)
M ( 20%)
10
22
47
100
220
470
1,000
2,200
4,700
10,000
22,000
Product thickness (mm)
0.8 0.1
∗The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification.
MNA14
Ceramic capacitors
!Characteristics
Class 1 (For thermal compensation)
Temperature characteristics
Item
Test methods / conditions
(based on JIS C 5102)
A (C0G)
Operating temperature
Nominal capacitance (C)
−55°C ~ +125°C
Must be within the specified tolerance range.
Based on paragraph 7.8 and paragraph 9,
Measured at room temperature and standard humidity.
100 / (400 + 20C)% or less: Less than 30 pF
Measurement frequency :
Measurement voltage
1
1
0.1MHz
Dissipation factor (tanδ)
0.1% or less : 30 pF or larger
:
0.1Vrms.
Based on paragraph 7.6.
Measurement is made after rated voltage is
applied for 60 5s.
Insulation resistance (IR)
Withstanding voltage
10,000MΩ or 500MΩ⋅µF, whichever is smaller
Based on paragraph 7.1.
Apply 300% of the rated voltage for 1 to 5s
then measure.
The insulation must not be damaged.
The temperature coefficients in table 12, paragraph
7.12 are calculated at 20°C and high temperature.
Temperature characteristics
Within 0 30ppm / °C
Based on paragraph 8.11.2.
Apply 5N for 10 1s
in the direction
indicated by the arrow.
Pressure (5N)
Terminal adherence
No detachment or signs of detachment.
Test board
Capacitor
There must be no mechanical damage.
Must be within initial tolerance.
Appearance
Resistance
Chip is mounted to a board in the manner
shown on the right, subjected to vibration
(type A in paragraph 8.2), and
Rate of capacitance change
to vibration
Board
measured 24 2 hours later.
Dissipation factor (tanδ)
Must satisfy initial specified value.
Based on paragraph 8.13,
Soldering temperature
Soldering time
At least 3/4 of the surface of the two terminals
must be covered with new solder.
: 235 5°C
: 2 0.5s
Solderability
There must be no mechanical damage.
2.5% or 0.25 pF, whichever is larger
Must satisfy initial specified value.
Appearance
Rate of capacitance change
Based on paragraph 8.14.
Resistance
to soldering
heat
Dissipation factor (tanδ)
Soldering temperature : 260 5°C
Soldering time
: 5 0.5s
Insulation resistance
Withstanding voltage
Appearance
10,000MΩ or 500MΩ⋅µF, whichever is smaller
The insulation must not be damaged.
There must be no mechanical damage.
Preheating
: 150 10°C for 1 to 2 min.
Based on paragraph 9.3,
Rate of capacitance change
Dissipation factor (Tanδ)
Insulation resistance
Appearance
2.5% or 0.25 pF, whichever is larger
Must satisfy initial specified value.
10,000MΩ or 500MΩ⋅µF, whichever is smaller
There must be no mechanical damage.
7.5% or 0.75 pF, whichever is larger
0.5% or less
Temperature
cycling
Number of cycles : 5
Capacitance measured after 24 2 hrs.
Based on paragraph 9.9,
Test temperature : 40 2°C
Relative humidity : 90% to 95%
Applied voltage : rated voltage
Rate of capacitance change
Dissipation factor (tanδ)
Insulation resistance
Appearance
Humidity load
test
Test time
: 500 to 524 hrs.
500MΩ or 25MΩ⋅µF, whichever is smaller
There must be no mechanical damage.
3.0% or 0.3 pF, whichever is larger
0.3% or less
Capacitance measured after 24 2 hrs.
Based on paragraph 9.10,
Test temperature : Max. operating temp.
Applied voltage : rated voltage
Test time : 1,000 to 1,048 hrs.
Capacitance measured after 24 2 hrs.
High-
temperature
load test
Rate of capacitance change
Dissipation factor (tanδ)
Insulation resistance
× 200%
10,000MΩ or 50MΩ⋅µF, whichever is smaller
∗The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification.
MNA14
Ceramic capacitors
Class 2 (High dielectric constant)
Temperature characteristics
Item
Test methods/conditions
(based on JIS C 5102)
CN (X7R)
Operating temperature
Nominal capacitance (C)
−55°C ~ +125°C
Based on paragraph 7.8
Measured at room temperature and standard humidity.
Must be within the specified tolerance range.
Measurement frequency
Measurement voltage
: 1 0.1 kHz
: 0.1 0.2 Vrms.
2.5% or less
(when rated voltage is 16V : 3.5% or less)
Dissipation factor (tanδ)
Based on paragraph 7.6
Measurement is made after rated voltage
is applied for 60 5s.
Insulation resistance (IR)
10,000MΩ or 500MΩ⋅µF, whichever is smaller
Based on paragraph 7.1
Apply 250% of the rated voltage
for 1 to 5s then measure.
Withstanding voltage
The insulation must not be damaged.
The temperature coefficients in paragraph 7.12,
table 8, condition B, are based on measurements
carried out at 20°C, with no voltage applied.
Temperature characteristics
Within 15%
Based on paragraph 8.11.2.
Apply 5N for 10 1s
in the direction indicated
by the arrow.
No peeling or sign of peeling on terminal.
Terminal adherence
Pressure (5N)
Test board
Capacitor
Appearance
Resistance
There must be no mechanical damage.
Must be within initial tolerance.
Chip is mounted to a board in the
manner shown on the right, subjected
to vibration (type A in paragraph 8.2),
and measured 48 4 hrs. later.
Rate of capacitance change
to vibration
Board
Dissipation factor (tanδ)
Must satisfy initial specified value.
Based on paragraph 8.13
At least 3/4 of the surface of the two terminals must be covered with new solder.
Solderability
Soldering temperature
Soldering time
: 235 5°
: 2 0.5s
C
Appearance
There must be no mechanical damage.
Within 5.0%
Based on paragraph 8.14.
Rate of capacitance change
Resistance
: 260 5°
: 5 0.5s
: 150 10°
1 to 2 min.
C
Soldering temperature
Soldering time
Preheating
Dissipation factor (tanδ)
Insulation resistance
Withstanding voltage
Appearance
Must satisfy initial specified value.
10,000MΩ or 500MΩ⋅µF, whichever is smaller
The insulation must not be damaged.
There must be no mechanical damage.
Within 7.5%
to soldering
heat
C for
Based on paragraph 9.3
Number of cycles : 5
Capacitance measured after 48 4 hrs.
Rate of capacitance change
Dissipation factor (tanδ)
Insulation resistance
Temperature
cycling
Must satisfy initial specified value.
10,000MΩ or 500MΩ⋅µF, whichever is smaller
There must be no mechanical damage.
Within 12.5%
Appearance
Based on paragraph 9.9
Test temperature
: 40 2°
C
Rate of capacitance change
Humidity load
test
: 90% to 95%
Relative humidity
Applied voltage
Test time
: rated voltage
: 500 to 524 hrs.
Dissipation factor (tanδ)
5.0% or less
Capacitance measured after 48 4 hrs.
Insulation resistance
500MΩ or 25MΩ⋅µF, whichever is smaller
There must be no mechanical damage.
Appearance
Based on paragraph 9.10
Rate of capacitance change
High-
temperature
load test
Within 10.0%
5.0% or less
: Max. operating temp.
Test temperature
Applied voltage
Test time
: rated voltage
× 200%
Dissipation factor (tanδ)
: 1,000 to 1,048 hrs.
Capacitance measured after 48 4 hrs.
Insulation resistance
1,000MΩ or 50MΩ⋅µF, whichever is smaller
∗The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification.
MNA14
Ceramic capacitors
!Packaging specifications
(Units : mm)
Taping
Reel
t
φJ
E
D
A
11.4 ± 1.0
C
B
t1
F
G
H
(Paper taping)
Pulling direction
Symbol
Dimensions
C
D
E
F
G
H
J
t
t1
8.0
3.5 1.75 4.0 2.0 4.0 φ1.5 1.05 1.2
+0.1
0.3 0.05 0.1 0.1 0.05 0.1
MAX. MAX.
0
Label position
Symbol
(φ180mm reel)
A
B
Size
1608 × 4
EIAJ ET-7200A compliant
2.0 0.1 3.5 0.1
∗The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification.
MNA14
Ceramic capacitors
!Electrical characteristics
A (C0G) Characteristics
g
5
10000
1000
100
10
4
3
2
1
0
−1
−2
−3
−4
100pF
220pF
470pF
1
0.1
0
−5
−50
0
50
100
1
10
100
1000
10000
FREQUENCY (MHz)
TEMPERATURE : (°C)
Fig.2 Impedance-frequency
characteristics
Fig.1 Capacitance-temperature
characteristics
CN (X7R) Characteristics
g
30
1000
100
10
20
10
∆C / C
0
−10
−20
−30
1,000pF
1
15
10
5
0.1
0.01
10,000pF
tanδ
0
−50
0
50
100
1
10
100
1000
10000
TEMPERATURE : (°C
)
FREQUENCY (MHz)
Fig.4 Impedance-frequency
characteristics
Fig.3 Capacitance-temperature
characteristics
∗The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification.
MNA14
Ceramic capacitors
Temperature cycling test
g
A (C0G) Characteristics (100pF)
3.0
0.6
0.5
0.4
JIS C 5102 9. 3
JIS C 5102 9. 3
SAMPLE SIZE : n = 50pcs
−55 / +125°C 100cyc
JIS C 5102 9. 3
SAMPLE SIZE : n = 50pcs
−55 / +125°C 100cyc
SAMPLE SIZE : n = 50pcs
−55 / +125°C 100cyc
2.0
1
×
1 012
1.0
0
0.3
0.2
−1.0
−2.0
−3.0
0.1
0
1
×
1011
INITIAL VALUE
TESTED
INITIAL VALUE
TESTED
INITIAL VALUE
TESTED
Fig.5 Rate of capacitance change
Fig.7 Insulation resistance
Fig.6 tan
δ
CN (X7R) Characterisics (10,000pF)
15.0
6.0
5.0
4.0
JIS C 5102 9. 3
SAMPLE SIZE : n = 50pcs
−55 / +125°C 100cyc
JIS C 5102 9. 3
SAMPLE SIZE : n = 50pcs
−55 / +125°C 100cyc
JIS C 5102 9. 3
SAMPLE SIZE : n = 50pcs
−55 / +125°C 100cyc
10.0
1
×
1012
5.0
0
3.0
2.0
−5.0
−10.0
−15.0
1.0
0
1
×
1011
INITIAL VALUE
TESTED
INITIAL VALUE
TESTED
INITIAL VALUE
TESTED
Fig.8 Rate of capacitance change
Fig.10 Insulation resistance
Fig.9 tanδ
High – temperature load test
g
A (C0G) Characteristics (100pF)
3.0
0.6
0.5
0.4
JIS C 5102 9. 10
SAMPLE SIZE : n = 50pcs
+125°C 1,000h
OVERLOAD : 200% RATED VOLTAGE
JIS C 5102 9. 10
SAMPLE SIZE : n = 50pcs
2.0
1.0
+125°C 1,000h
OVERLOAD : 200% RATED VOLTAGE
1
×
1012
0.0
0.3
0.2
1
1
×
×
1011
−1.0
JIS C 5102 9. 10
SAMPLE SIZE : n = 50pcs
+125°C 1,000h
OVERLOAD : 200% RATED VOLTAGE
−2.0
−3.0
0.1
0
1010
1000
1000
0
240
480
720
0
240
480
720
1000
0
240
480
720
TIME (h)
TIME (h)
TIME (h)
Fig.12 tanδ
Fig.11 Rate of capacitance change
Fig.13 Insulation resistance
∗The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification.
MNA14
Ceramic capacitors
CN (X7R) Characteristics (10,000pF)
6.0
5.0
4.0
15.0
JIS C 5102 9. 10
JIS C 5102 9. 10
SAMPLE SIZE : n = 50pcs
+125°C 1,000h
OVERLOAD : 200% RATED VOLTAGE
JIS C 5102 9. 10
SAMPLE SIZE : n = 50pcs
+125°C 1,000h
OVERLOAD : 200% RATED VOLTAGE
SAMPLE SIZE : n = 50pcs
+125°C 1,000h
10.0
5.0
OVERLOAD : 200% RATED VOLTAGE
1 ×
1012
3.0
2.0
0.0
−5.0
1.0
0
−10.0
−15.0
1 ×
1011
1000
0
240
480
720
1000
1000
0
240
480
720
0
240
480
720
TIME (h)
TIME (h)
TIME (h)
Fig.15 tanδ
Fig.16 Insulation resistance
Fig.14 Rate of capacitance change
Humidity load test
g
A (C0G) Characteristics (100pF)
3.0
0.6
JIS C 5102 9. 9
JIS C 5102 9. 9
JIS C 5102 9. 9
SAMPLE SIZE : n = 50pcs
+40°C 90 ~ 95%RH 1,000h
OVERLOAD : THE RATED VOLTAGE
SAMPLE SIZE : n = 50pcs
+40°C 90 ~ 95%RH 1,000h
OVERLOAD : THE RATED VOLTAGE
SAMPLE SIZE : n = 50pcs
+40°C 90 ~ 95%RH 1,000h
OVERLOAD : THE RATED VOLTAGE
2.0
1.0
0.5
0.4
1
×
1012
0.0
0.3
0.2
1
1
×
×
1011
−1.0
−2.0
−3.0
0.1
0
1010
1000
0
240
480
720
1000
0
240
480
720
1000
0
240
480
720
TIME (h)
TIME (h)
TIME (h)
Fig.17 Rate of capacitance change
Fig.18 tanδ
Fig.19 Insulation resistance
CN (X7R) Characteristics (10,000pF)
15.0
6.0
5.0
4.0
JIS C 5102 9. 9
JIS C 5102 9. 9
SAMPLE SIZE : n = 50pcs
+40°C 90 ~ 95%RH 1,000h
OVERLOAD : THE RATED VOLTAGE
SAMPLE SIZE : n = 50pcs
+40°C 90 ~ 95%RH 1,000h
OVERLOAD : THE RATED VOLTAGE
10.0
1
×
1012
5.0
0
3.0
2.0
1
1
×
×
1011
−5.0
JIS C 5102 9. 9
−10.0
−15.0
SAMPLE SIZE : n = 50pcs
+40°C 90 ~ 95%RH 1,000h
OVERLOAD : THE RATED VOLTAGE
1.0
0
1010
1000
0
240
480
720
1000
0
240
480
720
1000
0
240
480
720
TIME (h)
TIME (h)
TIME (h)
Fig.20 Rate of capacitance change
Fig.21 tanδ
Fig.22 Insulation resistance
∗The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification.
Appendix
Notes
No technical content pages of this document may be reproduced in any form or transmitted by any
means without prior permission of ROHM CO.,LTD.
The contents described herein are subject to change without notice. The specifications for the
product described in this document are for reference only. Upon actual use, therefore, please request
that specifications to be separately delivered.
Application circuit diagrams and circuit constants contained herein are shown as examples of standard
use and operation. Please pay careful attention to the peripheral conditions when designing circuits
and deciding upon circuit constants in the set.
Any data, including, but not limited to application circuit diagrams information, described herein
are intended only as illustrations of such devices and not as the specifications for such devices. ROHM
CO.,LTD. disclaims any warranty that any use of such devices shall be free from infringement of any
third party's intellectual property rights or other proprietary rights, and further, assumes no liability of
whatsoever nature in the event of any such infringement, or arising from or connected with or related
to the use of such devices.
Upon the sale of any such devices, other than for buyer's right to use such devices itself, resell or
otherwise dispose of the same, no express or implied right or license to practice or commercially
exploit any intellectual property rights or other proprietary rights owned or controlled by
ROHM CO., LTD. is granted to any such buyer.
Products listed in this document use silicon as a basic material.
Products listed in this document are no antiradiation design.
The products listed in this document are designed to be used with ordinary electronic equipment or devices
(such as audio visual equipment, office-automation equipment, communications devices, electrical
appliances and electronic toys).
Should you intend to use these products with equipment or devices which require an extremely high level of
reliability and the malfunction of with would directly endanger human life (such as medical instruments,
transportation equipment, aerospace machinery, nuclear-reactor controllers, fuel controllers and other
safety devices), please be sure to consult with our sales representative in advance.
About Export Control Order in Japan
Products described herein are the objects of controlled goods in Annex 1 (Item 16) of Export Trade Control
Order in Japan.
In case of export from Japan, please confirm if it applies to "objective" criteria or an "informed" (by MITI clause)
on the basis of "catch all controls for Non-Proliferation of Weapons of Mass Destruction.
Appendix1-Rev1.0
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