K6T4016V3C-TB700 [SAMSUNG]

Standard SRAM, 256KX16, 70ns, CMOS, PDSO44, 0.400 INCH, TSOP2-44;
K6T4016V3C-TB700
型号: K6T4016V3C-TB700
厂家: SAMSUNG    SAMSUNG
描述:

Standard SRAM, 256KX16, 70ns, CMOS, PDSO44, 0.400 INCH, TSOP2-44

静态存储器 光电二极管
文件: 总9页 (文件大小:154K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
K6T4016V3C, K6T4016U3C Family  
CMOS SRAM  
Document Title  
256Kx16 bit Low Power and Low Voltage CMOS Static RAM  
Revision History  
Revision No History  
Draft Date  
Remark  
0.0  
Initial draft  
January 13, 1998  
Advance  
0.1  
Revise  
June 12, 1998  
Preliminary  
- Speed bin change  
Commercial: 70/85ns to 70/85/100ns  
Industrial: 85/100ns to 70/85/100ns  
- DC Characteristics change  
ICC: 5mA at read/write to 4mA at read  
ICC1: 5mA to 6mA  
ICC2: 50mA to 45mA  
ISB: 0.5mA to 0.3mA  
ISB1: 10mA to 15mA for commercial parts  
0.11  
1.0  
Errata correction  
Finalize  
August 13, 1998  
November 16, 1998  
June 26, 2001  
Final  
Final  
2.0  
Revise  
- Add K6T4016V3C-TB55 product  
2.01  
Revise  
October 15, 2001  
Final  
- Improved VOH(output high voltage) from 2.2V to 2.4V.  
The attached datasheets are provided by SAMSUNG Electronics. SAMSUNG Electronics CO., LTD. reserve the right to change the specifications and  
products. SAMSUNG Electronics will answer to your questions about device. If you have any questions, please contact the SAMSUNG branch offices.  
1
Revision 2.01  
October 2001  
K6T4016V3C, K6T4016U3C Family  
CMOS SRAM  
256Kx16 bit Low Power and Low Voltage CMOS Static RAM  
FEATURES  
GENERAL DESCRIPTION  
· Process Technology: TFT  
· Organization: 256K x16  
The K6T4016V3C and K6T4016U3C families are fabricated by  
SAMSUNG¢s advanced CMOS process technology. The fami-  
lies support various operating temperature ranges and have  
various package types for user flexibility of system design. The  
families also support low data retention voltage for battery  
back-up operation with low data retention current.  
· Power Supply Voltage  
K6T4016V3C Family: 3.0~3.6V  
K6T4016U3C Family: 2.7~3.3V  
· Low Data Retention Voltage: 2V(Min)  
· Three State Outputs  
· Package Type: 44-TSOP2-400F/R  
PRODUCT FAMILY  
Power Dissipation  
Product Family  
Operating Temperature Vcc Range  
Speed(ns)  
PKG Type  
Standby  
(ISB1, Max)  
Operating  
(ICC2, Max)  
551)/701)/85/100  
701)/85/100  
K6T4016V3C-B  
K6T4016U3C-B  
K6T4016V3C-F  
K6T4016U3C-F  
3.0~3.6V  
2.7~3.3V  
3.0~3.6V  
2.7~3.3V  
Commercial(0~70°C)  
Industrial(-40~85°C)  
15mA  
20mA  
45mA  
44-TSOP2-400F/R  
1. The parameter is measured with 30pF test load.  
PIN DESCRIPTION  
FUNCTIONAL BLOCK DIAGRAM  
A4  
A3  
44  
43  
42  
41  
40  
39  
38  
37  
36  
35  
34  
33  
32  
31  
30  
29  
28  
27  
26  
25  
24  
23  
1
44  
43  
42  
41  
40  
39  
38  
37  
36  
35  
34  
33  
32  
31  
30  
29  
28  
27  
26  
25  
24  
23  
1
2
A4  
A5  
A5  
A6  
Clk gen.  
Precharge circuit.  
2
A3  
A6  
A2  
3
3
A2  
A7  
A7  
A1  
A0  
4
4
A1  
OE  
OE  
A0  
Vcc  
Vss  
5
5
UB  
A0  
UB  
A1  
CS  
6
6
LB  
CS  
LB  
A2  
I/OI  
I/O2  
I/O3  
I/O4  
Vcc  
Vss  
I/O5  
I/O6  
I/O7  
I/O8  
WE  
A17  
A16  
A15  
A14  
A13  
7
I/O16  
I/O15  
I/O14  
I/O13  
Vss  
Vcc  
I/O12  
I/O11  
I/O10  
I/O9  
NC  
7
I/OI  
I/O2  
I/O3  
I/O4  
Vcc  
Vss  
I/O5  
I/O6  
I/O7  
I/O8  
WE  
A17  
A16  
A15  
A14  
A13  
I/O16  
I/O15  
I/O14  
I/O13  
Vss  
8
8
A3  
9
9
Memory array  
1024 rows  
256´ 16 columns  
A4  
Row  
select  
10  
11  
12  
13  
14  
15  
16  
17  
18  
19  
20  
21  
22  
10  
11  
A13  
A14  
A15  
A16  
A17  
44-TSOP2  
Forward  
44-TSOP2  
Reverse  
12  
13  
14  
15  
16  
17  
18  
19  
20  
21  
22  
Vcc  
I/O12  
I/O11  
I/O10  
I/O9  
NC  
A8  
A8  
I/O Circuit  
Column select  
Data  
cont  
I/O1~I/O8  
A9  
A9  
A10  
A11  
A12  
A10  
A11  
A12  
Data  
cont  
I/O9~I/O16  
Data  
cont  
Name  
CS  
Function  
Chip Select Input  
Name Function  
A5 A6 A7 A8 A9 A10A11A12  
Vcc Power  
OE  
Output Enable Input Vss Ground  
WE  
Write Enable Input  
Address Inputs  
LB  
UB  
NC  
Lower Byte (I/O1~8)  
Upper Byte (I/O9~16)  
No Connection  
WE  
OE  
UB  
LB  
A0~A17  
Control  
logic  
I/O1~I/O16 Data Input/Output  
CS  
SAMSUNG ELECTRONICS CO., LTD. reserves the right to change products and specifications without notice.  
2
Revision 2.01  
October 2001  
K6T4016V3C, K6T4016U3C Family  
CMOS SRAM  
PRODUCT LIST  
Commercial Temperature Product(0~70°C)  
Industrial Temperature Products(-40~85°C)  
Part Name  
Function  
Part Name  
Function  
K6T4016V3C-TB55  
K6T4016V3C-TB70  
K6T4016V3C-TB85  
K6T4016V3C-TB10  
K6T4016V3C-RB70  
K6T4016V3C-RB85  
K6T4016V3C-RB10  
44-TSOP2-F, 55ns, 3.3V, LL  
44-TSOP2-F, 70ns, 3.3V, LL  
44-TSOP2-F, 85ns, 3.3V, LL  
44-TSOP2-F, 100ns, 3.3V, LL  
44-TSOP2-R, 70ns, 3.3V, LL  
44-TSOP2-R, 85ns, 3.3V, LL  
44-TSOP2-R, 100ns, 3.3V, LL  
K6T4016V3C-TF70  
K6T4016V3C-TF85  
K6T4016V3C-TF10  
K6T4016V3C-RF70  
K6T4016V3C-RF85  
K6T4016V3C-RF10  
44-TSOP2-F, 70ns, 3.3V, LL  
44-TSOP2-F, 85ns, 3.3V, LL  
44-TSOP2-F, 100ns, 3.3V, LL  
44-TSOP2-R, 70ns, 3.3V, LL  
44-TSOP2-R, 85ns, 3.3V, LL  
44-TSOP2-R, 100ns, 3.3V, LL  
K6T4016U3C-TF70  
K6T4016U3C-TF85  
K6T4016U3C-TF10  
K6T4016U3C-RF70  
K6T4016U3C-RF85  
K6T4016U3C-RF10  
44-TSOP2-F, 70ns, 3.0V, LL  
44-TSOP2-F, 85ns, 3.0V, LL  
44-TSOP2-F, 100ns, 3.0V, LL  
44-TSOP2-R, 70ns, 3.0V, LL  
44-TSOP2-R, 85ns, 3.0V, LL  
44-TSOP2-R, 100ns, 3.0V, LL  
K6T4016U3C-TB70  
K6T4016U3C-TB85  
K6T4016U3C-TB10  
K6T4016U3C-RB70  
K6T4016U3C-RB85  
K6T4016U3C-RB10  
44-TSOP2-F, 70ns, 3.0V, LL  
44-TSOP2-F, 85ns, 3.0V, LL  
44-TSOP2-F, 100ns, 3.0V, LL  
44-TSOP2-R, 70ns, 3.0V, LL  
44-TSOP2-R, 85ns, 3.0V, LL  
44-TSOP2-R, 100ns, 3.0V, LL  
FUNCTIONAL DESCRIPTION  
CS  
H
L
OE  
X1)  
H
WE  
X1)  
H
LB  
X1)  
X1)  
H
UB  
X1)  
X1)  
H
I/O1~8  
High-Z  
High-Z  
High-Z  
Dout  
I/O9~16  
High-Z  
High-Z  
High-Z  
High-Z  
Dout  
Mode  
Power  
Standby  
Active  
Active  
Active  
Active  
Active  
Active  
Active  
Active  
Deselected  
Output Disabled  
Output Disabled  
Lower Byte Read  
Upper Byte Read  
Word Read  
X1)  
L
X1)  
H
L
L
L
H
L
L
H
H
L
High-Z  
Dout  
L
L
H
L
L
Dout  
X1)  
X1)  
X1)  
L
L
L
H
Din  
High-Z  
Din  
Lower Byte Write  
Upper Byte Write  
Word Write  
L
L
H
L
High-Z  
Din  
L
L
L
L
Din  
1. X means don¢t care. (Must be in low or high state)  
ABSOLUTE MAXIMUM RATINGS1)  
Item  
Symbol  
VIN,VOUT  
VCC  
Ratings  
Unit  
Remark  
Voltage on any pin relative to Vss  
Voltage on Vcc supply relative to Vss  
Power Dissipation  
-0.5 to VCC+0.5  
-0.3 to 4.6  
1.0  
V
-
-
-
-
V
PD  
W
°C  
°C  
°C  
Storage temperature  
TSTG  
-65 to 150  
0 to 70  
K6T4016V3C-B, K6T4016U3C-B  
K6T4016V3C-F, K6T4016U3C-F  
Operating Temperature  
TA  
-40 to 85  
1. Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. Functional operation should be  
restricted to recommended operating condition. Exposure to absolute maximum rating conditions for extended periods may affect reliability.  
3
Revision 2.01  
October 2001  
K6T4016V3C, K6T4016U3C Family  
CMOS SRAM  
RECOMMENDED DC OPERATING CONDITIONS1)  
Item  
Symbol  
Product  
Min  
Typ  
Max  
Unit  
K6T4016V3C Family  
K6T4016U3C Family  
3.0  
2.7  
3.3  
3.0  
3.6  
3.3  
Supply voltage  
Vcc  
V
Ground  
Vss  
VIH  
VIL  
All Family  
0
0
-
0
V
V
V
Vcc+0.32)  
0.6  
Input high voltage  
Input low voltage  
Note:  
K6T4016V3C, K6T4016U3C Family  
K6T4016V3C, K6T4016U3C Family  
2.2  
-0.33)  
-
1. Commercial Product: TA=0 to 70°C, otherwise specified  
Industrial Product: TA=-40 to 85°C, otherwise specified  
2. Overshoot: VCC+2.0V in case of pulse width £ 30ns  
3. Undershoot: -2.0V in case of pulse width £ 30ns  
4. Overshoot and undershoot are sampled, not 100% tested.  
CAPACITANCE1) (f=1MHz, TA=25°C)  
Item  
Input capacitance  
Symbol  
CIN  
Test Condition  
VIN=0V  
Min  
Max  
Unit  
-
-
8
pF  
pF  
Input/Output capacitance  
CIO  
VIO=0V  
10  
1. Capacitance is sampled, not 100% tested  
DC AND OPERATING CHARACTERISTICS  
Item  
Symbol  
ILI  
Test Conditions  
Min Typ Max Unit  
Input leakage current  
VIL=Vss to Vcc  
-1  
-1  
-
-
-
-
1
1
4
mA  
mA  
Output leakage current  
Operating power supply current  
ILO  
CS=VIH or OE=VIH or WE=VIL VIO=Vss to Vcc  
IIO=0mA, CS=VIL, VIN=VIL or VIH, Read  
ICC  
mA  
Cycle time=1ms, 100% duty, IIO=0mA CS£0.2V,  
VIN£0.2V or VIN³ Vcc-0.2V  
ICC1  
ICC2  
-
-
-
-
6
mA  
mA  
Average operating current  
Cycle time=Min2), 100% duty, IIO=0mA, CS=VIL,  
VIN=VIH or VIL  
45  
Output low voltage  
VOL  
VOH  
ISB  
IOL=2.1mA  
-
2.4  
-
-
-
-
-
0.4  
-
V
V
Output high voltage  
Standby Current(TTL)  
Standby Current(CMOS)  
IOH=-1.0mA  
CS=VIH, Other inputs=VIL or VIH  
CS³ Vcc-0.2V, Other inputs=0~Vcc  
0.3  
151)  
mA  
mA  
ISB1  
-
1. Industrial product = 20mA  
2. Cycle time = 70ns  
4
Revision 2.01  
October 2001  
K6T4016V3C, K6T4016U3C Family  
CMOS SRAM  
AC OPERATING CONDITIONS  
TEST CONDITIONS( Test Load and Input/Output Reference)  
Input pulse level: 0.4 to 2.2V  
Input rising and falling time: 5ns  
)
1
Input and output reference voltage: 1.5V  
Output load(see right): CL=100pF+1TTL  
CL=30pF+1TTL  
CL  
1.Including scope and jig capacitance  
AC CHARACTERISTICS (K6T4016V3C Family: Vcc=3.0~3.6V, K6T4016U3C Family: Vcc=2.7~3.3V  
Commercial product: TA=0 to 70°C, Industrial product: TA=-40 to 85°C)  
Speed Bins  
Parameter List  
Symbol  
Units  
55ns  
70ns  
85ns  
100ns  
Min  
Max  
Min  
Max  
Min  
Max  
Min  
Max  
Read cycle time  
tRC  
tAA  
55  
-
-
55  
55  
25  
25  
-
70  
-
-
70  
70  
35  
35  
-
85  
-
-
85  
85  
40  
40  
-
100  
-
-
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
Address access time  
100  
Chip select to output  
tCO  
tOE  
-
-
-
-
100  
Output enable to valid output  
LB, UB valid to data output  
Chip select to low-Z output  
Output enable to low-Z output  
LB, UB enable to low-Z output  
Output hold from address change  
Chip disable to high-Z output  
OE disable to high-Z output  
LB, UB disable to high-Z output  
Write cycle time  
-
-
-
-
50  
50  
-
tBA  
-
-
-
-
tLZ  
10  
5
10  
5
10  
5
10  
5
Read  
tOLZ  
tBLZ  
tOH  
tHZ  
-
-
-
-
5
-
5
-
5
-
5
-
10  
0
-
10  
0
-
10  
0
-
15  
0
-
20  
20  
20  
-
25  
25  
25  
-
25  
25  
25  
-
30  
30  
30  
-
tOHZ  
tBHZ  
tWC  
tCW  
tAS  
0
0
0
0
0
0
0
0
55  
45  
0
70  
60  
0
85  
70  
0
100  
80  
0
Chip select to end of write  
Address set-up time  
-
-
-
-
-
-
-
-
Address valid to end of write  
Write pulse width  
tAW  
tWP  
tWR  
tWHZ  
tDW  
tDH  
45  
40  
0
-
60  
55  
0
-
70  
60  
0
-
80  
70  
0
-
-
-
-
-
Write  
Write recovery time  
-
-
-
-
Write to output high-Z  
0
20  
-
0
25  
-
0
25  
-
0
30  
-
Data to write time overlap  
Data hold from write time  
End write to output low-Z  
LB, UB valid to end of write  
25  
0
30  
0
35  
0
40  
0
-
-
-
-
tOW  
tBW  
5
-
5
-
5
-
5
-
45  
-
60  
-
70  
-
80  
-
DATA RETENTION CHARACTERISTICS  
Item  
Symbol  
Test Condition  
CS³ Vcc-0.2V  
Vcc=3.0V, CS³ Vcc-0.2V  
Min  
2.0  
-
Typ  
Max  
Unit  
V
Vcc for data retention  
Data retention current  
Data retention set-up time  
VDR  
-
0.5  
-
3.6  
151)  
IDR  
mA  
tSDR  
0
-
-
See data retention waveform  
ms  
Recovery time  
tRDR  
5
-
1. Industrial product = 20mA  
5
Revision 2.01  
October 2001  
K6T4016V3C, K6T4016U3C Family  
CMOS SRAM  
TIMING DIAGRAMS  
TIMING WAVEFORM OF READ CYCLE(1) (Address Controlled, CS=OE=VIL, WE=VIH, UB or/and LB=VIL)  
tRC  
Address  
tAA  
tOH  
Data Valid  
Data Out  
Previous Data Valid  
TIMING WAVEFORM OF READ CYCLE(2) (WE=VIH)  
tRC  
Address  
tOH  
tAA  
tCO  
CS  
tHZ  
tBA  
UB, LB  
OE  
tBHZ  
tOHZ  
tOE  
tOLZ  
tBLZ  
tLZ  
Data out  
High-Z  
Data Valid  
NOTES (READ CYCLE)  
1. tHZ and tOHZ are defined as the time at which the outputs achieve the open circuit conditions and are not referenced to output voltage  
levels.  
2. At any given temperature and voltage condition, tHZ(Max.) is less than tLZ(Min.) both for a given device and from device to device  
interconnection.  
6
Revision 2.01  
October 2001  
K6T4016V3C, K6T4016U3C Family  
CMOS SRAM  
TIMING WAVEFORM OF WRITE CYCLE(1) (WE Controlled)  
tWC  
Address  
CS  
tWR(4)  
tCW(2)  
tAW  
tBW  
UB, LB  
tWP(1)  
WE  
tAS(3)  
tDW  
tDH  
High-Z  
High-Z  
Data in  
Data Valid  
tWHZ  
tOW  
Data Undefined  
Data out  
TIMING WAVEFORM OF WRITE CYCLE(2) (CS Controlled)  
tWC  
Address  
tAS(3)  
tCW(2)  
tWR(4)  
CS  
tAW  
tBW  
UB, LB  
WE  
tWP(1)  
tDW  
tDH  
Data Valid  
Data in  
Data out  
High-Z  
High-Z  
7
Revision 2.01  
October 2001  
K6T4016V3C, K6T4016U3C Family  
CMOS SRAM  
TIMING WAVEFORM OF WRITE CYCLE(3) (UB, LB Controlled)  
tWC  
Address  
CS  
tCW(2)  
tWR(4)  
tAW  
tBW  
UB, LB  
WE  
tAS(3)  
tWP(1)  
tDH  
tDW  
Data in  
Data Valid  
High-Z  
Data out  
High-Z  
NOTES (WRITE CYCLE)  
1. A write occurs during the overlap(tWP) of low CS and low WE. A write begins when CS goes low and WE goes low with asserting UB  
or LB for single byte operation or simultaneously asserting UB and LB for double byte operation. A write ends at the earliest transi-  
tion when CS goes high and WE goes high. The tWP is measured from the beginning of write to the end of write.  
2. tCW is measured from the CS going low to the end of write.  
3. tAS is measured from the address valid to the beginning of write.  
4. tWR is measured from the end of write to the address change. tWR is applied in case a write ends with CS or WE going high.  
DATA RETENTION WAVE FORM  
CS controlled  
Data Retention Mode  
tSDR  
tRDR  
VCC  
3.0/2.7V1)  
2.2V  
VDR  
CS³ VCC - 0.2V  
CS  
GND  
1. 3.0V for K6T4016V3C Family, 2.7V for K6T4016U3C Family  
8
Revision 2.01  
October 2001  
K6T4016V3C, K6T4016U3C Family  
CMOS SRAM  
Unit: millimeter(inch)  
PACKAGE DIMENSIONS  
44 PIN THIN SMALL OUTLINE PACKAGE TYPE II (400F)  
0~8°  
0.25  
0.010  
(
)
#44  
#23  
0.45 ~0.75  
0.018 ~ 0.030  
11.76±0.20  
0.463±0.008  
0.50  
0.020  
(
)
#1  
#22  
1.00±0.10  
0.039±0.004  
18.81  
0.741  
1.20  
0.047  
MAX.  
MAX.  
18.41±0.10  
0.725±0.004  
0.10  
0.004  
MAX  
0.35± 0.10  
0.014±0.004  
0.80  
0.0315  
0.805  
0.032  
(
)
0~8°  
44 PIN THIN SMALL OUTLINE PACKAGE TYPE II (400R)  
0.25  
0.010  
(
)
#1  
#22  
0.45 ~0.75  
0.018 ~ 0.030  
11.76±0.20  
0.463±0.008  
0.50  
)
(
0.020  
#44  
#23  
1.00±0.10  
0.039±0.004  
18.81  
0.741  
1.20  
0.047  
MAX.  
MAX.  
18.41± 0.10  
0.725±0.004  
0.10  
0.004  
MAX  
0.35±0.10  
0.014±0.004  
0.80  
0.0315  
0.805  
0.032  
(
)
9
Revision 2.01  
October 2001  

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