K7A323601M-QC200 [SAMSUNG]

Cache SRAM, 1MX36, 3.1ns, CMOS, PQFP100, 20 X 14 MM, TQFP-100;
K7A323601M-QC200
型号: K7A323601M-QC200
厂家: SAMSUNG    SAMSUNG
描述:

Cache SRAM, 1MX36, 3.1ns, CMOS, PQFP100, 20 X 14 MM, TQFP-100

静态存储器 内存集成电路
文件: 总18页 (文件大小:248K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
K7A323601M  
K7A321801M  
1Mx36 & 2Mx18 Synchronous SRAM  
Document Title  
1Mx36 & 2Mx18-Bit Synchronous Pipelined Burst SRAM  
Revision History  
Rev. No.  
History  
Draft Date  
Remark  
May. 10. 2001  
Dec. 31. 2001  
0.0  
0.1  
1. Initial draft  
Advance  
1. Speed bin merge.  
Preliminary  
From K7A3236(18)08M to K7A3236(18)01M.  
2. AC parameter change.  
tOH(min)/tHZC(min) from 0.8 to 1.5 at -25  
tOH(min)/tHZC(min) from 1.0 to 1.5 at -22  
tOH(min)/tHZC(min) from 1.0 to 1.5 at -20  
May. 10. 2002  
Oct. 15. 2002  
Oct. 17, 2003  
0.2  
1.0  
1.1  
1. Add Icc, Isb, Isb1 and Isb2 values.  
1. Correct the pin name of 100TQFP.  
Preliminary  
Final  
1. Change the Stand-by current (Isb)  
Before After  
Final  
Isb - 25 : 120  
- 22 : 110  
- 20 : 100  
170  
160  
150  
140  
140  
140  
110  
100  
- 16 :  
- 15 :  
90  
90  
90  
- 14 :  
Isb1  
Isb2  
:
:
90  
80  
The attached data sheets are prepared and approved by SAMSUNG Electronics. SAMSUNG Electronics CO., LTD. reserve the right to change the  
specifications. SAMSUNG Electronics will evaluate and reply to your requests and questions on the parameters of this device. If you have any ques-  
tions, please contact the SAMSUNG branch office near your office, call or contact Headquarters.  
- 1 -  
Oct. 2003  
Rev 1.1  
K7A323601M  
K7A321801M  
1Mx36 & 2Mx18 Synchronous SRAM  
32Mb SB/SPB Synchronous SRAM Ordering Information  
Speed  
Org.  
Part Number  
Mode  
VDD  
SB ; Access Time(ns)  
SPB ; Cycle Time(MHz)  
PKG  
Temp  
K7B321825M-Q(H/F)C65/75/85  
SB  
3.3  
6.5/7.5/8.5ns  
2Mx18  
K7A321800M-Q(H/F)C25/22/20/16/15/14 SPB(2E1D)  
3.3 250/225/200/167/150/138MHz  
3.3 250/225/200/167/150/138MHz  
C
Q: 100TQFP  
H: 119BGA  
F: 165FBGA  
K7A321801M-QC25/22/20/16/15/14  
K7B323625M-Q(H/F)C65/75/85  
SPB(2E2D)  
SB  
(Commercial  
Temperature  
Range)  
3.3  
6.5/7.5/8.5ns  
1Mx36  
K7A323600M-Q(H/F)C25/22/20/16/15/14 SPB(2E1D)  
K7A323601M-QC25/22/20/16/15/14 SPB(2E2D)  
3.3 250/225/200/167/150/138MHz  
3.3 250/225/200/167/150/138MHz  
- 2 -  
Oct. 2003  
Rev 1.1  
K7A323601M  
K7A321801M  
1Mx36 & 2Mx18 Synchronous SRAM  
1Mx36 & 2Mx18-Bit Synchronous Pipelined Burst SRAM  
FEATURES  
GENERAL DESCRIPTION  
• Synchronous Operation.  
• 2 Stage Pipelined operation with 4 Burst.  
• On-Chip Address Counter.  
The K7A323601M and K7A321801M are 37,748,736-bit Syn-  
chronous Static Random Access Memory designed for high  
performance second level cache of Pentium and Power PC  
based System.  
• Self-Timed Write Cycle.  
• On-Chip Address and Control Registers.  
• VDD= 3.3V +0.165V/-0.165V Power Supply.  
• I/O Supply Voltage 3.3V +0.165V/-0.165V for 3.3V I/O  
or 2.5V+0.4V/-0.125V for 2.5V I/O.  
• 5V Tolerant Inputs Except I/O Pins.  
• Byte Writable Function.  
It is organized as 1M(2M) words of 36(18) bits and integrates  
address and control registers, a 2-bit burst address counter and  
added some new functions for high performance cache RAM  
applications; GW, BW, LBO, ZZ. Write cycles are internally self-  
timed and synchronous.  
Full bus-width write is done by GW, and each byte write is per-  
formed by the combination of WEx and BW when GW is high.  
And with CS1 high, ADSP is blocked to control signals.  
Burst cycle can be initiated with either the address status pro-  
cessor(ADSP) or address status cache controller(ADSC)  
inputs. Subsequent burst addresses are generated internally in  
the system¢s burst sequence and are controlled by the burst  
address advance(ADV) input.  
• Global Write Enable Controls a full bus-width write.  
• Power Down State via ZZ Signal.  
• LBO Pin allows a choice of either a interleaved burst or a linear  
burst.  
• Three Chip Enables for simple depth expansion with No Data  
Contention ; 2cycle Enable, 2cycle Disable.  
• Asynchronous Output Enable Control.  
• ADSP, ADSC, ADV Burst Control Pins.  
• TTL-Level Three-State Output.  
LBO pin is DC operated and determines burst sequence(linear  
or interleaved).  
• 100-TQFP-1420A Package  
ZZ pin controls Power Down State and reduces Stand-by cur-  
rent regardless of CLK.  
FAST ACCESS TIMES  
PARAMETER  
Cycle Time  
Clock Access Time  
Output Enable Access Time tOE  
Symbol -25 -22 -20 -16 -15 -14 Unit  
The K7A323601M and K7A321801M are fabricated using SAM-  
SUNG¢s high performance CMOS technology and is available  
in a 100pin TQFP package. Multiple power and ground pins are  
utilized to minimize ground bounce.  
tCYC 4.0 4.4 5.0 6.0 6.7 7.2 ns  
tCD  
2.6 2.8 3.1 3.5 3.8 4.0 ns  
2.6 2.8 3.1 3.5 3.8 4.0 ns  
LOGIC BLOCK DIAGRAM  
CLK  
LBO  
1Mx36 , 2Mx18  
BURST CONTROL  
LOGIC  
BURST  
MEMORY  
ADDRESS  
COUNTER  
ADV  
ADSC  
A¢0~A¢1  
ARRAY  
A0~A1  
A2~A19  
or A2~A20  
A0~A19  
ADDRESS  
REGISTER  
or A0~A20  
ADSP  
DATA-IN  
REGISTER  
CS1  
CS2  
CS2  
GW  
OUTPUT  
REGISTER  
CONTROL  
LOGIC  
BW  
BUFFER  
WEx  
(x=a,b,c,d or a,b)  
OE  
ZZ  
DQa0 ~ DQd7 or DQa0 ~ DQb7  
DQPa ~ DQPd  
DQPa,DQPb  
- 3 -  
Oct. 2003  
Rev 1.1  
K7A323601M  
K7A321801M  
1Mx36 & 2Mx18 Synchronous SRAM  
PIN CONFIGURATION(TOP VIEW)  
80  
79  
78  
77  
76  
75  
74  
73  
72  
71  
70  
69  
68  
67  
66  
65  
64  
63  
62  
61  
60  
59  
58  
57  
56  
55  
54  
53  
52  
51  
DQPb  
DQb7  
DQb6  
VDDQ  
VSSQ  
DQb5  
DQb4  
DQb3  
DQb2  
VSSQ  
VDDQ  
DQb1  
DQb0  
VSS  
DQPc  
DQc0  
DQc1  
VDDQ  
VSSQ  
DQc2  
DQc3  
DQc4  
DQc5  
VSSQ  
VDDQ  
DQc6  
DQc7  
N.C.  
1
2
3
4
5
6
7
8
9
10  
11  
12  
13  
14  
15  
16  
17  
18  
19  
20  
21  
22  
23  
24  
25  
26  
27  
28  
29  
30  
100 Pin TQFP  
(20mm x 14mm)  
N.C.  
VDD  
N.C.  
VSS  
VDD  
ZZ  
DQd0  
DQd1  
VDDQ  
VSSQ  
DQd2  
DQd3  
DQd4  
DQd5  
VSSQ  
VDDQ  
DQd6  
DQd7  
DQPd  
DQa7  
DQa6  
VDDQ  
VSSQ  
DQa5  
DQa4  
DQa3  
DQa2  
VSSQ  
VDDQ  
DQa1  
DQa0  
DQPa  
K7A323601M(1Mx36)  
PIN NAME  
SYMBOL  
PIN NAME  
TQFP PIN NO.  
SYMBOL  
PIN NAME  
TQFP PIN NO.  
A0 - A19  
Address Inputs  
32,33,34,35,36,37,39 VDD  
42,43,44,45,46,47,48 VSS  
49,50,81,82,99,100  
Power Supply(+3.3V) 15,41,65,91  
Ground  
17,40,67,90  
14,16,38,66  
ADV  
ADSP  
ADSC  
CLK  
Burst Address Advance  
Address Status Processor 84  
Address Status Controller 85  
83  
No Connect  
N.C.  
Data Inputs/Outputs  
52,53,56,57,58,59,62,63  
68,69,72,73,74,75,78,79  
2,3,6,7,8,9,12,13  
DQa0~a7  
DQb0~b7  
DQc0~c7  
DQd0~d7  
DQPa~Pd  
Clock  
89  
98  
CS 1  
Chip Select  
Chip Select  
Chip Select  
CS 2  
CS 2  
97  
92  
18,19,22,23,24,25,28,29  
51,80,1,30  
WEx(x=a,b,c,d) Byte Write Inputs  
93,94,95,96  
OE  
Output Enable  
86  
88  
87  
64  
31  
Output Power Supply 4,11,20,27,54,61,70,77  
(3.3V or 2.5V)  
VDDQ  
VSSQ  
GW  
BW  
ZZ  
Global Write Enable  
Byte Write Enable  
Power Down Input  
Burst Mode Control  
Output Ground  
5,10,21,26,55,60,71,76  
LBO  
Note : 1. A0 and A1 are the two least significant bits(LSB) of the address field and set the internal burst counter if burst is desired.  
- 4 -  
Oct. 2003  
Rev 1.1  
K7A323601M  
K7A321801M  
1Mx36 & 2Mx18 Synchronous SRAM  
PIN CONFIGURATION(TOP VIEW)  
A10  
80  
79  
78  
77  
76  
75  
74  
73  
72  
71  
70  
69  
68  
67  
66  
65  
64  
63  
62  
61  
60  
59  
58  
57  
56  
55  
54  
53  
52  
51  
N.C.  
N.C.  
N.C.  
VDDQ  
VSSQ  
N.C.  
N.C.  
DQb0  
DQb1  
VSSQ  
VDDQ  
DQb2  
DQb3  
N.C.  
VDD  
1
2
3
4
5
6
7
N.C.  
N.C.  
VDDQ  
VSSQ  
N.C.  
DQPa  
DQa7  
DQa6  
VSSQ  
VDDQ  
DQa5  
DQa4  
VSS  
8
9
10  
11  
12  
13  
14  
15  
16  
17  
18  
19  
20  
21  
22  
23  
24  
25  
26  
27  
28  
29  
30  
100 Pin TQFP  
(20mm x 14mm)  
N.C.  
VDD  
ZZ  
N.C.  
VSS  
DQb4  
DQb5  
VDDQ  
VSSQ  
DQb6  
DQb7  
DQPb  
N.C.  
VSSQ  
VDDQ  
N.C.  
N.C.  
N.C.  
DQa3  
DQa2  
VDDQ  
VSSQ  
DQa1  
DQa0  
N.C.  
N.C.  
VSSQ  
VDDQ  
N.C.  
N.C.  
N.C.  
K7A321801M(2Mx18)  
PIN NAME  
SYMBOL  
PIN NAME  
TQFP PIN NO.  
SYMBOL  
PIN NAME  
TQFP PIN NO.  
A0 - A20  
Address Inputs  
32,33,34,35,36,37,39  
VDD  
Power Supply(+3.3V)  
Ground  
15,41,65,91  
17,40,67,90  
42,43,44,45,46,47,48, VSS  
49,50 80,81,82,99,100  
ADV  
Burst Address Advance  
83  
No Connect  
1,2,3,6,7,14,16,25,28,29  
30,38,51,52,53,56,57  
66,75,78,79,95,96  
N.C.  
ADSP  
ADSC  
Address Status Processor 84  
Address Status Controller 85  
CLK  
CS1  
CS2  
CS2  
Clock  
89  
Chip Select  
Chip Select  
Chip Select  
98  
97  
92  
Data Inputs/Outputs  
58,59,62,63,68,69,72,73  
8,9,12,13,18,19,22,23  
74,24  
DQa0 ~ a7  
DQb0 ~ b7  
DQPa, Pb  
WEx(x=a,b) Byte Write Inputs  
93,94  
86  
OE  
Output Enable  
Output Power Supply  
(3.3V or 2.5V)  
4,11,20,27,54,61,70,77  
5,10,21,26,55,60,71,76  
VDDQ  
VSSQ  
GW  
BW  
ZZ  
Global Write Enable  
Byte Write Enable  
Power Down Input  
Burst Mode Control  
88  
87  
64  
31  
Output Ground  
LBO  
Note : 1. A0 and A1 are the two least significant bits(LSB) of the address field and set the internal burst counter if burst is desired.  
- 5 -  
Oct. 2003  
Rev 1.1  
K7A323601M  
K7A321801M  
1Mx36 & 2Mx18 Synchronous SRAM  
FUNCTION DESCRIPTION  
The K7A323601M and K7A321801M are synchronous SRAM designed to support the burst address accessing sequence of the  
Power PC based microprocessor. All inputs (with the exception of OE, LBO and ZZ) are sampled on rising clock edges. The start and  
duration of the burst access is controlled by ADSC, ADSP and ADV and chip select pins.  
The accesses are enabled with the chip select signals and output enabled signals. Wait states are inserted into the access with  
ADV.  
When ZZ is pulled high, the SRAM will enter a Power Down State. At this time, internal state of the SRAM is preserved. When ZZ  
returns to low, the SRAM normally operates after 2cycles of wake up time. ZZ pin is pulled down internally.  
Read cycles are initiated with ADSP(regardless of WEx and ADSC)using the new external address clocked into the on-chip address  
register whenever ADSP is sampled low, the chip selects are sampled active, and the output buffer is enabled with OE. In read oper-  
ation the data of cell array accessed by the current address, registered in the Data-out registers by the positive edge of CLK, are car-  
ried to the Data-out buffer by the next positive edge of CLK. The data, registered in the Data-out buffer, are projected to the output  
pins. ADV is ignored on the clock edge that samples ADSP asserted, but is sampled on the subsequent clock edges. The address  
increases internally for the next access of the burst when WEx are sampled High and ADV is sampled low. And ADSP is blocked to  
control signals by disabling CS 1.  
All byte write is done by GW(regaedless of BW and WEx.), and each byte write is performed by the combination of BW and WEx  
when GW is high.  
Write cycles are performed by disabling the output buffers with OE and asserting WEx. WEx are ignored on the clock edge that sam-  
ples ADSP low, but are sampled on the subsequent clock edges. The output buffers are disabled when WEx are sampled  
Low(regaedless of OE). Data is clocked into the data input register when WEx sampled Low. The address increases internally to the  
next address of burst, if both WEx and ADV are sampled Low. Individual byte write cycles are performed by any one or more byte  
write enable signals(WEa, WEb, WEc or WEd) sampled low. The WEa control DQa0 ~ DQa7 and DQPa, WEb controls DQb0 ~ DQb7  
and DQPb, WEc controls DQc0 ~ DQc7 and DQPc, and WEd control DQd0 ~ DQd7 and DQPd. Read or write cycle may also be initi-  
ated with ADSC, instead of ADSP. The differences between cycles initiated with ADSC and ADSP as are follows;  
ADSP must be sampled high when ADSC is sampled low to initiate a cycle with ADSC.  
WEx are sampled on the same clock edge that sampled ADSC low(and ADSP high).  
Addresses are generated for the burst access as shown below, The starting point of the burst sequence is provided by the external  
address. The burst address counter wraps around to its initial state upon completion. The burst sequence is determined by the state  
of the LBO pin. When this pin is Low, linear burst sequence is selected. When this pin is High, Interleaved burst sequence is  
selected.  
BURST SEQUENCE TABLE  
(Interleaved Burst)  
Case 4  
Case 1  
Case 2  
Case 3  
LBO PIN  
HIGH  
First Address  
A1  
A0  
A1  
A0  
A1  
A0  
A1  
A0  
0
0
1
1
0
1
0
1
0
0
1
1
1
0
1
0
1
1
0
0
0
1
0
1
1
1
0
0
1
0
1
0
Fourth Address  
BQ TABLE  
(Linear Burst)  
Case 1  
Case 2  
Case 3  
Case 4  
A0  
LBO PIN  
LOW  
First Address  
A1  
A0  
A1  
A0  
A1  
A0  
A1  
0
0
1
1
0
1
0
1
0
1
1
0
1
0
1
0
1
1
0
0
0
1
0
1
1
0
0
1
1
0
1
0
Fourth Address  
Note : 1. LBO pin must be tied to High or Low, and Floating State must not be allowed.  
ASYNCHRONOUS TRUTH TABLE  
OPERATION  
ZZ  
H
L
OE  
X
I/O Status  
High-Z  
Notes  
1. X means "Don¢t Care".  
2. ZZ pin is pulled down internally  
3. For write cycles that following read cycles, the output buffers must be  
disabled with OE, otherwise data bus contention will occur.  
4. Sleep Mode means power down state of which stand-by current does  
not depend on cycle time.  
Sleep Mode  
L
DQ  
Read  
L
H
High-Z  
Write  
L
X
Din, High-Z  
High-Z  
5. Deselected means power down state of which stand-by current  
depends on cycle time.  
Deselected  
L
X
- 6 -  
Oct. 2003  
Rev 1.1  
K7A323601M  
K7A321801M  
1Mx36 & 2Mx18 Synchronous SRAM  
TRUTH TABLES  
SYNCHRONOUS TRUTH TABLE  
CS1  
H
L
CS2  
X
L
CS 2 ADSP ADSC ADV WRITE CLK  
ADDRESS ACCESSED  
N/A  
Operation  
X
X
H
X
H
L
X
L
L
X
X
X
X
X
X
X
X
L
X
X
X
X
X
X
L
Not Selected  
X
X
L
N/A  
Not Selected  
L
X
L
L
N/A  
Not Selected  
L
X
X
L
N/A  
Not Selected  
L
X
H
H
H
X
X
X
X
X
X
X
X
L
N/A  
Not Selected  
L
X
L
External Address  
External Address  
External Address  
Next Address  
Next Address  
Next Address  
Next Address  
Current Address  
Current Address  
Current Address  
Current Address  
Begin Burst Read Cycle  
Begin Burst Write Cycle  
Begin Burst Read Cycle  
Continue Burst Read Cycle  
Continue Burst Read Cycle  
Continue Burst Write Cycle  
Continue Burst Write Cycle  
Suspend Burst Read Cycle  
Suspend Burst Read Cycle  
Suspend Burst Write Cycle  
Suspend Burst Write Cycle  
L
L
H
H
H
X
H
X
H
X
H
X
L
L
L
H
H
H
L
X
H
X
H
X
H
X
H
X
X
X
X
X
X
X
X
H
H
H
H
H
H
H
H
L
L
L
L
H
H
H
H
H
H
L
L
Notes : 1. X means "Don¢t Care".  
2. The rising edge of clock is symbolized by .  
3. WRITE = L means Write operation in WRITE TRUTH TABLE.  
WRITE = H means Read operation in WRITE TRUTH TABLE.  
4. Operation finally depends on status of asynchronous input pins(ZZ and OE).  
WRITE TRUTH TABLE(x36)  
GW  
H
BW  
H
L
WEa  
X
WEb  
X
WEc  
X
WEd  
OPERATION  
READ  
X
H
H
H
L
H
H
H
H
READ  
H
L
L
H
H
WRITE BYTE a  
WRITE BYTE b  
WRITE BYTE c and d  
WRITE ALL BYTEs  
WRITE ALL BYTEs  
H
L
H
L
H
H
L
H
H
L
H
L
L
L
L
L
L
X
X
X
X
X
Notes : 1. X means "Don¢t Care".  
2. All inputs in this table must meet setup and hold time around the rising edge of CLK().  
WRITE TRUTH TABLE(x18)  
GW  
H
BW  
H
L
WEa  
X
WEb  
OPERATION  
X
H
H
L
READ  
H
H
READ  
H
L
L
WRITE BYTE a  
WRITE BYTE b  
WRITE ALL BYTEs  
WRITE ALL BYTEs  
H
L
H
H
L
L
L
L
X
X
X
Notes : 1. X means "Don¢t Care".  
2. All inputs in this table must meet setup and hold time around the rising edge of CLK().  
- 7 -  
Oct. 2003  
Rev 1.1  
K7A323601M  
K7A321801M  
1Mx36 & 2Mx18 Synchronous SRAM  
ABSOLUTE MAXIMUM RATINGS*  
PARAMETER  
Voltage on VDD Supply Relative to VSS  
Voltage on VDDQ Supply Relative to VSS  
Voltage on Input Pin Relative to VSS  
Voltage on I/O Pin Relative to VSS  
Power Dissipation  
SYMBOL  
VDD  
RATING  
-0.3 to 4.6  
VDD  
UNIT  
V
VDDQ  
VIN  
V
-0.3 to VDD+0.3  
-0.3 to VDDQ+0.3  
1.6  
V
VIO  
V
PD  
W
Storage Temperature  
TSTG  
TOPR  
TBIAS  
-65 to 150  
0 to 70  
°C  
°C  
°C  
Operating Temperature  
Storage Temperature Range Under Bias  
-10 to 85  
*Note : Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress rating only  
and functional operation of the device at these or any other conditions above those indicated in the operating sections of this specification is not  
implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.  
OPERATING CONDITIONS at 3.3V I/O(0°C £ TA £ 70°C)  
PARAMETER  
Supply Voltage  
Ground  
SYMBOL  
VDD  
MIN  
3.135  
3.135  
0
Typ.  
3.3  
3.3  
0
Max  
3.465  
3.465  
0
Unit  
V
VDDQ  
V
VSS  
V
OPERATING CONDITIONS at 2.5V I/O(0°C £ TA £ 70°C)  
PARAMETER  
Supply Voltage  
Ground  
SYMBOL  
VDD  
MIN  
3.135  
2.375  
0
Typ.  
3.3  
2.5  
0
Max  
3.465  
2.9  
Unit  
V
VDDQ  
V
VSS  
0
V
CAPACITANCE*(TA=25°C, f=1MHz)  
PARAMETER  
SYMBOL  
TEST CONDITION  
VIN=0V  
Min  
Max  
Unit  
pF  
Input Capacitance  
CIN  
-
-
5
7
Output Capacitance  
COUT  
VOUT=0V  
pF  
*Note : Sampled not 100% tested.  
- 8 -  
Oct. 2003  
Rev 1.1  
K7A323601M  
K7A321801M  
1Mx36 & 2Mx18 Synchronous SRAM  
DC ELECTRICAL CHARACTERISTICS(VDD=3.3V+0.165V/-0.165V, TA=0°C to +70°C)  
PARAMETER  
SYMBOL  
TEST CONDITIONS  
VDD = Max ; VIN=VSS to VDD  
MIN  
MAX  
+2  
UNIT NOTES  
Input Leakage Current(except ZZ)  
Output Leakage Current  
IIL  
-2  
-2  
-
mA  
mA  
IOL  
Output Disabled, VOUT=VSS to VDDQ  
+2  
-25  
-22  
-20  
-16  
-15  
-14  
-25  
-22  
-20  
-16  
-15  
-14  
460  
440  
410  
360  
330  
310  
170  
160  
150  
140  
140  
140  
-
-
Device Selected, IOUT=0mA,  
ZZ£VIL , Cycle Time ³ tCYC Min  
Operating Current  
ICC  
mA  
1,2  
-
-
-
-
-
Device deselected, IOUT=0mA,  
ZZ£VIL, f=Max,  
-
ISB  
mA  
-
All Inputs£0.2V or ³ V DD-0.2V  
-
Standby Current  
-
Device deselected, IOUT=0mA, ZZ£0.2V,  
f = 0, All Inputs=fixed (VDD-0.2V or 0.2V)  
ISB1  
ISB2  
-
-
110  
100  
mA  
mA  
Device deselected, IOUT=0mA, ZZ³ VDD-  
0.2V, f=Max, All Inputs£VILor ³ VIH  
Output Low Voltage(3.3V I/O)  
Output High Voltage(3.3V I/O)  
Output Low Voltage(2.5V I/O)  
Output High Voltage(2.5V I/O)  
Input Low Voltage(3.3V I/O)  
nput High Voltage(3.3V I/O)  
Input Low Voltage(2.5V I/O)  
Input High Voltage(2.5V I/O)  
VOL  
VOH  
VOL  
VOH  
VIL  
IOL=8.0mA  
IOH=-4.0mA  
IOL=1.0mA  
IOH=-1.0mA  
-
0.4  
V
V
V
V
V
V
V
V
2.4  
-
-
0.4  
-
2.0  
-0.3*  
2.0  
-0.3*  
1.7  
0.8  
VDD+0.3**  
0.7  
3
3
VIH  
VIL  
VIH  
VDD+0.3**  
Notes : 1. Reference AC Operating Conditions and Characteristics for input and timing.  
2. Data states are all zero.  
3. In Case of I/O Pins, the Max. VIH=VDDQ+0.3V.  
VIH  
VSS  
VSS-1.0V  
20% tCYC (MIN)  
TEST CONDITIONS  
(VDD=3.3V+0.165V/-0.165V,VDDQ=3.3V+0.165/-0.165V or VDD=3.3V+0.165V/-0.165V,VDDQ=2.5V+0.4V/-0.125V, TA=0to70°C)  
Parameter  
Value  
0 to 3.0V  
0 to 2.5V  
1.0V/ns  
1.0V/ns  
1.5V  
Input Pulse Level(for 3.3V I/O)  
Input Pulse Level(for 2.5V I/O)  
Input Rise and Fall Time(Measured at 20% to 80% for 3.3V I/O)  
Input Rise and Fall Time(Measured at 20% to 80% for 2.5V I/O)  
Input and Output Timing Reference Levels for 3.3V I/O  
Input and Output Timing Reference Levels for 2.5V I/O  
Output Load  
VDDQ/2  
See Fig. 1  
- 9 -  
Oct. 2003  
Rev 1.1  
K7A323601M  
K7A321801M  
1Mx36 & 2Mx18 Synchronous SRAM  
Output Load(A)  
Output Load(B),  
(for tLZC, tLZOE, tHZOE & tHZC)  
+3.3V for 3.3V I/O  
/+2.5V for 2.5V I/O  
RL=50W  
Dout  
VL=1.5V for 3.3V I/O  
VDDQ/2 for 2.5V I/O  
319W / 1667W  
30pF*  
Dout  
Zo=50W  
353W / 1538W  
5pF*  
* Including Scope and Jig Capacitance  
Fig. 1  
AC TIMING CHARACTERISTICS(VDD=3.3V+0.165V/-0.165V, TA=0°C to +70°C)  
-25  
-22  
-20  
-16  
-15  
-14  
Parameter  
Symbol  
Unit  
Min MAX Min Max MIN MAX Min Max Min Max Min Max  
Cycle Time  
tCYC  
tCD  
4.0  
-
-
2.6  
2.6  
-
4.4  
-
2.8  
2.8  
-
5.0  
-
3.1  
3.1  
-
6.0  
-
3.5  
3.5  
-
6.7  
-
3.8  
3.8  
-
7.2  
-
4.0  
4.0  
-
ns  
ns  
Clock Access Time  
-
-
-
-
-
-
-
-
-
-
Output Enable to Data Valid  
tOE  
-
ns  
Clock High to Output Low-Z  
tLZC  
tOH  
0
0
0
0
0
0
ns  
Output Hold from Clock High  
Output Enable Low to Output Low-Z  
Output Enable High to Output High-Z  
Clock High to Output High-Z  
Clock High Pulse Width  
1.5  
0
-
1.5  
0
-
1.5  
0
-
1.5  
0
-
1.5  
0
-
1.5  
0
-
ns  
tLZOE  
tHZOE  
tHZC  
tCH  
-
-
-
-
-
-
ns  
-
2.6  
-
2.8  
-
3.0  
-
3.0  
-
3.0  
-
3.5  
ns  
1.5 2.6 1.5 2.8 1.5 3.0 1.5 3.0 1.5 3.0 1.5 3.5  
ns  
1.7  
1.7  
1.2  
1.2  
1.2  
1.2  
1.2  
1.2  
0.3  
0.3  
0.3  
0.3  
0.3  
0.3  
2
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
1.8  
1.8  
1.4  
1.4  
1.4  
1.4  
1.4  
1.4  
0.4  
0.4  
0.4  
0.4  
0.4  
0.4  
2
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
2.0  
2.0  
1.4  
1.4  
1.4  
1.4  
1.4  
1.4  
0.4  
0.4  
0.4  
0.4  
0.4  
0.4  
2
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
2.1  
2.1  
1.5  
1.5  
1.5  
1.5  
1.5  
1.5  
0.5  
0.5  
0.5  
0.5  
0.5  
0.5  
2
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
2.3  
2.3  
1.5  
1.5  
1.5  
1.5  
1.5  
1.5  
0.5  
0.5  
0.5  
0.5  
0.5  
0.5  
2
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
2.5  
2.5  
1.5  
1.5  
1.5  
1.5  
1.5  
1.5  
0.5  
0.5  
0.5  
0.5  
0.5  
0.5  
2
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
ns  
Clock Low Pulse Width  
tCL  
ns  
Address Setup to Clock High  
Address Status Setup to Clock High  
Data Setup to Clock High  
tAS  
ns  
tSS  
ns  
tDS  
ns  
Write Setup to Clock High (GW, BW, WEX)  
Address Advance Setup to Clock High  
Chip Select Setup to Clock High  
Address Hold from Clock High  
Address Status Hold from Clock High  
Data Hold from Clock High  
tWS  
ns  
tADVS  
tCSS  
tAH  
ns  
ns  
ns  
tSH  
ns  
tDH  
ns  
Write Hold from Clock High (GW, BW, WEX)  
Address Advance Hold from Clock High  
Chip Select Hold from Clock High  
ZZ High to Power Down  
tWH  
tADVH  
tCSH  
tPDS  
tPUS  
ns  
ns  
ns  
cycle  
cycle  
ZZ Low to Power Up  
2
2
2
2
2
2
Notes : 1. All address inputs must meet the specified setup and hold times for all rising clock edges whenever ADSC and/or ADSP is sampled low and  
CS is sampled low. All other synchronous inputs must meet the specified setup and hold times whenever this device is chip selected.  
2. Both chip selects must be active whenever ADSC or ADSP is sampled low in order for the this device to remain enabled.  
3. ADSC or ADSP must not be asserted for at least 2 Clock after leaving ZZ state.  
- 10 -  
Oct. 2003  
Rev 1.1  
K7A323601M  
K7A321801M  
1Mx36 & 2Mx18 Synchronous SRAM  
- 11 -  
Oct. 2003  
Rev 1.1  
K7A323601M  
K7A321801M  
1Mx36 & 2Mx18 Synchronous SRAM  
- 12 -  
Oct. 2003  
Rev 1.1  
K7A323601M  
K7A321801M  
1Mx36 & 2Mx18 Synchronous SRAM  
- 13 -  
Oct. 2003  
Rev 1.1  
K7A323601M  
K7A321801M  
1Mx36 & 2Mx18 Synchronous SRAM  
- 14 -  
Oct. 2003  
Rev 1.1  
K7A323601M  
K7A321801M  
1Mx36 & 2Mx18 Synchronous SRAM  
- 15 -  
Oct. 2003  
Rev 1.1  
K7A323601M  
K7A321801M  
1Mx36 & 2Mx18 Synchronous SRAM  
APPLICATION INFORMATION  
DEPTH EXPANSION  
The Samsung 1Mx36 Synchronous Pipelined Burst SRAM has two additional chip selects for simple depth expansion.  
This permits easy secondary cache upgrades from 1M depth to 2M depth without extra logic.  
I/O[0:71]  
Data  
Address  
A[0:20]  
A[20]  
A[0:19]  
A[20]  
A[0:19]  
Address Data  
Address Data  
CLK  
CS2  
CS2  
CLK  
ADSC  
WEx  
OE  
CS2  
CS2  
CLK  
ADSC  
WEx  
OE  
1Mx36  
SPB  
SRAM  
1Mx36  
SPB  
SRAM  
Microprocessor  
Address  
CLK  
(Bank 0)  
(Bank 1)  
Cache  
Controller  
CS1  
CS1  
ADV ADSP  
ADV ADSP  
ADS  
INTERLEAVE READ TIMING (Refer to non-interleave write timing for interleave write timing)  
(ADSP CONTROLLED , ADSC=HIGH)  
Clock  
tSS  
tSH  
ADSP  
tAS  
tAH  
ADDRESS  
[0:n*]  
A1  
A2  
tWS  
tWH  
WRITE  
tCSS  
tCSH  
CS1  
Bank 0 is selected by CS2, and Bank 1 deselected by CS2  
An+1*  
ADV  
OE  
Bank 0 is deselected by CS2, and Bank 1 selected by CS2  
tADVS  
tADVH  
tOE  
tLZOE  
tHZC  
Data Out  
(Bank 0)  
Q1-1  
Q1-2  
Q1-3  
Q1-4  
tCD  
tLZC  
Data Out  
(Bank 1)  
Q2-1  
Q2-2  
Q2-3  
Q2-4  
*Notes  
:
n = 14 32K depth ,  
15 64K depth  
16 128K depth , 17 256K depth  
18 512K depth , 19 1M depth  
Don¢t Care  
Undefined  
- 16 -  
Oct. 2003  
Rev 1.1  
K7A323601M  
K7A321801M  
1Mx36 & 2Mx18 Synchronous SRAM  
APPLICATION INFORMATION  
DEPTH EXPANSION  
The Samsung 2Mx18 Synchronous Pipelined Burst SRAM has two additional chip selects for simple depth expansion.  
This permits easy secondary cache upgrades from 2M depth to 4M depth without extra logic.  
I/O[0:71]  
Data  
Address  
A[21]  
A[21]  
A[0:21]  
A[0:20]  
A[0:20]  
Address Data  
CS  
CS  
Address Data  
CS  
CS  
CLK  
2
2
2
2
Microprocessor  
CLK  
ADSC  
WEx  
OE  
2Mx18  
SPB  
SRAM  
CLK  
ADSC  
WEx  
OE  
2Mx18  
SPB  
SRAM  
Address  
CLK  
(Bank 0)  
(Bank 1)  
Cache  
Controller  
CS1  
CS1  
ADV ADSP  
ADV ADSP  
ADS  
INTERLEAVE READ TIMING (Refer to non-interleave write timing for interleave write timing)  
(ADSP CONTROLLED , ADSC=HIGH)  
Clock  
tSS  
tSH  
ADSP  
tAS  
tAH  
ADDRESS  
[0:n*]  
A1  
A2  
tWS  
tWH  
WRITE  
tCSS  
tCSH  
CS1  
Bank 0 is selected by CS2, and Bank 1 deselected by CS2  
An+1*  
ADV  
OE  
Bank 0 is deselected by CS2, and Bank 1 selected by CS2  
tADVS  
tADVH  
tOE  
tLZOE  
tHZC  
Data Out  
(Bank 0)  
Q1-1  
Q1-2  
Q1-3  
Q1-4  
tCD  
tLZC  
Data Out  
(Bank 1)  
Q2-1  
Q2-2  
Q2-3  
Q2-4  
*Notes : n = 14 32K depth ,  
15 64K depth  
16 128K depth , 17 256K depth  
18 512K depth , 19 1M depth  
20 2M depth  
Don¢t Care  
Undefined  
- 17 -  
Oct. 2003  
Rev 1.1  
K7A323601M  
K7A321801M  
1Mx36 & 2Mx18 Synchronous SRAM  
PACKAGE DIMENSIONS  
Units ; millimeters/Inches  
100-TQFP-1420A  
22.00 ±0.30  
20.00 ±0.20  
0~8°  
+ 0.10  
- 0.05  
0.127  
16.00 ±0.30  
14.00 ±0.20  
0.10 MAX  
(0.83)  
0.50 ±0.10  
#1  
0.65  
0.30 ±0.10  
0.10MAX  
(0.58)  
1.40 ±0.10  
1.60MAX  
0.05 MIN  
0.50 ±0.10  
- 18 -  
Oct. 2003  
Rev 1.1  

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