KM62U256CLGI-10L [SAMSUNG]

Standard SRAM, 32KX8, 100ns, CMOS, PDSO28, 0.450 INCH, SOP-28;
KM62U256CLGI-10L
型号: KM62U256CLGI-10L
厂家: SAMSUNG    SAMSUNG
描述:

Standard SRAM, 32KX8, 100ns, CMOS, PDSO28, 0.450 INCH, SOP-28

静态存储器 光电二极管
文件: 总9页 (文件大小:148K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
KM62V256C, KM62U256C Family  
CMOS SRAM  
Document Title  
32Kx8 bit Low Power and Low Voltage CMOS Static RAM  
Revision History  
Revision No. History  
Draft Data  
Remark  
0.0  
0.1  
1.0  
2.0  
3.0  
Design target  
Initial draft  
Finalize  
February 12, 1993  
Advance  
November 2, 1993  
Preliminary  
September 24, 1994 Final  
Revised  
August 12, 1995  
April 1, 1997  
Final  
Final  
Revised  
- One datasheet for commercial, extended, industrial product.  
- Increased KM62V256C Family¢s ICC2 30 to 35mA.  
- Increased tDW 50 to 60ns for KM62U256C Family.  
- Remove SOP package from KM62V256C Family.  
4.0  
Revised  
February 12, 1998  
Final  
- Change datasheets format.  
- Improved power dissipation : 0.7W® 1W  
The attached datasheets are provided by SAMSUNG Electronics. SAMSUNG Electronics CO., LTD. reserve the right to change the specifications and  
products. SAMSUNG Electronics will answer to your questions about device. If you have any questions, please contact the SAMSUNG branch offices.  
1
Revision 4.0  
February 1998  
KM62V256C, KM62U256C Family  
CMOS SRAM  
32Kx8 bit Low Power and Low Voltage CMOS Static RAM  
FEATURES  
GENERAL DESCRIPTION  
· Process Technology : Poly Load  
· Organization : 32Kx8  
The KM62V256C and KM62U256C families are fabricated  
by SAMSUNG¢s advanced CMOS process technology. The  
families support various operating temperature ranges and  
has various package types for user flexibility of system  
design. The families also support low data retention voltage  
for battery back-up operation with low data retention current.  
· Power Supply Voltage  
KM62V256C family : 2.7~3.3V  
KM62U256C family : 3.0~3.6V  
· Low Data Retention Voltage : 2V(Min)  
· Three state output and TTL Compatible  
· Package Type : 28-SOP-450, 28-TSOP1-0813.4F/R  
PRODUCT FAMILY  
Power Dissipation  
Operating  
Temperature  
Product Family  
VCC Range  
Speed(ns)  
PKG Type  
Standby  
Operating  
(ICC2, Max)  
(ISB1, Max)  
701)/100  
851)/100  
701)/100  
851)/100  
701)/100  
851)/100  
KM62V256CL-L  
KM62U256CL-L  
KM62V256CLE-L  
KM62U256CLE-L  
KM62V256CL-L  
KM62U256CLI-L  
3.0 ~ 3.6V  
2.7 ~ 3.3V  
3.0 ~ 3.6V  
2.7 ~ 3.3V  
3.0 ~ 3.6V  
2.7 ~ 3.3V  
10mA  
10mA  
20mA  
15mA  
20mA  
15mA  
Commercial(0~70°C)  
Extended(-25~85°C)  
Industrial(-40~85°C)  
28-SOP2)  
28-TSOP1-F/R  
35mA  
1. The parameter is measured with 30pF test load.  
2. The device with 100ns SOP package in 3.0~3.6V VCC range which is not produced.  
PIN DESCRIPTION  
FUNCTIONAL BLOCK DIAGRAM  
1
2
3
4
5
6
7
8
28  
27  
26  
25  
24  
23  
22  
21  
20  
19  
18  
17  
16  
15  
A10  
CS  
OE  
A11  
A9  
A8  
A13  
WE  
VCC  
A14  
A12  
A7  
Clk gen.  
Precharge circuit.  
I/O8  
I/O7  
I/O6  
I/O5  
I/O4  
VSS  
I/O3  
I/O2  
I/O1  
A0  
A14  
1
28  
27  
26  
25  
24  
23  
22  
21  
20  
19  
18  
17  
16  
15  
VCC  
WE  
A12  
A7  
2
28-TSOP  
A3  
A4  
3
A13  
A8  
Type1 - Forward  
9
4
A6  
A5  
A6  
A7  
10  
11  
12  
13  
14  
5
Memory array  
512 rows  
64´ 8 columns  
A5  
A9  
A6  
A5  
A4  
A3  
Row  
select  
6
A11  
OE  
A4  
A1  
A2  
7
A3  
A8  
28-SOP  
8
A10  
CS  
A2  
A12  
A13  
A14  
14  
13  
12  
11  
10  
9
8
7
6
5
A3  
A4  
A5  
A6  
A7  
A12  
A14  
VCC  
WE  
A13  
A8  
15  
16  
17  
18  
19  
20  
21  
22  
23  
24  
25  
26  
27  
28  
A2  
A1  
A0  
9
A1  
10  
11  
12  
13  
14  
I/O8  
I/O7  
I/O6  
I/O5  
I/O4  
A0  
I/O1  
I/O2  
I/O3  
VSS  
I/O4  
I/O5  
I/O6  
I/O7  
I/O8  
CS  
I/O1  
I/O2  
I/O3  
VSS  
28-TSOP  
I/O1  
I/O8  
Data  
cont  
I/O Circuit  
Type1 - Reverse  
Column select  
4
3
2
1
A9  
A11  
Data  
cont  
A10  
OE  
Pin Name  
CS  
Function  
A0 A1  
A2 A9 A10  
A11  
Chip Select Input  
Output Enable Input  
Write Enable Input  
Address Inputs  
Data Inputs/Outputs  
Power  
OE  
CS  
WE  
Control  
logic  
WE  
OE  
A0~A14  
I/O1~I/O8  
Vcc  
Vss  
Ground  
SAMSUNG ELECTRONICS CO., LTD. reserves the right to change products and specifications without notice.  
2
Revision 4.0  
February 1998  
KM62V256C, KM62U256C Family  
CMOS SRAM  
PRODUCT LIST  
Commercial Temperature Products  
Extended Temperature Products  
(-25~85°C)  
Industrial Temperature Products  
(-40~85°C)  
(0~70°C)  
Part Name  
Function  
Part Name  
Function  
Part Name  
Function  
KM62V256CLG-7L  
KM62V256CLG-10L  
KM62V256CLTG-7L  
28-SOP, 70ns, 3.3V  
28-SOP, 100ns, 3.3V  
28-TSOP F, 70ns, 3.3V  
KM62V256CLGE-7L  
KM62V256CLGE-10L  
KM62V256CLTGE-7L  
28-SOP, 70ns, 3.3V  
28-SOP, 100ns, 3.3V  
28-TSOP F, 70ns, 3.3V  
KM62V256CLGI-7L  
KM62V256CLGI-10L  
KM62V256CLTGI-7L  
28-SOP, 70ns, 3.3V  
28-SOP, 100ns, 3.3V  
28-TSOP F, 70ns, 3.3V  
KM62V256CLTG-10L 28-TSOP F, 100ns, 3.3V KM62V256CLTGE-10L 28-TSOP F, 100ns, 3.3V KM62V256CLTGI-10L 28-TSOP F, 100ns, 3.3V  
KM62V256CLRG-7L 28-TSOP R, 70ns, 3.3V KM62V256CLRGE-7L 28-TSOP R, 70ns, 3.3V KM62V256CLRGI-7L 28-TSOP R, 70ns, 3.3V  
KM62V256CLRG-10L 28-TSOP R, 100ns, 3.3V KM62V256CLRGE-10L 28-TSOP R, 100ns, 3.3V KM62V256CLRGI-10L 28-TSOP R, 100ns, 3.3V  
KM62U256CLG-8L  
KM62U256CLG-10L  
KM62U256CLTG-8L  
28-SOP, 85ns, 3.0V  
28-SOP, 100ns, 3.0V  
28-TSOP F, 85ns, 3.0V  
KM62U256CLGE-8L  
KM62U256CLGE-10L  
KM62U256CLTGE-8L  
28-SOP, 85ns, 3.0V  
28-SOP, 100ns, 3.0V  
28-TSOP F, 85ns, 3.0V  
KM62U256CLGI-8L  
KM62U256CLGI-10L  
KM62U256CLTGI-8L  
28-SOP, 85ns, 3.0V  
28-SOP, 100ns, 3.0V  
28-TSOP F, 85ns, 3.0V  
KM62U256CLTG-10L 28-TSOP F, 100ns, 3.0V KM62U256CLTGE-10L 28-TSOP F, 100ns, 3.0V KM62U256CLTGI-10L 28-TSOP F, 100ns, 3.0V  
KM62U256CLRG-8L 28-TSOP R, 85ns, 3.0V KM62U256CLRGE-8L 28-TSOP R, 85ns, 3.0V KM62U256CLRGI-8L 28-TSOP R, 85ns, 3.0V  
KM62U256CLRG-10L 28-TSOP R, 100ns, 3.0V KM62U256CLRGE-10L 28-TSOP R, 100ns, 3.0V KM62U256CLRGI-10L 28-TSOP R, 100ns, 3.0V  
FUNCTIONAL DESCRIPTION  
CS  
H
L
OE  
X1)  
H
WE  
X1)  
H
I/O  
High-Z  
High-Z  
Dout  
Mode  
Deselected  
Output Disabled  
Read  
Power  
Standby  
Active  
L
L
H
Active  
X1)  
L
L
Din  
Write  
Active  
1. X means don¢t care(Must be low or high state.)  
ABSOLUTE MAXIMUM RATINGS1)  
Item  
Symbol  
VIN,VOUT  
VCC  
Ratings  
Unit  
Remark  
Voltage on any pin relative to Vss  
Voltage on Vcc supply relative to Vss  
Power Dissipation  
-0.5 to VCC+0.5  
-0.3 to 4.6  
V
V
-
-
-
-
PD  
1.0  
W
°C  
°C  
°C  
°C  
-
Storage temperature  
TSTG  
-65 to 150  
0 to 70  
KM62V256CL-L, KM62U256CL-L  
KM62V256CLE-L, KM62U256CLE-L  
KM62V256CLI-L, KM62U256CLI-L  
-
Operating Temperature  
TA  
-25 to 85  
-40 to 85  
Soldering temperature and time  
TSOLDER  
260°C, 10sec (Lead Only)  
1. Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. Functional operation should be  
restricted to recommended operating condition. Exposure to absolute maximum rating conditions for extended periods may affect reliability.  
3
Revision 4.0  
February 1998  
KM62V256C, KM62U256C Family  
CMOS SRAM  
RECOMMENDED DC OPERATING CONDITIONS1)  
Item  
Symbol  
Product  
Min  
Typ  
Max  
Unit  
KM62V256C Family  
KM62U256C Family  
3.0  
2.7  
3.3  
3.0  
3.6  
3.3  
Supply voltage  
Vcc  
V
Ground  
Vss  
VIH  
VIL  
All  
0
0
-
0
V
V
V
Vcc+0.3V2)  
0.4  
Input high voltage  
Input low voltage  
KM62V256C, KM62U256C Family  
KM62V256C, KM62U256C Family  
2.2  
-0.33)  
-
Note:  
1. Commercial Product : TA=0 to 70°C, otherwise specified  
Extended Product : TA=-25 to 85°C, unless otherwise specified  
Industrial Product : TA=-40 to 85°C, otherwise specified  
2. Overshoot : VCC+3.0V in case of pulse width £ 30ns  
3. Undershoot : -3.0V in case of pulse width £ 30ns  
4. Overshoot and undershoot are sampled, not 100% tested.  
CAPACITANCE1) (f=1MHz, TA=25°C)  
Item  
Symbol  
CIN  
Test Condition  
VIN=0V  
Min  
Max  
6
Unit  
pF  
Input capacitance  
-
-
Input/Output capacitance  
CIO  
VIO=0V  
8
pF  
1. Capacitance is sampled, not 100% tested  
DC AND OPERATING CHARACTERISTICS  
Item  
Symbol  
ILI  
Test Conditions  
Min Typ Max Unit  
Input leakage current  
Output leakage current  
Operating power supply  
VIN=Vss to Vcc  
-1  
-1  
-
-
-
1
1
mA  
mA  
mA  
mA  
mA  
V
ILO  
CS=VIH or OE=VIH or WE=VIL, VIO=VSS to Vcc  
IIO=0mA, CS=VIL, VIN=VIH or VIL  
ICC  
1.0  
2.5  
20  
-
2.0  
5
ICC1  
ICC2  
VOL  
VOH  
ISB  
Cycle time=1ms, 100% duty, IIO=0mA, CS£0.2V, VIN£0.2V, VIN³ Vcc -0.2V  
Cycle time=Min,100% duty, IIO=0mA, CS=VIL, VIN=VIH or VIL  
IOL=2.1mA  
-
Average operating current  
-
35  
0.4  
-
Output low voltage  
Output high voltage  
Standby Current(TTL)  
-
IOH=-1.0mA  
2.2  
-
-
V
CS=VIH, Other inputs=VIH or VIL  
-
0.3  
mA  
KM62V256CL-L  
KM62V256CLE-L  
KM62V256CLI-L  
-
-
-
1.5  
1.5  
1.5  
10  
20  
20  
mA  
mA  
Standby Current(CMOS)  
ISB1  
CS³ Vcc-0.2V, Other inputs=0~Vcc  
KM62U256CL-L  
KM62U256CLE-L  
KM62U256CLI-L  
-
-
-
1.0  
1.0  
1.0  
10  
15  
15  
4
Revision 4.0  
February 1998  
KM62V256C, KM62U256C Family  
CMOS SRAM  
AC OPERATING CONDITIONS  
TEST CONDITIONS( Test Load and Input/Output Reference)  
Input pulse level : 0.4 to 2.2V  
Input rising and falling time : 5ns  
1)  
Input and output reference voltage :1.5V  
Output load(see right) : CL=100pF+1TTL  
CL  
1)CL=30pF+1TTL  
1. KM62V256CL-7L Family, KM62U256CL-8L Family  
1. Including scope and jig capacitance  
AC CHARACTERISTICS (KM62V256C Family : Vcc=3.0~3.6V, KM62U256C Family : Vcc=2.7~3.3V  
Commercial product :TA=0 to 70°C, Extended product :TA=-25 to 85°C, Industrial product : TA=-40 to 85°C)  
Speed Bins  
Parameter List  
Symbol  
Units  
70ns  
85ns  
100ns  
Min  
70  
-
Max  
Min  
85  
-
Max  
Min  
100  
-
Max  
Read cycle time  
tRC  
tAA  
-
70  
70  
35  
-
-
85  
85  
40  
-
-
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
Address access time  
100  
Chip select to output  
tCO  
tOE  
-
-
-
100  
Output enable to valid output  
Chip select to low-Z output  
Output enable to low-Z output  
Chip disable to high-Z output  
Output disable to high-Z output  
Output hold from address change  
Write cycle time  
-
-
-
50  
-
Read  
tLZ  
10  
5
10  
5
10  
5
tOLZ  
tHZ  
-
-
-
0
30  
30  
-
0
30  
30  
-
0
35  
35  
-
tOHZ  
tOH  
tWC  
tCW  
tAS  
0
0
0
5
10  
85  
70  
0
15  
100  
70  
0
70  
60  
0
-
-
-
Chip select to end of write  
Address set-up time  
-
-
-
-
-
-
Address valid to end of write  
Write pulse width  
tAW  
tWP  
tWR  
tWHZ  
tDW  
tDH  
60  
50  
0
-
70  
60  
0
-
70  
60  
0
-
-
-
-
Write  
Write recovery time  
-
-
-
Write to output high-Z  
0
25  
-
0
25  
-
0
30  
-
Data to write time overlap  
Data hold from write time  
End write to output low-Z  
50  
0
60  
0
60  
0
-
-
-
tOW  
5
-
10  
-
10  
-
DATA RETENTION CHARACTERISTICS  
Item  
Symbol  
Test Condition  
Min  
Typ  
Max  
Unit  
Vcc for data retention  
VDR  
CS³ Vcc-0.2V  
2.0  
-
3.6  
V
KM62V256CL-L  
KM62U256CL-L  
-
-
1
0.6  
8
8
Vcc=3.0V  
CS³ Vcc-0.2V  
KM62V256CLE-L  
KM62U256CLE-L  
-
-
1
0.6  
10  
10  
Data retention current  
IDR  
mA  
KM62V256CLI-L  
KM62U256CLI-L  
-
-
1
0.6  
10  
10  
Data retention set-up time  
Recovery time  
tSDR  
tRDR  
0
5
-
-
-
-
See data retention waveform  
ms  
5
Revision 4.0  
February 1998  
KM62V256C, KM62U256C Family  
CMOS SRAM  
TIMMING DIAGRAMS  
TIMING WAVEFORM OF READ CYCLE(1) (Address Controlled, CS=OE=VIL, WE=VIH)  
tRC  
Address  
tAA  
tOH  
Data Valid  
Data Out  
Previous Data Valid  
TIMING WAVEFORM OF READ CYCLE(2) (WE=VIH)  
tRC  
Address  
tOH  
tAA  
tCO  
CS  
tHZ  
tOE  
OE  
tOHZ  
tOLZ  
tLZ  
High-Z  
Data out  
Data Valid  
NOTES (READ CYCLE)  
1. tHZ and tOHZ are defined as the time at which the outputs achieve the open circuit conditions and are not referenced to output voltage  
levels.  
2. At any given temperature and voltage condition, tHZ(Max.) is less than tLZ(Min.) both for a given device and from device to device  
interconnection.  
6
Revision 4.0  
February 1998  
KM62V256C, KM62U256C Family  
CMOS SRAM  
TIMING WAVEFORM OF WRITE CYCLE(1) (WE Controlled)  
tWC  
Address  
tCW(2)  
tWR(4)  
CS  
tAW  
tWP(1)  
WE  
tAS(3)  
tDW  
tDH  
Data Valid  
Data in  
Data out  
tWHZ  
tOW  
Data Undefined  
TIMING WAVEFORM OF WRITE CYCLE(2) (CS Controlled)  
tWC  
Address  
tCW(2)  
tAS(3)  
tWR(4)  
CS  
tAW  
tWP(1)  
WE  
tDW  
tDH  
Data in  
Data Valid  
High-Z  
Data out  
High-Z  
NOTES (WRITE CYCLE)  
1. A write occurs during the overlap of a low CS and a low WE. A write begins at the latest transition among CS going Low and WE  
going low : A write end at the earliest transition among CS going high and WE going high, tWP is measured from the begining of write  
to the end of write.  
2. tCW is measured from the CS going low to end of write.  
3. tAS is measured from the address valid to the beginning of write.  
4. tWR is measured from the end of write to the address change. tWR applied in case a write ends as CS or WE going high.  
DATA RETENTION WAVE FORM  
CS controlled  
Data Retention Mode  
tSDR  
tRDR  
VCC  
3.0/2.7V1)  
2.2V  
VDR  
CS³ VCC - 0.2V  
CS  
GND  
1. 3.0V for KM62V256C Family, 2.7V for KM62U256C Family.  
7
Revision 4.0  
February 1998  
KM62V256C, KM62U256C Family  
PACKAGE DIMENSIONS  
CMOS SRAM  
Units : millimeter(inch)  
28 PIN PLASTIC SMALL OUTLINE PACKAGE(450mil)  
0~8°  
#28  
#15  
8.38±0.20  
0.330±0.008  
11.81±0.30  
0.465±0.012  
#1  
#14  
1.02±0.20  
0.040±0.008  
+0.10  
-0.05  
0.15  
2.59±0.20  
0.102±0.008  
18.69  
0.736  
+0.004  
-0.002  
MAX  
0.006  
3.00  
0.118  
MAX  
18.29±0.20  
0.720±0.008  
0.10 MAX  
0.004 MAX  
0.89  
0.035  
1.27  
0.050  
0.41±0.10  
0.016±0.004  
(
)
0.05  
0.002  
MIN  
8
Revision 4.0  
February 1998  
KM62V256C, KM62U256C Family  
CMOS SRAM  
Units : millimeter(inch)  
PACKAGE DIMENSIONS  
28 PIN THIN SMALL OUTLINE PACKAGE TYPE I (0813.4F)  
13.40±0.20  
0.528±0.008  
+0.10  
0.20  
-0.05  
+0.004  
0.008  
-0.002  
#1  
#28  
0.425  
0.017  
(
)
0.55  
0.0217  
#14  
#15  
1.00±0.10  
0.039±0.004  
0.05  
0.002  
MIN  
1.20  
MAX  
0.047  
28 PIN THIN SMALL OUTLINE PACKAGE TYPE I (0813.4R)  
13.40±0.20  
0.528±0.008  
+0.10  
-0.05  
0.20  
0.008+0.004  
-0.002  
#14  
#15  
0.425  
0.017  
(
)
0.55  
0.0217  
#1  
#28  
0.25  
0.010  
11.80±0.10  
0.465±0.004  
+0.10  
-0.05  
1.00±0.10  
0.039±0.004  
0.05  
0.002  
TYP  
0.15  
MIN  
0.006+0.004  
-0.002  
1.20  
MAX  
0.047  
0~8°  
0.50  
0.020  
0.45 ~0.75  
0.018 ~0.030  
(
)
9
Revision 4.0  
February 1998  

相关型号:

KM62U256CLGI-8L

Standard SRAM, 32KX8, 85ns, CMOS, PDSO28, 0.450 INCH, SOP-28
SAMSUNG

KM62U256CLGI-8L0

Standard SRAM, 32KX8, 85ns, CMOS, PDSO28, 0.450 INCH, PLASTIC, SOP-28
SAMSUNG

KM62U256CLRG-10L

32Kx8 bit Low Power AND Low Vcc CMOS Static RAM
SAMSUNG

KM62U256CLRG-8L

32Kx8 bit Low Power AND Low Vcc CMOS Static RAM
SAMSUNG

KM62U256CLRG-8L0

Standard SRAM, 32KX8, 85ns, CMOS, PDSO28, 8 X 13.40 MM, REVERSE, TSOP1-28
SAMSUNG

KM62U256CLTG-10L

32Kx8 bit Low Power AND Low Vcc CMOS Static RAM
SAMSUNG

KM62U256CLTG-8L

32Kx8 bit Low Power AND Low Vcc CMOS Static RAM
SAMSUNG

KM62U256CLTG-8L0

Standard SRAM, 32KX8, 85ns, CMOS, PDSO28, 8 X 13.40 MM, TSOP1-28
SAMSUNG

KM62U256CLTGE-8L

Standard SRAM, 32KX8, 85ns, CMOS, PDSO28, 8 X 13.40 MM, TSOP1-28
SAMSUNG

KM62U256CLTGI-8L

Standard SRAM, 32KX8, 85ns, CMOS, PDSO28, 8 X 13.40 MM, TSOP1-28
SAMSUNG

KM62U256D

32Kx8 bit Low Power and Low Voltage CMOS Static RAM
SAMSUNG

KM62U256DL-L

32Kx8 bit Low Power and Low Voltage CMOS Static RAM
SAMSUNG