KM684002CJI-2000 [SAMSUNG]

Standard SRAM, 512KX8, 20ns, CMOS, PDSO36, 0.400 INCH, PLASTIC, SOJ-36;
KM684002CJI-2000
型号: KM684002CJI-2000
厂家: SAMSUNG    SAMSUNG
描述:

Standard SRAM, 512KX8, 20ns, CMOS, PDSO36, 0.400 INCH, PLASTIC, SOJ-36

静态存储器 光电二极管 内存集成电路
文件: 总9页 (文件大小:183K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
PRELIMINARY  
CMOS SRAM  
KM684002C, KM684002CE, KM684002CI  
Document Title  
512Kx8 Bit High Speed Static RAM(5V Operating).  
Operated at Extended and Industrial Temperature Ranges.  
Revision History  
RevNo.  
Rev. 0.0  
Rev. 1.0  
History  
Draft Data  
Remark  
Initial release with Preliminary.  
Feb. 12. 1999  
Mar. 29. 1999  
Preliminary  
Preliminary  
1.1 Removed Low power Version.  
1.2 Removed Data Retention Characteristics.  
1.3 Changed ISB1 to 20mA  
Rev. 2.0  
2.1 Relax D.C parameters.  
Aug. 19. 1999  
Preliminary  
Item  
Previous  
Current  
195mA  
190mA  
185mA  
12ns  
15ns  
20ns  
170mA  
165mA  
160mA  
ICC  
2.2 Relax Absolute Maximum Rating.  
Item  
Previous  
Current  
Voltage on Any Pin Relative to Vss  
-0.5 to 7.0  
-0.5 to Vcc+0.5  
3.1 Delete Preliminary  
Rev. 3.0  
Mar. 27. 2000  
Final  
3.2 Update D.C parameters and 10ns part.  
Previous  
Current  
ICC  
-
195mA  
190mA  
185mA  
Isb  
Isb1  
ICC  
Isb  
Isb1  
10ns  
12ns  
15ns  
20ns  
170mA  
160mA  
150mA  
140mA  
70mA  
20mA  
60mA  
10mA  
3.3 Added Extended temperature range  
The attached data sheets are prepared and approved by SAMSUNG Electronics. SAMSUNG Electronics CO., LTD. reserve the right to change the  
specifications. SAMSUNG Electronics will evaluate and reply to your requests and questions on the parameters of this device. If you have any ques-  
tions, please contact the SAMSUNG branch office near your office, call or contact Headquarters.  
Rev 3.0  
March 2000  
- 1 -  
PRELIMINARY  
CMOS SRAM  
KM684002C, KM684002CE, KM684002CI  
512K x 8 Bit High-Speed CMOS Static RAM  
FEATURES  
GENERAL DESCRIPTION  
• Fast Access Time 10,12,15,20ns(Max.)  
• Low Power Dissipation  
The KM684002C is a 4,194,304-bit high-speed Static Random  
Access Memory organized as 524,288 words by 8 bits. The  
KM684002C uses 8 common input and output lines and has an  
output enable pin which operates faster than address access  
time at read cycle. The device is fabricated using SAMSUNG¢s  
advanced CMOS process and designed for high-speed circuit  
technology. It is particularly well suited for use in high-density  
high-speed system applications. The KM684002C is packaged  
in a 400 mil 36-pin plastic SOJ and 44-pin plastic TSOP type II.  
Standby (TTL)  
: 60mA(Max.)  
(CMOS) : 10mA(Max.)  
Operating KM684002C-10 : 170mA(Max.)  
KM684002C-12 : 160mA(Max.)  
KM684002C-15 : 150mA(Max.)  
KM684002C-20 : 140mA(Max.)  
• Single 5.0V±10% Power Supply  
• TTL Compatible Inputs and Outputs  
• I/O Compatible with 3.3V Device  
• Fully Static Operation  
- No Clock or Refresh required  
• Three State Outputs  
• Center Power/Ground Pin Configuration  
• Standard Pin Configuration  
KM684002CJ : 36-SOJ-400  
KM684002CT: 44-TSOP2-400BF  
FUNCTIONAL BLOCK DIAGRAM  
ORDERING INFORMATION  
KM684002C-10/12/15/20  
KM684002C-10/12/15/20  
KM684002C-10/12/15/20  
Commercial Temp.  
Extended Temp.  
Industrial Temp.  
Clk Gen.  
Pre-Charge Circuit  
A0  
A1  
A2  
A3  
A4  
A5  
A6  
A7  
A8  
A9  
Memory Array  
1024 Rows  
512 x 8 Columns  
Data  
Cont.  
I/O Circuit  
Column Select  
I/O1~I/O8  
CLK  
Gen.  
A10 A11 A12 A13 A14 A15 A16 A17 A18  
CS  
WE  
OE  
Rev 3.0  
March 2000  
- 2 -  
PRELIMINARY  
CMOS SRAM  
KM684002C, KM684002CE, KM684002CI  
PIN CONFIGURATION (Top View)  
N.C  
N.C  
A0  
1
2
3
4
5
6
7
8
9
44 N.C  
43 N.C  
42 N.C  
41 A18  
40 A17  
39 A16  
38 A15  
37 OE  
36 I/O8  
35 I/O7  
34 Vss  
33 Vcc  
32 I/O6  
31 I/O5  
30 A14  
29 A13  
28 A12  
27 A11  
26 A10  
25 N.C  
24 N.C  
23 N.C  
A0  
A1  
1
2
3
4
5
6
7
8
9
36 N.C  
35 A18  
34 A17  
33 A16  
32 A15  
31 OE  
30 I/O8  
29 I/O7  
28 Vss  
27 Vcc  
26 I/O6  
25 I/O5  
24 A14  
23 A13  
22 A12  
21 A11  
20 A10  
19 N.C  
A2  
A1  
A3  
A2  
A4  
A3  
A4  
CS  
I/O1  
I/O2  
Vcc  
CS  
I/O1  
I/O2 10  
Vcc 11  
Vss 12  
I/O3 13  
I/O4 14  
WE 15  
A5 16  
A6 17  
A7 18  
A8 19  
A9 20  
N.C 21  
N.C 22  
36-SOJ  
44-TSOP2  
Vss 10  
I/O3 11  
I/O4 12  
WE 13  
A5 14  
A6 15  
A7 16  
A8 17  
A9 18  
PIN FUNCTION  
Pin Name  
A0 - A18  
WE  
Pin Function  
Address Inputs  
Write Enable  
Chip Select  
CS  
OE  
Output Enable  
Data Inputs/Outputs  
Power(+5.0V)  
Ground  
I/O1 ~ I/O8  
VCC  
VSS  
N.C  
No Connection  
ABSOLUTE MAXIMUM RATINGS*  
Parameter  
Symbol  
VIN, VOUT  
VCC  
Rating  
-0.5 to VCC+0.5  
-0.5 to 7.0  
1.0  
Unit  
V
Voltage on Any Pin Relative to VSS  
Voltage on VCC Supply Relative to VSS  
Power Dissipation  
V
PD  
W
Storage Temperature  
TSTG  
TA  
-65 to 150  
0 to 70  
°C  
°C  
°C  
°C  
Operating Temperature  
Commercial  
Extended  
Industrial  
TA  
-25 to 85  
-40 to 85  
TA  
* Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress rating only and  
functional operation of the device at these or any other conditions above those indicated in the operating sections of this specification is not implied.  
Exposure to absolute maximum rating conditions for extended periods may affect reliability.  
Rev 3.0  
March 2000  
- 3 -  
PRELIMINARY  
CMOS SRAM  
KM684002C, KM684002CE, KM684002CI  
RECOMMENDED DC OPERATING CONDITIONS*(TA=0 to 70°C)  
Parameter  
Min  
Symbol  
VCC  
VSS  
Typ  
Max  
Unit  
V
Supply Voltage  
4.5  
5.0  
5.5  
Ground  
0
0
-
0
V
Input High Voltage  
Input Low Voltage  
VIH  
2.2  
VCC+0.5***  
0.8  
V
VIL  
-0.5**  
-
V
*
The above parameters are also guaranteed at extended and industrial temperature range.  
** VIL(Min) = -2.0V a.c(Pulse Width £ 8ns) for I £ 20mA.  
*** VIH(Max) = VCC + 2.0V a.c (Pulse Width £ 8ns) for I £ 20mA.  
DC AND OPERATING CHARACTERISTICS*(TA=0 to 70°C, Vcc=5.0V±10%, unless otherwise specified)  
Min  
Max  
Parameter  
Symbol  
ILI  
Test Conditions  
Unit  
mA  
Input Leakage Current  
Output Leakage Current  
VIN=VSS to VCC  
-2  
2
ILO  
CS=VIH or OE=VIH or WE=VIL  
VOUT=VSS to VCC  
-2  
2
mA  
Operating Current  
ICC  
Min. Cycle, 100% Duty  
CS=VIL, VIN=VIH or VIL, IOUT=0mA  
Com.  
10ns  
12ns  
15ns  
20ns  
10ns  
12ns  
15ns  
20ns  
-
-
-
-
-
-
-
-
-
-
170  
160  
150  
140  
185  
175  
165  
155  
60  
mA  
Ext.  
Ind.  
Standby Current  
ISB  
Min. Cycle, CS=VIH  
mA  
mA  
ISB1  
f=0MHz, CS³ VCC-0.2V,  
10  
VIN³ VCC-0.2V or VIN£0.2V  
Output Low Voltage Level  
Output High Voltage Level  
VOL  
VOH  
IOL=8mA  
-
2.4  
-
0.4  
-
V
V
V
IOH=-4mA  
IOH1=-0.1mA  
VOH1**  
3.95  
* The above parameters are also guaranteed at extended and industrial temperature range.  
** VCC=5.0V±5%, Temp.=25°C.  
CAPACITANCE*(TA=25°C, f=1.0MHz)  
Item  
Input/Output Capacitance  
Input Capacitance  
Symbol  
Test Conditions  
VI/O=0V  
MIN  
Max  
8
Unit  
pF  
CI/O  
-
-
VIN=0V  
CIN  
7
pF  
* Capacitance is sampled and not 100% tested.  
Rev 3.0  
March 2000  
- 4 -  
PRELIMINARY  
CMOS SRAM  
KM684002C, KM684002CE, KM684002CI  
AC CHARACTERISTICS(TA=0 to 70°C, VCC=5.0V±10%, unless otherwise noted.)  
TEST CONDITIONS*  
Parameter  
Value  
Input Pulse Levels  
0V to 3V  
3ns  
Input Rise and Fall Times  
Input and Output timing Reference Levels  
Output Loads  
1.5V  
See below  
* The above test conditions are also applied at extended and industrial temperature range.  
Output Loads(A)  
DOUT  
Output Loads(B)  
for tHZ, tLZ, tWHZ, tOW, tOLZ & tOHZ  
+5.0V  
RL = 50W  
VL = 1.5V  
30pF*  
480W  
DOUT  
ZO = 50W  
255W  
5pF*  
* Including Scope and Jig Capacitance  
* Capacitive Load consists of all components of the  
test environment.  
READ CYCLE*  
KM684002C-10  
KM684002C-12  
KM684002C-15  
KM684002C-20  
Parameter  
Symbol  
Unit  
Min  
10  
-
Max  
Min  
12  
-
Max  
Min  
15  
-
Max  
Min  
20  
-
Max  
Read Cycle Time  
tRC  
tAA  
tCO  
tOE  
tLZ  
-
10  
10  
5
-
12  
12  
6
-
15  
15  
7
-
20  
20  
9
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
Address Access Time  
Chip Select to Output  
-
-
-
-
Output Enable to Valid Output  
Chip Enable to Low-Z Output  
Output Enable to Low-Z Output  
Chip Disable to High-Z Output  
Output Disable to High-Z Output  
Output Hold from Address  
Chip Selection to Power Up Time  
Chip Selection to Power Down-  
-
-
-
-
3
-
3
-
3
-
3
-
tOLZ  
tHZ  
tOHZ  
tOH  
tPU  
0
-
0
-
0
-
0
-
0
5
0
6
0
7
0
9
0
5
0
6
0
7
0
9
3
-
3
-
3
-
3
-
0
-
0
-
0
-
0
-
tPD  
-
10  
-
12  
-
15  
-
20  
* The above parameters are also guaranteed at extended and industrial temperature range.  
Rev 3.0  
March 2000  
- 5 -  
PRELIMINARY  
CMOS SRAM  
KM684002C, KM684002CE, KM684002CI  
WRITE CYCLE*  
KM684002C-10  
KM684002C-12  
KM684002C-15  
KM684002C-20  
Parameter  
Symbol  
Unit  
Min  
10  
7
Max  
Min  
12  
8
Max  
Min  
15  
10  
0
Max  
Min  
20  
12  
0
Max  
Write Cycle Time  
tWC  
tCW  
tAS  
-
-
-
-
-
-
-
6
-
-
-
-
-
-
-
-
-
-
6
-
-
-
-
-
-
-
-
-
-
7
-
-
-
-
-
-
-
-
-
-
9
-
-
-
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
Chip Select to End of Write  
Address Set-up Time  
0
0
Address Valid to End of  
Write Pulse Width(OE High)  
Write Pulse Width(OE Low)  
Write Recovery Time  
tAW  
tWP  
tWP1  
tWR  
tWHZ  
tDW  
tDH  
7
8
10  
10  
15  
0
12  
12  
20  
0
7
8
10  
0
12  
0
Write to Output High-Z  
Data to Write Time Overlap  
Data Hold from Write Time  
End Write to Output Low-Z  
0
0
0
0
5
6
7
9
0
0
0
0
tOW  
3
3
3
3
* The above parameters are also guaranteed at extended and industrial temperature range.  
TIMMING DIAGRAMS  
TIMING WAVEFORM OF READ CYCLE(1) (Address Controlled, CS=OE=VIL, WE=VIH)  
tRC  
Address  
tAA  
tOH  
Data Out  
Valid Data  
Previous Valid Data  
TIMING WAVEFORM OF READ CYCLE(2) (WE=VIH)  
tRC  
Address  
tAA  
tHZ(3,4,5)  
tCO  
CS  
tOE  
tOHZ  
tOH  
OE  
tOLZ  
tLZ(4,5)  
Data out  
Valid Data  
tPU  
tPD  
ICC  
ISB  
VCC  
50%  
50%  
Current  
NOTES(WRITE CYCLE)  
1. WE is high for read cycle.  
2. All read cycle timing is referenced from the last valid address to the first transition address.  
3. tHZ and tOHZ are defined as the time at which the outputs achieve the open circuit condition and are not referenced to VOH or  
VOL levels.  
4. At any given temperature and voltage condition, tHZ(Max.) is less than tLZ(Min.) both for a given device and from device to  
device.  
5. Transition is measured ±200mV from steady state voltage with Load(B). This parameter is sampled and not 100% tested.  
6. Device is continuously selected with CS=VIL.  
7. Address valid prior to coincident with CS transition low.  
8. For common I/O applications, minimization or elimination of bus contention conditions is necessary during read and write cycle.  
Rev 3.0  
March 2000  
- 6 -  
PRELIMINARY  
CMOS SRAM  
KM684002C, KM684002CE, KM684002CI  
TIMING WAVEFORM OF WRITE CYCLE(1) (OE= Clock)  
tWC  
Address  
tWR(5)  
tAW  
OE  
tCW(3)  
CS  
tWP(2)  
tAS(4)  
WE  
tDW  
tDH  
High-Z  
Data in  
Data out  
Valid Data  
tOHZ(6)  
High-Z(8)  
TIMING WAVEFORM OF WRITE CYCLE(2) (OE=Low Fixed)  
tWC  
Address  
tWR(5)  
tAW  
tCW(3)  
CS  
tAS(4)  
tWP1(2)  
WE  
tDH  
tDW  
High-Z  
Data in  
Valid Data  
tWHZ(6)  
tOW  
(10)  
(9)  
High-Z(8)  
Data out  
TIMING WAVEFORM OF WRITE CYCLE(3) (CS = Controlled)  
tWC  
Address  
tAW  
tWR(5)  
tCW(3)  
tWP(2)  
CS  
tAS(4)  
WE  
tDH  
tDW  
High-Z  
High-Z  
High-Z  
Data in  
Data out  
Valid Data  
tLZ  
tWHZ(6)  
High-Z(8)  
Rev 3.0  
March 2000  
- 7 -  
PRELIMINARY  
CMOS SRAM  
KM684002C, KM684002CE, KM684002CI  
NOTES(WRITE CYCLE)  
1. All write cycle timing is referenced from the last valid address to the first transition address.  
2. A write occurs during the overlap of a low CS and WE. A write begins at the latest transition CS going low and WE going low ; A write  
ends at the earliest transition CS going high or WE going high. tWP is measured from the beginning of write to the end of write.  
3. tCW is measured from the later of CS going low to end of write.  
4. tAS is measured from the address valid to the beginning of write.  
5. tWR is measured from the end of write to the address change. tWR applied in case a write ends as CS or WE going high.  
6. If OE, CS and WE are in the Read Mode during this period, the I/O pins are in the output low-Z state. Inputs of opposite phase of the  
output must not be applied because bus contention can occur.  
7. For common I/O applications, minimization or elimination of bus contention conditions is necessary during read and write cycle.  
8. If CS goes low simultaneously with WE going or after WE going low, the outputs remain high impedance state.  
9. Dout is the read data of the new address.  
10. When CS is low : I/O pins are in the output state. The input signals in the opposite phase leading to the output should not be applied.  
FUNCTIONAL DESCRIPTION  
CS  
WE  
X
OE  
X*  
H
Mode  
Not Select  
Output Disable  
Read  
I/O Pin  
High-Z  
High-Z  
DOUT  
Supply Current  
H
ISB, ISB1  
ICC  
L
H
L
H
L
ICC  
L
L
X
Write  
DIN  
ICC  
* X means Don¢t Care.  
Rev 3.0  
March 2000  
- 8 -  
PRELIMINARY  
CMOS SRAM  
KM684002C, KM684002CE, KM684002CI  
Units:millimeters/Inches  
PACKAGE DIMENSIONS  
36-SOJ-400  
#36  
#19  
9.40 ±0.25  
0.370 ±0.010  
11.18 ±0.12  
0.440 ±0.005  
+0.10  
-0.05  
0.20  
+0.004  
-0.002  
#1  
#18  
0.008  
0.69  
MIN  
0.027  
23.90  
MAX  
0.941  
23.50 ±0.12  
0.925 ±0.005  
1.19  
0.047  
1.27  
(
(
)
)
3.76  
0.148  
0.10  
0.004  
MAX  
MAX  
0.050  
+0.10  
-0.05  
0.43  
+0.10  
+0.004  
-0.002  
0.71  
0.028  
-0.05  
0.017  
0.95  
0.0375  
1.27  
0.050  
(
)
+0.004  
-0.002  
44-TSOP2-400BF  
Units:millimeters/Inches  
0~8°  
0.25  
0.010  
TYP  
#23  
#44  
0.45 ~0.75  
0.018 ~ 0.030  
11.76 ±0.20  
0.463 ±0.008  
0.50  
0.020  
(
)
#1  
#22  
18.81  
0.741  
MAX  
+ 0.075  
- 0.035  
+ 0.003  
- 0.001  
0.125  
0.005  
18.41 ±0.10  
0.725 ±0.004  
1.00 ±0.10  
0.039 ±0.004  
1.20  
0.047  
MAX  
0.10  
0.004  
MAX  
+0.10  
- 0.05  
+0.004  
- 0.002  
0.05  
0.002  
0.30  
MIN  
0.80  
0.0315  
0.805  
0.032  
(
)
0.012  
Rev 3.0  
March 2000  
- 9 -  

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