KMM464S424CT1-FL [SAMSUNG]

Synchronous DRAM Module, 4MX64, 6ns, CMOS, SODIMM-144;
KMM464S424CT1-FL
型号: KMM464S424CT1-FL
厂家: SAMSUNG    SAMSUNG
描述:

Synchronous DRAM Module, 4MX64, 6ns, CMOS, SODIMM-144

时钟 动态存储器 内存集成电路
文件: 总11页 (文件大小:168K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
KMM464S424CT1  
PC100 144pin SDRAM SODIMM  
Revision History  
Revision 0.1 (May. 24, 1999)  
- Changed "Detail Y" in PCB Dimension.  
Rev.0.1 May 1999  
KMM464S424CT1  
PC100 144pin SDRAM SODIMM  
KMM464S424CT1 SDRAM SODIMM  
4Mx64 SDRAM SODIMM based on 4Mx16, 4Banks, 4K Refresh, 3.3V Synchronous DRAMs with SPD  
GENERAL DESCRIPTION  
FEATURE  
The Samsung KMM464S424CT1 is a 4M bit x 64 Synchro-  
nous Dynamic RAM high density memory module. The Sam-  
sung KMM464S424CT1 consists of four CMOS 4M x 16 bit  
with 4banks Synchronous DRAMs in TSOP-II 400mil package  
and a 2K EEPROM in 8-pin TSSOP package on a 144-pin  
glass-epoxy substrate. Three 0.1uF decoupling capacitors are  
mounted on the printed circuit board in parallel for each  
SDRAM. The KMM464S424CT1 is a Small Outline Dual In-line  
Memory Module and is intended for mounting into 144-pin  
edge connector sockets.  
• Performance range  
Part No.  
Max Freq. (Speed)  
100MHz (10ns @ CL=2)  
100MHz (10ns @ CL=3)  
KMM464S424CT1-FH  
KMM464S424CT1-FL  
Burst mode operation  
• Auto & self refresh capability (4096 Cycles/64ms)  
LVTTL compatible inputs and outputs  
• Single 3.3V ± 0.3V power supply  
• MRS cycle with address key programs  
Latency (Access from column address)  
Burst length (1, 2, 4, 8 & Full page)  
Data scramble (Sequential & Interleave)  
• All inputs are sampled at the positive going edge of the  
system clock  
Synchronous design allows precise cycle control with the use  
of system clock. I/O transactions are possible on every clock  
cycle. Range of operating frequencies, programmable laten-  
cies allows the same device to be useful for a variety of high  
bandwidth, high performance memory system applications.  
• Serial presence detect with EEPROM  
PCB : Height (1,000mil,)double sided component  
PIN CONFIGURATIONS (Front side/back side)  
PIN NAMES  
Pin Front Pin Back Pin Front Pin Back Pin Front Pin Back  
Pin Name  
A0 ~ A11  
BA0 ~ BA1  
DQ0 ~ DQ63  
CLK0  
Function  
Address input (Multiplexed)  
Select bank  
1
3
VSS  
DQ0  
DQ1  
DQ2  
2
4
6
8
VSS  
51 DQ14 52 DQ46 95 DQ21 96 DQ53  
DQ32 53 DQ15 54 DQ47 97 DQ22 98 DQ54  
Data input/output  
Clock input  
5
DQ33 55  
DQ34 57  
VSS  
NC  
NC  
56  
58  
60  
VSS  
99 DQ23 100 DQ55  
7
NC 101  
NC 103  
105  
VDD  
A6  
102 VDD  
104 A7  
9
DQ3 10 DQ35 59  
12  
CKE0  
CS0  
Clock enable input  
Chip select input  
Row address strobe  
Column address strobe  
Write enable  
11  
VDD  
VDD  
A8  
106 BA0  
108 VSS  
110 BA1  
13 DQ4 14 DQ36  
15 DQ5 16 DQ37  
107  
VSS  
A9  
Voltage Key  
RAS  
109  
CAS  
17 DQ6 18 DQ38 61 CLK0 62 CKE0 111 A10/AP 112 A11  
19 DQ7 20 DQ39 63 64 VDD 113 114 VDD  
21 22 65 RAS 66 CAS 115 DQM2 116 DQM6  
23 DQM0 24 DQM4 67 WE 68 *CKE1 117 DQM3 118 DQM7  
25 DQM1 26 DQM5 69 CS0 70 *A12 119 120 VSS  
71 *CS1 72 *A13 121 DQ24 122 DQ56  
WE  
VDD  
VDD  
DQM0 ~ 7  
VDD  
DQM  
VSS  
VSS  
Power supply (3.3V)  
Ground  
VSS  
VSS  
27  
29  
31  
33  
35  
VDD  
A0  
28  
30  
32  
34  
36  
VDD  
A3  
SDA  
Serial data I/O  
Serial clock  
73  
75  
77  
79  
DU  
VSS  
NC  
74 *CLK1 123 DQ25 124 DQ57  
SCL  
A1  
A4  
76  
78  
80  
82  
VSS 125 DQ26 126 DQ58  
NC 127 DQ27 128 DQ59  
DU  
Don¢t use  
A2  
A5  
NC  
No connection  
VSS  
VSS  
NC  
NC 129  
VDD  
130 VDD  
37 DQ8 38 DQ40 81  
VDD  
VDD 131 DQ28 132 DQ60  
*
These pins are not used in this module.  
39 DQ9 40 DQ41 83 DQ16 84 DQ48 133 DQ29 134 DQ61  
41 DQ10 42 DQ42 85 DQ17 86 DQ49 135 DQ30 136 DQ62  
43 DQ11 44 DQ43 87 DQ18 88 DQ50 137 DQ31 138 DQ63  
** These pins should be NC in the system  
which does not support SPD.  
45  
47 DQ12 48 DQ44 91  
49 DQ13 50 DQ45 93 DQ20 94 DQ52 143  
VDD  
46  
VDD  
89 DQ19 90 DQ51 139  
92 VSS 141 **SDA 142 **SCL  
144 VDD  
VSS  
140 VSS  
VSS  
VDD  
SAMSUNG ELECTRONICS CO., Ltd. reserves the right to change products and specifications without notice.  
Rev.0.1 May 1999  
KMM464S424CT1  
PC100 144pin SDRAM SODIMM  
PIN CONFIGURATION DESCRIPTION  
Pin  
Name  
System clock  
Input Function  
CLK  
CS  
Active on the positive going edge to sample all inputs.  
Disables or enables device operation by masking or enabling all inputs except  
CLK, CKE and DQM  
Chip select  
Masks system clock to freeze operation from the next clock cycle.  
CKE should be enabled at least one cycle prior to new command.  
Disable input buffers for power down in standby.  
CKE  
Clock enable  
CKE should be enabled 1CLK+tSS prior to valid command.  
Row/column addresses are multiplexed on the same pins.  
Row address : RA0 ~ RA11, Column address : CA0 ~ CA7  
A0 ~ A11  
BA0 ~ BA1  
RAS  
Address  
Selects bank to be activated during row address latch time.  
Selects bank for read/write during column address latch time.  
Bank select address  
Row address strobe  
Column address strobe  
Write enable  
Latches row addresses on the positive going edge of the CLK with RAS low.  
Enables row access & precharge.  
Latches column addresses on the positive going edge of the CLK with CAS low.  
Enables column access.  
CAS  
Enables write operation and row precharge.  
Latches data in starting from CAS, WE active.  
WE  
Makes data output Hi-Z, tSHZ after the clock and masks the output.  
Blocks data input when DQM active. (Byte masking)  
DQM0 ~ 7  
Data input/output mask  
DQ0 ~ 63  
VDD/VSS  
Data input/output  
Data inputs/outputs are multiplexed on the same pins.  
Power and ground for the input buffers and the core logic.  
Power supply/ground  
Rev.0.1 May 1999  
KMM464S424CT1  
PC100 144pin SDRAM SODIMM  
FUNCTIONAL BLOCK DIAGRAM  
CS0  
DQM0  
DQM4  
LDQM CS  
LDQM CS  
DQ0  
DQ1  
DQ2  
DQ3  
DQ4  
DQ5  
DQ6  
DQ7  
DQ0  
DQ1  
DQ2  
DQ3  
DQ4  
DQ5  
DQ6  
DQ7  
DQ32  
DQ0  
DQ33  
DQ1  
DQ34  
U0  
DQ2  
DQ3  
DQ4  
DQ5  
DQ6  
DQ7  
U2  
DQ35  
DQ36  
DQ37  
DQ38  
DQ39  
DQM1  
DQM2  
DQM3  
UDQM  
UDQM  
DQM5  
DQM6  
DQM7  
DQ8  
DQ9  
DQ8  
DQ9  
DQ40  
DQ41  
DQ42  
DQ43  
DQ44  
DQ45  
DQ46  
DQ47  
DQ8  
DQ9  
DQ10  
DQ11  
DQ12  
DQ13  
DQ14  
DQ15  
DQ10  
DQ11  
DQ12  
DQ13  
DQ14  
DQ15  
DQ10  
DQ11  
DQ12  
DQ13  
DQ14  
DQ15  
LDQM CS  
LDQM CS  
DQ16  
DQ17  
DQ18  
DQ19  
DQ20  
DQ21  
DQ22  
DQ23  
DQ0  
DQ1  
DQ48  
DQ49  
DQ50  
DQ51  
DQ52  
DQ53  
DQ54  
DQ55  
DQ0  
DQ1  
DQ2  
DQ3  
DQ4  
DQ5  
DQ6  
DQ7  
U1  
DQ2  
DQ3  
DQ4  
DQ5  
DQ6  
DQ7  
U3  
UDQM  
UDQM  
DQ24  
DQ25  
DQ26  
DQ27  
DQ28  
DQ29  
DQ30  
DQ31  
DQ8  
DQ9  
DQ56  
DQ57  
DQ58  
DQ59  
DQ60  
DQ61  
DQ62  
DQ63  
DQ8  
DQ9  
DQ10  
DQ11  
DQ12  
DQ13  
DQ14  
DQ15  
DQ10  
DQ11  
DQ12  
DQ13  
DQ14  
DQ15  
Serial PD  
SDRAM U0 ~ U3  
SDRAM U0 ~ U3  
SDRAM U0 ~ U3  
SDRAM U0 ~ U3  
SDRAM U0 ~ U3  
A0 ~ A11, BA0 & 1  
SDA  
WP  
SCL  
SA0 SA1 SA2  
RAS  
CAS  
WE  
U0  
U1  
U2  
CKE0  
10W  
CLK0  
CLK1  
DQn  
Every DQ pin of SDRAM  
U3  
VDD  
10W  
Three 0.1uF X7R 0603 Capacitors  
per each SDRAM  
To all SDRAMs  
Vss  
10pF  
Note :  
Use a zero ohm jumper to isolate A12 from the SDRAM pins in non-256Mbit designs.  
Rev.0.1 May 1999  
KMM464S424CT1  
PC100 144pin SDRAM SODIMM  
ABSOLUTE MAXIMUM RATINGS  
Parameter  
Voltage on any pin relative to Vss  
Voltage on VDD supply relative to Vss  
Storage temperature  
Symbol  
VIN, VOUT  
VDD, VDDQ  
TSTG  
Value  
-1.0 ~ 4.6  
-1.0 ~ 4.6  
-55 ~ +150  
4
Unit  
V
V
°C  
W
Power dissipation  
PD  
Short circuit current  
IOS  
50  
mA  
Note :  
Permanent device damage may occur if "ABSOLUTE MAXIMUM RATINGS" are exceeded.  
Functional operation should be restricted to recommended operating condition.  
Exposure to higher than recommended voltage for extended periods of time could affect device reliability.  
DC OPERATING CONDITIONS AND CHARACTERISTICS  
Recommended operating conditions (Voltage referenced to VSS = 0V, TA = 0 to 70°C)  
Parameter  
Supply voltage  
Symbol  
VDD  
VIH  
Min  
3.0  
2.0  
-0.3  
2.4  
-
Typ  
Max  
Unit  
V
Note  
3.3  
3.6  
Input high voltage  
3.0  
VDDQ+0.3  
V
1
Input low voltage  
VIL  
0
-
0.8  
-
V
2
IOH = -2mA  
IOL = 2mA  
3
Output high voltage  
VOH  
VOL  
IIL  
V
Output low voltage  
-
0.4  
4
V
Input leakage current (Inputs)  
Input leakage current (I/O pins)  
-4  
-
uA  
uA  
IIL  
-1.5  
-
1.5  
3,4  
Notes :  
1. VIH (max) = 5.6V AC.The overshoot voltage duration is £ 3ns.  
2. VIL (min) = -2.0V AC. The undershoot voltage duration is £ 3ns.  
3. Any input 0V £ VIN £ VDDQ.  
Input leakage currents include Hi-Z output leakage for all bi-directional buffers with Tri-State outputs.  
4. Dout is disabled, 0V £ VOUT £ VDDQ.  
CAPACITANCE (VDD = 3.3V, TA = 23°C, f = 1MHz, VREF = 1.4V ± 200 mV)  
Parameter  
Symbol  
Min  
Max  
Unit  
Input capacitance (A0 ~ A11, BA0 ~ BA1)  
Input capacitance (RAS, CAS, WE)  
Input capacitance (CKE0)  
CIN1  
CIN2  
CIN3  
CIN4  
CIN5  
CIN6  
COUT  
20  
20  
20  
20  
20  
12  
14  
30  
30  
30  
26  
30  
15  
17  
pF  
pF  
pF  
pF  
pF  
pF  
pF  
Input capacitance (CLK0)  
Input capacitance (CS0)  
Input capacitance (DQM0 ~ DQM7)  
Data input/output capacitance (DQ0 ~ DQ63)  
Rev.0.1 May 1999  
KMM464S424CT1  
PC100 144pin SDRAM SODIMM  
DC CHARACTERISTICS  
(Recommended operating condition unless otherwise noted, TA = 0 to 70°C)  
Version  
CAS  
Latency  
Parameter  
Symbol  
Test Condition  
Burst length = 1  
tRC ³ tRC(min)  
IOL = 0 mA  
Unit  
mA  
Note  
-H  
-L  
Operating current  
(One bank active)  
ICC1  
280  
280  
1
ICC2P  
CKE £ VIL(max), tCC = 15ns  
4
4
Precharge standby current in  
power-down mode  
mA  
ICC2PS  
CKE & CLK £ VIL(max), tCC =¥  
CKE ³ VIH(min), CS ³ VIH(min), tCC = 15ns  
Input signals are changed one time during 30ns  
ICC2N  
48  
24  
Precharge standby current in  
non power-down mode  
mA  
mA  
CKE ³ VIH(min), CLK £ VIL(max), tCC =¥  
Input signals are stable  
ICC2NS  
ICC3P  
CKE £ VIL(max), tCC = 15ns  
8
8
Active standby current in  
power-down mode  
ICC3PS  
CKE & CLK £ VIL(max), tCC =¥  
CKE ³ VIH(min), CS ³ VIH(min), tCC = 15ns  
Input signals are changed one time during 30ns  
ICC3N  
80  
40  
mA  
mA  
Active standby current in  
non power-down mode  
(One bank active)  
CKE ³ VIH(min), CLK £ VIL(max), tCC =¥  
Input signals are stable  
ICC3NS  
IOL = 0 mA  
Page burst  
2Banks activated  
tCCD = 2CLKs  
3
360  
360  
360  
340  
Operating current  
(Burst mode)  
ICC4  
mA  
1
2
2
Refresh current  
ICC5  
ICC6  
tRC ³ tRC(min)  
500  
1.8  
mA  
mA  
Self refresh current  
CKE £ 0.2V  
Notes :  
1. Measured with outputs open.  
2. Refresh period is 64ms.  
Rev.0.1 May 1999  
KMM464S424CT1  
PC100 144pin SDRAM SODIMM  
AC OPERATING TEST CONDITIONS(VDD = 3.3V ± 0.3V, TA = 0 to 70°C)  
Parameter  
AC input levels (Vih/Vil)  
Value  
2.4/0.4  
1.4  
Unit  
V
Input timing measurement reference level  
Input rise and fall time  
V
tr/tf = 1/1  
1.4  
ns  
V
Output timing measurement reference level  
Output load condition  
See Fig. 2  
3.3V  
Vtt = 1.4V  
1200W  
50W  
VOH (DC) = 2.4V, IOH = -2mA  
VOL (DC) = 0.4V, IOL = 2mA  
Z0 = 50W  
Output  
Output  
50pF  
50pF  
870W  
(Fig. 1) DC output load circuit  
(Fig. 2) AC output load circuit  
OPERATING AC PARAMETER(AC operating conditions unless otherwise noted)  
Version  
Parameter  
Symbol  
Unit  
Note  
-H  
20  
20  
20  
50  
-L  
Row active to row active delay  
RAS to CAS delay  
tRRD(min)  
tRCD(min)  
tRP(min)  
20  
20  
20  
50  
ns  
ns  
1
1
1
1
Row precharge time  
ns  
tRAS(min)  
tRAS(max)  
tRC(min)  
ns  
Row active time  
100  
us  
Row cycle time  
70  
70  
ns  
1
2
2
2
3
Last data in to row precharge  
Last data in to new col. address delay  
Last data in to burst stop  
tRDL(min)  
tCDL(min)  
tBDL(min)  
tCCD(min)  
1
1
1
1
2
1
CLK  
CLK  
CLK  
CLK  
Col. address to col. address delay  
CAS latency=3  
CAS latency=2  
Number of valid output data  
ea  
4
Notes :  
1. The minimum number of clock cycles is determined by dividing the minimum time required with clock cycle time,  
and then rounding off to the next higher integer.  
2. Minimum delay is required to complete write.  
3. All parts allow every cycle column address change.  
4. In case of row precharge interrupt, auto precharge and read burst stop.  
Rev.0.1 May 1999  
KMM464S424CT1  
PC100 144pin SDRAM SODIMM  
AC CHARACTERISTICS(AC operating conditions unless otherwise noted)  
REFER TO THE INDIVIDUAL COMPONENT, NOT THE WHOLE MODULE.  
-H  
-L  
Parameter  
Symbol  
Unit  
ns  
Note  
1
Min  
10  
Max  
Min  
10  
Max  
CAS latency=3  
CAS latency=2  
CAS latency=3  
CAS latency=2  
CAS latency=3  
CAS latency=2  
CLK cycle time  
tCC  
1000  
1000  
10  
12  
6
6
6
7
CLK to valid output delay  
Output data hold time  
tSAC  
ns  
1,2  
2
3
3
3
3
2
1
1
3
3
3
3
2
1
1
tOH  
ns  
CLK high pulse width  
CLK low pulse width  
Input setup time  
tCH  
tCL  
ns  
ns  
ns  
ns  
ns  
3
3
3
3
2
tSS  
tSH  
tSLZ  
Input hold time  
CLK to output in Low-Z  
CAS latency=3  
CAS latency=2  
6
6
6
7
CLK to output in Hi-Z  
tSHZ  
ns  
Notes :  
1. Parameters depend on programmed CAS latency.  
2. If clock rising time is longer than 1ns, (tr/2-0.5)ns should be added to the parameter.  
3. Assumed input rise and fall time (tr & tf) = 1ns.  
If tr & tf is longer than 1ns, transient time compensation should be considered,  
i.e., [(tr + tf)/2-1]ns should be added to the parameter.  
Rev.0.1 May 1999  
KMM464S424CT1  
PC100 144pin SDRAM SODIMM  
FREQUENCY vs. AC PARAMETER RELATIONSHIP TABLE  
(Unit : Number of clock)  
KMM464S424CT1-FH  
t
RC  
t
RAS  
t
RP  
t
RRD  
t
RCD  
t
CCD  
t
CDL  
tRDL  
CAS  
Latency  
Frequency  
70ns  
50ns  
20ns  
20ns  
20ns  
10ns  
10ns  
10ns  
100MHz (10.0ns)  
83MHz (12.0ns)  
75MHz (13.0ns)  
66MHz (15.0ns)  
60MHz (16.7ns)  
2
2
2
2
2
7
6
6
5
5
5
5
4
4
3
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
(Unit : Number of clock)  
KMM464S424CT1-FL  
Frequency  
t
RC  
t
RAS  
t
RP  
t
RRD  
t
RCD  
t
CCD  
tCDL  
tRDL  
CAS  
Latency  
70ns  
50ns  
20ns  
20ns  
20ns  
10ns  
10ns  
10ns  
100MHz (10.0ns)  
83MHz (12.0ns)  
75MHz (13.0ns)  
66MHz (15.0ns)  
60MHz (16.7ns)  
3
2
2
2
2
7
6
6
5
5
5
5
4
4
3
2
2
2
2
2
2
2
2
2
2
2
2
2
2
2
1
1
1
1
1
1
1
1
1
1
1
1
1
1
1
Rev.0.1 May 1999  
KMM464S424CT1  
PC100 144pin SDRAM SODIMM  
SIMPLIFIED TRUTH TABLE  
A
11,  
CKEn-1  
CKEn  
CS  
RAS  
CAS  
WE  
DQM BA0,1  
A10/AP  
Note  
Command  
A
9
~ A  
0
Register  
Refresh  
Mode register set  
Auto refresh  
H
X
H
L
L
L
L
L
X
OP code  
X
1,2  
3
H
L
L
L
L
H
X
X
Entry  
3
Self  
L
H
L
H
X
L
H
X
H
H
X
H
3
refresh  
Exit  
H
X
3
Bank active & row addr.  
H
H
X
X
X
X
V
V
Row address  
Column  
address  
(A0 ~ A7)  
Read &  
column address  
Auto precharge disable  
Auto precharge enable  
Auto precharge disable  
Auto precharge enable  
L
H
L
4
4,5  
4
L
L
H
H
L
L
H
L
Column  
address  
(A0 ~ A7)  
Write &  
column address  
H
X
X
V
H
4,5  
6
Burst stop  
Precharge  
H
H
X
X
L
L
H
L
H
H
L
L
X
X
X
Bank selection  
All banks  
V
X
L
X
H
H
L
X
V
X
X
H
X
V
X
V
X
X
H
X
V
X
V
X
X
H
X
V
Entry  
H
L
X
Clock suspend or  
active power down  
X
X
Exit  
L
H
L
X
H
L
X
X
Entry  
H
Precharge power down mode  
H
L
Exit  
L
H
X
X
X
DQM  
H
H
V
X
X
X
7
H
L
X
H
X
H
X
H
No operation command  
(V=Valid, X=Don¢t care, H=Logic high, L=Logic low)  
Notes :  
1. OP Code : Operand code  
A0 ~ A11 & BA0 ~ BA1 : Program keys. (@ MRS)  
2. MRS can be issued only at all banks precharge state.  
A new command can be issued after 2 clock cycles of MRS.  
3. Auto refresh functions are as same as CBR refresh of DRAM.  
The automatical precharge without row precharge command is meant by "Auto".  
Auto/self refresh can be issued only at all banks precharge state.  
4. BA0 ~ BA1 : Bank select addresses.  
If both BA0 and BA1 are "Low" at read, write, row active and precharge, bank A is selected.  
If both BA0 is "Low" and BA1 is "High" at read, write, row active and precharge, bank B is selected.  
If both BA0 is "High" and BA1 is "Low" at read, write, row active and precharge, bank C is selected.  
If both BA0 and BA1 are "High" at read, write, row active and precharge, bank D is selected.  
If A10/AP is "High" at row precharge, BA0 and BA1 is ignored and all banks are selected.  
5. During burst read or write with auto precharge, new read/write command can not be issued.  
Another bank read/write command can be issued after the end of burst.  
New row active of the associated bank can be issued at tRP after the end of burst.  
6. Burst stop command is valid at every burst length.  
7. DQM sampled at positive going edge of a CLK and masks the data-in at the very CLK (Write DQM latency is 0),  
but makes Hi-Z state the data-out of 2 CLK cycles after. (Read DQM latency is 2)  
Rev.0.1 May 1999  
KMM464S424CT1  
PC100 144pin SDRAM SODIMM  
PACKAGE DIMENSIONS  
Units : Inches (Millimeters)  
2.66  
(67.56)  
2.50  
(63.60)  
2-R 0.078 Min  
(2.00 Min)  
0.16 ± 0.039  
(4.00 ± 0.10)  
1
59  
61  
143  
0.91  
(23.20)  
1.29  
(32.80)  
0.13  
(3.30)  
2-f 0.07  
(1.80)  
0.18  
(4.60)  
0.083  
(2.10)  
0.10  
(2.50)  
Z
Y
0.15  
(3.70)  
2
60  
62  
144  
0.150 Max  
(3.80 Max)  
0.024 ± 0.001  
(0.60 ± 0.05)  
0.16 ± 0.0039  
(4.00 ± 0.10)  
0.008 ± 0.006  
(0.200 ± 0.150)  
0.06 ± 0.0039  
(1.50 ± 0.1)  
0.03 TYP  
(0.80 TYP)  
0.04 ± 0.0039  
(1.00 ± 0.10)  
Detail Z  
Detail Y  
Tolerances : ± 0.006(.15) unless otherwise specified  
The used device is 4Mx16 SDRAM, TSOP  
SDRAM Part No. : KM416S4030CT  
Rev.0.1 May 1999  

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