M464S6453BK0-L1L [SAMSUNG]
Synchronous DRAM Module, 64MX64, 6ns, CMOS, SODIMM-144;![M464S6453BK0-L1L](http://pdffile.icpdf.com/pdf2/p00237/img/icpdf/M464S6453BK0_1390207_icpdf.jpg)
型号: | M464S6453BK0-L1L |
厂家: | ![]() |
描述: | Synchronous DRAM Module, 64MX64, 6ns, CMOS, SODIMM-144 动态存储器 |
文件: | 总10页 (文件大小:144K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
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PC100/PC133 512MB SODIMM
M464S6453BK0
Revision History
Revision 0.0 (Nov. 2000)
Revision 0.1 (Jan. 2001)
• Correted column address information in PIN CONFIGURATION DESCRIPTION.
C’ A11’is deleted
• Defined the input capacitance in CAPACITANCE.
• Redefined the ICC* in DC CHARACTERISTICS.
Revision 0.2 (Feb. 2001)
• Reduced the value of ICC6 for low power 32mA to 24mA
Revision 0.3 (Mar. 2001)
• Redifined the value of Input Capacitance
Revision 0.4 (Jun 2001)
• defined a new product of "-7A"
Rev. 0.4 Jun 2001
PC100/PC133 512MB SODIMM
M464S6453BK0
M464S6453BK0 SDRAM SODIMM
64Mx64 SDRAM SODIMM based on 64Mx8, 4Banks, 8K Refresh,3.3V Synchronous DRAMs with SPD
GENERAL DESCRIPTION
FEATURE
The Samsung M464S6453BK0 is a 64M bit x 64 Synchronous
Dynamic RAM high density memory module. The Samsung
M464S6453BK0 consists of eight CMOS 64M x 8 bit with
4banks Synchronous DRAMs in TSOP-II 400mil package and a
2K EEPROM in 8-pin TSSOP package on a 144-pin glass-epoxy
substrate. Three 0.1uF decoupling capacitors are mounted on
the printed circuit board in parallel for each SDRAM. The
M464S6453BK0 is a Small Outline Dual In-line Memory Module
and is intended for mounting into 144-pin M46S6453BK0 edge
connector sockets.
• Performance range
Part No.
Max Freq. (Speed)
133MHz(7.5ns @CL=3)
133MHz(7.5ns @CL=3)
100MHz (10ns @ CL=2)
100MHz (10ns @ CL=3)
M464S6453BK0-L7A /C7A
M464S6453BK0-L75 /C75
M464S6453BK0-L1H /C1H
M464S6453BK0-L1L /C1L
• Burst mode operation
• Auto & self refresh capability (8192 Cycles/64ms)
• LVTTL compatible inputs and outputs
• Single 3.3V ± 0.3V power supply
Synchronous design allows precise cycle control with the use of
system clock. I/O transactions are possible on every clock cycle.
Range of operating frequencies, programmable latencies allows
the same device to be useful for a variety of high bandwidth,
high performance memory system applications.
• MRS cycle with address key programs
Latency (Access from column address)
Burst length (1, 2, 4, 8 & Full page)
Data scramble (Sequential & Interleave)
• All inputs are sampled at the positive going edge of the
system clock
• Serial presence detect with EEPROM
• PCB : Height (1,200mil), double sided component
PIN CONFIGURATIONS (Front side/back side)
PIN NAMES
Pin Front Pin Back Pin Front Pin Back Pin Front Pin Back
Pin Name
A0 ~ A12
Function
Address input (Multiplexed)
Select bank
1
3
VSS
DQ0
DQ1
DQ2
2
4
6
8
VSS
51 DQ14 52 DQ46 95 DQ21 96 DQ53
DQ32 53 DQ15 54 DQ47 97 DQ22 98 DQ54
BA0 ~ BA1
5
DQ33 55
DQ34 57
VSS
NC
NC
56
58
60
VSS
99 DQ23 100 DQ55
DQ0 ~ DQ63 Data input/output
CLK0 ~ CLK1 Clock input
7
NC 101
NC 103
105
VDD
A6
102 VDD
104 A7
9
DQ3 10 DQ35 59
12
CKE0 ~ CKE1 Clock enable input
11
VDD
VDD
A8
106 BA0
108 VSS
110 BA1
CS0 ~ CS1
RAS
Chip select input
Row address strobe
Column address strobe
Write enable
13 DQ4 14 DQ36
15 DQ5 16 DQ37
107
VSS
A9
Voltage Key
109
17 DQ6 18 DQ38 61 CLK0 62 CKE0 111 A10/AP 112 A11
19 DQ7 20 DQ39 63 64 VDD 113 114 VDD
21 22 65 RAS 66 CAS 115 DQM2 116 DQM6
23 DQM0 24 DQM4 67 WE 68 CKE1 117 DQM3 118 DQM7
25 DQM1 26 DQM5 69 CS0 70 A12 119 120 VSS
71 CS1 72 *A13 121 DQ24 122 DQ56
CAS
VDD
VDD
WE
VSS
VSS
DQM0 ~ 7
VDD
DQM
Power supply (3.3V)
Ground
VSS
VSS
27
29
31
33
35
VDD
A0
28
30
32
34
36
VDD
A3
SDA
Serial data I/O
Serial clock
73
75
77
79
DU
VSS
NC
74 CLK1 123 DQ25 124 DQ57
SCL
A1
A4
76
78
80
82
VSS 125 DQ26 126 DQ58
NC 127 DQ27 128 DQ59
A2
A5
DU
Don¢t use
VSS
VSS
NC
NC 129
VDD
130 VDD
NC
No connection
37 DQ8 38 DQ40 81
VDD
VDD 131 DQ28 132 DQ60
*
These pins are not used in this module.
39 DQ9 40 DQ41 83 DQ16 84 DQ48 133 DQ29 134 DQ61
41 DQ10 42 DQ42 85 DQ17 86 DQ49 135 DQ30 136 DQ62
43 DQ11 44 DQ43 87 DQ18 88 DQ50 137 DQ31 138 DQ63
** These pins should be NC in the system
which does not support SPD.
45
47 DQ12 48 DQ44 91
49 DQ13 50 DQ45 93 DQ20 94 DQ52 143
VDD
46
VDD
89 DQ19 90 DQ51 139
92 VSS 141 **SDA 142 **SCL
144 VDD
VSS
140 VSS
VSS
VDD
SAMSUNG ELECTRONICS CO., Ltd. reserves the right to change products and specifications without notice.
Rev. 0.4 Jun 2001
PC100/PC133 512MB SODIMM
M464S6453BK0
PIN CONFIGURATION DESCRIPTION
Pin
Name
System clock
Input Function
CLK
CS
Active on the positive going edge to sample all inputs.
Disables or enables device operation by masking or enabling all inputs except
CLK, CKE and DQM
Chip select
Masks system clock to freeze operation from the next clock cycle.
CKE should be enabled at least one cycle prior to new command.
Disable input buffers for power down in standby.
CKE
Clock enable
CKE should be enabled 1CLK+tSS prior to valid command.
Row/column addresses are multiplexed on the same pins.
Row address : RA0 ~ RA12, Column address : CA0 ~ CA9
A0 ~ A12
BA0 ~ BA1
RAS
Address
Selects bank to be activated during row address latch time.
Selects bank for read/write during column address latch time.
Bank select address
Row address strobe
Column address strobe
Write enable
Latches row addresses on the positive going edge of the CLK with RAS low.
Enables row access & precharge.
Latches column addresses on the positive going edge of the CLK with CAS low.
Enables column access.
CAS
Enables write operation and row precharge.
Latches data in starting from CAS, WE active.
WE
Makes data output Hi-Z, tSHZ after the clock and masks the output.
Blocks data input when DQM active. (Byte masking)
DQM0 ~ 7
Data input/output mask
DQ0 ~ 63
VDD/VSS
Data input/output
Data inputs/outputs are multiplexed on the same pins.
Power and ground for the input buffers and the core logic.
Power supply/ground
Rev. 0.4 Jun 2001
PC100/PC133 512MB SODIMM
M464S6453BK0
FUNCTIONAL BLOCK DIAGRAM
CKE1
CKE0
CS1
CS0
DQM0
DQM4
DQM
DQM
CS0 CS1
CKE0CKE1
CS0 CS1CKE0 CKE1
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
DQ32
DQ33
DQ34
DQ35
DQ36
DQ37
DQ38
DQ39
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
U0
U4
DQM1
DQM5
DQM
DQM
CS0 CS1
CKE0CKE1
CS0 CS1CKE0 CKE1
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
DQ8
DQ9
DQ40
DQ41
DQ42
DQ43
DQ44
DQ45
DQ46
DQ47
DQ10
DQ11
DQ12
DQ13
DQ14
DQ15
U1
U5
DQM2
DQM6
DQM
DQM
CS0 CS1 CKE0CKE1
CS0 CS1CKE0 CKE1
DQ48
DQ49
DQ50
DQ51
DQ52
DQ53
DQ54
DQ55
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
DQ16
DQ17
DQ18
DQ19
DQ20
DQ21
DQ22
DQ23
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
U2
U6
DQM7
DQM3
DQM
DQM
CS0 CS1
CKE0CKE1
CS0 CS1CKE0 CKE1
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
DQ24
DQ25
DQ26
DQ27
DQ28
DQ29
DQ30
DQ31
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
DQ56
DQ57
DQ58
DQ59
DQ60
DQ61
DQ62
DQ63
U3
U7
SDRAM U0 ~ U7
SDRAM U0 ~ U7
SDRAM U0 ~ U7
SDRAM U0 ~ U7
SDRAM U0 ~ U7
A0 ~ A12, BA0 & 1
RAS
CAS
Serial PD
SDA
WP
SCL
SA0 SA1 SA2
WE
CKE0 & 1
10W
DQn
Every DQ pin of SDRAM
U0/U4
·
·
U1/U5
U2/U6
U3/U7
VDD
Vss
·
CLK0/1
Three 0.1 uF X7R 0603 Capacitors
per each SDRAM
To all SDRAMs
Rev. 0.4 Jun 2001
PC100/PC133 512MB SODIMM
M464S6453BK0
ABSOLUTE MAXIMUM RATINGS
Parameter
Voltage on any pin relative to Vss
Voltage on VDD supply relative to Vss
Storage temperature
Symbol
VIN, VOUT
VDD, VDDQ
TSTG
Value
-1.0 ~ 4.6
-1.0 ~ 4.6
-55 ~ +150
8
Unit
V
V
°C
W
Power dissipation
PD
Short circuit current
IOS
50
mA
Note :
Permanent device damage may occur if "ABSOLUTE MAXIMUM RATINGS" are exceeded.
Functional operation should be restricted to recommended operating condition.
Exposure to higher than recommended voltage for extended periods of time could affect device reliability.
DC OPERATING CONDITIONS AND CHARACTERISTICS
Recommended operating conditions (Voltage referenced to VSS = 0V, TA = 0 to 70°C)
Parameter
Supply voltage
Symbol
VDD
VIH
Min
3.0
2.0
-0.3
2.4
-
Typ
Max
Unit
V
Note
3.3
3.6
Input high voltage
Input low voltage
3.0
VDDQ+0.3
V
1
VIL
0
-
0.8
-
V
2
Output high voltage
Output low voltage
Input leakage current
VOH
VOL
ILI
V
IOH = -2mA
IOL = 2mA
3
-
0.4
10
V
-10
-
uA
Notes :
1. VIH (max) = 5.6V AC.The overshoot voltage duration is £ 3ns.
2. VIL (min) = -2.0V AC. The undershoot voltage duration is £ 3ns.
3. Any input 0V £ VIN £ VDDQ.
Input leakage currents include Hi-Z output leakage for all bi-directional buffers with Tri-State outputs.
CAPACITANCE (VDD = 3.3V, TA = 23°C, f = 1MHz, VREF = 1.4V ± 200 mV)
Parameter
Symbol
Min
Max
Unit
Input capacitance (A0 ~ A12, BA0 ~ BA1)
Input capacitance (RAS, CAS, WE)
Input capacitance (CKE0 ~ CKE1)
Input capacitance (CLK0 ~ CLK1)
Input capacitance (CS0 ~ CS1)
CIN1
CIN2
CIN3
CIN4
CIN5
CIN6
COUT
45
45
35
25
35
10
15
90
90
60
45
60
25
30
pF
pF
pF
pF
pF
pF
pF
Input capacitance (DQM0 ~ DQM7)
Data input/output capacitance (DQ0 ~ DQ63)
Rev. 0.4 Jun 2001
PC100/PC133 512MB SODIMM
M464S6453BK0
DC CHARACTERISTICS
(Recommended operating condition unless otherwise noted, TA = 0 to 70°C)
Version
Sym-
bol
Parameter
Test Condition
Unit Note
7A
75
1H
1L
Burst length = 1
tRC ³ tRC(min)
IO = 0 mA
Operating current
(One bank active)
ICC1
1,200
1,120
mA
mA
1
ICC2P
CKE £ VIL(max), tCC = 10ns
CKE & CLK £ VIL(max), tCC =¥
38
38
Precharge standby current
in power-down mode
ICC2PS
CKE ³ VIH(min), CS ³ VIH(min), tCC = 10ns
Input signals are changed one time during 20ns
ICC2N
310
270
Precharge standby current
in non power-down mode
mA
mA
CKE ³ VIH(min), CLK £ VIL(max), tCC =¥
Input signals are stable
ICC2NS
ICC3P
CKE £ VIL(max), tCC = 10ns
CKE & CLK £ VIL(max), tCC =¥
120
120
Active standby current in
power-down mode
ICC3PS
CKE ³ VIH(min), CS ³ VIH(min), tCC = 10ns
Input signals are changed one time during 20ns
ICC3N
580
480
mA
mA
Active standby current in
non power-down mode
(One bank active)
CKE ³ VIH(min), CLK £ VIL(max), tCC =¥
Input signals are stable
ICC3NS
IO = 0 mA
Operating current
(Burst mode)
Page burst
4Banks activated
tCCD = 2CLKs
ICC4
1,360
2,000
1,160
1,920
mA
1
2
Refresh current
ICC5
ICC6
tRC ³ tRC(min)
mA
mA
mA
C
48
24
Self refresh current
CKE £ 0.2V
L
Notes :
1. Measured with outputs open.
2. Refresh period is 64ms.
3. Unless otherwise noted, input swing level is CMOS(VIH/VIL=VDDQ/VSSQ)
Rev. 0.4 Jun 2001
PC100/PC133 512MB SODIMM
M464S6453BK0
AC OPERATING TEST CONDITIONS (VDD = 3.3V ± 0.3V, TA = 0 to 70°C)
Parameter
AC input levels (Vih/Vil)
Value
2.4/0.4
1.4
Unit
V
Input timing measurement reference level
Input rise and fall time
V
tr/tf = 1/1
1.4
ns
V
Output timing measurement reference level
Output load condition
See Fig. 2
3.3V
Vtt = 1.4V
1200W
50W
VOH (DC) = 2.4V, IOH = -2mA
VOL (DC) = 0.4V, IOL = 2mA
Output
Output
Z0 = 50W
50pF
50pF
870W
(Fig. 1) DC output load circuit
(Fig. 2) AC output load circuit
OPERATING AC PARAMETER
(AC operating conditions unless otherwise noted)
Version
-1H
20
Parameter
Symbol
Unit
Note
-7A
15
20
20
45
-75
15
20
20
45
-1L
20
20
20
50
Row active to row active delay
RAS to CAS delay
tRRD(min)
tRCD(min)
tRP(min)
ns
ns
1
1
1
1
20
Row precharge time
20
ns
tRAS(min)
tRAS(max)
tRC(min)
50
ns
Row active time
100
70
us
Row cycle time
65
65
70
ns
1
2,5
5
Last data in to row precharge
Last data in to Active delay
Last data in to new col. address delay
Last data in to burst stop
tRDL(min)
tDAL(min)
tCDL(min)
tBDL(min)
tCCD(min)
2
CLK
-
2 CLK + 20 ns
1
CLK
CLK
CLK
2
1
2
Col. address to col. address delay
1
3
CAS latency=3
CAS latency=2
2
Number of valid output
data
ea
4
1
-
1
Notes :
1. The minimum number of clock cycles is determined by dividing the minimum time required with clock cycle time
and then rounding off to the next higher integer.
2. Minimum delay is required to complete write.
3. All parts allow every cycle column address change.
4. In case of row precharge interrupt, auto precharge and read burst stop.
Rev. 0.4 Jun 2001
PC100/PC133 512MB SODIMM
M464S6453BK0
AC CHARACTERISTICS (AC operating conditions unless otherwise noted)
REFER TO THE INDIVIDUAL COMPONENT, NOT THE WHOLE MODULE.
7A
-75
-1H
-1L
Parameter
Symbol
Unit
ns
Note
1
Min
7.5
10
-
Max
Min
7.5
-
Max
Min
10
Max
Min
10
Max
CAS latency=3
CLK cycle time
tCC
1000
1000
1000
1000
CAS latency=2
CAS latency=3
CAS latency=2
CAS latency=3
CAS latency=2
10
12
5.4
6
-
5.4
-
6
6
6
7
CLK to valid output
delay
tSAC
ns
1,2
2
-
-
3
3
3
3
3
3
2
1
1
3
3
3
3
2
1
1
Output data hold
time
tOH
ns
3
-
CLK high pulse width
CLK low pulse width
Input setup time
tCH
tCL
2.5
2.5
1.5
0.8
1
2.5
2.5
1.5
0.8
1
ns
ns
ns
ns
ns
3
3
3
3
2
tSS
tSH
tSLZ
Input hold time
CLK to output in Low-Z
CAS latency=3
CAS latency=2
5.4
6
5.4
6
6
6
7
CLK to output in
Hi-Z
tSHZ
ns
Notes :
1. Parameters depend on programmed CAS latency.
2. If clock rising time is longer than 1ns, (tr/2-0.5)ns should be added to the parameter.
3. Assumed input rise and fall time (tr & tf) = 1ns.
If tr & tf is longer than 1ns, transient time compensation should be considered,
i.e., [(tr + tf)/2-1]ns should be added to the parameter.
Rev. 0.4 Jun 2001
PC100/PC133 512MB SODIMM
M464S6453BK0
SIMPLIFIED TRUTH TABLE
A12, A11
A9 ~ A0
Command
CKEn-1
CKEn
CS
RAS
CAS
WE
DQM BA0,1
A10/AP
Note
Register
Refresh
Mode register set
Auto refresh
H
X
H
L
L
L
L
L
X
OP code
1,2
3
H
L
L
L
L
H
X
X
X
X
Entry
3
Self
L
H
L
H
X
L
H
X
H
H
X
H
3
refresh
Exit
H
3
Bank active & row addr.
H
H
X
X
X
X
V
V
Row address
Column
address
(A0 ~ A8)
Read &
column address
Auto precharge disable
Auto precharge enable
Auto precharge disable
Auto precharge enable
L
H
L
4
4,5
4
L
L
H
H
L
L
H
L
Column
address
(A0 ~ A8)
Write &
column address
H
X
X
V
H
X
L
4,5
6
Burst stop
Precharge
H
H
X
X
L
L
H
L
H
H
L
L
X
X
Bank selection
All banks
V
X
X
H
H
L
X
V
X
X
H
X
V
X
V
X
X
H
X
V
X
V
X
X
H
X
V
Entry
H
L
X
Clock suspend or
active power down
X
X
Exit
L
H
L
X
H
L
X
X
Entry
H
Precharge power down mode
H
L
Exit
L
H
X
X
X
DQM
H
H
V
X
X
X
7
H
L
X
H
X
H
X
H
No operation command
(V=Valid, X=Don¢t care, H=Logic high, L=Logic low)
Notes :
1. OP Code : Operand code
A0 ~ A12 & BA0 ~ BA1 : Program keys. (@ MRS)
2. MRS can be issued only at all banks precharge state.
A new command can be issued after 2 clock cycles of MRS.
3. Auto refresh functions are as same as CBR refresh of DRAM.
The automatical precharge without row precharge command is meant by "Auto".
Auto/self refresh can be issued only at all banks precharge state.
4. BA0 ~ BA1 : Bank select addresses.
If both BA0 and BA1 are "Low" at read, write, row active and precharge, bank A is selected.
If both BA0 is "High" and BA1 is "Low" at read, write, row active and precharge, bank B is selected.
If both BA0 is "Low" and BA1 is "High" at read, write, row active and precharge, bank C is selected.
If both BA0 and BA1 are "High" at read, write, row active and precharge, bank D is selected.
If A10/AP is "High" at row precharge, BA0 and BA1 is ignored and all banks are selected.
5. During burst read or write with auto precharge, new read/write command can not be issued.
Another bank read/write command can be issued after the end of burst.
New row active of the associated bank can be issued at tRP after the end of burst.
6. Burst stop command is valid at every burst length.
7. DQM sampled at positive going edge of a CLK and masks the data-in at the very CLK (Write DQM latency is 0),
but makes Hi-Z state the data-out of 2 CLK cycles after. (Read DQM latency is 2)
Rev. 0.4 Jun 2001
PC100/PC133 512MB SODIMM
M464S6453BK0
PACKAGE DIMENSIONS
Units : Inches (Millimeters)
2.66
(67.60)
2.50
(63.60)
2-R 0.078 Min
(2.00 Min)
0.16 ± 0.039
(4.00 ± 0.10)
1
59
61
143
0.91
(23.20)
1.29
(32.80)
0.13
(3.30)
2-f 0.07
(1.80)
0.18
(4.60)
0.083
(2.10)
0.10
(2.50)
Z
Y
0.15
(3.70)
2
60
62
144
0.150 Max
(3.80 Max)
0.024 ± 0.001
(0.600 ± 0.050)
0.16 ± 0.0039
(4.00 ± 0.10)
0.008 ±0.006
(0.200 ±0.150)
0.06 ± 0.0039
(1.50 ± 0.1)
0.03 TYP
(0.80 TYP)
0.04 ± 0.0039
(1.00 ± 0.10)
Detail Y
Detail Z
Tolerances : ±.006(.15) unless otherwise specified
The used device is 64Mx8 SDRAM, TSOP
SDRAM Part No. : K4S510832B-K*
Rev. 0.4 Jun 2001
相关型号:
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