M53620800CB0-C60 [SAMSUNG]

Fast Page DRAM Module, 8MX36, 60ns, CMOS, SIMM-72;
M53620800CB0-C60
型号: M53620800CB0-C60
厂家: SAMSUNG    SAMSUNG
描述:

Fast Page DRAM Module, 8MX36, 60ns, CMOS, SIMM-72

动态存储器 内存集成电路
文件: 总15页 (文件大小:289K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
M53620800CW0/CB0  
M53620810CW0/CB0  
DRAM MODULE  
M53620800CW0/CB0 & M53620810CW0/CB0 with Fast Page Mode  
8M x 36 DRAM SIMM using 4Mx4 and 16M Quad CAS, 4K/2K Refresh, 5V  
GENERAL DESCRIPTION  
FEATURES  
• Part Identification  
The Samsung M5362080(1)0C is a 8Mx36bits Dynamic RAM  
high density memory module. The Samsung M5362080(1)0C  
consists of sixteen CMOS 4Mx4bits DRAMs in 24-pin SOJ  
package and two CMOS 4Mx4 bit Quad CAS DRAM in 28-pin  
SOJ package mounted on a 72-pin glass-epoxy substrate. A  
0.1 or 0.22uF decoupling capacitor is mounted on the printed  
circuit board for each DRAM. The M5362080(1)0C is a Single  
In-line Memory Module with edge connections and is intended  
for mounting into 72 pin edge connector sockets.  
- M53620800CW0-C(4096 cycles/64ms Ref, SOJ, Solder)  
- M53620800CB0-C(4096 cycles/64ms Ref, SOJ, Gold)  
- M53620810CW0-C(2048 cycles/32ms Ref, SOJ, Solder)  
- M53620810CB0-C(2048 cycles/32ms Ref, SOJ, Gold)  
• Fast Page Mode Operation  
• CAS-before-RAS refresh capability  
• RAS-only and Hidden refresh capability  
• TTL compatible inputs and outputs  
• Single +5V±10% power supply  
PERFORMANCE RANGE  
• JEDEC standard PDPin & pinout  
Speed  
tRAC  
50ns  
60ns  
tCAC  
13ns  
15ns  
tRC  
• PCB : Height(1000mil), double sided component  
-50  
90ns  
110ns  
-60  
PIN CONFIGURATIONS  
PIN NAMES  
Pin  
Symbol  
Pin  
Symbol  
Pin Name  
A0 - A11  
A0 - A10  
DQ0 - DQ35  
W
Function  
Address Inputs(4K Ref)  
Address Inputs(2K Ref)  
Data In/Out  
1
2
3
4
5
6
7
8
VSS  
DQ0  
DQ18  
DQ1  
DQ19  
DQ2  
DQ20  
DQ3  
DQ21  
Vcc  
NC  
A0  
A1  
A2  
37  
38  
39  
40  
41  
42  
43  
44  
45  
46  
47  
48  
49  
50  
51  
52  
53  
54  
55  
56  
57  
58  
59  
60  
61  
62  
63  
64  
65  
66  
67  
68  
69  
70  
71  
72  
DQ17  
DQ35  
Vss  
CAS0  
CAS2  
CAS3  
CAS1  
RAS0  
RAS1  
NC  
Read/Write Enable  
Row Address Strobe  
Column Address Strobe  
Presence Detect  
Power(+5V)  
RAS0, RAS1  
CAS0 - CAS3  
PD1 -PD4  
Vcc  
9
10  
11  
12  
13  
14  
15  
16  
17  
18  
19  
20  
21  
22  
23  
24  
25  
26  
27  
28  
29  
30  
31  
32  
33  
34  
35  
36  
W
NC  
DQ9  
DQ27  
DQ10  
DQ28  
DQ11  
DQ29  
DQ12  
DQ30  
DQ13  
DQ31  
Vcc  
DQ32  
DQ14  
DQ33  
DQ15  
DQ34  
DQ16  
NC  
Vss  
Ground  
A3  
A4  
A5  
A6  
NC  
No Connection  
A10  
DQ4  
DQ22  
DQ5  
DQ23  
DQ6  
DQ24  
DQ7  
DQ25  
A7  
A11  
Vcc  
A8  
A9  
RAS1  
RAS0  
DQ26  
DQ8  
PRESENCE DETECT PINS (Optional)  
Pin  
50NS  
60NS  
PD1  
PD2  
PD3  
PD4  
NC  
Vss  
Vss  
Vss  
NC  
Vss  
NC  
NC  
* Pin connection changing available  
PD1  
PD2  
PD3  
PD4  
NC  
Vss  
SAMSUNG ELECTRONICS CO., LTD. reserves the right to  
change products and specifications without notice.  
* NOTE : A11 is used for only M53620800CW0/CB0 (4K ref.)  
M53620800CW0/CB0  
M53620810CW0/CB0  
DRAM MODULE  
FUNCTIONAL BLOCK DIAGRAM  
DQ0-DQ3  
DQ4-DQ7  
DQ0  
DQ1  
DQ2  
DQ3  
DQ0  
DQ1  
DQ2  
CAS  
RAS  
OE  
CAS0  
RAS0  
CAS0  
RAS1  
CAS  
RAS  
OE  
U0  
A0-  
U9  
A0-  
A11(A10)  
DQ3  
W
W
W
W
W
W
W
W
A11(A10)  
W
W
W
W
W
W
W
W
DQ0  
DQ1  
DQ2  
DQ3  
DQ0  
CAS  
RAS  
OE  
CAS  
RAS  
OE  
U1  
U10  
DQ1  
DQ2  
DQ3  
A0-  
A11(A10)  
A0-  
A11(A10)  
DQ9-DQ12  
DQ13-DQ16  
DQ18-DQ21  
DQ22-DQ25  
DQ27-DQ30  
DQ31-DQ34  
DQ0  
DQ1  
DQ2  
DQ3  
DQ0  
CAS1  
CAS2  
CAS3  
CAS1  
CAS2  
CAS3  
CAS  
CAS  
RAS  
OE  
U2  
U11  
DQ1  
DQ2  
DQ3  
RAS  
OE  
A0-  
A11(A10)  
A0-  
A11(A10)  
DQ0  
DQ1  
DQ2  
DQ3  
DQ0  
CAS  
RAS  
OE  
CAS  
RAS  
OE  
U3  
U12  
DQ1  
DQ2  
DQ3  
A0-  
A11(A10)  
A0-  
A11(A10)  
DQ0  
DQ1  
DQ2  
DQ3  
DQ0  
CAS  
RAS  
OE  
CAS  
RAS  
OE  
U4  
U13  
DQ1  
DQ2  
DQ3  
A0-  
A11(A10)  
A0-  
A11(A10)  
DQ0  
DQ1  
DQ2  
DQ3  
DQ0  
CAS  
RAS  
OE  
CAS  
RAS  
OE  
U5  
U14  
DQ1  
DQ2  
DQ3  
A0-  
A11(A10)  
A0-  
A11(A10)  
DQ0  
DQ1  
DQ2  
DQ3  
DQ0  
CAS  
RAS  
OE  
CAS  
RAS  
OE  
U6  
U15  
DQ1  
DQ2  
DQ3  
A0-  
A11(A10)  
A0-  
A11(A10)  
DQ0  
DQ1  
DQ2  
DQ3  
DQ0  
CAS  
RAS  
OE  
CAS  
RAS  
OE  
U7  
U16  
DQ1  
DQ2  
DQ3  
A0-  
A11(A10)  
A0-  
A11(A10)  
CAS0  
CAS1  
CAS2  
CAS3  
RAS  
CAS0  
CAS1  
CAS2  
CAS3  
RAS  
DQ8  
DQ17  
DQ26  
DQ35  
DQ0  
DQ1  
DQ2  
DQ3  
DQ0  
U8  
U17  
DQ1  
DQ2  
DQ3  
A0-  
A11(A10)  
A0-  
A11(A10)  
OE  
OE  
W
W
W
A0-A11(A10)  
Vcc  
Vss  
.1 or .22uF Capacitor  
for each DRAM  
To all DRAMs  
M53620800CW0/CB0  
M53620810CW0/CB0  
DRAM MODULE  
ABSOLUTE MAXIMUM RATINGS *  
Item  
Symbol  
Rating  
Unit  
Voltage on any pin relative to VSS  
Voltage on VCC supply relative to VSS  
Storage Temperature  
VIN, VOUT  
VCC  
-1 to +7.0  
-1 to +7.0  
-55 to +150  
18  
V
V
°C  
W
Tstg  
Pd  
Power Dissipation  
Short Circuit Output Current  
IOS  
50  
mA  
* Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are exceeded. Functional operation should be restricted to  
the conditions as detailed in the operational sections of this data sheet. Exposure to absolute maximum rating conditions for intended  
periods may affect device reliability.  
RECOMMENDED OPERATING CONDITIONS (Voltage referenced to VSS, TA = 0 to 70°C)  
Item  
Symbol  
Min  
Typ  
Max  
Unit  
4.5  
0
2.4  
5.5  
0
Supply Voltage  
Ground  
Input High Voltage  
Input Low Voltage  
VCC  
VSS  
VIH  
VIL  
5.0  
0
-
V
V
V
V
*1  
VCC+1  
0.8  
*2  
-
-1.0  
*1 : VCC+2.0V/20ns, Pulse width is measured at VCC.  
*2 : -2.0V/20ns, Pulse width is measured at VSS.  
DC AND OPERATING CHARACTERISTICS (Recommended operating conditions unless otherwise noted)  
M53620800CW0/CB0  
M53620810CW0/CB0  
Symbol  
Speed  
Unit  
Min  
Max  
Min  
Max  
ICC1  
-50  
-60  
828  
738  
1008  
918  
mA  
mA  
-
-
-
-
ICC2  
ICC3  
Don¢t care  
-
36  
-
36  
mA  
-50  
-60  
-
-
828  
738  
-
-
1008  
918  
mA  
mA  
ICC4  
-50  
-60  
-
-
738  
648  
-
-
828  
738  
mA  
mA  
ICC5  
ICC6  
Don¢t care  
-
18  
-
18  
mA  
-50  
-60  
-
-
828  
738  
-
-
1008  
918  
mA  
mA  
II(L)  
IO(L)  
-90  
-10  
90  
10  
-90  
-10  
90  
10  
uA  
uA  
Don¢t care  
Don¢t care  
VOH  
VOL  
2.4  
-
-
2.4  
-
-
V
V
0.4  
0.4  
ICC1  
: Operating Current * (RAS, CAS, Address cycling @tRC=min)  
ICC2 : Standby Current (RAS=CAS=W=VIH)  
ICC3  
ICC4  
ICC5  
ICC6  
II(L)  
: RAS Only Refresh Current * (CAS=VIH, RAS cycling @tRC=min)  
: Fast Page Mode Current * (RAS=VIL, CAS Address cycling : tPC=min)  
: Standby Current (RAS=CAS=W=Vcc-0.2V)  
: CAS-Before-RAS Refresh Current * (RAS and CAS cycling @tRC=min)  
: Input Leakage Current (Any input 0£VIN£Vcc+0.5V, all other pins not under test=0 V)  
IO(L) : Output Leakage Current(Data Out is disabled, 0V£VOUT£Vcc)  
VOH : Output High Voltage Level (IOH = -5mA)  
: Output Low Voltage Level (IOL = 4.2mA)  
VOL  
* NOTE :  
ICC1, ICC3, ICC4 and ICC6 are dependent on output loading and cycle rates. Specified values are obtained with the output open.  
ICC is specified as an average current. In ICC1 and ICC3, address can be changed maximum once while RAS=VIL. In ICC4,  
address can be changed maximum once within one page mode cycle, tPC.  
M53620800CW0/CB0  
M53620810CW0/CB0  
DRAM MODULE  
CAPACITANCE (TA = 25°C, VCC=5V, f = 1MHz)  
Item  
Symbol  
Min  
Max  
Unit  
Input capacitance[A0-A11(A10)]  
Input capacitance[W]  
CIN1  
CIN2  
CIN3  
CIN4  
CDQ  
110  
130  
80  
pF  
pF  
pF  
pF  
pF  
-
-
-
-
-
Input capacitance[RAS0, RAS1]  
Input capacitance[CAS0 - CAS3]  
Input/Output capacitance[DQ0-35]  
40  
25  
AC CHARACTERISTICS (0°C£TA£70°C, VCC=5.0V±10%. See notes 1,2.)  
Test condition : Vih/Vil=2.4/0.8V, Voh/Vol=2.4/0.4V, Output loading CL=100pF  
-50  
-60  
Parameter  
Symbol  
Unit  
Note  
Min  
Max  
Min  
Max  
Random read or write cycle time  
Access time from RAS  
90  
110  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ms  
ms  
ns  
ns  
ns  
ns  
tRC  
50  
13  
25  
60  
15  
30  
3,4  
3,4,5  
3,10  
3
tRAC  
tCAC  
tAA  
Access time from CAS  
Access time from column address  
CAS to output in Low-Z  
0
0
0
0
tCLZ  
tOFF  
tT  
Output buffer turn-off delay  
Transition time(rise and fall)  
RAS precharge time  
13  
50  
15  
50  
6
3
3
2
30  
50  
13  
50  
13  
20  
15  
5
40  
60  
15  
60  
15  
20  
15  
5
tRP  
RAS pulse width  
10K  
10K  
tRAS  
tRSH  
tCSH  
tCAS  
tRCD  
tRAD  
tCRP  
tASR  
tRAH  
tASC  
tCAH  
tRAL  
tRCS  
tRCH  
tRRH  
tWCH  
tWP  
RAS hold time  
CAS hold time  
CAS pulse width  
10K  
37  
10K  
45  
RAS to CAS delay time  
4
RAS to column address delay time  
CAS to RAS precharge time  
Row address set-up time  
Row address hold time  
25  
30  
10  
0
0
10  
0
10  
0
Column address set-up time  
Column address hold time  
Column address to RAS lead time  
Read command set-up time  
Read command hold time referenced to CAS  
Read command hold time referenced to RAS  
Write command hold time  
Write command pulse width  
Write command to RAS lead time  
Write command to CAS lead time  
Data-in set-up time  
10  
25  
0
10  
30  
0
0
0
8
8
0
0
10  
10  
13  
13  
0
10  
10  
15  
15  
0
tRWL  
tCWL  
tDS  
9
9
Data-in hold time  
10  
15  
tDH  
Refresh period (4K Ref)  
64  
32  
64  
32  
tREF  
tREF  
tWCS  
tCSR  
tCHR  
tRPC  
Refresh period (2K Ref)  
Write command set-up time  
CAS setup time(CAS-before-RAS refresh)  
CAS hold time(CAS-before-RAS refresh)  
RAS precharge to CAS hold time  
0
5
0
5
7
10  
5
10  
5
M53620800CW0/CB0  
M53620810CW0/CB0  
DRAM MODULE  
AC CHARACTERISTICS (0°C£TA£70°C, VCC=5.0V±10%. See notes 1,2.)  
Test condition : Vih/Vil=2.4/0.8V, Voh/Vol=2.4/0.4V, Output loading CL=100pF  
-50  
-60  
Parameter  
Symbol  
Unit  
Note  
Min  
Max  
Min  
Max  
Access time from CAS precharge  
Fast page mode cycle time  
30  
35  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
3
tCPA  
tPC  
35  
10  
50  
10  
10  
20  
5
40  
10  
60  
10  
10  
20  
5
CAS precharge time(Fast page cycle)  
RAS pulse width(Fast page cycle)  
W to RAS precharge time(C-B-R refresh)  
W to RAS hold time(C-B-R refresh)  
CAS precharge(C-B-R counter test)  
Hold time CAS low to CAS high  
tCP  
200K  
200K  
tRASP  
tWRP  
tWRH  
tCPT  
tCLCH  
11  
NOTES  
An initial pause of 200us is required after power-up followed  
by any 8 RAS-only or CAS-before-RAS refresh cycles before  
proper device operation is achieved.  
1.  
7. tWCS is non-restrictive operating parameter. It is included in  
the data sheet as electrical characteristics only. If  
tWCS³ tWCS(min), the cycle is an early write cycle and the  
data out pin will remain high impedance for the duration of  
the cycle.  
2. VIH(min) and VIL(max) are reference levels for measuring  
timing of input signals. Transition times are measured  
between VIH(min) and VIL(max) and are assumed to be 5ns  
for all inputs.  
8. Either tRCH or tRRH must be satisfied for a read cycle.  
9. These parameter are referenced to the CAS leading edge in  
early write cycles.  
3. Measured with a load equivalent to 2 TTL loads and 100pF.  
Operation within the tRCD(max) limit insures that tRAC(max)  
can be met. tRCD(max) is specified as a reference point only.  
If tRCD is greater than the specified tRCD(max) limit, then  
access time is controlled exclusively by tCAC.  
4.  
Operation within the tRAD(max) limit insures that tRAC(max)  
can be met. tRAD(max) is specified as reference point only. If  
tRAD is greater than the specified tRAD(max) limit, then  
access time is controlled by tAA.  
10.  
11.  
5.  
6.  
Assumes that tRCD³ tRCD(max).  
In order to hold the address latched by the first CAS going  
low, the parameter tCLCH must be met.  
This parameter defines the time at which the output achieves  
the open circuit condition and is not referenced to VOH or  
VOL.  
M53620800CW0/CB0  
M53620810CW0/CB0  
DRAM MODULE  
READ CYCLE  
tRC  
tRAS  
tRP  
VIH -  
RAS  
VIL -  
tCSH  
tCRP  
tASR  
tCRP  
tRCD  
tRSH  
tCAS  
VIH -  
CAS  
VIL -  
tRAD  
tRAL  
tRAH  
tASC  
tRCS  
tCAH  
VIH -  
COLUMN  
ADDRESS  
ROW  
ADDRESS  
A
VIL -  
tRCH  
tRRH  
VIH -  
W
VIL -  
tAA  
tCAC  
tCLZ  
tOFF  
tRAC  
VOH -  
DQ  
OPEN  
DATA-OUT  
VOL -  
Don¢t care  
Undefined  
M53620800CW0/CB0  
M53620810CW0/CB0  
DRAM MODULE  
WRITE CYCLE ( EARLY WRITE )  
NOTE : DOUT = OPEN  
tRC  
tRAS  
tRP  
VIH -  
RAS  
VIL -  
tCSH  
tCRP  
tCRP  
tRCD  
tRSH  
tCAS  
VIH -  
CAS  
VIL -  
tRAD  
tRAL  
tASR  
tRAH  
tASC  
tCAH  
VIH -  
VIL -  
ROW  
ADDRESS  
COLUMN  
ADDRESS  
A
tCWL  
tRWL  
tWCS  
tWCH  
tWP  
VIH -  
VIL -  
W
tDS  
tDH  
DATA-IN  
VIH -  
VIL -  
DQ  
Don¢t care  
Undefined  
M53620800CW0/CB0  
M53620810CW0/CB0  
DRAM MODULE  
FAST PAGE READ CYCLE  
NOTE : DOUT = OPEN  
tRP  
tRASP  
¡ó  
VIH -  
tRHCP  
RAS  
VIL -  
tPC  
tCRP  
tCP  
tRCD  
tCP  
tRSH  
tCAS  
tCAS  
¡ó  
VIH -  
CAS  
tCAS  
VIL -  
tRAD  
tASC  
tCSH  
tASR  
ROW  
tASC  
tCAH  
tASC  
tCAH  
tRAH  
tCAH  
¡ó  
¡ó  
VIH -  
VIL -  
COLUMN  
COLUMN  
ADDRESS  
COLUMN  
A
ADDRESS  
ADDR  
ADDRESS  
tRCS  
tRRH  
tRCS  
tRCH  
tCAC  
tRCS  
tRCH  
¡ó  
VIH -  
VIL -  
W
tCAC  
tCAC  
tAA  
tOFF  
tAA  
tAA  
tOFF  
tOFF  
tRAC  
tCLZ  
tCLZ  
tCLZ  
VOH -  
VOL -  
VALID  
DATA-OUT  
VALID  
DATA-OUT  
VALID  
DATA-OUT  
DQ  
Don¢t care  
Undefined  
M53620800CW0/CB0  
M53620810CW0/CB0  
DRAM MODULE  
FAST PAGE WRITE CYCLE ( EARLY WRITE )  
NOTE : DOUT = OPEN  
tRP  
tRASP  
¡ó  
VIH -  
tRHCP  
RAS  
VIL -  
tPC  
tPC  
tCRP  
tCP  
tRCD  
tCP  
tRSH  
tCAS  
tCAS  
¡ó  
VIH -  
VIL -  
tCAS  
CAS  
tRAD  
tASC  
tRAH  
ROW  
tCStHCAH  
tASC  
tCAH  
tASC  
tCAH  
tASR  
¡ó  
¡ó  
VIH -  
VIL -  
COLUMN  
ADDRESS  
COLUMN  
ADDRESS  
COLUMN  
ADDRESS  
A
ADDR  
tWCS  
tWCS  
tWCH  
tWP  
tWCS  
tWCH  
¡ó  
tWCH  
tWP  
VIH -  
VIL -  
tWP  
W
tCWL  
tRWL  
tDH  
tCWL  
tCWL  
tDH  
tDS  
tDH  
tDS  
tDS  
¡ó  
¡ó  
VIH -  
VIL -  
VALID  
DATA-IN  
VALID  
DATA-IN  
VALID  
DATA-IN  
DQ  
Don¢t care  
Undefined  
M53620800CW0/CB0  
M53620810CW0/CB0  
DRAM MODULE  
RAS - ONLY REFRESH CYCLE  
NOTE : W, OE, DIN = Don't care  
DOUT = OPEN  
tRC  
tRP  
tRAS  
VIH -  
RAS  
VIL -  
tRPC  
tCRP  
tCRP  
VIH -  
CAS  
VIL -  
tASR  
tRAH  
VIH -  
VIL -  
ROW  
ADDR  
A
CAS - BEFORE - RAS REFRESH CYCLE  
NOTE : OE, A = Don't care  
tRC  
tRP  
tRAS  
tRP  
VIH -  
RAS  
tRPC  
tCP  
VIL -  
tRPC  
VIH -  
VIL -  
tCSR  
tWRP  
CAS  
W
tCHR  
tWRH  
VIH -  
VIL -  
tOFF  
VOH -  
VOL -  
DQ  
OPEN  
Don¢t care  
Undefined  
M53620800CW0/CB0  
M53620810CW0/CB0  
DRAM MODULE  
HIDDEN REFRESH CYCLE ( READ )  
tRC  
tRC  
tRP  
tRP  
tRAS  
tRAS  
VIH -  
RAS  
VIL -  
tCRP  
tRCD  
tRSH  
tCHR  
VIH -  
VIL -  
CAS  
tRAD  
tASR  
tRAH  
tASC  
tRCS  
tCAH  
COLUMN  
ADDRESS  
VIH -  
VIL -  
ROW  
ADDRESS  
A
tWRH  
tWRP  
tRRH  
VIH -  
VIL -  
W
tAA  
tCAC  
tCLZ  
tOFF  
tRAC  
VOH -  
VOL -  
DQ  
OPEN  
DATA-OUT  
Don¢t care  
Undefined  
M53620800CW0/CB0  
M53620810CW0/CB0  
DRAM MODULE  
HIDDEN REFRESH CYCLE ( WRITE )  
NOTE : DOUT = OPEN  
tRC  
tRC  
tRP  
tRP  
tRAS  
tRAS  
VIH -  
RAS  
VIL -  
tCRP  
tRCD  
tRSH  
tCHR  
VIH -  
CAS  
VIL -  
tRAD  
tASR  
tRAH  
tASC  
tCAH  
VIH -  
VIL -  
ROW  
ADDRESS  
COLUMN  
ADDRESS  
A
tWRH  
tWRP  
tWCS  
tDS  
tWCH  
VIH -  
VIL -  
W
tWP  
tDH  
VIH -  
VIL -  
DQ  
DATA-IN  
Don¢t care  
Undefined  
M53620800CW0/CB0  
M53620810CW0/CB0  
DRAM MODULE  
CAS-BEFORE-RAS REFRESH COUNTER TEST CYCLE  
tRP  
VIH -  
VIL -  
tRAS  
RAS  
CAS  
tCPT  
tRSH  
tCAS  
tCSR  
VIH -  
VIL -  
tCHR  
tRAL  
tASC  
tCAH  
VIH -  
VIL -  
COLUMN  
ADDRESS  
A
tRRH  
tRCH  
tAA  
tWRP  
tWRH  
READ CYCLE  
tRCS  
tCAC  
VIH -  
W
VIL -  
tOFF  
tCLZ  
VOH -  
DQ  
DATA-OUT  
VOL -  
WRITE CYCLE  
tRWL  
tWRP  
tWRH  
tCWL  
VIH -  
W
tWCS  
tWCH  
tWP  
VIL -  
tDS  
tDH  
DATA-IN  
VIH -  
DQ  
OPEN  
VIL -  
Don¢t care  
Undefined  
NOTE : This timing diagram is applied to all devices besides 16M DRAM 4th & 64M DRAM.  
M53620800CW0/CB0  
M53620810CW0/CB0  
DRAM MODULE  
CAS - BEFORE - RAS SELF REFRESH CYCLE  
NOTE : OE, A = Don¢t care  
tRP  
tRASS  
tRPS  
tRPC  
VIH -  
RAS  
tRPC  
tCP  
VIL -  
tCHS  
VIH -  
VIL -  
tCSR  
CAS  
DQ  
tOFF  
VOH -  
VOL -  
OPEN  
tWRP  
tWRH  
VIH -  
VIL -  
W
TEST MODE IN CYCLE  
NOTE : OE, A = Don¢t care  
tRC  
tRP  
tRAS  
tRP  
VIH -  
RAS  
VIL -  
tRPC  
tCP  
tRPC  
VIH -  
tCSR  
tWTS  
tCHR  
CAS  
VIL -  
tWTH  
VIH -  
W
VIL -  
tOFF  
VOH -  
DQ  
OPEN  
VOL -  
Don¢t care  
Undefined  
M53620800CW0/CB0  
M53620810CW0/CB0  
DRAM MODULE  
PACKAGE DIMENSIONS  
Units : Inches (millimeters)  
4.250(107.95)  
3.984(101.19)  
.133(3.38)  
R.062(1.57)  
.125 DIA±.002(3.18±.051)  
.400(10.16)  
1.00(25.40)  
.250(6.35)  
.080(2.03)  
.250(6.35)  
R.062±.004(R1.57±.10)  
.250(6.35)  
3.750(95.25)  
( Front view )  
.125(3.17)  
MIN  
( Back view )  
Gold & Solder Plating Lead  
.350(8.89)  
MAX  
.100(2.54)  
.010(.25)MAX  
MIN  
.225(5.71)  
MIN  
.054(1.37)  
.050(1.27)  
.041±.004(1.04±.10)  
.047(1.19)  
Tolerances : ±.005(.13) unless otherwise specified  
NOTE : The used device are 4Mx4 FP DRAM (SOJ & 300mil) & 4Mx4 Quad CAS with FP DRAM (SOJ & 300mil)  
DRAM Part No. : M53620800CW0/CB0 -- K4F170411C-B(300mil) & K4P170411C-B(300mil)  
M53620810CW0/CB0 -- K4F160411C-B(300mil) & K4P160411C-B(300mil)  
Revision History  
Rev 0.0 : Oct. 1999  

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