LE25FV051T [SANYO]

512k (64k word x 8bits) Serial flash EEPROM; 512K ( 64K字X 8位)串行闪存EEPROM
LE25FV051T
型号: LE25FV051T
厂家: SANYO SEMICON DEVICE    SANYO SEMICON DEVICE
描述:

512k (64k word x 8bits) Serial flash EEPROM
512K ( 64K字X 8位)串行闪存EEPROM

闪存 可编程只读存储器 电动程控只读存储器 电可擦编程只读存储器
文件: 总11页 (文件大小:152K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
LE25FV051T  
3.3V-only 512k-Bit Serial Flash EEPROM  
Preliminary Specifications  
memory contents within the addressed sector are erased  
and other sectors are not inadvertently erased. The erase  
operation begins with the rising edge of the pulse and  
terminates automatically by using an internal timer.  
Termination of this mode is found out by using Status  
Register Read.  
Command Definition  
Table 2 contains a command list and a brief summary  
of the commands. The following is a detailed description  
of the options initiated by each command.  
CS  
Read  
Fig.5 shows the timing waveform of read operation.  
The read operation is initiated by READ command. After  
writing OPcode of “FFH” and following 24bit address and  
16 dummy bits, SO is transformed into Low-impedance  
state, and the specified addresses’ data are read out  
synchronously with SCK clock. While the SCK clock is  
continuously on, the device counts up the next address  
automatically and reads the data in order. When the  
address reaches its maximum, while the read operation  
still be continuing, the address is reset to the lowest one,  
and the device continues reading data from the beginning.  
Byte_Program  
Fig.8 shows the timing waveform of Byte_Program.  
Byte_Program command consists of 6 bus cycles from 1st  
bus cycle to 6th bus cycle, and stages the device for Byte  
programmable. To execute the Byte_Program operation,  
program address, program data and Dummy bits must be  
written to the command register after writing the OPcode  
of (10H). The program operation begins with the rising  
edge of the  
pulse and terminates automatically by  
CS  
using an internal timer. Termination of this mode is found  
out by using Status Register Read.  
When  
is set High so as to deselect the device,  
CS  
the read operation terminates with the output in High-  
impedance state. Do not execute read operation while the  
device is in Byte_Program or Sector_Erase Cycle to  
prevent inadvertent writes.  
Reset  
Fig.9 shows the timing waveform of Reset operation.  
Reset operation is effective while the device is already in  
Program or Erase mode. But the data of specified  
address are not guaranteed. The Reset Command can be  
provided as a means to safely abort the Erase or Program  
Command sequences. Following 4th bus cycles (erase or  
program) with a write of (FFH) in 5th bus cycle will safely  
abort the operation. Memory contents will not be altered.  
Status_Register Read  
Fig.6 shows the timing waveform of Status_Register  
Read.  
Status_Register can be read while the device is in  
Program or Erase mode. As is shown in the table below,  
the LSB (Least Significant Bit) of Status_Register is set to  
with other bits intact. By setting  
to LOW and  
CS  
BSY  
writing “9FH” in command register, the contents of the  
Status_Register come out from MSB. The LSB of the  
Status_Register stands for if the device is busy or not.  
Therefore,”0” stands for busy and “1” for not in Program  
Hardware Write Protection  
Setting  
to LOW prevents inadvertent writes by  
WP  
inhibiting write operation. As  
is connected internally  
WP  
to the Vcc, don’t connect externally to any nodes when  
this function is not necessary. To prevent inadvertent  
writes during system power-up, LE25FV051T has power-  
on-reset circuit.  
or Erase mode. When  
goes High, Status Register  
CS  
reading  
terminates with the output pin in High-  
impedance state.  
7(MSB)  
X
6
5
4
3
2
1
0(LSB)  
To perform power up more safely, the usage of  
X
X
X
X
X
X
BSY  
is recommended as follows. By holding  
RESET  
RESET  
LOW during system power up and setting to High after  
Vcc reaches operation voltage, inadvertent writes can be  
prevented (see Fig.10). Don’t use this function except  
Sector_Erase  
during power up. As  
is connected to Vcc  
RESET  
Fig.7 shows the timing waveform of Sector_Erase.  
Sector_Erase command consists of 6 bus cycles from 1st  
bus cycle to 6th bus cycle. This command stages the  
device for electrical erasing of all bytes within a sector. A  
sector contains 256 bytes. This sector erasability  
enhances the flexibility and usefulness of the  
internally, don’t connect externally to any nodes when this  
function is not necessary.  
Decoupling Capacitors  
Ceramic capacitors (0.1 µF) must be added between  
V
CC and VSS to each device to assure stable flash memory  
LE25FV051T  
, since most applications only need to  
operation.  
change a small number of bytes or sectors, not the  
entire chip. To execute the Sector_Erase operation, erase  
address, 2nd OPcode (D0H) and Dummy bits must be  
written to the command register after writing 1st OPcode  
of (20H). This two-step sequence ensures that only  
SANYO Electric Co., Ltd.  
3/10  
LE25FV051T  
3.3V-only 512k-Bit Serial Flash EEPROM  
Preliminary Specifications  
Absolute Maximum Stress Ratings  
Storage Temperature........................................................-55 °C ~ 150 °C  
Supply Voltage..................................................................-0.5 V ~ 4.6 V  
D.C. Voltage on Any Pin to Grand Potential .....................-0.5 V ~ Vcc + 0.5 V  
Permanent device damage may occur if ABSOLTE MAXIMUM RATINGS are exceeded.  
Operating Range  
Ambient Temperature .......................................................0 °C ~ 70 °C  
Vcc....................................................................................3.0 V ~ 3.6 V  
DC Operating Characteristics  
Symbol  
Parameter  
Limit  
unit  
mA  
mA  
mA  
µA  
Test Condition  
Min.  
Max.  
10  
ICCR  
Power Supply Current  
(Read)  
= VIL  
SO,  
open  
WP  
CS  
SI = VIL / VIH, f = 10MHz, VCC = VCC max.  
VCC = VCC max.  
ICCW  
ISB1  
ISB2  
Power Supply Current  
(Write)  
45  
3
Standby Vcc Current  
(TTL input)  
= VIH  
SO,  
, RESET open  
WP  
CS  
VCC = VCC max.  
Standby Vcc Current  
(CMOS input)  
20  
= VCC–0.3V SO,  
, RESET open  
WP  
CS  
VCC = VCC max.  
ILI  
Input Leakage Current  
Output Leakage Current  
Input Low Voltage  
Input High Voltage  
Output Low Voltage  
Output High Voltage  
10  
10  
µA  
µA  
V
VIN = VSS ~ VCC, VCC = VCC max.  
VIN = VSS ~ VCC, VCC = VCC max.  
VCC = VCC max.  
ILO  
VIL  
VIH  
VOL  
VOH  
–0.3  
2.4  
0.4  
Vcc+0.3  
0.2  
V
VCC = VCC min.  
V
IOL = 100 µA, VCC = VCC min.  
IOH = –100 µA, VCC = VCC min.  
Vcc-0.2  
V
Power-up Timing  
Symbol  
tPU_READ  
tPU_WRITE  
tPU_RST  
Parameter  
Minimum  
Units  
ms  
10  
10  
1
Power-up to Read Operation(without using RESET )  
Power-up to Write Operation(without using RESET )  
From RESET goes High to Command Entry  
ms  
µs  
Capacitance (Ta = 25 °C, f = 1 MHz)  
Symbol  
Description  
DQ Pin Capacitance  
Input Capacitance  
Maximum  
Unit  
pF  
Test Condition  
VDQ = 0V  
CDQ  
CIN  
12  
6
pF  
VIN = 0V  
Note: These parameters are periodically sampled and are not 100% tested.  
SANYO Electric Co., Ltd.  
4/10  
LE25FV051T  
3.3V-only 512k-Bit Serial Flash EEPROM  
Preliminary Specifications  
AC Characteristics  
Symbol  
Parameter  
Limit  
unit  
Min.  
Max.  
10  
fCLK  
tCSS  
tCSH  
tCPH  
tCHZ  
tDS  
Clock Frequency  
MHz  
ns  
CS setup time  
CS hold time  
400  
400  
250  
ns  
CS standby pulse width  
CS to Hi-Z output  
ns  
250  
ns  
Data Setup time  
30  
30  
45  
45  
0
ns  
tDH  
Data hold time  
ns  
tCLH  
tCLL  
tCLZ  
tV  
SCK High pulse width  
SCK Low pulse width  
SCK to Lo-Z output  
SCK to output valid  
Output data hold time  
Sector Erase Cycle Time  
Byte Program Cycle time  
Write Reset Recovery Time  
ns  
ns  
ns  
40  
ns  
tHO  
0
ns  
tSE  
4
35  
4
ms  
µs  
µs  
tBP  
tRST  
AC Test Conditions  
Input Pulse Level.................................................0 V ~ 3.0 V  
Input Rise/Fall Time..............................................5 ns  
Input/Output Timing Level ...................................1.5V  
Input Load Levels..................................................30 pF  
SANYO Electric Co., Ltd.  
5/10  
LE25FV051T  
3.3V-only 512k-Bit Serial Flash EEPROM  
Preliminary Specifications  
Timing waveforms  
Figure 3: Serial Input Timing Diagram  
( SPI mode 0 )  
tCPH  
CS  
tcss  
tCSH  
SCK  
tDS  
tDH  
DATA VALID  
SI  
High Impedance  
High Impedance  
SO  
SPI mode 3 )  
(
tCPH  
CS  
tcss  
tCSH  
SCK  
tDS tDH  
VALID  
SI  
High Impedance  
High Impedance  
SO  
SANYO Electric Co., Ltd.  
6/10  
LE25FV051T  
3.3V-only 512k-Bit Serial Flash EEPROM  
Preliminary Specifications  
Figure 4: Serial Output Timing Diagram  
( SPI mode 0 )  
CS  
tCLH tCLL  
tCSH  
SCK  
tHO  
tCHZ  
tcLZ  
DATA VALID  
SO  
SI  
tV  
( SPI mode 3 )  
CS  
tCLL tCLH  
tCSH  
SCK  
SO  
tHO  
tCHZ  
tcLZ  
DATA VALID  
tV  
SI  
SANYO Electric Co., Ltd.  
7/10  
LE25FV051T  
3.3V-only 512k-Bit Serial Flash EEPROM  
Preliminary Specifications  
(The following is described in SPI mode 0)  
Figure 5: Read Cycle Timing Diagram  
CS  
0
1
2
3
4
5
6
7
8
15 16 23 24 31 32 39 40 47 48 55 56 63 64  
71  
SCK  
SI  
FFH  
Add. Add. Add.  
X
X
N
N+1  
N+2  
High Impedance  
DATA DATA DATA  
MSB MSB MSB  
SO  
Figure 6: Status Register Read Timing Diagram  
CS  
0
1
2
3
4
5
6
7
8
9
10 11 12 13 14 15 16  
23 24 31  
SCK  
SI  
9FH  
High Impedance  
DATA  
DATA DATA  
SO  
MSB  
MSB  
MSB  
SANYO Electric Co., Ltd.  
8/10  
LE25FV051T  
3.3V-only 512k-Bit Serial Flash EEPROM  
Preliminary Specifications  
Figure 7: Sector_Erase Timing Diagram  
Self-timed Sector  
Erase Cycle  
t SE  
CS  
0
1
2
3
4
5
6
7
8
15 16 23 24 31 32 39 40 47  
SCK  
SI  
20H  
Add. Add.  
X
D0H  
X
High Impedance  
SO  
Figure 8: Byte_Program Timing Diagram  
Self-timed Byte  
Program Cycle  
t BP  
CS  
0
1
2
3
4
5
6
7
8
15 16 23 24 31 32 39 40 47  
SCK  
SI  
10H  
Add. Add. Add.  
PD  
X
High Impedance  
SO  
SANYO Electric Co., Ltd.  
9/10  
LE25FV051T  
3.3V-only 512k-Bit Serial Flash EEPROM  
Preliminary Specifications  
Figure 9: Reset Timing Diagram  
Reset Command is effective when the device is only in Erase or Program sequence (in tBP or tSE period).  
t RST  
CS  
0
1 2 3 4 5 6 7  
SCK  
SI  
FFH  
High Impedance  
SO  
Figure 10: Command Entry Recover Timing from RESET goes High  
Vcc  
t PU_RST  
RESET  
SANYO Electric Co., Ltd.  
10/10  

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