S-80138CNPF-JKXTFG [SII]
ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING); 内置延迟电路超小型高精度电压检测器（内部设定延迟时间）
| 型号： | S-80138CNPF-JKXTFG |
| 厂家： | 
SEIKO INSTRUMENTS INC |
| 描述： | ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) |
| 文件： | 总33页 (文件大小：335K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
Rev.3.3_00
ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR
WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING)
S-801 Series
The S-801 Series is a series of high-precision voltage
detectors with a built-in delay time generator of fixed time
developed using CMOS process. The detection voltage is
fixed internally, with an accuracy of ±2.0 %. Internal oscillator
and counter timer can delay the release signal without
external parts. Three delay times 50 ms, 100 ms, and 200 ms
are available. Two output forms, Nch open-drain and CMOS
output, are available.
Features
• Ultra-low current consumption
1.3 μA typ. (at VDD=3.5 V)
±2.0 %
60 mV typ.
2.2 V to 6.0 V (0.1 V step)
A type 50 ms typ.
B type 100 ms typ.
C type 200 ms typ.
• High-precision detection voltage
• Hysteresis characteristics
• Detection voltage
• Three delay times
• ON/OFF switching function of delay time (DS pin)
• Operating voltage range
• Output forms
0.95 V to 10.0 V
Nch open-drain output (Active Low)
CMOS output (Active Low)
• Lead-free products
Applications
• Power monitor for portable equipment such as notebook computers, digital still cameras, PDA, and
cellular phones.
• Constant voltage power monitor for cameras, video equipment and communication devices.
• Power monitor for microcomputers and reset for CPUs.
Packages
Package name
Drawing code
Package
MP005-A
PF004-A
Tape
MP005-A
PF004-A
Reel
MP005-A
PF004-A
Land
—
PF004-A
SOT-23-5
SNT-4A
Seiko Instruments Inc.
1
ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING)
Rev.3.3_00
S-801 Series
Block Diagrams
1. Nch Open-drain Output Products
VDD
Delay circuit
+
−
Oscillator
counter
timer
OUT
*1
*1
*1
VREF
VSS
DS
*1. Parasitic diode
Figure 1
2. CMOS Output Products
VDD
*1
Delay circuit
+
−
OUT
Oscillator
counter
timer
*1
*1
*1
VREF
VSS
DS
*1. Parasitic diode
Figure 2
2
Seiko Instruments Inc.
ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING)
Rev.3.3_00
S-801 Series
Product Name Structure
The detection voltage, delay time, output form and packages for S-801 Series can be selected at the user's
request. Refer to the "1. Product name" for the construction of the product name and "2. Product Name
List" for the full product names.
1. Product Name
S-801xx x x xx - xxx xx G
IC direction in tape specifications*1
T2: SOT-23-5
TF: SNT-4A
Product code*2
Package code
MC: SOT-23-5
PF: SNT-4A
Output form
N: Nch open-drain output (Active low)
L: CMOS output (Active low)
Delay time
A: 50 ms typ.
B: 100 ms typ.
C: 200 ms typ.
Detection voltage value
22 to 60
(e.g. When the detection voltage is 2.2 V,
it is expressed as 22.)
*1. Refer to the taping specifications at the end this book.
*2. Refer to the Table 2 in the “2. Product name list”.
Seiko Instruments Inc.
3
ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING)
Rev.3.3_00
S-801 Series
2. Product Name List
2-1. SOT-23-5
Table 1 (1/3)
Detection voltage range
Delay time
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
Nch open-drain output products
S-80122ANMC-JCHT2G
S-80122BNMC-JGHT2G
S-80122CNMC-JKHT2G
S-80123ANMC-JCIT2G
S-80123BNMC-JGIT2G
S-80123CNMC-JKIT2G
S-80124ANMC-JCJT2G
S-80124BNMC-JGJT2G
S-80124CNMC-JKJT2G
S-80125ANMC-JCKT2G
S-80125BNMC-JGKT2G
S-80125CNMC-JKKT2G
S-80126ANMC-JCLT2G
S-80126BNMC-JGLT2G
S-80126CNMC-JKLT2G
S-80127ANMC-JCMT2G
S-80127BNMC-JGMT2G
S-80127CNMC-JKMT2G
S-80128ANMC-JCNT2G
S-80128BNMC-JGNT2G
S-80128CNMC-JKNT2G
S-80129ANMC-JCOT2G
S-80129BNMC-JGOT2G
S-80129CNMC-JKOT2G
S-80130ANMC-JCPT2G
S-80130BNMC-JGPT2G
S-80130CNMC-JKPT2G
S-80131ANMC-JCQT2G
S-80131BNMC-JGQT2G
S-80131CNMC-JKQT2G
S-80132ANMC-JCRT2G
S-80132BNMC-JGRT2G
S-80132CNMC-JKRT2G
S-80133ANMC-JCST2G
S-80133BNMC-JGST2G
S-80133CNMC-JKST2G
S-80134ANMC-JCTT2G
S-80134BNMC-JGTT2G
S-80134CNMC-JKTT2G
CMOS output products
S-80122ALMC-JAHT2G
S-80122BLMC-JEHT2G
S-80122CLMC-JIHT2G
S-80123ALMC-JAIT2G
S-80123BLMC-JEIT2G
S-80123CLMC-JIIT2G
S-80124ALMC-JAJT2G
S-80124BLMC-JEJT2G
S-80124CLMC-JIJT2G
S-80125ALMC-JAKT2G
S-80125BLMC-JEKT2G
S-80125CLMC-JIKT2G
S-80126ALMC-JALT2G
S-80126BLMC-JELT2G
S-80126CLMC-JILT2G
S-80127ALMC-JAMT2G
S-80127BLMC-JEMT2G
S-80127CLMC-JIMT2G
S-80128ALMC-JANT2G
S-80128BLMC-JENT2G
S-80128CLMC-JINT2G
S-80129ALMC-JAOT2G
S-80129BLMC-JEOT2G
S-80129CLMC-JIOT2G
S-80130ALMC-JAPT2G
S-80130BLMC-JEPT2G
S-80130CLMC-JIPT2G
S-80131ALMC-JAQT2G
S-80131BLMC-JEQT2G
S-80131CLMC-JIQT2G
S-80132ALMC-JART2G
S-80132BLMC-JERT2G
S-80132CLMC-JIRT2G
S-80133ALMC-JAST2G
S-80133BLMC-JEST2G
S-80133CLMC-JIST2G
S-80134ALMC-JATT2G
S-80134BLMC-JETT2G
S-80134CLMC-JITT2G
2.2 V ±2.0%
2.3 V ±2.0%
2.4 V ±2.0%
2.5 V ±2.0%
2.6 V ±2.0%
2.7 V ±2.0%
2.8 V ±2.0%
2.9 V ±2.0%
3.0 V ±2.0%
3.1 V ±2.0%
3.2 V ±2.0%
3.3 V ±2.0%
3.4 V ±2.0%
4
Seiko Instruments Inc.
ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING)
Rev.3.3_00
S-801 Series
Table 1 (2/3)
Detection voltage range
Delay time
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
Nch open-drain output products
S-80135ANMC-JCUT2G
S-80135BNMC-JGUT2G
S-80135CNMC-JKUT2G
S-80136ANMC-JCVT2G
S-80136BNMC-JGVT2G
S-80136CNMC-JKVT2G
S-80137ANMC-JCWT2G
S-80137BNMC-JGWT2G
S-80137CNMC-JKWT2G
S-80138ANMC-JCXT2G
S-80138BNMC-JGXT2G
S-80138CNMC-JKXT2G
S-80139ANMC-JCYT2G
S-80139BNMC-JGYT2G
S-80139CNMC-JKYT2G
S-80140ANMC-JCZT2G
S-80140BNMC-JGZT2G
S-80140CNMC-JKZT2G
S-80141ANMC-JC2T2G
S-80141BNMC-JG2T2G
S-80141CNMC-JK2T2G
S-80142ANMC-JC3T2G
S-80142BNMC-JG3T2G
S-80142CNMC-JK3T2G
S-80143ANMC-JC4T2G
S-80143BNMC-JG4T2G
S-80143CNMC-JK4T2G
S-80144ANMC-JC5T2G
S-80144BNMC-JG5T2G
S-80144CNMC-JK5T2G
S-80145ANMC-JC6T2G
S-80145BNMC-JG6T2G
S-80145CNMC-JK6T2G
S-80146ANMC-JC7T2G
S-80146BNMC-JG7T2G
S-80146CNMC-JK7T2G
S-80147ANMC-JC8T2G
S-80147BNMC-JG8T2G
S-80147CNMC-JK8T2G
S-80148ANMC-JC9T2G
S-80148BNMC-JG9T2G
S-80148CNMC-JK9T2G
S-80149ANMC-JDAT2G
S-80149BNMC-JHAT2G
S-80149CNMC-JLAT2G
CMOS output products
S-80135ALMC-JAUT2G
S-80135BLMC-JEUT2G
S-80135CLMC-JIUT2G
S-80136ALMC-JAVT2G
S-80136BLMC-JEVT2G
S-80136CLMC-JIVT2G
S-80137ALMC-JAWT2G
S-80137BLMC-JEWT2G
S-80137CLMC-JIWT2G
S-80138ALMC-JAXT2G
S-80138BLMC-JEXT2G
S-80138CLMC-JIXT2G
S-80139ALMC-JAYT2G
S-80139BLMC-JEYT2G
S-80139CLMC-JIYT2G
S-80140ALMC-JAZT2G
S-80140BLMC-JEZT2G
S-80140CLMC-JIZT2G
S-80141ALMC-JA2T2G
S-80141BLMC-JE2T2G
S-80141CLMC-JI2T2G
S-80142ALMC-JA3T2G
S-80142BLMC-JE3T2G
S-80142CLMC-JI3T2G
S-80143ALMC-JA4T2G
S-80143BLMC-JE4T2G
S-80143CLMC-JI4T2G
S-80144ALMC-JA5T2G
S-80144BLMC-JE5T2G
S-80144CLMC-JI5T2G
S-80145ALMC-JA6T2G
S-80145BLMC-JE6T2G
S-80145CLMC-JI6T2G
S-80146ALMC-JA7T2G
S-80146BLMC-JE7T2G
S-80146CLMC-JI7T2G
S-80147ALMC-JA8T2G
S-80147BLMC-JE8T2G
S-80147CLMC-JI8T2G
S-80148ALMC-JA9T2G
S-80148BLMC-JE9T2G
S-80148CLMC-JI9T2G
S-80149ALMC-JBAT2G
S-80149BLMC-JFAT2G
S-80149CLMC-JJAT2G
3.5 V ±2.0%
3.6 V ±2.0%
3.7 V ±2.0%
3.8 V ±2.0%
3.9 V ±2.0%
4.0 V ±2.0%
4.1 V ±2.0%
4.2 V ±2.0%
4.3 V ±2.0%
4.4 V ±2.0%
4.5 V ±2.0%
4.6 V ±2.0%
4.7 V ±2.0%
4.8 V ±2.0%
4.9 V ±2.0%
Seiko Instruments Inc.
5
ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING)
Rev.3.3_00
S-801 Series
Table 1 (3/3)
Detection voltage range
Delay time
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
Nch open-drain output products
S-80150ANMC-JDBT2G
S-80150BNMC-JHBT2G
S-80150CNMC-JLBT2G
S-80151ANMC-JDCT2G
S-80151BNMC-JHCT2G
S-80151CNMC-JLCT2G
S-80152ANMC-JDDT2G
S-80152BNMC-JHDT2G
S-80152CNMC-JLDT2G
S-80153ANMC-JDET2G
S-80153BNMC-JHET2G
S-80153CNMC-JLET2G
S-80154ANMC-JDFT2G
S-80154BNMC-JHFT2G
S-80154CNMC-JLFT2G
S-80155ANMC-JDGT2G
S-80155BNMC-JHGT2G
S-80155CNMC-JLGT2G
S-80156ANMC-JDHT2G
S-80156BNMC-JHHT2G
S-80156CNMC-JLHT2G
S-80157ANMC-JDIT2G
S-80157BNMC-JHIT2G
S-80157CNMC-JLIT2G
S-80158ANMC-JDJT2G
S-80158BNMC-JHJT2G
S-80158CNMC-JLJT2G
S-80159ANMC-JDKT2G
S-80159BNMC-JHKT2G
S-80159CNMC-JLKT2G
S-80160ANMC-JDLT2G
S-80160BNMC-JHLT2G
S-80160CNMC-JLLT2G
CMOS output products
S-80150ALMC-JBBT2G
S-80150BLMC-JFBT2G
S-80150CLMC-JJBT2G
S-80151ALMC-JBCT2G
S-80151BLMC-JFCT2G
S-80151CLMC-JJCT2G
S-80152ALMC-JBDT2G
S-80152BLMC-JFDT2G
S-80152CLMC-JJDT2G
S-80153ALMC-JBET2G
S-80153BLMC-JFET2G
S-80153CLMC-JJET2G
S-80154ALMC-JBFT2G
S-80154BLMC-JFFT2G
S-80154CLMC-JJFT2G
S-80155ALMC-JBGT2G
S-80155BLMC-JFGT2G
S-80155CLMC-JJGT2G
S-80156ALMC-JBHT2G
S-80156BLMC-JFHT2G
S-80156CLMC-JJHT2G
S-80157ALMC-JBIT2G
S-80157BLMC-JFIT2G
S-80157CLMC-JJIT2G
S-80158ALMC-JBJT2G
S-80158BLMC-JFJT2G
S-80158CLMC-JJJT2G
S-80159ALMC-JBKT2G
S-80159BLMC-JFKT2G
S-80159CLMC-JJKT2G
S-80160ALMC-JBLT2G
S-80160BLMC-JFLT2G
S-80160CLMC-JJLT2G
5.0 V ±2.0%
5.1 V ±2.0%
5.2 V ±2.0%
5.3 V ±2.0%
5.4 V ±2.0%
5.5 V ±2.0%
5.6 V ±2.0%
5.7 V ±2.0%
5.8 V ±2.0%
5.9 V ±2.0%
6.0 V ±2.0%
6
Seiko Instruments Inc.
ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING)
Rev.3.3_00
S-801 Series
2-2. SNT-4A
Table 2 (1/3)
Detection voltage range
Delay time
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
Nch open-drain output products
S-80122ANPF-JCHTFG
S-80122BNPF-JGHTFG
S-80122CNPF-JKHTFG
S-80123ANPF-JCITFG
S-80123BNPF-JGITFG
S-80123CNPF-JKITFG
S-80124ANPF-JCJTFG
S-80124BNPF-JGJTFG
S-80124CNPF-JKJTFG
S-80125ANPF-JCKTFG
S-80125BNPF-JGKTFG
S-80125CNPF-JKKTFG
S-80126ANPF-JCLTFG
S-80126BNPF-JGLTFG
S-80126CNPF-JKLTFG
S-80127ANPF-JCMTFG
S-80127BNPF-JGMTFG
S-80127CNPF-JKMTFG
S-80128ANPF-JCNTFG
S-80128BNPF-JGNTFG
S-80128CNPF-JKNTFG
S-80129ANPF-JCOTFG
S-80129BNPF-JGOTFG
S-80129CNPF-JKOTFG
S-80130ANPF-JCPTFG
S-80130BNPF-JGPTFG
S-80130CNPF-JKPTFG
S-80131ANPF-JCQTFG
S-80131BNPF-JGQTFG
S-80131CNPF-JKQTFG
S-80132ANPF-JCRTFG
S-80132BNPF-JGRTFG
S-80132CNPF-JKRTFG
S-80133ANPF-JCSTFG
S-80133BNPF-JGSTFG
S-80133CNPF-JKSTFG
S-80134ANPF-JCTTFG
S-80134BNPF-JGTTFG
S-80134CNPF-JKTTFG
S-80135ANPF-JCUTFG
S-80135BNPF-JGUTFG
S-80135CNPF-JKUTFG
S-80136ANPF-JCVTFG
S-80136BNPF-JGVTFG
S-80136CNPF-JKVTFG
S-80137ANPF-JCWTFG
S-80137BNPF-JGWTFG
S-80137CNPF-JKWTFG
CMOS output products
S-80122ALPF-JAHTFG
S-80122BLPF-JEHTFG
S-80122CLPF-JIHTFG
S-80123ALPF-JAITFG
S-80123BLPF-JEITFG
S-80123CLPF-JIITFG
S-80124ALPF-JAJTFG
S-80124BLPF-JEJTFG
S-80124CLPF-JIJTFG
S-80125ALPF-JAKTFG
S-80125BLPF-JEKTFG
S-80125CLPF-JIKTFG
S-80126ALPF-JALTFG
S-80126BLPF-JELTFG
S-80126CLPF-JILTFG
S-80127ALPF-JAMTFG
S-80127BLPF-JEMTFG
S-80127CLPF-JIMTFG
S-80128ALPF-JANTFG
S-80128BLPF-JENTFG
S-80128CLPF-JINTFG
S-80129ALPF-JAOTFG
S-80129BLPF-JEOTFG
S-80129CLPF-JIOTFG
S-80130ALPF-JAPTFG
S-80130BLPF-JEPTFG
S-80130CLPF-JIPTFG
S-80131ALPF-JAQTFG
S-80131BLPF-JEQTFG
S-80131CLPF-JIQTFG
S-80132ALPF-JARTFG
S-80132BLPF-JERTFG
S-80132CLPF-JIRTFG
S-80133ALPF-JASTFG
S-80133BLPF-JESTFG
S-80133CLPF-JISTFG
S-80134ALPF-JATTFG
S-80134BLPF-JETTFG
S-80134CLPF-JITTFG
S-80135ALPF-JAUTFG
S-80135BLPF-JEUTFG
S-80135CLPF-JIUTFG
S-80136ALPF-JAVTFG
S-80136BLPF-JEVTFG
S-80136CLPF-JIVTFG
S-80137ALPF-JAWTFG
S-80137BLPF-JEWTFG
S-80137CLPF-JIWTFG
2.2 V ±2.0%
2.3 V ±2.0%
2.4 V ±2.0%
2.5 V ±2.0%
2.6 V ±2.0%
2.7 V ±2.0%
2.8 V ±2.0%
2.9 V ±2.0%
3.0 V ±2.0%
3.1 V ±2.0%
3.2 V ±2.0%
3.3 V ±2.0%
3.4 V ±2.0%
3.5 V ±2.0%
3.6 V ±2.0%
3.7 V ±2.0%
Seiko Instruments Inc.
7
ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING)
Rev.3.3_00
S-801 Series
Table 2 (2/3)
Detection voltage range
Delay time
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
Nch open-drain output products
S-80138ANPF-JCXTFG
S-80138BNPF-JGXTFG
S-80138CNPF-JKXTFG
S-80139ANPF-JCYTFG
S-80139BNPF-JGYTFG
S-80139CNPF-JKYTFG
S-80140ANPF-JCZTFG
S-80140BNPF-JGZTFG
S-80140CNPF-JKZTFG
S-80141ANPF-JC2TFG
S-80141BNPF-JG2TFG
S-80141CNPF-JK2TFG
S-80142ANPF-JC3TFG
S-80142BNPF-JG3TFG
S-80142CNPF-JK3TFG
S-80143ANPF-JC4TFG
S-80143BNPF-JG4TFG
S-80143CNPF-JK4TFG
S-80144ANPF-JC5TFG
S-80144BNPF-JG5TFG
S-80144CNPF-JK5TFG
S-80145ANPF-JC6TFG
S-80145BNPF-JG6TFG
S-80145CNPF-JK6TFG
S-80146ANPF-JC7TFG
S-80146BNPF-JG7TFG
S-80146CNPF-JK7TFG
S-80147ANPF-JC8TFG
S-80147BNPF-JG8TFG
S-80147CNPF-JK8TFG
S-80148ANPF-JC9TFG
S-80148BNPF-JG9TFG
S-80148CNPF-JK9TFG
S-80149ANPF-JDATFG
S-80149BNPF-JHATFG
S-80149CNPF-JLATFG
S-80150ANPF-JDBTFG
S-80150BNPF-JHBTFG
S-80150CNPF-JLBTFG
S-80151ANPF-JDCTFG
S-80151BNPF-JHCTFG
S-80151CNPF-JLCTFG
S-80152ANPF-JDDTFG
S-80152BNPF-JHDTFG
S-80152CNPF-JLDTFG
S-80153ANPF-JDETFG
S-80153BNPF-JHETFG
S-80153CNPF-JLETFG
CMOS output products
S-80138ALPF-JAXTFG
S-80138BLPF-JEXTFG
S-80138CLPF-JIXTFG
S-80139ALPF-JAYTFG
S-80139BLPF-JEYTFG
S-80139CLPF-JIYTFG
S-80140ALPF-JAZTFG
S-80140BLPF-JEZTFG
S-80140CLPF-JIZTFG
S-80141ALPF-JA2TFG
S-80141BLPF-JE2TFG
S-80141CLPF-JI2TFG
S-80142ALPF-JA3TFG
S-80142BLPF-JE3TFG
S-80142CLPF-JI3TFG
S-80143ALPF-JA4TFG
S-80143BLPF-JE4TFG
S-80143CLPF-JI4TFG
S-80144ALPF-JA5TFG
S-80144BLPF-JE5TFG
S-80144CLPF-JI5TFG
S-80145ALPF-JA6TFG
S-80145BLPF-JE6TFG
S-80145CLPF-JI6TFG
S-80146ALPF-JA7TFG
S-80146BLPF-JE7TFG
S-80146CLPF-JI7TFG
S-80147ALPF-JA8TFG
S-80147BLPF-JE8TFG
S-80147CLPF-JI8TFG
S-80148ALPF-JA9TFG
S-80148BLPF-JE9TFG
S-80148CLPF-JI9TFG
S-80149ALPF-JBATFG
S-80149BLPF-JFATFG
S-80149CLPF-JJATFG
S-80150ALPF-JBBTFG
S-80150BLPF-JFBTFG
S-80150CLPF-JJBTFG
S-80151ALPF-JBCTFG
S-80151BLPF-JFCTFG
S-80151CLPF-JJCTFG
S-80152ALPF-JBDTFG
S-80152BLPF-JFDTFG
S-80152CLPF-JJDTFG
S-80153ALPF-JBETFG
S-80153BLPF-JFETFG
S-80153CLPF-JJETFG
3.8 V ±2.0%
3.9 V ±2.0%
4.0 V ±2.0%
4.1 V ±2.0%
4.2 V ±2.0%
4.3 V ±2.0%
4.4 V ±2.0%
4.5 V ±2.0%
4.6 V ±2.0%
4.7 V ±2.0%
4.8 V ±2.0%
4.9 V ±2.0%
5.0 V ±2.0%
5.1 V ±2.0%
5.2 V ±2.0%
5.3 V ±2.0%
8
Seiko Instruments Inc.
ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING)
Rev.3.3_00
S-801 Series
Table 2 (3/3)
Detection voltage range
Delay time
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
50 ms typ.
100 ms typ.
200 ms typ.
Nch open-drain output products
S-80154ANPF-JDFTFG
S-80154BNPF-JHFTFG
S-80154CNPF-JLFTFG
S-80155ANPF-JDGTFG
S-80155BNPF-JHGTFG
S-80155CNPF-JLGTFG
S-80156ANPF-JDHTFG
S-80156BNPF-JHHTFG
S-80156CNPF-JLHTFG
S-80157ANPF-JDITFG
S-80157BNPF-JHITFG
S-80157CNPF-JLITFG
S-80158ANPF-JDJTFG
S-80158BNPF-JHJTFG
S-80158CNPF-JLJTFG
S-80159ANPF-JDKTFG
S-80159BNPF-JHKTFG
S-80159CNPF-JLKTFG
S-80160ANPF-JDLTFG
S-80160BNPF-JHLTFG
S-80160CNPF-JLLTFG
CMOS output products
S-80154ALPF-JBFTFG
S-80154BLPF-JFFTFG
S-80154CLPF-JJFTFG
S-80155ALPF-JBGTFG
S-80155BLPF-JFGTFG
S-80155CLPF-JJGTFG
S-80156ALPF-JBHTFG
S-80156BLPF-JFHTFG
S-80156CLPF-JJHTFG
S-80157ALPF-JBITFG
S-80157BLPF-JFITFG
S-80157CLPF-JJITFG
S-80158ALPF-JBJTFG
S-80158BLPF-JFJTFG
S-80158CLPF-JJJTFG
S-80159ALPF-JBKTFG
S-80159BLPF-JFKTFG
S-80159CLPF-JJKTFG
S-80160ALPF-JBLTFG
S-80160BLPF-JFLTFG
S-80160CLPF-JJLTFG
5.4 V ±2.0%
5.5 V ±2.0%
5.6 V ±2.0%
5.7 V ±2.0%
5.8 V ±2.0%
5.9 V ±2.0%
6.0 V ±2.0%
Seiko Instruments Inc.
9
ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING)
Rev.3.3_00
S-801 Series
Pin Configurations
Table 3
SOT-23-5
Top view
Pin No.
Pin name
DS*1
Pin description
5
4
1
2
3
4
5
ON/OFF switch for delay time
GND pin
No connection
Voltage detection output pin
Voltage input pin
VSS
NC*2
OUT
VDD
*1. Refer to “2. Delay Circuit” in “ Operation” for operation.
*2. The NC pin is electrically open.
1
2
3
The NC pin can be connected to VDD or VSS.
Figure 3
SNT-4A
Table 4
Top view
Pin No.
Pin name
VSS
Pin description
1
2
3
4
GND pin
DS*1
ON/OFF switch for delay time
Voltage input pin
Voltage detection output pin
1
2
4
3
VDD
OUT
*1. Refer to “2. Delay Circuit” in “ Operation” for operation.
Figure 4
10
Seiko Instruments Inc.
ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING)
Rev.3.3_00
S-801 Series
Absolute Maximum Ratings
Table 5
(Ta=25°C unless otherwise specified)
Item
Power supply voltage
Output voltage Nch open-drain output products
CMOS output products
Symbol
VDD−VSS
VOUT
Absolute maximum ratings
Unit
V
12
VSS−0.3 to VSS+12
VSS−0.3 to VDD+0.3
Output current
Power
dissipation
IOUT
PD
50
mA
mW
SOT-23-5
SNT-4A
250 (When not mounted on board)
600*1
140 (When not mounted on board)
300*1
Operating ambient temperature
Storage temperature
Topr
Tstg
−40 to +85
−40 to +125
°C
*1. When mounted on board
[Mounted board]
(1) Board size: 114.3 mm × 76.2 mm × t1.6 mm
(2) Board name: JEDEC STANDARD51-7
Caution The absolute maximum ratings are rated values exceeding which the product could suffer
physical damage. These values must therefore not be exceeded under any conditions.
700
600
500
SOT-23-5
400
300
200
SNT-4A
50
100
0
100
150
0
Ambient Temperature (Ta) [°C]
Figure 5 Power Dissipation of Package (When Mounted on Board)
Seiko Instruments Inc.
11
ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING)
Rev.3.3_00
S-801 Series
Electrical Characteristics
Table 6
(Ta=25 °C Unless otherwise specified)
Test
circuit
Item
Symbol
VDET
Condition
Min.
Typ.
Max.
Unit
−
VDET(S)
−
VDET(S)
−
VDET(S)
×1.02
100
3.3
3.5
4.0
10.0
Detection voltage*1
−
—
—
V
1
×
0.98
30
—
Hysteresis width
Current
consumption
VHYS
ISS
60
1.3
1.5
1.8
—
mV
μA
S-80122 to 26
S-80127 to 39
S-80140 to 60
VDD
VDD
VDD
=
=
=
3.5 V
4.5 V
6.5 V
—
—
0.95
Operating voltage
Output current
VDD
IOUT
—
V
Output transistor,
Nch, VOUT 0.5 V
VDD
S-80122 to 60
VDD 2.4 V
S-80127 to 60
VDD 4.8 V
S-80122 to 39
VDD 6.0 V
S-80140 to 54
VDD 8.4 V
S-80155 to 60
=1.2 V
0.75
1.5
6.0
2.0
2.5
3.0
—
—
—
—
—
mA
2
=
=
3.0
1.0
Only for CMOS output
products,
=
Output transistor,
=
1.25
1.5
Pch, VDD–VOUT=0.5 V
=
Only for Nch open-drain output products,
Output transistor,
Leakage current
ILEAK
—
—
—
0.1
μ
A
Nch, VDD
=
10.0 V, VOUT
Ta=−40 °C to
1 V, DS pin Low
=
10.0 V
85 °C
S-801xxAx
Detection voltage
temperature
Δ − VDET
ΔTa • −VDET
ppm/
°C
+
±
120
±360
1
coefficient *2
Delay time 1
tD1
32.5
65
130
110
1.0
—
50
72.5
145
290
330
—
ms
VDD=−VDET
+
S-801xxBx
S-801xxCx
100
200
220
—
Delay time 2
Input voltage
tD2
VSH
VSL
3
4
VDD=−VDET+1 V, DS pin High
μs
V
DS pin, VDD=6.0 V
—
0.3
DS pin, VDD=6.0 V
*1. −VDET: Actual detection voltage value, −VDET(S): Specified detection voltage value (The center value of the
detection voltage range in Table 1 to 2.)
*2. Temperature change ratio for the detection voltage [mV/°C] is calculated using the following equation.
Δ − VDET
ΔTa
Δ − VDET
ΔTa • −VDET
*2
[
mV/°C *1
]
= −VDET(S)
(
Typ.
)
[
V
]
×
[
ppm/°C *3
÷1000
]
*1. Temperature change ratio of the detection voltage
*2. Specified detection voltage value
*3. Detection voltage temperature coefficient
12
Seiko Instruments Inc.
ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING)
Rev.3.3_00
S-801 Series
Test Circuits
1.
2.
A
R*1
100 kΩ
VDD
VDD
DS
A
DS
OUT
VSS
OUT
VSS
V
*1. R is unnecessary for CMOS output products.
Figure 6
Figure 7
3.
4.
R*1
R*1
A
100 kΩ
100 kΩ
VDD
VDD
DS
OUT
VSS
OUT
VSS
DS
V
V
*1. R is unnecessary for CMOS output products.
*1. R is unnecessary for CMOS output products.
Figure 8
Figure 9
Seiko Instruments Inc.
13
ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING)
Rev.3.3_00
S-801 Series
Operation
1. Basic Operation: CMOS Output (Active Low)
1-1. When the power supply voltage (VDD) is higher than the release voltage (+VDET), the Nch
transistor is OFF and the Pch transistor is ON to provide VDD (high) at the output. Since the
(RB + RC)• VDD
Nch transistor N1 in Figure 10 is OFF, the comparator input voltage is
.
RA + RB + RC
1-2. When the VDD goes below +VDET, the output provides the VDD level, as long as VDD remains
above the detection voltage (–VDET). When the VDD falls below –VDET (point A in Figure 11),
the Nch transistor becomes ON, the Pch transistor becomes OFF, and the VSS level appears
at the output. At this time the Nch transistor N1 in Figure 10 becomes ON, the comparator
RB • VDD
input voltage is changed to
.
RA + RB
1-3. When the VDD falls below the minimum operating voltage, the output becomes undefined, or
goes to VDD when the output is pulled up to VDD.
1-4. The VSS level appears when VDD rises above the minimum operating voltage. The VSS level still
appears even when VDD surpasses the –VDET, as long as it does not exceed the release
voltage +VDET
.
1-5. When VDD rises above +VDET (point B in Figure 11), the Nch transistor becomes OFF and the
Pch transistor becomes ON to provide VDD at the output. The VDD at the OUT pin is delayed for
tD due to the delay circuit.
VDD
*1
RA
+
Pch
Nch
Delay circuit
OUT
−
*1
RB
RC
VREF
N1
DS
VSS
*1. Paracitic diode
Figure 10 Operation 1
14
Seiko Instruments Inc.
ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING)
Rev.3.3_00
S-801 Series
(1) (2) (3) (4) (5)
B
VDD
Release voltage (+VDET
Detection voltage (−VDET
)
Hysterisis width (VHYS
)
A
)
Minimum operating voltage
VSS
VDD
Output from OUT pin
VSS
tD
Figure 11 Operation 2
2. Delay Circuit
2-1. Delay Time
The delay circuit delays the output signal from the time at which the power voltage (VDD)
exceeds the release voltage (+VDET) when VDD is turned on. The output signal is not delayed
when the VDD goes below the detection voltage (–VDET). (Refer to Figure 11.)
The delay time (tD) is a fixed value that is determined by a built-in oscillation circuit and
counter.
2-2. DS Pin (ON/OFF Switch Pin for Delay Time)
The DS pin should be connected to Low or High. When the DS pin is High, the output delay
time becomes short since the output signal is taken from the middle of counter circuit (Refer to
Figure 16).
3. Other Characteristics
3-1. Temperature Characteristics of Detection Voltage
The shaded area in Figure 12 shows the temperature characteristics of the detection voltage.
–VDET [V]
+0.792 mV/°C
2.200
–0.792 mV/°C
–40
25
85
Ta [°C]
Figure 12 Temperature Characteristics of Detection Voltage (Example for S-80122xxxx)
Seiko Instruments Inc.
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ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING)
Rev.3.3_00
S-801 Series
3-2. Temperature Characteristics of Release Voltage
Δ + VDET
ΔTa
The temperature coefficient
of the release voltage is calculated by the temperature
coefficient Δ − VDET for the detection voltage as follows:
ΔTa
Δ + VDET
ΔTa
+VDET
− VDET
Δ − VDET
ΔTa
=
×
The temperature coefficients for the release voltage and the detection voltage have the same sign
consequently.
3-3. Temperature Characteristics of Hysteresis Voltage
Δ + VDET Δ − VDET
The temperature characteristics for the hysteresis voltage is expressed as
is calculated as follows:
−
and
ΔTa
ΔTa
Δ + VDET Δ − VDET
VHYS
Δ − VDET
ΔTa
−
=
×
ΔTa
ΔTa
− VDET
Standard Circuit
R*1
100 kΩ
VDD
OUT
DS
VSS
*1. R is unnecessary for CMOS output products.
Figure 13
Caution The above connection diagram and constant will not guarantees successful operation.
Perform through using the actual application to set the constant.
16
Seiko Instruments Inc.
ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING)
Rev.3.3_00
S-801 Series
Technical Terms
1. Detection Voltage (–VDET), Release Voltage (+VDET
)
The detection voltage (–VDET) is a voltage at which the output turns to low. The detection voltage varies
slightly among products of the same specification. The variation of detection voltage between the
specified minimum (–VDET) Min. and the maximum (–VDET) Max. is called the detection voltage range
(Refer to Figure 14).
e.g. For the S-80122AN, the detection voltage lies in the range of 2.156 ≤ (–VDET) ≤ 2.244.
This means that some S-80122ANs have 2.156 V for –VDET and some have 2.244 V.
The release voltage (+VDET) is a voltage at which the output turns to high. The release voltage varies
slightly among products of the same specification. The variation of release voltages between the
specified minimum (+VDET) Min. and the maximum (+VDET) Max. is called the release voltage range
(Refer to Figure 15).
e.g. For the S-80122AN, the release voltage lies in the range of 2.186 ≤ (+VDET) ≤ 2.344.
This means that some S-80122ANs have 2.186 V for +VDET and some have 2.344 V.
VDD
VDD
Detection voltage
Release voltage
(+VDET) Max.
(−VDET) Max.
(−VDET) Min.
Release voltage
range
Detection voltage
range
(+VDET) Min.
OUT
OUT
Delay time
Figure 14 Detection Voltage
Figure 15 Release Voltage
Remark Although the detection voltage and release voltage overlap in the range of 2.186 V to 2.244 V,
+VDET is always larger than –VDET
.
Seiko Instruments Inc.
17
ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING)
Rev.3.3_00
S-801 Series
2. Hysteresis Width (VHYS
)
Hysteresis width is the voltage difference between the detection voltage and the release voltage
(The voltage at point B−The voltage at point A=VHYS in Figure 11). The existence of the hysteresis
width prevents malfunction caused by noise on input signal.
3. Delay Time (tD)
Delay time is a time internally measured from the instant at which input voltage to the VDD pin
exceeds the release voltage (+VDET) to the point at which the output of the OUT pin inverts. The
delay time is fixed in each series distinguished by A, B and C.
S-801xxAx series: typ. 50 ms
S-801xxBx series: typ. 100 ms
S-801xxCx series: typ. 200 ms
The output of the OUT pin can be inverted in a short delay time (tD2) by setting the DS pin High (Refer
to Figure 16).
VDD
V
+VDET
at DS=”H”
OUT
tD1
tD2
Figure 16
4. Through-type Current
The through-type current refers to the current that flows instantaneously at the time of detection and
release of a voltage detector. The through-type current flows at a frequency of 20 kHz during release
delay time since the internal logic circuit operates.
18
Seiko Instruments Inc.
ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING)
Rev.3.3_00
S-801 Series
5. Oscillation
In applications where a resistor is connected to the voltage detector input (Figure 17), taking a
CMOS active low products for example, the through-type current which is generated when the
output goes from low to high (release) causes a voltage drop equal to [through-type current] × [input
resistance] across the resistor. When the input voltage drops below the detection voltage (–VDET) as
a result, the output voltage goes to low level. In this state, the through-type current stops and its
resultant voltage drop disappears, and the output goes from low to high. The through-type current is
again generated, a voltage drop appears, and repeating the process finally induces oscillation.
VDD
RA
VIN
S-801
OUT
RB
VSS
Figure 17 Example for Bad Implementation of Input Voltage Divider
Precautions
• In the S-801 series products, the through-type current flows at a frequency of 20 kHz approximately
during the delay time since the internal oscillator circuit and counter timer operate at voltage release.
High impedance in the input may cause oscillation by the through-type current. When the input
impedance is high, insert a capacitor between VDD pin and VSS pin to prevent oscillation.
• Do not apply an electrostatic discharge to this IC that exceeds the performance ratings of the built-in
electrostatic protection circuit.
• In CMOS output products of the S-801 Series, the through-type current flows at detection and release. If
the impedance is high, oscillation may occur due to the voltage drop by the through-type current during
releasing.
• When designing for mass production using an application circuit described herein, the product deviation
and temperature characteristics should be taken into consideration. SII shall not bear any responsibility
for the patents on the circuits described herein.
• SII claims no responsibility for any and all disputes arising out of or in connection with any infringement of
the products including this IC upon patents owned a third party.
Seiko Instruments Inc.
19
ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING)
Rev.3.3_00
S-801 Series
Typical Characteristics (Typical Data)
1. Detection Voltage (VDET) - Temperature (Ta)
S-80122AL
S-80160AL
2.4
6.4
VDET (+)
6.2
6.0
5.8
2.3
2.2
2.1
VDET (+)
VDET (−)
VDET (−)
0
20
Ta [°C)]
40
60
80 100
−40 −20
0
20
Ta [°C]
40
60
80 100
−40 −20
2. Hysteresis Voltage Width (VHYS) - Temperature (Ta)
S-80122AL
S-80160AL
100
100
90
80
70
60
50
40
30
90
80
70
60
50
40
30
0
20
Ta [°C]
40
60
80 100
−40 −20
0
20
Ta [°C]
40
60
80 100
−40 −20
3. Current Consumption (ISS) - Input Voltage (VDD)
(a) S-80122AL
(b) S-80129AL
Ta=25°C
Ta=25°C
3.5
3.5
3.0
2.5
2.0
1.5
1.0
0.5
0.0
0
3.3 μA
3.0
2.9 μA
2.5
2.0
1.5
1.0
0.5
0.0
0
2
4
6
VDD [V]
8
10
2
4
6
8
10
VDD [V]
(c) S-80130AL
(d) S-80160AL
Ta=25°C
Ta=25°C
20 μA
5.0 μA
3.5
3.0
2.5
2.0
1.5
1.0
0.5
0.0
0
3.5
3.0
2.5
2.0
1.5
1.0
0.5
0.0
0
2
4
6
VDD [V]
8
10
2
4
6
8
10
VDD [V]
20
Seiko Instruments Inc.
ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING)
Rev.3.3_00
S-801 Series
4. Current Consumption (ISS) - Temperature (Ta)
(a) S-80122AL
(b) S-80129AL
5.0
VDD=3.5 V
VDD=4.5 V
5.0
4.0
3.0
2.0
1.0
0.0
4.0
3.0
2.0
1.0
0.0
0
20
Ta [°C]
40
60
80 100
0
20
Ta [°C]
40
60
80 100
−40 −20
−40 −20
(c) S-80130AL
(d) S-80160AL
5.0
VDD=4.5 V
VDD=6.5 V
5.0
4.0
3.0
2.0
1.0
0.0
4.0
3.0
2.0
1.0
0.0
0
20
Ta [°C]
40
60
80 100
−40 −20
0
20
Ta [°C]
40
60
80 100
−40 −20
5. Nch Transistor Output Current (IOUT) -VOUT
6. Pch Transistor Output Current (IOUT) - (VDD-VOUT)
S-80160AL
S-80122AL
Ta=25°C
Ta=25°C
70
60
50
40
30
20
10
0
40
VDD=1 V, 1.2 V
6 V
5.5 V
4 V
4.8 V
30
20
10
0
VDD=4 V
10 V
2.4 V
2 V
8 V
6.5 V
0
2
4
6
8
10
0
2
4
6
8
10
VOUT [V]
VDD-VOUT [V]
7. Nch Transistor Output Current (IOUT) - Input
8. Pch transistor Output Current (IOUT) - Input
Voltage (VDD)
Voltage (VDD)
S-80160AL
S-80122AL
VDS=0.5 V
VDS=0.5 V
25
20
15
10
5
5
4
3
2
1
0
Ta= −40°C
Ta= −40°C
25°C
25°C
85°C
85°C
0
0
2
4
6
8
10
0
2
4
6
8
10
VDD [V]
VDD [V]
Seiko Instruments Inc.
21
ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING)
Rev.3.3_00
S-801 Series
9. Minimum Operating Voltage - Input Voltage (VDD)
S-80122AN
Pull-up, VDD:100 kΩ
0.6
0.5
Ta= −40°C
0.4
0.3
0.2
0.1
0
25°C
85°C
1
0
0.5
1.5
VDD [V]
10. Threshold Voltage of DS Pin - Temperature (Ta)
11. Threshold Voltage of DS Pin - Input Voltage (VDD)
S-80122AL
S-80122AL
1
VDD=6.0 V
1
Ta= −40°C
0.8
0.8
0.6
0.4
0.2
0
0.6
25°C
0.4
85°C
0.2
0
0
2
4
6
8
10
0
20
Ta [°C]
40
60
80
100
−40 −20
VDD [V]
12. Delay Time 1 - Temperature (Ta)
S-80122CL
S-80160CL
VDD=3.2 V
VDD
=7.0 V
300
250
200
150
100
50
300
250
200
150
100
50
0
0
0
20
Ta [°C]
40
60
80 100
−40 −20
0
20
Ta [°C]
40
60
80 100
−40 −20
13. Delay Time 1 - Input Voltage (VDD
)
S-80122CL
Ta=25°C
300
250
200
150
100
50
0
2
4
6
8
10
VDD [V]
22
Seiko Instruments Inc.
ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING)
Rev.3.3_00
S-801 Series
14. Delay Time 2 - Temperature (Ta)
S-80122AL
S-80160AL
VDD=7.0 V
VDD=3.2 V
400
350
300
250
200
150
100
50
400
350
300
250
200
150
100
50
0
0
0
20
Ta [°C]
40
60
80 100
−40 −20
0
20
Ta [°C]
40
60
80 100
−40 −20
15. Delay Time 2 - Input Voltage (VDD
)
S-80122AN
Ta=25°C
400
350
300
250
200
150
100
50
0
2
4
6
8
10
VDD [V]
R*2
VIH
VDD
100 kΩ
DS*1
V
OUT
S-801
Series
INPUT VOLTAGE
VIL
VDD
VSS
tD
V
VDD×90 %
OUTPUT VOLTAGE
VSS
*1. Set to VDD or VSS.
*2. R is not necessary for CMOS output products.
VIH=10 V, VIL=0.95 V
Figure 18 Measurment Condition for Delay Time
Figure 19 Measurment Circuit for Delay Time
Caution The above connection diagram will not guarantees successful operation. Perform through using
the actual application to set the constant.
Seiko Instruments Inc.
23
ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING)
Rev.3.3_00
S-801 Series
16. Response Time - Load Capacitor (COUT
)
S-80122AL
S-80122AN
Ta=25°C
Ta=25°C
1
100
10
1
0.1
tPHL
0.1
tPHL
0.01
0.001
tPLH
(Delay time2)
tPLH
(Delay time2)
0.01
0.001
0.00001 0.0001
0.001
COUT [μF]
0.01
0.1
0.00001 0.0001
0.001
COUT [μF]
0.01 0.1
S-80160AL
S-80160AN
Ta=25°C
Ta=25°C
1
100
10
1
0.1
tPHL
0.1
tPHL
0.01
0.001
tPLH
(Delay time2)
tPLH
(Delay time2)
0.01
0.001
0.00001 0.0001
0.001
0.01
0.1
0.00001 0.0001
0.001
0.01 0.1
COUT [μF]
COUT [μF]
1 μs
1 μs
R*1
100 kΩ
VDD
S-801
VIH
VDD
INPUT VOLTAGE
OUT
Series
V
DS
VIL
VDD
tPLH
tPHL
VSS
V
VDD × 90 %
OUTPUT VOLTAGE
*1. R is not necessary for CMOS output products.
VDD × 10 %
VIH=10 V, VIL=0.95 V
Figure 20 Measurment Condition for Response Time
Figure 21 Measurment Circuit for Response Time
Caution The above connection diagram will not guarantees successful operation. Perform through using
the actual application to set the constant.
24
Seiko Instruments Inc.
ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING)
Rev.3.3_00
S-801 Series
Application Circuit Examples
Microcomputer Reset Circuits
If the power supply voltage to a microcomputer falls below the specified level, an unspecified
operation may be performed or the contents of the memory register may be lost. When power supply
voltage returns to normal, the microcomputer needs to be initialized before normal operations can be
done. Reset circuits protect microcomputers in the event of current being momentarily switched off
or lowered.
Reset circuits shown in Figures 22 to 23 can be easily constructed with the help of the S-801 series
that has low operating voltage, a high-precision detection voltage, hysteresis, and a built-in delay
circuit.
VDD1
VDD2
VDD
S-
S-
Microcomputer
801xxAN
Microcomputer
801xxAL
VSS
VSS
(Nch open-drain output products only.)
Figure 23 Reset Circuit (S-801xxAN)
Figure 22 Ret Circuit (S-801xxAL)
Caution The above connection diagram will not guarantees successful operation. Perform
through using the actual application to set the constant.
Seiko Instruments Inc.
25
2.9±0.2
1.9±0.2
4
5
+0.1
-0.06
1
2
3
0.16
0.95±0.1
0.4±0.1
No. MP005-A-P-SD-1.2
TITLE
SOT235-A-PKG Dimensions
MP005-A-P-SD-1.2
No.
SCALE
UNIT
mm
Seiko Instruments Inc.
4.0±0.1(10 pitches:40.0±0.2)
+0.1
-0
2.0±0.05
0.25±0.1
ø1.5
+0.2
-0
4.0±0.1
ø1.0
1.4±0.2
3.2±0.2
3
4
2 1
5
Feed direction
No. MP005-A-C-SD-2.1
TITLE
SOT235-A-Carrier Tape
MP005-A-C-SD-2.1
No.
SCALE
UNIT
mm
Seiko Instruments Inc.
12.5max.
9.0±0.3
Enlarged drawing in the central part
ø13±0.2
(60°)
(60°)
No. MP005-A-R-SD-1.1
TITLE
SOT235-A-Reel
MP005-A-R-SD-1.1
No.
SCALE
UNIT
QTY.
3,000
mm
Seiko Instruments Inc.
1.2±0.04
3
4
+0.05
-0.02
0.08
2
1
0.65
0.48±0.02
0.2±0.05
No. PF004-A-P-SD-4.0
SNT-4A-A-PKG Dimensions
PF004-A-P-SD-4.0
TITLE
No.
SCALE
UNIT
mm
Seiko Instruments Inc.
+0.1
-0
ø1.5
4.0±0.1
2.0±0.05
0.25±0.05
+0.1
ø0.5
-0
4.0±0.1
0.65±0.05
1.45±0.1
5°
2
3
1
4
Feed direction
No. PF004-A-C-SD-1.0
TITLE
SNT-4A-A-Carrier Tape
PF004-A-C-SD-1.0
No.
SCALE
UNIT
mm
Seiko Instruments Inc.
12.5max.
9.0±0.3
Enlarged drawing in the central part
ø13±0.2
(60°)
(60°)
No. PF004-A-R-SD-1.0
SNT-4A-A-Reel
TITLE
No.
PF004-A-R-SD-1.0
SCALE
UNIT
QTY.
5,000
mm
Seiko Instruments Inc.
0.52
1.16
0.52
0.3
0.3
0.35
Caution Making the wire pattern under the package is possible. However, note that the package
may be upraised due to the thickness made by the silk screen printing and of a solder
resist on the pattern because this package does not have the standoff.
No. PF004-A-L-SD-3.0
SNT-4A-A-Land Recommendation
TITLE
No.
PF004-A-L-SD-3.0
SCALE
UNIT
mm
Seiko Instruments Inc.
·
·
The information described herein is subject to change without notice.
Seiko Instruments Inc. is not responsible for any problems caused by circuits or diagrams described herein
whose related industrial properties, patents, or other rights belong to third parties. The application circuit
examples explain typical applications of the products, and do not guarantee the success of any specific
mass-production design.
·
·
·
When the products described herein are regulated products subject to the Wassenaar Arrangement or other
agreements, they may not be exported without authorization from the appropriate governmental authority.
Use of the information described herein for other purposes and/or reproduction or copying without the
express permission of Seiko Instruments Inc. is strictly prohibited.
The products described herein cannot be used as part of any device or equipment affecting the human
body, such as exercise equipment, medical equipment, security systems, gas equipment, or any apparatus
installed in airplanes and other vehicles, without prior written permission of Seiko Instruments Inc.
Although Seiko Instruments Inc. exerts the greatest possible effort to ensure high quality and reliability, the
failure or malfunction of semiconductor products may occur. The user of these products should therefore
give thorough consideration to safety design, including redundancy, fire-prevention measures, and
malfunction prevention, to prevent any accidents, fires, or community damage that may ensue.
·
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