532AA970M000BGR [SILICON]

Oscillator;
532AA970M000BGR
型号: 532AA970M000BGR
厂家: SILICON    SILICON
描述:

Oscillator

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中文:  中文翻译
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Si532  
PRELIMINARY DATA SHEET  
CRYSTAL OSCILLATOR (XO)  
(10 MHZ TO 1.4 GHZ)  
Features  
Available with any-rate output  
Internal fixed crystal frequency  
ensures high reliability and low  
aging  
frequencies from 10 MHz to 945 MHz  
and select frequencies to 1.4 GHz  
Two selectable output frequencies Available CMOS, LVPECL,  
®
LVDS, and CML outputs  
3rd generation DSPLL with superior  
3.3, 2.5, and 1.8 V supply options  
Industry-standard 5 x 7 mm  
package and pinout  
jitter performance  
3x better frequency stability than  
SAW-based oscillators  
Pb-free/RoHS-compliant  
Ordering Information:  
Applications  
See page 6.  
SONET/SDH  
Networking  
SD/HD video  
Clock and data recovery  
FPGA/ASIC clock generation  
Pin Assignments:  
See page 5.  
Description  
(Top View)  
The Si532 dual frequency XO utilizes Silicon Laboratories’ advanced  
®
DSPLL circuitry to provide a low jitter clock at high frequencies. The Si532 is  
VDD  
1
2
3
6
5
4
FS  
OE  
available with any-rate output frequency from 10 to 945 MHz and select  
frequencies to 1400 MHz. Unlike a traditional XO where a different crystal is  
required for each output frequency, the Si532 uses one fixed crystal  
frequency to provide a wide range of output frequencies. This IC based  
approach allows the crystal resonator to provide exceptional frequency  
stability and reliability. In addition, DSPLL clock synthesis provides superior  
supply noise rejection, simplifying the task of generating low jitter clocks in  
noisy environments typically found in communication systems. The Si532 IC  
based XO is factory configurable for a wide variety of user specifications  
including frequency, supply voltage, output format, and temperature stability.  
Specific configurations are factory programmed at time of shipment, thereby  
eliminating long lead times associated with custom oscillators.  
CLK–  
CLK+  
GND  
(LVDS/LVPECL/CML)  
VDD  
1
2
3
6
5
4
FS  
OE  
NC  
Functional Block Diagram  
GND  
CLK  
VDD  
CLK– CLK+  
(CMOS)  
Any-rate  
10–1400 MHz  
DSPLL®  
Fixed  
Frequency  
XO  
Clock  
Synthesis  
FS  
OE  
GND  
Preliminary Rev. 0.4 5/06  
Copyright © 2006 by Silicon Laboratories  
Si532  
This information applies to a product under development. Its characteristics and specifications are subject to change without notice.  
Si532  
1. Electrical Specifications  
Table 1. Recommended Operating Conditions  
Parameter  
Symbol  
Test Condition  
3.3 V option  
Min  
2.97  
2.25  
1.71  
Typ  
3.3  
2.5  
1.8  
90  
Max  
3.63  
2.75  
1.89  
Units  
1
V
DD  
Supply Voltage  
2.5 V option  
V
1.8 V option  
Supply Current  
I
Output enabled  
TriState mode  
DD  
mA  
60  
2
Output Enable (OE)  
V
0.75 x V  
IH  
DD  
V
V
0.5  
85  
IL  
Operating Temperature Range  
T
–40  
ºC  
A
Notes:  
1. Selectable parameter specified by part number. See Section 3. "Ordering Information" on page 6 for further details.  
2. OE pin includes a 17 kpullup resistor to VDD. Pulling OE to ground causes outputs to tristate.  
Table 2. CLK± Output Frequency Characteristics  
Parameter  
Symbol  
Test Condition  
LVPECL/LVDS/CML  
CMOS  
Min  
10  
Typ  
Max  
945  
160  
Units  
Nominal Frequency1,2  
O
f
MHz  
10  
Initial Accuracy  
Measured at +25 °C at  
time of shipping  
fi  
±1.5  
ppm  
ppm  
ppm  
f/f  
–20  
–50  
+20  
+50  
Temperature Stability1,3  
Aging  
O
Frequency drift over  
projected 15 year life  
fa  
±10  
Powerup Time4  
tOSC  
tFRQ  
10  
10  
ms  
ms  
Settling Time After FS Change  
Notes:  
1. See Section 3. "Ordering Information" on page 6 for further details.  
2. Specified at time of order by part number. Also available in frequencies from 970 to 1134 MHz and 1213 to 1417 MHz.  
3. Selectable parameter specified by part number.  
4. Time from powerup or tristate mode to fO.  
2
Preliminary Rev. 0.4  
Si532  
Table 3. CLK± Output Levels and Symmetry  
Parameter  
Symbol  
Test Condition  
mid-level  
Min  
VDD – 1.42  
1.1  
Typ  
Max  
Units  
V
1
VDD – 1.25  
1.9  
LVPECL Output Option  
V
O
VOD  
VSE  
swing (diff)  
VPP  
VPP  
V
swing (single-ended)  
mid-level  
0.5  
0.93  
1.275  
0.50  
2
LVDS Output Option  
V
1.125  
0.32  
1.20  
0.40  
O
swing (diff)  
VOD  
VO  
VPP  
V
2
CML Output Option  
mid-level  
V
– 0.75  
DD  
VOD  
VOH  
VOL  
swing (diff)  
0.70  
0.8 x VDD  
0.95  
1.20  
VDD  
0.4  
VPP  
3
CMOS Output Option  
I
= 32 mA  
OH  
V
IOL = 32 mA  
Rise/Fall time (20/80%)  
Symmetry (duty cycle)  
tR, F  
t
LVPECL/LVDS/CML  
CMOS with CL = 15 pF  
350  
ps  
ns  
1
SYM  
LVPECL:  
LVDS:  
V
– 1.3 V (diff)  
DD  
45  
55  
%
1.25 V (diff)  
/2  
CMOS:  
V
DD  
Notes:  
1. 50 to VDD – 2.0 V.  
2. Rterm = 100 (differential).  
3. CL = 15 pF  
Table 4. CLK± Output Phase Jitter  
Parameter  
Symbol  
Test Condition  
Min  
Typ  
Max  
Units  
Phase Jitter (RMS)*  
φJ  
φJ  
12 kHz to 20 MHz (OC-48)  
50 kHz to 80 MHz (OC-192)  
0.27  
0.30  
ps  
for F  
> 500 MHz  
OUT  
Phase Jitter (RMS)*  
for F of 125 to 500 MHz  
12 kHz to 20 MHz (OC-48)  
0.50  
ps  
OUT  
*Note: Differential Modes: LVPECL/LVDS/CML. Refer to AN256 for further information.  
Table 5. CLK± Output Period Jitter  
Parameter  
Period Jitter*  
Symbol  
Test Condition  
RMS  
Min  
Typ  
1
Max  
Units  
J
ps  
PER  
for F < 160 MHz  
OUT  
Peak-to-Peak  
5
*Note: Any output mode, including CMOS, LVPECL, LVDS, CML. N = 1000 cycles.  
Preliminary Rev. 0.4  
3
Si532  
Table 6. CLK± Output Phase Noise (Typical)  
Configuration  
f
81.25 MHz  
LVDS  
312.5 MHz  
LVPECL  
1066 MHz  
LVPECL  
Units  
C
Output  
Offest Frequency (f)  
L (f)  
100 Hz  
1 kHz  
10 kHz  
100 kHz  
1 MHz  
–110  
–127  
–134  
–136  
–143  
–147  
n/a  
–100  
–115  
–119  
–123  
–135  
–144  
–147  
–87  
–102  
–107  
–111  
–121  
–135  
–142  
dBc/Hz  
10 MHz  
100 MHz  
Table 7. Absolute Maximum Ratings1  
Parameter  
Supply Voltage  
Symbol  
Rating  
–0.5 to +3.8  
Units  
V
Volts  
Volts  
ºC  
DD  
Input Voltage (any input pin)  
Storage Temperature  
V
–0.5 to V + 0.3  
I
DD  
T
–55 to +125  
>2500  
260  
S
ESD Sensitivity (HBM, per JESD22-A114)  
ESD  
Volts  
ºC  
2
Soldering Temperature (Pb-free profile)  
T
PEAK  
2
Soldering Temperature Time @ T  
(Pb-free profile)  
t
10  
seconds  
PEAK  
P
Notes:  
1. Stresses beyond those listed in Absolute Maximum Ratings may cause permanent damage to the device. Functional  
operation or specification compliance is not implied at these conditions.  
2. Refer to Si5xx Packaging FAQ available for download at www.silabs.com/VCXO for further information, including  
soldering profiles.  
Table 8. Environmental Compliance  
The Si532 meets the following qualification test requirements.  
Parameter  
Conditions/ Test Method  
MIL-STD-883F, Method 2002.3 B  
MIL-STD-883F, Method 2007.3 A  
MIL-STD-883F, Method 203.8  
MIL-STD-883F, Method 1014.7  
MIL-STD-883F, Method 2016  
Mechanical Shock  
Mechanical Vibration  
Solderability  
Gross & Fine Leak  
Resistance to Solvents  
4
Preliminary Rev. 0.4  
Si532  
2. Pin Descriptions  
(Top View)  
VDD  
VDD  
1
2
3
6
5
4
1
6
5
4
FS  
OE  
FS  
OE  
2
3
NC  
CLK–  
CLK+  
GND  
GND  
CLK  
LVDS/LVPECL/CML  
CMOS  
Table 9. Pin Descriptions  
Pin  
Symbol  
LVDS/LVPECL/CML Function  
CMOS Function  
Frequency Select  
Frequency Select  
1
FS*  
0 = First frequency selected  
1 = Second frequency selected  
0 = First frequency selected  
1 = Second frequency selected  
Output enable  
Output enable  
2
OE*  
0 = clock output disabled (outputs tristated) 0 = clock output disabled (outputs tristated)  
1 = clock output enabled  
Electrical and Case Ground  
Oscillator Output  
1 = clock output enabled  
Electrical and Case Ground  
Oscillator Output  
3
4
5
6
GND  
CLK+  
CLK–  
Complementary output  
Power Supply Voltage  
No connection  
V
Power Supply Voltage  
DD  
*Note: FS and OE include a 17 kpullup resistor to VDD. See Section 3. “Ordering Information” for details on frequency value  
ordering.  
Preliminary Rev. 0.4  
5
Si532  
3. Ordering Information  
The Si532 XO was designed to support a variety of options including frequency, temperature stability, output  
format, and V . Specific device configurations are programmed into the Si532 at time of shipment. Configurations  
DD  
can be specified using the Part Number Configuration chart below. Silicon Laboratories provides a web browser-  
based part number configuration utility to simplify this process. Refer to www.silabs.com/VCXOPartNumber to  
access this tool and for further ordering instructions. The Si532 is supplied in an industry-standard, RoHS  
compliant, 6-pad, 5 x 7 mm package.  
X
X
B
G
R
532  
XXXXXX  
R = Tape & Reel  
Blank = Trays  
532 Dual XO  
Product Family  
Operating Temp Range (°C)  
–40 to +85 °C  
G
Device Revision Letter  
6-digit Frequency Designator Code  
1st Option Code  
Two unique frequencies can be specified within the following bands of frequencies: 10 to  
945 MHz, 970 to 1134 MHz, and 1213 to 1417 MHz. A six digit code will be assigned for  
the specified combination of frequencies. Codes > 000100 refer to dual XOs programmed  
with the lower frequency value selected when FS = 0, and the higher value when FS = 1.  
Six digit codes < 000100 refer to dual XOs programmed with the higher frequency value  
selected when FS = 0, and the lower value when FS = 1.  
Code  
A
B
C
D
E
F
G
H
J
VDD  
3.3  
Output Format  
LVPECL  
LVDS  
CMOS  
CML  
3.3  
3.3  
3.3  
2.5  
2.5  
2.5  
2.5  
1.8  
1.8  
LVPECL  
LVDS  
CMOS  
CML  
2nd Option Code  
CMOS  
CML  
Code Temperature Stability (ppm, max, ±)  
K
A
B
50  
20  
Note:  
CMOS available to 160 MHz.  
Example Part Number: 532AB000108BGR is a 5 x 7 mm Dual XO in a 6 pad package. Since the six digit code (000108) is > 000100,  
f0 is 644.53125 MHz (lower frequency) and f1 is 693.48299 (higher frequency), with a 3.3 V supply and LVPECL output. Temperature  
stability is specified as ± 20 ppm. The part is specified for a -40 to +85 C° ambient temperature range operation and is shipped in tape  
and reel format.  
Figure 1. Part Number Convention  
6
Preliminary Rev. 0.4  
Si532  
4. Outline Diagram and Suggested Pad Layout  
Figure 2 illustrates the package details for the Si532. Table 10 lists the values for the dimensions shown in the  
illustration.  
Figure 2. Si532 Outline Diagram  
Table 10. Package Diagram Dimensions (mm)  
Dimension  
Min  
1.45  
1.2  
Nom  
1.65  
Max  
1.85  
1.6  
A
b
1.4  
c
0.60 TYP  
7.00 BSC  
6.2  
D
D1  
e
6.10  
6.30  
2.54 BSC  
5.00 BSC  
4.40  
E
E1  
L
4.30  
1.07  
4.50  
1.47  
1.27  
S
1.815 BSC  
0.7 REF  
R
aaa  
bbb  
ccc  
ddd  
0.15  
0.15  
0.10  
0.10  
Preliminary Rev. 0.4  
7
Si532  
5. 6-Pin PCB Land Pattern  
Figure 3 illustrates the 6-pin PCB land pattern for the Si532. Table 11 lists the values for the dimensions shown in  
the illustration.  
Figure 3. Si532 PCB Land Pattern  
Table 11. PCB Land Pattern Dimensions (mm)  
Dimension  
Min  
Max  
D2  
e
5.08 REF  
2.54 BSC  
4.15 REF  
E2  
GD  
GE  
VD  
VE  
X
0.84  
2.00  
8.20 REF  
7.30 REF  
1.70 TYP  
2.15 REF  
Y
ZD  
ZE  
6.78  
6.30  
Notes:  
1. Dimensioning and tolerancing per the ANSI Y14.5M-1994 specification.  
2. Land pattern design based on IPC-7351 guidelines.  
3. All dimensions shown are at maximum material condition (MMC).  
4. Controlling dimension is in millimeters (mm).  
8
Preliminary Rev. 0.4  
Si532  
DOCUMENT CHANGE LIST  
Revision 0.3 to Revision 0.4  
Updated 1. "Electrical Specifications" on page 2.  
Updated ordering and format of Tables 1–9.  
Updated LVDS and CML in Table 3, “CLK± Output  
Levels and Symmetry,” on page 3.  
Added Table 6, “CLK± Output Phase Noise  
(Typical),” on page 4.  
Preliminary Rev. 0.4  
9
Si532  
CONTACT INFORMATION  
Silicon Laboratories Inc.  
4635 Boston Lane  
Austin, TX 78735  
Tel: 1+(512) 416-8500  
Fax: 1+(512) 416-9669  
Toll Free: 1+(877) 444-3032  
Email: VCXOinfo@silabs.com  
Internet: www.silabs.com  
The information in this document is believed to be accurate in all respects at the time of publication but is subject to change without notice.  
Silicon Laboratories assumes no responsibility for errors and omissions, and disclaims responsibility for any consequences resulting from  
the use of information included herein. Additionally, Silicon Laboratories assumes no responsibility for the functioning of undescribed features  
or parameters. Silicon Laboratories reserves the right to make changes without further notice. Silicon Laboratories makes no warranty, rep-  
resentation or guarantee regarding the suitability of its products for any particular purpose, nor does Silicon Laboratories assume any liability  
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation conse-  
quential or incidental damages. Silicon Laboratories products are not designed, intended, or authorized for use in applications intended to  
support or sustain life, or for any other application in which the failure of the Silicon Laboratories product could create a situation where per-  
sonal injury or death may occur. Should Buyer purchase or use Silicon Laboratories products for any such unintended or unauthorized ap-  
plication, Buyer shall indemnify and hold Silicon Laboratories harmless against all claims and damages.  
Silicon Laboratories, Silicon Labs, and DSPLL are trademarks of Silicon Laboratories Inc.  
Other products or brandnames mentioned herein are trademarks or registered trademarks of their respective holders.  
10  
Preliminary Rev. 0.4  

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