AM29F200BT-50FC [SPANSION]
Flash, 128KX16, 50ns, PDSO48, REVERSE, MO-142DD, TSOP-48;型号: | AM29F200BT-50FC |
厂家: | SPANSION |
描述: | Flash, 128KX16, 50ns, PDSO48, REVERSE, MO-142DD, TSOP-48 光电二极管 内存集成电路 |
文件: | 总42页 (文件大小:1325K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
Am29F200B
Data Sheet
July 2003
The following document specifies Spansion memory products that are now offered by both Advanced
Micro Devices and Fujitsu. Although the document is marked with the name of the company that orig-
inally developed the specification, these products will be offered to customers of both AMD and
Fujitsu.
Continuity of Specifications
There is no change to this datasheet as a result of offering the device as a Spansion product. Any
changes that have been made are the result of normal datasheet improvement and are noted in the
document revision summary, where supported. Future routine revisions will occur when appropriate,
and changes will be noted in a revision summary.
Continuity of Ordering Part Numbers
AMD and Fujitsu continue to support existing part numbers beginning with “Am” and “MBM”. To order
these products, please use only the Ordering Part Numbers listed in this document.
For More Information
Please contact your local AMD or Fujitsu sales office for additional information about Spansion
memory solutions.
Publication Number 21526 Revision D Amendment +1 Issue Date June 14, 2004
THIS PAGE LEFT INTENTIONALLY BLANK.
Am29F200B
2 Megabit (256 K x 8-Bit/128 K x 16-Bit)
CMOS 5.0 Volt-only, Boot Sector Flash Memory
DISTINCTIVE CHARACTERISTICS
■ 5.0 V for read and write operations
■ Embedded Algorithms
— Minimizes system level power requirements
— Embedded Erase algorithm automatically
preprograms and erases the entire chip or any
combination of designated sectors
■ Manufactured on 0.32 µm process technology
— Compatible with 0.5 µm Am29F200A device
— Embedded Program algorithm automatically
writes and verifies data at specified addresses
■ High performance
— Access times as fast as 45 ns
■ Minimum 1,000,000 write/erase cycles guaranteed
■ 20-year data retention at 125°C
— Reliable operation for the life of the system
■ Package options
■ Low power consumption
— 20 mA typical active read current (byte mode)
— 28 mA typical active read current for
(word mode)
— 44-pin SO
— 30 mA typical program/erase current
— 1 µA typical standby current
— 48-pin TSOP
— Known Good Die (KGD)
(see publication number 21257)
■ Sector erase architecture
— One 16 Kbyte, two 8 Kbyte, one 32 Kbyte, and
three 64 Kbyte sectors (byte mode)
■ Compatible with JEDEC standards
— Pinout and software compatible with
single-power-supply flash
— One 8 Kword, two 4 Kword, one 16 Kword, and
three 32 Kword sectors (word mode)
— Superior inadvertent write protection
— Supports full chip erase
■ Data# Polling and Toggle Bit
— Sector Protection features:
— Detects program or erase cycle completion
■ Ready/Busy# output (RY/BY#)
A hardware method of locking a sector to
prevent any program or erase operations within
that sector
— Hardware method for detection of program or
erase cycle completion
Sectors can be locked via programming equipment
■ Erase Suspend/Erase Resume
Temporary Sector Unprotect feature allows code
changes in previously locked sectors
— Supports reading data from a sector not
being erased
■ Top or bottom boot block configurations available
■ Hardware RESET# pin
— Resets internal state machine to the reading
array data
Publication# 21526 Rev: D Amendment/1
Issue Date: June 14, 2004
This Data Sheet states AMD’s current technical specifications regarding the Products described herein. This Data
Sheet may be revised by subsequent versions or modifications due to changes in technical specifications.
GENERAL DESCRIPTION
The Am29F200B is a 2 Mbit, 5.0 Volt-only Flash
memory organized as 262,144 bytes or 131,072 words.
The 8 bits of data appear on DQ0–DQ7; the 16 bits on
DQ0–DQ15. The Am29F200B is offered in 44-pin SO
and 48-pin TSOP packages. The device is also avail-
able in Known Good Die (KGD) form. For more
information, refer to publication number 21257. This
device is designed to be programmed in-system with
the standard system 5.0 volt VCC supply. A 12.0 volt
VPP is not required for program or erase operations.
The device can also be reprogrammed in standard
EPROM programmers.
Device erasure occurs by executing the erase
command sequence. This initiates the Embedded
Erase algorithm—an internal algorithm that automati-
cally preprograms the array (if it is not already
programmed) before executing the erase operation.
During erase, the device automatically times the erase
pulse widths and verifies proper cell margin.
The host system can detect whether a program or
erase operation is complete by observing the RY/BY#
pin, or by reading the DQ7 (Data# Polling) and DQ6/
DQ2 (toggle) status bits. After a program or erase
cycle has been completed, the device is ready to read
array data or accept another command.
This device is manufactured using AMD’s 0.32 µm
process technology, and offers all the features and
benefits of the Am29F200A, which was manufactured
using 0.5 µm process technology.
The sector erase architecture allows memory sectors
to be erased and reprogrammed without affecting the
data contents of other sectors. The device is fully
erased when shipped from the factory.
The standard device offers access times of 45, 50, 55,
70, 90, and 120 ns, allowing operation of high-speed
microprocessors without wait states. To eliminate bus
contention the device has separate chip enable (CE#),
write enable (WE#) and output enable (OE#) controls.
Hardware data protection measures include a low
VCC detector that automatically inhibits write opera-
tions during power transitions. The hardware sector
protection feature disables both program and erase
operations in any combination of the sectors of memory.
This can be achieved via programming equipment.
The device requires only a single 5.0 volt power
supply for both read and write functions. Internally
generated and regulated voltages are provided for the
program and erase operations.
The Erase Suspend feature enables the user to put
erase on hold for any period of time to read data from,
or program data to, any sector that is not selected for
erasure. True background erase can thus be achieved.
The device is entirely command set compatible with the
JEDEC single-power-supply Flash standard. Com-
mands are written to the command register using
standard microprocessor write timings. Register con-
tents serve as input to an internal state-machine that
controls the erase and programming circuitry. Write
cycles also internally latch addresses and data needed
for the programming and erase operations. Reading
data out of the device is similar to reading from other
Flash or EPROM devices.
The hardware RESET# pin terminates any operation
in progress and resets the internal state machine to
reading array data. The RESET# pin may be tied to the
system reset circuitry. A system reset would thus also
reset the device, enabling the system microprocessor
to read the boot-up firmware from the Flash memory.
The system can place the device into the standby
mode. Power consumption is greatly reduced in this mode.
Device programming occurs by executing the program
command sequence. This initiates the Embedded
Program algorithm—an internal algorithm that auto-
matically times the program pulse widths and verifies
proper cell margin.
AMD’s Flash technology combines years of Flash
memory manufacturing experience to produce the
highest levels of quality, reliability and cost effective-
ness. The device electrically erases all bits within a
sector simultaneously via Fowler-Nordheim tunneling.
The data is programmed using hot electron injection.
4
Am29F200B
TABLE OF CONTENTS
Figure 5. Toggle Bit Algorithm........................................................ 20
Table 6. Write Operation Status ..................................................... 21
Absolute Maximum Ratings. . . . . . . . . . . . . . . . . 22
Operating Ranges. . . . . . . . . . . . . . . . . . . . . . . . . 22
DC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . 23
TTL/NMOS Compatible .......................................................... 23
CMOS Compatible .................................................................. 24
Test Conditions. . . . . . . . . . . . . . . . . . . . . . . . . . . 25
Figure 8. Test Setup....................................................................... 25
Table 7. Test Specifications ........................................................... 25
Key to Switching Waveforms. . . . . . . . . . . . . . . . 25
AC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . 26
Read Operations .................................................................... 26
Figure 9. Read Operations Timings ............................................... 26
Hardware Reset (RESET#) .................................................... 27
Figure 10. RESET# Timings .......................................................... 27
Word/Byte Configuration (BYTE#) ...................................... 28
Figure 11. BYTE# Timings for Read Operations............................ 28
Figure 12. BYTE# Timings for Write Operations............................ 28
Erase/Program Operations ..................................................... 29
Figure 13. Program Operation Timings.......................................... 30
Figure 14. Chip/Sector Erase Operation Timings .......................... 31
Figure 15. Data# Polling Timings (During Embedded Algorithms). 32
Figure 16. Toggle Bit Timings (During Embedded Algorithms)...... 32
Figure 17. DQ2 vs. DQ6................................................................. 33
Temporary Sector Unprotect .................................................. 33
Figure 18. Temporary Sector Unprotect Timing Diagram .............. 33
Alternate CE# Controlled Erase/Program Operations ............ 34
Figure 19. Alternate CE# Controlled Write Operation Timings ...... 35
Erase and Programming Performance . . . . . . . . 36
Latchup Characteristics. . . . . . . . . . . . . . . . . . . . 36
TSOP and SO Pin Capacitance . . . . . . . . . . . . . . 36
Data Retention. . . . . . . . . . . . . . . . . . . . . . . . . . . . 36
Physical Dimensions . . . . . . . . . . . . . . . . . . . . . . 37
SO 044—44-Pin Small Outline Package ................................ 37
TS 048—48-Pin Standard Thin Small Outline Package ......... 38
TSR048—48-Pin Reverse Thin Small Outline Package ......... 39
Revision Summary . . . . . . . . . . . . . . . . . . . . . . . . 40
Revision A (July 1998) ............................................................ 40
Revision B (January 1999) ..................................................... 40
....................................................Revision B+2 (July 2, 1999) 40
Revision C (November 12, 1999) ........................................... 40
Revision D (November 29, 2000) ........................................... 40
Revision D (November 29, 2000) ........................................... 40
Revision D+1 (June 11, 2004) ................................................ 40
Product Selector Guide . . . . . . . . . . . . . . . . . . . . . 4
Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4
Connection Diagrams . . . . . . . . . . . . . . . . . . . . . . 5
Pin Configuration. . . . . . . . . . . . . . . . . . . . . . . . . . 7
Logic Symbol . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
Ordering Information. . . . . . . . . . . . . . . . . . . . . . . 8
Device Bus Operations . . . . . . . . . . . . . . . . . . . . . 9
Table 1. Am29F200B Device Bus Operations ..................................9
Word/Byte Configuration .......................................................... 9
Requirements for Reading Array Data ..................................... 9
Writing Commands/Command Sequences .............................. 9
Program and Erase Operation Status .................................... 10
Standby Mode ........................................................................ 10
RESET#: Hardware Reset Pin ............................................... 10
Output Disable Mode .............................................................. 10
Table 2. Am29F200T Top Boot Block Sector Address Table .........11
Table 3. Am29F200B Bottom Boot Block Sector Address Table ....11
Autoselect Mode ..................................................................... 11
Table 4. Am29F200B Autoselect Codes (High Voltage Method) ....12
Sector Protection/Unprotection ............................................... 12
Temporary Sector Unprotect .................................................. 12
Figure 1. Temporary Sector Unprotect Operation........................... 12
Hardware Data Protection ...................................................... 12
Low V Write Inhibit ......................................................................13
CC
Write Pulse “Glitch” Protection ........................................................13
Logical Inhibit ..................................................................................13
Power-Up Write Inhibit ....................................................................13
Command Definitions . . . . . . . . . . . . . . . . . . . . . 13
Reading Array Data ................................................................ 13
Reset Command ..................................................................... 13
Autoselect Command Sequence ............................................ 13
Word/Byte Program Command Sequence ............................. 14
Figure 2. Program Operation .......................................................... 14
Chip Erase Command Sequence ........................................... 14
Sector Erase Command Sequence ........................................ 15
Erase Suspend/Erase Resume Commands ........................... 15
Figure 3. Erase Operation............................................................... 16
Command Definitions ............................................................. 17
Table 5. Am29F200B Command Definitions ...................................17
DQ7: Data# Polling ................................................................. 18
Figure 4. Data# Polling Algorithm ................................................... 18
RY/BY#: Ready/Busy# ........................................................... 19
DQ6: Toggle Bit I .................................................................... 19
DQ2: Toggle Bit II ................................................................... 19
Reading Toggle Bits DQ6/DQ2 .............................................. 19
DQ5: Exceeded Timing Limits ................................................ 20
DQ3: Sector Erase Timer ....................................................... 20
Am29F200B
5
PRODUCT SELECTOR GUIDE
Family Part Number
Am29F200B
V
V
= 5.0 V 5%
= 5.0 V 10%
-45
-50
CC
Speed Option
-55
-70
70
70
30
-90
90
90
35
-120
120
120
50
CC
Max access time, ns (t
)
45
45
30
50
50
30
55
55
30
ACC
Max CE# access time, ns (t
)
CE
Max OE# access time, ns (t
)
OE
BLOCK DIAGRAM
DQ0–DQ15
RY/BY#
Buffer
RY/BY#
V
V
CC
Input/Output
Buffers
SS
Erase Voltage
Generator
State
Control
WE#
BYTE#
Command
Register
RESET#
PGM Voltage
Generator
Data
Latch
Chip Enable
Output Enable
Logic
STB
CE#
OE#
Y-Decoder
Y-Gating
STB
V
Detector
Timer
CC
X-Decoder
Cell Matrix
A0–A16
A-1
6
Am29F200B
CONNECTION DIAGRAMS
This device is also available in Known Good Die (KGD) form. Refer to publication number 21257 for
more information.
NC
RY/BY#
NC
1
2
3
4
5
6
7
8
9
44 RESET#
43 WE#
42 A8
A7
41 A9
A6
40 A10
A5
39 A11
A4
38 A12
A3
37 A13
A2
36 A14
A1 10
A0 11
35 A15
34 A16
SO
CE# 12
VSS 13
33 BYTE#
32 VSS
OE# 14
DQ0 15
DQ8 16
DQ1 17
DQ9 18
DQ2 19
DQ10 20
DQ3 21
DQ11 22
31 DQ15/A-1
30 DQ7
29 DQ14
28 DQ6
27 DQ13
26 DQ5
25 DQ12
24 DQ4
23 VCC
Am29F200B
7
CONNECTION DIAGRAMS
This device is also available in Known Good Die (KGD) form. Refer to publication number 21257 for
more information.
A16
1
2
3
4
5
6
7
A15
A14
A13
A12
A11
A10
A9
A8
NC
NC
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
BYTE#
V
SS
DQ15/A-1
DQ7
DQ14
DQ6
DQ13
DQ5
DQ12
8
9
10
11
12
13
14
15
16
17
18
19
20
DQ4
WE#
RESET#
NC
NC
RY/BY#
NC
V
CC
Standard TSOP
DQ11
DQ3
DQ10
DQ2
DQ9
DQ1
DQ8
DQ0
OE#
NC
A7
A6
A5
A4
A3
A2
A1
21
22
23
24
V
SS
CE#
A0
A16
BYTE#
1
2
3
4
5
6
7
A15
A14
A13
A12
A11
A10
A9
A8
NC
NC
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
V
SS
DQ15/A-1
DQ7
DQ14
DQ6
DQ13
DQ5
8
9
DQ12
DQ4
10
11
12
13
14
15
16
17
18
19
20
WE#
RESET#
NC
Reverse TSOP
V
CC
DQ11
DQ3
DQ10
DQ2
DQ9
DQ1
DQ8
DQ0
OE#
NC
RY/BY#
NC
NC
A7
A6
A5
A4
A3
A2
A1
21
22
23
24
V
SS
CE#
A0
8
Am29F200B
PIN CONFIGURATION
LOGIC SYMBOL
A0–A16
=
17 addresses
17
DQ0–DQ14 = 15 data inputs/outputs
A0–A16
16 or 8
DQ15/A-1
=
DQ15 (data input/output, word mode),
A-1 (LSB address input, byte mode)
DQ0–DQ15
(A-1)
BYTE#
CE#
=
=
=
=
=
=
=
Selects 8-bit or 16-bit mode
Chip enable
CE#
OE#
OE#
Output enable
WE#
WE#
Write enable
RESET#
BYTE#
RESET#
RY/BY#
VCC
Hardware reset pin, active low
Ready/Busy output
RY/BY#
+5.0 V single power supply
(see Product Selector Guide for
device speed ratings and voltage
supply tolerances)
VSS
NC
=
=
Device ground
Pin not connected internally
Am29F200B
9
ORDERING INFORMATION
Standard Products
AMD standard products are available in several packages and operating ranges. The order number (Valid Combination) is formed
by a combination of the following:
Am29F200B
T
-45
E
C
TEMPERATURE RANGE
C
D
I
=
=
=
=
=
=
Commercial (0°C to +70°C)
Commercial (0°C to +70°C) with Pb-free package
Industrial (–40°C to +85°C)
Industrial (–40°C to +85°C) with Pb-free package
Extended (–55°C to +125°C)
Extended (–55°C to +125°C) with Pb-free package
F
E
K
PACKAGE TYPE
E
F
S
=
=
=
48-Pin Thin Small Outline Package (TSOP) Standard Pinout (TS 048)
48-Pin Thin Small Outline Package (TSOP) Reverse Pinout (TSR048)
44-Pin Small Outline Package (SO 044)
This device is also available in Known Good Die (KGD) form. See publication number
21257 for more information.
SPEED OPTION
See Product Selector Guide and Valid Combinations
BOOT CODE SECTOR ARCHITECTURE
T
B
=
=
Top sector
Bottom sector
DEVICE NUMBER/DESCRIPTION
Am29F200B
2 Megabit (256 K x 8-Bit/128 K x 16-Bit) CMOS Flash Memory
5.0 Volt-only Program and Erase
Valid Combinations
Valid Combinations
V
Voltage
CC
Valid Combinations list configurations planned to be sup-
ported in volume for this device. Consult the local AMD sales
office to confirm availability of specific valid combinations and
to check on newly released combinations.
EC, EI, FC, FI, SC, SI
ED, EF, SD, SF
AM29F200BT-45,
AM29F200BB-45
5.0 V 5%
AM29F200BT-50,
AM29F200BB-50
AM29F200BT-55,
AM29F200BB-55
EC, EI, EE, ED, EF, EK
FC, FI, FE,
SC, SI, SE, SD, SF, SK
AM29F200BT-70,
AM29F200BB-70
5.0 V 10%
AM29F200BT-90,
AM29F200BB-90
AM29F200BT-120,
AM29F200BB-120
10
Am29F200B
DEVICE BUS OPERATIONS
This section describes the requirements and use of the
device bus operations, which are initiated through the
internal command register. The command register
itself does not occupy any addressable memory loca-
tion. The register is composed of latches that store the
commands, along with the address and data informa-
tion needed to execute the command. The contents of
the register serve as inputs to the internal state
machine. The state machine outputs dictate the func-
tion of the device. The appropriate device bus
operations table lists the inputs and control levels
required, and the resulting output. The following sub-
sections describe each of these operations in further
detail.
Table 1. Am29F200B Device Bus Operations
DQ8–DQ15
BYTE# BYTE#
Operation
CE#
L
OE# WE#
RESET#
A0–A16
DQ0–DQ7
= V
= V
IH
IL
Read
Write
L
H
X
X
H
X
H
L
H
H
A
D
D
High-Z
High-Z
IN
IN
OUT
OUT
L
A
D
D
IN
IN
CMOS Standby
TTL Standby
V
0.5 V
X
X
H
X
V
0.5 V
X
High-Z
High-Z
High-Z
High-Z
High-Z High-Z
High-Z High-Z
High-Z High-Z
High-Z High-Z
CC
CC
H
L
H
H
L
X
X
X
Output Disable
Hardware Reset
X
Temporary Sector Unprotect
(See Note)
X
X
X
V
A
D
D
IN
X
ID
IN
IN
Legend:
L = Logic Low = V , H = Logic High = V , V = 12.0 0.5 V, X = Don’t Care, D = Data In, D
= Data Out, A = Address In
IN
IL
IH
ID
IN
OUT
Note: See the sections Sector Group Protection and Temporary Sector Unprotect for more information.
content occurs during the power transition. No
Word/Byte Configuration
command is necessary in this mode to obtain array
data. Standard microprocessor read cycles that assert
valid addresses on the device address inputs produce
valid data on the device data outputs. The device
remains enabled for read access until the command
register contents are altered.
The BYTE# pin controls whether the device data I/O
pins DQ15–DQ0 operate in the byte or word configura-
tion. If the BYTE# pin is set at logic ‘1’, the device is in
word configuration, DQ15–DQ0 are active and con-
trolled by CE# and OE#.
If the BYTE# pin is set at logic ‘0’, the device is in byte
configuration, and only data I/O pins DQ0–DQ7 are
active and controlled by CE# and OE#. The data I/O
pins DQ8–DQ14 are tri-stated, and the DQ15 pin is
used as an input for the LSB (A-1) address function.
See “Reading Array Data” for more information. Refer
to the AC Read Operations table for timing specifica-
tions and to the Read Operations Timings diagram for
the timing waveforms. ICC1 in the DC Characteristics
table represents the active current specification for
reading array data.
Requirements for Reading Array Data
To read array data from the outputs, the system must
drive the CE# and OE# pins to VIL. CE# is the power
control and selects the device. OE# is the output
control and gates array data to the output pins. WE#
should remain at VIH. On x16 (word-wide) devices, the
BYTE# pin determines whether the device outputs
array data in words or bytes.
Writing Commands/Command Sequences
To write a command or command sequence (which
includes programming data to the device and erasing
sectors of memory), the system must drive WE# and
CE# to VIL, and OE# to VIH.
On x16 (word-wide) devices, for program operations,
the BYTE# pin determines whether the device accepts
program data in bytes or words. Refer to “Word/Byte
Configuration” for more information.
The internal state machine is set for reading array data
upon device power-up, or after a hardware reset. This
ensures that no spurious alteration of the memory
Am29F200B
11
An erase operation can erase one sector, multiple sec-
tors, or the entire device. The Sector Address Tables
indicate the address space that each sector occupies.
A “sector address” consists of the address bits required
to uniquely select a sector. See the “Command Defini-
tions” section for details on erasing a sector or the
entire chip, or suspending/resuming the erase
operation.
If the device is deselected during erasure or program-
ming, the device draws active current until the
operation is completed.
In the DC Characteristics tables, ICC3 represents the
standby current specification.
RESET#: Hardware Reset Pin
The RESET# pin provides a hardware method of reset-
ting the device to reading array data. When the system
After the system writes the autoselect command
sequence, the device enters the autoselect mode. The
system can then read autoselect codes from the
internal register (which is separate from the memory
array) on DQ7–DQ0. Standard read cycle timings apply
in this mode. Refer to the “Autoselect Mode” and
“Autoselect Command Sequence” sections for more
information.
drives the RESET# pin low for at least a period of tRP
,
the device immediately terminates any operation in
progress, tristates all data output pins, and ignores all
read/write attempts for the duration of the RESET#
pulse. The device also resets the internal state
machine to reading array data. The operation that was
interrupted should be reinitiated once the device is
ready to accept another command sequence, to
ensure data integrity.
ICC2 in the DC Characteristics table represents the
active current specification for the write mode. The “AC
Characteristics” section contains timing specification
tables and timing diagrams for write operations.
Current is reduced for the duration of the RESET#
pulse. When RESET# is held at VIL, the device enters
the TTL standby mode; if RESET# is held at VSS
0.5 V, the device enters the CMOS standby mode.
Program and Erase Operation Status
During an erase or program operation, the system may
check the status of the operation by reading the status
bits on DQ7–DQ0. Standard read cycle timings and ICC
read specifications apply. Refer to “Write Operation
Status” for more information, and to each AC Charac-
teristics section in the appropriate data sheet for timing
diagrams.
The RESET# pin may be tied to the system reset cir-
cuitry. A system reset would thus also reset the Flash
memory, enabling the system to read the boot-up firm-
ware from the Flash memory.
If RESET# is asserted during a program or erase oper-
ation, the RY/BY# pin remains a “0” (busy) until the
internal reset operation is complete, which requires a
time of tREADY (during Embedded Algorithms). The
system can thus monitor RY/BY# to determine whether
the reset operation is complete. If RESET# is asserted
when a program or erase operation is not executing
(RY/BY# pin is “1”), the reset operation is completed
within a time of tREADY (not during Embedded Algo-
rithms). The system can read data tRH after the
RESET# pin returns to VIH.
Standby Mode
When the system is not reading or writing to the device,
it can place the device in the standby mode. In this
mode, current consumption is greatly reduced, and the
outputs are placed in the high impedance state, inde-
pendent of the OE# input.
The device enters the CMOS standby mode when CE#
and RESET# pins are both held at VCC 0.5 V. (Note
that this is a more restricted voltage range than VIH.)
The device enters the TTL standby mode when CE#
and RESET# pins are both held at VIH. The device
requires standard access time (tCE) for read access
when the device is in either of these standby modes,
before it is ready to read data.
Refer to the AC Characteristics tables for RESET#
parameters and timing diagram.
Output Disable Mode
When the OE# input is at VIH, output from the device is
disabled. The output pins are placed in the high imped-
ance state.
The device also enters the standby mode when the
RESET# pin is driven low. Refer to the next section,
“RESET#: Hardware Reset Pin”.
12
Am29F200B
Table 2. Am29F200T Top Boot Block Sector Address Table
Address Range (in hexadecimal)
Sector Size
(Kbytes/
(x8)
(x16)
Sector
SA0
SA1
SA2
SA3
SA4
SA5
SA6
A16
0
A15
0
A14
X
A13
X
A12
X
Kwords)
Address Range
Address Range
64/32
64/32
64/32
32/16
8/4
00000h–0FFFFh
10000h–1FFFFh
20000h–2FFFFh
30000h–37FFFh
38000h–39FFFh
3A000h–3BFFFh
3C000h–3FFFFh
00000h–07FFFh
08000h–0FFFFh
10000h–17FFFh
18000h–1BFFFh
1C000h–1CFFFh
1D000h–1DFFFh
1E000h–1FFFFh
0
1
X
X
X
1
0
X
X
X
1
1
0
X
X
1
1
1
0
0
1
1
1
0
1
8/4
1
1
1
1
X
16/8
Table 3. Am29F200B Bottom Boot Block Sector Address Table
Address Range (in hexadecimal)
Sector Size
(Kbytes/
(x8)
(x16)
Sector
SA0
SA1
SA2
SA3
SA4
SA5
SA6
A16
0
A15
0
A14
0
A13
0
A12
X
Kwords)
Address Range
Address Range
16/8
8/4
00000h–03FFFh
04000h–05FFFh
06000h–07FFFh
08000h–0FFFFh
10000h–1FFFFh
20000h–2FFFFh
30000h–3FFFFh
00000h–01FFFh
02000h–02FFFh
03000h–03FFFh
04000h–07FFFh
08000h–0FFFFh
10000h–17FFFh
18000h–1FFFFh
0
0
0
1
0
0
0
0
1
1
8/4
0
0
1
X
X
32/16
64/32
64/32
64/32
0
1
X
X
X
1
0
X
X
X
1
1
X
X
X
Note for Tables 2 and 3: Address range is A16:A-1 in byte mode and A16:A0 in word mode. See the “Word/Byte Configuration”
sectionfor more information.
Autoselect Mode
The autoselect mode provides manufacturer and
device identification, and sector protection verification,
through identifier codes output on DQ7–DQ0. This
mode is primarily intended for programming equipment
to automatically match a device to be programmed with
its corresponding programming algorithm. However,
the autoselect codes can also be accessed in-system
through the command register.
address must appear on the appropriate highest order
address bits. Refer to the corresponding Sector
Address Tables. The Command Definitions table
shows the remaining address bits that are don’t care.
When all necessary bits have been set as required, the
programming equipment may then read the corre-
sponding identifier code on DQ7–DQ0.
To access the autoselect codes in-system, the host
system can issue the autoselect command via the
command register, as shown in the Command Defini-
tions table. This method does not require VID. See
“Autoselect Command Sequence” for details on using
the autoselect mode.
When using programming equipment, the autoselect
mode requires VID (11.5 V to 12.5 V) on address pin
A9. Address pins A6, A1, and A0 must be as shown in
Autoselect Codes (High Voltage Method) table. In addi-
tion, when verifying sector protection, the sector
Am29F200B
13
Table 4. Am29F200B Autoselect Codes (High Voltage Method)
A16 A11
to to
Mode CE# OE# WE# A12 A10 A9
A8
to
A7
A5
to
A2
DQ8
to
A0 DQ15
DQ7
to
DQ0
Description
A6
A1
Manufacturer ID: AMD
L
L
L
L
H
H
X
X
V
X
X
L
X
X
L
L
X
01h
51h
ID
Device ID:
Am29F200B
(Top Boot Block)
Word
Byte
Word
Byte
22h
X
X
V
L
L
L
L
H
ID
L
L
L
L
L
L
H
H
H
X
22h
X
51h
57h
57h
Device ID:
Am29F200B
(Bottom Boot Block)
X
X
X
V
V
X
X
X
X
H
L
ID
01h
(protected)
X
X
Sector Protection Verification
L
L
H
SA
L
H
ID
00h
(unprotected)
L = Logic Low = V , H = Logic High = V , SA = Sector Address, X = Don’t care.
IL
IH
Sector Protection/Unprotection
The hardware sector protection feature disables both
program and erase operations in any sector. The hard-
ware sector unprotection feature re-enables both
program and erase operations in previously protected
sectors.
START
RESET# = V
(Note 1)
ID
Sector protection/unprotection must be implemented
using programming equipment. The procedure
requires a high voltage (VID) on address pin A9 and the
control pins. Details on this method are provided in a
supplement, publication number 20551. Contact an
AMD representative to obtain a copy of the appropriate
document.
Perform Erase or
Program Operations
RESET# = V
IH
The device is shipped with all sectors unprotected.
AMD offers the option of programming and protecting
sectors at its factory prior to shipping the device
through AMD’s ExpressFlash™ Service. Contact an
AMD representative for details.
Temporary Sector
Unprotect
Completed (Note 2)
It is possible to determine whether a sector is protected
or unprotected. See “Autoselect Mode” for details.
Notes:
1. All protected sectors unprotected.
Temporary Sector Unprotect
2. All previously protected sectors are protected once
again.
This feature allows temporary unprotection of previ-
ously protected sectors to change data in-system. The
Sector Unprotect mode is activated by setting the
RESET# pin to VID. During this mode, formerly pro-
tected sectors can be programmed or erased by
selecting the sector addresses. Once VID is removed
from the RESET# pin, all the previously protected
sectors are protected again. Figure 1 shows the algo-
rithm, and the Temporary Sector Unprotect diagram
(Figure 18) shows the timing waveforms, for this
feature.
Figure 1. Temporary Sector Unprotect Operation
Hardware Data Protection
The command sequence requirement of unlock cycles
for programming or erasing provides data protection
against inadvertent writes (refer to the Command Defi-
nitions table). In addition, the following hardware data
protection measures prevent accidental erasure or pro-
14
Am29F200B
gramming, which might otherwise be caused by
spurious system level signals during VCC power-up and
power-down transitions, or from system noise.
Write Pulse “Glitch” Protection
Noise pulses of less than 5 ns (typical) on OE#, CE# or
WE# do not initiate a write cycle.
Low V
Write Inhibit
CC
Logical Inhibit
When VCC is less than VLKO, the device does not
accept any write cycles. This protects data during VCC
power-up and power-down. The command register and
all internal program/erase circuits are disabled, and the
device resets. Subsequent writes are ignored until VCC
is greater than VLKO. The system must provide the
proper signals to the control pins to prevent uninten-
Write cycles are inhibited by holding any one of OE# =
VIL, CE# = VIH or WE# = VIH. To initiate a write cycle,
CE# and WE# must be a logical zero while OE# is a
logical one.
Power-Up Write Inhibit
If WE# = CE# = VIL and OE# = VIH during power up, the
device does not accept commands on the rising edge
of WE#. The internal state machine is automatically
reset to reading array data on power-up.
tional writes when VCC is greater than VLKO
.
COMMAND DEFINITIONS
Writing specific address and data commands or
sequences into the command register initiates device
operations. The Command Definitions table defines the
valid register command sequences. Writing incorrect
address and data values or writing them in the
improper sequence resets the device to reading array
data.
ters, and Read Operation Timings diagram shows the
timing diagram.
Reset Command
Writing the reset command to the device resets the
device to reading array data. Address bits are don’t
care for this command.
All addresses are latched on the falling edge of WE# or
CE#, whichever happens later. All data is latched on
the rising edge of WE# or CE#, whichever happens
first. Refer to the appropriate timing diagrams in the
“AC Characteristics” section.
The reset command may be written between the
sequence cycles in an erase command sequence
before erasing begins. This resets the device to reading
array data. Once erasure begins, however, the device
ignores reset commands until the operation is
complete.
Reading Array Data
The reset command may be written between the
sequence cycles in a program command sequence
before programming begins. This resets the device to
reading array data (also applies to programming in
Erase Suspend mode). Once programming begins,
however, the device ignores reset commands until the
operation is complete.
The device is automatically set to reading array data
after device power-up. No commands are required to
retrieve data. The device is also ready to read array
data after completing an Embedded Program or
Embedded Erase algorithm.
After the device accepts an Erase Suspend command,
the device enters the Erase Suspend mode. The
system can read array data using the standard read
timings, except that if it reads at an address within
erase-suspended sectors, the device outputs status
data. After completing a programming operation in the
Erase Suspend mode, the system may once again
read array data with the same exception. See “Erase
Suspend/Erase Resume Commands” for more infor-
mation on this mode.
The reset command may be written between the
sequence cycles in an autoselect command sequence.
Once in the autoselect mode, the reset command must
be written to return to reading array data (also applies
to autoselect during Erase Suspend).
If DQ5 goes high during a program or erase operation,
writing the reset command returns the device to
reading array data (also applies during Erase
Suspend).
The system must issue the reset command to re-
enable the device for reading array data if DQ5 goes
high, or while in the autoselect mode. See the “Reset
Command” section, next.
Autoselect Command Sequence
The autoselect command sequence allows the host
system to access the manufacturer and devices codes,
and determine whether or not a sector is protected.
The Command Definitions table shows the address
and data requirements. This method is an alternative to
that shown in the Autoselect Codes (High Voltage
See also “Requirements for Reading Array Data” in the
“Device Bus Operations” section for more information.
The Read Operations table provides the read parame-
Am29F200B
15
Method) table, which is intended for PROM program-
mers and requires VID on address bit A9.
START
The autoselect command sequence is initiated by
writing two unlock cycles, followed by the autoselect
command. The device then enters the autoselect
mode, and the system may read at any address any
number of times, without initiating another command
sequence.
Write Program
Command Sequence
A read cycle at address XX00h retrieves the manufac-
turer code. A read cycle at address XX01h in word
mode (or 02h in byte mode) returns the device code. A
read cycle containing a sector address (SA) and the
address 02h in word mode (or 04h in byte mode)
returns 01h if that sector is protected, or 00h if it is
unprotected. Refer to the Sector Address tables for
valid sector addresses.
Data Poll
from System
Embedded
Program
algorithm
in progress
Verify Data?
Yes
No
The system must write the reset command to exit the
autoselect mode and return to reading array data.
Word/Byte Program Command Sequence
No
Increment Address
Last Address?
Yes
The system may program the device by byte or word,
on depending on the state of the BYTE# pin. Program-
ming is a four-bus-cycle operation. The program
command sequence is initiated by writing two unlock
write cycles, followed by the program set-up command.
The program address and data are written next, which
in turn initiate the Embedded Program algorithm. The
system is not required to provide further controls or tim-
ings. The device automatically provides internally
generated program pulses and verify the programmed
cell margin. The Command Definitions take shows the
address and data requirements for the byte program
command sequence.
Programming
Completed
Note: See the appropriate Command Definitions table for
program command sequence.
Figure 2. Program Operation
When the Embedded Program algorithm is complete,
the device then returns to reading array data and
addresses are no longer latched. The system can
determine the status of the program operation by using
DQ7, DQ6, or RY/BY#. See “Write Operation Status”
for information on these status bits.
Chip Erase Command Sequence
Chip erase is a six-bus-cycle operation. The chip erase
command sequence is initiated by writing two unlock
cycles, followed by a set-up command. Two additional
unlock write cycles are then followed by the chip erase
command, which in turn invokes the Embedded Erase
algorithm. The device does not require the system to
preprogram prior to erase. The Embedded Erase algo-
rithm automatically preprograms and verifies the entire
memory for an all zero data pattern prior to electrical
erase. The system is not required to provide any con-
trols or timings during these operations. The Command
Definitions table shows the address and data require-
ments for the chip erase command sequence.
Any commands written to the device during the
Embedded Program Algorithm are ignored. Note that a
hardware reset immediately terminates the program-
ming operation. The program command sequence
should be reinitiated once the device has reset to
reading array data, to ensure data integrity.
Programming is allowed in any sequence and across
sector boundaries. A bit cannot be programmed
from a “0” back to a “1”. Attempting to do so may halt
the operation and set DQ5 to “1”, or cause the Data#
Polling algorithm to indicate the operation was suc-
cessful. However, a succeeding read will show that the
data is still “0”. Only erase operations can convert a “0”
to a “1”.
Any commands written to the chip during the
Embedded Erase algorithm are ignored. Note that a
hardware reset during the chip erase operation imme-
diately terminates the operation. The Chip Erase
command sequence should be reinitiated once the
device has returned to reading array data, to ensure
data integrity.
16
Am29F200B
The system can determine the status of the erase oper-
ation by using DQ7, DQ6, DQ2, or RY/BY#. See “Write
Operation Status” for information on these status bits.
When the Embedded Erase algorithm is complete, the
device returns to reading array data and addresses are
no longer latched.
operation. The Sector Erase command sequence
should be reinitiated once the device has returned to
reading array data, to ensure data integrity.
When the Embedded Erase algorithm is complete, the
device returns to reading array data and addresses are
no longer latched. The system can determine the
status of the erase operation by using DQ7, DQ6, DQ2,
or RY/BY#. Refer to “Write Operation Status” for infor-
mation on these status bits.
Figure 3 illustrates the algorithm for the erase opera-
tion. See the Erase/Program Operations tables in “AC
Characteristics” for parameters, and to the Chip/Sector
Erase Operation Timings for timing waveforms.
Figure 3 illustrates the algorithm for the erase opera-
tion. Refer to the Erase/Program Operations tables in
the “AC Characteristics” section for parameters, and to
the Sector Erase Operations Timing diagram for timing
waveforms.
Sector Erase Command Sequence
Sector erase is a six bus cycle operation. The sector
erase command sequence is initiated by writing two
unlock cycles, followed by a set-up command. Two
additional unlock write cycles are then followed by the
address of the sector to be erased, and the sector
erase command. The Command Definitions table
shows the address and data requirements for the
sector erase command sequence.
Erase Suspend/Erase Resume Commands
The Erase Suspend command allows the system to
interrupt a sector erase operation and then read data
from, or program data to, any sector not selected for
erasure. This command is valid only during the sector
erase operation, including the 50 µs time-out period
during the sector erase command sequence. The
Erase Suspend command is ignored if written during
the chip erase operation or Embedded Program algo-
rithm. Writing the Erase Suspend command during the
Sector Erase time-out immediately terminates the
time-out period and suspends the erase operation.
Addresses are “don’t-cares” when writing the Erase
Suspend command.
The device does not require the system to preprogram
the memory prior to erase. The Embedded Erase algo-
rithm automatically programs and verifies the sector for
an all zero data pattern prior to electrical erase. The
system is not required to provide any controls or
timings during these operations.
After the command sequence is written, a sector erase
time-out of 50 µs begins. During the time-out period,
additional sector addresses and sector erase com-
mands may be written. Loading the sector erase buffer
may be done in any sequence, and the number of
sectors may be from one sector to all sectors. The time
between these additional cycles must be less than 50
µs, otherwise the last address and command might not
be accepted, and erasure may begin. It is recom-
mended that processor interrupts be disabled during
this time to ensure all commands are accepted. The
interrupts can be re-enabled after the last Sector Erase
command is written. If the time between additional
sector erase commands can be assumed to be less
than 50 µs, the system need not monitor DQ3. Any
command other than Sector Erase or Erase
Suspend during the time-out period resets the
device to reading array data. The system must
rewrite the command sequence and any additional
sector addresses and commands.
When the Erase Suspend command is written during a
sector erase operation, the device requires a maximum
of 20 µs to suspend the erase operation. However,
when the Erase Suspend command is written during
the sector erase time-out, the device immediately ter-
minates the time-out period and suspends the erase
operation.
After the erase operation has been suspended, the
system can read array data from or program data to
any sector not selected for erasure. (The device “erase
suspends” all sectors selected for erasure.) Normal
read and write timings and command definitions apply.
Reading at any address within erase-suspended
sectors produces status data on DQ7–DQ0. The
system can use DQ7, or DQ6 and DQ2 together, to
determine if a sector is actively erasing or is erase-sus-
pended. See “Write Operation Status” for information
on these status bits.
The system can monitor DQ3 to determine if the sector
erase timer has timed out. (See the “DQ3: Sector Erase
Timer” section.) The time-out begins from the rising
edge of the final WE# pulse in the command sequence.
After an erase-suspended program operation is com-
plete, the system can once again read array data within
non-suspended sectors. The system can determine
the status of the program operation using the DQ7 or
DQ6 status bits, just as in the standard program oper-
ation. See “Write Operation Status” for more
information.
Once the sector erase operation has begun, only the
Erase Suspend command is valid. All other commands
are ignored. Note that a hardware reset during the
sector erase operation immediately terminates the
Am29F200B
17
The system may also write the autoselect command
sequence when the device is in the Erase Suspend
mode. The device allows reading autoselect codes
even at addresses within erasing sectors, since the
codes are not stored in the memory array. When the
device exits the autoselect mode, the device reverts to
the Erase Suspend mode, and is ready for another
valid operation. See “Autoselect Command Sequence”
for more information.
START
Write Erase
Command Sequence
The system must write the Erase Resume command
(address bits are “don’t care”) to exit the erase suspend
mode and continue the sector erase operation. Further
writes of the Resume command are ignored. Another
Erase Suspend command can be written after the
device has resumed erasing.
Data Poll
from System
Embedded
Erase
algorithm
in progress
No
Data = FFh?
Yes
Erasure Completed
Notes:
1. See the appropriate Command Definitions table for erase
command sequence.
2. See “DQ3: Sector Erase Timer” for more information.
Figure 3. Erase Operation
18
Am29F200B
Command Definitions
Table 5. Am29F200B Command Definitions
Bus Cycles (Notes 2–5)
Command
Sequence
(Note 1)
First
Second
Third
Addr
Fourth
Fifth
Sixth
Addr Data Addr Data
Data Addr Data Addr Data Addr Data
Read (Note 6)
Reset (Note 7)
1
1
RA
XXX
555
RD
F0
Word
2AA
555
2AA
555
2AA
555
555
AAA
555
Manufacturer ID
4
4
4
AA
AA
AA
55
55
55
90
90
90
X00
01
Byte
Word
Byte
Word
Byte
AAA
555
X01
X02
X01
X02
2251
51
Device ID,
Top Boot Block
AAA
555
AAA
555
2257
57
Device ID,
Bottom Boot Block
AAA
AAA
XX00
XX01
00
(SA)
X02
Word
Byte
555
2AA
555
555
Sector Protect Verify
(Note 9)
4
AA
55
90
(SA)
X04
AAA
AAA
01
Word
Byte
Word
Byte
Word
Byte
555
AAA
555
2AA
555
2AA
555
2AA
555
555
AAA
555
Program
4
6
6
AA
AA
AA
55
55
55
A0
80
80
PA
PD
AA
AA
555
AAA
555
2AA
555
2AA
555
555
Chip Erase
55
55
10
30
AAA
555
AAA
555
AAA
Sector Erase
SA
AAA
XXX
XXX
AAA
AAA
Erase Suspend (Note 10)
Erase Resume (Note 11)
1
1
B0
30
Legend:
X = Don’t care
PD = Data to be programmed at location PA. Data latches on the
rising edge of WE# or CE# pulse, whichever happens first.
RA = Address of the memory location to be read.
SA = Address of the sector to be verified (in autoselect mode) or
erased. Address bits A16–A12 uniquely select any sector.
RD = Data read from location RA during read operation.
PA = Address of the memory location to be programmed.
Addresses latch on the falling edge of the WE# or CE# pulse,
whichever happens later.
Notes:
1. See Table 1 for description of bus operations.
8. The fourth cycle of the autoselect command sequence is a
read cycle.
2. All values are in hexadecimal.
9. The data is 00h for an unprotected sector and 01h for a
protected sector. See “Autoselect Command Sequence” for
more information.
3. Except when reading array or autoselect data, all bus cycles
are write operations.
4. Data bits DQ15–DQ8 are don’t cares for unlock and
command cycles.
10. The system may read and program in non-erasing sectors, or
enter the autoselect mode, when in the Erase Suspend
mode. The Erase Suspend command is valid only during a
sector erase operation.
5. Address bits A16–A11 are don’t cares for unlock and
command cycles, unless SA or PA required.
6. No unlock or command cycles required when reading array
data.
11. The Erase Resume command is valid only during the Erase
Suspend mode.
7. The Reset command is required to return to reading array
data when device is in the autoselect mode, or if DQ5 goes
high (while the device is providing status data).
Am29F200B
19
WRITE OPERATION STATUS
The device provides several bits to determine the
status of a write operation: DQ2, DQ3, DQ5, DQ6,
DQ7, and RY/BY#. Table 6 and the following subsec-
tions describe the functions of these bits. DQ7, RY/
BY#, and DQ6 each offer a method for determining
whether a program or erase operation is complete or in
progress. These three bits are discussed first.
Table 6 shows the outputs for Data# Polling on DQ7.
Figure 4 shows the Data# Polling algorithm.
START
DQ7: Data# Polling
Read DQ7–DQ0
Addr = VA
The Data# Polling bit, DQ7, indicates to the host
system whether an Embedded Algorithm is in progress
or completed, or whether the device is in Erase Sus-
pend. Data# Polling is valid after the rising edge of the
final WE# pulse in the program or erase command
sequence.
Yes
DQ7 = Data?
During the Embedded Program algorithm, the device
outputs on DQ7 the complement of the datum pro-
grammed to DQ7. This DQ7 status also applies to
programming during Erase Suspend. When the
Embedded Program algorithm is complete, the device
outputs the datum programmed to DQ7. The system
must provide the program address to read valid status
information on DQ7. If a program address falls within a
protected sector, Data# Polling on DQ7 is active for
approximately 2 µs, then the device returns to reading
array data.
No
No
DQ5 = 1?
Yes
Read DQ7–DQ0
Addr = VA
During the Embedded Erase algorithm, Data# Polling
produces a “0” on DQ7. When the Embedded Erase
algorithm is complete, or if the device enters the Erase
Suspend mode, Data# Polling produces a “1” on DQ7.
This is analogous to the complement/true datum output
described for the Embedded Program algorithm: the
erase function changes all the bits in a sector to “1”;
prior to this, the device outputs the “complement,” or
“0.” The system must provide an address within any of
the sectors selected for erasure to read valid status
information on DQ7.
Yes
DQ7 = Data?
No
PASS
FAIL
After an erase command sequence is written, if all
sectors selected for erasing are protected, Data#
Polling on DQ7 is active for approximately 100 µs, then
the device returns to reading array data. If not all
selected sectors are protected, the Embedded Erase
algorithm erases the unprotected sectors, and ignores
the selected sectors that are protected.
Notes:
1. VA = Valid address for programming. During a sector
erase operation, a valid address is an address within any
sector selected for erasure. During chip erase, a valid
address is any non-protected sector address.
2. DQ7 should be rechecked even if DQ5 = “1” because
DQ7 may change simultaneously with DQ5.
When the system detects DQ7 has changed from the
complement to true data, it can read valid data at DQ7–
DQ0 on the following read cycles. This is because DQ7
may change asynchronously with DQ0–DQ6 while
Output Enable (OE#) is asserted low. The Data#
Polling Timings (During Embedded Algorithms) figure
in the “AC Characteristics” section illustrates this.
Figure 4. Data# Polling Algorithm
20
Am29F200B
The Write Operation Status table shows the outputs for
Toggle Bit I on DQ6. Refer to Figure 5 for the toggle bit
algorithm, and to the Toggle Bit Timings figure in the
“AC Characteristics” section for the timing diagram.
The DQ2 vs. DQ6 figure shows the differences
between DQ2 and DQ6 in graphical form. See also the
subsection on “DQ2: Toggle Bit II”.
RY/BY#: Ready/Busy#
The RY/BY# is a dedicated, open-drain output pin that
indicates whether an Embedded Algorithm is in
progress or complete. The RY/BY# status is valid after
the rising edge of the final WE# pulse in the command
sequence. Since RY/BY# is an open-drain output,
several RY/BY# pins can be tied together in parallel
with a pull-up resistor to VCC
.
DQ2: Toggle Bit II
If the output is low (Busy), the device is actively erasing
or programming. (This includes programming in the
Erase Suspend mode.) If the output is high (Ready),
the device is ready to read array data (including during
the Erase Suspend mode), or is in the standby mode.
The “Toggle Bit II” on DQ2, when used with DQ6, indi-
cates whether a particular sector is actively erasing
(that is, the Embedded Erase algorithm is in progress),
or whether that sector is erase-suspended. Toggle Bit
II is valid after the rising edge of the final WE# pulse in
the command sequence.
Table 6 shows the outputs for RY/BY#. The timing dia-
grams for read, reset, program, and erase shows the
relationship of RY/BY# to other signals.
DQ2 toggles when the system reads at addresses
within those sectors that have been selected for era-
sure. (The system may use either OE# or CE# to
control the read cycles.) But DQ2 cannot distinguish
whether the sector is actively erasing or is erase-sus-
pended. DQ6, by comparison, indicates whether the
device is actively erasing, or is in Erase Suspend, but
cannot distinguish which sectors are selected for era-
sure. Thus, both status bits are required for sector and
mode information. Refer to Table 6 to compare outputs
for DQ2 and DQ6.
DQ6: Toggle Bit I
Toggle Bit I on DQ6 indicates whether an Embedded
Program or Erase algorithm is in progress or complete,
or whether the device has entered the Erase Suspend
mode. Toggle Bit I may be read at any address, and is
valid after the rising edge of the final WE# pulse in the
command sequence (prior to the program or erase
operation), and during the sector erase time-out.
During an Embedded Program or Erase algorithm
operation, successive read cycles to any address
cause DQ6 to toggle. (The system may use either OE#
or CE# to control the read cycles.) When the operation
is complete, DQ6 stops toggling.
Figure 5 shows the toggle bit algorithm in flowchart
form, and the section “DQ2: Toggle Bit II” explains the
algorithm. See also the “DQ6: Toggle Bit I” subsection.
Refer to the Toggle Bit Timings figure for the toggle bit
timing diagram. The DQ2 vs. DQ6 figure shows the dif-
ferences between DQ2 and DQ6 in graphical form.
After an erase command sequence is written, if all
sectors selected for erasing are protected, DQ6 toggles
for approximately 100 µs, then returns to reading array
data. If not all selected sectors are protected, the
Embedded Erase algorithm erases the unprotected
sectors, and ignores the selected sectors that are
protected.
Reading Toggle Bits DQ6/DQ2
Refer to Figure 5 for the following discussion. When-
ever the system initially begins reading toggle bit
status, it must read DQ7–DQ0 at least twice in a row to
determine whether a toggle bit is toggling. Typically, a
system would note and store the value of the toggle bit
after the first read. After the second read, the system
would compare the new value of the toggle bit with the
first. If the toggle bit is not toggling, the device has com-
pleted the program or erase operation. The system can
read array data on DQ7–DQ0 on the following read
cycle.
The system can use DQ6 and DQ2 together to deter-
mine whether a sector is actively erasing or is erase-
suspended. When the device is actively erasing (that is,
the Embedded Erase algorithm is in progress), DQ6
toggles. When the device enters the Erase Suspend
mode, DQ6 stops toggling. However, the system must
also use DQ2 to determine which sectors are erasing
or erase-suspended. Alternatively, the system can use
DQ7 (see the subsection on “DQ7: Data# Polling”).
However, if after the initial two read cycles, the system
determines that the toggle bit is still toggling, the
system also should note whether the value of DQ5 is
high (see the section on DQ5). If it is, the system
should then determine again whether the toggle bit is
toggling, since the toggle bit may have stopped tog-
gling just as DQ5 went high. If the toggle bit is no longer
toggling, the device has successfully completed the
program or erase operation. If it is still toggling, the
device did not complete the operation successfully, and
If a program address falls within a protected sector,
DQ6 toggles for approximately 2 µs after the program
command sequence is written, then returns to reading
array data.
DQ6 also toggles during the erase-suspend-program
mode, and stops toggling once the Embedded
Program algorithm is complete.
Am29F200B
21
the system must write the reset command to return to
reading array data.
of DQ3 prior to and following each subsequent sector
erase command. If DQ3 is high on the second status
check, the last command might not have been
accepted. Table 6 shows the outputs for DQ3.
The remaining scenario is that the system initially
determines that the toggle bit is toggling and DQ5 has
not gone high. The system may continue to monitor the
toggle bit and DQ5 through successive read cycles,
determining the status as described in the previous
paragraph. Alternatively, it may choose to perform
other system tasks. In this case, the system must start
at the beginning of the algorithm when it returns to
determine the status of the operation (top of Figure 5).
START
Read DQ7–DQ0
DQ5: Exceeded Timing Limits
DQ5 indicates whether the program or erase time has
exceeded a specified internal pulse count limit. Under
these conditions DQ5 produces a “1.” This is a failure
condition that indicates the program or erase cycle was
not successfully completed.
Read DQ7–DQ0
(Note 1)
The DQ5 failure condition may appear if the system
tries to program a “1” to a location that is previously pro-
grammed to “0.” Only an erase operation can change
a “0” back to a “1.” Under this condition, the device
halts the operation, and when the operation has
exceeded the timing limits, DQ5 produces a “1.”
No
Toggle Bit
= Toggle?
Yes
Under both these conditions, the system must issue the
reset command to return the device to reading array
data.
No
DQ5 = 1?
Yes
DQ3: Sector Erase Timer
After writing a sector erase command sequence, the
system may read DQ3 to determine whether or not an
erase operation has begun. (The sector erase timer
does not apply to the chip erase command.) If addi-
tional sectors are selected for erasure, the entire time-
out also applies after each additional sector erase com-
mand. When the time-out is complete, DQ3 switches
from “0” to “1.” The system may ignore DQ3 if the
system can guarantee that the time between additional
sector erase commands will always be less than 50 µs.
See also the “Sector Erase Command Sequence”
section.
(Notes
1, 2)
Read DQ7–DQ0
Twice
Toggle Bit
= Toggle?
No
Yes
Program/Erase
Operation Not
Complete, Write
Reset Command
Program/Erase
Operation Complete
After the sector erase command sequence is written,
the system should read the status on DQ7 (Data#
Polling) or DQ6 (Toggle Bit I) to ensure the device has
accepted the command sequence, and then read DQ3.
If DQ3 is “1”, the internally controlled erase cycle has
begun; all further commands (other than Erase Sus-
pend) are ignored until the erase operation is complete.
If DQ3 is “0”, the device will accept additional sector
erase commands. To ensure the command has been
accepted, the system software should check the status
Notes:
1. Read toggle bit twice to determine whether or not it is
toggling. See text.
2. Recheck toggle bit because it may stop toggling as DQ5
changes to “1”. See text.
Figure 5. Toggle Bit Algorithm
22
Am29F200B
Table 6. Write Operation Status
DQ7
DQ5
DQ2
Operation
(Note 1)
DQ6
(Note 2)
DQ3
N/A
1
(Note 1)
RY/BY#
Embedded Program Algorithm
Embedded Erase Algorithm
DQ7#
0
Toggle
Toggle
0
0
No toggle
Toggle
0
0
Standard
Mode
Reading within Erase
Suspended Sector
1
No toggle
0
N/A
Toggle
1
Erase
Suspend Reading within Non-Erase
Data
Data
Data
0
Data
N/A
Data
N/A
1
0
Mode
Suspended Sector
Erase-Suspend-Program
DQ7#
Toggle
Notes:
1. DQ7 and DQ2 require a valid address when reading status information. Refer to the appropriate subsection for further details.
2. DQ5 switches to ‘1’ when an Embedded Program or Embedded Erase operation has exceeded the maximum timing limits.
See “DQ5: Exceeded Timing Limits” for more information.
Am29F200B
23
ABSOLUTE MAXIMUM RATINGS
Storage Temperature
Plastic Packages . . . . . . . . . . . . . . . –65°C to +150°C
20 ns
20 ns
+0.8 V
Ambient Temperature
with Power Applied. . . . . . . . . . . . . . –55°C to +125°C
–0.5 V
–2.0 V
Voltage with Respect to Ground
VCC (Note 1) . . . . . . . . . . . . . . . .–2.0 V to +7.0 V
A9, OE#, and
20 ns
RESET# (Note 2). . . . . . . . . . . .–2.0 V to +12.5 V
Figure 6. Maximum Negative
Overshoot Waveform
All other pins (Note 1) . . . . . . . . .–0.5 V to +7.0 V
Output Short Circuit Current (Note 3) . . . . . . 200 mA
Notes:
1. Minimum DC voltage on input or I/O pins is –0.5 V. During
voltage transitions, input or I/O pins may overshoot V to
SS
–2.0 V for periods of up to 20 ns. See Figure 6. Maximum
20 ns
DC voltage on input or I/O pins is V
+0.5 V. During
CC
voltage transitions, input or I/O pins may overshoot to V
+2.0 V for periods up to 20 ns. See Figure 7.
V
CC
CC
+2.0 V
V
2. Minimum DC input voltage on pins A9, OE#, and RESET#
is –0.5 V. During voltage transitions, A9, OE#, and
CC
+0.5 V
RESET# may overshoot V to –2.0 V for periods of up to
SS
2.0 V
20 ns. See Figure 6. Maximum DC input voltage on pin A9
is +12.5 V which may overshoot to +13.5 V for periods up
to 20 ns.
20 ns
20 ns
Figure 7. Maximum Positive
Overshoot Waveform
3. No more than one output may be shorted to ground at a
time. Duration of the short circuit should not be greater
than one second.
Note: Stresses above those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device. This is
a stress rating only; functional operation of the device at
these or any other conditions above those indicated in the op-
erational sections of this data sheet is not implied. Exposure
of the device to absolute maximum rating conditions for ex-
tended periods may affect device reliability.
OPERATING RANGES
Commercial (C) Devices
Ambient Temperature (TA) . . . . . . . . . . . 0°C to +70°C
Industrial (I) Devices
Ambient Temperature (TA) . . . . . . . . . –40°C to +85°C
Extended (E) Devices
Ambient Temperature (TA) . . . . . . . . –55°C to +125°C
VCC Supply Voltages
VCC for 5% devices. . . . . . . . . . .+4.75 V to +5.25 V
VCC for 10% devices . . . . . . . . . . . .+4.5 V to +5.5 V
Note: Operating ranges define those limits between which
the functionality of the device is guaranteed.
24
Am29F200B
DC CHARACTERISTICS
TTL/NMOS Compatible
Parameter
Symbol
Parameter Description
Test Conditions
= V to V , V = V Max
Min
Max
Unit
I
Input Load Current
V
V
1.0
µA
LI
IN
SS
CC CC
CC
A9, OE#, RESET# Input Load
Current
= V Max,
CC
CC
I
50
µA
µA
LIT
A9, OE#, RESET# = 12.5 V
I
Output Leakage Current
V
= V to V , V = V Max
1.0
40
LO
OUT
SS
CC CC
CC
Byte
I
V
V
Active Read Current (Notes 1, 2) CE# = V , OE# = V
mA
mA
CC1
CC
IL
IH
Word
50
Active Program/Erase Current
(Notes 2, 3, 4)
CC
I
I
CE# = V , OE# = V
60
CC2
IL
IH
V
Standby Current (Note 2)
V
= V Max, CE# = V , OE# = V
IH
1.0
0.8
mA
V
CC3
CC
CC
CC
IH
V
Input Low Voltage
Input High Voltage
–0.5
2.0
IL
V
V
+ 0.5
CC
V
IH
Voltage for Autoselect and Temporary
Sector Unprotect
V
V
= 5.0 V
11.5
12.5
0.45
V
ID
CC
V
Output Low Voltage
Output High Voltage
I
I
= 5.8 mA, V = V Min
V
V
V
OL
OL
CC
CC
V
= –2.5 mA, V = V Min
2.4
3.2
OH
OH
CC
CC
V
Low V Lock-Out Voltage
4.2
LKO
CC
Notes:
1. The I current is typically less than 2 mA/MHz, with OE# at V
.
IH
CC
2. Maximum I specifications are tested with V = V .
CCmax
CC
CC
3. I active while Embedded Program or Erase Algorithm is in progress.
CC
4. Not 100% tested.
Am29F200B
25
DC CHARACTERISTICS (Continued)
CMOS Compatible
Parameter
Symbol
Parameter Description
Test Conditions
= V to V , V = V Max
Min
Typ
Max
Unit
I
Input Load Current
V
V
1.0
µA
LI
IN
SS
CC CC
CC
A9, OE#, RESET# Input
Load Current
= V Max;
CC
CC
I
50
µA
µA
LIT
A9, OE#, RESET# = 12.5 V
I
Output Leakage Current
V
= V to V , V = V Max
1.0
40
LO
OUT
SS
CC CC
CC
Byte
20
28
V
Active Read Current
CC
I
CE# = V , OE# = V
mA
CC1
IL
IH
IH
(Notes 1, 2)
Word
50
V
Active Program/Erase
CC
I
I
CE# = V , OE# = V
30
1
50
mA
µA
CC2
IL
Current (Notes 2, 3, 4)
V
Standby Current
CC
CE# = V
0.5 V, OE# = V
5
CC3
CC
IH
Note (Note 5)
V
Input Low Voltage
Input High Voltage
–0.5
0.8
V
V
IL
V
0.7 x V
V
+ 0.3
CC
IH
CC
Voltage for Autoselect and
Temporary Sector Unprotect
V
V
= 5.0 V
11.5
12.5
0.45
V
ID
CC
V
Output Low Voltage
I
I
I
= 5.8 mA, V = V Min
V
V
V
V
OL
OL
OH
OH
CC
CC
V
V
= –2.5 mA, V = V Min
0.85 V
OH1
OH2
CC
CC
CC
Output Low Voltage
= –100 µA, V = V Min
V
– 0.4
CC
CC
CC
V
Low V Lock-Out Voltage
3.2
4.2
LKO
CC
Notes:
1. The I current listed is typically less than 2 mA/MHz, with OE# at V
.
IH
CC
2. Maximum I specifications are tested with V = V .
CCmax
CC
CC
3. I active while Embedded Program or Erase Algorithm is in progress.
CC
4. Not 100% tested.
5. I
for extended temperature is 20 µA max (>+85°C).
CC3
26
Am29F200B
TEST CONDITIONS
Table 7. Test Specifications
5.0
-45, -50,
-55
All
others
Test Condition
Output Load
Unit
2.7 kΩ
1 TTL gate
100
Device
Under
Test
Output Load Capacitance, C
(including jig capacitance)
L
30
5
pF
C
L
6.2 kΩ
Input Rise and Fall Times
Input Pulse Levels
20
ns
V
0.0–3.0 0.45–2.4
Input timing measurement
reference levels
1.5
1.5
0.8, 2.0
0.8, 2.0
V
V
Note:
Output timing measurement
reference levels
Diodes are IN3064 or equivalents.
Figure 8. Test Setup
KEY TO SWITCHING WAVEFORMS
WAVEFORM
INPUTS
OUTPUTS
Steady
Changing from H to L
Changing from L to H
Don’t Care, Any Change Permitted
Does Not Apply
Changing, State Unknown
Center Line is High Impedance State (High Z)
Am29F200B
27
AC CHARACTERISTICS
Read Operations
Parameter
Speed Options
JEDEC Std Description
Test Setup
-45
-50
-55
-70
-90 -120 Unit
t
t
Read Cycle Time (Note 1)
Address to Output Delay
Chip Enable to Output Delay
Min
Max
Max
Max
45
50
55
70
90
90
90
35
120
120
120
50
ns
ns
ns
ns
AVAV
RC
CE# = V
OE# = V
IL
IL
t
t
t
45
45
30
50
50
30
55
55
30
70
70
30
AVQV
ELQV
GLQV
ACC
t
OE# = V
CE
OE
IL
Output Enable to Output Delay
(Note 1)
t
t
Chip Enable to Output High Z
(Note 1)
t
t
t
Max
20
20
20
20
20
20
20
20
20
20
30
30
ns
EHQZ
GHQZ
DF
DF
Output Enable to Output High Z
(Note 1)
t
Max
Min
Min
ns
ns
ns
Read
0
Output Enable
t
Hold Time
(Note 1)
OEH
Toggle and
Data# Polling
10
Output Hold Time From
t
t
Addresses, CE# or OE#,
Whichever Occurs First (Note 1)
Min
0
ns
AXQX
OH
Notes:
1. Not 100% tested.
2. See Figure 8 and Table 7 for test specifications
tRC
Addresses Stable
tACC
Addresses
CE#
tDF
tOE
OE#
tOEH
WE#
tCE
tOH
HIGH Z
HIGH Z
Output Valid
Outputs
RESET#
RY/BY#
0 V
Figure 9. Read Operations Timings
28
Am29F200B
AC CHARACTERISTICS
Hardware Reset (RESET#)
Parameter
JEDEC
Std Description
Test Setup
All Speed Options
Unit
RESET# Pin Low (During Embedded
Algorithms) to Read or Write (See Note)
t
t
Max
20
µs
READY
RESET# Pin Low (NOT During Embedded
Algorithms) to Read or Write (See Note)
Max
500
ns
READY
t
t
t
RESET# Pulse Width
Min
Min
Min
500
50
0
ns
ns
ns
RP
RH
RB
RESET# High Time Before Read (See Note)
RY/BY# Recovery Time
Note: Not 100% tested.
RY/BY#
CE#, OE#
RESET#
tRH
tRP
tReady
Reset Timings NOT during Embedded Algorithms
Reset Timings during Embedded Algorithms
tReady
RY/BY#
tRB
CE#, OE#
RESET#
tRP
Figure 10. RESET# Timings
Am29F200B
29
AC CHARACTERISTICS
Word/Byte Configuration (BYTE#)
Parameter
Speed Options
JEDEC
Std
Description
-45
-50
-55
-70
-90
-120 Unit
t
t
t
t
CE# to BYTE# Switching Low or High
BYTE# Switching Low to Output HIGH Z
BYTE# Switching High to Output Active
Max
Max
Max
5
ns
ELFL/ ELFH
20
45
20
50
20
55
20
70
20
90
30
ns
ns
FLQZ
FHQV
120
CE#
OE#
BYTE#
t
ELFL
Data Output
(DQ0–DQ14)
Data Output
(DQ0–DQ7)
BYTE#
DQ0–DQ14
DQ15/A-1
Switching
from word
to byte
Address
Input
DQ15
Output
mode
t
FLQZ
t
ELFH
BYTE#
BYTE#
Switching
from byte
to word
Data Output
(DQ0–DQ7)
Data Output
(DQ0–DQ14)
DQ0–DQ14
DQ15/A-1
mode
Address
Input
DQ15
Output
t
FHQV
Figure 11. BYTE# Timings for Read Operations
CE#
The falling edge of the last WE# signal
WE#
BYTE#
t
SET
(t
)
AS
t
(t
)
HOLD AH
Note:
Refer to the Erase/Program Operations table for t and t specifications.
AS
AH
Figure 12. BYTE# Timings for Write Operations
30
Am29F200B
AC CHARACTERISTICS
Erase/Program Operations
Parameter
Speed Options
JEDEC
Std
Description
-45
-50
-55
-70
-90
-120 Unit
t
t
Write Cycle Time (Note 1)
Address Setup Time
Address Hold Time
Data Setup Time
Min
Min
Min
Min
Min
Min
45
50
55
70
90
120
ns
ns
ns
ns
ns
ns
AVAV
WC
t
t
0
AVWL
WLAX
DVWH
WHDX
AS
AH
DS
DH
t
t
45
25
45
25
45
25
45
30
45
45
50
50
t
t
t
t
t
t
Data Hold Time
0
0
t
Output Enable Setup Time
OES
Read Recovery Time Before Write
(OE# High to WE# Low)
t
Min
0
ns
GHWL
GHWL
t
t
CE# Setup Time
Min
Min
Min
Min
Typ
Typ
Typ
Min
Min
Min
0
0
ns
ns
ns
ns
ELWL
WHEH
WLWH
WHWL
CS
CH
WP
t
CE# Hold Time
t
t
Write Pulse Width
Write Pulse Width High
30
30
30
35
45
50
t
t
20
7
WPH
Byte
Word
Programming Operation
(Note 2)
t
t
t
t
µs
WHWH1
WHWH2
WHWH1
12
1
Sector Erase Operation (Note 2)
sec
µs
WHWH2
t
V
Setup Time (Note 1)
50
0
VCS
CC
t
Recovery Time from RY/BY#
Program/Erase Valid to RY/BY# Delay
ns
RB
t
30
30
30
30
35
50
ns
BUSY
Notes:
1. Not 100% tested.
2. See the “Erase and Programming Performance” section for more information.
Am29F200B
31
AC CHARACTERISTICS
Program Command Sequence (last two cycles)
Read Status Data (last two cycles)
tAS
tWC
Addresses
555h
PA
PA
PA
tAH
CE#
OE#
tCH
tWHWH1
tWP
WE#
Data
tWPH
tCS
tDS
tDH
PD
DOUT
A0h
Status
tBUSY
tRB
RY/BY#
VCC
tVCS
Notes:
1. PA = program address, PD = program data, D
is the true data at the program address.
OUT
2. Illustration shows device in word mode.
Figure 13. Program Operation Timings
32
Am29F200B
AC CHARACTERISTICS
Erase Command Sequence (last two cycles)
Read Status Data
VA
tAS
SA
tWC
VA
Addresses
CE#
2AAh
555h for chip erase
tAH
tCH
OE#
tWP
WE#
tWPH
tWHWH2
tCS
tDS
tDH
In
Data
Complete
55h
30h
Progress
10 for Chip Erase
tBUSY
tRB
RY/BY#
VCC
tVCS
Notes:
1. SA = sector address (for Sector Erase), VA = Valid Address for reading status data (”see “Write Operation Status”).
2. Illustration shows device in word mode.
Figure 14. Chip/Sector Erase Operation Timings
Am29F200B
33
AC CHARACTERISTICS
tRC
VA
Addresses
VA
VA
tACC
tCE
CE#
tCH
tOE
OE#
WE#
tOEH
tDF
tOH
High Z
High Z
DQ7
Valid Data
Complement
Complement
True
DQ0–DQ6
Status Data
True
Valid Data
Status Data
tBUSY
RY/BY#
Note: VA = Valid address. Illustration shows first status cycle after command sequence, last status read cycle, and array data
read cycle.
Figure 15. Data# Polling Timings (During Embedded Algorithms)
tRC
Addresses
CE#
VA
tACC
tCE
VA
VA
VA
tCH
tOE
OE#
WE#
tOEH
tDF
tOH
High Z
DQ6/DQ2
RY/BY#
Valid Status
(first read)
Valid Status
Valid Status
Valid Data
(second read)
(stops toggling)
tBUSY
Note: VA = Valid address; not required for DQ6. Illustration shows first two status cycle after command sequence, last status
read cycle, and array data read cycle
Figure 16. Toggle Bit Timings (During Embedded Algorithms)
34
Am29F200B
AC CHARACTERISTICS
Enter
Embedded
Erasing
Erase
Suspend
Enter Erase
Suspend Program
Erase
Resume
Erase
Erase Suspend
Read
Erase
Suspend
Program
Erase
Complete
WE#
Erase
Erase Suspend
Read
DQ6
DQ2
Note: The system may use OE# or CE# to toggle DQ2 and DQ6. DQ2 toggles only when read at an address within the erase-sus-
pended sector.
Figure 17. DQ2 vs. DQ6
Temporary Sector Unprotect
Parameter
JEDEC
Std
Description
Rise and Fall Time (See Note)
All Speed Options
Unit
t
V
Min
Min
500
ns
VIDR
ID
RESET# Setup Time for Temporary Sector
Unprotect
t
4
µs
RSP
Note: Not 100% tested.
12 V
RESET#
0 or 5 V
0 or 5 V
tVIDR
tVIDR
Program or Erase Command Sequence
CE#
WE#
tRSP
RY/BY#
Figure 18. Temporary Sector Unprotect Timing Diagram
Am29F200B
35
AC CHARACTERISTICS
Alternate CE# Controlled Erase/Program Operations
Parameter
Speed Options
JEDEC
Std
Description
-45
-50
-55
-70
-90
-120
Unit
ns
t
t
t
Write Cycle Time (Note 1)
Address Setup Time
Address Hold Time
Data Setup Time
Min
Min
Min
Min
Min
Min
45
50
55
70
90
120
AVAV
AVEL
ELAX
DVEH
EHDX
WC
t
0
ns
AS
AH
DS
DH
t
t
45
25
45
25
45
25
45
30
45
45
50
50
ns
t
t
t
ns
t
Data Hold Time
0
0
ns
t
Output Enable Setup Time
ns
OES
Read Recovery Time Before Write
(OE# High to WE# Low)
t
t
t
Min
0
ns
GHEL
GHEL
t
WE# Setup Time
WE# Hold Time
Min
Min
Min
Min
Typ
Typ
Typ
0
0
ns
ns
ns
ns
WLEL
WS
t
t
EHWH
WH
t
t
CE# Pulse Width
CE# Pulse Width High
30
30
30
35
45
50
ELEH
EHEL
CP
t
t
20
7
CPH
Byte
Word
Programming Operation
(Note 2)
t
t
t
t
µs
WHWH1
WHWH1
12
1
Sector Erase Operation (Note 2)
sec
WHWH2
WHWH2
Notes:
1. Not 100% tested.
2. See the “Erase and Programming Performance” section for more information.
36
Am29F200B
AC CHARACTERISTICS
555 for program
PA for program
2AA for erase
SA for sector erase
555 for chip erase
Data# Polling
Addresses
PA
tWC
tWH
tAS
tAH
WE#
OE#
tGHEL
tWHWH1 or 2
tCP
CE#
Data
tWS
tCPH
tDS
tBUSY
tDH
DQ7#
DOUT
tRH
A0 for program
55 for erase
PD for program
30 for sector erase
10 for chip erase
RESET#
RY/BY#
Notes:
1. PA = Program Address, PD = Program Data, SA = Sector Address, DQ7# = Complement of Data Input, D
= Array Data.
OUT
2. Figure indicates the last two bus cycles of the command sequence, with the device in word mode.
Figure 19. Alternate CE# Controlled Write Operation Timings
Am29F200B
37
ERASE AND PROGRAMMING PERFORMANCE
Limits
Parameter
Sector Erase Time
Typ (Note 1)
Max (Note 2)
Unit
sec
sec
µs
Comments
1
5
8
Excludes 00h programming prior to
erasure (Note 4)
Chip Erase Time
Byte Programming Time
Word Programming Time
Chip Programming Time (Note 3)
7
300
500
5.4
Excludes system-level overhead
(Note 5)
12
1.8
µs
sec
Notes:
1. Typical program and erase times assume the following conditions: 25×C, 5.0 V V , 1,000,000 cycles. Additionally,
CC
programming typicals assume checkerboard pattern.
2. Under worst case conditions of 90°C, V = 4.5 V (V = 4.75 V for 5% devices), 1,000,000 cycles.
CC
CC
3. The typical chip programming time is considerably less than the maximum chip programming time listed, since most bytes
program faster than the maximum byte program time listed.
4. In the pre-programming step of the Embedded Erase algorithm, all bytes are programmed to 00h before erasure.
5. System-level overhead is the time required to execute the four-bus-cycle command sequence for programming. See Table 1
for further information on command definitions.
6. The device has a guaranteed minimum erase and program cycle endurance of 1,000,000 cycles.
LATCHUP CHARACTERISTICS
Parameter Description
Input Voltage with respect to V on all I/O pins
Min
Max
+ 1.0 V
–1.0 V
V
CC
SS
V
Current
–100 mA
+100 mA
CC
Note: Includes all pins except V . Test conditions: V = 5.0 V, one pin at a time.
CC
CC
TSOP AND SO PIN CAPACITANCE
Parameter
Symbol
Parameter Description
Input Capacitance
Test Setup
= 0
Typ
6
Max
7.5
12
Unit
pF
C
V
IN
IN
C
Output Capacitance
V
= 0
8.5
8
pF
OUT
OUT
C
Control Pin Capacitance
V
= 0
10
pF
IN2
IN
Notes:
1. Sampled, not 100% tested.
2. Test conditions T = 25°C, f = 1.0 MHz.
A
DATA RETENTION
Parameter
Test Conditions
150°C
Min
10
Unit
Years
Years
Minimum Pattern Data Retention Time
125°C
20
38
Am29F200B
PHYSICAL DIMENSIONS
SO 044—44-Pin Small Outline Package
Dwg rev AC; 10/99
Am29F200B
39
PHYSICAL DIMENSIONS
TS 048—48-Pin Standard Thin Small Outline Package
Dwg rev AA; 10/99
40
Am29F200B
PHYSICAL DIMENSIONS
TSR048—48-Pin Reverse Thin Small Outline Package
Dwg rev AA; 10/99
Am29F200B
41
REVISION SUMMARY
Revision A (July 1998)
Revision C (November 12, 1999)
Global
AC Characteristics—Figure 13. Program
Operations Timing and Figure 14. Chip/Sector
Erase Operations
Made formatting and layout consistent with other data
sheets. Used updated common tables and diagrams
Deleted tGHWL and changed OE# waveform to start at
high.
Revision B (January 1999)
Distinctive Characteristics
Physical Dimensions
Added bullet for 20-year data retention at 125°C
Replaced figures with more detailed illustrations.
Ordering Information
Revision D (November 29, 2000)
Added table of contents.
Optional Processing: Deleted “B = Burn-in”.
DC Characteristics—TTL/NMOS Compatible
Ordering Information
ICC1, ICC2, ICC3: Added Note 2 “Maximum ICC specifi-
cations are tested with VCC = VCCmax”.
Deleted burn-in option.
DC Characteristics—CMOS Compatible
Revision D (November 29, 2000)
ICC1, ICC2, ICC3: Added Note 2 “Maximum ICC specifi-
cations are tested with VCC = VCCmax”.
Added table of contents.
Ordering Information
AC Characteristics
Deleted burn-in option.
Figure 15. Data# Polling Timings (During Embedded
Algorithms): Added text to note.
Revision D+1 (June 14, 2004)
Figure 16. Toggle Bit Timings (During Embedded Algo-
rithms): Added text to note.
Ordering Information
Added Pb-free OPNs.
Revision B+2 (July 2, 1999)
Global
Added references to availability of device in Known
Good Die (KGD) form.
The products described in this document are designed, developed and manufactured as contemplated for general use, including without limita-
tion, ordinary industrial use, general office use, personal use, and household use, but are not designed, developed and manufactured as con-
templated (1) for any use that includes fatal risks or dangers that, unless extremely high safety is secured, could have a serious effect to the
public, and could lead directly to death, personal injury, severe physical damage or other loss (i.e., nuclear reaction control in nuclear facility,
aircraft flight control, air traffic control, mass transport control, medical life support system, missile launch control in weapon system), or (2) for
any use where chance of failure is intolerable ( i.e., submersible repeater and artificial satellite). Please note that FASL will not be liable to you
and/or any third party for any claims or damages arising in connection with above-mentioned uses of the products. Any semiconductor devices
have an inherent chance of failure. You must protect against injury, damage or loss from such failures by incorporating safety design measures
into your facility and equipment such as redundancy, fire protection, and prevention of over-current levels and other abnormal operating condi-
tions. If any products described in this document represent goods or technologies subject to certain restrictions on export under the Foreign Ex-
change and Foreign Trade Law of Japan, the US Export Administration Regulations or the applicable laws of any other country, the prior
authorization by the respective government entity will be required for export of those products.
Trademarks
Copyright © 2004 Advanced Micro Devices, Inc. All rights reserved.
AMD, the AMD logo, and combinations thereof are registered trademarks of Advanced Micro Devices, Inc.
ExpressFlash is a trademark of Advanced Micro Devices, Inc.
Product names used in this publication are for identification purposes only and may be trademarks of their respective companies.
42
Am29F200B
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