SSM4880AGM [SSC]

N-CHANNEL ENHANCEMENT-MODE POWER MOSFET; N沟道增强模式功率MOSFET
SSM4880AGM
型号: SSM4880AGM
厂家: SILICON STANDARD CORP.    SILICON STANDARD CORP.
描述:

N-CHANNEL ENHANCEMENT-MODE POWER MOSFET
N沟道增强模式功率MOSFET

文件: 总5页 (文件大小:227K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
SSM4880AGM  
N-CHANNEL ENHANCEMENT-MODE POWER MOSFET  
Low on-resistance  
BVDSS  
RDS(ON)  
ID  
30V  
D
D
D
Fast switching, planar construction  
Simple drive requirement  
9m  
D
13A  
G
S
S
SO-8  
S
Description  
D
S
Power MOSFETs from Silicon Standard provide the  
designer with the best combination of fast switching,  
ruggedized device design, low on-resistance and cost-effectiveness.  
G
The SO-8 package is widely preferred for commercial and  
industrial surface mount applications and the SSM4880AGM is well suited for  
for low-voltage applications such as DC/DC converters.  
Pb-free lead finish (second-level interconnect)  
Absolute Maximum Ratings  
Symbol  
Parameter  
Rating  
30  
Units  
V
VDS  
VGS  
Drain-Source Voltage  
Gate-Source Voltage  
±20  
V
ID @ TA=25°C  
ID @ TA=70°C  
IDM  
Continuous Drain Current3  
Continuous Drain Current3  
Pulsed Drain Current1  
13  
A
10  
A
50  
A
PD @ TA=25°C  
Total Power Dissipation  
2.5  
W
Linear Derating Factor  
Single Pulse Avalanche Energy4  
0.02  
266  
W/°C  
mJ  
A
EAS  
IAR  
Avalanche Current  
7.3  
TSTG  
TJ  
Storage Temperature Range  
Operating Junction Temperature Range  
-55 to 150  
-55 to 150  
°C  
°C  
Thermal Data  
Symbol  
Parameter  
Value  
50  
Unit  
Rthj-a  
Thermal Resistance Junction-ambient3  
Max.  
°C/W  
3/08/2005 Rev.2.2  
www.SiliconStandard.com  
1 of 5  
SSM4880AGM  
Electrical Characteristics @ Tj=25oC (unless otherwise specified)  
Symbol  
BVDSS  
Parameter  
Test Conditions  
VGS=0V, ID=250uA  
Min. Typ. Max. Units  
Drain-Source Breakdown Voltage  
30  
-
-
0.037  
-
-
V
BVDSS/Tj  
Breakdown Voltage Temperature Coefficient Reference to 25°C, ID=1mA  
Static Drain-Source On-Resistance VGS=10V, ID=13A  
VGS=4.5V, ID=10A  
-
V/°C  
m  
RDS(ON)  
-
9
-
1
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
15  
3
mΩ  
V
VGS(th)  
gfs  
Gate Threshold Voltage  
VDS=VGS, ID=250uA  
VDS=15V, ID=10A  
VDS=30V, VGS=0V  
VDS=24V, VGS=0V  
Forward Transconductance  
Drain-Source Leakage Current (Tj=25°C)  
Drain-Source Leakage Current (Tj=55°C)  
20  
-
-
S
IDSS  
uA  
uA  
nA  
nC  
nC  
nC  
ns  
ns  
ns  
ns  
pF  
pF  
pF  
1
-
25  
IGSS  
Qg  
Gate-Source Leakage  
Total Gate Charge2  
Gate-Source Charge  
Gate-Drain ("Miller") Charge  
Turn-on Delay Time2  
Rise Time  
V =  
GS  
-
± 20V  
±100  
ID=13A  
22.5  
3.3  
15.4  
9
-
-
Qgs  
Qgd  
td(on)  
tr  
VDS=15V  
VGS=5V  
-
VDS=15V  
ID=1A  
-
16  
25  
50  
813  
516  
224  
-
td(off)  
tf  
Turn-off Delay Time  
Fall Time  
RG=6.2,VGS=10V  
RD=15Ω  
-
-
-
-
-
Ciss  
Coss  
Crss  
Input Capacitance  
Output Capacitance  
Reverse Transfer Capacitance  
VGS=0V  
VDS=25V  
f=1.0MHz  
Source-Drain Diode  
Symbol  
Parameter  
Test Conditions  
Min. Typ. Max. Units  
A
A
V
IS  
Continuous Source Current ( Body Diode )  
Pulsed Source Current ( Body Diode )1  
Forward On Voltage2  
VD=VG=0V , VS=1.3V  
-
-
-
-
2.3  
50  
ISM  
VSD  
Tj=25°C, IS=2.3A, VGS=0V  
-
-
1.3  
Notes:  
1.Pulse width limited by safe operating area.  
2.Pulse width <300us , duty cycle <2%.  
3.Surface mounted on 1 in2 copper pad of FR4 board ; 125°C/W when mounted on min. copper pad.  
4.Starting Tj=25oC , VDD=25V , L=10mH , RG=25  
3/08/2005 Rev.2.2  
www.SiliconStandard.com  
2 of 5  
SSM4880AGM  
50  
40  
30  
20  
10  
0
50  
40  
30  
20  
10  
0
10V  
8.0V  
6.0V  
5.0V  
10V  
8.0V  
6.0V  
5.0V  
T A =150 o C  
T A =25 o C  
V G = 4 .0 V  
V G = 4 .0 V  
0
1
2
3
4
5
6
0
1
2
3
4
5
6
V DS , Drain-to-Source Voltage (V)  
V DS , Drain-to-Source Voltage (V)  
Fig 1. Typical Output Characteristics  
Fig 2. Typical Output Characteristics  
21  
17  
13  
9
1.8  
1.6  
1.4  
1.2  
1
I D =10A  
I D =13A  
V G =10V  
T
A =25°C  
0.8  
0.6  
5
2
4
6
8
10  
-50  
0
50  
100  
150  
T j , Junction Temperature ( o C)  
V GS , Gate-to-Source Voltage (V)  
Fig 3. On-Resistance vs. Gate Voltage  
Fig 4. Normalized On-Resistance  
vs. Junction Temperature  
3
2
1
0
100  
10  
T j =150 o C  
T j =25 o C  
1
0.1  
0.1  
0.3  
0.5  
0.7  
0.9  
1.1  
1.3  
-50  
0
50  
100  
150  
V SD , Source-to-Drain Voltage (V)  
T j , Junction Temperature( o C)  
Fig 5. Forward Characteristic of  
Reverse Diode  
Fig 6. Gate Threshold Voltage vs.  
Junction Temperature  
3/08/2005 Rev.2.2  
www.SiliconStandard.com  
3 of 5  
SSM4880AGM  
f=1.0MHz  
16  
14  
12  
10  
8
10000  
1000  
100  
I D =13A  
V
DS =15V  
C iss  
C oss  
6
4
C rss  
2
0
1
6
11  
16  
21  
0
10  
20  
30  
40  
50  
Q G , Total Gate Charge (nC)  
V DS , Drain-to-Source Voltage (V)  
Fig 7. Gate Charge Characteristics  
Fig 8. Typical Capacitance Characteristics  
1
100  
Duty factor = 0.5  
0.2  
0.1  
10  
1ms  
0.1  
0.05  
0.02  
10ms  
1
100ms  
0.01  
PDM  
0.01  
Single Pulse  
t
1s  
10s  
DC  
T
0.1  
T A =25 o C  
Duty Factor = t/T  
Single Pulse  
Peak Tj = PDM x Rthja + Ta  
Rthja=125oC/W  
0.01  
0.001  
0.1  
1
10  
100  
0.0001  
0.001  
0.01  
0.1  
1
10  
100  
1000  
V DS , Drain-to-Source Voltage (V)  
t , Pulse Width (s)  
Fig 9. Maximum Safe Operating Area  
Fig 10. Effective Transient Thermal Impedance  
VG  
VDS  
90%  
QG  
5V  
QGS  
QGD  
10%  
VGS  
tr  
t
Q
Charge  
td(on)  
d(off) tf  
Fig 11. Switching Time Waveform  
Fig 12. Gate Charge Waveform  
3/08/2005 Rev.2.2  
www.SiliconStandard.com  
4 of 5  
SSM4880AGM  
Information furnished by Silicon Standard Corporation is believed to be accurate and reliable. However, Silicon Standard Corporation makes no  
guarantee or warranty, express or implied, as to the reliability, accuracy, timeliness or completeness of such information and assumes no  
responsibility for its use, or for infringement of any patent or other intellectual property rights of third parties that may result from its  
use. Silicon Standard reserves the right to make changes as it deems necessary to any products described herein for any reason, including  
without limitation enhancement in reliability, functionality or design. No license is granted, whether expressly or by implication, in relation to  
the use of any products described herein or to the use of any information provided herein, under any patent or other intellectual property rights of  
Silicon Standard Corporation or any third parties.  
3/08/2005 Rev.2.2  
www.SiliconStandard.com  
5 of 5  

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