SSM4880AGM [SSC]
N-CHANNEL ENHANCEMENT-MODE POWER MOSFET; N沟道增强模式功率MOSFET型号: | SSM4880AGM |
厂家: | SILICON STANDARD CORP. |
描述: | N-CHANNEL ENHANCEMENT-MODE POWER MOSFET |
文件: | 总5页 (文件大小:227K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
SSM4880AGM
N-CHANNEL ENHANCEMENT-MODE POWER MOSFET
Low on-resistance
BVDSS
RDS(ON)
ID
30V
D
D
D
Fast switching, planar construction
Simple drive requirement
9mΩ
D
13A
G
S
S
SO-8
S
Description
D
S
Power MOSFETs from Silicon Standard provide the
designer with the best combination of fast switching,
ruggedized device design, low on-resistance and cost-effectiveness.
G
The SO-8 package is widely preferred for commercial and
industrial surface mount applications and the SSM4880AGM is well suited for
for low-voltage applications such as DC/DC converters.
Pb-free lead finish (second-level interconnect)
Absolute Maximum Ratings
Symbol
Parameter
Rating
30
Units
V
VDS
VGS
Drain-Source Voltage
Gate-Source Voltage
±20
V
ID @ TA=25°C
ID @ TA=70°C
IDM
Continuous Drain Current3
Continuous Drain Current3
Pulsed Drain Current1
13
A
10
A
50
A
PD @ TA=25°C
Total Power Dissipation
2.5
W
Linear Derating Factor
Single Pulse Avalanche Energy4
0.02
266
W/°C
mJ
A
EAS
IAR
Avalanche Current
7.3
TSTG
TJ
Storage Temperature Range
Operating Junction Temperature Range
-55 to 150
-55 to 150
°C
°C
Thermal Data
Symbol
Parameter
Value
50
Unit
Rthj-a
Thermal Resistance Junction-ambient3
Max.
°C/W
3/08/2005 Rev.2.2
www.SiliconStandard.com
1 of 5
SSM4880AGM
Electrical Characteristics @ Tj=25oC (unless otherwise specified)
Symbol
BVDSS
Parameter
Test Conditions
VGS=0V, ID=250uA
Min. Typ. Max. Units
Drain-Source Breakdown Voltage
30
-
-
0.037
-
-
V
∆BVDSS/∆Tj
Breakdown Voltage Temperature Coefficient Reference to 25°C, ID=1mA
Static Drain-Source On-Resistance VGS=10V, ID=13A
VGS=4.5V, ID=10A
-
V/°C
mΩ
RDS(ON)
-
9
-
1
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
15
3
mΩ
V
VGS(th)
gfs
Gate Threshold Voltage
VDS=VGS, ID=250uA
VDS=15V, ID=10A
VDS=30V, VGS=0V
VDS=24V, VGS=0V
Forward Transconductance
Drain-Source Leakage Current (Tj=25°C)
Drain-Source Leakage Current (Tj=55°C)
20
-
-
S
IDSS
uA
uA
nA
nC
nC
nC
ns
ns
ns
ns
pF
pF
pF
1
-
25
IGSS
Qg
Gate-Source Leakage
Total Gate Charge2
Gate-Source Charge
Gate-Drain ("Miller") Charge
Turn-on Delay Time2
Rise Time
V =
GS
-
± 20V
±100
ID=13A
22.5
3.3
15.4
9
-
-
Qgs
Qgd
td(on)
tr
VDS=15V
VGS=5V
-
VDS=15V
ID=1A
-
16
25
50
813
516
224
-
td(off)
tf
Turn-off Delay Time
Fall Time
RG=6.2Ω ,VGS=10V
RD=15Ω
-
-
-
-
-
Ciss
Coss
Crss
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
VGS=0V
VDS=25V
f=1.0MHz
Source-Drain Diode
Symbol
Parameter
Test Conditions
Min. Typ. Max. Units
A
A
V
IS
Continuous Source Current ( Body Diode )
Pulsed Source Current ( Body Diode )1
Forward On Voltage2
VD=VG=0V , VS=1.3V
-
-
-
-
2.3
50
ISM
VSD
Tj=25°C, IS=2.3A, VGS=0V
-
-
1.3
Notes:
1.Pulse width limited by safe operating area.
2.Pulse width <300us , duty cycle <2%.
3.Surface mounted on 1 in2 copper pad of FR4 board ; 125°C/W when mounted on min. copper pad.
4.Starting Tj=25oC , VDD=25V , L=10mH , RG=25Ω
3/08/2005 Rev.2.2
www.SiliconStandard.com
2 of 5
SSM4880AGM
50
40
30
20
10
0
50
40
30
20
10
0
10V
8.0V
6.0V
5.0V
10V
8.0V
6.0V
5.0V
T A =150 o C
T A =25 o C
V G = 4 .0 V
V G = 4 .0 V
0
1
2
3
4
5
6
0
1
2
3
4
5
6
V DS , Drain-to-Source Voltage (V)
V DS , Drain-to-Source Voltage (V)
Fig 1. Typical Output Characteristics
Fig 2. Typical Output Characteristics
21
17
13
9
1.8
1.6
1.4
1.2
1
I D =10A
I D =13A
V G =10V
T
A =25°C
0.8
0.6
5
2
4
6
8
10
-50
0
50
100
150
T j , Junction Temperature ( o C)
V GS , Gate-to-Source Voltage (V)
Fig 3. On-Resistance vs. Gate Voltage
Fig 4. Normalized On-Resistance
vs. Junction Temperature
3
2
1
0
100
10
T j =150 o C
T j =25 o C
1
0.1
0.1
0.3
0.5
0.7
0.9
1.1
1.3
-50
0
50
100
150
V SD , Source-to-Drain Voltage (V)
T j , Junction Temperature( o C)
Fig 5. Forward Characteristic of
Reverse Diode
Fig 6. Gate Threshold Voltage vs.
Junction Temperature
3/08/2005 Rev.2.2
www.SiliconStandard.com
3 of 5
SSM4880AGM
f=1.0MHz
16
14
12
10
8
10000
1000
100
I D =13A
V
DS =15V
C iss
C oss
6
4
C rss
2
0
1
6
11
16
21
0
10
20
30
40
50
Q G , Total Gate Charge (nC)
V DS , Drain-to-Source Voltage (V)
Fig 7. Gate Charge Characteristics
Fig 8. Typical Capacitance Characteristics
1
100
Duty factor = 0.5
0.2
0.1
10
1ms
0.1
0.05
0.02
10ms
1
100ms
0.01
PDM
0.01
Single Pulse
t
1s
10s
DC
T
0.1
T A =25 o C
Duty Factor = t/T
Single Pulse
Peak Tj = PDM x Rthja + Ta
Rthja=125oC/W
0.01
0.001
0.1
1
10
100
0.0001
0.001
0.01
0.1
1
10
100
1000
V DS , Drain-to-Source Voltage (V)
t , Pulse Width (s)
Fig 9. Maximum Safe Operating Area
Fig 10. Effective Transient Thermal Impedance
VG
VDS
90%
QG
5V
QGS
QGD
10%
VGS
tr
t
Q
Charge
td(on)
d(off) tf
Fig 11. Switching Time Waveform
Fig 12. Gate Charge Waveform
3/08/2005 Rev.2.2
www.SiliconStandard.com
4 of 5
SSM4880AGM
Information furnished by Silicon Standard Corporation is believed to be accurate and reliable. However, Silicon Standard Corporation makes no
guarantee or warranty, express or implied, as to the reliability, accuracy, timeliness or completeness of such information and assumes no
responsibility for its use, or for infringement of any patent or other intellectual property rights of third parties that may result from its
use. Silicon Standard reserves the right to make changes as it deems necessary to any products described herein for any reason, including
without limitation enhancement in reliability, functionality or design. No license is granted, whether expressly or by implication, in relation to
the use of any products described herein or to the use of any information provided herein, under any patent or other intellectual property rights of
Silicon Standard Corporation or any third parties.
3/08/2005 Rev.2.2
www.SiliconStandard.com
5 of 5
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