SFF40N60NUB [SSDI]

Power Field-Effect Transistor;
SFF40N60NUB
型号: SFF40N60NUB
厂家: SOLID STATES DEVICES, INC    SOLID STATES DEVICES, INC
描述:

Power Field-Effect Transistor

文件: 总3页 (文件大小:149K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
SFF40N60N  
SFF40N60P  
Solid State Devices, Inc.  
14701 Firestone Blvd * La Mirada, Ca 90638  
Phone: (562) 404-4474 * Fax: (562) 404-1773  
ssdi@ssdi-power.com * www.ssdi-power.com  
DESIGNER’S DATA SHEET  
Part Number / Ordering Information 1/  
40 AMP / 600 Volts  
Typ 40 m  
N-Channel POWER MOSFET  
__  
__  
__  
SFF40N60  
Screening 2/ __ = Not Screened  
TX = TX Level  
TXV = TXV Level  
S = S Level  
Features:  
Rugged Construction with Polysilicon Gate  
Very Low RDS(ON) and High Transconductance  
Excellent High Temperature Stability  
Very Fast Switching Speed  
Fast Recovery and Superior dV/dt performance  
Lead Option  
__ = Straight Leads  
DB = Down Bend  
UB = Up Bend  
Package N = TO-258  
P = TO-259  
Increased Reverse Energy Capability  
Low Input and Transfer Capacitance for Easy Paralleling  
Hermetically Sealed, Isolated Surface Mount Power Package  
Ceramic Seals for Improved Hermeticity  
TX, TXV, S-Level screening available  
Maximum Ratings  
Symbol  
VDS  
Value  
600  
±20  
40  
Units  
Volts  
Volts  
Amps  
Drain – Source Voltage  
Gate – Source Voltage  
Continues Drain Current  
VGS  
ID  
EAR  
EAS  
3
Avalanche Energy, repetitive  
Avalanche energy, single pulse  
mJ  
1900  
150  
114  
TC = 25ºC  
TC = 55ºC  
Power Dissipation  
PD  
Top & Tstg  
RθJC  
W
ºC  
Operating & Storage Temperature  
-55 to +150  
Maximum Thermal Resistance  
Junction to Case  
0.83  
ºC/W  
NOTES:  
TO-258 (N)  
TO-259 (P)  
*
Pulse test: pulse width = 300µsec, duty cycle = 2%  
1/ For ordering information, price, and availability - contact factory.  
2/ Screening based on MIL-PRF-19500. Screening flows available on request.  
3/ Unless otherwise specified, all electrical characteristics @25ºC.  
NOTE: All specifications are subject to change without notification.  
SCD's for these devices should be reviewed by SSDI prior to release.  
DATA SHEET #: FT0059A  
DOC  
SFF40N60N  
SFF40N60P  
Solid State Devices, Inc.  
14701 Firestone Blvd * La Mirada, Ca 90638  
Phone: (562) 404-4474 * Fax: (562) 404-1773  
ssdi@ssdi-power.com * www.ssdi-power.com  
Electrical Characteristics 3/  
Symbol  
Min  
Typ  
Max  
Units  
Drain to Source Breakdown Voltage  
(VGS = 0V, ID = 250µA)  
BVDSS  
600  
650  
––  
Volts  
ID = 25A  
ID = 15A  
ID = 15A, 125°C  
RDS(on)1  
RDS(on)2  
RDS(on)3  
––  
––  
––  
40  
40  
80  
50  
––  
––  
Drain to Source On State Resistance  
(VGS = 10V)  
mΩ  
TA = 25ºC  
TA = 125ºC  
TA = -55ºC  
2.0  
1.0  
-
3.0  
2.2  
3.3  
4.0  
-
5.0  
Gate Threshold Voltage  
(VDS = VGS, ID = 4mA)  
VGS(th)  
V
Gate to Source Leakage  
(At Rated VGS)  
IGSS  
––  
––  
±100  
nA  
Zero Gate Voltage Drain Current  
(VGS = 0V)  
IDSS1  
IDSS2  
VDS = Rated, TA = 25ºC  
––  
––  
0.5  
500  
25  
750  
µA  
µA  
VDS = Rated, TA = 125ºC  
Forward Transconductance *  
(VDS > ID(on) x RDS(on) Max, IDS = 50% Rated  
ID)  
gfs  
10  
25  
––  
Mho  
nC  
Total Gate Charge  
Gate to Source Charge  
Gate to Drain Charge  
VGS = 10V  
VDS = 300V  
ID = 16.5A  
Qg  
Qgs  
Qgd  
––  
––  
––  
150  
40  
50  
200  
60  
65  
Turn on Delay Time  
Rise Time  
Turn on Delay Time  
Fall Time  
td(on)  
tr  
td(off)  
tf  
––  
––  
––  
––  
45  
20  
200  
20  
60  
40  
250  
30  
VDD = 300V  
ID = 16.5A  
RG = 2Ω  
nsec  
V
Diode Forward Voltage *  
(IS = Rated ID, VGS = 0V, TJ = 25°C)  
VSD  
––  
0.875  
1.0  
Diode Reverse Recovery Time  
Reverse Recovery Charge  
(IF = 10A, di/dt = 100A/µsec, TJ =  
25°C)  
nsec  
µC  
trr  
QRR  
––  
––  
400  
5.6  
550  
––  
VGS = 0V, VDS = 25V, f = 1 MHz  
VGS = 0V, VDS = 100V, f = 1 MHz  
15.2  
9.2  
8800  
400  
nF  
nF  
pF  
pF  
Input Capacitance  
Output Capacitance  
Reverse Transfer Capacitance  
Ciss  
––  
––  
––  
––  
––  
––  
VGS = 0V, VDS = 25V, f = 1 MHz  
Coss  
VGS = 0V, VDS = 100V, f = 1 MHz  
NOTE: All specifications are subject to change without notification.  
SCD's for these devices should be reviewed by SSDI prior to release.  
DATA SHEET #: FT0059A  
DOC  
SFF40N60N  
SFF40N60P  
Solid State Devices, Inc.  
14701 Firestone Blvd * La Mirada, Ca 90638  
Phone: (562) 404-4474 * Fax: (562) 404-1773  
ssdi@ssdi-power.com * www.ssdi-power.com  
Optional Lead Bend Configuration  
Case Outline: TO-258 (N)  
NDB & PDB  
NUB & PUB  
NOTES:  
Case Outline: TO-259 (P)  
*
Pulse test: pulse width = 300µsec, duty cycle  
= 2%  
1/ For ordering information, price, and  
availability - contact factory.  
2/ Screening based on MIL-PRF-19500.  
Screening flows available on request.  
3/ Unless otherwise specified, all electrical  
characteristics @25ºC.  
Available Part Numbers:  
SFF40N60N; SFF40N60NDB;  
SFF40N60NUB;  
SFF40N60P; SFF40N60PDB;  
SFF40N60PUB  
PIN ASSIGNMENT (Standard)  
Package  
TO-258 (N)  
TO-259 (P)  
Drain  
Pin 1  
Pin 1  
Source  
Pin 2  
Gate  
Pin 3  
Pin 3  
Pin 2  
NOTE: All specifications are subject to change without notification.  
SCD's for these devices should be reviewed by SSDI prior to release.  
DATA SHEET #: FT0059A  
DOC  

相关型号:

SFF40N60PDBS

Power Field-Effect Transistor
SSDI

SFF40N60PDBTX

Power Field-Effect Transistor
SSDI

SFF40N60PDBTXV

Power Field-Effect Transistor
SSDI

SFF420-20

Transistor
SSDI

SFF420-28

Transistor
SSDI

SFF420AAGZ

Transistor
SSDI

SFF420C

Transistor
SSDI

SFF420CGZ

Transistor
SSDI

SFF420G

Transistor
SSDI

SFF420J

2.5 AMP 500 VOLTS 3.0 ohm N-Channel Power MOSFET
SSDI

SFF420JGZ

Transistor
SSDI

SFF420M

Transistor
SSDI