HCC4021BD [STMICROELECTRONICS]
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| 型号： | HCC4021BD |
| 厂家： | 
ST |
| 描述： | 暂无描述 移位寄存器 |
| 文件： | 总13页 (文件大小：303K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
HCC/HCF4014B
HCC/HCF4021B
8-STAGE STATIC SHIFT REGISTERS
4014B SYNCHRONOUS PARALLEL OR
lines and synchronous with the positive transition of
the clock line. In the HCC/HCF4021B, the CLOCK
input of theinternal stageis ”forced” whenasynchro-
nous parallel entry is made. Register expansion
using multiple package is permitted.
SERIAL INPUT/SERIAL OUTPUT
4021B ASYNCHRONOUS PARALLEL
INPUT OR SYNCHRONOUS
SERIAL INPUT/SERIAL OUTPUT
.
MEDIUM-SPEED OPERATION-12MHz (typ.)
CLOCK RATE AT VDD – VSS = 10V
FULLY STATIC OPERATION
8 MASTER-SLAVE FLIP-FLOPS PLUS OUT-
PUT BUFFERING AND CONTROL GATING
QUIESCENT CURRENT SPECIFIED TO 20V
FOR HCC DEVICE
5V, 10V AND 15V PARAMETRIC RATINGS
INPUT CURRENT OF 100nA AT 18V AND 25°C
FOR HCC DEVICE
100% TESTED FOR QUIESCENT CURRENT
MEETS ALLREQUIREMENTS OF JEDECTEN-
TATIVE STANDARD No 13A, ”STANDARD
SPECIFICATIONS FOR DESCRIPTION OF ”B”
SERIES CMOS DEVICES”
.
.
.
.
EY
F
(Plastic Package)
.
(Ceramic Package)
.
.
M1
C1
(Micro Package)
(Plastic Chip Carrier)
ORDER CODES :
DESCRIPTION
HCC40XXBF
HCF40XXBM1
HCF40XXBC1
HCF40XXBEY
The HCC4014B, HCC4021B (extended temperatu-
re range) and theHCF4014B, HCF4021B (interme-
diate temperature range) are monolithic integrated
circuits, available in 16-lead dual in-line plastic or ce-
ramic package and plastic micro package. The
HCC/HCF4014BandHCC/HCF4021B seriestypes
are 8-stage parallel-or serial-input/serial-output re-
gisters having common CLOCK and PARAL-
LEL/SERIAL CONTROL inputs, a single SERIAL
data input, and individual parallel ”JAM” inputs to
each register stage. Each register stage is a Dtype,
master-slave flip-flop in addition to an output from
stage 8, ”Q” outputs are also available from stages
6 and 7. Parallel as well as serial entry is made into
the register synchronously with the positive clock li-
ne transition in the HCC/HCF4014B. In the
HCC/HCF4021B serial entry is synchronous with
the clock but parallel entry is asynchronous. In both
types, entryis controlled by the PARALLEL/SERIAL
CONTROL input. When the PARALLEL/SERIAL
CONTROL input is low, data is serially shifted into
the 8-stage register synchronously with the positive
transition of the clock line. When the PARAL-
LEL/SERIAL CONTROL input is high, data is jam-
med into the 8-stage register via the parallel input
PIN CONNECTIONS
November 1996
1/13
HCC/HCF4014B/4021B
FUNCTIONAL DIAGRAM
ABSOLUTE MAXIMUM RATINGS
Symbol
Parameter
Value
Unit
VDD
*
Supply Voltage : HCC Types
HCF Types
– 0.5 to + 20
– 0.5 to + 18
V
V
Vi
II
Input Voltage
– 0.5 to VDD + 0.5
V
DC Input Current (any one input)
± 10
mA
mW
Pto t
Total Power Dissipation (per package)
Dissipation per Output Transistor
200
for To p = Full Package-temperature Range
100
mW
Top
Operating Temperature : HCC Types
HCF Types
– 55 to + 125
– 40 to + 85
°C
°C
Tstg
Storage Temperature
– 65 to + 150
°C
Stresses above those listed under ”Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and
functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not
implied. Exposure to absolute maximum ratingconditions for external periods may affect device reliability.
*
All voltage values are referred to VSS pin voltage.
RECOMMENDED OPERATING CONDITIONS
Symbol
Parameter
Supply Voltage : HCC Types
HCF Types
Value
Unit
VDD
3 to 18
3 to 15
V
V
VI
Input Voltage
0 to VDD
V
To p
Operating Temperature : HCC Types
HCF Types
– 55 to + 125
– 40 to + 85
°C
°C
2/13
HCC/HCF4014B/4021B
LOGIC DIAGRAMS
4014B
4021B
3/13
HCC/HCF4014B/4021B
TRUTH TABLES
HCC/HCF 4014B
HCC/HCF4021B
Parallel/
Serial
Parallel/
Serial
Control
Q 1
(internal)
Serial
Input
Q 1
(internal)
CL
Pl–1 Pl–n
Q n
CL
Pl–1 Pl–n
Q n
Serial
Input
Control
–
/
X
X
X
X
X
X
X
X
1
1
1
1
0
0
1
1
0
1
0
1
0
0
1
1
0
1
0
1
X
X
X
X
0
1
1
1
1
0
0
X
0
1
0
0
0
1
0
0
–
–
/
–
–
/
0
1
0
1
–
–
/
1
1
1
1
–
–
/
0
1
0
0
X
X
X
X
0
1
Qn–1
Qn–1
I
–
–
/
X
X
X
X
X
X
0
Qn–1
Qn–1
Qn
–
–
\
NC
–
X
0
X
X
Q1
Qn
–
/
I
1
1
–
X =don’t care case.
NC = no change.
–
X
Q1
NC
\
–
X = don’t care case.
NC = no change.
STATIC ELECTRICAL CHARACTERISTICS (over recommended operating conditions)
Test Conditions
Value
Symbol
Parameter
Unit
VI
VO
| IO | VDD
TLow
*
25°C
THigh*
(V)
(V)
(µA) (V)
Min. Max. Min. Typ. Max. Min. Max.
IL
Quiescent
Current
0/ 5
0/10
0/15
0/20
0/ 5
0/10
0/15
0/ 5
0/10
0/15
5/0
5
5
10
20
100
20
40
80
0.04
0.04
0.04
5
150
300
600
3000
150
300
600
10
15
20
5
10
20
HCC
Types
µA
0.08 100
0.04
0.04
0.04
20
40
80
HCF
Types
10
15
VOH
VOL
VIH
Output High
Voltage
< 1
< 1
< 1
< 1
< 1
< 1
5
4.95
4.95
9.95
4.95
9.95
V
V
V
V
10 9.95
15 14.95
14.95
14.95
Output Low
Voltage
5
0.05
0.05
0.05
0.05
0.05
0.05
0.05
0.05
0.05
10/0
15/0
10
15
Input High
Voltage
0.5/4.5 < 1
1/9 < 1
5
3.5
7
3.5
7
3.5
7
10
15
5
1.5/13.5 < 1
4.5/0.5 < 1
11
11
11
VIL
Input Low
Voltage
1.5
3
1.5
3
1.5
3
9/1
< 1
10
15
13.5/1.5 < 1
4
4
4
* TLow = – 55°C for HCC device : – 40°C for HCF device.
* THigh = + 125°C for HCC device : + 85°C for HCF device.
The Noise Margin for both ”1” and ”0” level is : 1V min. with VDD = 5V, 2V min. with VDD = 10V, 2.5 V min.with VDD = 15V.
4/13
HCC/HCF4014B/4021B
STATIC ELECTRICAL CHARACTERISTICS (continued)
Test Conditions
Value
25°C
Min. Max. Min. Typ. Max. Min. Max.
Symbol
Parameter
Unit
VI
VO
|IO
|
VD D
T Lo w
*
T High*
(V)
(V)
(µA) (V)
IOH
Output
Drive
Current
0/ 5
0/ 5
0/10
0/15
0/ 5
0/ 5
0/10
0/15
0/ 5
0/10
0/15
0/ 5
0/10
0/15
2.5
4.6
9.5
13.5
2.5
4.6
9.5
13.5
0.4
0.5
1.5
0.4
0.5
1.5
5
5
– 2
– 1.6 – 3.2
– 0.51 – 1
– 1.3 – 2.6
– 3.4 – 6.8
– 1.36 – 3.2
– 0.44 – 1
– 1.1 – 2.6
– 3.0 – 6.8
– 1.15
– 0.36
– 0.9
– 2.4
– 1.1
– 0.36
– 0.9
– 2.4
0.36
– 0.64
HCC
Types
10 – 1.6
15 – 4.2
mA
5
5
– 1.53
– 0.52
HCF
Types
10 – 1.3
15 – 3.6
IOL
Output
Sink
Current
5
0.64
1.6
0.51
1.3
1
HCC
Types
10
15
5
2.6
0.9
4.2
3.4
6.8
2.4
mA
0.52
1.3
0.44
1.1
1
0.36
HCF
Types
10
15
18
2.6
0.9
3.6
3.0
6.8
2.4
I
IH, IIL Input
HCC 0/18
Types
± 0.1
± 0.3
±10–5 ± 0.1
± 1
± 1
Leakage
Current
Any Input
Any Input
µA
HCF
Types
0/15
15
±10–5 ± 0.3
CI
Input Capacitance
5
7.5
pF
* TLow = – 55°C for HCC device : – 40°C for HCF device.
* THigh = + 125°C for HCC device : + 85°C for HCF device.
The Noise Margin for both ”1” and ”0” level is : 1V min. with VDD = 5V, 2V min. with VDD = 10V, 2.5 V min.with VDD = 15V.
DYNAMIC ELECTRICAL CHARACTERISTICS (Tamb = 25°C, CL = 50pF, RL = 200kΩ,
typical temperature coefficient for all VDD = 0.3%/°C values, all input rise and fall time = 20ns)
Test Conditions
Value
Symbol
Parameter
Unit
V DD (V) Min. Typ. Max.
CLOCKED OPERATION
tPLH, tPHL Propagation Delay Time
5
160
80
60
100
50
40
6
320
160
120
200
100
80
ns
ns
10
15
5
t
THL, tTLH Transition Time
10
15
5
fCL
*
Maximum Clock Input Frequency
Clock Pulse Width
3
6
MHz
ns
10
15
5
12
17
90
40
25
8.5
180
80
50
tW
10
15
*
If more than one unit is cascaded trCL should be made less than or equal to the sum of the transition time and the fixed propagation delay of
the output of the driving stage of the estimated capacitive load.
5/13
HCC/HCF4014B/4021B
DYNAMIC ELECTRICAL CHARACTERISTICS (Continued)
Test Conditions
VDD (V) Min.
Value
Typ.
Symbol
Parameter
Unit
Max.
CLOCKED OPERATION
tr, tf
tsetup
tsetup
tsetup
tsetup
thold
Clock Input Rise or Fall Time
5
15
15
15
µs
ns
ns
ns
ns
ns
ns
ns
10
15
5
Setup Time, serial Input (ref. to CL)
120
80
60
80
50
40
50
30
20
180
80
60
0
60
40
30
40
25
20
25
15
10
90
40
30
10
15
5
Setup Time, parallel Input (4014B)
(ref. to CL)
10
15
5
Setup Time, parallel Input (4021B)
(ref. to P/S)
10
15
5
Setup Time, parallel/serial Control (4014B)
(ref. to CL)
10
15
5
Hold Time, serial in, parallel in,
parallel/serial Cotrol
10
15
5
0
0
tWH
P/S Pulse Width (4021B)
160
80
50
280
140
100
80
40
10
15
5
25
trem
P/S Removal time (4021B)
(ref. to CL)
140
70
10
15
50
*
If more than one unit is cascaded trCL should be made less than or equal to the sum of the transition time and the fixed propagation delay of
the output of the driving stage of the estimated capacitive load.
Typical Output Low (sink) Current Characteristics.
Minimum Output Low (sink) Current Charac-
teristics.
6/13
HCC/HCF4014B/4021B
Typical Output High (source) Current Charac-
teristics.
Minimum Output High (source) Current Charac-
teristics.
Typical Transition Time vs. Load Capacitance.
Typical Propagation Delay Time vs. Load Capacit-
ance.
Typical Dynamic Power Dissapating vs. Clock
Input Frequency.
7/13
HCC/HCF4014B/4021B
TEST CIRCUITS
Quiescent Device Current.
Noise Immunity.
Input Leakage Current.
Dynamic Power Dissipation.
8/13
HCC/HCF4014B/4021B
Plastic DIP16 (0.25) MECHANICAL DATA
mm
inch
TYP.
DIM.
MIN.
0.51
0.77
TYP.
MAX.
MIN.
0.020
0.030
MAX.
a1
B
b
1.65
0.065
0.5
0.020
0.010
b1
D
E
e
0.25
20
0.787
8.5
2.54
17.78
0.335
0.100
0.700
e3
F
7.1
5.1
0.280
0.201
I
L
3.3
0.130
Z
1.27
0.050
P001C
9/13
HCC/HCF4014B/4021B
Ceramic DIP16/1 MECHANICAL DATA
mm
inch
TYP.
DIM.
MIN.
TYP.
MAX.
20
MIN.
MAX.
0.787
0.276
A
B
7
D
E
3.3
0.130
0.700
0.38
0.015
e3
F
17.78
2.29
0.4
2.79
0.55
1.52
0.31
1.27
10.3
8.05
5.08
0.090
0.016
0.046
0.009
0.020
0.110
0.022
0.060
0.012
0.050
0.406
0.317
0.200
G
H
L
1.17
0.22
0.51
M
N
P
7.8
0.307
Q
P053D
10/13
HCC/HCF4014B/4021B
SO16 (Narrow) MECHANICAL DATA
mm
inch
DIM.
MIN.
TYP.
MAX.
1.75
0.2
MIN.
TYP.
MAX.
0.068
0.007
0.064
0.018
0.010
A
a1
a2
b
0.1
0.004
1.65
0.46
0.25
0.35
0.19
0.013
0.007
b1
C
0.5
0.019
c1
D
45° (typ.)
9.8
5.8
10
0.385
0.228
0.393
0.244
E
6.2
e
1.27
8.89
0.050
0.350
e3
F
3.8
4.6
0.5
4.0
5.3
0.149
0.181
0.019
0.157
0.208
0.050
0.024
G
L
1.27
0.62
M
S
8° (max.)
P013H
11/13
HCC/HCF4014B/4021B
PLCC20 MECHANICAL DATA
mm
inch
TYP.
DIM.
MIN.
TYP.
MAX.
10.03
9.04
MIN.
0.385
0.350
0.165
MAX.
0.395
0.356
0.180
A
B
9.78
8.89
4.2
D
4.57
d1
d2
E
2.54
0.56
0.100
0.022
7.37
8.38
0.290
0.330
0.004
e
1.27
5.08
0.38
0.050
0.200
0.015
e3
F
G
0.101
M
M1
1.27
1.14
0.050
0.045
P027A
12/13
HCC/HCF4014B/4021B
Information furnished is believed to be accurate and reliable. However, SGS-THOMSON Microelectronics assumes no responsability for the
consequences of use of such information nor for any infringement of patents or other rights of third parties which may results from its use. No
license is granted by implication or otherwise under any patent or patent rights of SGS-THOMSON Microelectronics. Specifications mentioned
in this publication are subject to change without notice. This publication supersedes and replaces all information previously supplied.
SGS-THOMSON Microelectronics products are not authorized for use as critical components in lifesupport devices or systems without express
written approval of SGS-THOMSON Microelectonics.
1996 SGS-THOMSON Microelectronics - Printed in Italy - All Rights Reserved
SGS-THOMSONMicroelectronics GROUP OF COMPANIES
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13/13
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