M27C516-10XN1TR [STMICROELECTRONICS]
512 Kbit 32Kb x16 OTP EPROM; 512 Kbit的32Kb的X16 OTP EPROM型号: | M27C516-10XN1TR |
厂家: | ST |
描述: | 512 Kbit 32Kb x16 OTP EPROM |
文件: | 总12页 (文件大小:94K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
M27C516
512 Kbit (32Kb x16) OTP EPROM
5V ± 10% SUPPLYVOLTAGEin READ
OPERATION
FASTACCESS TIME: 35ns
LOW POWER CONSUMPTION:
– Active Current 30mA at 5MHz
– Stand-byCurrent 100µA
PROGRAMMING VOLTAGE: 12.75V 0.25V
±
PROGRAMMING TIME: 100 s/word (typical)
µ
ELECTRONIC SIGNATURE
– ManufacturerCode: 0020h
– Device Code: 000Fh
PLCC44 (C)
TSOP40 (N)
10 x 14mm
Figure 1. Logic Diagram
DESCRIPTION
The M27C516 is a 512 Kbit EPROM offered in the
OTP range (one time programmable). It is ideally
suited for microprocessor systems requiring large
data or program storage and is organized as
32,768 words of 16 bits.
TheM27C516is offeredin aPLCC44andTSOP40
(10 x 14mm) packages.
V
V
PP
CC
15
16
A0-A14
Q0-Q15
P
E
M27C516
Table 1. Signal Names
A0-A14
Q0-Q15
E
Address Inputs
Data Outputs
Chip Enable
G
G
Output Enable
Program Enable
Supply Voltage
Program Supply
Ground
V
SS
AI00932
P
VCC
VPP
VSS
September 1998
1/12
M27C516
Figure 2A. LCC Pin Connections
Figure 2B. TSOP Pin Connections
A9
A10
A11
A12
A13
A14
NC
NC
P
1
40
V
SS
A8
A7
A6
1 44
A5
Q12
A13
A12
A11
A10
A9
A4
Q11
Q10
Q9
A3
A2
A1
Q8
V
10
11
M27C516
(Normal)
31
30
A0
CC
V
12
M27C516
34
V
SS
SS
V
PP
E
G
NC
Q7
Q6
Q5
Q4
NC
A8
A7
A6
A5
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
DQ15
DQ14
DQ13
DQ12
DQ11
DQ10
DQ9
23
AI00934
DQ8
20
21
V
SS
AI01600
Warning: NC = Not Connected.
Warning: NC = Not Connected.
Table 2. Absolute Maximum Ratings (1)
Symbol
TA
Parameter
Ambient Operating Temperature (3)
Value
–40 to 125
–50 to 125
–65 to 150
–2 to 7
Unit
C
°
TBIAS
TSTG
Temperature Under Bias
Storage Temperature
Input or Output Voltages (except A9)
Supply Voltage
°C
C
°
(2)
VIO
V
VCC
–2 to 7
V
V
V
(2)
VA9
A9 Voltage
–2 to 13.5
–2 to 14
VPP
Program Supply Voltage
Notes:
1. Except for the rating ”Operating Temperature Range”, stresses above those listed in the Table ”AbsoluteMaximum Ratings”
may cause permanent damage to the device. These are stress ratings only and operation of the device at these or any other
conditions above those indicated in the Operating sections of this specification is not implied. Exposure to Absolute Maximum
Rating conditions for extended periods may affect device reliability. Refer also to the STMicroelectronics SURE Program and other
relevant quality documents.
2. Minimum DC voltage on Input or Output is –0.5V with possible undershoot to –2.0Vfor a period less than 20ns. Maximum DC
voltage on Output is VCC +0.5V with possible overshoot to VCC +2V for a period less than 20ns.
3. Depends on range.
2/12
M27C516
Table 3. Operating Modes
Mode
Read
E
G
VIL
VIH
X
P
A9
X
VPP
VCC
VCC
VPP
VPP
VPP
VCC
VCC
Q0 - Q15
Data Out
Hi-Z
VIL
VIL
VIL
VIL
VIH
VIH
VIL
VIH
Output Disable
Program
X
X
VIL Pulse
X
Data In
Data Out
Hi-Z
Verify
VIL
X
VIH
X
X
Program Inhibit
Standby
X
X
X
X
Hi-Z
Electronic Signature
VIL
VIH
VID
Codes
Notes
: X = VIH or VIL, VID = 12V ± 0.5V
Table 4. Electronic Signature
Identifier
Manufacturer’s Code
Device Code
A0
VIL
VIH
Q7
0
Q6
0
Q5
1
Q4
Q3
Q2
Q1
0
Q0
Hex Data
20h
0
0
0
1
0
1
0
1
0
0
0
1
0Fh
Note: Outputs Q8-Q15 are set to ’0’.
DEVICE OPERATION
M27C516 is placed in the standbymode by apply-
inga CMOShigh signal to the E input. When in the
standbymode, theoutputsareina highimpedance
state, independentof the G input.
The operating modes of the M27C516 are listed in
the Operating Modes table. A single power supply
is required in the read mode. All inputs are TTL
levels except for G and 12V on A9 for Electronic
Signature.
Two Line Output Control
Because OTP EPROMsare usually used in larger
memoryarrays,theproductfeaturesa 2linecontrol
function which accommodates the use of multiple
memory connection. The two line control function
allows:
Read Mode
The M27C516 has two control functions, both of
which must be logically active in order to obtain
data at the outputs. Chip Enable (E) is the power
control and should be used for device selection.
OutputEnable(G) is the output control and should
be used to gate data to the output pins, inde-
pendent of device selection. Assuming that the
addresses are stable, the address access time
(tAVQV) isequalto thedelayfromE tooutput(tELQV).
Datais availableatthe outputafter a delayof tGLQV
from the falling edge of G, assuming that E has
been low and the addresses have been stable for
a. thelowest possible memorypowerdissipation,
b. complete assurance that output bus contention
will not occur.
Forthe mostefficientuse ofthesetwo controllines,
E should be decoded and used as the primary
device selecting function, while G should be made
a common connection to all devices in the array
and connected to the READ line from the system
controlbus. This ensures that all deselectedmem-
ory devices are in their low power standby mode
and that the output pins are only active when data
is required from a particular memory device.
at least tAVQV-tGLQV
.
Standby Mode
TheM27C516 has a standby mode which reduces
the supply current from 30mA to 100µA. The
3/12
M27C516
Table 5. AC Measurement Conditions
High Speed
≤ 10ns
Standard
≤ 20ns (10% to 90%)
0.4V to 2.4V
Input Rise and Fall Times
Input Pulse Voltages
0 to 3V
1.5V
Input and Output Timing Ref. Voltages
0.8V and 2V
Figure 3. AC Testing Input Output Waveform
Figure 4. AC Testing Load Circuit
1.3V
High Speed
3V
1N914
1.5V
0V
3.3kΩ
DEVICE
UNDER
TEST
Standard
OUT
= 30pF or 60pF or 100pF
2.4V
C
L
2.0V
0.8V
0.4V
C
includes JIG capacitance
AI01822
L
AI02024B
Table 6. Capacitance
°
(TA = 25 C, f = 1 MHz )
Symbol
Parameter
Test Condition
VIN = 0V
Min
Max
6
Unit
pF
CIN
Input Capacitance
Output Capacitance
COUT
VOUT = 0V
12
pF
Notes. 1. VCC must be applied simultaneously with or before VPP and removed simultaneously with or after VPP
.
2. This parameter is sampled only and not tested 100%.
System Considerations
output controland by properlyselecteddecoupling
capacitors.It is recommended that a 1µF ceramic
capacitor be used on every device between VCC
and VSS. Thisshouldbe a highfrequencycapacitor
of low inherent inductance and should be placed
as close to the device as possible. In addition, a
4.7µF bulk electrolytic capacitor should be used
betweenVCC and VSS forevery eight devices. The
bulk capacitor should be located near the power
supplyconnection point.The purpose of the bulk
capacitor is to overcome the voltage drop caused
by the inductive effects of PCB traces.
The power switching characteristics of Advanced
CMOS EPROMsrequire careful decouplingof the
devices. The supply current, ICC, has three seg-
ments that are of interest to the system designer:
the standby current level, the active current level,
and transient current peaks that are produced by
the falling and risingedges of E. Themagnitudeof
the transient current peaks is dependent on the
capacitiveandinductiveloadingof thedeviceatthe
output.Theassociatedtransientvoltagepeaks can
be suppressed by complying with the two line
4/12
M27C516
Table 7. Read Mode DC Characteristics(1)
(TA = 0 to 70 °C or –40 to 85 °C; VCC = 5V ± 5% or 5V ± 10%; VPP = VCC
)
Symbol
ILI
Parameter
Input Leakage Current
Output Leakage Current
Supply Current
Test Condition
0V
Min
Max
Unit
V
IN
V
CC
1
±
A
µ
≤
≤
ILO
0V ≤ VOUT ≤ VCC
E = VIL, G = VIL, f = 5MHz
E = VIH
±5
30
µA
mA
mA
ICC
ICC1
ICC2
IPP
Supply Current (Standby) TTL
Supply Current (Standby) CMOS
Program Current
1
E > VCC – 0.3V
VPP = VCC
100
10
A
µ
µA
V
VIL
Input Low Voltage
–0.3
2
0.8
(2)
VIH
Input High Voltage
VCC + 1
0.4
V
VOL
VOH
Output Low Voltage
IOL = 2.1mA
IOH = –400µA
IOH = –100µA
V
Output High Voltage TTL
Output High Voltage CMOS
2.4
V
VCC –0.7V
V
Notes: 1. VCC must be applied simultaneously with or before VPP and removed simultaneously or after VPP
.
2. Maximum DC Voltage on Output is VCC +0.5V.
Table 8A. Read Mode AC Characteristics (1)
(TA = 0 to 70 °C or –40 to 85 °C; VCC = 5V ± 5% or 5V ± 10%; VPP = VCC
)
M27C516
-45 (3)
Symbol
Alt
Parameter
Test Condition
Unit
-35 (3)
-55 (4)
Min
Max
Min
Max
Min
Max
Address Valid to Output
Valid
tAVQV
tELQV
tGLQV
tACC
tCE
tOE
tDF
tDF
tOH
E = VIL, G = VIL
G = VIL
35
35
18
18
18
45
45
23
18
18
55
55
25
20
20
ns
ns
ns
ns
ns
ns
Chip Enable Low to
Output Valid
Output Enable Low to
Output Valid
E = VIL
Chip Enable High to
Output Hi-Z
(2)
tEHQZ
G = VIL
0
0
0
0
0
0
0
0
0
Output Enable High to
Output Hi-Z
(2)
tGHQZ
E = VIL
Address Transitionto
Output Transition
tAXQX
E = VIL, G = VIL
Notes:
1. VCC must be applied simultaneously with or before VPP and removed simultaneously with or afterVPP.
2. Sampled only, not 100% tested.
3. Speed obtained with High Speed measurement conditions and a load capacitance of 30pF.
4. Speed obtained with a load capacitance of 60pF.
5/12
M27C516
Table 8B. Read Mode AC Characteristics (1)
(TA = 0 to 70 °C or –40 to 85 °C; VCC = 5V ± 5% or 5V ± 10%; VPP = VCC
)
M27C516
Symbol
Alt
Parameter
Test Condition
Unit
-70 (3)
Max
-85/-10
Min
Min
Max
tAVQV
tELQV
tGLQV
tACC Address Valid to Output Valid
tCE Chip Enable Low to Output Valid
tOE Output Enable Low to Output Valid
tDF Chip Enable High to Output Hi-Z
tDF Output Enable High to Output Hi-Z
E = VIL, G = VIL
G = VIL
70
70
35
20
20
85
85
35
30
30
ns
ns
ns
ns
ns
E = VIL
(2)
tEHQZ
G = VIL
0
0
0
0
(2)
tGHQZ
E = VIL
Address Transition to
tOH
tAXQX
E = VIL, G = VIL
0
0
ns
Output Transition
Notes: 1. VCC must be applied simultaneously with or before VPP and removed simultaneously with or afterVPP.
2. Sampled only, not 100% tested.
3. Speed obtained with a load capacitance of 60pF
Figure 5. Read Mode AC Waveforms
VALID
tAVQV
VALID
A0-A14
E
tAXQX
tEHQZ
tGHQZ
tGLQV
G
tELQV
Hi-Z
Q0-Q15
AI00935B
Programming
programming mode whenVPP input is at 12.75V,E
is at VIL and P is pulsed to VIL. The data to be
programmed is applied to 16 bits in parallel to the
data output pins. The evels required for the ad-
dress and data inputs are TTL. VCC is specifiedto
be 6.25V ±0.25V.
When delivered, all bits of the M27C516 are in the
’1’state.Data is introducedby selectivelyprogram-
ming ’0’s into the desired bit locations. Although
only ’0’s will be programmed,both ’1’s and’0’s can
be presentin thedata word.TheM27C516is in the
6/12
M27C516
Table 9. Programming Mode DC Characteristics (1)
(TA = 25 °C; VCC = 6.25V± 0.25V;VPP = 12.75V ± 0.25V)
Symbol
ILI
Parameter
Input Leakage Current
Supply Current
Test Condition
Min
Max
±10
Unit
µA
mA
mA
V
V
IL ≤ VIN ≤ VIH
ICC
50
IPP
Program Current
Input Low Voltage
Input High Voltage
Output Low Voltage
Output High Voltage TTL
A9 Voltage
E = VIL
50
VIL
–0.3
2
0.8
VIH
VCC + 0.5
0.4
V
VOL
VOH
VID
IOL = 2.1mA
V
IOH = –400µA
2.4
V
11.5
12.5
.
V
Note: 1. VCC must be applied simultaneously with or before VPP and removed simultaneously or after VPP
Table 10. ProgrammingMode AC Characteristics(1)
(TA = 25 °C; VCC = 6.25V ± 0.25V;VPP = 12.75V ± 0.25V)
Symbol
tAVPL
Alt
tAS
Parameter
Test Condition
Min
2
Max
Unit
Address Valid to Program Low
Input Valid to Program Low
VPP High to Program Low
VCC High to Program Low
s
µ
tQVPL
tDS
2
µs
tVPHPL
tVCHPL
tVPS
tVCS
2
s
µ
2
µs
µs
µs
Chip Enable Low to
Program Low
tELPL
tPLPH
tPHQX
tCES
tPW
tDH
2
95
2
Program Pulse Width
105
Program High to Input
Transition
s
µ
Input Transition to Output
Enable Low
tQXGL
tGLQV
tOES
tOE
tDFP
tAH
2
µs
ns
ns
µs
Output Enable Low to
Output Valid
100
130
Output Enable High to
Output Hi-Z
(2)
tGHQZ
0
0
Output Enable High to
Address Transition
tGHAX
Notes:
1. VCC must be applied simultaneously with or before VPP and removed simultaneously or after VPP
.
2. Sampled only and not 100% tested.
7/12
M27C516
Figure 6. Programming and Verify Modes AC Waveforms
VALID
A0-A14
Q0-Q15
tAVPL
tQVPL
DATA IN
DATA OUT
tPHQX
V
PP
tVPHPL
tVCHPL
tGLQV
tGHQZ
tGHAX
V
CC
E
tELPL
tPLPH
P
tQXGL
G
PROGRAM
VERIFY
AI00936
Figure 7. ProgrammingFlowchart
PRESTO II ProgrammingAlgorithm
PRESTO II Programming Algorithm allows to pro-
gram the whole array with a guaranteedmargin, in
a typical time of 3 seconds. Programming with
PRESTO II involvesthe application of a sequence
V
= 6.25V, V = 12.75V
PP
CC
µ
of100 s programpulsestoeachbyteuntilacorrect
verify occurs (see Figure 7). During programming
and verify operation, a MARGIN MODE circuit is
automatically activated in order to guarantee that
each cell is programmedwith enough margin. No
overprogram pulse is applied since the verify in
MARGIN MODE provides necessary margin to
each programmedcell.
n = 0
P = 100µs Pulse
NO
NO
++n
= 25
VERIFY
YES
++ Addr
Program Inhibit
YES
Programmingof multipleM27C516sin parallelwith
different data is also easily accomplished. Except
for E, all like inputs including G of the parallel
M27C516 may be common. A TTL low level pulse
appliedto aM27C516’sP input,with E low andVPP
at 12.75V,will programthat M27C516.A high level
E input inhibits the other M27C516s from being
programmed.
Last
Addr
NO
FAIL
YES
CHECK ALL WORDS
1st: V
2nd: V
= 6V
= 4.2V
CC
CC
Program Verify
A verify (read) should be performed on the pro-
grammedbits todeterminethat theywerecorrectly
programmed. The verify is accomplished with E
and G at VIL, P at VIH, VPP at 12.75V and VCC at
6.25V.
AI00707C
8/12
M27C516
On-Board Programming
ming the M27C516. To activate the ES mode, the
programmingequipmentmustforce11.5Vto 12.5V
on address line A9 of the M27C516.
Two identifier bytes may then be sequenced from
thedeviceoutputsby togglingaddressline A0from
VIL to VIH. All other address lines must be held at
VIL during Electronic Signature mode. Byte 0
The M27C516 can be directly programmed in the
application circuit. See the relevant Application
Note AN620.
Electronic Signature
The Electronic Signature (ES) mode allows the
reading out of a binary code from an EPROMthat
will identify its manufacturer and type. This mode
is intended for use by programming equipment to
automatically match the device to be programmed
withits correspondingprogrammingalgorithm.The
(A0=V ) represents the manufacturer code and
IL
byte 1 (A0=V ) the device identifier code. For the
IH
STMicroelectronics M27C516, these two identifier
bytes are given in Table 4 and can be read-outon
outputsQ0 to Q7.
°
± °
ES mode is functional in the 25 C 5 C ambient
temperaturerange that is required when program-
ORDERING INFORMATION SCHEME
Example: M27C516
-70 X
N
1 TR
Speed
35 ns
V
CC Tolerance
Package
Temperature Range
Option
-35 (1)
-45 (1)
-55 (2)
-70 (2)
-85
blank
X
±10%
±5%
C
N
PLCC44
1
6
0 to 70 °C
TR Tape & Reel
Packing
45 ns
55 ns
70 ns
85 ns
100 ns
TSOP40
10 x 14mm
–40 to 85 °C
-10
Notes:
1. High Speed, see AC Characteristics section for furtherinformation.
2. Speed obtained with a load capacitance of 60pF.
Fora listof availableoptions(Speed,Package,etc...)or for furtherinformationon any aspect ofthis device,
please contact the STMicroelectronics Sales Office nearest to you.
9/12
M27C516
PLCC44 - 44 lead Plastic Leaded Chip Carrier, square
mm
Min
4.20
2.29
–
inches
Min
Symb
Typ
Max
4.70
3.04
0.51
0.53
0.81
17.65
16.66
16.00
17.65
16.66
16.00
–
Typ
Max
0.185
0.120
0.020
0.021
0.032
0.695
0.656
0.630
0.695
0.656
0.630
–
A
A1
A2
B
0.165
0.090
–
0.33
0.66
17.40
16.51
14.99
17.40
16.51
14.99
–
0.013
0.026
0.685
0.650
0.590
0.685
0.650
0.590
–
B1
D
D1
D2
E
E1
E2
e
1.27
0.89
0.050
0.035
F
0.00
–
0.25
–
0.000
–
0.010
–
R
N
44
44
CP
0.10
0.004
D
A1
D1
A2
1 N
B1
e
Ne
E1 E
D2/E2
F
B
0.51 (.020)
1.14 (.045)
Nd
A
R
CP
PLCC
Drawing is not to scale
10/12
M27C516
TSOP40 - 40 lead Plastic Thin Small Outline, 10 x 14mm
mm
Min
inches
Min
Symb
Typ
Max
1.20
0.15
1.05
0.27
0.21
14.20
12.50
10.10
–
Typ
Max
0.047
0.006
0.041
0.011
0.008
0.559
0.492
0.398
–
A
A1
A2
B
0.05
0.95
0.17
0.10
13.80
12.30
9.90
–
0.002
0.037
0.007
0.004
0.543
0.484
0.390
–
C
D
D1
E
e
0.50
0.020
L
0.50
0.70
0.020
0.028
0
°
5
°
0
°
5
°
α
N
40
40
CP
0.10
0.004
A2
1
N
e
E
B
N/2
D1
D
A
CP
DIE
C
TSOP-a
A1
α
L
Drawing is not to scale
11/12
M27C516
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences
of use of such information nor for any infringementof patents or other rights of thirdparties which may result from its use. No licenseis granted
by implicationor otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject to
change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not
authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
The ST logo is a registered trademark of STMicroelectronics
1998 STMicroelectronics - AllRights Reserved
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12/12
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