M29F002T-70K1TR

更新时间:2024-09-18 02:34:05
描述:2 Mbit 256Kb x8, Boot Block Single Supply Flash Memory

M29F002T-70K1TR 概述

2 Mbit 256Kb x8, Boot Block Single Supply Flash Memory 2兆位256Kb的X8 ,引导块单电源闪存

M29F002T-70K1TR 数据手册

通过下载M29F002T-70K1TR数据手册来全面了解它。这个PDF文档包含了所有必要的细节,如产品概述、功能特性、引脚定义、引脚排列图等信息。

PDF下载
M29F002T, M29F002NT  
M29F002B  
2 Mbit (256Kb x8, Boot Block) Single Supply Flash Memory  
5V ± 10% SUPPLYVOLTAGEfor PROGRAM,  
ERASE and READ OPERATIONS  
FASTACCESS TIME: 70ns  
FAST PROGRAMMING TIME: 10µs typical  
PROGRAM/ERASE CONTROLLER (P/E.C.)  
– Program Byte-by-Byte  
32  
– Status Register bits  
MEMORY BLOCKS  
1
PLCC32 (K)  
PDIP32 (P)  
– Boot Block (Top or Bottom location)  
– Parameterand Main blocks  
BLOCK, MULTI-BLOCK and CHIP ERASE  
MULTI-BLOCKPROTECTION/TEMPORARY  
UNPROTECTION MODES  
ERASE SUSPEND and RESUME MODES  
– Read and Program another Block during  
Erase Suspend  
TSOP32 (N)  
8 x 20mm  
LOW POWER CONSUMPTION  
– Stand-byand AutomaticStand-by  
100,000 PROGRAM/ERASE CYCLES per  
BLOCK  
20 YEARSDATARETENTION  
– Defectivity below 1ppm/year  
ELECTRONIC SIGNATURE  
– ManufacturerCode: 20h  
Figure 1. Logic Diagram  
V
CC  
– Device Code, M29F002T: B0h  
– Device Code, M29F002NT: B0h  
– Device Code, M29F002B: 34h  
18  
8
A0-A17  
DQ0-DQ7  
DESCRIPTION  
W
The M29F002 is a non-volatile memory that may  
be erased electrically at the block or chiplevel and  
programmed in-system on a Byte-by-Byte basis  
usingonlyasingle5VVCC supply.ForProgramand  
Erase operations the necessary high voltages are  
generated internally. The device can also be pro-  
grammed in standardprogrammers.  
M29F002T  
M29F002B  
M29F002NT  
E
G
(*) RPNC  
The array matrix organisationallows each block to  
be erased and reprogrammed without affecting  
other blocks. Blocks can be protectedagainst pro-  
graming and erase on programming equipment,  
and temporarily unprotected to make changes in  
the application. Each block can be programmed  
and erased over 100,000 cycles.  
V
SS  
AI02078C  
Note: * RPNC function is not available for the M29F002NT  
July 1998  
1/29  
M29F002T, M29F002NT, M29F002B  
Figure 2A. DIP Pin Connections  
Figure 2B. LCC Pin Connections  
(*) RPNC  
A16  
A15  
A12  
A7  
1
2
3
4
5
6
7
8
9
32  
31  
V
CC  
W
30 A17  
29 A14  
28 A13  
27 A8  
1 32  
A7  
A14  
A13  
A8  
A6  
A6  
A5  
A5  
26 A9  
M29F002T  
M29F002B  
M29F002NT  
A4  
25 A11  
A4  
A9  
M29F002T  
M29F002B  
A3  
24  
23 A10  
22  
G
A3  
A2  
9
25 A11  
G
A2 10  
A1 11  
E
A1  
A10  
E
A0 12  
21 DQ7  
20 DQ6  
19 DQ5  
18 DQ4  
17 DQ3  
A0  
DQ0 13  
DQ1 14  
DQ2 15  
DQ0  
DQ7  
17  
V
16  
SS  
AI02079C  
AI02080C  
Note: Pin 1 is not connected for the M29F002NT  
Figure 2C. TSOP Pin Connections  
Table 1. Signal Names  
A0-A17  
DQ0-DQ7  
E
Address Inputs  
Data Input/Outputs, Command Inputs  
Chip Enable  
A11  
A9  
1
32  
G
A10  
E
G
Output Enable  
A8  
A13  
A14  
A17  
W
DQ7  
DQ6  
DQ5  
DQ4  
DQ3  
W
Write Enable  
RPNC (*)  
VCC  
Reset / Block Temporary Unprotect  
Supply Voltage  
V
8
9
25  
24  
M29F002T  
M29F002B  
CC  
V
SS  
RPNC  
A16  
VSS  
Ground  
DQ2  
DQ1  
DQ0  
A0  
A15  
A12  
A7  
DESCRIPTION (cont’d)  
Instructions for Read/Reset, Auto Select for read-  
ing the Electronic Signature or Block Protection  
status,Programming, BlockandChip Erase,Erase  
Suspend and Resume are written to the device in  
cyclesofcommandstoa CommandInterfaceusing  
standardmicroprocessor write timings. The device  
is offeredin PLCC32,PDIP32and TSOP32(8 x 20  
mm) packages.  
A6  
A1  
A5  
A2  
A4  
16  
17  
A3  
AI02361B  
2/29  
M29F002T, M29F002NT, M29F002B  
Table 2. Absolute Maximum Ratings (1)  
Symbol  
TA  
Parameter  
Value  
–40 to 125  
–50 to 125  
–65 to 150  
–0.6 to 7  
Unit  
°C  
°C  
°C  
V
Ambient Operating Temperature (3)  
Temperature Under Bias  
Storage Temperature  
TBIAS  
TSTG  
(2)  
VIO  
Input or Output Voltages  
Supply Voltage  
VCC  
–0.6 to 7  
V
(2)  
V(A9, E, G, RPNC)  
A9, E, G, RPNC Voltage  
–0.6 to 13.5  
V
Notes: 1. Except for the rating ”Operating Temperature Range”, stresses above those listed in the Table ”AbsoluteMaximum Ratings”  
may cause permanent damage to the device. These are stress ratings only and operation of the device at these or any other  
conditions above those indicated in the Operating sections of this specification is not implied. Exposure to Absolute Maximum  
Rating conditions for extended periods may affect device reliability. Refer also to the STMicroelectronics SURE Program and other  
relevant quality documents.  
2. Minimum Voltagemay undershoot to –2V during transitionand for less than 20ns.  
3. Depends on range.  
Organisation  
from or program to any block not being ersased,  
and then resumed.Block protection providesaddi-  
tional data security. Each block can be separately  
protectedor unprotectedagainstProgramor Erase  
on programming equipment. All previously pro-  
tectedblockscan be temporarilyunprotectedin the  
application.  
The M29F002 is organised as 256K x 8. Memory  
control is provided by Chip Enable E, Output En-  
able G and Write Enable W inputs.  
A Reset/Block Temporary Unprotection RPNC  
(NOTavailable on M29F002NT) tri-level input pro-  
videsa hardwareresetwhenpulledLow,andwhen  
held High (at VID) temporarily unprotects blocks  
previously protected allowing them to be progra-  
med and erased. Erase and Program operations  
are controlled by an internal Program/Erase Con-  
troller(P/E.C.).StatusRegisterdataoutputon DQ7  
provides a Data Pollingsignal, and DQ6 and DQ2  
provide Toggle signals to indicate the state of the  
P/E.C operations.  
Bus Operations  
The following operations can be performed using  
theappropriatebus cycles:Read(Array, Electronic  
Signature, Block Protection Status), Write com-  
mand, Output Disable, Standby,Reset, Block Pro-  
tection, Unprotection, Protection Verify,  
Unprotection Verify and Block Temporary Unpro-  
tection. See Tables4 and 5.  
Memory Blocks  
Command Interface  
The devices feature asymmetricallyblocked archi-  
tecture providing system memory integration. The  
M29F002has an arrayof 7blocks, one Boot Block  
of 16 KBytes, two Parameter Blocks of 8 KBytes,  
oneMainBlockof 32KBytesandthreeMainBlocks  
of 64 KBytes.  
Instructions, made up of commands written in cy-  
cles, can be given to the Program/EraseController  
through a Command Interface (C.I.). For added  
data protection,program or erase execution starts  
after4 or6 cycles.The first,second,fourthand fifth  
cycles are used to input Coded cycles to the C.I.  
This Coded sequence is the same for all Pro-  
gram/Erase Controller instructions. The ’Com-  
mand’ itself and its confirmation, when applicable,  
are given on the third, fourth or sixth cycles. Any  
incorrect command or any improper command se-  
quencewill reset the device to Read Array mode.  
Thememory map is shownin Figure3. Eachblock  
can be erased separately, any combination of  
blockscan be specifiedfor multi-blockerase or the  
entire chip may be erased. The Erase operations  
aremanagedautomaticallybythe P/E.C.Theblock  
eraseoperationcan be suspendedin orderto read  
3/29  
M29F002T, M29F002NT, M29F002B  
Figure 3. Memory Map and Block Address Table  
M29F002T, M29F002NT  
3FFFFh  
M29F002B  
3FFFFh  
16K BOOT BLOCK  
64K MAIN BLOCK  
64K MAIN BLOCK  
64K MAIN BLOCK  
32K MAIN BLOCK  
8K PARAMETER BLOCK  
8K PARAMETER BLOCK  
16K BOOT BLOCK  
3C000h  
3BFFFh  
30000h  
2FFFFh  
8K PARAMETER BLOCK  
3A000h  
39FFFh  
20000h  
1FFFFh  
8K PARAMETER BLOCK  
38000h  
37FFFh  
10000h  
0FFFFh  
32K MAIN BLOCK  
30000h  
2FFFFh  
08000h  
07FFFh  
64K MAIN BLOCK  
20000h  
1FFFFh  
06000h  
05FFFh  
64K MAIN BLOCK  
10000h  
0FFFFh  
04000h  
03FFFh  
64K MAIN BLOCK  
00000h  
00000h  
AI02081C  
Table 3A. M29F002T, M29F002NTBlock Address Table  
Address Range  
00000h-0FFFFh  
10000h-1FFFFh  
20000h-2FFFFh  
30000h-37FFFh  
38000h-39FFFh  
3A000h-3BFFFh  
3C000h-3FFFFh  
A17  
0
A16  
0
A15  
A14  
X
A13  
X
X
X
0
1
1
1
X
X
X
X
0
0
1
X
1
0
X
1
1
X
1
1
0
1
1
0
1
1
1
1
X
Table 3B. M29F002B Block Address Table  
Address Range  
00000h-03FFFh  
04000h-05FFFh  
06000h-07FFFh  
08000h-0FFFFh  
10000h-1FFFFh  
20000h-2FFFFh  
30000h-3FFFFh  
A17  
0
A16  
0
A15  
0
A14  
0
A13  
X
0
0
0
1
0
0
0
0
1
1
0
0
1
X
X
0
1
X
X
X
1
0
X
X
X
1
1
X
X
X
4/29  
M29F002T, M29F002NT, M29F002B  
Instructions  
impedance when the chip is deselected or the  
outputs are disabled and when RPNC is at a Low  
level.  
Seven instructions are defined to perform Read  
Array,Auto Select(to readthe ElectronicSignature  
or Block ProtectionStatus), Program, BlockErase,  
Chip Erase, Erase Suspend and Erase Resume.  
The internal P/E.C. automatically handles all tim-  
ing and verification of the Program and Erase  
operations.The Status Register Data Polling, Tog-  
gle, Error bits may be read at any time, during  
programming or erase, to monitor the progress of  
the operation.  
Chip Enable (E). The Chip Enable input activates  
the memory control logic, input buffers, decoders  
andsenseamplifiers.E Highdeselectsthememory  
andreducesthe powerconsumptiontothestandby  
level. E can also be used to control writing to the  
command register and to the memory array, while  
Wremainsat a low level. TheChip Enablemust be  
forced to VID duringthe Block Unprotection opera-  
tion.  
Instructions are composed of up to six cycles. The  
first two cycles input a Coded sequence to the  
CommandInterfacewhich iscommontoall instruc-  
tions (see Table 8). The third cycle inputs the  
instruction set-up command. Subsequent cycles  
outputthe addressed data, Electronic Signatureor  
Block Protection Status for Read operations. In  
orderto giveadditionaldata protection,the instruc-  
tions for Programand Block or Chip Erase require  
furthercommandinputs. ForaPrograminstruction,  
the fourth command cycle inputs the address and  
data to be programmed. For an Erase instruction  
(Block or Chip), the fourth and fifth cycles input a  
further Coded sequence before the Erase confirm  
command on the sixth cycle. Erasure of a memory  
blockmaybe suspended,in orderto readdatafrom  
anotherblock or to programdata in another block,  
and then resumed.  
Output Enable (G). The Output Enable gates the  
outputs through the data buffers during a read  
operation. When G is High the outputs are High  
impedance. G must be forced to VID level during  
Block Protection and Unprotection operations.  
WriteEnable (W). This inputcontrols writing to the  
CommandRegisterand Addressand Datalatches.  
Reset/Block Temporary Unprotect/No Connect  
Input (RPNC). The RPNC (not available for the  
M29F002NT) input provides hardware reset and  
protected block(s) temporary unprotection func-  
tions. In read or write mode, the RPNC pin can be  
left open (Not Connected) or held at VIH. Reset of  
the memory is acheived by pulling RPNC to VIL for  
atleast 500ns.When the reset pulseis given,if the  
memory is in Read or Standby modes, it will be  
availablefor newoperationsin 50nsafter the rising  
edge of RPNC. If the memory is in Erase, Erase  
Suspend or Program modes the reset will take  
10µs.Ahardwareresetduringan Eraseor Program  
operation will corrupt the data being programmed  
or the sector(s) being erased.  
When power is first applied or if VCC falls below  
VLKO, the command interface is reset to Read  
Array.  
SIGNAL DESCRIPTIONS  
Temporary block unprotection is made by holding  
RPNC at VID. Inthis conditionpreviously protected  
blocks can be programmed or erased. The transi-  
tion of RPNC from VIH to VID must slower than  
500ns. When RPNC is returnedfrom VID to VIH all  
blocks temporarily unprotected will be again pro-  
tected.  
See Figure 1 and Table1.  
Address Inputs (A0-A17). The address inputs for  
the memory array are latchedduring a write opera-  
tion on the falling edge of Chip Enable E or Write  
EnableW. When A9 is raisedto VID, eithera Read  
ElectronicSignatureManufacturerorDeviceCode,  
BlockProtectionStatus or a WriteBlock Protection  
or Block Unprotectionis enableddependingon the  
combinationof levelson A0, A1, A6, A12 and A15.  
VCC Supply Voltage. The power supply for all  
operations (Read, Program and Erase).  
VSS Ground. VSS is the reference for all voltage  
measurements.  
Data Input/Outputs (DQ0-DQ7). Theinput is data  
to be programmed in the memory array or a com-  
mand to be written to the C.I. Both are latched on  
the rising edge of Chip Enable E or Write Enable  
W. The output is data from the Memory Array, the  
Electronic Signature Manufacturer or Device  
codes, the Block Protection Status or the Status  
register Data Polling bit DQ7, the ToggleBits DQ6  
and DQ2, the Error bit DQ5 or the Erase Timer bit  
DQ3. Outputs are valid when Chip Enable E and  
Output Enable G are active. The output is high  
DEVICE OPERATIONS  
See Tables 4, 5 and 6.  
Read. Read operations are used to output the  
contents of the Memory Array, the Electronic Sig-  
nature,the Status Register or the BlockProtection  
Status. Both Chip Enable E and Output Enable G  
must be low in order to read the output of the  
memory.  
5/29  
M29F002T, M29F002NT, M29F002B  
Table 4. User Bus Operations (1)  
Operation  
Read Byte  
E
G
VIL  
VIH  
VIH  
X
W
VIH  
VIL  
VIH  
X
RPNC (6)  
VIH/NC(5)  
VIH/NC(5)  
VIH/NC(5)  
VIH/NC(5)  
VIL  
A0  
A0  
A0  
X
A1  
A1  
A1  
X
A6  
A6  
A6  
X
A9  
A9  
A9  
X
A12  
A12  
A12  
X
A15  
A15  
A15  
X
DQ0-DQ7  
Data Output  
Data Input  
Hi-Z  
VIL  
VIL  
VIL  
VIH  
X
Write Byte  
Output Disable  
Standby  
X
X
X
X
X
X
Hi-Z  
Reset (6)  
X
X
X
X
X
X
X
X
Hi-Z  
Block  
VIL  
VID VIL Pulse VIH/NC(5)  
VID VIL Pulse VIH/NC(5)  
X
X
X
X
X
X
VID  
VID  
X
X
X
X
Protection(2,4)  
Blocks  
VID  
VIH  
VIH  
Unprotection(4)  
Block  
Block Protect  
Status (3)  
Protection  
VIL  
VIL  
X
VIL  
VIL  
X
VIH  
VIH  
X
VIH/NC(5)  
VIH/NC(5)  
VID  
VIL  
VIL  
X
VIH  
VIH  
X
VIL  
VIH  
X
VID  
VID  
X
A12  
A12  
X
A15  
A15  
X
Verify(2,4)  
Block  
Block Protect  
Status (3)  
Unprotection  
Verify(2,4)  
Block  
Temporary  
X
Unprotection (6)  
Notes: 1. X = VIL or VIH  
2. Block Address must be given on A13-A17 bits.  
3. See Table 6.  
4. Operation performed on programming equipment.  
5. RPNC can be held at VIH or left open (Not Connected).  
6. Not Available on M29F002NT.  
Table 5. Read Electronic Signature (following AS instruction or with A9 = VID)  
Other  
Code  
Device  
E
G
W
A0  
VIL  
VIH  
VIH  
A1  
VIL  
VIL  
VIL  
DQ0 - DQ7  
20h  
Addresses  
Manufact. Code  
VIL  
VIL  
VIL  
VIL  
VIL  
VIL  
VIH  
VIH  
VIH  
Don’t Care  
Don’t Care  
Don’t Care  
M29F002T  
M29F002NT  
B0h  
Device Code  
M29F002B  
34h  
Table 6. Read Block Protection with AS Instruction  
Other  
Addresses  
Code  
E
G
W
A0  
A1  
A13 - A17  
DQ0 - DQ7  
Protected Block  
VIL  
VIL  
VIL  
VIL  
VIH  
VIH  
VIL  
VIL  
VIH  
VIH  
Block Address  
Block Address  
Don’t Care  
Don’t Care  
01h  
00h  
Unprotected Block  
6/29  
M29F002T, M29F002NT, M29F002B  
Write. Writeoperationsareusedto giveInstruction  
Commands to the memory or to latch input data to  
be programmed.Awrite operationis initiatedwhen  
Chip Enable E is Low and Write Enable W is Low  
with OutputEnableG High. Addressesare latched  
on the fallingedgeof W or E whicheveroccurs last.  
Commandsand InputDataarelatchedontherising  
edge of W or E whichever occurs first.  
previously protected block can be temporarily un-  
protected in order to change stored data. The  
temporaryunprotectionmode is activatedby bring-  
ing RPNC to VID. During the temporary unprotec-  
tion mode the previously protected blocks are  
unprotected.A block can be selectedand data can  
be modified by executing the Erase or Program  
instruction with the RPNCsignal held atVID. When  
RPNC is returned to VIH, all the previously pro-  
tected blocks are again protected.  
Output Disable. The data outputsare high imped-  
ance when the Output Enable G is High with Write  
Enable W High.  
Block Unprotection. All protected blocks can be  
unprotected on programming equipment to allow  
updating of bit contents. All blocks must first be  
protectedbefore the unprotectionoperation.Block  
unprotectionis activated when A9, G and E are at  
VID and A12, A15 at VIH. The Block Unprotection  
algorithm is shown in Figure 15. Unprotection is  
initiatedby the edgeof Wfallingto VIL. Aftera delay  
of 10ms, the unprotection operation is ended by  
rising W to VIH. Unprotection verify is achieved by  
bringing G and E to VIL while A0 is at VIL, A6 and  
A1 are at VIH and A9 remains at VID. In these  
conditions,reading the output data will yield 00h if  
the block defined by the inputs A13-A17 has been  
succesfullyunprotected.Eachblockmustbe sepa-  
rately verified by giving its address in order to  
ensure that it has been unprotected.  
Standby. The memory is in standby when Chip  
Enable E is High and the P/E.C. is idle. The power  
consumption is reduced to the standby level and  
the outputs are high impedance, independent of  
the Output Enable G or Write Enable W inputs.  
Automatic Standby. After 150ns of bus inactivity  
and when CMOS levels are driving the addresses,  
the chip automatically enters a pseudo-standby  
mode whereconsumptionis reducedto the CMOS  
standby value, while outputs still drive the bus.  
Electronic Signature. Two codes identifying the  
manufacturerand the devicecan be read from the  
memory. These codes allow programming equip-  
ment or applications to automatically match their  
interface to the characteristics of the M29F002.  
The Electronic Signature is output by a Read op-  
erationwhenthe voltageappliedto A9 is at V and  
ID  
INSTRUCTIONS AND COMMANDS  
addressinput A1 is Low.Themanufacturercodeis  
output when the Address input A0 is Low and the  
devicecodewhen thisinput is High.OtherAddress  
inputs are ignored.  
The Command Interface latches commands writ-  
ten to the memory. Instructions are made up from  
one or more commands to perform Read Memory  
Array, ReadElectronic Signature,Read Block Pro-  
tection, Program, Block Erase, Chip Erase, Erase  
Suspend and Erase Resume. Commands are  
made of addressand data sequences.  
TheElectronic Signaturecan also be read, without  
raisingA9 to V , bygiving the memory the Instruc-  
ID  
tion AS.  
Block Protection. Each block can be separately  
protected against Program or Erase on program-  
ming equipment. Block protection provides addi-  
tional data security, as it disables all program or  
erase operations. This mode is activated when  
both A9 and G are raisedto VID and an address in  
the blockis appliedon A13-A17.TheBlockProtec-  
tion algorithm is shown in Figure 14. Block protec-  
tion is initiatedon the edgeof W fallingto VIL. Then  
after a delay of 100µs, the edge of W rising to VIH  
ends the protection operations. Block protection  
verify is achieved by bringing G, E, A0 and A6 to  
VIL and A1 to VIH, while W is at VIH and A9 at VID.  
Undertheseconditions,readingthedataoutput will  
yield 01h if the block defined by the inputs on  
A13-A17 is protected. Any attempt to program or  
erase a protected block will be ignored by the  
device.  
Table 7. Commands  
Hex Code  
00h  
Command  
Invalid/Reserved  
10h  
Chip Erase Confirm  
Reserved  
20h  
30h  
Block Erase Resume/Confirm  
Set-up Erase  
80h  
Read Electronic Signature/  
Block Protection Status  
90h  
A0h  
B0h  
F0h  
Program  
Erase Suspend  
Read Array/Reset  
Block Temporary Unprotection. This feature is  
available on M29F002T and M29F002B only. Any  
7/29  
M29F002T, M29F002NT, M29F002B  
Table 8. Instructions (1)  
Mne.  
Instr.  
Cyc.  
1st Cyc. 2nd Cyc. 3rd Cyc. 4th Cyc. 5th Cyc. 6th Cyc. 7th Cyc.  
Addr. (3,7)  
Data  
X
1+  
Read Memory Array until a new write cycle is initiated.  
Read/Reset  
RD (2,4)  
F0h  
Memory Array  
Addr. (3,7)  
555h  
AAh  
AAAh  
55h  
555h  
F0h  
Read Memory Array until a new write  
cycle is initiated.  
3+  
3+  
Data  
Addr. (3,7)  
555h  
AAAh  
555h  
Read Electronic Signature or Block  
Protection Status until a new write cycle  
is initiated. See Note 5 and 6.  
AS (4) Auto Select  
Data  
AAh  
55h  
90h  
Program  
Address  
Addr. (3,7)  
555h  
AAAh  
555h  
Read Data Polling or Toggle  
Bit until Program completes.  
PG  
BE  
Program  
4
6
Program  
Data  
Data  
AAh  
55h  
A0h  
Block  
Additional  
Addr. (3,7)  
555h  
AAAh  
555h  
555h  
AAAh  
Address Block (8)  
Block Erase  
Chip Erase  
Data  
AAh  
555h  
AAh  
X
55h  
AAAh  
55h  
80h  
555h  
80h  
AAh  
555h  
AAh  
55h  
AAAh  
55h  
30h  
555h  
10h  
30h  
Addr. (3,7)  
CE  
ES (10)  
ER  
6
1
1
Note 9  
Data  
Addr. (3,7)  
Data  
Erase  
Suspend  
Read until Toggle stops, then read all the data needed from  
any Block(s) not being erased then Resume Erase.  
B0h  
X
Addr. (3,7)  
Erase  
Resume  
Read Data Polling or Toggle Bits until Erase completes or  
Erase is suspended another time  
Data  
30h  
Notes: 1. Commands not interpreted in this table will default to read array mode.  
2. Await of tPLYH is necessary after a Read/Reset command if the memory was in an Erase or Program mode  
before starting any new operation (see Table 14 and Figure 9).  
3. X = Don’t Care.  
4. The first cycles of the RD or AS instructions are followed by read operations. Any number of read cycles can occur after  
the command cycles.  
5. Signature Address bits A0,A1 at VIL willoutput Manufacturer code (20h). Address bits A0 at VIH and A1 at VIL will output  
Device code.  
6. Block Protection Address: A0 at VIL, A1 at VIH and A13-A17 within the Block will output the Block Protection status.  
7. For Coded cycles address inputs A12-A17are don’t care.  
8. Optional, additional Blocks addresses must be entered within the erase timeout delay after last write entry,  
timeout status can be verified through DQ3 value (see Erase Timer Bit DQ3 description).  
When full command is entered, read Data Polling or Togglebit until Erase is completed or suspended.  
9. Read Data Polling, Toggle bits or RB until Erase completes.  
10.During Erase Suspend, Read and Data Program functions are allowed in blocks not being erased.  
Theinstructions require from 1 to 6 cycles, the first  
or first three of which are always write operations  
usedtoinitiatethe instruction.Theyare followedby  
either further write cycles to confirm the first com-  
mand or executethe commandimmediately.Com-  
mand sequencing must be followed exactly. Any  
invalid combination of commands will reset the  
device to Read Array. The increased number of  
cycles has been chosen to assure maximum data  
security. Instructions are initialised by two initial  
Coded cycles which unlock the Command Inter-  
face.Inaddition,for Erase,instructionconfirmation  
is again preceded by the two Coded cycles.  
Status Register Bits  
P/E.C.status is indicatedduring executionby Data  
Polling on DQ7, detection of Toggle on DQ6 and  
DQ2, or Error on DQ5 and Erase Timer DQ3 bits.  
Any read attempt during Program or Erase com-  
mandexecutionwill automaticallyoutputthesefive  
StatusRegister bits. TheP/E.C. automaticallysets  
bits DQ2, DQ3, DQ5, DQ6 and DQ7. Other bits  
(DQ0, DQ1 and DQ4) are reserved for future use  
and should be masked. See Tables 9 and 10.  
8/29  
M29F002T, M29F002NT, M29F002B  
Table 9. Status Register Bits  
DQ  
Name  
Logic Level  
Definition  
Note  
Erase Complete or erase  
block in Erase Suspend  
’1’  
’0’  
Indicates the P/E.C. status, check during  
Program or Erase, and on completion  
before checking bits DQ5 for Program or  
Erase Success.  
Erase On-going  
Data  
Polling  
7
Program Complete or data  
of non erase block during  
Erase Suspend  
DQ  
DQ  
Program On-going  
’-1-0-1-0-1-0-1-’ Erase or Program On-going  
Successive reads output complementary  
data on DQ6 while Programming or Erase  
operations are on-going. DQ6 remains at  
constant level when P/E.C. operations are  
completed or Erase Suspend is  
DQ  
Program Complete  
6
Toggle Bit  
Erase Complete or Erase  
’-1-1-1-1-1-1-1-’ Suspend on currently  
addressed block  
acknowledged.  
’1’  
’0’  
Program or Erase Error  
This bit is set to ’1’ in the case of  
Programming or Erase failure.  
5
4
Error Bit  
Program or Erase On-going  
Reserved  
P/E.C. Erase operation has started. Only  
possible command entry is Erase Suspend  
(ES).  
’1’  
’0’  
Erase Timeout Period Expired  
Erase  
Time Bit  
3
Erase Timeout Period  
On-going  
An additional block to be erased in parallel  
can be entered to the P/E.C.  
Chip Erase, Erase or Erase  
Suspend on the currently  
addressed block.  
Erase Error due to the  
currently addressed block  
(when DQ5 = ’1’).  
’-1-0-1-0-1-0-1-’  
Indicates the erase status and allows to  
identify the erased block  
2
Toggle Bit  
Program on-going, Erase  
on-going on another block or  
Erase Complete  
1
Erase Suspend read on  
non Erase Suspend block  
DQ  
1
0
Reserved  
Reserved  
Notes: Logic level ’1’ is High, ’0’ is Low. -0-1-0-0-0-1-1-1-0- represent bit value in successive Read operations.  
Data Polling Bit (DQ7). When Programming op-  
erations are in progress, this bit outputs the com-  
plement of the bit being programmed on DQ7.  
During Erase operation, it outputsa 0’. After com-  
pletion of the operation, DQ7 will output the bit last  
programmed or a ’1’ after erasing. Data Polling is  
valid and only effective during P/E.C. operation,  
that is after the fourth W pulse for programmingor  
after the sixth W pulse for erase. It must be per-  
formed at the address being programmed or at an  
address within the block being erased. If all the  
blocks selectedfor erasureare protected,DQ7 will  
be set to ’0’ for about 100µs, and then return to the  
previous addressed memory data value.  
9/29  
M29F002T, M29F002NT, M29F002B  
Table 10. Polling and Toggle Bits  
identify the block being erased. During Erase or  
Erase Suspend a read from a block being erased  
will cause DQ2 to toggle. A read from a block not  
being erased will set DQ2 to ’1’ during erase and  
to DQ2 during Erase Suspend. During Chip Erase  
a read operation will cause DQ2 to toggle as all  
blocks are being erased. DQ2 will be set to ’1’  
during program operation and when erase is com-  
plete. After erase completion and if the error bit  
DQ5 is set to ’1’, DQ2 will toggle if the faulty block  
is addressed.  
Mode  
DQ7  
DQ7  
0
DQ6  
DQ2  
Program  
Erase  
Toggle  
1
Toggle Note 1  
Erase Suspend Read  
(in Erase Suspend  
block)  
1
1
Toggle  
Erase Suspend Read  
(outside Erase Suspend  
block)  
DQ7  
DQ7  
DQ6  
DQ2  
N/A  
Error Bit (DQ5). This bit is set to ’1’ by the P/E.C.  
when there is a failure of programming, block  
erase, or chip erase that results in invalid data in  
thememoryblock.In caseof anerrorin blockerase  
or program,the block in which the error occured or  
to which the programmed data belongs, must be  
discarded. The DQ5 failure condition will also ap-  
pear if a usertries to programa 1’ toa locationthat  
is previously programmedto ’0’. OtherBlocks may  
stillbe used.Theerrorbit resetsaftera Read/Reset  
(RD) instruction. In case of success of Program or  
Erase, the error bit will be set to ’0’ .  
Erase Suspend Program  
Toggle  
Note: 1. Toggle if the address is within a block being erased.  
’1’ if the address is within a block not being erased.  
See Figure 11 for the Data Polling flowchart and  
Figure 10 for the Data Polling waveforms.DQ7 will  
also flag the Erase Suspend mode by switching  
from ’0’ to ’1’ at the start of the Erase Suspend. In  
order to monitor DQ7 in the Erase Suspend mode  
an address within a block being erased must be  
provided. For a Read Operationin Erase Suspend  
mode, DQ7 will output ’1’ if the read is attempted  
ona blockbeingerasedand thedatavalueon other  
blocks. During Program operation in Erase Sus-  
pend Mode, DQ7 will have the same behaviour as  
in the normal program execution outside of the  
suspend mode.  
Erase Timer Bit (DQ3). This bit is set to ’0’ by the  
P/E.C. when the last block Erase command has  
been entered to the Command Interface and it is  
awaiting the Erase start. When the erase timeout  
periodis finished,after 50µs to120µs, DQ3returns  
to ’1’.  
Coded Cycles  
The two Coded cycles unlock the Command Inter-  
face. They are followed by an input command or a  
confirmation command. The Coded cycles consist  
of writing the data AAh at address 555h during the  
first cycle. During the second cycle the Coded  
cycles consist of writing the data 55h at address  
AAAh. Theaddresslines A0 to A11are valid,other  
address lines are ’don’t care’. The Coded cycles  
happenon firstand secondcyclesof thecommand  
write or on the fourth and fifth cycles.  
Toggle Bit (DQ6). WhenProgramming or Erasing  
operationsare in progress,successiveattemptsto  
readDQ6willoutputcomplementarydata. DQ6will  
toggle following toggling of either G, or E when G  
is low. The operationis completed when two suc-  
cessivereads yieldthe same output data.Thenext  
readwill outputthe bitlastprogrammedora 1after  
erasing. The toggle bit DQ6 is valid only during  
P/E.C. operations, that is after the fourth W pulse  
for programming or after the sixth W pulse for  
Erase. If the blocks selected for erasure are pro-  
Instructions  
tected, DQ6 will toggle for about 100 s and then  
µ
See Table 8.  
returnback toRead. DQ6will be setto ’1if a Read  
operationis attemptedon anEraseSuspendblock.  
When erase is suspended DQ6 will toggle during  
programming operations in a blockdifferent to the  
block in Erase Suspend.Either E or G toggling will  
cause DQ6 to toggle. See Figure 12 for Toggle Bit  
flowchart and Figure 13 for ToggleBit waveforms.  
Read/Reset (RD) Instruction. The Read/Reset  
instruction consists of one write cycle giving the  
commandF0h.It canbe optionallyprecededbythe  
twoCodedcycles.Subsequentreadoperationswill  
read the memory array addressed and output the  
data read. A wait state of 10 s is necessaryafter  
µ
Read/Reset prior to any valid read if the memory  
was in an Erase mode when the RD instruction is  
given.  
Toggle Bit (DQ2). This toggle bit, together with  
DQ6, can be used to determine the device status  
duringthe Erase operations.It can also be usedto  
10/29  
M29F002T, M29F002NT, M29F002B  
Table 11. AC MeasurementConditions  
High Speed  
10ns  
Standard  
Input Rise and Fall Times  
10ns  
Input Pulse Voltages  
0 to 3V  
1.5V  
0.45V to 2.4V  
0.8V and 2V  
Input and Output Timing Ref. Voltages  
Figure 4. AC Testing Input Output Waveform  
Figure 5. AC Testing Load Circuit  
1.3V  
High Speed  
1N914  
3V  
1.5V  
3.3k  
0V  
DEVICE  
UNDER  
TEST  
OUT  
Standard  
C
L
2.4V  
2.0V  
0.8V  
0.45V  
C
C
C
= 30pF for High Speed  
= 100pF for Standard  
includes JIG capacitance  
L
L
L
AI01275B  
AI01276B  
Table 12. Capacitance(1) (T = 25 C, f = 1 MHz )  
°
A
Symbol  
CIN  
Parameter  
Input Capacitance  
Output Capacitance  
Test Condition  
VIN = 0V  
Min  
Max  
6
Unit  
pF  
COUT  
VOUT = 0V  
12  
pF  
Note: 1. Sampled only, not 100% tested.  
Auto Select (AS) Instruction. This instruction  
uses the two Coded cycles followed by one write  
cycle giving the command90h to address555h for  
commandset-up.Asubsequentread willoutputthe  
manufacturer code and the device code or the  
block protection status depending on the levels of  
A0 and A1. The manufacturercode, 20h, is output  
when the addresses lines A0 and A1 are Low, the  
devicecodeis outputwhen A0isHigh withA1 Low.  
Program (PG) Instruction. This instruction uses  
four write cycles. The Program command A0h is  
written to address555h on the third cycle after two  
Coded cycles. A fourth write operation latches the  
Addresson the falling edge of W or E and the Data  
to be written on the rising edge and starts the  
P/E.C.Read operationsoutput the StatusRegister  
bits after the programming has started. Memory  
programming is made only by writing ’0’ in place of  
’1’.StatusbitsDQ6 and DQ7determineif program-  
mingis on-goingand DQ5allowsverificationof any  
possible error. Programming at an address not in  
blocks being erased is also possible during erase  
suspend. In this case, DQ2 will toggle at the ad-  
dress being programmed.  
The AS instruction also allows access to the block  
protectionstatus.Aftergivingthe ASinstruction,A0  
is set to V with A1 at V , while A13-A17 define  
IL  
IH  
the address of the block to be verified. A read in  
these conditions will output a 01h if the block is  
protected and a 00h if the block is not protected.  
11/29  
M29F002T, M29F002NT, M29F002B  
Table 13. DC Characteristics  
(T = 0 to 70 C or –40 to 85 C; V = 5V 10%)  
°
°
±
A
CC  
Symbol  
Parameter  
Test Condition  
0V VIN VCC  
0V VOUT VCC  
RPNC = VCC  
Min  
Max  
±1  
Unit  
µA  
(2)  
ILI  
Input Leakage Current  
Output Leakage Current  
ILO  
±1  
µA  
ILR1  
ILR2  
ICC1  
ICC2  
ICC3  
RPNC Leakage Current High  
RPNC Leakage Current Low  
Supply Current (Read) TTL Byte  
Supply Current (Standby) TTL  
Supply Current (Standby) CMOS  
±1  
µA  
RPNC = VSS  
–0.2  
–10  
20  
µA  
E = VIL, G = VIH, f = 6MHz  
E = VIH  
mA  
mA  
1
E = VCC 0.2V  
100  
A
µ
±
Byte program, Block or  
Chip Erase in progress  
(1)  
ICC4  
Supply Current (Program or Erase)  
20  
mA  
VIL  
VIH  
VOL  
Input Low Voltage  
–0.5  
2
0.8  
VCC + 0.5  
0.45  
V
V
V
V
V
V
Input High Voltage  
Output Low Voltage  
IOL = 5.8mA  
Output High Voltage TTL  
Output High Voltage CMOS  
A9, E, G, RPNC High Voltage  
A9, E, G, RPNC High Current  
IOH = –2.5mA  
2.4  
VCC –0.4V  
11.5  
VOH  
IOH = –100 A  
µ
VID  
IID  
12.5  
100  
A9, E, G or RPNC = VID  
A
µ
Supply Voltage(Erase and  
Program lock-out)  
VLKO  
3.2  
4.2  
V
Note: 1. Sampled only, not 100% tested.  
2. Except RPNC.  
Block Erase (BE) Instruction. This instruction  
uses a minimum of six write cycles. The Erase  
Set-upcommand80h is writtento address555hon  
third cycle after the two Coded cycles. The Block  
EraseConfirmcommand 30h is similarly writtenon  
the sixth cycle after another two Coded cycles.  
During the input of the second command an ad-  
dress within the block to be erased is given and  
latched into the memory. Additional block Erase  
Confirm commands and block addresses can be  
written subsequently to erase other blocks in par-  
allel, without further Coded cycles. The erase will  
start after the erase timeout period (see Erase  
Timer Bit DQ3 description). Thus, additionalErase  
Confirm commandsfor other blocks mustbe given  
within this delay. Theinput of a new EraseConfirm  
commandwillrestartthetimeoutperiod.Thestatus  
of the internal timer can be monitored through the  
level of DQ3, if DQ3 is ’0’ the Block Erase Com-  
mand has been given and the timeoutis running,if  
DQ3 is ’1’, the timeout has expired and the P/E.C.  
is erasing the Block(s). If the second command  
givenis not an erase confirmor if theCodedcycles  
are wrong, the instruction aborts,and thedevice is  
resetto Read Array. It is not necessaryto program  
the block with 00h as the P/E.C. will do this auto-  
maticallybeforeto erasingto FFh.Readoperations  
after the sixth rising edge of W or E output the  
status register status bits.  
Duringthe executionof theeraseby the P/E.C.,the  
memory accepts onlythe Erase Suspend ES and  
Read/Reset RD instructions. Data Polling bit DQ7  
returns ’0’ while the erasure is in progress and ’1’  
when it has completed. The Toggle bit DQ2 and  
DQ6 toggle during the erase operation. They stop  
when erase is completed. After completion the  
StatusRegisterbit DQ5returns1’ iftherehas been  
an erase failure. In such a situation, the Toggle bit  
DQ2 can be used to determine which block is not  
correctly erased. In the case of erase failure, a  
Read/ResetRDinstruction is necessaryin orderto  
reset the P/E.C.  
12/29  
M29F002T, M29F002NT, M29F002B  
Table 14. Read AC Characteristics  
(T = 0 to 70 C or –40 to 85 C)  
°
°
A
M29F002T / M29F002NT / M29F002B  
-70  
-90  
-120  
Symbol  
Alt  
Parameter  
Test Condition  
Unit  
VCC = 5V 10% V = 5V 10% V = 5V 10%  
±
±
±
CC  
CC  
Standard  
Interface  
Standard  
Interface  
Standard  
Interface  
Min  
Max  
Min  
Max  
Min  
Max  
Address Valid to  
Next Address Valid  
tAVAV  
tAVQV  
tRC  
tACC  
tLZ  
E = VIL, G = VIL  
E = VIL, G = VIL  
G = VIL  
70  
90  
120  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
Address Valid to  
Output Valid  
70  
90  
90  
35  
20  
20  
10  
120  
Chip Enable Low to  
Output Transition  
(1)  
tELQX  
0
0
0
Chip Enable Low to  
Output Valid  
(2)  
tELQV  
tCE  
G = VIL  
70  
30  
20  
20  
10  
120  
50  
30  
30  
10  
Output Enable Low  
to Output Transition  
(1)  
tGLQX  
tOLZ  
tOE  
E = VIL  
0
0
0
Output Enable Low  
to Output Valid  
(2)  
tGLQV  
E = VIL  
Chip Enable High to  
Output Transition  
tEHQX  
tOH  
G = VIL  
0
0
0
Chip Enable High to  
Output Hi-Z  
(1)  
tEHQZ  
tHZ  
G = VIL  
Output Enable High  
to Output Transition  
tGHQX  
tOH  
E = VIL  
0
0
0
Output Enable High  
to Output Hi-Z  
(1)  
tGHQZ  
tDF  
E = VIL  
Address Transition  
to Output Transition  
tAXQX  
tOH  
E = VIL, G = VIL  
0
0
0
RPNC Low to Read  
Mode  
(1,3)  
tPLEL  
tREADY  
s
µ
RPNC High to Chip  
Enable Low  
tPHEL  
tPLPX  
tRSP  
50  
50  
50  
ns  
ns  
tRP RPNC Pulse Width  
500  
500  
500  
Notes: 1. Sampled only, not 100% tested.  
2. G may be delayed by up to tELQV - tGLQV afterthe falling edge of E without increasing tELQV  
3. To be considered only if the Reset pulse is given while the memory is in Erase mode.  
.
13/29  
M29F002T, M29F002NT, M29F002B  
Figure 6. Read Mode AC Waveforms  
14/29  
M29F002T, M29F002NT, M29F002B  
Table 15. Write AC Characteristics,Write Enable Controlled  
(T = 0 to 70 C or –40 to 85 C)  
°
°
A
M29F002T / M29F002NT / M29F002B  
-70  
-90  
-120  
Symbol  
Alt  
Parameter  
Unit  
VCC = 5V 10% VCC = 5V 10% VCC = 5V 10%  
±
±
±
Standard  
Interface  
Standard  
Interface  
Standard  
Interface  
Min  
Max  
Min  
Max  
Min  
Max  
Address Validto Next Address  
Valid  
tAVAV  
tWC  
tCS  
tWP  
70  
0
90  
0
120  
0
ns  
ns  
Chip Enable Low to Write Enable  
Low  
tELWL  
Write Enable Low to Write Enable  
High  
tWLWH  
tDVWH  
tWHDX  
35  
30  
0
45  
45  
0
50  
50  
0
ns  
ns  
ns  
tDS Input Valid to Write Enable High  
Write Enable High to Input  
Transition  
tDH  
Write Enable High to Chip Enable  
High  
tWHEH  
tCH  
0
0
0
ns  
Write Enable High to Write Enable  
tWHWL  
tAVWL  
tWLAX  
tWPH  
Low  
20  
5
20  
5
20  
5
ns  
ns  
ns  
tAS Address Valid to Write Enable Low  
Write Enable Low to Address  
Transition  
tAH  
45  
45  
50  
Output Enable High to Write  
Enable Low  
tGHWL  
tVCHEL  
tWHGL  
0
50  
0
0
50  
0
0
50  
0
ns  
tVCS VCC High to Chip Enable Low  
s
µ
Write Enable High to Output  
Enable Low  
tOEH  
ns  
(1,2)  
tPHPHH  
tVIDR RPNC Rise Time to VID  
tRP RPNC Pulse Width  
500  
500  
500  
500  
500  
500  
ns  
ns  
tPLPX  
Notes: 1. Sample only, not 100% tested.  
2. This timing is for Temporary Block Unprotectionoperation.  
ChipErase(CE)Instruction.Thisinstructionuses  
six write cycles. The Erase Set-up command 80h  
is written to address 555h on the third cycle after  
the two Coded cycles. The Chip Erase Confirm  
command10h is similarly writtenon the sixth cycle  
after another two Coded cycles. If the second  
command given is not an erase confirm or if the  
Codedcycles arewrong, the instructionabortsand  
thedeviceis resettoReadArray.It is notnecessary  
toprogramthearray with00h first astheP/E.C. will  
automaticallydo thisbeforeerasingittoFFh. Read  
operations after the sixth rising edge of W or E  
output the Status Register bits. During the execu-  
tionof theeraseby the P/E.C.,DataPollingbit DQ7  
returns ’0’, then ’1’ on completion. The Toggle bits  
DQ2 and DQ6 toggle during erase operation and  
stopwhenerase is completed.Aftercompletionthe  
StatusRegisterbit DQ5returns1’ iftherehas been  
an Erase Failure.  
15/29  
M29F002T, M29F002NT, M29F002B  
Figure 7. Write AC Waveforms, W Controlled  
tAVAV  
VALID  
A0-A17  
tWLAX  
tAVWL  
tWHEH  
E
tELWL  
tWHGL  
G
tGHWL  
tWLWH  
W
tWHWL  
tWHDX  
tDVWH  
VALID  
DQ0-DQ7  
V
CC  
tVCHEL  
AI02083  
Note: Address are latched on the falling edge of W, Data is latched on the rising edge of W.  
Erase Suspend (ES) Instruction. The Block  
Eraseoperationmay be suspendedbythis instruc-  
tion which consists of writing the command B0h  
without any specific address. No Codedcycles are  
required. It permits reading of data from another  
block and programming in another block while an  
erase operation is in progress. Erase suspend is  
accepted only during the Block Erase instruction  
execution. Writing this command during Erase  
timeout will, in addition to suspending the erase,  
terminate the timeout. The Toggle bit DQ6 stops  
togglingwhentheP/E.C.is suspended.The Toggle  
bitswill stoptogglingbetween0.1µs and 15µs after  
the Erase Suspend (ES) command has been writ-  
ten. The device will then automatically be set to  
Read Memory Array mode. When erase is sus-  
pended, a Read from blocks being erased will  
output DQ2 toggling and DQ6 at ’1’. A Read from  
a blocknot being erasedreturnsvalid data. During  
suspension the memory will respond only to the  
Erase Resume ER and the Program PG instruc-  
tions. A Program operation can be initiated during  
erase suspend in one of the blocks not being  
erased. It will result in both DQ2 and DQ6 toggling  
whenthedatais beingprogrammed.ARead/Reset  
command will definitively abort erasure and result  
in invalid data in the blocks being erased.  
EraseResume(ER)Instruction. Ifan Erase Sus-  
pend instruction was previously executed, the  
erase operation may be resumed by giving the  
command 30h, at any address, and without any  
Coded cycles.  
POWER SUPPLY  
Power Up  
ThememoryCommandInterfaceis reset onpower  
up to Read Array. Either E or W must be tied to VIH  
during Power Up to allow maximum security and  
thepossibility to writea commandon the first rising  
edge of E and W. Any write cycle initiation is  
blocked when Vcc is below VLKO  
.
Supply Rails  
Normal precautionsmust be taken for supply volt-  
age decoupling; each device in a system should  
havethe VCC rail decoupledwith a 0.1µF capacitor  
close to the VCC and VSS pins. The PCB trace  
widths should be sufficient to carry the VCC pro-  
gram and erase currents required.  
16/29  
M29F002T, M29F002NT, M29F002B  
Table 16. Write AC Characteristics,Chip Enable Controlled  
(T = 0 to 70 C or –40 to 85 C)  
°
°
A
M29F002T / M29F002NT / M29F002B  
-70  
-90  
-120  
Symbol  
Alt  
Parameter  
Unit  
VCC = 5V 10% VCC = 5V 10% VCC = 5V 10%  
±
±
±
Standard  
Interface  
Standard  
Interface  
Standard  
Interface  
Min  
Max  
Min  
Max  
Min  
Max  
Address Valid to Next Address  
Valid  
tAVAV  
tWC  
tWS  
70  
0
90  
0
120  
0
ns  
ns  
Write Enable Low to Chip  
Enable Low  
tWLEL  
Chip Enable Low to Chip  
Enable High  
tELEH  
tDVEH  
tEHDX  
tCP  
tDS  
tDH  
35  
30  
5
45  
45  
5
50  
50  
5
ns  
ns  
ns  
Input Valid to Chip Enable High  
Chip Enable High to Input  
Transition  
Chip Enable High to Write  
Enable High  
tEHWH  
tEHEL  
tAVEL  
tELAX  
tWH  
0
0
20  
0
0
ns  
ns  
ns  
ns  
Chip Enable High to Chip  
Enable Low  
tCPH  
tAS  
20  
0
20  
0
Address Valid to Chip Enable  
Low  
Chip Enable Low to Address  
Transition  
tAH  
45  
45  
50  
Output Enable High Chip  
Enable Low  
tGHEL  
tVCHWL  
tEHGL  
0
50  
0
0
50  
0
0
50  
0
ns  
µs  
ns  
tVCS  
tOEH  
VCC High to Write Enable Low  
Chip Enable High to Output  
Enable Low  
(1,2)  
tPHPHH  
tVIDR  
tRP  
RPNC Rise TIme to VID  
RPNC Pulse Width  
500  
500  
500  
500  
500  
500  
ns  
ns  
tPLPX  
Notes: 1. Sample only, not 100% tested.  
2. This timing is for Temporary Block Unprotectionoperation.  
17/29  
M29F002T, M29F002NT, M29F002B  
Figure 8. Write AC Waveforms, E Controlled  
tAVAV  
VALID  
A0-A17  
tELAX  
tAVEL  
tEHWH  
W
tWLEL  
tEHGL  
G
tGHEL  
tELEH  
E
tEHEL  
tDVEH  
VALID  
tEHDX  
DQ0-DQ7  
V
CC  
tVCHWL  
AI02084  
Note: Address are latched on the fallingedge of E, Data is latchedon the rising edge of E.  
Figure 9. Read and Write AC Characteristics, RP Related  
E
tPHEL  
tPLPX  
RPNC  
tPHPHH  
tPLEL  
AI02085  
18/29  
M29F002T, M29F002NT, M29F002B  
Table 17. Data Polling and Toggle Bit AC Characteristics(1)  
(T = 0 to 70 C or –40 to 85 C)  
°
°
A
M29F002T / M29F002NT / M29F002B  
-70  
-90  
-120  
Sym-  
bol  
Alt  
Parameter  
Unit  
VCC = 5V 10% VCC = 5V 10% VCC = 5V 10%  
±
±
±
Standard  
Interface  
Standard  
Interface  
Standard  
Interface  
Min  
Max  
Min  
Max  
Min  
Max  
Write Enable High to DQ7 Valid  
(Program, W Controlled)  
10  
1.0  
10  
2400  
10  
1.0  
10  
2400  
10  
1.0  
10  
2400  
s
µ
tWHQ7V  
Write Enable High to DQ7 Valid  
(Chip Erase, W Controlled)  
30  
2400  
30  
30  
2400  
30  
30  
2400  
30  
sec  
µs  
Chip Enable High to DQ7 Valid  
(Program, E Controlled)  
tEHQ7V  
Chip Enable High to DQ7 Valid  
(Chip Erase, E Controlled)  
1.0  
1.0  
1.0  
sec  
ns  
Q7 Validto Output Valid (Data  
Polling)  
tQ7VQV  
30  
35  
50  
Write Enable High to Output  
Valid (Program)  
10  
1.0  
10  
2400  
30  
10  
1.0  
10  
2400  
30  
10  
1.0  
10  
2400  
30  
s
µ
tWHQV  
Write Enable High to Output  
Valid (Chip Erase)  
sec  
µs  
Chip Enable High to Output  
Valid (Program)  
2400  
30  
2400  
30  
2400  
30  
tEHQV  
Chip Enable High to Output  
Valid (Chip Erase)  
1.0  
1.0  
1.0  
sec  
Note: 1. All other timings are defined in Read AC Characteristics table.  
19/29  
M29F002T, M29F002NT, M29F002B  
Figure 10. DataPolling DQ7 AC Waveforms  
20/29  
M29F002T, M29F002NT, M29F002B  
Figure 12. Data Toggle Flowchart  
START  
Figure 11. DataPolling Flowchart  
START  
READ  
DQ2, DQ5 & DQ6  
READ DQ5 & DQ7  
at VALID ADDRESS  
NO  
DQ2, DQ6  
=
DQ7  
=
DATA  
YES  
TOGGLE  
NO  
YES  
NO  
NO  
DQ5  
= 1  
DQ5  
= 1  
YES  
YES  
READ DQ2, DQ6  
READ DQ7  
DQ7  
=
DATA  
YES  
NO  
DQ2, DQ6  
=
TOGGLE  
NO  
YES  
FAIL  
FAIL  
PASS  
PASS  
AI01369  
AI01873  
Table 18. Program, Erase Times and Program, Erase Endurance Cycles  
(T = 0 to 70 C)  
°
A
M29F002T / M29F002NT / M29F002B  
Parameter  
Unit  
Typical after  
100k W/E Cycles  
Min  
Typ  
Chip Erase (Preprogrammed)  
Chip Erase  
0.7  
2.4  
0.6  
0.5  
0.9  
1.0  
3.2  
11  
0.9  
2.5  
sec  
sec  
sec  
sec  
sec  
sec  
sec  
Boot Block Erase  
Parameter Block Erase  
Main Block (32Kb) Erase  
Main Block (64Kb) Erase  
Chip Program (Byte)  
Byte Program  
3.2  
11  
s
µ
Program/Erase Cycles (per Block)  
100,000  
cycles  
21/29  
M29F002T, M29F002NT, M29F002B  
Figure 13. DataToggle DQ6, DQ2 AC Waveforms  
22/29  
M29F002T, M29F002NT, M29F002B  
Figure 14. Block Protection Flowchart  
START  
BLOCK ADDRESS  
on A13-A17  
W = V  
IH  
Set-up  
n = 0  
G, A9 = V  
E = V  
,
ID  
IL  
Wait 4µs  
W = V  
IL  
Protect  
Verify  
Wait 100µs  
W = V  
IH  
E, G = V  
IH  
VERIFY BLOCK PROTECTION  
A0, A6 = V ; A1 = V ; A9 = V  
ID  
IL  
IH  
A13-A17 IDENTIFY BLOCK  
E = V  
IL  
Wait 4µs  
G = V  
IL  
Wait 60ns  
VERIFY BLOCK  
PROTECT STATUS  
NO  
DATA  
=
01h  
YES  
A9 = V  
IH  
++n  
NO  
= 25  
PASS  
YES  
A9 = V  
IH  
FAIL  
AI02088B  
23/29  
M29F002T, M29F002NT, M29F002B  
Figure 15. All Blocks Unprotecting Flowchart  
START  
PROTECT  
ALL BLOCKS  
n = 0  
Set-up  
W = V  
IH  
E, G, A9 = V  
ID  
A12, A15 = V  
IH  
Wait 4µs  
W = V  
IL  
Wait 10ms  
Unprotect  
Verify  
W = V  
IH  
E, G = V  
IH  
E, A0 = V ; A1, A6 = V ; A9 = V  
ID  
IL  
IH  
A13-A17 IDENTIFY BLOCK  
NEXT  
BLOCK  
Wait 4µs  
G = V  
IL  
Wait 60ns  
VERIFY BLOCK  
PROTECT STATUS  
NO  
YES  
DATA  
=
00h  
NO  
++n  
= 1000  
LAST  
BLK.  
NO  
YES  
YES  
A9 = V  
IH  
A9 = V  
IH  
FAIL  
PASS  
AI02089C  
24/29  
M29F002T, M29F002NT, M29F002B  
ORDERING INFORMATION SCHEME  
Example:  
M29F002T  
-70  
X
K
1
TR  
Operating Voltage  
Option  
F
5V  
TR Tape & Reel  
Packing  
Array Matrix  
Top Boot  
Speed  
-70 70ns  
Power Supplies  
blank VCC 10%  
Package  
PDIP32  
PLCC32  
Temp. Range  
0 to 70 C  
T
B
P
K
N
1
6
±
°
Bottom Boot  
-90 90ns  
X
VCC 5%  
–40 to 85 C  
°
±
NT Top Boot  
without  
-120 120ns  
TSOP32  
(8 x 20 mm)  
RPNC function  
Devices are shipped from the factory with the memory content erased (to FFh).  
Fora list ofavailableoptions(Speed, Package,etc...)or for furtherinformationon anyaspect of thisdevice,  
please contact the STMicroelectronics Sales Office nearest to you.  
25/29  
M29F002T, M29F002NT, M29F002B  
PDIP32 - 32 pin Plastic DIP, 600 mils width  
mm  
Min  
inches  
Min  
Symb  
Typ  
Max  
5.08  
Typ  
Max  
0.200  
A
A1  
A2  
B
0.38  
3.56  
0.38  
0.015  
0.140  
0.015  
4.06  
0.51  
0.160  
0.020  
B1  
C
1.52  
0.060  
0.20  
41.78  
0.30  
42.04  
0.008  
1.645  
0.012  
1.655  
D
D2  
E
38.10  
15.24  
1.500  
0.600  
E1  
e1  
eA  
eB  
L
13.59  
13.84  
0.535  
0.545  
2.54  
0.100  
0.600  
15.24  
15.24  
3.18  
1.78  
0°  
17.78  
3.43  
2.03  
10°  
0.600  
0.125  
0.070  
0°  
0.700  
0.135  
0.080  
10°  
S
α
N
32  
32  
A2  
A
A1  
e1  
L
α
C
B1  
B
eA  
eB  
D2  
D
S
N
1
E1  
E
PDIP  
Drawing is not to scale.  
26/29  
M29F002T, M29F002NT, M29F002B  
PLCC32 - 32 lead Plastic Leaded Chip Carrier, rectangular  
mm  
Min  
2.54  
1.52  
inches  
Min  
0.100  
0.060  
Symb  
Typ  
Max  
3.56  
2.41  
0.38  
0.53  
0.81  
12.57  
11.56  
10.92  
15.11  
14.10  
13.46  
Typ  
Max  
0.140  
0.095  
0.015  
0.021  
0.032  
0.495  
0.455  
0.430  
0.595  
0.555  
0.530  
A
A1  
A2  
B
0.33  
0.66  
12.32  
11.35  
9.91  
14.86  
13.89  
12.45  
0.013  
0.026  
0.485  
0.447  
0.390  
0.585  
0.547  
0.490  
B1  
D
D1  
D2  
E
E1  
E2  
e
1.27  
0.89  
0.050  
0.035  
F
0.00  
0.25  
0.000  
0.010  
R
N
32  
32  
Nd  
Ne  
CP  
7
7
9
9
0.10  
0.004  
D
A1  
D1  
A2  
1 N  
B1  
e
Ne  
E1 E  
D2/E2  
F
B
0.51 (.020)  
1.14 (.045)  
Nd  
A
R
CP  
PLCC  
Drawing is not to scale.  
27/29  
M29F002T, M29F002NT, M29F002B  
TSOP32 - 32 lead Plastic Thin Small Outline, 8 x 20mm  
mm  
Min  
inches  
Min  
Symb  
Typ  
Max  
1.20  
0.15  
1.05  
0.27  
0.21  
20.20  
18.50  
8.10  
-
Typ  
Max  
0.047  
0.007  
0.041  
0.011  
0.008  
0.795  
0.728  
0.319  
-
A
A1  
A2  
B
0.05  
0.95  
0.15  
0.10  
19.80  
18.30  
7.90  
-
0.002  
0.037  
0.006  
0.004  
0.780  
0.720  
0.311  
-
C
D
D1  
E
e
0.50  
0.020  
L
0.50  
0.70  
0.020  
0.028  
0
°
5
°
0
°
5
°
α
N
32  
32  
CP  
0.10  
0.004  
A2  
1
N
e
E
B
N/2  
D1  
D
A
CP  
DIE  
C
TSOP-a  
A1  
α
L
Drawing is not to scale.  
28/29  
M29F002T, M29F002NT, M29F002B  
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences  
of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted  
by implicationor otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject to  
change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not  
authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.  
The ST logo is a registered trademark of STMicroelectronics.  
1998 STMicroelectronics - All Rights Reserved  
STMicroelectronics GROUP OF COMPANIES  
Australia - Brazil - Canada - China - France - Germany - Italy - Japan - Korea - Malaysia - Malta - Mexico - Morocco - The Netherlands -  
Singapore - Spain - Sweden - Switzerland - Taiwan - Thailand - United Kingdom - U.S.A.  
29/29  

M29F002T-70K1TR 相关器件

型号 制造商 描述 价格 文档
M29F002T-70K6 STMICROELECTRONICS 暂无描述 获取价格
M29F002T-70K6TR STMICROELECTRONICS 2 Mbit 256Kb x8, Boot Block Single Supply Flash Memory 获取价格
M29F002T-70K6TR NUMONYX Flash, 256KX8, 70ns, PQCC32, PLASTIC, LCC-32 获取价格
M29F002T-70N1TR STMICROELECTRONICS 2 Mbit 256Kb x8, Boot Block Single Supply Flash Memory 获取价格
M29F002T-70N1TR NUMONYX 暂无描述 获取价格
M29F002T-70N6TR STMICROELECTRONICS 2 Mbit 256Kb x8, Boot Block Single Supply Flash Memory 获取价格
M29F002T-70N6TR NUMONYX Flash, 256KX8, 70ns, PDSO32, 8 X 20 MM, PLASTIC, TSOP-32 获取价格
M29F002T-70P1TR STMICROELECTRONICS 2 Mbit 256Kb x8, Boot Block Single Supply Flash Memory 获取价格
M29F002T-70P6TR STMICROELECTRONICS 2 Mbit 256Kb x8, Boot Block Single Supply Flash Memory 获取价格
M29F002T-70XK1TR STMICROELECTRONICS 2 Mbit 256Kb x8, Boot Block Single Supply Flash Memory 获取价格

M29F002T-70K1TR 相关文章

  • Bourns 密封通孔金属陶瓷微调电位计产品选型手册(英文版)
    2024-09-20
    6
  • Bourns 精密环境传感器产品选型手册(英文版)
    2024-09-20
    9
  • Bourns POWrTher 负温度系数(NTC)热敏电阻手册 (英文版)
    2024-09-20
    8
  • Bourns GMOV 混合过压保护组件产品选型手册(英文版)
    2024-09-20
    6