M29F002T-70K1TR
更新时间:2024-09-18 02:34:05
描述:2 Mbit 256Kb x8, Boot Block Single Supply Flash Memory
M29F002T-70K1TR 概述
2 Mbit 256Kb x8, Boot Block Single Supply Flash Memory 2兆位256Kb的X8 ,引导块单电源闪存
M29F002T-70K1TR 数据手册
通过下载M29F002T-70K1TR数据手册来全面了解它。这个PDF文档包含了所有必要的细节,如产品概述、功能特性、引脚定义、引脚排列图等信息。
PDF下载M29F002T, M29F002NT
M29F002B
2 Mbit (256Kb x8, Boot Block) Single Supply Flash Memory
5V ± 10% SUPPLYVOLTAGEfor PROGRAM,
ERASE and READ OPERATIONS
FASTACCESS TIME: 70ns
FAST PROGRAMMING TIME: 10µs typical
PROGRAM/ERASE CONTROLLER (P/E.C.)
– Program Byte-by-Byte
32
– Status Register bits
MEMORY BLOCKS
1
PLCC32 (K)
PDIP32 (P)
– Boot Block (Top or Bottom location)
– Parameterand Main blocks
BLOCK, MULTI-BLOCK and CHIP ERASE
MULTI-BLOCKPROTECTION/TEMPORARY
UNPROTECTION MODES
ERASE SUSPEND and RESUME MODES
– Read and Program another Block during
Erase Suspend
TSOP32 (N)
8 x 20mm
LOW POWER CONSUMPTION
– Stand-byand AutomaticStand-by
100,000 PROGRAM/ERASE CYCLES per
BLOCK
20 YEARSDATARETENTION
– Defectivity below 1ppm/year
ELECTRONIC SIGNATURE
– ManufacturerCode: 20h
Figure 1. Logic Diagram
V
CC
– Device Code, M29F002T: B0h
– Device Code, M29F002NT: B0h
– Device Code, M29F002B: 34h
18
8
A0-A17
DQ0-DQ7
DESCRIPTION
W
The M29F002 is a non-volatile memory that may
be erased electrically at the block or chiplevel and
programmed in-system on a Byte-by-Byte basis
usingonlyasingle5VVCC supply.ForProgramand
Erase operations the necessary high voltages are
generated internally. The device can also be pro-
grammed in standardprogrammers.
M29F002T
M29F002B
M29F002NT
E
G
(*) RPNC
The array matrix organisationallows each block to
be erased and reprogrammed without affecting
other blocks. Blocks can be protectedagainst pro-
graming and erase on programming equipment,
and temporarily unprotected to make changes in
the application. Each block can be programmed
and erased over 100,000 cycles.
V
SS
AI02078C
Note: * RPNC function is not available for the M29F002NT
July 1998
1/29
M29F002T, M29F002NT, M29F002B
Figure 2A. DIP Pin Connections
Figure 2B. LCC Pin Connections
(*) RPNC
A16
A15
A12
A7
1
2
3
4
5
6
7
8
9
32
31
V
CC
W
30 A17
29 A14
28 A13
27 A8
1 32
A7
A14
A13
A8
A6
A6
A5
A5
26 A9
M29F002T
M29F002B
M29F002NT
A4
25 A11
A4
A9
M29F002T
M29F002B
A3
24
23 A10
22
G
A3
A2
9
25 A11
G
A2 10
A1 11
E
A1
A10
E
A0 12
21 DQ7
20 DQ6
19 DQ5
18 DQ4
17 DQ3
A0
DQ0 13
DQ1 14
DQ2 15
DQ0
DQ7
17
V
16
SS
AI02079C
AI02080C
Note: Pin 1 is not connected for the M29F002NT
Figure 2C. TSOP Pin Connections
Table 1. Signal Names
A0-A17
DQ0-DQ7
E
Address Inputs
Data Input/Outputs, Command Inputs
Chip Enable
A11
A9
1
32
G
A10
E
G
Output Enable
A8
A13
A14
A17
W
DQ7
DQ6
DQ5
DQ4
DQ3
W
Write Enable
RPNC (*)
VCC
Reset / Block Temporary Unprotect
Supply Voltage
V
8
9
25
24
M29F002T
M29F002B
CC
V
SS
RPNC
A16
VSS
Ground
DQ2
DQ1
DQ0
A0
A15
A12
A7
DESCRIPTION (cont’d)
Instructions for Read/Reset, Auto Select for read-
ing the Electronic Signature or Block Protection
status,Programming, BlockandChip Erase,Erase
Suspend and Resume are written to the device in
cyclesofcommandstoa CommandInterfaceusing
standardmicroprocessor write timings. The device
is offeredin PLCC32,PDIP32and TSOP32(8 x 20
mm) packages.
A6
A1
A5
A2
A4
16
17
A3
AI02361B
2/29
M29F002T, M29F002NT, M29F002B
Table 2. Absolute Maximum Ratings (1)
Symbol
TA
Parameter
Value
–40 to 125
–50 to 125
–65 to 150
–0.6 to 7
Unit
°C
°C
°C
V
Ambient Operating Temperature (3)
Temperature Under Bias
Storage Temperature
TBIAS
TSTG
(2)
VIO
Input or Output Voltages
Supply Voltage
VCC
–0.6 to 7
V
(2)
V(A9, E, G, RPNC)
A9, E, G, RPNC Voltage
–0.6 to 13.5
V
Notes: 1. Except for the rating ”Operating Temperature Range”, stresses above those listed in the Table ”AbsoluteMaximum Ratings”
may cause permanent damage to the device. These are stress ratings only and operation of the device at these or any other
conditions above those indicated in the Operating sections of this specification is not implied. Exposure to Absolute Maximum
Rating conditions for extended periods may affect device reliability. Refer also to the STMicroelectronics SURE Program and other
relevant quality documents.
2. Minimum Voltagemay undershoot to –2V during transitionand for less than 20ns.
3. Depends on range.
Organisation
from or program to any block not being ersased,
and then resumed.Block protection providesaddi-
tional data security. Each block can be separately
protectedor unprotectedagainstProgramor Erase
on programming equipment. All previously pro-
tectedblockscan be temporarilyunprotectedin the
application.
The M29F002 is organised as 256K x 8. Memory
control is provided by Chip Enable E, Output En-
able G and Write Enable W inputs.
A Reset/Block Temporary Unprotection RPNC
(NOTavailable on M29F002NT) tri-level input pro-
videsa hardwareresetwhenpulledLow,andwhen
held High (at VID) temporarily unprotects blocks
previously protected allowing them to be progra-
med and erased. Erase and Program operations
are controlled by an internal Program/Erase Con-
troller(P/E.C.).StatusRegisterdataoutputon DQ7
provides a Data Pollingsignal, and DQ6 and DQ2
provide Toggle signals to indicate the state of the
P/E.C operations.
Bus Operations
The following operations can be performed using
theappropriatebus cycles:Read(Array, Electronic
Signature, Block Protection Status), Write com-
mand, Output Disable, Standby,Reset, Block Pro-
tection, Unprotection, Protection Verify,
Unprotection Verify and Block Temporary Unpro-
tection. See Tables4 and 5.
Memory Blocks
Command Interface
The devices feature asymmetricallyblocked archi-
tecture providing system memory integration. The
M29F002has an arrayof 7blocks, one Boot Block
of 16 KBytes, two Parameter Blocks of 8 KBytes,
oneMainBlockof 32KBytesandthreeMainBlocks
of 64 KBytes.
Instructions, made up of commands written in cy-
cles, can be given to the Program/EraseController
through a Command Interface (C.I.). For added
data protection,program or erase execution starts
after4 or6 cycles.The first,second,fourthand fifth
cycles are used to input Coded cycles to the C.I.
This Coded sequence is the same for all Pro-
gram/Erase Controller instructions. The ’Com-
mand’ itself and its confirmation, when applicable,
are given on the third, fourth or sixth cycles. Any
incorrect command or any improper command se-
quencewill reset the device to Read Array mode.
Thememory map is shownin Figure3. Eachblock
can be erased separately, any combination of
blockscan be specifiedfor multi-blockerase or the
entire chip may be erased. The Erase operations
aremanagedautomaticallybythe P/E.C.Theblock
eraseoperationcan be suspendedin orderto read
3/29
M29F002T, M29F002NT, M29F002B
Figure 3. Memory Map and Block Address Table
M29F002T, M29F002NT
3FFFFh
M29F002B
3FFFFh
16K BOOT BLOCK
64K MAIN BLOCK
64K MAIN BLOCK
64K MAIN BLOCK
32K MAIN BLOCK
8K PARAMETER BLOCK
8K PARAMETER BLOCK
16K BOOT BLOCK
3C000h
3BFFFh
30000h
2FFFFh
8K PARAMETER BLOCK
3A000h
39FFFh
20000h
1FFFFh
8K PARAMETER BLOCK
38000h
37FFFh
10000h
0FFFFh
32K MAIN BLOCK
30000h
2FFFFh
08000h
07FFFh
64K MAIN BLOCK
20000h
1FFFFh
06000h
05FFFh
64K MAIN BLOCK
10000h
0FFFFh
04000h
03FFFh
64K MAIN BLOCK
00000h
00000h
AI02081C
Table 3A. M29F002T, M29F002NTBlock Address Table
Address Range
00000h-0FFFFh
10000h-1FFFFh
20000h-2FFFFh
30000h-37FFFh
38000h-39FFFh
3A000h-3BFFFh
3C000h-3FFFFh
A17
0
A16
0
A15
A14
X
A13
X
X
X
0
1
1
1
X
X
X
X
0
0
1
X
1
0
X
1
1
X
1
1
0
1
1
0
1
1
1
1
X
Table 3B. M29F002B Block Address Table
Address Range
00000h-03FFFh
04000h-05FFFh
06000h-07FFFh
08000h-0FFFFh
10000h-1FFFFh
20000h-2FFFFh
30000h-3FFFFh
A17
0
A16
0
A15
0
A14
0
A13
X
0
0
0
1
0
0
0
0
1
1
0
0
1
X
X
0
1
X
X
X
1
0
X
X
X
1
1
X
X
X
4/29
M29F002T, M29F002NT, M29F002B
Instructions
impedance when the chip is deselected or the
outputs are disabled and when RPNC is at a Low
level.
Seven instructions are defined to perform Read
Array,Auto Select(to readthe ElectronicSignature
or Block ProtectionStatus), Program, BlockErase,
Chip Erase, Erase Suspend and Erase Resume.
The internal P/E.C. automatically handles all tim-
ing and verification of the Program and Erase
operations.The Status Register Data Polling, Tog-
gle, Error bits may be read at any time, during
programming or erase, to monitor the progress of
the operation.
Chip Enable (E). The Chip Enable input activates
the memory control logic, input buffers, decoders
andsenseamplifiers.E Highdeselectsthememory
andreducesthe powerconsumptiontothestandby
level. E can also be used to control writing to the
command register and to the memory array, while
Wremainsat a low level. TheChip Enablemust be
forced to VID duringthe Block Unprotection opera-
tion.
Instructions are composed of up to six cycles. The
first two cycles input a Coded sequence to the
CommandInterfacewhich iscommontoall instruc-
tions (see Table 8). The third cycle inputs the
instruction set-up command. Subsequent cycles
outputthe addressed data, Electronic Signatureor
Block Protection Status for Read operations. In
orderto giveadditionaldata protection,the instruc-
tions for Programand Block or Chip Erase require
furthercommandinputs. ForaPrograminstruction,
the fourth command cycle inputs the address and
data to be programmed. For an Erase instruction
(Block or Chip), the fourth and fifth cycles input a
further Coded sequence before the Erase confirm
command on the sixth cycle. Erasure of a memory
blockmaybe suspended,in orderto readdatafrom
anotherblock or to programdata in another block,
and then resumed.
Output Enable (G). The Output Enable gates the
outputs through the data buffers during a read
operation. When G is High the outputs are High
impedance. G must be forced to VID level during
Block Protection and Unprotection operations.
WriteEnable (W). This inputcontrols writing to the
CommandRegisterand Addressand Datalatches.
Reset/Block Temporary Unprotect/No Connect
Input (RPNC). The RPNC (not available for the
M29F002NT) input provides hardware reset and
protected block(s) temporary unprotection func-
tions. In read or write mode, the RPNC pin can be
left open (Not Connected) or held at VIH. Reset of
the memory is acheived by pulling RPNC to VIL for
atleast 500ns.When the reset pulseis given,if the
memory is in Read or Standby modes, it will be
availablefor newoperationsin 50nsafter the rising
edge of RPNC. If the memory is in Erase, Erase
Suspend or Program modes the reset will take
10µs.Ahardwareresetduringan Eraseor Program
operation will corrupt the data being programmed
or the sector(s) being erased.
When power is first applied or if VCC falls below
VLKO, the command interface is reset to Read
Array.
SIGNAL DESCRIPTIONS
Temporary block unprotection is made by holding
RPNC at VID. Inthis conditionpreviously protected
blocks can be programmed or erased. The transi-
tion of RPNC from VIH to VID must slower than
500ns. When RPNC is returnedfrom VID to VIH all
blocks temporarily unprotected will be again pro-
tected.
See Figure 1 and Table1.
Address Inputs (A0-A17). The address inputs for
the memory array are latchedduring a write opera-
tion on the falling edge of Chip Enable E or Write
EnableW. When A9 is raisedto VID, eithera Read
ElectronicSignatureManufacturerorDeviceCode,
BlockProtectionStatus or a WriteBlock Protection
or Block Unprotectionis enableddependingon the
combinationof levelson A0, A1, A6, A12 and A15.
VCC Supply Voltage. The power supply for all
operations (Read, Program and Erase).
VSS Ground. VSS is the reference for all voltage
measurements.
Data Input/Outputs (DQ0-DQ7). Theinput is data
to be programmed in the memory array or a com-
mand to be written to the C.I. Both are latched on
the rising edge of Chip Enable E or Write Enable
W. The output is data from the Memory Array, the
Electronic Signature Manufacturer or Device
codes, the Block Protection Status or the Status
register Data Polling bit DQ7, the ToggleBits DQ6
and DQ2, the Error bit DQ5 or the Erase Timer bit
DQ3. Outputs are valid when Chip Enable E and
Output Enable G are active. The output is high
DEVICE OPERATIONS
See Tables 4, 5 and 6.
Read. Read operations are used to output the
contents of the Memory Array, the Electronic Sig-
nature,the Status Register or the BlockProtection
Status. Both Chip Enable E and Output Enable G
must be low in order to read the output of the
memory.
5/29
M29F002T, M29F002NT, M29F002B
Table 4. User Bus Operations (1)
Operation
Read Byte
E
G
VIL
VIH
VIH
X
W
VIH
VIL
VIH
X
RPNC (6)
VIH/NC(5)
VIH/NC(5)
VIH/NC(5)
VIH/NC(5)
VIL
A0
A0
A0
X
A1
A1
A1
X
A6
A6
A6
X
A9
A9
A9
X
A12
A12
A12
X
A15
A15
A15
X
DQ0-DQ7
Data Output
Data Input
Hi-Z
VIL
VIL
VIL
VIH
X
Write Byte
Output Disable
Standby
X
X
X
X
X
X
Hi-Z
Reset (6)
X
X
X
X
X
X
X
X
Hi-Z
Block
VIL
VID VIL Pulse VIH/NC(5)
VID VIL Pulse VIH/NC(5)
X
X
X
X
X
X
VID
VID
X
X
X
X
Protection(2,4)
Blocks
VID
VIH
VIH
Unprotection(4)
Block
Block Protect
Status (3)
Protection
VIL
VIL
X
VIL
VIL
X
VIH
VIH
X
VIH/NC(5)
VIH/NC(5)
VID
VIL
VIL
X
VIH
VIH
X
VIL
VIH
X
VID
VID
X
A12
A12
X
A15
A15
X
Verify(2,4)
Block
Block Protect
Status (3)
Unprotection
Verify(2,4)
Block
Temporary
X
Unprotection (6)
Notes: 1. X = VIL or VIH
2. Block Address must be given on A13-A17 bits.
3. See Table 6.
4. Operation performed on programming equipment.
5. RPNC can be held at VIH or left open (Not Connected).
6. Not Available on M29F002NT.
Table 5. Read Electronic Signature (following AS instruction or with A9 = VID)
Other
Code
Device
E
G
W
A0
VIL
VIH
VIH
A1
VIL
VIL
VIL
DQ0 - DQ7
20h
Addresses
Manufact. Code
VIL
VIL
VIL
VIL
VIL
VIL
VIH
VIH
VIH
Don’t Care
Don’t Care
Don’t Care
M29F002T
M29F002NT
B0h
Device Code
M29F002B
34h
Table 6. Read Block Protection with AS Instruction
Other
Addresses
Code
E
G
W
A0
A1
A13 - A17
DQ0 - DQ7
Protected Block
VIL
VIL
VIL
VIL
VIH
VIH
VIL
VIL
VIH
VIH
Block Address
Block Address
Don’t Care
Don’t Care
01h
00h
Unprotected Block
6/29
M29F002T, M29F002NT, M29F002B
Write. Writeoperationsareusedto giveInstruction
Commands to the memory or to latch input data to
be programmed.Awrite operationis initiatedwhen
Chip Enable E is Low and Write Enable W is Low
with OutputEnableG High. Addressesare latched
on the fallingedgeof W or E whicheveroccurs last.
Commandsand InputDataarelatchedontherising
edge of W or E whichever occurs first.
previously protected block can be temporarily un-
protected in order to change stored data. The
temporaryunprotectionmode is activatedby bring-
ing RPNC to VID. During the temporary unprotec-
tion mode the previously protected blocks are
unprotected.A block can be selectedand data can
be modified by executing the Erase or Program
instruction with the RPNCsignal held atVID. When
RPNC is returned to VIH, all the previously pro-
tected blocks are again protected.
Output Disable. The data outputsare high imped-
ance when the Output Enable G is High with Write
Enable W High.
Block Unprotection. All protected blocks can be
unprotected on programming equipment to allow
updating of bit contents. All blocks must first be
protectedbefore the unprotectionoperation.Block
unprotectionis activated when A9, G and E are at
VID and A12, A15 at VIH. The Block Unprotection
algorithm is shown in Figure 15. Unprotection is
initiatedby the edgeof Wfallingto VIL. Aftera delay
of 10ms, the unprotection operation is ended by
rising W to VIH. Unprotection verify is achieved by
bringing G and E to VIL while A0 is at VIL, A6 and
A1 are at VIH and A9 remains at VID. In these
conditions,reading the output data will yield 00h if
the block defined by the inputs A13-A17 has been
succesfullyunprotected.Eachblockmustbe sepa-
rately verified by giving its address in order to
ensure that it has been unprotected.
Standby. The memory is in standby when Chip
Enable E is High and the P/E.C. is idle. The power
consumption is reduced to the standby level and
the outputs are high impedance, independent of
the Output Enable G or Write Enable W inputs.
Automatic Standby. After 150ns of bus inactivity
and when CMOS levels are driving the addresses,
the chip automatically enters a pseudo-standby
mode whereconsumptionis reducedto the CMOS
standby value, while outputs still drive the bus.
Electronic Signature. Two codes identifying the
manufacturerand the devicecan be read from the
memory. These codes allow programming equip-
ment or applications to automatically match their
interface to the characteristics of the M29F002.
The Electronic Signature is output by a Read op-
erationwhenthe voltageappliedto A9 is at V and
ID
INSTRUCTIONS AND COMMANDS
addressinput A1 is Low.Themanufacturercodeis
output when the Address input A0 is Low and the
devicecodewhen thisinput is High.OtherAddress
inputs are ignored.
The Command Interface latches commands writ-
ten to the memory. Instructions are made up from
one or more commands to perform Read Memory
Array, ReadElectronic Signature,Read Block Pro-
tection, Program, Block Erase, Chip Erase, Erase
Suspend and Erase Resume. Commands are
made of addressand data sequences.
TheElectronic Signaturecan also be read, without
raisingA9 to V , bygiving the memory the Instruc-
ID
tion AS.
Block Protection. Each block can be separately
protected against Program or Erase on program-
ming equipment. Block protection provides addi-
tional data security, as it disables all program or
erase operations. This mode is activated when
both A9 and G are raisedto VID and an address in
the blockis appliedon A13-A17.TheBlockProtec-
tion algorithm is shown in Figure 14. Block protec-
tion is initiatedon the edgeof W fallingto VIL. Then
after a delay of 100µs, the edge of W rising to VIH
ends the protection operations. Block protection
verify is achieved by bringing G, E, A0 and A6 to
VIL and A1 to VIH, while W is at VIH and A9 at VID.
Undertheseconditions,readingthedataoutput will
yield 01h if the block defined by the inputs on
A13-A17 is protected. Any attempt to program or
erase a protected block will be ignored by the
device.
Table 7. Commands
Hex Code
00h
Command
Invalid/Reserved
10h
Chip Erase Confirm
Reserved
20h
30h
Block Erase Resume/Confirm
Set-up Erase
80h
Read Electronic Signature/
Block Protection Status
90h
A0h
B0h
F0h
Program
Erase Suspend
Read Array/Reset
Block Temporary Unprotection. This feature is
available on M29F002T and M29F002B only. Any
7/29
M29F002T, M29F002NT, M29F002B
Table 8. Instructions (1)
Mne.
Instr.
Cyc.
1st Cyc. 2nd Cyc. 3rd Cyc. 4th Cyc. 5th Cyc. 6th Cyc. 7th Cyc.
Addr. (3,7)
Data
X
1+
Read Memory Array until a new write cycle is initiated.
Read/Reset
RD (2,4)
F0h
Memory Array
Addr. (3,7)
555h
AAh
AAAh
55h
555h
F0h
Read Memory Array until a new write
cycle is initiated.
3+
3+
Data
Addr. (3,7)
555h
AAAh
555h
Read Electronic Signature or Block
Protection Status until a new write cycle
is initiated. See Note 5 and 6.
AS (4) Auto Select
Data
AAh
55h
90h
Program
Address
Addr. (3,7)
555h
AAAh
555h
Read Data Polling or Toggle
Bit until Program completes.
PG
BE
Program
4
6
Program
Data
Data
AAh
55h
A0h
Block
Additional
Addr. (3,7)
555h
AAAh
555h
555h
AAAh
Address Block (8)
Block Erase
Chip Erase
Data
AAh
555h
AAh
X
55h
AAAh
55h
80h
555h
80h
AAh
555h
AAh
55h
AAAh
55h
30h
555h
10h
30h
Addr. (3,7)
CE
ES (10)
ER
6
1
1
Note 9
Data
Addr. (3,7)
Data
Erase
Suspend
Read until Toggle stops, then read all the data needed from
any Block(s) not being erased then Resume Erase.
B0h
X
Addr. (3,7)
Erase
Resume
Read Data Polling or Toggle Bits until Erase completes or
Erase is suspended another time
Data
30h
Notes: 1. Commands not interpreted in this table will default to read array mode.
2. Await of tPLYH is necessary after a Read/Reset command if the memory was in an Erase or Program mode
before starting any new operation (see Table 14 and Figure 9).
3. X = Don’t Care.
4. The first cycles of the RD or AS instructions are followed by read operations. Any number of read cycles can occur after
the command cycles.
5. Signature Address bits A0,A1 at VIL willoutput Manufacturer code (20h). Address bits A0 at VIH and A1 at VIL will output
Device code.
6. Block Protection Address: A0 at VIL, A1 at VIH and A13-A17 within the Block will output the Block Protection status.
7. For Coded cycles address inputs A12-A17are don’t care.
8. Optional, additional Blocks addresses must be entered within the erase timeout delay after last write entry,
timeout status can be verified through DQ3 value (see Erase Timer Bit DQ3 description).
When full command is entered, read Data Polling or Togglebit until Erase is completed or suspended.
9. Read Data Polling, Toggle bits or RB until Erase completes.
10.During Erase Suspend, Read and Data Program functions are allowed in blocks not being erased.
Theinstructions require from 1 to 6 cycles, the first
or first three of which are always write operations
usedtoinitiatethe instruction.Theyare followedby
either further write cycles to confirm the first com-
mand or executethe commandimmediately.Com-
mand sequencing must be followed exactly. Any
invalid combination of commands will reset the
device to Read Array. The increased number of
cycles has been chosen to assure maximum data
security. Instructions are initialised by two initial
Coded cycles which unlock the Command Inter-
face.Inaddition,for Erase,instructionconfirmation
is again preceded by the two Coded cycles.
Status Register Bits
P/E.C.status is indicatedduring executionby Data
Polling on DQ7, detection of Toggle on DQ6 and
DQ2, or Error on DQ5 and Erase Timer DQ3 bits.
Any read attempt during Program or Erase com-
mandexecutionwill automaticallyoutputthesefive
StatusRegister bits. TheP/E.C. automaticallysets
bits DQ2, DQ3, DQ5, DQ6 and DQ7. Other bits
(DQ0, DQ1 and DQ4) are reserved for future use
and should be masked. See Tables 9 and 10.
8/29
M29F002T, M29F002NT, M29F002B
Table 9. Status Register Bits
DQ
Name
Logic Level
Definition
Note
Erase Complete or erase
block in Erase Suspend
’1’
’0’
Indicates the P/E.C. status, check during
Program or Erase, and on completion
before checking bits DQ5 for Program or
Erase Success.
Erase On-going
Data
Polling
7
Program Complete or data
of non erase block during
Erase Suspend
DQ
DQ
Program On-going
’-1-0-1-0-1-0-1-’ Erase or Program On-going
Successive reads output complementary
data on DQ6 while Programming or Erase
operations are on-going. DQ6 remains at
constant level when P/E.C. operations are
completed or Erase Suspend is
DQ
Program Complete
6
Toggle Bit
Erase Complete or Erase
’-1-1-1-1-1-1-1-’ Suspend on currently
addressed block
acknowledged.
’1’
’0’
Program or Erase Error
This bit is set to ’1’ in the case of
Programming or Erase failure.
5
4
Error Bit
Program or Erase On-going
Reserved
P/E.C. Erase operation has started. Only
possible command entry is Erase Suspend
(ES).
’1’
’0’
Erase Timeout Period Expired
Erase
Time Bit
3
Erase Timeout Period
On-going
An additional block to be erased in parallel
can be entered to the P/E.C.
Chip Erase, Erase or Erase
Suspend on the currently
addressed block.
Erase Error due to the
currently addressed block
(when DQ5 = ’1’).
’-1-0-1-0-1-0-1-’
Indicates the erase status and allows to
identify the erased block
2
Toggle Bit
Program on-going, Erase
on-going on another block or
Erase Complete
1
Erase Suspend read on
non Erase Suspend block
DQ
1
0
Reserved
Reserved
Notes: Logic level ’1’ is High, ’0’ is Low. -0-1-0-0-0-1-1-1-0- represent bit value in successive Read operations.
Data Polling Bit (DQ7). When Programming op-
erations are in progress, this bit outputs the com-
plement of the bit being programmed on DQ7.
During Erase operation, it outputsa ’0’. After com-
pletion of the operation, DQ7 will output the bit last
programmed or a ’1’ after erasing. Data Polling is
valid and only effective during P/E.C. operation,
that is after the fourth W pulse for programmingor
after the sixth W pulse for erase. It must be per-
formed at the address being programmed or at an
address within the block being erased. If all the
blocks selectedfor erasureare protected,DQ7 will
be set to ’0’ for about 100µs, and then return to the
previous addressed memory data value.
9/29
M29F002T, M29F002NT, M29F002B
Table 10. Polling and Toggle Bits
identify the block being erased. During Erase or
Erase Suspend a read from a block being erased
will cause DQ2 to toggle. A read from a block not
being erased will set DQ2 to ’1’ during erase and
to DQ2 during Erase Suspend. During Chip Erase
a read operation will cause DQ2 to toggle as all
blocks are being erased. DQ2 will be set to ’1’
during program operation and when erase is com-
plete. After erase completion and if the error bit
DQ5 is set to ’1’, DQ2 will toggle if the faulty block
is addressed.
Mode
DQ7
DQ7
0
DQ6
DQ2
Program
Erase
Toggle
1
Toggle Note 1
Erase Suspend Read
(in Erase Suspend
block)
1
1
Toggle
Erase Suspend Read
(outside Erase Suspend
block)
DQ7
DQ7
DQ6
DQ2
N/A
Error Bit (DQ5). This bit is set to ’1’ by the P/E.C.
when there is a failure of programming, block
erase, or chip erase that results in invalid data in
thememoryblock.In caseof anerrorin blockerase
or program,the block in which the error occured or
to which the programmed data belongs, must be
discarded. The DQ5 failure condition will also ap-
pear if a usertries to programa ’1’ toa locationthat
is previously programmedto ’0’. OtherBlocks may
stillbe used.Theerrorbit resetsaftera Read/Reset
(RD) instruction. In case of success of Program or
Erase, the error bit will be set to ’0’ .
Erase Suspend Program
Toggle
Note: 1. Toggle if the address is within a block being erased.
’1’ if the address is within a block not being erased.
See Figure 11 for the Data Polling flowchart and
Figure 10 for the Data Polling waveforms.DQ7 will
also flag the Erase Suspend mode by switching
from ’0’ to ’1’ at the start of the Erase Suspend. In
order to monitor DQ7 in the Erase Suspend mode
an address within a block being erased must be
provided. For a Read Operationin Erase Suspend
mode, DQ7 will output ’1’ if the read is attempted
ona blockbeingerasedand thedatavalueon other
blocks. During Program operation in Erase Sus-
pend Mode, DQ7 will have the same behaviour as
in the normal program execution outside of the
suspend mode.
Erase Timer Bit (DQ3). This bit is set to ’0’ by the
P/E.C. when the last block Erase command has
been entered to the Command Interface and it is
awaiting the Erase start. When the erase timeout
periodis finished,after 50µs to120µs, DQ3returns
to ’1’.
Coded Cycles
The two Coded cycles unlock the Command Inter-
face. They are followed by an input command or a
confirmation command. The Coded cycles consist
of writing the data AAh at address 555h during the
first cycle. During the second cycle the Coded
cycles consist of writing the data 55h at address
AAAh. Theaddresslines A0 to A11are valid,other
address lines are ’don’t care’. The Coded cycles
happenon firstand secondcyclesof thecommand
write or on the fourth and fifth cycles.
Toggle Bit (DQ6). WhenProgramming or Erasing
operationsare in progress,successiveattemptsto
readDQ6willoutputcomplementarydata. DQ6will
toggle following toggling of either G, or E when G
is low. The operationis completed when two suc-
cessivereads yieldthe same output data.Thenext
readwill outputthe bitlastprogrammedora ’1’after
erasing. The toggle bit DQ6 is valid only during
P/E.C. operations, that is after the fourth W pulse
for programming or after the sixth W pulse for
Erase. If the blocks selected for erasure are pro-
Instructions
tected, DQ6 will toggle for about 100 s and then
µ
See Table 8.
returnback toRead. DQ6will be setto ’1’if a Read
operationis attemptedon anEraseSuspendblock.
When erase is suspended DQ6 will toggle during
programming operations in a blockdifferent to the
block in Erase Suspend.Either E or G toggling will
cause DQ6 to toggle. See Figure 12 for Toggle Bit
flowchart and Figure 13 for ToggleBit waveforms.
Read/Reset (RD) Instruction. The Read/Reset
instruction consists of one write cycle giving the
commandF0h.It canbe optionallyprecededbythe
twoCodedcycles.Subsequentreadoperationswill
read the memory array addressed and output the
data read. A wait state of 10 s is necessaryafter
µ
Read/Reset prior to any valid read if the memory
was in an Erase mode when the RD instruction is
given.
Toggle Bit (DQ2). This toggle bit, together with
DQ6, can be used to determine the device status
duringthe Erase operations.It can also be usedto
10/29
M29F002T, M29F002NT, M29F002B
Table 11. AC MeasurementConditions
High Speed
10ns
Standard
Input Rise and Fall Times
10ns
≤
≤
Input Pulse Voltages
0 to 3V
1.5V
0.45V to 2.4V
0.8V and 2V
Input and Output Timing Ref. Voltages
Figure 4. AC Testing Input Output Waveform
Figure 5. AC Testing Load Circuit
1.3V
High Speed
1N914
3V
1.5V
3.3kΩ
0V
DEVICE
UNDER
TEST
OUT
Standard
C
L
2.4V
2.0V
0.8V
0.45V
C
C
C
= 30pF for High Speed
= 100pF for Standard
includes JIG capacitance
L
L
L
AI01275B
AI01276B
Table 12. Capacitance(1) (T = 25 C, f = 1 MHz )
°
A
Symbol
CIN
Parameter
Input Capacitance
Output Capacitance
Test Condition
VIN = 0V
Min
Max
6
Unit
pF
COUT
VOUT = 0V
12
pF
Note: 1. Sampled only, not 100% tested.
Auto Select (AS) Instruction. This instruction
uses the two Coded cycles followed by one write
cycle giving the command90h to address555h for
commandset-up.Asubsequentread willoutputthe
manufacturer code and the device code or the
block protection status depending on the levels of
A0 and A1. The manufacturercode, 20h, is output
when the addresses lines A0 and A1 are Low, the
devicecodeis outputwhen A0isHigh withA1 Low.
Program (PG) Instruction. This instruction uses
four write cycles. The Program command A0h is
written to address555h on the third cycle after two
Coded cycles. A fourth write operation latches the
Addresson the falling edge of W or E and the Data
to be written on the rising edge and starts the
P/E.C.Read operationsoutput the StatusRegister
bits after the programming has started. Memory
programming is made only by writing ’0’ in place of
’1’.StatusbitsDQ6 and DQ7determineif program-
mingis on-goingand DQ5allowsverificationof any
possible error. Programming at an address not in
blocks being erased is also possible during erase
suspend. In this case, DQ2 will toggle at the ad-
dress being programmed.
The AS instruction also allows access to the block
protectionstatus.Aftergivingthe ASinstruction,A0
is set to V with A1 at V , while A13-A17 define
IL
IH
the address of the block to be verified. A read in
these conditions will output a 01h if the block is
protected and a 00h if the block is not protected.
11/29
M29F002T, M29F002NT, M29F002B
Table 13. DC Characteristics
(T = 0 to 70 C or –40 to 85 C; V = 5V 10%)
°
°
±
A
CC
Symbol
Parameter
Test Condition
0V ≤ VIN ≤ VCC
0V ≤ VOUT ≤ VCC
RPNC = VCC
Min
Max
±1
Unit
µA
(2)
ILI
Input Leakage Current
Output Leakage Current
ILO
±1
µA
ILR1
ILR2
ICC1
ICC2
ICC3
RPNC Leakage Current High
RPNC Leakage Current Low
Supply Current (Read) TTL Byte
Supply Current (Standby) TTL
Supply Current (Standby) CMOS
±1
µA
RPNC = VSS
–0.2
–10
20
µA
E = VIL, G = VIH, f = 6MHz
E = VIH
mA
mA
1
E = VCC 0.2V
100
A
µ
±
Byte program, Block or
Chip Erase in progress
(1)
ICC4
Supply Current (Program or Erase)
20
mA
VIL
VIH
VOL
Input Low Voltage
–0.5
2
0.8
VCC + 0.5
0.45
V
V
V
V
V
V
Input High Voltage
Output Low Voltage
IOL = 5.8mA
Output High Voltage TTL
Output High Voltage CMOS
A9, E, G, RPNC High Voltage
A9, E, G, RPNC High Current
IOH = –2.5mA
2.4
VCC –0.4V
11.5
VOH
IOH = –100 A
µ
VID
IID
12.5
100
A9, E, G or RPNC = VID
A
µ
Supply Voltage(Erase and
Program lock-out)
VLKO
3.2
4.2
V
Note: 1. Sampled only, not 100% tested.
2. Except RPNC.
Block Erase (BE) Instruction. This instruction
uses a minimum of six write cycles. The Erase
Set-upcommand80h is writtento address555hon
third cycle after the two Coded cycles. The Block
EraseConfirmcommand 30h is similarly writtenon
the sixth cycle after another two Coded cycles.
During the input of the second command an ad-
dress within the block to be erased is given and
latched into the memory. Additional block Erase
Confirm commands and block addresses can be
written subsequently to erase other blocks in par-
allel, without further Coded cycles. The erase will
start after the erase timeout period (see Erase
Timer Bit DQ3 description). Thus, additionalErase
Confirm commandsfor other blocks mustbe given
within this delay. Theinput of a new EraseConfirm
commandwillrestartthetimeoutperiod.Thestatus
of the internal timer can be monitored through the
level of DQ3, if DQ3 is ’0’ the Block Erase Com-
mand has been given and the timeoutis running,if
DQ3 is ’1’, the timeout has expired and the P/E.C.
is erasing the Block(s). If the second command
givenis not an erase confirmor if theCodedcycles
are wrong, the instruction aborts,and thedevice is
resetto Read Array. It is not necessaryto program
the block with 00h as the P/E.C. will do this auto-
maticallybeforeto erasingto FFh.Readoperations
after the sixth rising edge of W or E output the
status register status bits.
Duringthe executionof theeraseby the P/E.C.,the
memory accepts onlythe Erase Suspend ES and
Read/Reset RD instructions. Data Polling bit DQ7
returns ’0’ while the erasure is in progress and ’1’
when it has completed. The Toggle bit DQ2 and
DQ6 toggle during the erase operation. They stop
when erase is completed. After completion the
StatusRegisterbit DQ5returns’1’ iftherehas been
an erase failure. In such a situation, the Toggle bit
DQ2 can be used to determine which block is not
correctly erased. In the case of erase failure, a
Read/ResetRDinstruction is necessaryin orderto
reset the P/E.C.
12/29
M29F002T, M29F002NT, M29F002B
Table 14. Read AC Characteristics
(T = 0 to 70 C or –40 to 85 C)
°
°
A
M29F002T / M29F002NT / M29F002B
-70
-90
-120
Symbol
Alt
Parameter
Test Condition
Unit
VCC = 5V 10% V = 5V 10% V = 5V 10%
±
±
±
CC
CC
Standard
Interface
Standard
Interface
Standard
Interface
Min
Max
Min
Max
Min
Max
Address Valid to
Next Address Valid
tAVAV
tAVQV
tRC
tACC
tLZ
E = VIL, G = VIL
E = VIL, G = VIL
G = VIL
70
90
120
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
Address Valid to
Output Valid
70
90
90
35
20
20
10
120
Chip Enable Low to
Output Transition
(1)
tELQX
0
0
0
Chip Enable Low to
Output Valid
(2)
tELQV
tCE
G = VIL
70
30
20
20
10
120
50
30
30
10
Output Enable Low
to Output Transition
(1)
tGLQX
tOLZ
tOE
E = VIL
0
0
0
Output Enable Low
to Output Valid
(2)
tGLQV
E = VIL
Chip Enable High to
Output Transition
tEHQX
tOH
G = VIL
0
0
0
Chip Enable High to
Output Hi-Z
(1)
tEHQZ
tHZ
G = VIL
Output Enable High
to Output Transition
tGHQX
tOH
E = VIL
0
0
0
Output Enable High
to Output Hi-Z
(1)
tGHQZ
tDF
E = VIL
Address Transition
to Output Transition
tAXQX
tOH
E = VIL, G = VIL
0
0
0
RPNC Low to Read
Mode
(1,3)
tPLEL
tREADY
s
µ
RPNC High to Chip
Enable Low
tPHEL
tPLPX
tRSP
50
50
50
ns
ns
tRP RPNC Pulse Width
500
500
500
Notes: 1. Sampled only, not 100% tested.
2. G may be delayed by up to tELQV - tGLQV afterthe falling edge of E without increasing tELQV
3. To be considered only if the Reset pulse is given while the memory is in Erase mode.
.
13/29
M29F002T, M29F002NT, M29F002B
Figure 6. Read Mode AC Waveforms
14/29
M29F002T, M29F002NT, M29F002B
Table 15. Write AC Characteristics,Write Enable Controlled
(T = 0 to 70 C or –40 to 85 C)
°
°
A
M29F002T / M29F002NT / M29F002B
-70
-90
-120
Symbol
Alt
Parameter
Unit
VCC = 5V 10% VCC = 5V 10% VCC = 5V 10%
±
±
±
Standard
Interface
Standard
Interface
Standard
Interface
Min
Max
Min
Max
Min
Max
Address Validto Next Address
Valid
tAVAV
tWC
tCS
tWP
70
0
90
0
120
0
ns
ns
Chip Enable Low to Write Enable
Low
tELWL
Write Enable Low to Write Enable
High
tWLWH
tDVWH
tWHDX
35
30
0
45
45
0
50
50
0
ns
ns
ns
tDS Input Valid to Write Enable High
Write Enable High to Input
Transition
tDH
Write Enable High to Chip Enable
High
tWHEH
tCH
0
0
0
ns
Write Enable High to Write Enable
tWHWL
tAVWL
tWLAX
tWPH
Low
20
5
20
5
20
5
ns
ns
ns
tAS Address Valid to Write Enable Low
Write Enable Low to Address
Transition
tAH
45
45
50
Output Enable High to Write
Enable Low
tGHWL
tVCHEL
tWHGL
0
50
0
0
50
0
0
50
0
ns
tVCS VCC High to Chip Enable Low
s
µ
Write Enable High to Output
Enable Low
tOEH
ns
(1,2)
tPHPHH
tVIDR RPNC Rise Time to VID
tRP RPNC Pulse Width
500
500
500
500
500
500
ns
ns
tPLPX
Notes: 1. Sample only, not 100% tested.
2. This timing is for Temporary Block Unprotectionoperation.
ChipErase(CE)Instruction.Thisinstructionuses
six write cycles. The Erase Set-up command 80h
is written to address 555h on the third cycle after
the two Coded cycles. The Chip Erase Confirm
command10h is similarly writtenon the sixth cycle
after another two Coded cycles. If the second
command given is not an erase confirm or if the
Codedcycles arewrong, the instructionabortsand
thedeviceis resettoReadArray.It is notnecessary
toprogramthearray with00h first astheP/E.C. will
automaticallydo thisbeforeerasingittoFFh. Read
operations after the sixth rising edge of W or E
output the Status Register bits. During the execu-
tionof theeraseby the P/E.C.,DataPollingbit DQ7
returns ’0’, then ’1’ on completion. The Toggle bits
DQ2 and DQ6 toggle during erase operation and
stopwhenerase is completed.Aftercompletionthe
StatusRegisterbit DQ5returns’1’ iftherehas been
an Erase Failure.
15/29
M29F002T, M29F002NT, M29F002B
Figure 7. Write AC Waveforms, W Controlled
tAVAV
VALID
A0-A17
tWLAX
tAVWL
tWHEH
E
tELWL
tWHGL
G
tGHWL
tWLWH
W
tWHWL
tWHDX
tDVWH
VALID
DQ0-DQ7
V
CC
tVCHEL
AI02083
Note: Address are latched on the falling edge of W, Data is latched on the rising edge of W.
Erase Suspend (ES) Instruction. The Block
Eraseoperationmay be suspendedbythis instruc-
tion which consists of writing the command B0h
without any specific address. No Codedcycles are
required. It permits reading of data from another
block and programming in another block while an
erase operation is in progress. Erase suspend is
accepted only during the Block Erase instruction
execution. Writing this command during Erase
timeout will, in addition to suspending the erase,
terminate the timeout. The Toggle bit DQ6 stops
togglingwhentheP/E.C.is suspended.The Toggle
bitswill stoptogglingbetween0.1µs and 15µs after
the Erase Suspend (ES) command has been writ-
ten. The device will then automatically be set to
Read Memory Array mode. When erase is sus-
pended, a Read from blocks being erased will
output DQ2 toggling and DQ6 at ’1’. A Read from
a blocknot being erasedreturnsvalid data. During
suspension the memory will respond only to the
Erase Resume ER and the Program PG instruc-
tions. A Program operation can be initiated during
erase suspend in one of the blocks not being
erased. It will result in both DQ2 and DQ6 toggling
whenthedatais beingprogrammed.ARead/Reset
command will definitively abort erasure and result
in invalid data in the blocks being erased.
EraseResume(ER)Instruction. Ifan Erase Sus-
pend instruction was previously executed, the
erase operation may be resumed by giving the
command 30h, at any address, and without any
Coded cycles.
POWER SUPPLY
Power Up
ThememoryCommandInterfaceis reset onpower
up to Read Array. Either E or W must be tied to VIH
during Power Up to allow maximum security and
thepossibility to writea commandon the first rising
edge of E and W. Any write cycle initiation is
blocked when Vcc is below VLKO
.
Supply Rails
Normal precautionsmust be taken for supply volt-
age decoupling; each device in a system should
havethe VCC rail decoupledwith a 0.1µF capacitor
close to the VCC and VSS pins. The PCB trace
widths should be sufficient to carry the VCC pro-
gram and erase currents required.
16/29
M29F002T, M29F002NT, M29F002B
Table 16. Write AC Characteristics,Chip Enable Controlled
(T = 0 to 70 C or –40 to 85 C)
°
°
A
M29F002T / M29F002NT / M29F002B
-70
-90
-120
Symbol
Alt
Parameter
Unit
VCC = 5V 10% VCC = 5V 10% VCC = 5V 10%
±
±
±
Standard
Interface
Standard
Interface
Standard
Interface
Min
Max
Min
Max
Min
Max
Address Valid to Next Address
Valid
tAVAV
tWC
tWS
70
0
90
0
120
0
ns
ns
Write Enable Low to Chip
Enable Low
tWLEL
Chip Enable Low to Chip
Enable High
tELEH
tDVEH
tEHDX
tCP
tDS
tDH
35
30
5
45
45
5
50
50
5
ns
ns
ns
Input Valid to Chip Enable High
Chip Enable High to Input
Transition
Chip Enable High to Write
Enable High
tEHWH
tEHEL
tAVEL
tELAX
tWH
0
0
20
0
0
ns
ns
ns
ns
Chip Enable High to Chip
Enable Low
tCPH
tAS
20
0
20
0
Address Valid to Chip Enable
Low
Chip Enable Low to Address
Transition
tAH
45
45
50
Output Enable High Chip
Enable Low
tGHEL
tVCHWL
tEHGL
0
50
0
0
50
0
0
50
0
ns
µs
ns
tVCS
tOEH
VCC High to Write Enable Low
Chip Enable High to Output
Enable Low
(1,2)
tPHPHH
tVIDR
tRP
RPNC Rise TIme to VID
RPNC Pulse Width
500
500
500
500
500
500
ns
ns
tPLPX
Notes: 1. Sample only, not 100% tested.
2. This timing is for Temporary Block Unprotectionoperation.
17/29
M29F002T, M29F002NT, M29F002B
Figure 8. Write AC Waveforms, E Controlled
tAVAV
VALID
A0-A17
tELAX
tAVEL
tEHWH
W
tWLEL
tEHGL
G
tGHEL
tELEH
E
tEHEL
tDVEH
VALID
tEHDX
DQ0-DQ7
V
CC
tVCHWL
AI02084
Note: Address are latched on the fallingedge of E, Data is latchedon the rising edge of E.
Figure 9. Read and Write AC Characteristics, RP Related
E
tPHEL
tPLPX
RPNC
tPHPHH
tPLEL
AI02085
18/29
M29F002T, M29F002NT, M29F002B
Table 17. Data Polling and Toggle Bit AC Characteristics(1)
(T = 0 to 70 C or –40 to 85 C)
°
°
A
M29F002T / M29F002NT / M29F002B
-70
-90
-120
Sym-
bol
Alt
Parameter
Unit
VCC = 5V 10% VCC = 5V 10% VCC = 5V 10%
±
±
±
Standard
Interface
Standard
Interface
Standard
Interface
Min
Max
Min
Max
Min
Max
Write Enable High to DQ7 Valid
(Program, W Controlled)
10
1.0
10
2400
10
1.0
10
2400
10
1.0
10
2400
s
µ
tWHQ7V
Write Enable High to DQ7 Valid
(Chip Erase, W Controlled)
30
2400
30
30
2400
30
30
2400
30
sec
µs
Chip Enable High to DQ7 Valid
(Program, E Controlled)
tEHQ7V
Chip Enable High to DQ7 Valid
(Chip Erase, E Controlled)
1.0
1.0
1.0
sec
ns
Q7 Validto Output Valid (Data
Polling)
tQ7VQV
30
35
50
Write Enable High to Output
Valid (Program)
10
1.0
10
2400
30
10
1.0
10
2400
30
10
1.0
10
2400
30
s
µ
tWHQV
Write Enable High to Output
Valid (Chip Erase)
sec
µs
Chip Enable High to Output
Valid (Program)
2400
30
2400
30
2400
30
tEHQV
Chip Enable High to Output
Valid (Chip Erase)
1.0
1.0
1.0
sec
Note: 1. All other timings are defined in Read AC Characteristics table.
19/29
M29F002T, M29F002NT, M29F002B
Figure 10. DataPolling DQ7 AC Waveforms
20/29
M29F002T, M29F002NT, M29F002B
Figure 12. Data Toggle Flowchart
START
Figure 11. DataPolling Flowchart
START
READ
DQ2, DQ5 & DQ6
READ DQ5 & DQ7
at VALID ADDRESS
NO
DQ2, DQ6
=
DQ7
=
DATA
YES
TOGGLE
NO
YES
NO
NO
DQ5
= 1
DQ5
= 1
YES
YES
READ DQ2, DQ6
READ DQ7
DQ7
=
DATA
YES
NO
DQ2, DQ6
=
TOGGLE
NO
YES
FAIL
FAIL
PASS
PASS
AI01369
AI01873
Table 18. Program, Erase Times and Program, Erase Endurance Cycles
(T = 0 to 70 C)
°
A
M29F002T / M29F002NT / M29F002B
Parameter
Unit
Typical after
100k W/E Cycles
Min
Typ
Chip Erase (Preprogrammed)
Chip Erase
0.7
2.4
0.6
0.5
0.9
1.0
3.2
11
0.9
2.5
sec
sec
sec
sec
sec
sec
sec
Boot Block Erase
Parameter Block Erase
Main Block (32Kb) Erase
Main Block (64Kb) Erase
Chip Program (Byte)
Byte Program
3.2
11
s
µ
Program/Erase Cycles (per Block)
100,000
cycles
21/29
M29F002T, M29F002NT, M29F002B
Figure 13. DataToggle DQ6, DQ2 AC Waveforms
22/29
M29F002T, M29F002NT, M29F002B
Figure 14. Block Protection Flowchart
START
BLOCK ADDRESS
on A13-A17
W = V
IH
Set-up
n = 0
G, A9 = V
E = V
,
ID
IL
Wait 4µs
W = V
IL
Protect
Verify
Wait 100µs
W = V
IH
E, G = V
IH
VERIFY BLOCK PROTECTION
A0, A6 = V ; A1 = V ; A9 = V
ID
IL
IH
A13-A17 IDENTIFY BLOCK
E = V
IL
Wait 4µs
G = V
IL
Wait 60ns
VERIFY BLOCK
PROTECT STATUS
NO
DATA
=
01h
YES
A9 = V
IH
++n
NO
= 25
PASS
YES
A9 = V
IH
FAIL
AI02088B
23/29
M29F002T, M29F002NT, M29F002B
Figure 15. All Blocks Unprotecting Flowchart
START
PROTECT
ALL BLOCKS
n = 0
Set-up
W = V
IH
E, G, A9 = V
ID
A12, A15 = V
IH
Wait 4µs
W = V
IL
Wait 10ms
Unprotect
Verify
W = V
IH
E, G = V
IH
E, A0 = V ; A1, A6 = V ; A9 = V
ID
IL
IH
A13-A17 IDENTIFY BLOCK
NEXT
BLOCK
Wait 4µs
G = V
IL
Wait 60ns
VERIFY BLOCK
PROTECT STATUS
NO
YES
DATA
=
00h
NO
++n
= 1000
LAST
BLK.
NO
YES
YES
A9 = V
IH
A9 = V
IH
FAIL
PASS
AI02089C
24/29
M29F002T, M29F002NT, M29F002B
ORDERING INFORMATION SCHEME
Example:
M29F002T
-70
X
K
1
TR
Operating Voltage
Option
F
5V
TR Tape & Reel
Packing
Array Matrix
Top Boot
Speed
-70 70ns
Power Supplies
blank VCC 10%
Package
PDIP32
PLCC32
Temp. Range
0 to 70 C
T
B
P
K
N
1
6
±
°
Bottom Boot
-90 90ns
X
VCC 5%
–40 to 85 C
°
±
NT Top Boot
without
-120 120ns
TSOP32
(8 x 20 mm)
RPNC function
Devices are shipped from the factory with the memory content erased (to FFh).
Fora list ofavailableoptions(Speed, Package,etc...)or for furtherinformationon anyaspect of thisdevice,
please contact the STMicroelectronics Sales Office nearest to you.
25/29
M29F002T, M29F002NT, M29F002B
PDIP32 - 32 pin Plastic DIP, 600 mils width
mm
Min
–
inches
Min
–
Symb
Typ
Max
5.08
–
Typ
Max
0.200
–
A
A1
A2
B
0.38
3.56
0.38
–
0.015
0.140
0.015
–
4.06
0.51
–
0.160
0.020
–
B1
C
1.52
0.060
0.20
41.78
–
0.30
42.04
–
0.008
1.645
–
0.012
1.655
–
D
D2
E
38.10
15.24
1.500
0.600
–
–
–
–
E1
e1
eA
eB
L
13.59
–
13.84
–
0.535
–
0.545
–
2.54
0.100
0.600
15.24
–
–
–
–
15.24
3.18
1.78
0°
17.78
3.43
2.03
10°
0.600
0.125
0.070
0°
0.700
0.135
0.080
10°
S
α
N
32
32
A2
A
A1
e1
L
α
C
B1
B
eA
eB
D2
D
S
N
1
E1
E
PDIP
Drawing is not to scale.
26/29
M29F002T, M29F002NT, M29F002B
PLCC32 - 32 lead Plastic Leaded Chip Carrier, rectangular
mm
Min
2.54
1.52
–
inches
Min
0.100
0.060
–
Symb
Typ
Max
3.56
2.41
0.38
0.53
0.81
12.57
11.56
10.92
15.11
14.10
13.46
–
Typ
Max
0.140
0.095
0.015
0.021
0.032
0.495
0.455
0.430
0.595
0.555
0.530
–
A
A1
A2
B
0.33
0.66
12.32
11.35
9.91
14.86
13.89
12.45
–
0.013
0.026
0.485
0.447
0.390
0.585
0.547
0.490
–
B1
D
D1
D2
E
E1
E2
e
1.27
0.89
0.050
0.035
F
0.00
–
0.25
–
0.000
–
0.010
–
R
N
32
32
Nd
Ne
CP
7
7
9
9
0.10
0.004
D
A1
D1
A2
1 N
B1
e
Ne
E1 E
D2/E2
F
B
0.51 (.020)
1.14 (.045)
Nd
A
R
CP
PLCC
Drawing is not to scale.
27/29
M29F002T, M29F002NT, M29F002B
TSOP32 - 32 lead Plastic Thin Small Outline, 8 x 20mm
mm
Min
inches
Min
Symb
Typ
Max
1.20
0.15
1.05
0.27
0.21
20.20
18.50
8.10
-
Typ
Max
0.047
0.007
0.041
0.011
0.008
0.795
0.728
0.319
-
A
A1
A2
B
0.05
0.95
0.15
0.10
19.80
18.30
7.90
-
0.002
0.037
0.006
0.004
0.780
0.720
0.311
-
C
D
D1
E
e
0.50
0.020
L
0.50
0.70
0.020
0.028
0
°
5
°
0
°
5
°
α
N
32
32
CP
0.10
0.004
A2
1
N
e
E
B
N/2
D1
D
A
CP
DIE
C
TSOP-a
A1
α
L
Drawing is not to scale.
28/29
M29F002T, M29F002NT, M29F002B
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences
of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted
by implicationor otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject to
change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not
authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
The ST logo is a registered trademark of STMicroelectronics.
1998 STMicroelectronics - All Rights Reserved
STMicroelectronics GROUP OF COMPANIES
Australia - Brazil - Canada - China - France - Germany - Italy - Japan - Korea - Malaysia - Malta - Mexico - Morocco - The Netherlands -
Singapore - Spain - Sweden - Switzerland - Taiwan - Thailand - United Kingdom - U.S.A.
29/29
M29F002T-70K1TR 相关器件
型号 | 制造商 | 描述 | 价格 | 文档 |
M29F002T-70K6 | STMICROELECTRONICS | 暂无描述 | 获取价格 | |
M29F002T-70K6TR | STMICROELECTRONICS | 2 Mbit 256Kb x8, Boot Block Single Supply Flash Memory | 获取价格 | |
M29F002T-70K6TR | NUMONYX | Flash, 256KX8, 70ns, PQCC32, PLASTIC, LCC-32 | 获取价格 | |
M29F002T-70N1TR | STMICROELECTRONICS | 2 Mbit 256Kb x8, Boot Block Single Supply Flash Memory | 获取价格 | |
M29F002T-70N1TR | NUMONYX | 暂无描述 | 获取价格 | |
M29F002T-70N6TR | STMICROELECTRONICS | 2 Mbit 256Kb x8, Boot Block Single Supply Flash Memory | 获取价格 | |
M29F002T-70N6TR | NUMONYX | Flash, 256KX8, 70ns, PDSO32, 8 X 20 MM, PLASTIC, TSOP-32 | 获取价格 | |
M29F002T-70P1TR | STMICROELECTRONICS | 2 Mbit 256Kb x8, Boot Block Single Supply Flash Memory | 获取价格 | |
M29F002T-70P6TR | STMICROELECTRONICS | 2 Mbit 256Kb x8, Boot Block Single Supply Flash Memory | 获取价格 | |
M29F002T-70XK1TR | STMICROELECTRONICS | 2 Mbit 256Kb x8, Boot Block Single Supply Flash Memory | 获取价格 |
M29F002T-70K1TR 相关文章
- 2024-09-20
- 6
- 2024-09-20
- 9
- 2024-09-20
- 8
- 2024-09-20
- 6