STN2NF10 [STMICROELECTRONICS]
N-CHANNEL 100V - 0.23ohm - 2A SOT-223 STripFET⑩ II POWER MOSFET; N沟道100V - 0.23ohm - 2A SOT- 223 STripFET⑩ II功率MOSFET型号: | STN2NF10 |
厂家: | ST |
描述: | N-CHANNEL 100V - 0.23ohm - 2A SOT-223 STripFET⑩ II POWER MOSFET |
文件: | 总8页 (文件大小:261K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
STN2NF10
N-CHANNEL 100V - 0.23Ω - 2A SOT-223
STripFET™ II POWER MOSFET
V
R
I
D
TYPE
DSS
DS(on)
STN2NF10
100 V
< 0.26 Ω
2 A
2
■
TYPICAL R (on) = 0.23 Ω
DS
DESCRIPTION
3
2
This Power MOSFET is the latest development of
STMicroelectronis unique "Single Feature Size™"
strip-based process. The resulting transistor
shows extremely high packing density for low on-
resistance, rugged avalanche characteristics and
less critical alignment steps therefore a remark-
able manufacturing reproducibility.
1
SOT-223
APPLICATIONS
INTERNAL SCHEMATIC DIAGRAM
■
■
■
DC-DC & DC-AC COVERTERS
DC MOTOR CONTROL (DISK DRIVERS, etc.)
SYNCHRONOUS RECTIFICATION
ABSOLUTE MAXIMUM RATINGS
Symbol
Parameter
Value
100
Unit
V
V
Drain-source Voltage (V = 0)
DS
GS
V
Drain-gate Voltage (R = 20 kΩ)
100
V
DGR
GS
V
Gate- source Voltage
± 20
2
V
GS
I (•)
D
Drain Current (continuos) at T = 25°C
A
C
I
Drain Current (continuos) at T = 100°C
1.26
8
A
D
C
I
(••)
Drain Current (pulsed)
A
DM
P
Total Dissipation at T = 25°C
2.5
W
tot
C
Derating Factor
0.02
300
W/°C
mJ
°C
°C
E
AS
(1)
Single Pulse Avalanche Energy
Storage Temperature
T
stg
-65 to 150
150
T
Max. Operating Junction Temperature
j
(••) Pulse width limited by safe operating area.
(•) Current limited by the package
(1) I ≤1A, di/dt ≤300A/µs, V ≤ V
, T ≤ T
(BR)DSS j JMAX
SD
DD
December 2001
1/8
.
STN2NF10
THERMAL DATA
Rthj-pcb
Thermal Resistance Junction-PCB
(1 inch copper board)
50
°C/W
2
Rthj-pcb
90
260
°C/W
°C
Thermal Resistance Junction-PCB (min. footprint)
Maximum Lead Temperature For Soldering Purpose
T
Typ
l
ELECTRICAL CHARACTERISTICS (T
= 25 °C unless otherwise specified)
case
OFF
Symbol
Parameter
Drain-source
Test Conditions
Min.
Typ.
Max.
Unit
I
= 250 µA, V = 0
D
GS
V
100
V
(BR)DSS
Breakdown Voltage
V
= Max Rating
DS
Zero Gate Voltage
1
10
µA
µA
I
DSS
Drain Current (V = 0)
V
DS
= Max Rating T = 125°C
GS
C
Gate-body Leakage
V
GS
= ± 20V
±100
nA
I
GSS
Current (V = 0)
DS
(1)
ON
Symbol
Parameter
Test Conditions
Min.
Typ.
Max.
4
Unit
V
V
GS(th)
V
V
= V
I
I
= 250 µA
= 1 A
Gate Threshold Voltage
2
DS
GS
GS
D
D
= 10 V
Static Drain-source On
Resistance
0.23
0.26
Ω
R
DS(on)
DYNAMIC
Symbol
Parameter
Test Conditions
>I xR I =1A
Min.
Typ.
Max.
Unit
(*)
V
V
g
fs
Forward Transconductance
2.5
S
DS D(on)
DS(on)max
D
= 25V, f = 1 MHz, V = 0
C
iss
Input Capacitance
Output Capacitance
Reverse Transfer
Capacitance
280
45
20
pF
pF
pF
DS
GS
C
oss
C
rss
2/8
STN2NF10
ELECTRICAL CHARACTERISTICS (continued)
SWITCHING ON
Symbol
Parameter
Test Conditions
= 50 V
Min.
Typ.
Max.
Unit
V
R
I
= 1 A
D
Turn-on Delay Time
Rise Time
6
10
ns
ns
t
DD
d(on)
= 4.7 Ω
V
= 10 V
GS
t
r
G
(Resistive Load, Figure 3)
Q
V
= 80V I = 2A V =10V
D GS
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
10
2.5
4
nC
nC
nC
g
DD
Q
gs
Q
gd
SWITCHING OFF
Symbol
Parameter
Test Conditions
Min.
Min.
Typ.
Max.
Max.
Unit
t
V
R
= 80 V
I
D
= 2 A
Turn-off Delay Time
Fall Time
Cross-over Time
19
4
15
ns
ns
ns
d(Voff)
clamp
t
= 4.7Ω,
V
GS
= 10 V
f
G
t
c
(Inductive Load, Figure 5)
SOURCE DRAIN DIODE
Symbol
Parameter
Test Conditions
Typ.
Unit
I
Source-drain Current
Source-drain Current (pulsed)
2
8
A
A
SD
( )
•
I
SDM
(*)
I
I
= 2 A
V
= 0
GS
V
Forward On Voltage
1.2
V
SD
SD
SD
t
rr
= 2 A
di/dt = 100A/µs
Reverse Recovery Time
Reverse Recovery Charge
Reverse Recovery Current
70
175
5
ns
nC
A
Q
V
= 10 V
T = 150°C
j
rr
DD
I
(see test circuit, Figure 5)
RRM
(*)
(
Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %.
•)Pulse width limited by safe operating area.
Thermal Impedance
Safe Operating Area
3/8
STN2NF10
Output Characteristics
Transfer Characteristics
Transconductance
Static Drain-source On Resistance
Gate Charge vs Gate-source Voltage
Capacitance Variations
4/8
STN2NF10
Normalized Gate Threshold Voltage vs Temperature
Normalized on Resistance vs Temperature
Source-drain Diode Forward Characteristics
.
.
.
5/8
STN2NF10
Fig. 1: Unclamped Inductive Load Test Circuit
Fig. 2: Unclamped Inductive Waveform
Fig. 3: Switching Times Test Circuits For Resistive
Fig. 4: Gate Charge test Circuit
Load
Fig. 5: Test Circuit For Inductive Load Switching
And Diode Recovery Times
6/8
STN2NF10
SOT-223 MECHANICAL DATA
mm
mils
TYP.
90.6
181.1
15.7
25.6
63
DIM.
MIN.
2.27
4.57
0.2
TYP.
2.3
MAX.
2.33
4.63
0.6
MIN.
89.4
179.9
7.9
MAX.
91.7
a
b
4.6
182.3
23.6
c
0.4
d
0.63
1.5
0.65
1.6
0.67
1.7
24.8
59.1
26.4
e1
e4
f
66.9
0.32
3.1
12.6
2.9
0.67
6.7
3
114.2
26.4
118.1
27.6
122.1
28.7
g
0.7
7
0.73
7.3
l1
l2
L
263.8
137.8
248
275.6
137.8
255.9
287.4
145.7
263.8
3.5
3.5
6.5
3.7
6.3
6.7
L
l2
d
a
e4
c
b
f
C
C
B
E
g
P008B
7/8
STN2NF10
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences
of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted
by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject
to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not
authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
The ST logo is registered trademark of STMicroelectronics
2001 STMicroelectronics - All Rights Reserved
All other names are the property of their respective owners.
STMicroelectronics GROUP OF COMPANIES
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8/8
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