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STC32C25Q27VG

更新时间：2024-10-29 22:54:11
品牌：SUNTSU
描述：Ceramic SMT 4 Pad CMOS (VC)TCXO

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STC32C25Q27VG 概述

Ceramic SMT 4 Pad CMOS (VC)TCXO

STC32C25Q27VG 数据手册

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Ceramic SMT 4 Pad CMOS (VC)TCXO  
STC32C Series  
3.2mm x 2.5mm  
Features  
• ± ±10ppm (Frequency Stability) Available  
• CMOS  
Applications  
• Base Stations  
• IP networking  
• (VC)TCXO  
• Cellular and Cordless Phones  
• Tape and Reel  
Part Numbering Guide  
STC 32 C 33 R 48 V E - 32.000M  
SUNTSU TCXO  
FREQUENCY  
MHz  
PULLABILITY  
BLANK : TCXO  
E : ± ±210ppm  
F : ± 810ppm  
G : ± ꢀ10ppm  
3.2mm x 2.5mm  
CMOS  
TCXO/VCTCXO  
BLANK : TCXO  
V : VCTCXO  
OPERATING  
SUPPLY VOLTAGE  
TEMPERATURE RANGE  
2ꢀ : 21ꢀV± ꢀ%  
27 : 217V± ꢀ%  
30 : 310V± ꢀ%  
33 : 313V± ꢀ%  
FREQUENCY STABILITY  
07 : 0°C - +70°C  
N : ± ꢀ10ppm  
±6 : -±0°C - +60°C  
27 : -20°C - +70°C  
38 : -30°C - +8ꢀ°C  
48 : -40°C - +8ꢀ°C  
O : ± 21ꢀppm  
P : ± 210ppm  
Q : ± ±1ꢀppm  
R : ± ±10ppm  
COMPLIANT  
Cage Code: 4GUT4  
To customize your parameters contact a Suntsu representative1  
Electrical Parameters  
Units  
Minimum  
Typical  
Maximum  
Remarks  
Frequency Range  
MHz  
6
40  
Frequency Tolerance at +2ꢀºC  
Freq1 Stability vs1 Op Temp1  
Freq1 Stability vs1 Supply Voltage  
Freq1 Stability vs1 Load  
ppm  
ppm  
ppm  
ppm  
ppm  
°C  
-±1ꢀ  
-±10  
+±1ꢀ  
+±10  
+013  
+013  
+±10  
+8ꢀ  
+±2ꢀ  
3146ꢀ  
6
I hour after Reflow  
See part numbering guide for options1  
VDD ± ꢀ% Change  
-013  
-013  
-±10  
± ꢀ% Change  
Freq1 Stability vs1 Aging  
Operating Temperature  
Storage Temperature  
± Year  
-40  
-ꢀꢀ  
See part numbering guide for options1  
°C  
Supply Voltage (VDD)  
V
31±3ꢀ  
313  
See part numbering guide for options1  
Current (IDD)  
mA  
Current Voltage (VC, VCTCXO)  
Pullability (VCTCXO)  
V
0
VDD  
± ±210  
±0  
Center Voltage: VDD*ꢀ0%  
ppm  
%
± ꢀ10  
See part numbering guide for options1  
Linearity (VCTCXO)  
Output Load (CMOS)  
pF  
±ꢀ  
Output Logic HIGH Level (VOH)  
Output Logic LOW Level (VOL)  
Rise (TR) And Fall (TF) Time  
Symmetry (Duty Cycle)  
Start-Up Time  
V
018*VDD  
V
012*VDD  
ns  
ꢀ
60  
3
%
40  
ms  
VC Input Impedance (VCTCXO)  
Phase Noise (Typical) ±0Hz Offset  
Phase Noise (Typical) ±00Hz Offset  
kΩ  
±00  
dBc/Hz  
dBc/Hz  
dBc/Hz  
dBc/Hz  
dBc/Hz  
-8ꢀ  
-±±ꢀ  
-±3ꢀ  
-±4ꢀ  
-±ꢀ0  
Phase Noise (Typical) ±KHz Offset  
Phase Noise (Typical) ±0KHz Offset  
Phase Noise (Typical) ±00KHz Offset  
Suntsu Electronics, Inc.  
142 TECHNOLOGY DR., SUITE 150  
IRVINE, CA 92618  
www.suntsu.com  
Specifications are subject  
to change without notice.  
Call: +1-949-783-7300 | Fax: +1-949-783-7301  
Ceramic SMT 4 Pad CMOS (VC)TCXO  
STC32C Series  
3.2mm x 2.5mm  
Outline Drawing & Land Pattern  
All dimensions are in millimeters (mm) unless otherwise noted1 Drawings are not to scale1  
Test Circuit (CMOS)  
Waveform (CMOS)  
Typical Phase Noise Performance (Measured By Agilent E5052A)  
Frequency - 32.000MHz  
Frequency - 40.000MHz  
Suntsu Electronics, Inc.  
142 TECHNOLOGY DR., SUITE 150  
IRVINE, CA 92618  
www.suntsu.com  
Specifications are subject  
to change without notice.  
Call: +1-949-783-7300 | Fax: +1-949-783-7301  
Ceramic SMT 4 Pad CMOS (VC)TCXO  
STC32C Series  
3.2mm x 2.5mm  
Typical Jitter Performance (Measured By Agilent E5052A)  
Frequency - 32.000MHz  
Reflow Profile  
Frequency - 40.000MHz  
Part Marking  
Tp (Time At 260°C. 20-40 Sec)  
260  
Rup (Ramp Up, 3°C/Sec Max)  
217  
200  
TI (Time Above 217°C.  
60-150Sec)  
150  
Rdn (Ramp Down,  
6°C/Sec Max)  
Ts (Preheat Time.  
60-180Sec)  
T 25°C to Peak (480Sec Max)  
Time (sec)  
Tape And Reel Dimensions  
All dimensions are in millimeters (mm) unless otherwise noted1 Drawings are not to scale1  
3,000pcs/Reel  
Suntsu Electronics, Inc.  
142 TECHNOLOGY DR., SUITE 150  
IRVINE, CA 92618  
www.suntsu.com  
Specifications are subject  
to change without notice.  
Call: +1-949-783-7300 | Fax: +1-949-783-7301  
Ceramic SMT 4 Pad CMOS (VC)TCXO  
STC32C Series  
3.2mm x 2.5mm  
Environmental Specifications  
Mechanical Specifications  
Temperature Cycling  
MIL-STD-883, Method ±0±0, Condition B  
Mechanical Shock  
MIL-STD-202, Method 2±3, Condition B  
MIL-STD-883, Method 2007, Condition A  
MIL-STD-883, Method ±004  
Fine Leak Test  
MIL-STD-883, Method ±0±4, Condition A  
MIL-STD-883, Method ±0±4, Condition C  
Vibration  
Gross Leak Test  
Moisture Resistance  
Solderability  
MIL-STD-883, Method 2003  
J-STD-020, MSL ±  
Resistance to Solvents  
MIL-STD-202, Method 2±ꢀ  
Moisture Sensitivity  
Resistance to Soldering Heat  
MIL-STD-202, Method 2±0, Condition K  
Suntsu Electronics, Inc.  
142 TECHNOLOGY DR., SUITE 150  
IRVINE, CA 92618  
www.suntsu.com  
Specifications are subject  
to change without notice.  
Call: +1-949-783-7300 | Fax: +1-949-783-7301  

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