STC32K30N16E [SUNTSU]
Ceramic SMT 4 Pad Clipped Sinewave (VC)TCXO;
| 型号： | STC32K30N16E |
| 厂家： | 
Suntsu Electronics, Inc. |
| 描述： | Ceramic SMT 4 Pad Clipped Sinewave (VC)TCXO 石英晶振 温度补偿晶振 |
| 文件： | 总4页 (文件大小：902K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
Ceramic SMT 4 Pad Clipped Sinewave (VC)TCXO
STC32K Series
3.2mm x 2.5mm
Features
• ±±.5ppm (Frequency Stability) Available
• Clipped Sinewave
• (VC)TCXO
• Tape and Reel
Applications
• GPS
• Mobile Communication Equipment
• Cellular And Cordless Phones
• IP Networking
Part Numbering Guide
STC 32 K 33 R 48 V E A - 32.000M
SUNTSU TCXO
FREQUENCY
MHz
COMPENSATION
BLANK : Digital
3.2mm x 2.5mm
A : Analog
PULLABILITY
BLANK : TCXO
E : ±12.±±ppm
F : ±8.±ppm
CLIPPED SINEWAVE
TCXO/VCTCXO
BLANK : TCXO
V : VCTCXO
OPERATING
TEMPERATURE
RANGE
±7 : ±°C - +7±°C
16 : -1±°C - +6±°C
17 : -1±°C - +7±°C
27 : -2±°C - +7±°C
37 : -3±°C - +75°C
38 : -3±°C - +85°C
48 : -4±°C - +85°C
SUPPLY VOLTAGE
18 : 1.8V±5%
25 : 2.5V±5%
27 : 2.7V±5%
3± : 3.±V±5%
33 : 3.3V±5%
FREQUENCY STABILITY
G : ±5.±ppm
N : ±5.±ppm
O : ±2.5ppm
P : ±2.±ppm
Q : ±1.5ppm
R : ±1.±ppm
F : ±±.5ppm
COMPLIANT
Cage Code: 4GUT4
To customize your parameters contact a Suntsu representative.
Electrical Parameters
Units
Minimum
Typical
Maximum
Remarks
Frequency Range
MHz
6
4±
Frequency Tolerance at +25ºC
Freq. Stability vs. Op Temp.
Freq. Stability vs. Supply Voltage
Freq. Stability vs. Load
ppm
ppm
ppm
ppm
-1.5
-±.5
-±.3
-±.2
+1.5
1 hour after reflow.
+±.5
+±.3
+±.2
See part numbering guide for options.
VDD±5% change.
±1±% change
Freq. Stability vs. Aging
Operating Temperature
Storage Temperature
Supply Voltage (VDD)
Current (IDD)
ppm
°C
-1.±
-4±
-55
+1.±
+85
+125
3.465
2
1 Year
See part numbering guide for options.
°C
V
3.135
3.3
See part numbering guide for options.
mA
V
Control Current (VC, VCTCXO)
±
VDD
Center Voltage : VDD*5±%
Pullability (VCTCXO)
ppm
%
±5.±
±12.±
1±
See part numbering guide for options.
Linearity (VCTCXO)
Output Load (Clipped Sinewave)
Output Logic Levels
kΩ//pF
VP-P
1±//1±
±.8
4±
Symmetry (Duty Cycle)
%
5±
6±
3
ms
Start-Up Time
VC Input Impedance (VCTCXO)
Phase Noise (Typical) 1±Hz Offset
Phase Noise (Typical) 1±±Hz Offset
Phase Noise (Typical) 1KHz Offset
Phase Noise (Typical) 1±KHz Offset
Phase Noise (Typical) 1±±KHz Offset
kΩ
1±±
dBc/Hz
dBc/Hz
dBc/Hz
dBc/Hz
dBc/Hz
-85
-115
-135
-145
-15±
Suntsu Electronics, Inc.
142 TECHNOLOGY DR., SUITE 150
IRVINE, CA 92618
www.suntsu.com
Specifications are subject
to change without notice.
Call: +1-949-783-7300 | Fax: +1-949-783-7301
Ceramic SMT 4 Pad Clipped Sinewave (VC)TCXO
STC32K Series
3.2mm x 2.5mm
Outline Drawing
All dimensions are in millimeters (mm) unless otherwise noted. Drawings are not to scale.
Test Circuit (Clipped Sinewave)
Waveform (Clipped Sinewave)
Typical Phase Noise (Measured By Agilent E5052A)
Frequency - 32.000MHz
Frequency - 40.000MHz
Suntsu Electronics, Inc.
142 TECHNOLOGY DR., SUITE 150
IRVINE, CA 92618
www.suntsu.com
Specifications are subject
to change without notice.
Call: +1-949-783-7300 | Fax: +1-949-783-7301
Ceramic SMT 4 Pad Clipped Sinewave (VC)TCXO
STC32K Series
3.2mm x 2.5mm
Jitter Performance (Measured By Agilent E5052A)
Frequency - 32.000MHz
Frequency - 40.000MHz
Tape And Reel Dimensions
All dimensions are in millimeters (mm) unless otherwise noted. Drawings are not to scale.
3,±±±pcs/Reel
Reflow Profile & Part Marking
Tp (Time At 260°C. 20-40 Sec)
260
Rup (Ramp Up, 3°C/Sec Max)
217
200
TI (Time Above 217°C.
60-150Sec)
150
Rdn (Ramp Down,
6°C/Sec Max)
Ts (Preheat Time.
60-180Sec)
T 25°C to Peak (480Sec Max)
Time (sec)
Suntsu Electronics, Inc.
142 TECHNOLOGY DR., SUITE 150
IRVINE, CA 92618
www.suntsu.com
Specifications are subject
to change without notice.
Call: +1-949-783-7300 | Fax: +1-949-783-7301
Ceramic SMT 4 Pad Clipped Sinewave (VC)TCXO
STC32K Series
3.2mm x 2.5mm
Environmental Specifications
Mechanical Specifications
Temperature Cycling
MIL-STD-883, Method 1±1±, Condition B
Mechanical Shock
MIL-STD-2±2, Method 213, Condition B
MIL-STD-883, Method 2±±7, Condition A
MIL-STD-883, Method 1±±4
Fine Leak Test
MIL-STD-883, Method 1±14, Condition A
MIL-STD-883, Method 1±14, Condition C
Vibration
Gross Leak Test
Moisture Resistance
Solderability
MIL-STD-883, Method 2±±3
J-STD-±2±, MSL 1
Resistance to Solvents
MIL-STD-2±2, Method 215
Moisture Sensitivity
Resistance to Soldering Heat
MIL-STD-2±2, Method 21±, Condition K
Suntsu Electronics, Inc.
142 TECHNOLOGY DR., SUITE 150
IRVINE, CA 92618
www.suntsu.com
Specifications are subject
to change without notice.
Call: +1-949-783-7300 | Fax: +1-949-783-7301
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