CGJ5F4X7R0F102J [TDK]

CGJ series l High Reliability Series; CGJ系列l高可靠性系列
CGJ5F4X7R0F102J
元器件型号: CGJ5F4X7R0F102J
生产厂家: TDK ELECTRONICS    TDK ELECTRONICS
描述和应用:

CGJ series l High Reliability Series
CGJ系列l高可靠性系列

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TDK MLCC
Presentation
CGJ series l High Reliability Series
Contents
Purp os e / Ob je c tive s
TDK MLCC Line up
Se rie s Conc e p t
Ca p Ra ng e
Fe a ture s
Ap p lic a tions
De s ig n Tools /Re s ourc e s
Pa rt Numb e r De s c rip tion
Summa ry
Capacitors Business Group
TDK MLCC
Presentation
CGJ series l High Reliability Series
Purpose
To p rovid e a g e ne ra l ove rvie w of TDK’s “CGJ Hig h Re lia b ility Se rie s ” Ca p a c itor
Objectives
De fine TDK’s CGJ Hig h Re lia b ility Se rie s c a p a c itors
Hig hlig ht the fe a ture s a nd a p p lic a tions of TDK’s CGJ Se rie s Ca p a c itors
Exp la in TDK’s CGJ s e rie s p a rt numb e r s truc ture
TDK
2
TDK MLCC
Presentation
General Applications
Mid Voltage
High Voltage
• Wide range of case size and superior dimension precision
• Available in EIA class 1 and 2 dielectrics up to 50V
• Unique design allows for higher voltage in smaller case size
• Available in 100V, 250V, 450V, and 630V
• Advance design provides improved withstanding voltage
• Available rating up to 3000V
• Stable temperature characteristics up to 150ºC
• Highly precise temperature performance ( 7.5%) up to 125º C
• Design with higher Q factor than standard capacitors
• Excellent attenuation and high self resonance frequency (SRF)
• Flipped geometry provides lower inductance than standard capacitor
• Special design allows for adequate high frequency current to IC
• Unique design allows for increase resistance to mechanical bending
• Improved performance in vibration and electrical stresses
• Improved bending resistance and temperature cycle performance
• Termination technology available for most case sizes including arrays
• AgPdCu termination for conductive glue mounting
• Improved mechanical/thermal strength when used with conductive glue
• Unique design allows for specified “controlled” ESR
• Same no-hassle mounting method as standard 2-terminal components
• ESR is controlled without affecting the ESL
• 2 series-connected capacitors in one body
• Improved bending resistance and temperature cycle performance
• Ultra high reliability design for automotive battery line applications
• Qualified to CDF AEC Q-200 automotive testing standard
• Manufactured using matured process for guaranteed performance
• Available in C0G, X7R and X8R temperature characteristics
• Extensive testing to ensure higher reliability and longer life
• Reliability tests based on MIL-STD requirements
• Guaranteed TC Bias and Hot IR performance
• Allows for reduction of PCB space and mounting time
• Unique electrode design reduces crosstalk
• Also available in soft termination for higher reliability performance
• Optimized for noise bypass with signal and power source circuits
• Can be used for meeting EMC requirements
• Ideal for use at higher frequencies due to low parasitic inductance
• Advance design for twice the capacitance on single footprint
• Improved vibration and thermal/mechanical stress performance
• Lower ESR and ESL than ALU and TA capacitor
• Unique internal structure allows cancelation of magnetic fields to reduce
equivalent series inductance
• Eight sided terminal electrode design in one capacitor
• 01005 ~ 2220 / C0G, SL, X5R, X6S, X7R, X7S, Y5V
• 4V ~ 50V / up to 100 µF
• 0402 ~ 2220 / C0G, X6S, X7R, X7S, X7T
• 100V ~ 630V / up to 15 µF
• 1808 ~ 1812 / C0G, X7R, X7S
• 1000V ~ 3000V / up to 10 nF
• 0402 ~ 1210 / X8R
• 16V ~ 100V / up to 10 µF
• 0201 / C0G
• 25V / up to 20 pF
• 0204 ~ 0612 / X5R, X6S, X7R, X7S
• 4V ~ 50V / up to 10 µF
• 0805 ~ 2220 / X7R, X8R
• 16V ~ 630V / up to 22 µF
• 0805 ~ 3025 / X7R, X7S, X7T
• 16V ~ 630V / up to 100 µF
• 0402 ~ 1210 / C0G, X7R, X8R
• 25V ~ 100V / up to 10 µF
• 0603 ~ 0805 / X5R
• 4V ~ 10V / up to 10 µF
C
High Temperature
High Q
Flip Type
Open Mode
Soft Termination
Conductive Epoxy
CER
Controlled ESR
CEU
Serial Design
• 0603 ~ 0805 / X7R
• 50V / up to 100 nF
CGA
Automotive
Applications
High Reliability
Applications
2-in-1 Array
4-in-1 Array
• 0402 ~ 2220 / C0G, X5R, X7R, X7S, X7T, X8R
• 6.3V ~ 630V / up to 47 µF
CGJ
• 0402 ~ 1206 / C0G, X7R
• 6.3V ~ 50V / up to 10 µF
CKC
• CKCN27 ~ CKCA43 / C0G, X5R, X7R
• 6.3V ~ 50V / up to 2.2 µF
CKD
Feed Through
• 0402 ~ 1206 / up to 125ºC temperature range
• 6.3V ~ 50V / up to 22 µF
CKG
CLL
Mega Cap
Ultra Low
Inductance
• CKGxxK ~ CKGxxN / X5R, X7R, X7S, X7T
• 16V ~ 630V / up to 100 µF
• 0603 ~ 0805 / X7R, X7S
• 4V ~ 10V / up to 4.7 µF
TDK
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TDK MLCC
Presentation
CGJ series l High Reliability Series- Series Concept -
Concept Image
Qualification
Applications
Smart Meter/Smart Grid
Solar Micro Inverters
Industrial /Military/Medical Electronics
Applications requiring Hi-Rel components
CGJ
series
Reliability
AEC-Q200
select MIL-STD
CGA series
C series
- General Applications -
AEC-Q200
Engine Control Units
Sensor Modules
Automotive Battery Line
Anti-lock Break System
Automotive Infotainment System
EV/HEV/PHEV Battery Control
General Consumer Electronics
Mobile Communication Equipment
Power Supply Circuit
Office Automation Equipment
Servers/PCs/Laptops/Tablets
Test & Measurement Equipment
TDK Standard
Specifications
Capacitance Range
TDK
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TDK MLCC
Presentation
Insulation Resistance
Volta g e Proof Te s t (DWV)
Ca p a c ita nc e / Dis s ip a tion Fa c tor (DF, Q)
Exte rna l Ap p e a ra nc e / Vis ua l Ins p e c tion
Phys ic a l Dime ns ion
Sold e ra b ility
Te mp e ra ture Cha ra c te ris tic s
De fle c tion (Be nd ing ; Boa rd Fle x)
Op e ra ting Life
Bia s Humid ity
De s truc tive Phys ic a l Ana lys is (DPA)
Hig hly Ac c e le ra te d Life Te s t (HALT)
DC Bia s / ESR / Bre a kd own Volta g e
Sa lt Wa te r Imme rs ion / Tin Whis ke r
Commercial Grade
C Series
100% of e a c h lot
Automotive Grade
CGA Series
100% of e a c h lot
High Reliability Grade
CGJ Series
100% of e a c h lot
100% of e a c h lot
100% of e a c h lot
100% of e a c h lot
100% of e a c h lot
100% of e a c h lot
100% of e a c h lot
Sa mp le d e a c h lot
100%
100%
Sa mp le d e a c h lot
Sa mp le d e a c h lot
Sa mp le d e a c h lot
Sa mp le d e a c h lot
Sa mp le d e a c h lot
Sa mp le d e a c h lot
Qua lific a tion Only
Qua lific a tion Only
Sa mp le d e a c h lot (n= 10)
Qua lific a tion Only
Qua lific a tion Only
Sa mp le d e a c h lot (n= 10)
Qua lific a tion Only
-
-
Qua lific a tion (X• RV for 1,000 hrs )
Qua lific a tion (X• RV for
2,000 hrs
)
Qua lific a tion (RV only)
Qua lific a tion (RV a nd LV)
Qua lific a tion Only
Sa mp le d e a c h lot (n= 10)
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-
-
-
-
-
Sa mp le d e a c h lot (n= 60)
Qua lific a tion Only (n= 50)
Qua lific a tion Only
*Ple a s e re fe r to TDK Sp e c ific a tions (www.td
k.c om)
a nd Ce rtific a te of Comp lia nc e for more d e ta il on te s t me thod a nd a c c e p ta nc e c rite ria a s we ll a s s a mp le d lot s ize .
TDK
5
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