5962-9162701MCA [TI]

军用 4 通道、2 输入、4.5V 至 5.5V 双极与非门 | J | 14 | -55 to 125;
5962-9162701MCA
型号: 5962-9162701MCA
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

军用 4 通道、2 输入、4.5V 至 5.5V 双极与非门 | J | 14 | -55 to 125

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SN54AS1000A, SN74AS1000A  
QUADRUPLE 2-INPUT POSITIVE-NAND BUFFERS/DRIVERS  
SDAS056B – APRIL 1984 – REVISED JANUARY 1995  
SN54AS1000A . . . J PACKAGE  
SN74AS1000A . . . D OR N PACKAGE  
(TOP VIEW)  
Driver Version of AS00  
High Capacitive-Drive Capability  
Package Options Include Plastic  
Small-Outline (D) Packages, Ceramic Chip  
Carriers (FK), and Standard Plastic (N) and  
Ceramic (J) 300-mil DIPs  
1A  
1B  
1Y  
2A  
2B  
V
CC  
1
2
3
4
5
6
7
14  
13  
12  
11  
10  
9
4B  
4A  
4Y  
3B  
3A  
3Y  
description  
2Y  
GND  
These devices contain four independent 2-input  
positive-NAND buffers/drivers. They perform the  
Boolean functions Y = A B or Y = A + B in positive  
logic.  
8
SN54AS1000A . . . FK PACKAGE  
(TOP VIEW)  
The SN54AS1000A is characterized for operation  
over the full military temperature range of 55°C  
to 125°C. The SN74AS1000A is characterized for  
operation from 0°C to 70°C.  
3
2
1
20 19  
18  
1Y  
NC  
2A  
4
5
6
7
8
4A  
NC  
4Y  
NC  
3B  
17  
16  
15  
14  
FUNCTION TABLE  
(each gate)  
INPUTS  
OUTPUT  
NC  
2B  
Y
A
H
L
B
H
X
L
9 10 11 12 13  
L
H
H
X
NC – No internal connection  
logic symbol  
logic diagram (positive logic)  
1
1A  
2
1
&
3
6
1A  
2
3
6
1Y  
2Y  
3Y  
4Y  
1Y  
2Y  
3Y  
4Y  
1B  
4
1B  
4
2A  
5
2A  
5
2B  
9
2B  
3A  
10  
3B  
12  
4A  
13  
4B  
9
3A  
8
8
10  
3B  
11  
12  
4A  
11  
13  
4B  
This symbol is in accordance with ANSI/IEEE Std 91-1984 and  
IEC Publication 617-12.  
Pin numbers shown are for the D, J, and N packages.  
Copyright 1995, Texas Instruments Incorporated  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of Texas Instruments  
standard warranty. Production processing does not necessarily include  
testing of all parameters.  
1
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
SN54AS1000A, SN74AS1000A  
QUADRUPLE 2-INPUT POSITIVE-NAND BUFFERS/DRIVERS  
SDAS056B – APRIL 1984 – REVISED JANUARY 1995  
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)  
Supply voltage, V  
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 V  
CC  
Input voltage, V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 V  
I
Operating free-air temperature range, T : SN54AS1000A . . . . . . . . . . . . . . . . . . . . . . . . . . . 55°C to 125°C  
A
SN74AS1000A . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0°C to 70°C  
Storage temperature range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 65°C to 150°C  
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and  
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not  
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.  
recommended operating conditions  
SN54AS1000A  
MIN NOM MAX  
SN74AS1000A  
MIN NOM MAX  
UNIT  
V
V
V
Supply voltage  
4.5  
2
5
5.5  
4.5  
2
5
5.5  
V
V
CC  
High-level input voltage  
Low-level input voltage  
High-level output current  
Low-level output current  
Operating free-air temperature  
IH  
0.8  
40  
40  
0.8  
48  
48  
V
IL  
I
I
mA  
mA  
°C  
OH  
OL  
T
A
55  
125  
0
70  
These high sink- or source-current devices are not recommended for use above 40 MHz.  
electrical characteristics over recommended operating free-air temperature range (unless  
otherwise noted)  
SN54AS1000A  
SN74AS1000A  
PARAMETER  
TEST CONDITIONS  
UNIT  
§
§
MIN TYP  
MAX  
MIN TYP  
MAX  
V
V
V
= 4.5 V,  
I = –18 mA  
–1.2  
–1.2  
V
IK  
CC  
I
= 4.5 V to 5.5 V,  
I
I
I
I
I
I
= 2 mA  
= 3 mA  
= 40 mA  
= 48 mA  
= 40 mA  
= 48 mA  
V
–2  
V
–2  
CC  
OH  
OH  
OH  
OH  
OL  
OL  
CC  
2.4  
CC  
2.4  
3.2  
3.2  
V
OH  
V
V
CC  
= 4.5 V  
2
2
0.25  
0.5  
V
OL  
V
CC  
= 4.5 V  
V
0.35  
0.5  
0.1  
I
I
I
I
I
I
V
CC  
V
CC  
V
CC  
V
CC  
V
CC  
V
CC  
= 5.5 V,  
= 5.5 V,  
= 5.5 V,  
= 5.5 V,  
= 5.5 V,  
= 5.5 V,  
V = 7 V  
I
0.1  
20  
mA  
µA  
I
V = 2.7 V  
I
20  
IH  
V = 0.4 V  
I
0.5  
200  
3.5  
0.5  
200  
3.5  
mA  
mA  
mA  
mA  
IL  
V
O
= 2.25 V  
30  
50  
O
V = 0  
I
2.2  
12  
2.2  
12  
CCH  
CCL  
V = 4.5 V  
I
19  
19  
§
All typical values are at V  
= 5 V, T = 25°C.  
A
CC  
The output conditions have been chosen to produce a current that closely approximates one half of the true short-circuit output current, I  
.
OS  
2
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
SN54AS1000A, SN74AS1000A  
QUADRUPLE 2-INPUT POSITIVE-NAND BUFFERS/DRIVERS  
SDAS056B – APRIL 1984 – REVISED JANUARY 1995  
switching characteristics (see Figure 1)  
V
C
R
= 4.5 V to 5.5 V,  
= 50 pF,  
CC  
L
L
= 500 ,  
FROM  
TO  
(OUTPUT)  
PARAMETER  
(INPUT)  
UNIT  
T
A
= MIN to MAX  
SN54AS1000A SN74AS1000A  
MIN  
1
MAX  
MIN  
1
MAX  
t
t
5
5
4
4
PLH  
A or B  
Y
ns  
1
1
PHL  
For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions.  
3
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
SN54AS1000A, SN74AS1000A  
QUADRUPLE 2-INPUT POSITIVE-NAND BUFFERS/DRIVERS  
SDAS056B – APRIL 1984 – REVISED JANUARY 1995  
PARAMETER MEASUREMENT INFORMATION  
SERIES 54ALS/74ALS AND 54AS/74AS DEVICES  
7 V  
R
= R1 = R2  
V
CC  
L
S1  
R1  
R
L
Test  
Point  
From Output  
Under Test  
From Output  
Under Test  
Test  
Point  
Test  
Point  
From Output  
Under Test  
C
C
L
R
L
R2  
L
C
L
(see Note A)  
(see Note A)  
(see Note A)  
LOAD CIRCUIT FOR  
BI-STATE  
TOTEM-POLE OUTPUTS  
LOAD CIRCUIT  
FOR OPEN-COLLECTOR OUTPUTS  
LOAD CIRCUIT  
FOR 3-STATE OUTPUTS  
3.5 V  
3.5 V  
Timing  
Input  
High-Level  
1.3 V  
1.3 V  
1.3 V  
Pulse  
0.3 V  
0.3 V  
t
h
t
w
t
su  
3.5 V  
3.5 V  
0.3 V  
Data  
Input  
Low-Level  
1.3 V  
1.3 V  
1.3 V  
1.3 V  
Pulse  
0.3 V  
VOLTAGE WAVEFORMS  
SETUP AND HOLD TIMES  
VOLTAGE WAVEFORMS  
PULSE DURATIONS  
3.5 V  
0.3 V  
Output  
Control  
(low-level  
enabling)  
1.3 V  
1.3 V  
3.5 V  
t
PZL  
Input  
1.3 V  
1.3 V  
t
PLZ  
0.3 V  
PHL  
3.5 V  
t
Waveform 1  
S1 Closed  
(see Note B)  
t
PLH  
1.3 V  
V
OH  
In-Phase  
Output  
1.3 V  
1.3 V  
1.3 V  
V
OL  
0.3 V  
V
OL  
t
PHZ  
t
PLH  
t
PZH  
t
PHL  
V
OH  
V
Waveform 2  
S1 Open  
(see Note B)  
OH  
OL  
Out-of-Phase  
Output  
(see Note C)  
1.3 V  
1.3 V  
0.3 V  
V
0 V  
VOLTAGE WAVEFORMS  
PROPAGATION DELAY TIMES  
VOLTAGE WAVEFORMS  
ENABLE AND DISABLE TIMES, 3-STATE OUTPUTS  
NOTES: A.  
C includes probe and jig capacitance.  
L
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.  
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.  
C. When measuring propagation delay items of 3-state outputs, switch S1 is open.  
D. All input pulses have the following characteristics: PRR 1 MHz, t = t = 2 ns, duty cycle = 50%.  
r
f
E. The outputs are measured one at a time with one transition per measurement.  
Figure 1. Load Circuits and Voltage Waveforms  
4
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
IMPORTANT NOTICE  
Texas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue  
any product or service without notice, and advise customers to obtain the latest version of relevant information  
to verify, before placing orders, that information being relied on is current and complete. All products are sold  
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those  
pertaining to warranty, patent infringement, and limitation of liability.  
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in  
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent  
TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily  
performed, except those mandated by government requirements.  
CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF  
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL  
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR  
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER  
CRITICAL APPLICATIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERSTOOD TO  
BE FULLY AT THE CUSTOMER’S RISK.  
In order to minimize risks associated with the customer’s applications, adequate design and operating  
safeguards must be provided by the customer to minimize inherent or procedural hazards.  
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent  
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other  
intellectual property right of TI covering or relating to any combination, machine, or process in which such  
semiconductor products or services might be or are used. TI’s publication of information regarding any third  
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.  
Copyright 1998, Texas Instruments Incorporated  

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