5962-9673201QYX [TI]
100K SERIES, QUAD 1-INPUT INV/NINV GATE, CQFP24, CERPACK-24;型号: | 5962-9673201QYX |
厂家: | TEXAS INSTRUMENTS |
描述: | 100K SERIES, QUAD 1-INPUT INV/NINV GATE, CQFP24, CERPACK-24 输入元件 逻辑集成电路 |
文件: | 总6页 (文件大小:119K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
August 1998
100313
Low Power Quad Driver
General Description
Features
n 50% power reduction of the 100113
n 2000V ESD protection
The 100313 is a monolithic quad driver with two OR and two
NOR outputs and common enable. The common input is
buffered to minimize input loading. If the D inputs are not
used the Enable can be used to drive sixteen 50Ω lines. All
inputs have 50 kΩ pull-down resistors and all outputs are
buffered.
n Pin/function compatible with 100113 and 100112
n Voltage compensated operating range −4.2V to −5.7V
n Standard Microcircuit Drawing
(SMD) 5962-9673201
=
Logic Symbol
Pin Names
Da–Dd
Description
Data Inputs
E
Enable Input
O
O
na–Ond
na–Ond
Data Outputs
Complementary Data Outputs
DS100297-3
Connection Diagrams
24-Pin DIP
24-Pin Flatpak
DS100297-2
DS100297-1
© 1998 National Semiconductor Corporation
DS100297
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PrintDate=1998/08/31 PrintTime=07:05:03 45028 ds100297 Rev. No. 1 cmserv Proof
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Absolute Maximum Ratings (Note 1)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Recommended Operating
Conditions
Case Temperature (TC)
Military
−55˚C to +125˚C
−5.7V to −4.2V
Storage Temperature (TSTG
)
−65˚C to +150˚C
Supply Voltage (VEE
)
Maximum Junction Temperature (TJ)
Ceramic
Note 1: Absolute maximum ratings are those values beyond which the de-
vice may be damaged or have its useful life impaired. Functional operation
under these conditions is not implied.
+175˚C
−7.0V to +0.5V
VEE to +0.5V
−50 mA
VEE Pin Potential to Ground Pin
Input Voltage (DC)
Note 2: ESD testing conforms to MIL-STD-883, Method 3015.
Output Current (DC Output HIGH)
ESD (Note 2)
≥2000V
Military Version
DC Electrical Characteristics
=
=
=
=
VEE −4.2V to −5.7V, VCC VCCA GND, TC −55˚C to +125˚C
Symbol
Parameter
Min
Max Units
TC
Conditions
Notes
VOH
Output HIGH Voltage
−1025 −870
−1085 −870
−1830 −1620
−1830 −1555
−1035
mV
mV
mV
mV
mV
mV
mV
mV
mV
0˚C to +125˚C
−55˚C
=
VIN VIH (Max) Loading with
(Notes 3, 4,
5)
VOL
VOHC
VOLC
VIH
VIL
Output LOW Voltage
Output HIGH Voltage
Output LOW Voltage
Input HIGH Voltage
Input LOW Voltage
Input LOW Current
0˚C to +125˚C
−55˚C
or VIL(Min)
50Ω to −2.0V
0˚C to +125˚C
−55˚C
=
−1085
VIN VIH (Min)
Loading with
(Notes 3, 4,
5)
−1610
0˚C to +125˚C
−55˚C
or VIL (Max)
50Ω to −2.0V
−1555
−1165 −870
−55˚C to +125˚C
Guaranteed HIGH Signal
for All Inputs
(Notes 3, 4,
5, 6)
−1830 −1475
0.50
mV
µA
−55˚C to +125˚C
−55˚C to +125˚C
Guaranteed LOW Signal
for All Inputs
(Notes 3, 4,
5, 6)
=
VEE −4.2V
IIL
(Notes 3, 4,
5)
=
VIN VIL (Min)
IIH
Input HIGH Current
Data
350
240
500
340
µA
µA
0˚C to +125˚C
−55˚C
=
VEE −5.7V
Enable
(Notes 3, 4,
5)
=
Data
Enable
VIN VIH (Max)
IEE
Power Supply Current
−65
−20
mA
−55˚C to +125˚C
Inputs Open
(Notes 3, 4,
5)
Note 3: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately
without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides “cold start” specs which can be considered a worst case
condition at cold temperatures.
Note 4: Screen tested 100% on each device at −55˚C, +25˚C, and +125˚C, Subgroups 1, 2, 3, 7, and 8.
Note 5: Sample tested (Method 5005, Table I) on each manufactured lot at −55˚C, +25˚C, and +125˚C, Subgroups A1, 2, 3, 7, and 8.
Note 6: Guaranteed by applying specified input condition and testing V /V
.
OH OL
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PrintDate=1998/08/31 PrintTime=07:05:03 45028 ds100297 Rev. No. 1 cmserv Proof
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Military Version
AC Electrical Characteristics
=
=
=
VEE −4.2V to −5.7V, VCC VCCA GND
=
=
=
Symbol
Parameter
TC −55˚C
TC +25˚C
TC +125˚C
Units
ns
Conditions
Notes
Min
Max
Min
Max
Min
Max
tPLH
tPHL
tPLH
tPHL
tTLH
tTHL
Propagation Delay
Data to Output
0.30
2.00
0.30
1.80
0.30
2.30
(Notes 7,
8, 10, 11)
Propagation Delay
Enable to Output
Transition Time
0.50
0.30
2.40
2.00
0.60
0.30
2.30
1.90
0.60
0.30
2.70
2.00
ns
Figures 1, 2
ns
(Note 10)
20% to 80%, 80% to
20%
Note 7: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately
after power-up. This provides “cold start” specs which can be considered a worst case condition at cold temperatures.
Note 8: Screen tested 100% on each device at +25˚C, Subgroup A9.
Note 9: Sample tested (Method 5005, Table I) on each manufactured lot at +25˚C, Subgroup A9, and at +125˚C and −55˚C temperatures, Subgroups A10 and A11.
Note 10: Not tested at +25˚C, +125˚C, and −55˚C temperature (design characterization data).
Note 11: The propagation delay specified is for single output switching. Delays may vary up to 150 ps with multiple outputs switching.
Test Circuitry
DS100297-5
Notes:
=
=
EE
V , V
CC
+2V, V
−2.5V.
CCA
=
L1 and L2 equal length 50Ω impedance lines.
=
R
50Ω terminator internal to scope.
T
Decoupling 0.1 µF from GND to V and V
.
CC EE
All unused outputs are loaded with 50Ω to GND.
=
C
L
Fixture and stray capacitance ≤ 3 pF.
Pin numbers shown are for flatpak; for DIP see logic symbol.
FIGURE 1. AC Test Circuit
3
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Switching Waveforms
Book
Extract
End
DS100297-6
FIGURE 2. Propagation Delay and Transition Times
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Physical Dimensions inches (millimeters) unless otherwise noted
24-Pin Ceramic Dual-In-Line Package (D)
NS Package Number J24E
24-Pin Quad Cerpak (F)
NS Package Number W24B
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VICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL SEMI-
CONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or sys-
tems which, (a) are intended for surgical implant into
the body, or (b) support or sustain life, and whose fail-
ure to perform when properly used in accordance
with instructions for use provided in the labeling, can
be reasonably expected to result in a significant injury
to the user.
2. A critical component in any component of a life support
device or system whose failure to perform can be rea-
sonably expected to cause the failure of the life support
device or system, or to affect its safety or effectiveness.
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