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元器件品牌
74ABT18245ADGGRE4
[TI]
SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS; 18位总线收发器扫描测试设备
元器件型号：
74ABT18245ADGGRE4
生产厂家：
TEXAS INSTRUMENTS
描述和应用：
SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS
18位总线收发器扫描测试设备
总线驱动器 总线收发器 逻辑集成电路 测试 光电二极管 信息通信管理
PDF文件：
总34页 (文件大小：618K)
下载文档：
下载PDF数据表文档文件
型号参数：74ABT18245ADGGRE4参数
查看货源
74ABT18245ADGGRG4
SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS
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TI
74ABT18245ADGGRG4
Scan Test Devices With 18-Bit Bus Transceivers 56-TSSOP -40 to 85
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TI
74ABT18640DGGRE4
IC ABT SERIES, DUAL 9-BIT BOUNDARY SCAN TRANSCEIVER, INVERTED OUTPUT, PDSO56, GREEN, PLASTIC, TSSOP-56, Bus Driver/Transceiver
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TI
74ABT20
Dual 4-input NAND gate
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25
PHILIPS
74ABT20D
Dual 4-input NAND gate
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25
PHILIPS
74ABT20DB
Dual 4-input NAND gate
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28
PHILIPS
74ABT20DB,112
74ABT20 - Dual 4-input NAND gate SSOP1 14-Pin
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0
PHILIPS
74ABT20DB-T
Dual 4-input NAND Gate
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20
ETC
74ABT20D-T
Dual 4-input NAND Gate
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11
ETC
74ABT20N
Dual 4-input NAND gate
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18
PHILIPS
74ABT20PW
Dual 4-input NAND gate
Warning
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156
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28
PHILIPS
74ABT20PW,112
74ABT20 - Dual 4-input NAND gate TSSOP 14-Pin
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0
PHILIPS
74ABT20PW,118
74ABT20 - Dual 4-input NAND gate TSSOP 14-Pin
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0
PHILIPS
74ABT20PWDH
Dual 4-input NAND gate
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18
PHILIPS
74ABT20PW-T
Dual 4-input NAND Gate
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12
ETC
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