74ACTQ18825SSCX [TI]

ACT SERIES, DUAL 9-BIT DRIVER, TRUE OUTPUT, PDSO56, 0.300 INCH, SSOP-56;
74ACTQ18825SSCX
型号: 74ACTQ18825SSCX
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

ACT SERIES, DUAL 9-BIT DRIVER, TRUE OUTPUT, PDSO56, 0.300 INCH, SSOP-56

驱动 光电二极管 输出元件 逻辑集成电路
文件: 总8页 (文件大小:133K)
中文:  中文翻译
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March 1993  
74ACTQ18825 18-Bit  
Buffer/Line Driver with TRI-STATE Outputs  
É
General Description  
Features  
Y
Utilizes NSC FACT Quiet Series technology  
Broadside pinout allows for easy board layout  
Guaranteed simultaneous switching noise level and dy-  
namic threshold performance  
The ’ACTQ18825 contains eighteen non-inverting buffers  
with TRI-STATE outputs designed to be employed as a  
memory and address driver, clock driver, or bus oriented  
transmitter/receiver. The device is byte controlled. Each  
byte has separate TRI-STATE control inputs which can be  
shorted together for full 18-bit operation.  
Y
Y
Y
Y
Y
Guaranteed pin-to-pin output skew  
Separate control logic for each byte  
The ’ACTQ18825 utilizes NSC Quiet Series technology to  
guarantee quiet output switching and improved dynamic  
threshold performance. FACT Quiet SeriesTM features  
GTOTM output control and undershoot corrector for superior  
performance.  
Extra data width for wider address/data paths or buses  
carrying parity  
Y
Y
Y
Outputs source/sink 24 mA  
Additional specs for Multiple Output Switching  
Output loading specs for both 50 pF and 250 pF loads  
Logic Symbol  
Connection Diagram  
Pin Assignment  
for SSOP  
TL/F/10955–1  
TL/F/10955–2  
TRI-STATEÉ is a registered trademark of National Semiconductor Corporation.  
FACTTM, FACT Quiet SeriesTM and GTOTM are trademarks of National Semiconductor Corporation.  
C
1995 National Semiconductor Corporation  
TL/F/10955  
RRD-B30M75/Printed in U. S. A.  
Functional Description  
Pin Description  
The ’ACTQ18825 contains eighteen non-inverting buffers  
with TRI-STATE standard outputs. The device is byte con-  
trolled with each byte functioning identically, but indepen-  
dent of the other. The control pins may be shorted together  
to obtain full 8-bit operation. The TRI-STATE outputs are  
Pin Names  
Description  
OE  
n
Output Enable Input (Active Low)  
I I  
0 17  
Inputs  
O O  
0 17  
Outputs  
controlled by an Output Enable (OE ) input for each byte.  
n
When OE is LOW, the outputs are in 2-state mode. When  
n
OE is HIGH, the outputs are in the high impedance mode,  
n
but this does not interfere with entering new data into the  
inputs.  
Truth Table  
Inputs  
Outputs  
Byte 1 (0:8)  
OE  
Byte 2 (8:17)  
OE  
4
I I  
0
I I  
9
O O  
0
O O  
9 17  
8
17  
8
OE  
1
OE  
3
2
L
H
X
L
L
X
H
L
L
L
L
L
H
X
X
L
H
L
H
Z
Z
L
H
L
L
L
H
X
X
X
L
H
Z
Z
Z
L
H
X
H
L
X
H
H
L
L
L
H
X
L
H
Z
L
H
L
H
L
e
e
e
e
H
L
High Voltage Level  
Low Voltage Level  
Immaterial  
X
Z
High Impedance  
Logic Diagram  
TL/F/10955–3  
2
Absolute Maximum Ratings (Note 1)  
If Military/Aerospace specified devices are required,  
please contact the National Semiconductor Sales  
Office/Distributors for availability and specifications.  
Recommended Operating  
Conditions  
Supply Voltage (V  
’ACTQ  
)
CC  
4.5V to 5.5V  
b
a
0.5V to 7.0V  
Supply Voltage (V  
)
CC  
Input Voltage (V )  
I
0V to V  
0V to V  
CC  
DC Input Diode Current (I  
)
IK  
Output Voltage (V  
)
O
CC  
e b  
b
a
V
I
V
I
0.5V  
a
20 mA  
20 mA  
Operating Temperature (T )  
A
74ACTQ  
e
V
CC  
0.5V  
b
a
40 C to 85 C  
§
§
DC Output Diode Current (I  
)
OK  
Minimum Input Edge Rate dV/dt  
’ACTQ Devices  
e b  
b
a
V
V
0.5V  
a
20 mA  
20 mA  
O
O
125 mV/ns  
e
V
CC  
0.5V  
V
V
from 0.8V to 2.0V  
@
IN  
b
a
0.5V  
DC Output Voltage (V  
)
O
0.5V to V  
CC  
4.5V, 5.5V  
CC  
g
DC Output Source/Sink Current (I  
)
O
50 mA  
DC V  
or Ground Current  
CC  
Per Output Pin  
g
50 mA  
Junction Temperature  
PDIP SOIC  
a
140 C  
§
b
a
65 C to 150 C  
Storage Temperature  
§
§
4000V  
ESD Last Passing Voltage (Min)  
Note 1: Absolute maximum ratings are those values beyond which damage  
to the device may occur. The databook specifications should be met, without  
exception, to ensure that the system design is reliable over its power supply,  
temperature, and output/input loading variables. National does not recom-  
mend operation of FACTTM circuits outside databook specifications.  
Note 2: For qualification information please refer to the NSC SSOP Qualifi-  
cation Handbook.  
DC Electrical Characteristics for ACTQ Family Devices  
74ACTQ  
74ACTQ  
e
a
V
CC  
(V)  
T
A
40 C to 85 C  
e a  
Symbol  
Parameter  
Units  
Conditions  
T
25 C  
§
A
b
§
§
Typ  
Guaranteed Limits  
e
0.1V  
V
V
V
Minimum High  
Input Voltage  
4.5  
5.5  
1.5  
1.5  
2.0  
2.0  
2.0  
2.0  
V
IH  
OUT  
V
V
V
b
or V  
CC  
0.1V  
e
Maximum Low  
Input Voltage  
4.5  
5.5  
1.5  
1.5  
0.8  
0.8  
0.8  
0.8  
V
OUT  
0.1V  
IL  
b
or V  
CC  
0.1V  
e b  
OUT  
Minimum High  
Output Voltage  
4.5  
5.5  
4.49  
5.49  
4.4  
5.4  
4.4  
5.4  
I
50 mA  
OH  
e
*V  
IN  
V
IL  
or V  
IH  
24 mA  
24 mA  
b
b
4.5  
5.5  
3.86  
4.86  
3.76  
4.76  
V
V
I
OH  
e
e
V
OL  
Maximum Low  
Output Voltage  
4.5  
5.5  
0.001  
0.001  
0.1  
0.1  
0.1  
0.1  
I
50 mA  
OUT  
*V  
IN  
V or V  
IL IH  
4.5  
5.5  
0.36  
0.36  
0.44  
0.44  
24 mA  
V
I
OL  
24 mA  
e
I
I
I
Maximum TRI-STATE  
Leakage Current  
V
V
, V  
IL IH  
OZ  
g
g
g
g
5.5  
0.5  
0.1  
5.0  
1.0  
mA  
e
V
O
V
, GND  
CC  
e
Maximum Input  
Leakage Current  
V
V
CC  
, GND  
IN  
I
5.5  
5.5  
5.5  
mA  
mA  
mA  
e
b
I
I
Maximum I /Input  
CC  
0.6  
1.5  
V
V
V
CC  
2.1V  
CCT  
CC  
I
e
Maximum Quiescent  
Supply Current  
V
CC  
or GND  
IN  
8.0  
80.0  
75  
e
e
²
I
I
Minimum Dynamic  
mA  
mA  
V
V
1.65V Max  
3.85V Min  
OLD  
OHD  
OLD  
5.5  
Output Current  
b
75  
OHD  
*All outputs loaded; thresholds associated with output under test.  
²
Maximum test duration 2.0 ms, one output loaded at a time.  
3
DC Electrical Characteristics for ACTQ Family Devices (Continued)  
74ACTQ  
74ACTQ  
e
a
V
T
A
40 C to 85 C  
CC  
(V)  
e a  
Symbol  
Parameter  
Units  
Conditions  
T
Typ  
0.5  
25 C  
§
A
b
§
§
Guaranteed Limits  
0.8  
V
OLP  
V
OLV  
V
OHP  
V
OHV  
Quiet Output  
Figures 2-12, 13  
(Notes 2, 3)  
5.0  
5.0  
5.0  
5.0  
V
V
V
V
Maximum Dynamic V  
OL  
OL  
Quiet Output  
Figures 2-12, 13  
(Notes 2, 3)  
b
b
0.8  
0.5  
Minimum Dynamic V  
Maximum  
Overshoot  
Figures 2-12, 13  
(Notes 1, 3)  
a
b
a
b
V
V
1.0  
1.0  
V
OH  
V
OH  
1.5  
1.8  
OH  
OH  
Minimum V  
CC  
Figures 2-12, 13  
(Notes 1, 3)  
V
CC  
Droop  
Minimum High  
Dynamic Input  
Voltage Level  
V
IHD  
V
ILD  
5.0  
5.0  
1.7  
1.2  
2.0  
0.8  
V
V
(Notes 1, 4)  
(Notes 1, 4)  
Maximum Low  
Dynamic Input  
Voltage Level  
Note 1: Worst case package.  
Note 2: Maximum number of outputs that can switch simultaneously is n. (n-1) outputs are switched LOW and one output held LOW.  
Note 3: Maximum number of outputs that can switch simultaneously is n. (n-1) outputs are switched HIGH and one output held HIGH.  
Note 4: Maximum number of data inputs (n) switching (n-1) input switching 0V to 3V (’ACTQ). Input under test switching 3V to threshold (VILD).  
AC Electrical Characteristics  
74ACTQ  
74ACTQ  
e a  
e b  
A
a
V
*
T
25 C  
T
40 C to 85 C  
§
CC  
§
50 pF  
§
A
Symbol  
Parameter  
Units  
e
e
(V)  
C
C
L
50 pF  
L
Min  
Typ  
Max  
Min  
Max  
t
t
Propagation Delay  
Data to Output  
2.0  
2.0  
5.3  
5.6  
8.4  
8.7  
2.0  
2.0  
9.0  
9.2  
PHL  
5.0  
5.0  
5.0  
ns  
ns  
ns  
PLH  
t
t
Output Enable  
Time  
2.0  
2.0  
6.3  
6.5  
9.6  
9.7  
2.0  
2.0  
10.3  
10.4  
PZL  
PZH  
t
t
Output Disable  
Time  
1.5  
1.5  
4.5  
5.1  
7.3  
8.5  
1.5  
1.5  
7.6  
8.8  
PLZ  
PHZ  
g
*Voltage Range 5.0 is 5.0V 0.5V.  
4
Extended AC Electrical Characteristics  
74ACTQ  
54ACTQ  
74ACTQ  
e b  
54ACTQ  
e b  
e
A
T
40 C  
T
Mil  
Mil  
§
to 85 C  
A
T
40 C  
§
to 85 C  
A
a
e
e
e
T
A
V
Mil  
Mil  
§
Com  
CC  
a
e
§
Com  
e
e
Units  
V
C
L
50 pF  
V
CC  
CC  
Symbol  
Parameter  
V
CC  
e
16 Outputs  
e
(Note 3)  
C
50 pF  
16 Outputs)  
Switching  
(Note 2)  
C
250 pF  
L
L
e
(Note 3)  
C
250 pF  
L
Switching (Note 2)  
Min  
Typ  
Max  
Min  
Max  
Min Max  
Min  
Max  
t
t
Propagation Delay  
Data to Output  
6.5  
5.5  
8.0  
6.5  
9.8  
8.9  
PLH  
PHL  
ns  
ns  
ns  
ns  
ns  
ns  
t
t
Output Enable Time  
Output Disable Time  
Pin to Pin Skew  
6.1  
6.5  
7.6  
7.8  
9.2  
9.4  
PZH  
(Note 4)  
(Note 4)  
(Note 5)  
PZL  
t
t
3.1  
3.5  
5.0  
5.2  
6.1  
6.5  
PHZ  
PLZ  
(Note 5)  
t
OSHL  
(Note 1) HL Data to Output  
Pin to Pin Skew  
(Note 1) LH Data to Output  
Pin to Pin Skew  
(Note 1) LH/HL Data to Output  
t
OSLH  
t
OST  
Note 1: Skew is defined as the absolute value of the difference between the actual propagation delays for any two separate outputs of the same device. The  
specification applies to any outputs switching HIGH to LOW (t ), LOW to HIGH (t ), or any combination switching LOW to HIGH and/or HIGH to LOW  
OSHL OSLH  
(t  
OST  
).  
Note 2: This specification is guaranteed but not tested. The limits apply to propagation delays for all paths described switching in phase (i.e., all low-to-high, high-  
to-low, etc.).  
Note 3: This specification is guaranteed but not tested. The limits represent propagation delays with 250 pF load capacitors in place of the 50 pF load capacitors in  
the standard AC load. This specification pertains to single output switching only.  
Note 4: TRI-STATE delays are load dominated and have been excluded from the datasheet.  
Note 5: The Output Disable Time is dominated by the RC network (500X, 250 pF) on the output and has been excluded from the datasheet.  
Capacitance  
Symbol  
Parameter  
Typ  
Units  
Conditions  
e
e
C
C
Input Pin Capacitance  
4.5  
pF  
V
V
5.0V  
5.0V  
IN  
CC  
Power Dissipation  
Capacitance  
PD  
CC  
95  
pF  
5
FACT Noise Characteristics  
The setup of a noise characteristics measurement is critical  
to the accuracy and repeatability of the tests. The following  
is a brief description of the setup used to measure the noise  
characteristics of FACT.  
6. Set the word generator input levels at 0V LOW and 3V  
HIGH for ACT devices and 0V LOW and 5V HIGH for AC  
devices. Verify levels with a digital volt meter.  
V /V  
OLP OLV  
and V  
/V :  
OHP OHV  
Equipment:  
Determine the quiet output pin that demonstrates the  
greatest noise levels. The worst case pin will usually be  
the furthest from the ground pin. Monitor the output volt-  
ages using a 50X coaxial cable plugged into a standard  
SMB type connector on the test fixture. Do not use an  
active FET probe.  
#
Hewlett Packard Model 8180A Word Generator  
PC-163A Test Fixture  
Tektronics Model 7854 Oscilloscope  
Procedure:  
1. Verify Test Fixture Loading: Standard Load 50 pF, 500X.  
Measure V  
and V  
OLV  
on the quiet output during the  
and V on the quiet out-  
#
#
OLP  
HL transition. Measure V  
2. Deskew the word generator so that no two channels have  
greater than 150 ps skew between them. This requires  
that the oscilloscope be deskewed first. Swap out the  
channels that have more than 150 ps of skew until all  
channels being used are within 150 ps. It is important to  
deskew the word generator channels before testing. This  
will ensure that the outputs switch simultaneously.  
OHP  
put during the LH transition.  
OHV  
Verify that the GND reference recorded on the oscillo-  
scope has not drifted to ensure the accuracy and repeat-  
ability of the measurements.  
V
and V  
:
IHD  
ILD  
3. Terminate all inputs and outputs to ensure proper loading  
of the outputs and that the input levels are at the correct  
voltage.  
Monitor one of the switching outputs using a 50X coaxial  
cable plugged into a standard SMB type connector on  
the test fixture. Do not use an active FET probe.  
#
4. Set V  
to 5.0V.  
First increase the input LOW voltage level, V , until the  
IL  
output begins to oscillate. Oscillation is defined as noise  
#
#
#
CC  
5. Set the word generator to toggle all but one output at a  
frequency of 1 MHz. Greater frequencies will increase  
DUT heating and affect the results of the measurement.  
on the output LOW level that exceeds V limits, or on  
IL  
output HIGH levels that exceed V limits. The input  
IH  
LOW voltage level at which oscillation occurs is defined  
as V  
.
ILD  
Next increase the input HIGH voltage level on the word  
generator, V until the output begins to oscillate. Oscilla-  
IH  
tion is defined as noise on the output LOW level that  
exceeds V limits, or on output HIGH levels that exceed  
IL  
V
limits. The input HIGH voltage level at which oscilla-  
.
IH  
tion occurs is defined as V  
IHD  
Verify that the GND reference recorded on the oscillo-  
scope has not drifted to ensure the accuracy and repeat-  
ability of the measurements.  
TL/F/10955–4  
FIGURE 1. Quiet Output Noise Voltage Waveforms  
Note A: V  
and V  
are measured with respect to ground reference.  
OLP  
OHV  
e
Note B: Input pulses have the following characteristics:  
k
150 ps.  
f
1 MHz,  
e
e
3 ns, skew  
t
r
3 ns, t  
f
TL/F/10955–5  
FIGURE 2. Simultaneous Switching Test Circuit  
6
Ordering Information  
The device number is used to form part of a simplified purchasing code where the package type and temperature range are  
defined as follows:  
74ACTQ 18825 SS  
C
X
Temperature Range Family  
e
Special Variations  
X
e
Devices shipped in 13 reels  
74ACTQ  
CommercialÐTTL Compatible  
×
Device Type  
Temperature Range  
e
b
Commercial Product ( 40 C to  
C
§
Package Code  
e
a
85 C)  
§
SS  
Small Outline (SSOP)  
7
Physical Dimensions inches (millimeters)  
56-Lead SSOP (0.300 Wide) (SS)  
×
NS Package Number MS56A  
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DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL  
SEMICONDUCTOR CORPORATION. As used herein:  
1. Life support devices or systems are devices or  
systems which, (a) are intended for surgical implant  
into the body, or (b) support or sustain life, and whose  
failure to perform, when properly used in accordance  
with instructions for use provided in the labeling, can  
be reasonably expected to result in a significant injury  
to the user.  
2. A critical component is any component of a life  
support device or system whose failure to perform can  
be reasonably expected to cause the failure of the life  
support device or system, or to affect its safety or  
effectiveness.  
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