ADC12L080CIVY/NOPB [TI]

12 位、80MSPS、450MHz 输入带宽模数转换器 (ADC) | NEY | 32 | -40 to 85;
ADC12L080CIVY/NOPB
型号: ADC12L080CIVY/NOPB
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

12 位、80MSPS、450MHz 输入带宽模数转换器 (ADC) | NEY | 32 | -40 to 85

转换器 模数转换器
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ADC12L080  
www.ti.com  
SNAS200B OCTOBER 2004REVISED MARCH 2013  
ADC12L080 12-Bit, 80 MSPS, 450 MHz Bandwidth A/D Converter with Internal Reference  
Check for Samples: ADC12L080  
1
FEATURES  
DESCRIPTION  
The ADC12L080 is a monolithic CMOS analog-to-  
digital converter capable of converting analog input  
signals into 12-bit digital words at 80 Megasamples  
2
Single Supply Operation  
Low Power Consumption  
Power Down Mode  
per second (MSPS). This converter uses  
a
Internal or External Reference  
differential, pipeline architecture with digital error  
correction and an on-chip sample-and-hold circuit to  
minimize die size and power consumption while  
providing excellent dynamic performance. The  
ADC12L080 can be operated with either the internal  
or an external reference. Operating on a single 3.3V  
power supply, this device consumes just 425 mW at  
80 MSPS, including the reference current. The Power  
Down feature reduces power consumption to just 50  
mW.  
Selectable Offset Binary or 2's Complement  
Data Format  
Pin-Compatible with ADC12010, ADC12020,  
ADC12040, ADC12L063, ADC12L066  
APPLICATIONS  
Ultrasound and Imaging  
Instrumentation  
Cellular Base Stations/Communication  
Receivers  
The differential inputs provide a full scale input swing  
equal to ±VREF. The buffered, high impedance, single-  
ended external reference input is converted on-chip  
to a differential reference for use by the processing  
circuitry. Output data format may be selected as  
either offset binary or two's complement.  
Sonar/Radar  
xDSL  
Wireless Local Loops  
Data Acquisition Systems  
DSP Front Ends  
This device is available in the 32-lead LQFP package  
and operates over the industrial temperature range of  
40°C to +85°C.  
KEY SPECIFICATIONS  
Full Power Bandwidth: 450 MHz  
DNL: ±0.4 LSB (typ)  
SNR (fIN = 10 MHz): 66 dB (typ)  
SFDR (fIN = 10 MHz): 80 dB (typ)  
Power Consumption, 80 MHz  
Operating: 425 mW (typ)  
Power Down: 50 mW (typ)  
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
2
All trademarks are the property of their respective owners.  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
Copyright © 2004–2013, Texas Instruments Incorporated  
ADC12L080  
SNAS200B OCTOBER 2004REVISED MARCH 2013  
www.ti.com  
Connection Diagram  
Figure 1. 32-Lead LQFP Package  
See Package Number NEY0032A  
Block Diagram  
2
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ADC12L080  
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SNAS200B OCTOBER 2004REVISED MARCH 2013  
Pin Descriptions and Equivalent Circuits  
Pin No.  
ANALOG I/O  
2
Symbol  
Equivalent Circuit  
Description  
+
VIN  
Differential analog signal Input pins. With a 1.0V reference voltage  
the full-scale differential input signal level is 2.0 VP-P with each input  
pin centered on a common mode voltage, VCM. The VIN- pin may be  
connected to VCM for single-ended operation, but a differential input  
signal is required for best performance.  
3
VIN  
Reference input. This pin should be connected to VA to use the  
internal 1.0V reference. If it is desired to use an external reference  
voltage, this pin should be bypassed to AGND with a 0.1 µF low ESL  
capacitor. Specified operation is with a VREF of 1.0V, but the device  
will function well with a VREF range indicated in the Electrical Tables.  
1
VREF  
31  
32  
VRP  
VRM  
These pins are high impedance reference bypass pins only. Connect  
a 0.1 µF capacitor from each of these pins to AGND. Connect a 1.0  
µF capacitor from VRP to VRN. DO NOT LOAD these pins.  
30  
VRN  
DIGITAL I/O  
Digital clock input. The range of frequencies for this input is 10 MHz  
to 80 MHz with guaranteed performance at 80 MHz. The input is  
sampled on the rising edge of this input.  
10  
CLK  
OF  
Output format selection. When this pin is LOW, the output format is  
offset binary. When this pin is HIGH the output format is two's  
complement. This pin may be changed asynchronously, but such a  
change will result in errors for one or two conversions.  
11  
8
PD is the Power Down input pin. When high, this input puts the  
converter into the power down mode. When this pin is low, the  
converter is in the active mode.  
PD  
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SNAS200B OCTOBER 2004REVISED MARCH 2013  
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Pin Descriptions and Equivalent Circuits (continued)  
Pin No.  
Symbol  
Equivalent Circuit  
Description  
14–19,  
22–27  
Digital data output pins that make up the 12-bit conversion results.  
D0 is the LSB, while D11 is the MSB of the output word.  
D0–D11  
ANALOG POWER  
Positive analog supply pins. These pins should be connected to a  
quiet +3.3V source and bypassed to AGND with 0.1 µF low ESL  
capacitors located within 1 cm of these power pins, and with a 10 µF  
capacitor.  
5, 6, 29  
VA  
4, 7, 28  
AGND  
The ground return for the analog supply.  
DIGITAL POWER  
Positive digital supply pin. This pin should be connected to the same  
quiet +3.3V source as is VA and bypassed to DGND with a 0.1 µF  
monolithic capacitor in parallel with a 10 µF capacitor, both located  
within 1 cm of the power pin.  
13  
VD  
9, 12  
DGND  
The ground return for the digital supply.  
Positive digital supply pin for the ADC12L080's output drivers. This  
pin should be connected to a voltage source in the range indicated in  
the Operating Ratings table and be bypassed to DR GND with a 0.1  
µF capacitor. If the supply for this pin is different from the supply  
used for VA and VD, it should also be bypassed with a 10 µF  
capacitor. The voltage at this pin should never exceed the voltage on  
VD by more than 300 mV. All bypass capacitors should be located  
within 1 cm of the supply pin.  
21  
20  
VDR  
The ground return for the digital supply for the ADC12L080's output  
drivers. This pin should be connected to the system digital ground,  
but not be connected in close proximity to the ADC12L080's DGND  
or AGND pins. See LAYOUT AND GROUNDING for more details.  
DR GND  
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam  
during storage or handling to prevent electrostatic damage to the MOS gates.  
4
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SNAS200B OCTOBER 2004REVISED MARCH 2013  
Absolute Maximum Ratings(1)(2)(3)  
VA, VD, VDR  
4.2V  
100 mV  
|VA–VD|  
VDR–VD  
300 mV  
Voltage on Any Pin  
0.3V to VA or (VD + 0.3V)  
±25 mA  
Input Current at Any Pin(4)  
Package Input Current(4)  
Package Dissipation at TA = 25°C  
ESD Susceptibility  
±50 mA  
See(5)  
Human Body Model(6)  
Machine Model(6)  
2500V  
250V  
Soldering Temperature, Infrared, 10 sec.(7)  
Storage Temperature  
235°C  
65°C to +150°C  
(1) All voltages are measured with respect to GND = AGND = DGND = 0V, unless otherwise specified.  
(2) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for  
which the device is functional, but do not guarantee specific performance limits. For guaranteed specifications and test conditions, see  
the Electrical Characteristics. The guaranteed specifications apply only for the test conditions listed. Some performance characteristics  
may degrade when the device is not operated under the listed test conditions.  
(3) If Military/Aerospace specified devices are required, please contact the TI Sales Office/ Distributors for availability and specifications.  
(4) When the input voltage at any pin exceeds the power supplies (that is, VIN < AGND, or VIN > VA, VD or VDR), the current at that pin  
should be limited to 25 mA. The 50 mA maximum package input current rating limits the number of pins that can safely exceed the  
power supplies with an input current of 25 mA to two.  
(5) The absolute maximum junction temperature (TJmax) for this device is 150°C. The maximum allowable power dissipation is dictated by  
TJmax, the junction-to-ambient thermal resistance (θJA), and the ambient temperature, (TA), and can be calculated using the formula  
PDMAX = (TJmax - TA )/θJA. The values for maximum power dissipation will be reached only when the device is operated in a severe  
fault condition (e.g. when input or output pins are driven beyond the power supply voltages, or the power supply polarity is reversed).  
Obviously, such conditions should always be avoided.  
(6) Human body model is 100 pF capacitor discharged through a 1.5 kΩ resistor. Machine model is 220 pF discharged through 0.  
(7) The 235°C reflow temperature refers to infrared reflow. For Vapor Phase Reflow (VPR), the following Conditions apply: Maintain the  
temperature at the top of the package body above 183°C for a minimum 60 seconds. The temperature measured on the package body  
must not exceed 220°C. Only one excursion above 183°C is allowed per reflow cycle.  
Operating Ratings(1)(2)  
Operating Temperature  
Supply Voltage (VA, VD)  
Output Driver Supply (VDR  
VREF  
40°C TA +85°C  
+3.0V to +3.60V  
+2.4V to VD  
)
0.8V to 1.5V  
CLK, PD, OF  
0.05V to VD + 0.05V  
0V to (VA 0.5V)  
0.5V to (VA-1.5V)  
0V  
VIN Input  
VCM  
|AGND–DGND|  
(1) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for  
which the device is functional, but do not guarantee specific performance limits. For guaranteed specifications and test conditions, see  
the Electrical Characteristics. The guaranteed specifications apply only for the test conditions listed. Some performance characteristics  
may degrade when the device is not operated under the listed test conditions.  
(2) All voltages are measured with respect to GND = AGND = DGND = 0V, unless otherwise specified.  
Package Thermal Resistances  
Package  
θJ-A  
32-Lead LQFP  
79°C / W  
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ADC12L080  
SNAS200B OCTOBER 2004REVISED MARCH 2013  
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Converter Electrical Characteristics  
Unless otherwise specified, the following specifications apply for AGND = DGND = DR GND = 0V, VA = VD = +3.3V, VDR  
=
+2.5V, PD = 0V, VREF = +1.0V external, VCM = 1.65V, RS < 100, fCLK = 80 MHz, tr = tf = 2 ns, fIN = 70 MHz, CL = 15 pF/pin.  
Boldface limits apply for TJ = TMIN to TMAX: all other limits TJ = 25°C(1)(2)(3)(4)  
Units  
(Limits)  
Symbol  
Parameter  
Conditions  
Typical(4) Limits(4)  
STATIC CONVERTER CHARACTERISTICS  
Resolution with No Missing Codes  
12  
Bits  
4.0  
LSB (max)  
LSB (min)  
LSB (max)  
LSB (min)  
INL  
Integral Non Linearity  
Best Fit Method  
±1.2  
-3.3  
1.5  
DNL  
Differential Non Linearity  
No missing codes  
±0.4  
-1.0  
+5.7  
-2  
%FS (max)  
%FS (min)  
Positive Error  
Negative Error  
0.15  
GE  
Gain Error  
+5  
-3.7  
%FS (max)  
%FS (min)  
+0.4  
Offset Error (VIN+ = VIN)  
+1.7  
-0.6  
+0.2  
%FS (max)  
Under Range Output Code  
Over Range Output Code  
0
0
4095  
4095  
REFERENCE AND ANALOG INPUT CHARACTERISTICS  
0.5  
2.0  
V (min)  
V (max)  
pF  
VCM  
Common Mode Input Voltage  
1.65  
(CLK LOW)  
(CLK HIGH)  
8
7
VIN Input Capacitance  
(each pin to GND)  
CIN  
VIN = 1.0 Vdc + 1 VP-P  
pF  
0.8  
1.5  
V (min)  
V (max)  
VREF  
Reference Voltage(5)(6)  
1.0  
(1) The inputs are protected as shown below. Input voltages above VA or below GND will not damage this device, provided current is limited  
per(6). However, errors in the A/D conversion can occur if the input goes above VA or below GND by more than 100 mV. As an example,  
if VA is 3.3V, the full-scale input voltage must be 3.4V to ensure accurate conversions.  
(2) To guarantee accuracy, it is required that |VA–VD| 100 mV and separate bypass capacitors are used at each power supply pin.  
(3) With the test condition for VREF = +1.0V (2 VP-P differential input), the 12-bit LSB is 488 µV.  
(4) Typical figures are at TA = TJ = 25°C, and represent most likely parametric norms. Test limits are guaranteed to TI's AOQL (Average  
Outgoing Quality Level).  
(5) Optimum dynamic performance will be obtained by keeping the reference input in the 0.8V to 1.5V range. The LM4051CIM3-ADJ or the  
LM4051CIM3-1.2 band gap voltage reference is recommended for this application.  
(6) When the input voltage at any pin exceeds the power supplies (that is, VIN < AGND, or VIN > VA, VD or VDR), the current at that pin  
should be limited to 25 mA. The 50 mA maximum package input current rating limits the number of pins that can safely exceed the  
power supplies with an input current of 25 mA to two.  
6
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ADC12L080  
www.ti.com  
SNAS200B OCTOBER 2004REVISED MARCH 2013  
DC and Logic Electrical Characteristics  
Unless otherwise specified, the following specifications apply for AGND = DGND = DR GND = 0V, VA = VD = +3.3V, VDR  
=
+2.5V, PD = 0V, VREF = +1.0V external, VCM = 1.65V, RS < 100, fCLK = 80 MHz, tr = tf = 2 ns, fIN = 70 MHz, CL = 15 pF/pin.  
Boldface limits apply for TJ = TMIN to TMAX: all other limits TJ = 25°C(1)(2)(3)(4)  
Units  
(Limits)  
Symbol  
Parameter  
Conditions  
Typical(4) Limits(4)  
DYNAMIC CONVERTER CHARACTERISTICS  
BW  
Full Power Bandwidth  
Signal-to-Noise Ratio  
-0.5 dBFS Input, Output at 3 dB  
450  
MHz  
dB (min)  
dB  
fIN = 10 MHz, Differential VIN = 0.5 dBFS  
fIN = 40 MHz, Differential VIN = 0.5 dBFS  
fIN = 70 MHz, Differential VIN = 0.5 dBFS  
fIN = 150 MHz, Differential VIN = 0.5 dBFS  
fIN = 10 MHz, Differential VIN = 0.5 dBFS  
fIN = 40 MHz, Differential VIN = 0.5 dBFS  
fIN = 70 MHz, Differential VIN = 0.5 dBFS  
fIN = 150 MHz, Differential VIN = 0.5 dBFS  
fIN = 10 MHz, Differential VIN = 0.5 dBFS  
fIN = 40 MHz, Differential VIN = 0.5 dBFS  
fIN = 70 MHz, Differential VIN = 0.5 dBFS  
fIN = 150 MHz, Differential VIN = 0.5 dBFS  
fIN = 10 MHz, Differential VIN = 0.5 dBFS  
fIN = 40 MHz, Differential VIN = 0.5 dBFS  
fIN = 70 MHz, Differential VIN = 0.5 dBFS  
fIN = 150 MHz, Differential VIN = 0.5 dBFS  
fIN = 10 MHz, Differential VIN = 0.5 dBFS  
fIN = 40 MHz, Differential VIN = 0.5 dBFS  
fIN = 70 MHz, Differential VIN = 0.5 dBFS  
fIN = 150 MHz, Differential VIN = 0.5 dBFS  
fIN = 10 MHz, Differential VIN = 0.5 dBFS  
fIN = 40 MHz, Differential VIN = 0.5 dBFS  
fIN = 70 MHz, Differential VIN = 0.5 dBFS  
fIN = 150 MHz, Differential VIN = 0.5 dBFS  
fIN = 10 MHz, Differential VIN = 0.5 dBFS  
fIN = 40 MHz, Differential VIN = 0.5 dBFS  
fIN = 70 MHz, Differential VIN = 0.5 dBFS  
fIN = 150 MHz, Differential VIN = 0.5 dBFS  
66  
65  
64  
63  
SNR  
65  
dB (min)  
dB  
63  
66  
63  
dB (min)  
dB  
64.5  
64  
SINAD Signal-to-Noise & Distortion  
62.7  
10.2  
10.1  
-66  
dB (min)  
dB  
62  
10.7  
10.4  
10.3  
10.0  
77  
-74  
-71  
-70  
80  
-80  
-80  
-79  
84  
-81  
-79  
-78  
80  
Bits (min)  
Bits  
ENOB  
THD  
Effective Number of Bits  
Total Harmonic Distortion  
Second Harmonic Distortion  
Third Harmonic Distortion  
Bits (min)  
Bits  
dB (max)  
dB  
-65  
dB (max)  
dB  
-68  
dB (max)  
dB  
2nd  
Harm  
-65.5  
-69  
dB (max)  
dB  
dB (max)  
dB  
3rd  
Harm  
-66  
dB (max)  
dB  
68  
dB (min)  
dB  
77  
SFDR  
IMD  
Spurious Free Dynamic Range  
Intermodulation Distortion  
74  
-65.5  
dB (min)  
dB  
73  
fIN1 = 19.6MHz, fIN2 = 20.5 MHz,  
each = -6.0 dBFS  
66  
dBFS  
(1) The inputs are protected as shown below. Input voltages above VA or below GND will not damage this device, provided current is limited  
per(6). However, errors in the A/D conversion can occur if the input goes above VA or below GND by more than 100 mV. As an example,  
if VA is 3.3V, the full-scale input voltage must be 3.4V to ensure accurate conversions.  
(2) To guarantee accuracy, it is required that |VA–VD| 100 mV and separate bypass capacitors are used at each power supply pin.  
(3) With the test condition for VREF = +1.0V (2 VP-P differential input), the 12-bit LSB is 488 µV.  
(4) Typical figures are at TA = TJ = 25°C, and represent most likely parametric norms. Test limits are guaranteed to TI's AOQL (Average  
Outgoing Quality Level).  
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ADC12L080  
SNAS200B OCTOBER 2004REVISED MARCH 2013  
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DC and Logic Electrical Characteristics (continued)  
Unless otherwise specified, the following specifications apply for AGND = DGND = DR GND = 0V, VA = VD = +3.3V, VDR  
=
+2.5V, PD = 0V, VREF = +1.0V external, VCM = 1.65V, RS < 100, fCLK = 80 MHz, tr = tf = 2 ns, fIN = 70 MHz, CL = 15 pF/pin.  
Boldface limits apply for TJ = TMIN to TMAX: all other limits TJ = 25°C(1)(2)(3)(4)  
Units  
(Limits)  
Symbol  
Parameter  
Conditions  
Typical(4) Limits(4)  
CLK, PD, OF DIGITAL INPUT CHARACTERISTICS  
VIN(1)  
VIN(0)  
IIN(1)  
IIN(0)  
CIN  
Logical “1” Input Voltage  
Logical “0” Input Voltage  
Logical “1” Input Current  
Logical “0” Input Current  
Digital Input Capacitance  
VD = 3.3V  
2.0  
V (min)  
V (max)  
µA  
VD = 3.3V  
0.8  
VIN+, VIN= 3.3V  
VIN+, VIN= 0V  
10  
10  
5
µA  
pF  
D0–D11 DIGITAL OUTPUT CHARACTERISTICS  
VOUT(1) Logical “1” Output Voltage  
VOUT(0) Logical “0” Output Voltage  
IOUT = 0.5 mA  
V
DR 0.18  
V (min)  
V (max)  
mA  
IOUT = 1.6 mA  
VOUT = 2.5V  
0.4  
+ISC  
Output Short Circuit Source Current VOUT = 0V  
20  
ISC  
Output Short Circuit Sink Current  
20  
mA  
POWER SUPPLY CHARACTERISTICS  
PD Pin = DGND  
PD Pin = VDR  
120  
10  
168  
mA (max)  
mA  
IA  
Analog Supply Current  
PD Pin = DGND  
PD Pin = VDR  
6
5
11.5  
mA (max)  
mA  
ID  
Digital Supply Current  
PD Pin = DGND, fin = 0(5)(6)  
PD Pin = VDR  
PD Pin = DGND, CL = 0 pF(7)  
PD Pin = VDR  
<1  
0
mA  
mA  
IDR  
Digital Output Supply Current  
Total Power Consumption  
425  
50  
590  
mW (max)  
mW  
Rejection of Full-Scale Gain Error  
change with VA = 3.0V vs. 3.6V  
PSRR1 Power Supply Rejection Ratio  
41  
dB  
(5) IDR is the current consumed by the switching of the output drivers and is primarily determined by load capacitance on the output pins,  
the supply voltage, VDR, and the rate at which the outputs are switching (which is signal dependent). IDR=VDR(C0 x f0 + C1 x f1 +....C11  
f11) where VDR is the output driver power supply voltage, Cn is total capacitance on the output pin, and fn is the average frequency at  
which that pin is toggling.  
x
(6) When the input voltage at any pin exceeds the power supplies (that is, VIN < AGND, or VIN > VA, VD or VDR), the current at that pin  
should be limited to 25 mA. The 50 mA maximum package input current rating limits the number of pins that can safely exceed the  
power supplies with an input current of 25 mA to two.  
(7) Power consumption excludes output driver power. See Note 5.  
8
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AC Electrical Characteristics  
Unless otherwise specified, the following specifications apply for AGND = DGND = DR GND = 0V, VA = VD = +3.3V, VDR  
=
+2.5V, PD = 0V, VREF = +1.0V external, VCM = 1.65V, RS < 100, fCLK = 80 MHz, tr = tf = 2 ns, fIN = 70 MHz, CL = 15 pF/pin.  
Boldface limits apply for TJ = TMIN to TMAX: all other limits TJ = 25°C(1)(2)(3)(4)(5)(6)  
Units  
Symbol  
Parameter  
Conditions  
Typical(4) Limits(4)  
(Limits)  
MHz (min)  
MHz  
Maximum Clock Frequency  
Minimum Clock Frequency  
80  
10  
60  
40  
% (max)  
% (min)  
Clock Duty Cycle  
tCH  
Clock High Time  
Clock Low Time  
Conversion Latency  
5.5  
5.5  
6
ns (min)  
ns (min)  
Clock Cycles  
ns (max)  
ns (max)  
ns  
tCL  
tCONV  
VDR = 2.5V  
VDR = 3.3V  
5.2  
4.8  
2
8.3  
7.5  
tOD  
Data Output Delay after Rising CLK Edge  
tAD  
tAJ  
Aperture Delay  
Aperture Jitter  
0.7  
ps rms  
0.1 µF on pins 30, 31, 32,  
and 1.0 µF from pin 30 to 31  
tPD  
Power Down Mode Exit Cycle  
1
µs  
(1) The inputs are protected as shown below. Input voltages above VA or below GND will not damage this device, provided current is limited  
per(6). However, errors in the A/D conversion can occur if the input goes above VA or below GND by more than 100 mV. As an example,  
if VA is 3.3V, the full-scale input voltage must be 3.4V to ensure accurate conversions.  
(2) To guarantee accuracy, it is required that |VA–VD| 100 mV and separate bypass capacitors are used at each power supply pin.  
(3) With the test condition for VREF = +1.0V (2 VP-P differential input), the 12-bit LSB is 488 µV.  
(4) Typical figures are at TA = TJ = 25°C, and represent most likely parametric norms. Test limits are guaranteed to TI's AOQL (Average  
Outgoing Quality Level).  
(5) Timing specifications are tested at TTL logic levels, VIL = 0.4V for a falling edge and VIH = 2.4V for a rising edge.  
(6) When the input voltage at any pin exceeds the power supplies (that is, VIN < AGND, or VIN > VA, VD or VDR), the current at that pin  
should be limited to 25 mA. The 50 mA maximum package input current rating limits the number of pins that can safely exceed the  
power supplies with an input current of 25 mA to two.  
Specification Definitions  
APERTURE DELAY is the time after the rising edge of the clock to when the input signal is acquired or held for  
conversion.  
APERTURE JITTER (APERTURE UNCERTAINTY) is the variation in aperture delay from sample to sample.  
Aperture jitter manifests itself as noise in the output.  
COMMON MODE VOLTAGE (VCM) is the d.c. potential present at both signal inputs to the ADC.  
CONVERSION LATENCY See PIPELINE DELAY.  
DIFFERENTIAL NON-LINEARITY (DNL) is the measure of the maximum deviation from the ideal step size of 1  
LSB.  
DUTY CYCLE is the ratio of the time that a repetitive digital waveform is high to the total time of one period. The  
specification here refers to the ADC clock input signal.  
EFFECTIVE NUMBER OF BITS (ENOB, or EFFECTIVE BITS) is another method of specifying Signal-to-Noise  
and Distortion or SINAD. ENOB is defined as (SINAD - 1.76) / 6.02 and says that the converter is equivalent to a  
perfect ADC of this (ENOB) number of bits.  
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FULL POWER BANDWIDTH is a measure of the frequency at which the reconstructed output fundamental  
drops 3 dB below its low frequency value for a full scale input.  
GAIN ERROR is the deviation from the ideal slope of the transfer function. It can be calculated as:  
Gain Error = Positive Full Scale Error Offset Error  
(1)  
INTEGRAL NON LINEARITY (INL) is a measure of the deviation of each individual code from a best fit straight  
line. The deviation of any given code from this straight line is measured from the center of that code value.  
INTERMODULATION DISTORTION (IMD) is the creation of additional spectral components as a result of two  
sinusoidal frequencies being applied to the ADC input at the same time. It is defined as the ratio of the power in  
the second and third order intermodulation products to the power in one of the original frequencies. IMD is  
usually expressed in dBFS.  
MISSING CODES are those output codes that will never appear at the ADC outputs. The ADC12L080 is  
guaranteed not to have any missing codes.  
NEGATIVE FULL SCALE ERROR is the difference between the input voltage (VIN+ VIN) just causing a  
transition from negative full scale to the first code and its ideal value of 0/5 LSB.  
OFFSET ERROR is the input voltage that will cause a transition from a code of 01 1111 1111 to a code of 10  
0000 0000/  
OUTPUT DELAY is the time delay after the rising edge of the clock before the data update is presented at the  
output pins.  
PIPELINE DELAY (LATENCY) is the number of clock cycles between initiation of conversion and when that data  
is presented to the output driver stage. Data for any given sample is available at the output pins the Pipeline  
Delay plus the Output Delay after the sample is taken. New data is available at every clock cycle, but the data  
lags the conversion by the pipeline delay.  
POSITIVE FULL SCALE ERROR is the difference between the actual last code transition and its ideal value of  
1½ LSB below positive full scale.  
POWER SUPPLY REJECTION RATIO (PSRR) is a measure of how well the ADC rejects a change in the power  
supply voltage. PSRR1 is the ratio of the change in Full-Scale Gain Error that results from a change in the d.c.  
power supply voltage, expressed in dB. PSRR2 is a measure of how well an a.c. signal riding upon the power  
supply is rejected at the output.  
SIGNAL TO NOISE RATIO (SNR) is the ratio, expressed in dB, of the rms value of the input signal to the rms  
value of the sum of all other spectral components below one-half the sampling frequency, not including  
harmonics or d.c.  
SIGNAL TO NOISE PLUS DISTORTION (S/N+D or SINAD) Is the ratio, expressed in dB, of the rms value of the  
input signal to the rms value of all of the other spectral components below half the clock frequency, including  
harmonics but excluding d.c.  
SPURIOUS FREE DYNAMIC RANGE (SFDR) is the difference, expressed in dB, between the rms values of the  
input signal and the peak spurious signal, where a spurious signal is any signal present in the output spectrum  
that is not present at the input.  
TOTAL HARMONIC DISTORTION (THD) is the ratio, expressed in dBc, of the rms total of the first nine  
harmonic levels at the output to the level of the fundamental at the output. THD is calculated as  
2
2
f10  
A
+ . . . + A  
f2  
THD = 20 x log  
2
A
f1  
(2)  
where Af1 is the RMS power of the fundamental (output) frequency and Af2 through Af10 are the RMS power in  
the first 9 harmonic frequencies.  
Second Harmonic Distortion (2nd Harm) is the difference expressed in dB, between the RMS power in the  
input frequency at the output and the power in its 2nd harmonic level at the output.  
Third Harmonic Distortion (3rd Harm) is the difference, expressed in dB, between the RMS power in the input  
frequency at the output and the power in its 3rd harmonic level at the output.  
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Timing Diagram  
Sample N + 7  
Sample N + 6  
Sample N + 5  
Sample N  
Sample N + 8  
Sample N + 9  
V
IN  
t
AD  
1
f
CLK  
Clock N  
Clock N + 6  
90%  
10%  
90%  
10%  
CLK  
t
t
CL  
CH  
t
f
t
r
t
OD  
D0 - D11  
Data N + 1 Data N + 2  
Data N - 1  
Data N  
Latency  
Figure 2. Output Timing  
Transfer Characteristic  
Figure 3. Transfer Characteristic  
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Typical Performance Characteristics DNL, INL  
VA = VD = 3.3V, VDR = 2.5V, VREF = 1.0V external, VCM = 1.65V, fCLK = 80 MHz, fIN = 0, unless otherwise stated.  
DNL  
INL  
Figure 4.  
Figure 5.  
DNL vs. fCLK  
INL vs. fCLK  
Figure 6.  
Figure 7.  
DNL vs. Clock Duty Cycle  
INL vs. Clock Duty Cycle  
Figure 8.  
Figure 9.  
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Typical Performance Characteristics DNL, INL (continued)  
VA = VD = 3.3V, VDR = 2.5V, VREF = 1.0V external, VCM = 1.65V, fCLK = 80 MHz, fIN = 0, unless otherwise stated.  
DNL vs. Temperature  
INL vs. Temperature  
Figure 10.  
Figure 11.  
DNL vs. VDR  
INL vs. VDR  
Figure 12.  
Figure 13.  
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Typical Performance Characteristics  
VA = VD = 3.3V, VDR = 2.5V, VREF = 1.0V external, VCM = 1.65V, fCLK = 80 MHz, fIN = 70 MHz, unless otherwise stated.  
SNR,SINAD,SFDR vs. VA  
Distortion vs. VA  
Figure 14.  
Figure 15.  
SNR,SINAD,SFDR vs. VDR  
Distortion vs. VDR  
Figure 16.  
Figure 17.  
SNR,SINAD,SFDR vs. VCM  
Distortion vs. VCM  
Figure 18.  
Figure 19.  
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Typical Performance Characteristics (continued)  
VA = VD = 3.3V, VDR = 2.5V, VREF = 1.0V external, VCM = 1.65V, fCLK = 80 MHz, fIN = 70 MHz, unless otherwise stated.  
SNR,SINAD,SFDR vs. fCLK  
Distortion vs. fCLK  
Figure 20.  
Figure 21.  
SNR,SINAD,SFDR vs. Clock Duty Cycle  
Distortion vs. Clock Duty Cycle  
Figure 22.  
Figure 23.  
SNR,SINAD,SFDR vs. VREF  
Distortion vs. VREF  
Figure 24.  
Figure 25.  
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Typical Performance Characteristics (continued)  
VA = VD = 3.3V, VDR = 2.5V, VREF = 1.0V external, VCM = 1.65V, fCLK = 80 MHz, fIN = 70 MHz, unless otherwise stated.  
SNR,SINAD,SFDR vs. fIN  
Distortion vs. fIN  
Figure 26.  
Figure 27.  
SNR,SINAD,SFDR vs. Temperature  
Distortion vs. Temperature  
Figure 28.  
tOD vs. VDR  
Figure 29.  
Spectral Response @ 10 MHz Input  
Figure 30.  
Figure 31.  
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Typical Performance Characteristics (continued)  
VA = VD = 3.3V, VDR = 2.5V, VREF = 1.0V external, VCM = 1.65V, fCLK = 80 MHz, fIN = 70 MHz, unless otherwise stated.  
Spectral Response @ 40 MHz Input  
Spectral Response @ 70 MHz Input  
Figure 32.  
Figure 33.  
Spectral Response @ 150 MHz Input  
Intermodulation Distortion, fIN1= 19.6 MHz, fIN2 = 20.5 MHz  
Figure 34.  
Figure 35.  
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FUNCTIONAL DESCRIPTION  
Operating on a single +3.3V supply, the ADC12L080 uses a pipeline architecture with error correction circuitry to  
help ensure maximum performance.  
Differential analog input signals are digitized to 12 bits. Each analog input signal should have a peak-to-peak  
voltage equal to the input reference voltage, VREF, be centered around VREF and be 180° out of phase with each  
other. Table 1 and Table 2 indicate the input to output relationship of the ADC12L080. Although a differential  
input signal is required for rated operation, single-ended operation is possible with reduced performance if one  
input is biased to VREF and the other input is driven. If the driven input is presented with its full range signal, there  
will be a 6 dB reduction of the output range, limiting it to the range of ¼ to ¾ of the minimum output range  
obtainable if both inputs were driven with complimentary signals. Signal Inputs explains how to avoid this signal  
reduction.  
Table 1. Input to Output Relationship—Differential Input  
+
VIN  
VIN−  
Output  
V
CM VREF  
VCM + VREF  
VCM +0.5 * VREF  
VCM  
0000 0000 0000  
0100 0000 0000  
1000 0000 0000  
1100 0000 0000  
1111 1111 1111  
V
CM 0.5 * VREF  
VCM  
VCM +0.5 * VREF  
VCM + VREF  
VCM 0.5 * VREF  
VCM VREF  
Table 2. Input to Output Relationship—Single-Ended Input  
+
VIN  
VIN  
Output  
V
CM 2 * VREF  
VCM  
VCM  
VCM  
VCM  
VCM  
0000 0000 0000  
0100 0000 0000  
1000 0000 0000  
1100 0000 0000  
1111 1111 1111  
VCM VREF  
VCM  
VCM + VREF  
VCM + 2 * VREF  
The output word rate is the same as the clock frequency, which may be in within the range indicated in the  
Electrical Tables. The analog input voltage is acquired at the rising edge of the clock and the digital data for that  
sample is delayed by the pipeline for 6 clock cycles.  
A logic high on the power down (PD) pin reduces the converter power consumption to 50 mW.  
Applications Information  
OPERATING CONDITIONS  
We recommend that the conditions in the Operating Table be observed for operation of the ADC12L080.  
ANALOG INPUTS  
The ADC12L080 has two analog signal inputs, VIN+ and VIN, which form a differential input pair. There is one  
reference input pin, VREF  
.
Reference Pins  
The ADC12L080 can be used with the internal 1.0V reference or with an external reference. While designed and  
specified to operate with a 1.0V reference, the ADC12L080 performs well with reference voltages in the range of  
indicated in the Operating Ratings table. Lower reference voltages will decrease the signal-to-noise ratio (SNR)  
of the ADC12L080. Higher reference voltages (and input signal swing) will degrade THD performance for a full-  
scale input.  
An input voltage below 2.0V at pin 1 (VREF) is interpreted to be an external reference and is used as such.  
Connecting this pin to the analog supply (VA) will force the use of the internal 1.0V reference.  
It is very important that all grounds associated with the reference voltage and the input signal make connection to  
the analog ground plane at a single, quiet point to minimize the effects of noise currents in the ground path.  
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The reference input pin serves two functions. When the input at this pin at or below 2V, this voltage is accepted  
as the reference for the converter. When this voltage is connected to VA, then internal 1.0V reference is used.  
Functionality is undefined with voltages at this pin between 2V and VA.  
The three Reference Bypass Pins (VRP, VRM and VRN) are made available for bypass purposes only. These pins  
should each be bypassed to ground with a 0.1 µF capacitor, and a 1.0 µF should be connected from VRP to VRN  
.
Higher capacitances will result in a longer power down exit cycle. Lower capacitances may result in degraded  
dynamic performance. DO NOT LOAD these pins.  
Signal Inputs  
The signal inputs are VIN+ and VIN. The input signal, VIN, is defined as  
+
VIN = (VIN ) – (VIN)  
(3)  
Figure 36 shows the expected input signal range. Note that the nominal input common mode voltage, VCM, is  
VA/2 and the nominal input signals each run between the limits of AGND and VREF. The Peaks of the input  
signals should never exceed the voltage described as  
Peak Input Voltage = VA 0.5V  
(4)  
to maintain dynamic performance.  
V
V
IN  
V
IN  
V
IN  
-
REF  
V
/2  
REF  
0V  
+
+
(a) Differential Input  
2V  
REF  
V
REF  
0V  
(b) Single-Ended Input  
Figure 36. Expected Input Signal Range  
The ADC12L080 performs best with a differential input, each of which should be centered around a common  
mode voltage, VCM. The peak-to-peak voltage swing at both VIN+ and VINshould not exceed the value of the  
reference voltage or the output data will be clipped. The two input signals should be exactly 180° out of phase  
from each other and of the same amplitude. For single frequency inputs, angular errors result in a reduction of  
the effective full scale input. For a complex waveform, however, angular errors will result in distortion.  
The full scale error in LSB for a sine wave input can be described as approximately  
EFS = 4096 ( 1 - sin (90° + dev))  
(5)  
Where dev is the angular difference between the two signals having a 180° relative phase relationship to each  
other (see Figure 37). Drive the analog inputs with a source impedance less than 100.  
Figure 37. Angular Errors Between the Two Input Signals Will Reduce the Output Level or Cause  
Distortion  
For differential operation, each analog input signal should have a peak-to-peak voltage equal to the input  
reference voltage, VREF, and be centered around VCM. For single-ended operation (which will result in reduced  
performance), one of the analog inputs should be connected to the d.c. common mode voltage of the driven  
input. The peak-to-peak differential input signal should be twice the reference voltage to maximize SNR and  
SINAD performance (Figure 36b). For example, set VREF to 1.0V, bias VINto 1.0V and drive VIN+ with a signal  
range of 0V to 2.0V.  
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Because very large input signal swings can degrade distortion performance, better performance with a single-  
ended input can be obtained by reducing the reference voltage while maintaining a full-range output. Table 1 and  
Table 2 indicate the input to output relationship of the ADC12L080.  
The VIN+ and the VINinputs of the ADC12L080 consist of an analog switch followed by a switched-capacitor  
amplifier. The internal switching action at the analog inputs causes energy to be output from the input pins. As  
the driving source tries to compensate for this, it adds noise to the signal. To minimize this, use 33series  
resistors at each of the signal inputs with a 51 pF capacitor to ground, as can be seen in Figure 39 and  
Figure 40. These components should be placed close to the ADC because the input pins of the ADC is the most  
sensitive part of the system and this is the last opportunity to filter the input. The 51 pF capacitor value is for  
Nyquist applications and should be replaced with a smaller capacitor for undersampling applications. The  
resulting pole should be at 1.7 to 2.0 times the highest input frequency. When determining this capacitor value,  
take into consideration the 8 pF ADC input capacitance.  
Table 3 gives component values for Figure 39 to convert a signals to a range 1.0V ±0.5V at each of the  
differential input pins of the ADC12L080.  
Table 3. Resistor values for Circuit of Figure 39  
SIGNAL RANGE  
0 - 0.25V  
0 - 0.5V  
R1  
0Ω  
R2  
R3  
R4  
R5, R6  
1000Ω  
499Ω  
open  
open  
1210Ω  
200Ω  
249Ω  
100Ω  
1780Ω  
1400Ω  
1210Ω  
0Ω  
±0.5V  
100Ω  
499Ω  
DIGITAL INPUTS  
Digital inputs consist of CLK, OF and PD. All digital inputs are 3V CMOS compatible.  
CLK  
The CLK signal controls the timing of the sampling process. Drive the clock input with a stable, low jitter clock  
signal in the range indicated in the Electrical Table with rise and fall times of less than 2 ns. The trace carrying  
the clock signal should be as short as possible and should not cross any other signal line, analog or digital, not  
even at 90°.  
The CLK signal also drives an internal state machine. If the CLK is interrupted, or its frequency is too low, the  
charge on internal capacitors can dissipate to the point where the accuracy of the output data will degrade. This  
is what limits the minimum sample rate.  
The duty cycle of the clock signal can affect the performance of any A/D Converter. Because achieving a precise  
duty cycle is difficult, the ADC12L080 is designed to maintain performance over a range of duty cycles. While it is  
specified and performance is guaranteed with a 50% clock duty cycle, performance is typically maintained over a  
clock duty cycle range indicated in the Electrical Table.  
The clock line should be terminated at its source in the characteristic impedance of that line. Take care to  
maintain a constant clock line impedance throughout the length of the line. Refer to Application Note AN-905 for  
information on setting characteristic impedance.  
It is highly desirable that the the source driving the ADC CLK pin only drive that pin. However, if that source is  
used to drive other things, each driven pin should be a.c. terminated with a series RC to ground, as shown in  
Figure 38, such that the resistor value is equal to the characteristic impedance of the clock line and the capacitor  
value is  
(6)  
where tPD is the signal propagation rate down the clock line, "L" is the line length and ZO is the characteristic  
impedance of the clock line. This termination should be as close as possible to the ADC clock pin but beyond it  
as seen from the clock source. Typical tPD is about 150 ps/inch (60 ps/cm) on FR-4 board material. The units of  
"L" and tPD should be the same (inches or centimeters).  
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OF  
The OF pin is used to determine the digital data output format. When this pin is high, the output formant is two's  
complement. When this pin is low the output format is offset binary. Changing this pin while the device is  
operating will result in uncertainty of the data for a few conversion cycles.  
PD  
The PD pin, when high, holds the ADC12L080 in a power-down mode to conserve power when the converter is  
not being used. The power consumption in this state is 50 mW and is not affected by the clock frequency, or by  
whether there is a clock signal present. The output data pins are undefined and the data in the pipeline is  
corrupted while in the power down mode.  
The Power Down Mode Exit Cycle time is determined by the value of the capacitors on pins 30, 31 and 32.  
These capacitors loose their charge in the Power Down mode and must be recharged by on-chip circuitry before  
conversions can be accurate. See Reference Pins.  
OUTPUTS  
The ADC12L080 has 12 TTL/CMOS compatible Data Output pins. The output data is present at these outputs  
while the PD pin is low. While the tOD time provides information about output timing, a simple way to capture a  
valid output is to latch the data on the rising edge of the conversion clock (pin 10).  
Be very careful when driving a high capacitance bus. The more capacitance the output drivers must charge for  
each conversion, the more instantaneous digital current flows through VDR and DR GND. These large charging  
current spikes can cause on-chip noise and couple into the analog circuitry, degrading dynamic performance.  
Adequate bypassing, limiting output capacitance and careful attention to the ground plane will reduce this  
problem. Additionally, bus capacitance beyond the specified 15 pF/pin will cause tOD to increase, making it  
difficult to properly latch the ADC output data. The result could be an apparent reduction in dynamic  
performance.  
To minimize noise due to output switching, minimize the load currents at the digital outputs. This can be done by  
connecting buffers between the ADC outputs and any other circuitry (74ACQ541, for example). Only one driven  
input should be connected to each output pin. Additionally, inserting series 100resistors at the digital outputs,  
close to the ADC pins, will isolate the outputs from trace and other circuit capacitances and limit the output  
currents, which could otherwise result in performance degradation. See Figure 38.  
While the ADC12L080 will operate with VDR voltages down to 1.8V, tOD increases with reduced VDR. Be careful of  
external timing when using reduced VDR  
.
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+1.8V to 3.6V  
+3.3V  
10 mF  
10 mF  
10 mF  
470  
200  
1%  
MF  
V
REF  
0.1 mF  
0.1 mF  
0.1 mF  
5
6
29  
13  
21  
VDR  
Power  
Down  
1.00k  
1%  
MF  
V
V
D
A
LM4150-1.2  
1 mF  
*
1
8
*
*
PD  
V
REF  
12 x 47W  
27  
26  
25  
24  
23  
22  
19  
18  
17  
16  
15  
14  
31  
30  
32  
D11 (MSB)  
V
V
Ground for the 1.00k resistor, the  
0.1 mF bypass capacitor, the ground  
pin for the LM4050-2.5, the bypass  
capacitors on pins 30, 31 and 32 of  
the ADC12L080 and pin 28 of the  
ADC12L080 should be connected to  
a common point in the analog  
ground plane.  
0.1 mF  
0.1 mF  
0.1 mF  
RP  
*
*
*
*
D10  
D9  
D8  
D7  
D6  
1 mF  
RN  
74ACQ541  
V
RM  
V
ADC12L080  
CM  
D5  
D4  
D3  
D2  
D1  
12 BIT  
2
3
DATA  
OUTPUT  
CLK  
V
+
IN  
Differential  
Drive  
See Fig 5  
SIGNAL  
INPUT  
V
-
IN  
D0 (LSB)  
10  
11  
CLOCK  
INPUT  
74ACQ541  
CLK  
OF  
47  
1/4  
74ACQ04  
AGND  
DGND  
12  
DRGND  
20  
see  
text  
See  
Text  
4
7
28  
*
9
47  
CLK  
LE  
Figure 38. Simple Application Circuit with Single-Ended to Differential Buffer  
Figure 39. Differential Drive Circuit of Figure 38  
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+1.8V to +3.6V  
+3.3V  
10 mF  
10 mF  
10 mF  
470  
200  
1%  
MF  
V
REF  
0.1 mF  
0.1 mF  
0.1 mF *  
5
6
29  
13  
21  
1.00k  
1%  
MF  
V
A
V
D
V
DR  
LM4140-1.2  
1 mF  
*
1
8
*
*
PD  
Power Down  
V
REF  
Ground for the 1.00k resistor, the  
1 mF bypass capacitor, the ground  
pin for the LM4040-2.5, the bypass  
capacitors on pins 30, 31 and 32 of  
the ADC12L080 and pin 28 of the  
ADC12L080 should be connected to  
a common point in the ground plane.  
*
27  
26  
25  
24  
23  
22  
19  
18  
17  
16  
15  
14  
31  
30  
32  
D11 (MSB)  
V
V
V
RP  
RN  
RM  
0.1 mF  
0.1 mF  
*
*
*
D10  
D9  
D8  
D7  
D6  
D5  
1 mF  
0.1 mF  
1k  
Output  
Word  
V
CM  
ADC12L080  
33  
2
D4  
D3  
V
+
IN  
IN  
51 pF  
0.1 mF  
SIGNAL  
INPUT  
D2  
D1  
3
D0 (LSB)  
V
-
MiniCircuits  
T4-6T  
33  
51 pF  
10  
11  
CLOCK  
INPUT  
CLK  
OF  
47  
AGND  
DGND  
12  
DRGND  
20  
see  
text  
#
The 51 pF capacitors at  
pins 2 and 3 are for  
oversampling applications.  
See text for  
4
7
28  
*
9
undersampling applications.  
Figure 40. Driving the Signal Inputs with a Transformer  
POWER SUPPLY CONSIDERATIONS  
The power supply pins should be bypassed with a 10 µF capacitor and with a 0.1 µF low ESL ceramic chip  
capacitor within 3 millimeters of each power pin.  
As is the case with all high-speed converters, the ADC12L080 is sensitive to power supply noise. Accordingly,  
the noise on the analog supply pin should be kept below 100 mVP-P  
.
No pin should ever have a voltage on it that is in excess of the supply voltages, not even on a transient basis. Be  
especially careful of this during turn on and turn off of power.  
The VDR pin provides power for the output drivers and may be operated from a supply in the range of 1.8V to VD.  
This can simplify interfacing to devices and systems operating with supplies less than VD. DO NOT operate the  
VDR pin at a voltage higher than VD.  
LAYOUT AND GROUNDING  
Proper grounding and proper routing of all signals are essential to ensure accurate conversion. Maintaining  
separate analog and digital areas of the board, with the ADC12L080 between these areas, is required to achieve  
specified performance.  
The ground return for the data outputs (DR GND) carries the ground current for the output drivers. The output  
current can exhibit high transients that could add noise to the conversion process. To prevent this from  
happening, the DR GND pins should NOT be connected to system ground in close proximity to any of the  
ADC12L080's other ground pins.  
Capacitive coupling between the typically noisy digital circuitry and the sensitive analog circuitry can lead to poor  
performance. The solution is to keep the analog circuitry separated from the digital circuitry, and to keep the  
clock line as short as possible.  
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Digital circuits create substantial supply and ground current transients. The logic noise thus generated could  
have significant impact upon system noise performance. The best logic family to use in systems with A/D  
converters is one which employs non-saturating transistor designs, or has low noise characteristics, such as the  
74LS, 74HC(T) and 74AC(T)Q families. The worst noise generators are logic families that draw the largest  
supply current transients during clock or signal edges, like the 74F and the 74AC(T) families.  
The effects of the noise generated from the ADC output switching can be minimized through the use of 100Ω  
resistors in series with each data output line. Locate these resistors as close to the ADC output pins as possible.  
Since digital switching transients are composed largely of high frequency components, total ground plane copper  
weight will have little effect upon the logic-generated noise. This is because of the skin effect. Total surface area  
is more important than is total ground plane volume.  
Generally, analog and digital lines should cross each other at 90° to avoid crosstalk. To maximize accuracy in  
high speed, high resolution systems, however, avoid crossing analog and digital lines altogether. It is important to  
keep clock lines as short as possible and isolated from ALL other lines, including other digital lines. Even the  
generally accepted 90° crossing should be avoided with the clock line as even a little coupling can cause  
problems at high frequencies. This is because other lines can introduce jitter into the clock line, which can lead to  
degradation of SNR. Also, the high speed clock can introduce noise into the analog chain.  
Best performance at high frequencies and at high resolution is obtained with a straight signal path. That is, the  
signal path through all components should form a straight line wherever possible.  
Be especially careful with the layout of inductors. Mutual inductance can change the characteristics of the circuit  
in which they are used. Inductors should not be placed side by side, even with just a small part of their bodies  
beside each other.  
Figure 41. Example of a Suitable Layout  
The analog input should be isolated from noisy signal traces to avoid coupling of spurious signals into the input.  
Any external component (e.g., a filter capacitor) connected between the converter's input pins and ground or to  
the reference input pin and ground should be connected to a very clean point in the ground plane.  
Figure 41 gives an example of a suitable layout. All analog circuitry (input amplifiers, filters, reference  
components, etc.) should be placed in the analog area of the board. All digital circuitry and I/O lines should be  
placed in the digital area of the board. Furthermore, all components in the reference circuitry and the input signal  
chain that are connected to ground should be connected together with short traces and enter the ground plane at  
a single point. All ground connections should have a low inductance path to ground.  
Best performance will be obtained with a single ground plane and separate analog and digital power planes. The  
power planes define analog and digital board areas of the board. Analog and digital components and signal lines  
should be kept within their own areas.  
24  
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SNAS200B OCTOBER 2004REVISED MARCH 2013  
DYNAMIC PERFORMANCE  
To achieve the best dynamic performance, the clock source driving the CLK input must be free of jitter. The  
maximum allowable jitter to avoid the addition of noise to the conversion process is  
Max Jitter = 1 / (2n+1 × π × fIN)  
(7)  
Isolate the ADC clock from any digital circuitry with buffers, as with the clock tree shown in Figure 42. To avoid  
adding jitter to the clock signal, the elements of Figure 42 should be capable of toggling at a up to ten times the  
frequency used.  
As mentioned in LAYOUT AND GROUNDING, it is good practice to keep the ADC clock line as short as possible  
and to keep it well away from any other signals. Other signals can introduce jitter into the clock signal, which can  
lead to reduced SNR performance, and the clock can introduce noise into other lines. Even lines with 90°  
crossings have capacitive coupling, so try to avoid even these 90° crossings of the clock line.  
Figure 42. Isolating the ADC Clock from other Circuitry with a Clock Tree  
COMMON APPLICATION PITFALLS  
Driving the inputs (analog or digital) beyond the power supply rails. For proper operation, all inputs should  
not go more than 100 mV beyond the supply rails (more than 100 mV below the ground pins or 100 mV above  
the supply pins). Exceeding these limits on even a transient basis may cause faulty or erratic operation. It is not  
uncommon for high speed digital components (e.g., 74F and 74AC devices) to exhibit overshoot or undershoot  
that goes above the power supply or below ground. A resistor of about 50to 100in series with any offending  
digital input, close to the signal source, will eliminate the problem.  
Do not allow input voltages to exceed the supply voltage, even on a transient basis. Not even during power up or  
power down.  
Be careful not to overdrive the inputs of the ADC12L080 with a device that is powered from supplies outside the  
range of the ADC12L080 supply. Such practice may lead to conversion inaccuracies and even to device  
damage.  
Attempting to drive a high capacitance digital data bus. The more capacitance the output drivers must  
charge for each conversion, the more instantaneous digital current flows through VDR and DR GND. These large  
charging current spikes can couple into the analog circuitry, degrading dynamic performance. Adequate  
bypassing and maintaining separate analog and digital areas on the PC board will reduce this problem.  
Additionally, bus capacitance beyond the specified 15 pF/pin will cause tOD to increase, making it difficult to  
properly latch the ADC output data. The result could, again, be an apparent reduction in dynamic performance.  
The digital data outputs should be buffered (with 74ACQ541, for example). Dynamic performance can also be  
improved by adding series resistors at each digital output, close to the ADC12L080, which reduces the energy  
coupled back into the converter output pins by limiting the output current. A reasonable value for these resistors  
is 100.  
Using an inadequate amplifier to drive the analog input. As explained in Signal Inputs, the sampling input is  
difficult to drive without degrading dynamic performance.  
If the amplifier exhibits overshoot, ringing, or any evidence of instability, even at a very low level, it will degrade  
performance. A small series resistor at each amplifier output and a capacitor at each of the ADC analog inputs to  
ground (as shown in Figure 39 and Figure 40) will improve performance. The LMH6702, LMH6628, LMH6622  
and LMH6655 have been successfully used to drive the analog inputs of the ADC12L080.  
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SNAS200B OCTOBER 2004REVISED MARCH 2013  
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Also, it is important that the signals at the two inputs have exactly the same amplitude and be exactly 180º out of  
phase with each other. Board layout, including equality of the length of the two traces to the input pins, will affect  
the effective phase between these two signals. Remember that an operational amplifier operated in the non-  
inverting configuration will exhibit more time delay than will the same device operating in the inverting  
configuration.  
Operating with the reference pins outside of the specified range. As mentioned in Reference Pins, VREF  
should be in the range specified in the Operating Ratings table. Operating outside of these limits could lead to  
performance degradation.  
Using a clock source with excessive jitter, using excessively long clock signal trace, or having other  
signals coupled to the clock signal trace. This will cause the sampling interval to vary, causing excessive  
output noise and a reduction in SNR and SINAD performance.  
26  
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ADC12L080  
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SNAS200B OCTOBER 2004REVISED MARCH 2013  
REVISION HISTORY  
Changes from Revision A (March 2013) to Revision B  
Page  
Changed layout of National Data Sheet to TI format .......................................................................................................... 26  
Copyright © 2004–2013, Texas Instruments Incorporated  
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PACKAGE OPTION ADDENDUM  
www.ti.com  
10-Dec-2020  
PACKAGING INFORMATION  
Orderable Device  
Status Package Type Package Pins Package  
Eco Plan  
Lead finish/  
Ball material  
MSL Peak Temp  
Op Temp (°C)  
Device Marking  
Samples  
Drawing  
Qty  
(1)  
(2)  
(3)  
(4/5)  
(6)  
ADC12L080CIVY/NOPB  
ACTIVE  
LQFP  
NEY  
32  
250  
RoHS & Green  
SN  
Level-3-260C-168 HR  
-40 to 85  
ADC12L0  
80CIVY  
(1) The marketing status values are defined as follows:  
ACTIVE: Product device recommended for new designs.  
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.  
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.  
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.  
OBSOLETE: TI has discontinued the production of the device.  
(2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance  
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may  
reference these types of products as "Pb-Free".  
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.  
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based  
flame retardants must also meet the <=1000ppm threshold requirement.  
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.  
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.  
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation  
of the previous line and the two combined represent the entire Device Marking for that device.  
(6)  
Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two  
lines if the finish value exceeds the maximum column width.  
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information  
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and  
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.  
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.  
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.  
Addendum-Page 1  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
23-Jun-2023  
TRAY  
L - Outer tray length without tabs  
KO -  
Outer  
tray  
height  
W -  
Outer  
tray  
width  
Text  
P1 - Tray unit pocket pitch  
CW - Measurement for tray edge (Y direction) to corner pocket center  
CL - Measurement for tray edge (X direction) to corner pocket center  
Chamfer on Tray corner indicates Pin 1 orientation of packed units.  
*All dimensions are nominal  
Device  
Package Package Pins SPQ Unit array  
Max  
matrix temperature  
(°C)  
L (mm)  
W
K0  
P1  
CL  
CW  
Name  
Type  
(mm) (µm) (mm) (mm) (mm)  
ADC12L080CIVY/NOPB  
NEY  
LQFP  
32  
250  
9 X 24  
150  
322.6 135.9 7620 12.2  
11.1 11.25  
Pack Materials-Page 1  
PACKAGE OUTLINE  
NEY0032A  
LQFP - 1.6 mm max height  
SCALE 1.800  
PLASTIC QUAD FLATPACK  
7.1  
6.9  
B
32  
25  
PIN 1 ID  
24  
1
7.1  
6.9  
9.4  
TYP  
8.6  
17  
8
A
9
16  
0.27  
0.17  
OPTIONAL:  
SHARP CORNERS EXCEPT  
PIN 1 ID CORNER  
28X 0.8  
4X 5.6  
32X  
0.2  
C A B  
SEE DETAIL A  
1.6 MAX  
C
SEATING PLANE  
0.09-0.20  
TYP  
0.25  
GAGE PLANE  
(1.4)  
0.1  
0.15  
0.05  
0.75  
0.45  
0 -7  
DETAIL  
A
S
C
A
L
E
:
1
2
DETAIL A  
TYPICAL  
4219901/A 10/2016  
NOTES:  
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing  
per ASME Y14.5M.  
2. This drawing is subject to change without notice.  
3. Reference JEDEC registration MS-026.  
www.ti.com  
EXAMPLE BOARD LAYOUT  
NEY0032A  
LQFP - 1.6 mm max height  
PLASTIC QUAD FLATPACK  
SYMM  
25  
32  
32X (1.6)  
1
24  
32X (0.4)  
SYMM  
(8.5)  
28X (0.8)  
8
17  
(R0.05) TYP  
9
16  
(8.5)  
LAND PATTERN EXAMPLE  
SCALE:8X  
0.07 MAX  
ALL AROUND  
0.07 MIN  
ALL AROUND  
METAL  
METAL UNDER  
SOLDER MASK  
SOLDER MASK  
SOLDER MASK  
OPENING  
SOLDER MASK  
DEFINED  
NON SOLDER MASK  
DEFINED  
SOLDER MASK DETAILS  
4219901/A 10/2016  
NOTES: (continued)  
4. Publication IPC-7351 may have alternate designs.  
5. Solder mask tolerances between and around signal pads can vary based on board fabrication site.  
www.ti.com  
EXAMPLE STENCIL DESIGN  
NEY0032A  
LQFP - 1.6 mm max height  
PLASTIC QUAD FLATPACK  
SYMM  
25  
32  
32X (1.6)  
1
24  
32X (0.4)  
SYMM  
(8.5)  
28X (0.8)  
8
17  
(R0.05) TYP  
16  
9
(8.5)  
SOLDER PASTE EXAMPLE  
SCALE 8X  
4219901/A 10/2016  
NOTES: (continued)  
6. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate  
design recommendations.  
7. Board assembly site may have different recommendations for stencil design.  
www.ti.com  
IMPORTANT NOTICE AND DISCLAIMER  
TI PROVIDES TECHNICAL AND RELIABILITY DATA (INCLUDING DATA SHEETS), DESIGN RESOURCES (INCLUDING REFERENCE  
DESIGNS), APPLICATION OR OTHER DESIGN ADVICE, WEB TOOLS, SAFETY INFORMATION, AND OTHER RESOURCES “AS IS”  
AND WITH ALL FAULTS, AND DISCLAIMS ALL WARRANTIES, EXPRESS AND IMPLIED, INCLUDING WITHOUT LIMITATION ANY  
IMPLIED WARRANTIES OF MERCHANTABILITY, FITNESS FOR A PARTICULAR PURPOSE OR NON-INFRINGEMENT OF THIRD  
PARTY INTELLECTUAL PROPERTY RIGHTS.  
These resources are intended for skilled developers designing with TI products. You are solely responsible for (1) selecting the appropriate  
TI products for your application, (2) designing, validating and testing your application, and (3) ensuring your application meets applicable  
standards, and any other safety, security, regulatory or other requirements.  
These resources are subject to change without notice. TI grants you permission to use these resources only for development of an  
application that uses the TI products described in the resource. Other reproduction and display of these resources is prohibited. No license  
is granted to any other TI intellectual property right or to any third party intellectual property right. TI disclaims responsibility for, and you  
will fully indemnify TI and its representatives against, any claims, damages, costs, losses, and liabilities arising out of your use of these  
resources.  
TI’s products are provided subject to TI’s Terms of Sale or other applicable terms available either on ti.com or provided in conjunction with  
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