ADS1299-4 [TI]
适用于生物电势测量的低噪声、4 通道、24 位模数转换器;型号: | ADS1299-4 |
厂家: | TEXAS INSTRUMENTS |
描述: | 适用于生物电势测量的低噪声、4 通道、24 位模数转换器 转换器 模数转换器 |
文件: | 总84页 (文件大小:1950K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
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ADS1299, ADS1299-4, ADS1299-6
ZHCS158C –JULY 2012–REVISED JANUARY 2017
ADS1299-x 适用于 EEG 和生物电势测量的低噪声 4 通道、6 通道、8 通
道、24 位模数转换器
1 特性
ADS1299-x 在每条通道中配有一个灵活的输入多路复
用器,该复用器可与内部生成的信号独立相连,完成测
试、温度和导联断开检测。此外,可选择输入通道的任
一配置生成患者偏置输出信号。提供可选 SRB 引脚,
旨在将公共信号路由至参考蒙太奇配置的多路输入。
ADS1299-x 以 250SPS 至 16kSPS 的数据传输速率运
行。可通过激励电流阱/电流源在器件内部实现导联断
开检测。
1
•
多达 8 个低噪声可编程增益放大器 (PGA) 和 8 个
高分辨率同步采样模数转换器 (ADC)
输入参考噪声:1 μVPP(带宽为 70Hz)
输入偏置电流:300pA
•
•
•
数据速率:250 每秒采样率 (SPS) 至 16 每秒千次
采样 (kSPS)
•
•
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共模抑制比 (CMRR):-110dB
可编程增益:1,2,4,6,8,12 或者 24
单极或者双极电源:
可在通道较多的系统中采用菊花链配置串联多个
ADS1299-4、ADS1299-6 或 ADS1299 器件。
ADS1299-x 采用 TQFP-64 封装,工作温度介于
–40°C 至 +85°C 之间。
–
–
模拟:4.75V 至 5.25V
数字:1.8V 至 3.6V
•
内置偏置驱动放大器,
持续断线检测,测试信号
器件信息(1)
•
•
•
•
•
•
内置振荡器
器件型号
ADS1299-x
封装
封装尺寸(标称值)
内部或者外部基准
TQFP (64)
10.00mm x 10.00mm
灵活的省电、待机模式
与ADS129x 引脚兼容
兼容串行外设接口 (SPI) 的串行接口
工作温度范围:-40°C 至 +85°C
(1) 要了解所有可用封装,请参见数据表末尾的可订购产品附录。
方框图
REF
Test Signals and
Monitors
Reference
ADC1
2 应用
SPI
A1
A2
A3
A4
•
医疗器械,包括:
ADC2
–
–
–
–
–
脑电图 (EEG) 研究
胎儿心电图 (ECG)
睡眠研究监视器
ADC3
Oscillator
ADC4
MUX
Control
A5
A6
ADC5
ADC6
双谱指数 (BIS)
诱发音频电位 (EAP)
A7
A8
ADC7
ADC8
3 说明
ADS1299-4、ADS1299-6 和 ADS1299 器件是一系列
四通道、六通道和八通道低噪声、24 位同步采样 Δ-Σ
模数转换器(ADC)系列产品。该系列内置可编程增益放
大器 (PGA)、内部基准以及板载振荡器。ADS1299-x
具备 颅外脑电图 (EEG) 和心电图 (ECG) 应用 所需的
全部常用功能。凭借高集成度和出色性能,ADS1299-
x 能够以大幅缩小的尺寸、显著降低的功耗和整体成本
构建可扩展的医疗仪器系统。
To Channel
¼
¼
PATIENT BIAS AND REFERENCE
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
English Data Sheet: SBAS499
ADS1299, ADS1299-4, ADS1299-6
ZHCS158C –JULY 2012–REVISED JANUARY 2017
www.ti.com.cn
目录
9.5 Programming........................................................... 38
9.6 Register Maps......................................................... 44
10 Applications and Implementation...................... 61
10.1 Application Information.......................................... 61
10.2 Typical Application ................................................ 66
11 Power Supply Recommendations ..................... 70
11.1 Power-Up Sequencing .......................................... 70
1
2
3
4
5
6
7
特性.......................................................................... 1
应用.......................................................................... 1
说明.......................................................................... 1
修订历史记录 ........................................................... 2
Device Comparison ............................................... 5
Pin Configuration and Functions......................... 5
Specifications......................................................... 7
7.1 Absolute Maximum Ratings ...................................... 7
7.2 ESD Ratings.............................................................. 7
7.3 Recommended Operating Conditions....................... 8
7.4 Thermal Information.................................................. 8
7.5 Electrical Characteristics........................................... 9
7.6 Timing Requirements: Serial Interface.................... 12
7.7 Switching Characteristics: Serial Interface.............. 12
7.8 Typical Characteristics............................................ 13
Parametric Measurement Information ............... 16
8.1 Noise Measurements .............................................. 16
Detailed Description ............................................ 18
9.1 Overview ................................................................. 18
9.2 Functional Block Diagram ....................................... 19
9.3 Feature Description................................................. 20
9.4 Device Functional Modes........................................ 34
11.2 Connecting the Device to Unipolar (5 V and 3.3 V)
Supplies ................................................................... 70
11.3 Connecting the Device to Bipolar (±2.5 V and 3.3 V)
Supplies ................................................................... 71
12 Layout................................................................... 72
12.1 Layout Guidelines ................................................. 72
12.2 Layout Example .................................................... 72
13 器件和文档支持 ..................................................... 74
13.1 文档支持................................................................ 74
13.2 相关链接................................................................ 74
13.3 接收文档更新通知 ................................................. 74
13.4 社区资源................................................................ 74
13.5 商标....................................................................... 74
13.6 静电放电警告......................................................... 74
13.7 Glossary................................................................ 74
14 机械、封装和可订购信息....................................... 75
8
9
4 修订历史记录
注:之前版本的页码可能与当前版本有所不同。
Changes from Revision B (October 2016) to Revision C
Page
•
•
Changed Maximum Junction parameter name to Junction in Absolute Maximum Ratings table .......................................... 7
Changed Recommended Operating Conditions table: changed free-air to ambient in conditions statement, changed
specifications of Input voltage parameter, and added VCM and fCLK symbols ........................................................................ 8
•
Changed conditions statement of Electrical Characteristics table: added TA to temperature conditions, moved DVDD
condition to after AVDD – AVSS condition ............................................................................................................................ 9
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•
Changed Input bias current parameter test conditions from input to InxP and INxN............................................................. 9
Changed Drift parameter unit from ppm to ppm/°C and changed Internal clock accuracy parameter test conditions
from –40°C ≤ TA ≤ +85°C to TA = –40°C to +85°C in Electrical Characteristics table ......................................................... 10
•
Changed IAVDD and IDVDD parameters [deleted (normal mode) from parameter names and added Normal mode to
test conditions], and deleted Quiescent from Power dissipation parameter name in Electrical Characteristics table ......... 11
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•
•
•
Changed free-air to ambient in conditions statement of Timing Requirements: Serial Interface table ................................ 12
Changed Analog Input section ............................................................................................................................................ 22
Changed Table 9 cross-reference to Table 7 in Settling Time section ................................................................................ 34
Changed Ideal Output Code versus Input Signal table: changed all VREF in first column to FS in and deleted footnote
1 ........................................................................................................................................................................................... 38
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•
•
•
•
Changed reset settings of bits 4 and 3 in bit register of CONFIG1 register......................................................................... 46
Changed reset value settings of bits 7 to 5 in CONFIG2 register: split cells apart.............................................................. 47
Changed reset value settings of bits 6 to 5 in CONFIG3 register: split cells apart ............................................................. 48
Changed AVDD – AVSS to AVDD + AVSS in description of bit 3 in Configuration Register 3 Field Descriptions ............. 48
Changed Lead-Off Control Register Field Descriptions table: changed 01 bit setting of bits 3:2 to 24 nA from 12 nA
changed description of bits 1:0............................................................................................................................................. 49
•
Changed Unused Inputs and Outputs section: added DRDY description, deleted statement of not floating unused
digital inputs ......................................................................................................................................................................... 61
2
版权 © 2012–2017, Texas Instruments Incorporated
ADS1299, ADS1299-4, ADS1299-6
www.ti.com.cn
ZHCS158C –JULY 2012–REVISED JANUARY 2017
修订历史记录 (接下页)
•
Deleted second Layout Guidelines sub-section from Layout section .................................................................................. 72
Changes from Revision A (August 2012) to Revision B
Page
•
已添加 ESD 额定值表,特性 描述 部分,器件功能模式,应用和实施部分,电源相关建议部分,布局部分,器件和文
档支持部分以及机械、封装和可订购信息部分........................................................................................................................ 1
已添加 ADS1299-4 和 ADS1299-6 至文档 ............................................................................................................................. 1
已添加 .................................................................................................................................................................................... 1
已删除 低功耗 特性要点.......................................................................................................................................................... 1
已更改 颅外脑电图 (EEG)(位于应用 和 说明 部分................................................................................................................ 1
已删除 最后一个应用要点 ....................................................................................................................................................... 1
已更改 说明部分:已添加有关 SRB 引脚的句子,已更改第二段的最后一句 ......................................................................... 1
已更改 通篇文档中的 ADS1299 系列器件至 ADS1299-x ....................................................................................................... 1
已更改 框图:已添加虚线框 ................................................................................................................................................... 1
Changed specifications for Lead-Off Detect, Frequency parameter of Electrical Characteristics table............................... 10
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Added specifications for ADS1299-4 and ADS1299-6 in Supply Current (Bias Turned Off) and Power Dissipation
(Analog Supply = 5 V, Bias Amplifiers Turned Off) sections of Electrical Characteristics table .......................................... 11
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Changed Noise Measurements section................................................................................................................................ 16
Changed Functional Block Diagram to show channels 5-8 not covered in ADS1299-4 and channels 7-8 not covered
in ADS1299-6 ....................................................................................................................................................................... 19
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Changed INxP and INxN pins in Figure 18 ......................................................................................................................... 20
Changed Figure 23: changed PgaP, PgaN to PGAp, PGAn ............................................................................................... 23
Changed Input Common-Mode Range section: changed input common-mode range description .................................... 23
Changed differential input voltage range in the Input Differential Dynamic Range section ................................................. 24
Changed Figure 34: MUX8[2:0] = 010 on IN8N, and BIAS_MEAS = 1 on BIASIN ............................................................. 29
Changed first sentence of second paragraph in Lead-Off Detection section....................................................................... 30
Changed AC Lead-Off (One Time or Periodic) section........................................................................................................ 31
Changed Bias Lead-Off section............................................................................................................................................ 32
Changed title of Figure 38 and power-down description in Bias Drive (DC Bias Circuit) section........................................ 33
Changed START Opcode to START in Figure 39................................................................................................................ 34
Changed Reset (RESET) section for clarity ......................................................................................................................... 35
Changed title, first paragraph, START Opcode and STOP Opcode to START and STOP (Figure 42), and STOP
Opcode to STOP Command (Figure 43) in Continuous Conversion Mode section............................................................. 36
•
•
•
•
•
Added last sentence to Data Input (DIN) section ................................................................................................................. 39
Added cross-reference to the Sending Multi-Byte Commands section in RDATAC: Read Data Continuous section ........ 41
Changed RDATAC Opcode to RDATAC in Figure 46.......................................................................................................... 41
Changed RDATA Opcode to RDATA in Figure 46............................................................................................................... 42
Changed description of SCLK rate restrictions, OPCODE 1 and OPCODE 2 to BYTE 1 and BYTE 2 in Figure 48 of
RREG: Read From Register section .................................................................................................................................... 43
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Changed footnotes 1 and 2 and added more cross-references to footnotes in rows 0Dh to 11h in Table 11 ................... 44
Changed register description and description of bit 5 in MISC1: Miscellaneous 1 Register section ................................... 59
Changed output names in Figure 68 from RA, LA, and RL to Electrode 1, Electrode 2, and BIAS Electrode,
respectively........................................................................................................................................................................... 63
•
Changed Power-Up Sequencing section.............................................................................................................................. 70
版权 © 2012–2017, Texas Instruments Incorporated
3
ADS1299, ADS1299-4, ADS1299-6
ZHCS158C –JULY 2012–REVISED JANUARY 2017
www.ti.com.cn
Changes from Original (July 2012) to Revision A
Page
•
已更改 器件系列和订购信息表的产品栏 ................................................................................................................................. 1
4
Copyright © 2012–2017, Texas Instruments Incorporated
ADS1299, ADS1299-4, ADS1299-6
www.ti.com.cn
ZHCS158C –JULY 2012–REVISED JANUARY 2017
5 Device Comparison
OPERATING
TEMPERATURE
RANGE
PACKAGE
MAXIMUM
SAMPLING RATE
PRODUCT
ADS1299-4
ADS1299-6
ADS1299
OPTIONS
TQFP-64
TQFP-64
TQFP-64
CHANNELS
ADC RESOLUTION
–40°C to +85°C
–40°C to +85°C
–40°C to +85°C
4
6
8
24
24
24
16 kSPS
16 kSPS
16 kSPS
6 Pin Configuration and Functions
PAG Package
64-Pin TQFP
Top View
IN8N
IN8P
IN7N
IN7P
IN6N
IN6P
IN5N
IN5P
IN4N
1
2
3
4
5
6
7
8
9
48 DVDD
47 DRDY
46 GPIO4
45 GPIO3
44 GPIO2
43 DOUT
42 GPIO1
41 DAISY_IN
40 SCLK
39 CS
IN4P 10
IN3N 11
IN3P 12
IN2N 13
IN2P 14
IN1N 15
IN1P 16
38 START
37 CLK
36 RESET
35 PWDN
34 DIN
33 DGND
Copyright © 2012–2017, Texas Instruments Incorporated
5
ADS1299, ADS1299-4, ADS1299-6
ZHCS158C –JULY 2012–REVISED JANUARY 2017
www.ti.com.cn
Pin Functions
PIN
TYPE
DESCRIPTION
NAME
NO.
19, 21, 22, 56, 59
Supply
Supply
Analog supply. Connect a 1-μF capacitor to AVSS.
AVDD
59
Charge pump analog supply. Connect a 1-μF capacitor to AVSS, pin 58.
Analog supply. Connect a 1-μF capacitor to AVSS1.
Analog ground
AVDD1
AVSS
54
Supply
20, 23, 32, 57
Supply
58
53
Supply
Analog ground for charge pump
Analog ground
AVSS1
BIASIN
BIASINV
BIASOUT
BIASREF
CS
Supply
62
Analog input
Analog input/output
Analog output
Analog input
Digital input
Digital input
Digital input
Digital input
Supply
Bias drive input to MUX
61
Bias drive inverting input
Bias drive output
63
60
Bias drive noninverting input
Chip select, active low
39
CLK
37
Master clock input
Master clock select(1)
CLKSEL
DAISY_IN
DGND
DIN
52
41
Daisy-chain input
33, 49, 51
34
Digital ground
Digital input
Digital output
Digital output
Supply
Serial data input
DOUT
43
Serial data output
DRDY
47
Data ready, active low
DVDD
48, 50
Digital power supply. Connect a 1-μF capacitor to DGND.
General-purpose input/output pin 1.
Connect to DGND with a ≥10-kΩ resistor if unused.
GPIO1
GPIO2
GPIO3
GPIO4
42
44
45
46
Digital input/output
Digital input/output
Digital input/output
Digital input/output
General-purpose input/output pin 2.
Connect to DGND with a ≥10-kΩ resistor if unused.
General-purpose input/output pin 3.
Connect to DGND with a ≥10-kΩ resistor if unused.
General-purpose input/output pin 4.
Connect to DGND with a ≥10-kΩ resistor if unused.
IN1N
IN1P
IN2N
IN2P
IN3N
IN3P
IN4N
IN4P
IN5N
IN5P
IN6N
IN6P
IN7N
IN7P
IN8N
IN8P
NC
15
16
13
14
11
12
9
Analog input
Analog input
Analog input
Analog input
Analog input
Analog input
Analog input
Analog input
Analog input
Analog input
Analog input
Analog input
Analog input
Analog input
Analog input
Analog input
—
Differential analog negative input 1(2)
Differential analog positive input 1(2)
Differential analog negative input 2(2)
Differential analog positive input 2(2)
Differential analog negative input 3(2)
Differential analog positive input 3(2)
Differential analog negative input 4(2)
Differential analog positive input 4(2)
Differential analog negative input 5(2) (ADS1299-6 and ADS1299 only)
Differential analog positive input 5(2) (ADS1299-6 and ADS1299 only)
Differential analog negative input 6(2) (ADS1299-6 and ADS1299 only)
Differential analog positive input 6(2) (ADS1299-6 and ADS1299 only)
Differential analog negative input 7(2) (ADS1299 only)
Differential analog positive input 7(2) (ADS1299 only)
Differential analog negative input 8(2) (ADS1299 only)
Differential analog positive input 8(2) (ADS1299 only)
No connection, leave as open circuit
10
7
8
5
6
3
4
1
2
27, 29
64
36
31
40
17
18
Reserved
RESET
RESV1
SCLK
SRB1
SRB2
Analog output
Digital input
Digital input
Digital input
Analog input/output
Analog input/output
Reserved for future use, leave as open circuit
System reset, active low
Reserved for future use, connect directly to DGND
Serial clock input
Patient stimulus, reference, and bias signal 1
Patient stimulus, reference, and bias signal 2
(1) Set the two-state mode setting pins high to DVDD or low to DGND through ≥10-kΩ resistors.
(2) Connect unused analog inputs directly to AVDD.
6
Copyright © 2012–2017, Texas Instruments Incorporated
ADS1299, ADS1299-4, ADS1299-6
www.ti.com.cn
ZHCS158C –JULY 2012–REVISED JANUARY 2017
Pin Functions (continued)
PIN
TYPE
DESCRIPTION
NAME
START
NO.
38
Digital input
Digital input
Synchronization signal to start or restart a conversion
PWDN
35
Power-down, active low
VCAP1
28
Analog output
Analog output
Analog bypass capacitor pin. Connect a 100-μF capacitor to AVSS.
Analog bypass capacitor pin. Connect a 1-μF capacitor to AVSS.
VCAP2
30
Analog bypass capacitor pin. Connect a parallel combination of 1-μF and 0.1-μF
capacitors to AVSS.
VCAP3
55
Analog output
VCAP4
VREFN
VREFP
26
25
24
Analog output
Analog input
Analog bypass capacitor pin. Connect a 1-μF capacitor to AVSS.
Negative analog reference voltage.
Analog input/output
Positive analog reference voltage. Connect a minimum 10-μF capacitor to VREFN.
7 Specifications
7.1 Absolute Maximum Ratings(1)
MIN
–0.3
MAX
5.5
UNIT
AVDD to AVSS
DVDD to DGND
AVSS to DGND
–0.3
3.9
–3
0.2
Voltage
VREFP to AVSS
–0.3
AVDD + 0.3
AVDD + 0.3
AVDD + 0.3
DVDD + 0.3
10
V
VREFN to AVSS
–0.3
Analog input
AVSS – 0.3
DGND – 0.3
–10
Digital input
Current
Input, continuous, any pin except power supply pins(2)
mA
°C
Junction, TJ
Storage, Tstg
150
Temperature
–60
150
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended
Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) Input pins are diode-clamped to the power-supply rails. Limit the input current to 10 mA or less if the analog input voltage exceeds
AVDD + 0.3 V or is less than AVSS – 0.3 V, or if the digital input voltage exceeds DVDD + 0.3 V or is less than DGND – 0.3 V.
7.2 ESD Ratings
VALUE
±1000
±500
UNIT
Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1)
Charged-device model (CDM), per JEDEC specification JESD22-C101(2)
V(ESD)
Electrostatic discharge
V
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
Copyright © 2012–2017, Texas Instruments Incorporated
7
ADS1299, ADS1299-4, ADS1299-6
ZHCS158C –JULY 2012–REVISED JANUARY 2017
www.ti.com.cn
7.3 Recommended Operating Conditions
over operating ambient temperature range (unless otherwise noted)
MIN
NOM
MAX
UNIT
POWER SUPPLY
Analog power supply
Digital power supply
Analog to Digital supply
AVDD to AVSS
DVDD to DGND
AVDD – DVDD
4.75
1.8
5
5.25
3.6
V
V
V
1.8
–2.1
3.6
ANALOG INPUTS
Full-scale differential input
voltage
VINxP – VINxN
±VREF / gain
V
See the Input Common-Mode Range
VCM
Input common-mode range
(VINxP + VINxN) / 2
subsection of the PGA Settings and Input
Range section
VOLTAGE REFERENCE INPUTS
VREF
Reference input voltage
Negative input
VREF = (VVREFP – VVREFN
)
4.5
AVSS
V
V
V
VREFN
VREFP
Positive input
AVSS + 4.5
CLOCK INPUT
fCLK
External clock input frequency CLKSEL pin = 0
1.5
DGND – 0.1
–40
2.048
2.25
DVDD + 0.1
85
MHz
V
DIGITAL INPUTS
Input voltage
TEMPERATURE RANGE
TA
Operating temperature range
°C
7.4 Thermal Information
ADS1299-4, ADS1299-6, ADS1299
THERMAL METRIC(1)
PAG (TQFP)
64 PINS
46.2
UNIT
RθJA
Junction-to-ambient thermal resistance
°C/W
°C/W
°C/W
°C/W
°C/W
°C/W
RθJC(top)
RθJB
Junction-to-case (top) thermal resistance
Junction-to-board thermal resistance
5.8
19.6
ψJT
Junction-to-top characterization parameter
Junction-to-board characterization parameter
Junction-to-case (bottom) thermal resistance
0.2
ψJB
19.2
RθJC(bot)
n/a
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report.
8
Copyright © 2012–2017, Texas Instruments Incorporated
ADS1299, ADS1299-4, ADS1299-6
www.ti.com.cn
ZHCS158C –JULY 2012–REVISED JANUARY 2017
7.5 Electrical Characteristics
Minimum and maximum specifications apply from TA = –40°C to 85°C. Typical specifications are at TA = +25°C. All
specifications are at AVDD – AVSS = 5 V, DVDD = 3.3 V, VREF = 4.5 V, external fCLK = 2.048 MHz, data rate = 250 SPS, and
gain = 12 (unless otherwise noted)
PARAMETER
ANALOG INPUTS
Input capacitance
TEST CONDITIONS
MIN
TYP
MAX
UNIT
20
pF
pA
TA = +25°C, InxP and INxN = 2.5 V
±300
Input bias current
TA = –40°C to +85°C, InxP and INxN = 2.5
V
±300
500
No lead-off
1000
DC input impedance
MΩ
Current source lead-off detection
(ILEADOFF = 6 nA)
PGA PERFORMANCE
Gain settings
Bandwidth
1, 2, 4, 6, 8, 12, 24
See Table 5
BW
ADC PERFORMANCE
Resolution
24
250
Bits
DR
Data rate
fCLK = 2.048 MHz
16000
SPS
DC CHANNEL PERFORMANCE
10 seconds of data, gain = 24(1)
1
1
250 points, 1 second of data, gain = 24,
TA = +25°C
1.35
1.6
μVPP
Input-referred noise (0.01 Hz to 70 Hz)
250 points, 1 second of data, gain = 24,
TA = –40°C to +85°C
1
All other sample rates and gain settings
Full-scale with gain = 12, best fit
See Noise Measurements
INL
Integral nonlinearity
8
60
80
0.1
3
ppm
μV
Offset error
Offset error drift
Gain error
nV/°C
% of FS
ppm/°C
% of FS
Excluding voltage reference error
Excluding voltage reference drift
±0.5
Gain drift
Gain match between channels
0.2
AC CHANNEL PERFORMANCE
CMRR
PSRR
Common-mode rejection ratio
fCM = 50 Hz and 60 Hz(2)
–110
–120
96
dB
dB
dB
dB
dB
Power-supply rejection ratio
Crosstalk
fPS = 50 Hz and 60 Hz
fIN = 50 Hz and 60 Hz
–110
121
–99
SNR
THD
Signal-to-noise ratio
Total harmonic distortion
VIN = –2 dBFs, fIN = 10-Hz input, gain = 12
VIN = –0.5 dBFs, fIN = 10 Hz
PATIENT BIAS AMPLIFIER
Integrated noise
BW = 150 Hz
2
100
0.07
–80
μVRMS
kHz
V/μs
dB
Gain bandwidth product
50-kΩ || 10-pF load, gain = 1
50-kΩ || 10-pF load, gain = 1
fIN = 10 Hz, gain = 1
Slew rate
THD
Total harmonic distortion
Common-mode input range
Short-circuit current
AVSS + 0.3
AVDD – 0.3
V
1.1
20
mA
μA
Quiescent power consumption
(1) Noise data measured in a 10-second interval. Test not performed in production. Input-referred noise is calculated with the input shorted
(without electrode resistance) over a 10-second interval.
(2) CMRR is measured with a common-mode signal of AVSS + 0.3 V to AVDD – 0.3 V. The values indicated are the minimum of the eight
channels.
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Electrical Characteristics (continued)
Minimum and maximum specifications apply from TA = –40°C to 85°C. Typical specifications are at TA = +25°C. All
specifications are at AVDD – AVSS = 5 V, DVDD = 3.3 V, VREF = 4.5 V, external fCLK = 2.048 MHz, data rate = 250 SPS, and
gain = 12 (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
LEAD-OFF DETECT
At dc, fDR / 4,
see Register Maps for settings
Continuous
Frequency
Current
Hz
One time or periodic
ILEAD_OFF[1:0] = 00
ILEAD_OFF[1:0] = 01
ILEAD_OFF[1:0] = 10
ILEAD_OFF[1:0] = 11
7.8, 31.2
6
24
nA
6
μA
24
Current accuracy
±20%
±30
Comparator threshold accuracy
mV
kΩ
V
EXTERNAL REFERENCE
Input impedance
5.6
INTERNAL REFERENCE
VREF
Internal reference voltage
4.5
±0.2%
35
VREF accuracy
Drift
TA = –40°C to +85°C
ppm/°C
ms
Start-up time
150
SYSTEM MONITORS
Analog supply
Digital supply
2%
Reading error
2%
From power-up to DRDY low
STANDBY mode
150
ms
µs
Device wake up
31.25
Voltage
TA = +25°C
145
490
mV
μV/°C
Hz
Temperature
sensor reading
Coefficient
fCLK / 221, fCLK / 220
±1, ±2
Signal frequency
Signal voltage
Accuracy
See Register Maps section for settings
See Register Maps section for settings
Test signal
mV
±2%
CLOCK
Internal oscillator clock frequency
Nominal frequency
TA = +25°C
2.048
MHz
±0.5%
±2.5%
Internal clock accuracy
TA = –40°C to +85°C
Internal oscillator start-up time
Internal oscillator power consumption
20
μs
120
μW
DIGITAL INPUT/OUTPUT (DVDD = 1.8 V to 3.6 V)
VIH
VIL
High-level input voltage
Low-level input voltage
High-level output voltage
Low-level output voltage
Input current
0.8 DVDD
–0.1
DVDD + 0.1
0.2 DVDD
V
V
VOH
VOL
IOH = –500 μA
0.9 DVDD
V
IOL = +500 μA
0.1 DVDD
10
V
0 V < VDigitalInput < DVDD
–10
μA
10
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ZHCS158C –JULY 2012–REVISED JANUARY 2017
Electrical Characteristics (continued)
Minimum and maximum specifications apply from TA = –40°C to 85°C. Typical specifications are at TA = +25°C. All
specifications are at AVDD – AVSS = 5 V, DVDD = 3.3 V, VREF = 4.5 V, external fCLK = 2.048 MHz, data rate = 250 SPS, and
gain = 12 (unless otherwise noted)
PARAMETER
TEST CONDITIONS
Normal mode, AVDD – AVSS = 5 V
Normal mode, DVDD = 3.3 V
Normal mode, DVDD = 1.8 V
MIN
TYP
MAX
UNIT
SUPPLY CURRENT (Bias Turned Off)
ADS1299-4
4.06
5.57
7.14
0.54
0.66
1
IAVDD
AVDD current
DVDD current
ADS1299-6
ADS1299
mA
ADS1299-4
ADS1299-6
ADS1299
IDVDD
mA
ADS1299-4
ADS1299-6
ADS1299
0.27
0.34
0.5
POWER DISSIPATION (Analog Supply = 5 V, Bias Amplifiers Turned Off)
Normal mode
22
10
24
33
42
mW
µW
ADS1299-4
Power dissipation ADS1299-6
ADS1299
Power-down
Standby mode, internal reference
Normal mode
5.1
30
mW
mW
µW
Power-down
10
Standby mode, internal reference
Normal mode
5.1
39
mW
mW
µW
Power-down
10
Standby mode, internal reference
5.1
mW
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7.6 Timing Requirements: Serial Interface
over operating ambient temperature range (unless otherwise noted)
2.7 V ≤ DVDD ≤ 3.6 V 1.8 V ≤ DVDD ≤ 2.0 V
MIN
414
6
MAX
MIN
414
17
66.6
25
10
11
2
MAX
666
UNIT
ns
tCLK
Master clock period
666
tCSSC
Delay time, CS low to first SCLK
SCLK period
ns
tSCLK
50
15
10
10
2
ns
tSPWH, L
tDIST
Pulse duration, SCLK pulse duration, high or low
Setup time, DIN valid to SCLK falling edge
Hold time, valid DIN after SCLK falling edge
Pulse duration, CS high
ns
ns
tDIHD
ns
tCSH
tCLK
tCLK
tCLK
ns
tSCCS
Delay time, final SCLK falling edge to CS high
Command decode time
4
4
tSDECODE
tDISCK2ST
tDISCK2HT
4
4
Setup time, DAISY_IN valid to SCLK rising edge
Hold time, DAISY_IN valid after SCLK rising edge
10
10
10
10
ns
7.7 Switching Characteristics: Serial Interface
over operating ambient temperature range (unless otherwise noted)
2.7 V ≤ DVDD ≤ 3.6 V 1.8 V ≤ DVDD ≤ 2.0 V
PARAMETER
MIN
MAX
MIN
MAX
UNIT
ns
tDOHD
tDOPD
tCSDOD
tCSDOZ
Hold time, SCLK falling edge to invalid DOUT
Propagation delay time, SCLK rising edge to DOUT valid
Propagation delay time, CS low to DOUT driven
Propagation delay time, CS high to DOUT Hi-Z
10
10
17
32
ns
10
20
ns
10
20
ns
tCLK
CLK
tCSSC
tCSH
tSDECODE
CS
tSPWL
tSCCS
tSCLK
tSPWH
SCLK
1
2
3
8
1
2
3
8
tDIHD
tDOHD
tDIST
tDOPD
DIN
tCSDOZ
Hi-Z
tCSDOD
Hi-Z
DOUT
NOTE: SPI settings are CPOL = 0 and CPHA = 1.
Figure 1. Serial Interface Timing
tDISCK2ST
tDISCK2HT
MSBD1
LSBD1
DAISY_IN
SCLK
1
2
3
216
217
218
219
MSBD1
MSB
LSB
DOUT
Figure 2. Daisy-Chain Interface Timing
12
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7.8 Typical Characteristics
At TA = 25°C, AVDD = 5 V, AVSS = 0 V, DVDD = 3.3 V, internal VREFP = 4.5 V, VREFN = AVSS, external clock = 2.048
MHz, data rate = 250 SPS, and gain = 12 (unless otherwise noted)
0.5
0.4
800
700
600
500
400
300
200
100
0
Gain = 24
Gain = 24
0.3
0.2
0.1
0
−0.1
−0.2
−0.3
−0.4
−0.5
1
2
3
4
5
6
7
8
9
10
Time (s)
G003
Input−Referred Noise (µV)
G004
Figure 3. Input-Referred Noise
Figure 4. Noise Histogram
400
350
300
250
200
150
100
50
−100
−105
−110
−115
−120
−125
−130
−135
Data Rate = 4 kSPS
AIN = AVDD − 0.3 V to AVSS + 0.3 V
Data Rate = 250 SPS to 8 kSPS
Data Rate = 16 kSPS
Gain = 1
Gain = 2
Gain = 4
Gain = 6
Gain = 8
Gain = 12
Gain = 24
0
10
100
1000
0
0.5
1
1.5
2
2.5
3
3.5
4
4.5
5
Frequency (Hz)
Input Voltage (V)
G005
G006
Figure 5. Common-Mode Rejection Ratio vs Frequency
Figure 6. Leakage Current vs Input Voltage
200
120
115
110
105
100
95
G = 1
G = 2
G = 4
G = 6
G = 8
G = 12
G = 24
175
150
125
100
75
50
90
Input Voltage = 2.5 V
Data Rate = 250 SPS to 8 kSPS
25
0
85
80
−40 −30 −20 −10
0
10 20 30 40 50 60 70 80 90
Temperature (°C)
10
100
Frequency (Hz)
1000
G007
G008
Figure 7. Leakage Current vs Temperature
Figure 8. PSRR vs Frequency
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Typical Characteristics (continued)
At TA = 25°C, AVDD = 5 V, AVSS = 0 V, DVDD = 3.3 V, internal VREFP = 4.5 V, VREFN = AVSS, external clock = 2.048
MHz, data rate = 250 SPS, and gain = 12 (unless otherwise noted)
−60
−65
−70
−75
−80
−85
−90
−95
−100
−105
12
10
8
Gain = 1
Gain = 2
Gain = 4
Gain = 6
Gain = 8
Gain = 12
Gain = 24
Data Rate = 8 kSPS
AIN = −0.5 dBFS
Gain = 1
Gain = 2
Gain = 4
Gain = 6
Gain = 8
Gain = 12
Gain = 24
6
4
2
0
−2
−4
−6
−8
−10
10
100
Frequency (Hz)
1000
−1 −0.8 −0.6 −0.4 −0.2
0
0.2 0.4 0.6 0.8
Input (Normalized to Full-Scale)
1
G009
G010
Figure 9. THD vs Frequency
Figure 10. INL vs PGA Gain
8
6
0
−20
Gain = 12
PGA Gain = 12
THD = −99 dB
SNR = 120 dB
Data Rate = 500 SPS
4
−40
2
−60
0
−80
−2
−4
−6
−8
−10
−100
−120
−140
−160
−180
+25°C
−40°C
+85°C
−1 −0.8 −0.6 −0.4 −0.2
0
0.2 0.4 0.6 0.8
1
0
50
100
150
200
250
Frequency (Hz)
Input Range (Normalized to Full−Scale)
G011
G012
Figure 11. INL vs Temperature
Figure 12. THD FFT Plot (60-Hz Signal)
0
−20
600
500
400
300
200
100
0
PGA Gain = 12
THD = −94 dB
SNR = 101 dB
−40
Data Rate = 16 kSPS
−60
−80
−100
−120
−140
−160
−180
0
2000
4000
6000
8000
1
10
30
Frequency (Hz)
PGA Gain
G013
G014
Figure 13. FFT Plot (60-Hz Signal)
Figure 14. Offset vs PGA Gain (Absolute Value)
14
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Typical Characteristics (continued)
At TA = 25°C, AVDD = 5 V, AVSS = 0 V, DVDD = 3.3 V, internal VREFP = 4.5 V, VREFN = AVSS, external clock = 2.048
MHz, data rate = 250 SPS, and gain = 12 (unless otherwise noted)
70
60
50
40
30
20
10
0
80
70
60
50
40
30
20
10
0
Data From 31 Devices, Two Lots
Data From 31 Devices, Two Lots
Error (%)
G015
Threshold Error (mV)
G016
Figure 15. Test Signal Amplitude Accuracy
Figure 16. Lead-Off Comparator Threshold Accuracy
350
Current Setting = 24 nA
300
250
200
150
100
50
0
Error in Current Magnitude (nA)
G017
Figure 17. Lead-Off Current Source Accuracy Distribution
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8 Parametric Measurement Information
8.1 Noise Measurements
NOTE
Unless otherwise noted, ADS1299-x refers to all specifications and functional descriptions
of the ADS1299-4, ADS1299-6, and ADS1299.
Optimize the ADS1299-x noise performance by adjusting the data rate and PGA setting. Reduce the data rate to
increase the averaging, and the noise drops correspondingly. Increase the PGA value to reduce the input-
referred noise. This lowered noise level is particularly useful when measuring low-level biopotential signals.
Table 1 to Table 4 summarize the ADS1299-x noise performance with a 5-V analog power supply. The data are
representative of typical noise performance at TA = +25°C. The data shown are the result of averaging the
readings from multiple devices and are measured with the inputs shorted together. A minimum of 1000
consecutive readings are used to calculate the RMS and peak-to-peak noise for each reading. For the lower data
rates, the ratio is approximately 6.6.
Table 1 shows measurements taken with an internal reference. The data are also representative of the
ADS1299-x noise performance when using a low-noise external reference such as the REF5045.
Table 1, Table 2, Table 3, and Table 4 list the input-referred noise in units of μVRMS and μVPP for the conditions
shown. The corresponding data in units of effective number of bits (ENOB) where ENOB for the RMS noise is
defined as in Equation 1:
≈
’
VREF
ENOB = log2
∆
∆
«
÷
÷
2 ìGainì VRMS ◊
(1)
Noise-free bits for the peak-to-peak noise are calculated with the same method.
The dynamic range data in Table 1, Table 2, Table 3, and Table 4 are calculated using Equation 2:
≈
’
VREF
Dynamic Range = 20ìlog
∆
∆
«
÷
÷
2 ìGainì VRMS ◊
(2)
Table 1. Input-Referred Noise (μVRMS, μVPP) in Normal Mode
5-V Analog Supply and 4.5-V Reference(1)
PGA
PGA
GAIN = 1
GAIN = 2
DR BITS OF
CONFIG1
REGISTER
OUTPUT
DATA RATE
(SPS)
DYNAMIC
RANGE
(dB)
NOISE-
FREE
BITS
DYNAMIC
RANGE
(dB)
NOISE-
FREE
BITS
–3-dB
BANDWIDTH (Hz)
μVRMS
21.70
6.93
4.33
3.06
2.17
1.53
1.08
—
μVPP
151.89
48.53
30.34
21.45
15.17
10.73
7.59
ENOB
17.16
18.81
19.49
19.99
20.49
20.99
21.48
—
μVRMS
10.85
3.65
2.28
1.61
1.14
0.81
0.57
—
μVPP
75.94
25.52
15.95
11.29
7.98
5.65
3.99
—
ENOB
000
001
010
011
100
101
110
111
16000
8000
4000
2000
1000
500
4193
2096
1048
524
262
131
65
103.3
113.2
117.3
120.3
123.3
126.3
129.3
—
15.85
17.50
18.18
18.68
19.18
19.68
20.18
—
103.3
112.8
116.9
119.9
122.9
125.9
128.9
—
15.85
17.43
18.11
18.60
19.10
19.60
20.10
—
17.16
18.74
19.41
19.91
20.41
20.91
21.41
—
250
n/a
n/a
—
(1) At least 1000 consecutive readings were used to calculate the RMS and peak-to-peak noise values in this table.
16
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Table 2. Input-Referred Noise (μVRMS, μVPP) in Normal Mode
5-V Analog Supply and 4.5-V Reference(1)
PGA
PGA
GAIN = 4
GAIN = 6
DR BITS OF
CONFIG1
REGISTER
OUTPUT
DATA RATE
(SPS)
DYNAMIC
RANGE
(dB)
NOISE-
FREE
BITS
DYNAMIC
RANGE
(dB)
NOISE-
FREE
BITS
–3-dB
BANDWIDTH (Hz)
μVRMS
5.60
1.98
1.24
0.88
0.62
0.44
0.31
—
μVPP
39.23
13.87
8.66
6.13
4.34
3.07
2.16
—
ENOB
17.12
18.62
19.29
19.79
20.29
20.79
21.30
—
μVRMS
3.87
1.31
0.93
0.66
0.46
0.33
0.23
—
μVPP
27.10
9.19
6.50
4.60
3.25
2.30
1.62
—
ENOB
17.06
18.62
19.12
19.62
20.12
20.62
21.13
—
000
001
010
011
100
101
110
111
16000
8000
4000
2000
1000
500
4193
2096
1048
524
262
131
65
103.0
112.1
116.1
119.2
122.2
125.2
128.2
—
15.81
17.31
17.99
18.49
18.99
19.49
19.99
—
102.7
112.1
115.1
118.1
121.1
124.1
127.2
—
15.76
17.32
17.82
18.32
18.81
19.31
19.82
—
250
n/a
n/a
(1) At least 1000 consecutive readings were used to calculate the RMS and peak-to-peak noise values in this table.
Table 3. Input-Referred Noise (μVRMS, μVPP) in Normal Mode
5-V Analog Supply and 4.5-V Reference(1)
PGA
PGA
GAIN = 8
GAIN = 12
DR BITS OF
CONFIG1
REGISTER
OUTPUT
DATA RATE
(SPS)
DYNAMIC
RANGE
(dB)
NOISE-
FREE
BITS
DYNAMIC
RANGE
(dB)
NOISE-
FREE
BITS
–3-dB
BANDWIDTH (Hz)
μVRMS
3.05
1.11
0.79
0.56
0.39
0.28
0.20
—
μVPP
21.32
7.80
5.52
3.90
2.76
1.95
1.38
—
ENOB
16.99
18.45
18.95
19.44
19.94
20.44
20.95
—
μVRMS
2.27
0.92
0.65
0.46
0.32
0.23
0.16
—
μVPP
15.89
6.41
4.53
3.20
2.26
1.61
1.13
—
ENOB
16.83
18.14
18.64
19.14
19.65
20.14
20.65
—
000
001
010
011
100
101
110
111
16000
8000
4000
2000
1000
500
4193
2096
1048
524
262
131
65
102.3
111.0
114.0
117.1
120.1
123.1
126.1
—
15.69
17.14
17.64
18.14
18.64
19.14
19.64
—
101.3
109.2
112.2
115.2
118.3
121.2
124.3
—
15.53
16.84
17.34
17.84
18.34
18.83
19.34
—
250
n/a
n/a
(1) At least 1000 consecutive readings were used to calculate the RMS and peak-to-peak noise values in this table.
Table 4. Input-Referred Noise (μVRMS, μVPP) in Normal Mode
5-V Analog Supply and 4.5-V Reference(1)
PGA
GAIN = 24
DR BITS OF CONFIG1
REGISTER
OUTPUT DATA
RATE (SPS)
DYNAMIC
RANGE (dB)
NOISE-FREE
BITS
–3-dB BANDWIDTH (Hz)
μVRMS
1.66
0.80
0.56
0.40
0.28
0.20
0.14
—
μVPP
11.64
5.57
3.94
2.79
1.97
1.39
0.98
—
ENOB
000
001
010
011
100
101
110
111
16000
8000
4000
2000
1000
500
4193
2096
1048
524
262
131
65
98.0
104.4
107.4
110.4
113.5
116.5
119.5
—
14.98
16.04
16.54
17.04
17.54
18.04
18.54
—
16.28
17.35
17.84
18.35
18.85
19.35
19.85
—
250
n/a
n/a
(1) At least 1000 consecutive readings were used to calculate the RMS and peak-to-peak noise values in this table.
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9 Detailed Description
9.1 Overview
The ADS1299-x is a low-noise, low-power, multichannel, simultaneously-sampling, 24-bit, delta-sigma (ΔΣ)
analog-to-digital converter (ADC) with an integrated programmable gain amplifier (PGA). These devices integrate
various EEG-specific functions that makes the family well-suited for scalable electrocardiogram (ECG),
electroencephalography (EEG) applications. These devices can also be used in high-performance, multichannel,
data acquisition systems by powering down the ECG or EEG-specific circuitry.
The devices have a highly-programmable multiplexer that allows for temperature, supply, input short, and bias
measurements. Additionally, the multiplexer allows any input electrodes to be programmed as the patient
reference drive. The PGA gain can be chosen from one of seven settings (1, 2, 4, 6, 8, 12, and 24). The ADCs in
the device offer data rates from 250 SPS to 16 kSPS. Communication to the device is accomplished using an
SPI-compatible interface. The device provides four general-purpose input/output (GPIO) pins for general use.
Multiple devices can be synchronized using the START pin.
The internal reference generates a low noise 4.5 V internal voltage when enabled and the internal oscillator
generates a 2.048-MHz clock when enabled. The versatile patient bias drive block allows the average of any
electrode combination to be chosen in order to generate the patient drive signal. Lead-off detection can be
accomplished by using a current source or sink. A one-time, in-band, lead-off option and a continuous, out-of-
band, internal lead-off option are available.
18
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9.2 Functional Block Diagram
AVDD AVDD1
VREFP VREFN
DVDD
Test Signal
Temperature Sensor Input
Power-Supply Signal
Reference
Lead-Off Excitation Source
DRDY
IN1P
DS
Low-Noise
PGA1
ADC1
CS
IN1N
IN2P
SCLK
DIN
DOUT
SPI
DS
Low-Noise
PGA2
ADC2
IN2N
IN3P
DS
Low-Noise
PGA3
ADC3
IN3N
IN4P
CLKSEL
CLK
DS
Low-Noise
PGA4
Oscillator
MUX
ADC4
IN4N
Control
GPIO1
IN5P
GPIO4
GPIO3
DS
Low-Noise
PGA5
ADC5
IN5N
IN6P
GPIO2
DS
Low-Noise
PGA6
ADC6
IN6N
IN7P
PWDN
RESET
DS
Low-Noise
PGA7
ADC7
IN7N
IN8P
START
DS
Low-Noise
PGA8
ADC8
IN8N
BIAS
Amplifier
AVSS AVSS1
DGND
BIAS BIAS
REF OUT
BIAS
INV
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9.3 Feature Description
This section contains details of the ADS1299-x internal functional elements. The analog blocks are discussed
first, followed by the digital interface. Blocks implementing EEG-specific functions are covered at the end of this
section.
Throughout this document, fCLK denotes the CLK pin signal frequency, tCLK denotes the CLK pin signal period,
fDR denotes the output data rate, tDR denotes the output data time period, and fMOD denotes the frequency at
which the modulator samples the input.
9.3.1 Analog Functionality
9.3.1.1 Input Multiplexer
The ADS1299-x input multiplexers are very flexible and provide many configurable signal-switching options.
Figure 18 shows the multiplexer on a single channel of the device. Note that the device has either four
(ADS1299-4), six (ADS1299-6) or eight (ADS1299) such blocks, one for each channel. SRB1, SRB2, and
BIASIN are common to all blocks. INxP and INxN are separate for each of the four, six, or eight blocks. This
flexibility allows for significant device and sub-system diagnostics, calibration, and configuration. Switch setting
selections for each channel by writing the appropriate values to the CHnSET[3:0] register (see the CHnSET:
Individual Channel Settings section for details) using the BIAS_MEAS bit in the CONFIG3 register and the SRB1
bit in the MISC1 register (see the CONFIG3: Configuration Register 3 subsection of the Register Maps section
for details). See the Input Multiplexer section for further information regarding the EEG-specific features of the
multiplexer.
To Next Channels
To Next Channels
TI Device
MUX
INT_TEST
TESTP
MUX[2:0] = 101
MUX[2:0] =100
MUX[2:0] =011
TempP
MVDDP
From LOFFP
MAIN(1)
To PGAP
INxP
INxN
MUX[2:0] =110
MUX[2:0] = 010 AND
BIAS_MEAS
CHxSET[3] = 1
MUX[2:0] =001
(VREFP + VREFN)
2
MUX[2:0] =111
MAIN(1) AND SRB1
MUX[2:0] =001
To PGAN
MAIN(1)
AND SRB1
From LoffN
(AVDD+AVSS)
BIASREF_INT=1
BIASREF_INT=0
MUX[2:0] = 010
AND
BIAS_MEAS
2
MUX[2:0] = 011
MUX[2:0] = 100
MUX[2:0] = 101
MVDDN
TempN
INT_TEST
TESTM
BIASREF
SRB2
BIAS_IN
SRB1
Copyright © 2016, Texas Instruments Incorporated
(1) MAIN is equal to either MUX[2:0] = 000, MUX[2:0] = 110, or MUX[2:0] = 111.
Figure 18. Input Multiplexer Block for One Channel
20
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Feature Description (continued)
9.3.1.1.1 Device Noise Measurements
Setting CHnSET[2:0] = 001 sets the common-mode voltage of [(VVREFP + VVREFN) / 2] to both channel inputs.
This setting can be used to test inherent device noise in the user system.
9.3.1.1.2 Test Signals (TestP and TestN)
Setting CHnSET[2:0] = 101 provides internally-generated test signals for use in sub-system verification at power-
up. This functionality allows the device internal signal chain to be tested out.
Test signals are controlled through register settings (see the CONFIG2: Configuration Register 2 subsection in
the Register Maps section for details). TEST_AMP controls the signal amplitude and TEST_FREQ controls
switching at the required frequency.
9.3.1.1.3 Temperature Sensor (TempP, TempN)
The ADS1299-x contains an on-chip temperature sensor. This sensor uses two internal diodes with one diode
having a current density 16x that of the other, as shown in Figure 19. The difference in diode current densities
yields a voltage difference proportional to absolute temperature.
As a result of the low thermal resistance of the package to the printed circuit board (PCB), the internal device
temperature tracks PCB temperature closely. Note that self-heating of the ADS1299-x causes a higher reading
than the temperature of the surrounding PCB.
The scale factor of Equation 3 converts the temperature reading to degrees Celsius. Before using this equation,
the temperature reading code must first be scaled to microvolts.
Temperature Reading (mV) - 145,300 mV
Temperature (°C) =
+ 25°C
490 mV/°C
(3)
Temperature Sensor Monitor
AVDD
1x
2x
To MUX TempP
To MUX TempN
8x
1x
AVSS
Figure 19. Temperature Sensor Measurement in the Input
9.3.1.1.4 Supply Measurements (MVDDP, MVDDN)
Setting CHnSET[2:0]
= 011 sets the channel inputs to different supply voltages of the device.
For channels 1, 2, 5, 6, 7, and 8, (MVDDP – MVDDN) is [0.5 × (AVDD + AVSS)].
For channels 3 and 4, (MVDDP – MVDDN) is DVDD / 4.
To avoid saturating the PGA when measuring power supplies, set the gain to 1.
9.3.1.1.5 Lead-Off Excitation Signals (LoffP, LoffN)
The lead-off excitation signals are fed into the multiplexer before the switches. The comparators that detect the
lead-off condition are also connected to the multiplexer block before the switches. For a detailed description of
the lead-off block, see the Lead-Off Detection section.
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Feature Description (continued)
9.3.1.1.6 Auxiliary Single-Ended Input
The BIASIN pin is primarily used for routing the bias signal to any electrodes in case the bias electrode falls off.
However, the BIASIN pin can be used as a multiple single-ended input channel. The signal at the BIASIN pin can
be measured with respect to the voltage at the BIASREF pin using any of the eight channels. This measurement
is done by setting the channel multiplexer setting to '010' and the BIAS_MEAS bit of the CONFIG3 register to '1'.
9.3.1.2 Analog Input
The analog inputs to the device connect directly to an integrated low-noise, low-drift, high input impedance,
programmable gain amplifier. The amplifier is located following the individual channel multiplexer.
The ADS1299-x analog inputs are fully differential. The differential input voltage (VINxP – VINxN) can span from
–VREF / gain to VREF / gain. See the Data Format section for an explanation of the correlation between the analog
input and digital codes. There are two general methods of driving the ADS1299-x analog inputs: pseudo-
differential or fully-differential, as shown in Figure 20, Figure 21, and Figure 22.
-VREF / Gain
to
VREF / Gain
VREF / Gain
Peak-to-Peak
Device
Device
Common
Voltage
VREF / Gain
Peak-to-Peak
Common
Voltage
a) Psuedo-Differential Input
b) Differential Input
Figure 20. Methods of Driving the ADS1299-x: Pseudo-Differential or Fully Differential
INxP
INxP
INxN
VCM
VCM
INxN
Figure 21. Pseudo-Differential Input Mode
Figure 22. Fully-Differential Input Mode
Hold the INxN pin at a common voltage, preferably at mid supply, to configure the fully differential input for a
pseudo-differential signal. Swing the INxP pin around the common voltage –VREF / gain to VREF / gain and remain
within the absolute maximum specifications. The common-mode voltage (VCM) changes with varying signal level
when the inputs are configured in pseudo-differential mode. Verify that the differential signal at the minimum and
maximum points meets the common-mode input specification discussed in the Input Common-Mode Range
section.
Configure the signals at INxP and INxN to be 180° out-of-phase centered around a common voltage to use a
fully differential input method. Both the INxP and INxN inputs swing from the common voltage + ½ VREF / gain to
the common voltage – ½ VREF / gain. The differential voltage at the maximum and minimum points is equal to
–VREF / gain to VREF / gain and centered around a fixed common-mode voltage (VCM). Use the ADS1299-x in a
differential configuration to maximize the dynamic range of the data converter. For optimal performance, the
common voltage is recommended to be set at the midpoint of the analog supplies [(AVDD + AVSS) / 2].
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9.3.1.3 PGA Settings and Input Range
The low-noise PGA is a differential input and output amplifier, as shown in Figure 23. The PGA has seven gain
settings (1, 2, 4, 6, 8, 12, and 24) that can be set by writing to the CHnSET register (see the CHnSET: Individual
Channel Settings subsection of the Register Maps section for details). The ADS1299-x has CMOS inputs and
therefore has negligible current noise. Table 5 shows the typical bandwidth values for various gain settings. Note
that Table 5 shows small-signal bandwidth. For large signals, performance is limited by PGA slew rate.
From MuxP
Low-Noise
PGAp
R2
18.15 kW
R1
3.3 kW
(for Gain = 12)
To ADC
R2
18.15 kW
Low-Noise
PGAn
From MuxN
Figure 23. PGA Implementation
Table 5. PGA Gain versus Bandwidth
NOMINAL BANDWIDTH AT ROOM
GAIN
TEMPERATURE (kHz)
1
2
662
332
165
110
83
4
6
8
12
24
55
27
The PGA resistor string that implements the gain has 39.6 kΩ of resistance for a gain of 12. This resistance
provides a current path across the PGA outputs in the presence of a differential input signal. This current is in
addition to the quiescent current specified for the device in the presence of a differential signal at the input.
9.3.1.3.1 Input Common-Mode Range
To stay within the linear operating range of the PGA, the input signals must meet certain requirements that are
discussed in this section.
The outputs of the amplifiers in Figure 23 cannot swing closer to the supplies (AVSS and AVDD) than 200 mV. If
the outputs of the amplifiers are driven to within 200 mV of the supply rails, then the amplifiers saturate and
consequently become nonlinear. To prevent this nonlinear operating condition, the output voltages must not
exceed the common-mode range of the front-end.
The usable input common-mode range of the front-end depends on various parameters, including the maximum
differential input signal, supply voltage, PGA gain, and the 200 mV for the amplifier headroom. This range is
described in Equation 4:
Gain ´ V
Gain ´ V
MAX _DIFF
æ
ö
æ
ö
MAX _DIFF
AVDD - 0.2 V -
> CM > AVSS + 0.2 V +
ç
÷
ç
÷
ç
÷
ç
÷
2
2
è
ø
è
ø
where:
VMAX_DIFF = maximum differential signal at the PGA input
CM = common-mode range
(4)
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For example:
If AVDD = 5 V, gain = 12, and VMAX_DIFF = 350 mV
Then 2.3 V < CM < 2.7 V
9.3.1.3.2 Input Differential Dynamic Range
The differential input voltage range (VINxP – VINxN) depends on the analog supply and reference used in the
system. This range is shown in Equation 5.
±VREF
2VREF
Full-Scale Range =
=
Gain
Gain
(5)
9.3.1.3.3 ADC ΔΣ Modulator
Each ADS1299-x channel has a 24-bit, ΔΣ ADC. This converter uses a second-order modulator optimized for
low-noise applications. The modulator samples the input signal at the rate of (fMOD = fCLK / 2). As in the case of
any ΔΣ modulator, the device noise is shaped until fMOD / 2, as shown in Figure 24. The on-chip digital
decimation filters explained in the next section can be used to filter out the noise at higher frequencies. These
on-chip decimation filters also provide antialias filtering. This ΔΣ converter feature drastically reduces the
complexity of the analog antialiasing filters typically required with nyquist ADCs.
0
−10
−20
−30
−40
−50
−60
−70
−80
−90
−100
−110
−120
−130
−140
−150
−160
0.001
0.01
0.1
1
Normalized Frequency (fIN/fMOD
)
G001
Figure 24. Modulator Noise Spectrum Up To 0.5 × fMOD
9.3.1.3.4 Reference
Figure 25 shows a simplified block diagram of the ADS1299-x internal reference. The 4.5-V reference voltage is
generated with respect to AVSS. When using the internal voltage reference, connect VREFN to AVSS.
100 mF
VCAP1
R1(1)
Bandgap
4.5 V
VREFP
R3(1)
10 mF
R2(1)
VREFN
AVSS
To ADC Reference Inputs
(1) For VREF = 4.5 V: R1 = 9.8 kΩ, R2 = 13.4 kΩ, and R3 = 36.85 kΩ.
Figure 25. Internal Reference
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The external band-limiting capacitors determine the amount of reference noise contribution. For high-end EEG
systems, the capacitor values should be chosen such that the bandwidth is limited to less than 10 Hz so that the
reference noise does not dominate system noise.
Alternatively, the internal reference buffer can be powered down and an external reference can be applied to
VREFP. Figure 26 shows a typical external reference drive circuitry. Power-down is controlled by the
PD_REFBUF bit in the CONFIG3 register. This power-down is also used to share internal references when two
devices are cascaded. By default, the device wakes up in external reference mode.
100 kꢀ
22 nF
+5 V
0.1 ꢁF
10 ꢀ
To VREFP
OPA350
100 ꢀ
10 ꢁF
Pin
10 ꢁF
0.1 ꢁF
VIN
OUT
5 V
100 ꢁF
REF5025
1 ꢁF
TRIM
Figure 26. External Reference Driver
9.3.2 Digital Functionality
9.3.2.1 Digital Decimation Filter
The digital filter receives the modulator output and decimates the data stream. By adjusting the amount of
filtering, tradeoffs can be made between resolution and data rate: filter more for higher resolution, filter less for
higher data rates. Higher data rates are typically used in EEG applications for ac lead-off detection.
The digital filter on each channel consists of a third-order sinc filter. The sinc filter decimation ratio can be
adjusted by the DR bits in the CONFIG1 register (see the Register Maps section for details). This setting is a
global setting that affects all channels and, therefore, all channels operate at the same data rate in a device.
9.3.2.1.1 Sinc Filter Stage (sinx / x)
The sinc filter is a variable decimation rate, third-order, low-pass filter. Data are supplied to this section of the
filter from the modulator at the rate of fMOD. The sinc filter attenuates the modulator high-frequency noise, then
decimates the data stream into parallel data. The decimation rate affects the overall converter data rate.
Equation 6 shows the scaled Z-domain transfer function of the sinc filter.
3
1 - Z-N
½H(z)½ =
1 - Z-1
(6)
The frequency domain transfer function of the sinc filter is shown in Equation 7.
3
Npf
sin
fMOD
H(f)½ =
pf
N ´ sin
fMOD
where:
N = decimation ratio
(7)
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The sinc filter has notches (or zeroes) that occur at the output data rate and multiples thereof. At these
frequencies, the filter has infinite attenuation. Figure 27 shows the sinc filter frequency response and Figure 28
shows the sinc filter roll-off. With a step change at input, the filter takes 3 × tDR to settle. After a rising edge of the
START signal, the filter takes tSETTLE time to give the first data output. The settling time of the filters at various
data rates are discussed in the Start subsection of the SPI Interface section. Figure 29 and Figure 30 show the
filter transfer function until fMOD / 2 and fMOD / 16, respectively, at different data rates. Figure 31 shows the
transfer function extended until 4 × fMOD. The ADS1299-x pass band repeats itself at every fMOD. The input R-C
antialiasing filters in the system should be chosen such that any interference in frequencies around multiples of
fMOD are attenuated sufficiently.
0
-20
0
-0.5
-1
-40
-60
-1.5
-2
-80
-100
-120
-140
-2.5
-3
0
0.5
1
1.5
2
2.5
3
3.5
4
4.5
5
0
0.05
0.1
0.15
0.2
0.25
0.3
0.35
Normalized Frequency (fIN / fDR
)
Normalized Frequency (fIN / fDR
)
Figure 27. Sinc Filter Frequency Response
Figure 28. Sinc Filter Roll-Off
0
0
DR[2:0] = 000
DR[2:0] = 001
DR[2:0] = 010
DR[2:0] = 011
DR[2:0] = 100
DR[2:0] = 101
DR[2:0] = 110
DR[2:0] = 000
DR[2:0] = 001
DR[2:0] = 010
DR[2:0] = 011
DR[2:0] = 100
DR[2:0] = 101
DR[2:0] = 110
−20
−40
−20
−40
−60
−60
−80
−80
−100
−120
−140
−160
−100
−120
−140
0
0.05 0.1 0.15 0.2 0.25 0.3 0.35 0.4 0.45 0.5
Normalized Frequency (fIN/fMOD
0
0.01
0.02
0.03
0.04
0.05
0.06
0.07
)
Normalized Frequency (fIN/fMOD
)
G027
G028
Figure 29. Transfer Function of On-Chip Decimation Filters
Until fMOD / 2
Figure 30. Transfer Function of On-Chip Decimation Filters
Until fMOD / 16
0
−20
−40
−60
−80
−100
−120
−140
0
0.5
1
1.5
2
2.5
3
3.5
4
Normalized Frequency (fIN/fMOD
)
G029
Figure 31. Transfer Function of On-Chip Decimation Filters
Until 4 fMOD for DR[2:0] = 000 and DR[2:0] = 110
26
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9.3.2.2 Clock
The ADS1299-x provides two methods for device clocking: internal and external. Internal clocking is ideally
suited for low-power, battery-powered systems. The internal oscillator is trimmed for accuracy at room
temperature. Accuracy varies over the specified temperature range; see the Electrical Characteristics. Clock
selection is controlled by the CLKSEL pin and the CLK_EN register bit.
The CLKSEL pin selects either the internal or external clock. The CLK_EN bit in the CONFIG1 register enables
and disables the oscillator clock to be output in the CLK pin. A truth table for these two pins is shown in Table 6.
The CLK_EN bit is useful when multiple devices are used in a daisy-chain configuration. During power-down, the
external clock is recommended be shut down to save power.
Table 6. CLKSEL Pin and CLK_EN Bit
CONFIG1.CLK_EN
CLKSEL PIN
BIT
CLOCK SOURCE
External clock
CLK PIN STATUS
Input: external clock
3-state
0
1
1
X
0
Internal clock oscillator
Internal clock oscillator
1
Output: internal clock oscillator
9.3.2.3 GPIO
The ADS1299-x has a total of four general-purpose digital I/O (GPIO) pins available in normal mode of operation.
The digital I/O pins are individually configurable as either inputs or outputs through the GPIOC bits register. The
GPIOD bits in the GPIO register control the pin level. When reading the GPIOD bits, the data returned are the
logic level of the pins, whether they are programmed as inputs or outputs. When the GPIO pin is configured as
an input, a write to the corresponding GPIOD bit has no effect. When configured as an output, a write to the
GPIOD bit sets the output value.
If configured as inputs, these pins must be driven (do not float). The GPIO pins are set as inputs after power-on
or after a reset. Figure 32 shows the GPIO port structure. The pins should be shorted to DGND if not used.
GPIO Data (read)
GPIO Pin
GPIO Data (write)
GPIO Control
Figure 32. GPIO Port Pin
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9.3.2.4 ECG and EEG Specific Features
9.3.2.4.1 Input Multiplexer (Rerouting the BIAS Drive Signal)
The input multiplexer has EEG-specific functions for the bias drive signal. The BIAS signal is available at the
BIASOUT pin when the appropriate channels are selected for BIAS derivation, feedback elements are installed
external to the chip, and the loop is closed. This signal can either be fed after filtering or fed directly into the
BIASIN pin, as shown in Figure 33. This BIASIN signal can be multiplexed into any input electrode by setting the
MUX bits of the appropriate channel set registers to '110' for P-side or '111' for N-side. Figure 33 shows the BIAS
signal generated from channels 1, 2, and 3 and routed to the N-side of channel 8. This feature can be used to
dynamically change the electrode that is used as the reference signal to drive the patient body.
BIAS_SENSP[0] = 1
IN1P
Low-Noise
PGA1
BIAS_SENSN[0] = 1
MUX1[2:0] = 000
IN1N
BIAS_SENSP[1] = 1
IN2P
Low-Noise
PGA2
BIAS_SENSN[1] = 1
MUX2[2:0] = 000
IN2N
BIAS_SENSP[2] = 1
IN3P
Low-Noise
PGA3
BIAS_SENSN[2] = 1
MUX3[2:0] = 000
IN3N
BIAS_SENSP[7] = 0
IN8P
Low-Noise
PGA8
BIAS_SENSN[7] = 0
MUX8[2:0] = 111
IN8N
BIASREF_INT = 1
MUX
(AVDD + AVSS)
2
BIASREF_INT = 0
BIAS_AMP
Device
BIASIN
BIASREF
BIASOUT
BIASINV
(1)
1 MW
Filter or
Feedthrough
1.5 nF(1)
(1) Typical values for example only.
Figure 33. Example of BIASOUT Signal Configured to be Routed to IN8N
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9.3.2.4.2 Input Multiplexer (Measuring the BIAS Drive Signal)
Also, the BIASOUT signal can be routed to a channel (that is not used for the calculation of BIAS) for
measurement. Figure 34 shows the register settings to route the BIASIN signal to channel 8. The measurement
is done with respect to the voltage on the BIASREF pin. If BIASREF is chosen to be internal, then BIASREF is at
[(AVDD + AVSS) / 2]. This feature is useful for debugging purposes during product development.
BIAS_SENSP[0] = 1
IN1P
Low-Noise
PGA1
BIAS_SENSN[0] = 1
MUX1[2:0] = 000
IN1N
BIAS_SENSP[1] = 1
IN2P
Low-Noise
PGA2
BIAS_SENSN[1] = 1
MUX2[2:0] = 000
IN2N
BIAS_SENSP[2] = 1
IN3P
Low-Noise
PGA3
BIAS_SENSN[2] = 1
MUX3[2:0] = 000
IN3N
BIAS_SENSP[7] = 0
IN8P
Low-Noise
PGA8
BIAS_SENSN[7] = 0
MUX8[2:0] = 010
IN8N
MUX
BIASREF_INT = 1
(AVDD + AVSS)
BIAS_MEAS = 1
2
BIAS_AMP
BIASREF_INT = 0
TI Device
BIASIN
BIASREF
BIASOUT
BIASINV
(1)
1 MW
Filter or
Feedthrough
1.5 nF(1)
Copyright © 2016, Texas Instruments Incorporated
(1) Typical values for example only.
Figure 34. BIASOUT Signal Configured to be Read Back by Channel 8
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9.3.2.4.3 Lead-Off Detection
Patient electrode impedances are known to decay over time. These electrode connections must be continuously
monitored to verify that a suitable connection is present. The ADS1299-x lead-off detection functional block
provides significant flexibility to the user to choose from various lead-off detection strategies. Though called lead-
off detection, this is in fact an electrode-off detection.
The basic principle is to inject an excitation current and measure the voltage to determine if the electrode is off.
As shown in the lead-off detection functional block diagram in Figure 35, this circuit provides two different
methods of determining the state of the patient electrode. The methods differ in the frequency content of the
excitation signal. Lead-off can be selectively done on a per channel basis using the LOFF_SENSP and
LOFF_SENSN registers. Also, the internal excitation circuitry can be disabled and just the sensing circuitry can
be enabled.
Skin,
Electrode Contact
Model
Patient
Protection
Resistor
Patient
Z1
47 nF
51 kW
51 kW
VINP
To ADC
VINN
Z2
LOFF_SENSP
LOFF_SENSN
47 nF
FLEAD_OFF[0:1]
Z3
47 nF
6 nA and 24 nA
6 mA and 24 mA
51 kW
AVDD
AVSS
BIAS OUT
Figure 35. Lead-Off Detection
30
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9.3.2.4.3.1 DC Lead-Off
In this method, the lead-off excitation is with a dc signal. The dc excitation signal can be chosen from either an
external pull-up or pull-down resistor or an internal current source or sink, as shown in Figure 36. One side of the
channel is pulled to supply and the other side is pulled to ground. The pull-up and pull-down current can be
swapped (as shown in Figure 36b and Figure 36c) by setting the bits in the LOFF_FLIP register. In case of a
current source or sink, the magnitude of the current can be set by using the ILEAD_OFF[1:0] bits in the LOFF
register. The current source or sink gives larger input impedance compared to the 10-MΩ pull-up or pull-down
resistor.
AVDD
AVDD
AVDD
Device
Device
Device
10 MW
INP
INN
INP
INN
INP
INN
Low-Noise
PGAn
Low-Noise
PGAn
Low-Noise
PGAn
10 MW
AVSS
a) External Pull-Up or Pull-Down Resistors
b) Input Current Source
(LOFF_FLIP = 0)
c) Input Current Source
(LOFF_FLIP = 1)
Figure 36. DC Lead-Off Excitation Options
Sensing of the response can be done either by searching the digital output code from the device or by monitoring
the input voltages with an on-chip comparator. If either electrode is off, the pull-up and pull-down resistors
saturate the channel. Searching the output code determines if either the P-side or the N-side is off. To pinpoint
which one is off, the comparators must be used. The input voltage is also monitored using a comparator and a 3-
bit DAC whose levels are set by the COMP_TH[2:0] bits in the LOFF register. The output of the comparators are
stored in the LOFF_STATP and LOFF_STATN registers. These registers are available as a part of the output
data stream. (See the Data Output (DOUT) subsection of the SPI Interface section.) If dc lead-off is not used, the
lead-off comparators can be powered down by setting the PD_LOFF_COMP bit in the CONFIG4 register.
An example procedure to turn on dc lead-off is given in the Lead-Off section.
9.3.2.4.3.2 AC Lead-Off (One Time or Periodic)
In this method, an in-band ac signal is used for excitation. The ac signal is generated by alternatively providing a
current source and sink at the input with a fixed frequency. The frequency can be chosen by the
FLEAD_OFF[1:0] bits in the LOFF register. The excitation frequency is chosen to be one of the two in-band
frequency selections (7.8 Hz or 31.2 Hz). This in-band excitation signal is passed through the channel and
measured at the output.
Sensing of the ac signal is done by passing the signal through the channel to be digitized and then measured at
the output. The ac excitation signals are introduced at a frequency that is in the band of interest. The signal can
be filtered out separately and processed. By measuring the magnitude of the output at the excitation signal
frequency, the electrode impedance can be calculated.
For continuous lead-off, an out-of-band ac current source or sink must be externally applied to the inputs. This
signal can then be digitally processed to determine the electrode impedance.
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9.3.2.4.4 Bias Lead-Off
BIAS Lead-Off Detection During Normal Operation
During normal operation, the ADS1299-x BIAS lead-off at power-up function cannot be used because the BIAS
amplifier must be powered off.
BIAS Lead Off Detection At Power-Up
This feature is included in the ADS1299-x for use in determining whether the bias electrode is suitably
connected. At power-up, the ADS1299-x uses a current source and comparator to determine the BIAS electrode
connection status, as shown in Figure 37. The reference level of the comparator is set to determine the
acceptable BIAS impedance threshold.
Skin,
Patient
Patient Electrode Contact Protection
Model
47 nF
Resistor
To ADC input (through VREF
connection to any of the channels).
BIAS_STAT
51 kW
BIAS_SENS
ILEAD_OFF[1:0]
AVSS
Figure 37. BIAS Lead-Off Detection at Power-Up
When the BIAS amplifier is powered on, the current source has no function. Only the comparator can be used to
sense the voltage at the output of the BIAS amplifier. The comparator thresholds are set by the same LOFF[7:5]
bits used to set the thresholds for other negative inputs.
32
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9.3.2.4.5 Bias Drive (DC Bias Circuit)
Use the bias circuitry to counter the common-mode interference in a EEG system as a result of power lines and
other sources, including fluorescent lights. The bias circuit senses the common-mode voltage of a selected set of
electrodes and creates a negative feedback loop by driving the body with an inverted common-mode signal. The
negative feedback loop restricts the common-mode movement to a narrow range, depending on the loop gain.
Stabilizing the entire loop is specific to the individual user system based on the various poles in the loop. The
ADS1299-x integrates the muxes to select the channel and an operational amplifier. All the amplifier terminals
are available at the pins, allowing the user to choose the components for the feedback loop. The circuit in
Figure 38 shows the overall functional connectivity for the bias circuit.
From
MUX1P
BIAS1P
220 kW
PGA1P
From
MUX2P
18.15 kW
BIAS2P
220 kW
PGA2P
18.15 kW
3.3 kW
18.15 kW
3.3 kW
220 kW
220 kW
PGA1N
From
MUX1N
BIAS1N
18.15 kW
PGA2N
220 kW
From
MUX2N
BIAS2N
BIAS4P
From
MUX3P
BIAS3P
PGA3P
From
MUX4P
18.15 kW
220 kW
PGA4P
18.15 kW
3.3 kW
18.15 kW
3.3 kW
220 kW
220 kW
PGA3N
From
MUX3N
BIAS3N
18.15 kW
PGA4N
220 kW
From
MUX4N
BIAS4N
BIAS6P
From
MUX5P
BIAS5P
PGA5P
From
MUX6P
18.15 kW
220 kW
PGA6P
18.15 kW
3.3 kW
18.15 kW
3.3 kW
220 kW
220 kW
PGA5N
From
MUX5N
BIAS5N
18.15 kW
PGA6N
220 kW
From
MUX6N
BIAS6N
BIAS8P
From
MUX7P
BIAS7P
PGA7P
From
MUX8P
18.15 kW
220 kW
PGA8P
18.15 kW
3.3 kW
18.15 kW
3.3 kW
220 kW
PGA7N
From
MUX7N
BIAS7N
18.15 kW
PGA8N
220 kW
BIASINV
From
MUX8N
BIAS8N
(1)
CEXT
(1)
REXT
1.5 nF
1 MW
BIAS
Amp
BIASOUT
BIASREF
(AVDD + AVSS) / 2
BIASREF_INT = 1
BIASREF_INT = 0
(1) Typical values.
Figure 38. Bias Drive Amplifier Channel Selection
The reference voltage for the bias drive can be chosen to be internally generated [(AVDD + AVSS) / 2] or
provided externally with a resistive divider. The selection of an internal versus external reference voltage for the
bias loop is defined by writing the appropriate value to the BIASREF_INT bit in the CONFIG2 register.
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If the bias function is not used, the amplifier can be powered down using the PD_BIAS bit (see the CONFIG3:
Configuration Register 3 subsection of the Register Maps section for details). Use the PD_BIAS bit to power-
down all but one of the bias amplifiers when daisy-chaining multiple ADS1299-x devices.
The BIASIN pin functionality is explained in the Input Multiplexer section. An example procedure to use the bias
amplifier is shown in the Bias Drive section.
9.3.2.4.5.1 Bias Configuration with Multiple Devices
Figure 39 shows multiple devices connected to the bias drive.
Device N
Device 2
Device 1
Power-Down
Power-Down
VA1-8 VA1-8
VA1-8 VA1-8
VA1-8 VA1-8
BIASIN BIAS BIAS
REF OUT
BIASINV
BIASIN BIAS BIAS
REF OUT
BIASINV
BIASIN BIAS BIAS
REF OUT
BIASINV
Figure 39. BIAS Drive Connection for Multiple Devices
9.4 Device Functional Modes
9.4.1 Start
Pull the START pin high for at least 2 tCLK periods, or send the START command to begin conversions. When
START is low and the START command has not been sent, the device does not issue a DRDY signal
(conversions are halted).
When using the START command to control conversions, hold the START pin low. The ADS1299-x features two
modes to control conversions: continuous mode and single-shot mode. The mode is selected by SINGLE_SHOT
(bit 3 of the CONFIG4 register). In multiple device configurations, the START pin is used to synchronize devices
(see the Multiple Device Configuration subsection of the SPI Interface section for more details).
9.4.1.1 Settling Time
The settling time (tSETTLE) is the time required for the converter to output fully-settled data when the START
signal is pulled high. When START is pulled high, DRDY is also pulled high. The next DRDY falling edge
indicates that data are ready. Figure 40 shows the timing diagram and Table 7 lists the settling time for different
data rates. The settling time depends on fCLK and the decimation ratio (controlled by the DR[2:0] bits in the
CONFIG1 register). When the initial settling time has passed, the DRDY falling edge occurs at the set data rate,
tDR. If data is not read back on DOUT and the output shift register needs to update, DRDY goes high for 4 tCLK
before returning back low indicating new data is ready. Table 7 lists the settling time as a function of tCLK. Note
that when START is held high and there is a step change in the input signal, 3 × tDR is required for the filter to
settle to the new value. Settled data are available on the fourth DRDY pulse.
tSETTLE
START Pin
or
START
DIN
tDR
4 / fCLK
DRDY
Figure 40. Settling Time
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Device Functional Modes (continued)
Table 7. Settling Time for Different Data Rates
DR[2:0]
000
NORMAL MODE
521
UNIT
tCLK
tCLK
tCLK
tCLK
tCLK
tCLK
tCLK
001
1033
010
2057
011
4105
100
8201
101
16393
32777
110
9.4.2 Reset (RESET)
There are two methods to reset the ADS1299-x: pull the RESET pin low, or send the RESET command. When
using the RESET pin, make sure to follow the minimum pulse duration timing specifications before taking the pin
back high. The RESET command takes effect on the eighth SCLK falling edge of the command. After a reset, 18
tCLK cycles are required to complete initialization of the configuration registers to default states and start the
conversion cycle. Note that an internal reset is automatically issued to the digital filter whenever the CONFIG1
register is set to a new value with a WREG command.
9.4.3 Power-Down (PWDN)
When PWDN is pulled low, all on-chip circuitry is powered down. To exit power-down mode, take the PWDN pin
high. Upon exiting from power-down mode, the internal oscillator and the reference require time to wake up.
During power-down, the external clock is recommended to be shut down to save power.
9.4.4 Data Retrieval
9.4.4.1 Data Ready (DRDY)
DRDY is an output signal which transitions from high to low indicating new conversion data are ready. The CS
signal has no effect on the data ready signal. DRDY behavior is determined by whether the device is in RDATAC
mode or the RDATA command is used to read data on demand. (See the RDATAC: Read Data Continuous and
RDATA: Read Data subsections of the SPI Command Definitions section for further details).
When reading data with the RDATA command, the read operation can overlap the next DRDY occurrence
without data corruption.
The START pin or the START command places the device either in normal data capture mode or pulse data
capture mode.
Figure 41 shows the relationship between DRDY, DOUT, and SCLK during data retrieval (in case of an
ADS1299). DOUT is latched out at the SCLK rising edge. DRDY is pulled high at the SCLK falling edge. Note
that DRDY goes high on the first SCLK falling edge, regardless of whether data are being retrieved from the
device or a command is being sent through the DIN pin.
DRDY
DOUT
SCLK
X
Bit 215
Bit 214
Bit 213
Figure 41. DRDY with Data Retrieval (CS = 0)
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Device Functional Modes (continued)
9.4.4.2 Reading Back Data
Data retrieval can be accomplished in one of two methods:
1. RDATAC: the read data continuous command sets the device in a mode that reads data continuously without
sending commands. See the RDATAC: Read Data Continuous section for more details.
2. RDATA: the read data command requires that a command is sent to the device to load the output shift
register with the latest data. See the RDATA: Read Data section for more details.
Conversion data are read by shifting data out on DOUT. The MSB of the data on DOUT is clocked out on the
first SCLK rising edge. DRDY returns high on the first SCLK falling edge. DIN should remain low for the entire
read operation.
The number of bits in the data output depends on the number of channels and the number of bits per channel.
For the 8-channel ADS1299, the number of data outputs is [(24 status bits + 24 bits × 8 channels) = 216 bits].
The format of the 24 status bits is: (1100 + LOFF_STATP + LOFF_STATN + bits[4:7] of the GPIO register). The
data format for each channel data are twos complement and MSB first. When channels are powered down using
the user register setting, the corresponding channel output is set to '0'. However, the channel output sequence
remains the same.
The ADS1299-x also provides a multiple readback feature. Data can be read out multiple times by simply giving
more SCLKs in RDATAC mode, in which case the MSB data byte repeats after reading the last byte. The
DAISY_EN bit in the CONFIG1 register must be set to '1' for multiple readbacks.
9.4.5 Continuous Conversion Mode
Conversions begin when the START pin is taken high or when the START command is sent. As shown in
Figure 42, the DRDY output goes high when conversions are started and goes low when data are ready.
Conversions continue indefinitely until the START pin is taken low or the STOP command is transmitted. When
the START pin is pulled low or the STOP command is issued, the conversion in progress is allowed to complete.
Figure 43 and Table 8 illustrate the required DRDY timing to the START pin or the START and STOP commands
when controlling conversions in this mode. The tSDSU timing indicates when to take the START pin low or when to
send the STOP command before the DRDY falling edge to halt further conversions. The tDSHD timing indicates
when to take the START pin low or send the STOP command after a DRDY falling edge to complete the current
conversion and halt further conversions. To keep the converter running continuously, the START pin can be
permanently tied high.
When switching from Single-Shot mode to Continuous Conversion mode, bring the START signal low and back
high or send a STOP command followed by a START command. This conversion mode is ideal for applications
that require a fixed continuous stream of conversions results.
START Pin
or
or
START(1)
STOP(1)
DIN
tDR
tSETTLE
DRDY
(1) START and STOP commands take effect on the seventh SCLK falling edge.
Figure 42. Continuous Conversion Mode
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Device Functional Modes (continued)
tSDSU
DRDY and DOUT
tDSHD
START Pin
or
STOP(1)
STOP(1)
STOP Command
(1) START and STOP commands take effect on the seventh SCLK falling edge at the end of the command.
Figure 43. START to DRDY Timing
Table 8. Timing Characteristics for Figure 43(1)
MIN
16
UNIT
tCLK
tSDSU
tDSHD
START pin low or STOP command to DRDY setup time to halt further conversions
START pin low or STOP command to complete current conversion
16
tCLK
(1) START and STOP commands take effect on the seventh SCLK falling edge at the end of the command.
9.4.6 Single-Shot Mode
Single-shot mode is enabled by setting the SINGLE_SHOT bit in the CONFIG4 register to '1'. In single-shot
mode, the ADS1299-x performs a single conversion when the START pin is taken high or when the START
command is sent. As shown in Figure 44, when a conversion is complete, DRDY goes low and further
conversions are stopped. Regardless of whether the conversion data are read or not, DRDY remains low. To
begin a new conversion, take the START pin low and then back high, or send the START command again. When
switching from Continuous Conversion mode to Single-Shot mode, bring the START signal low and back high or
send a STOP command followed by a START command.
START
tSETTLE
4 / fCLK
4 / fCLK
Data Updating
DRDY
Figure 44. DRDY with No Data Retrieval in Single-Shot Mode
This conversion mode is ideal for applications that require non-standard or non-continuous data rates. Issuing a
START command or toggling the START pin high resets the digital filter, effectively dropping the data rate by a
factor of four. This mode leaves the system more susceptible to aliasing effects, requiring more complex analog
or digital filtering. Loading on the host processor increases because the processor must toggle the START pin or
send a START command to initiate a new conversion cycle.
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9.5 Programming
9.5.1 Data Format
The device provides 24 bits of data in binary twos complement format. The size of one code (LSB) is calculated
using Equation 8.
1 LSB = (2 × VREF / Gain) / 224 = +FS / 223
(8)
A positive full-scale input produces an output code of 7FFFFFh and the negative full-scale input produces an
output code of 800000h. The output clips at these codes for signals exceeding full-scale. Table 9 summarizes the
ideal output codes for different input signals. All 24 bits toggle when the analog input is at positive or negative
full-scale.
Table 9. Ideal Output Code versus Input Signal
INPUT SIGNAL, VIN
(INxP - INxN)
IDEAL OUTPUT CODE(1)
7FFFFFh
≥ FS
+FS / (223 – 1)
0
000001h
000000h
–FS / (223 – 1)
≤ –FS (223 / 223 – 1)
FFFFFFh
800000h
(1) Excludes effects of noise, linearity, offset, and gain error.
9.5.2 SPI Interface
The SPI-compatible serial interface consists of four signals: CS, SCLK, DIN, and DOUT. The interface reads
conversion data, reads and writes registers, and controls ADS1299-x operation. The data-ready output, DRDY
(see the Data Ready (DRDY) section), is used as a status signal to indicate when data are ready. DRDY goes
low when new data are available.
9.5.2.1 Chip Select (CS)
The CS pin activates SPI communication. CS must be low before data transactions and must stay low for the
entire SPI communication period. When CS is high, the DOUT pin enters a high-impedance state. Therefore,
reading and writing to the serial interface are ignored and the serial interface is reset. DRDY pin operation is
independent of CS. DRDY still indicates that a new conversion has completed and is forced high as a response
to SCLK, even if CS is high.
Taking CS high deactivates only the SPI communication with the device and the serial interface is reset. Data
conversion continues and the DRDY signal can be monitored to check if a new conversion result is ready. A
master device monitoring the DRDY signal can select the appropriate slave device by pulling the CS pin low.
After the serial communication is finished, always wait four or more tCLK cycles before taking CS high.
9.5.2.2 Serial Clock (SCLK)
SCLK provides the clock for serial communication. SCLK is a Schmitt-trigger input, but TI recommends keeping
SCLK as free from noise as possible to prevent glitches from inadvertently shifting the data. Data are shifted into
DIN on the falling edge of SCLK and shifted out of DOUT on the rising edge of SCLK.
The absolute maximum SCLK limit is specified in Figure 1. When shifting in commands with SCLK, make sure
that the entire set of SCLKs is issued to the device. Failure to do so can result in the device serial interface being
placed into an unknown state requiring CS to be taken high to recover.
For a single device, the minimum speed required for SCLK depends on the number of channels, number of bits
of resolution, and output data rate. (For multiple cascaded devices, see the Cascaded Mode subsection of the
Multiple Device Configuration section.)
For example, if the ADS1299 is used in a 500-SPS mode (8 channels, 24-bit resolution), the minimum SCLK
speed is 110 kHz.
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Data retrieval can be accomplished either by placing the device in RDATAC mode or by issuing an RDATA
command for data on demand. The SCLK rate limitation in Equation 9 applies to RDATAC. For the RDATA
command, the limitation applies if data must be read in between two consecutive DRDY signals. Equation 9
assumes that there are no other commands issued in between data captures.
tDR - 4 tCLK
tSCLK
<
N
BITS ´ NCHANNELS + 24
(9)
9.5.2.3 Data Input (DIN)
DIN is used along with SCLK to send data to the device. Data on DIN are shifted into the device on the falling
edge of SCLK.
The communication of this device is full-duplex in nature. The device monitors commands shifted in even when
data are being shifted out. Data that are present in the output shift register are shifted out when sending in a
command. Therefore, make sure that whatever is being sent on the DIN pin is valid when shifting out data. When
no command is to be sent to the device when reading out data, send the NOP command on DIN. Make sure that
the tSDECODE timing is met in the Sending Multi-Byte Commands section when sending multiple byte commands
on DIN.
9.5.2.4 Data Output (DOUT)
DOUT is used with SCLK to read conversion and register data from the device. Data are clocked out on the
rising edge of SCLK, MSB first. DOUT goes to a high-impedance state when CS is high. Figure 45 shows the
ADS1299 data output protocol.
DRDY
CS
SCLK
216 SCLKs
DOUT
DIN
STAT
CH1
CH2
CH3
CH4
CH5
CH6
CH7
CH8
24-Bit
24-Bit
24-Bit
24-Bit
24-Bit
24-Bit
24-Bit
24-Bit
24-Bit
Figure 45. SPI Bus Data Output
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9.5.3 SPI Command Definitions
The ADS1299-x provides flexible configuration control. The commands, summarized in Table 10, control and
configure device operation. The commands are stand-alone, except for the register read and write operations
that require a second command byte plus data. CS can be taken high or held low between commands but must
stay low for the entire command operation (especially for multi-byte commands). System commands and the
RDATA command are decoded by the device on the seventh SCLK falling edge. The register read and write
commands are decoded on the eighth SCLK falling edge. Be sure to follow SPI timing requirements when pulling
CS high after issuing a command.
Table 10. Command Definitions
COMMAND
System Commands
WAKEUP
DESCRIPTION
FIRST BYTE
SECOND BYTE
Wake-up from standby mode
Enter standby mode
0000 0010 (02h)
0000 0100 (04h)
0000 0110 (06h)
0000 1000 (08h)
0000 1010 (0Ah)
STANDBY
RESET
Reset the device
START
Start and restart (synchronize) conversions
Stop conversion
STOP
Data Read Commands
Enable Read Data Continuous mode.
RDATAC
0001 0000 (10h)
This mode is the default mode at power-up.(1)
SDATAC
RDATA
Stop Read Data Continuously mode
0001 0001 (11h)
0001 0010 (12h)
Read data by command; supports multiple read back.
Register Read Commands
RREG
WREG
Read n nnnn registers starting at address r rrrr
Write n nnnn registers starting at address r rrrr
001r rrrr (2xh)(2)
010r rrrr (4xh)(2)
000n nnnn(2)
000n nnnn(2)
(1) When in RDATAC mode, the RREG command is ignored.
(2) n nnnn = number of registers to be read or written – 1. For example, to read or write three registers, set n nnnn = 0 (0010). r rrrr =
starting register address for read or write commands.
9.5.3.1 Sending Multi-Byte Commands
The ADS1299-x serial interface decodes commands in bytes and requires 4 tCLK cycles to decode and execute.
Therefore, when sending multi-byte commands (such as RREG or WREG), a 4 tCLK period must separate the
end of one byte (or command) and the next.
Assuming CLK is 2.048 MHz, then tSDECODE (4 tCLK) is 1.96 µs. When SCLK is 16 MHz, one byte can be
transferred in 500 ns. This byte transfer time does not meet the tSDECODE specification; therefore, a delay must be
inserted so the end of the second byte arrives 1.46 µs later. If SCLK is 4 MHz, one byte is transferred in 2 µs.
Because this transfer time exceeds the tSDECODE specification, the processor can send subsequent bytes without
delay. In this later scenario, the serial port can be programmed to move from single-byte transfers per cycle to
multiple bytes.
9.5.3.2 WAKEUP: Exit STANDBY Mode
The WAKEUP command exits low-power standby mode; see the STANDBY: Enter STANDBY Mode subsection
of the SPI Command Definitions section. Time is required when exiting standby mode (see the Electrical
Characteristics for details). There are no SCLK rate restrictions for this command and can be issued at any
time. Any following commands must be sent after a delay of 4 tCLK cycles.
9.5.3.3 STANDBY: Enter STANDBY Mode
The STANDBY command enters low-power standby mode. All parts of the circuit are shut down except for the
reference section. The standby mode power consumption is specified in the Electrical Characteristics. There are
no SCLK rate restrictions for this command and can be issued at any time. Do not send any other
commands other than the wakeup command after the device enters standby mode.
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9.5.3.4 RESET: Reset Registers to Default Values
The RESET command resets the digital filter cycle and returns all register settings to default values. See the
Reset (RESET) subsection of the SPI Interface section for more details. There are no SCLK rate restrictions
for this command and can be issued at any time. 18 tCLK cycles are required to execute the RESET
command. Avoid sending any commands during this time.
9.5.3.5 START: Start Conversions
The START command starts data conversions. Tie the START pin low to control conversions by command. If
conversions are in progress, this command has no effect. The STOP command stops conversions. If the START
command is immediately followed by a STOP command, then there must be a 4-tCLK cycle delay between them.
When the START command is sent to the device, keep the START pin low until the STOP command is issued.
(See the Start subsection of the SPI Interface section for more details.) There are no SCLK rate restrictions
for this command and can be issued at any time.
9.5.3.6 STOP: Stop Conversions
The STOP command stops conversions. Tie the START pin low to control conversions by command. When the
STOP command is sent, the conversion in progress completes and further conversions are stopped. If
conversions are already stopped, this command has no effect. There are no SCLK rate restrictions for this
command and can be issued at any time.
9.5.3.7 RDATAC: Read Data Continuous
The RDATAC command enables conversion data output on each DRDY without the need to issue subsequent
read data commands. This mode places the conversion data in the output register and may be shifted out
directly. The read data continuous mode is the device default mode; the device defaults to this mode on power-
up.
RDATAC mode is cancelled by the Stop Read Data Continuous command. If the device is in RDATAC mode, a
SDATAC command must be issued before any other commands can be sent to the device. There are no SCLK
rate restrictions for this command. However, subsequent data retrieval SCLKs or the SDATAC command
should wait at least 4 tCLK cycles before completion (see the Sending Multi-Byte Commands section). RDATAC
timing is illustrated in Figure 46. As depicted in Figure 46, there is a keep out zone of 4 tCLK cycles around the
DRDY pulse where this command cannot be issued in. If no data are retrieved from the device, DOUT and
DRDY behave similarly in this mode. To retrieve data from the device after the RDATAC command is issued,
make sure either the START pin is high or the START command is issued. Figure 46 shows the recommended
way to use the RDATAC command. RDATAC is ideally-suited for applications such as data loggers or recorders,
where registers are set one time and do not need to be reconfigured.
START
DRDY
tUPDATE
CS
SCLK
RDATAC
DIN
Hi-Z
Status Register + 8-Channel Data (216 Bits)
DOUT
Next Data
(1) tUPDATE = 4 / fCLK. Do not read data during this time.
Figure 46. RDATAC Usage
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9.5.3.8 SDATAC: Stop Read Data Continuous
The SDATAC command cancels the Read Data Continuous mode. There are no SCLK rate restrictions for
this command, but the next command must wait for 4 tCLK cycles before completion.
9.5.3.9 RDATA: Read Data
The RDATA command loads the output shift register with the latest data when not in Read Data Continuous
mode. Issue this command after DRDY goes low to read the conversion result. There are no SCLK rate
restrictions for this command, and there is no wait time needed for the subsequent commands or data retrieval
SCLKs. To retrieve data from the device after the RDATA command is issued, make sure either the START pin
is high or the START command is issued. When reading data with the RDATA command, the read operation can
overlap the next DRDY occurrence without data corruption. Figure 47 shows the recommended way to use the
RDATA command. RDATA is best suited for ECG- and EEG-type systems, where register settings must be read
or changed often between conversion cycles.
START
DRDY
CS
SCLK
RDATA
RDATA
DIN
Hi-Z
Status Register+ 8-Channel Data (216 Bits)
DOUT
Figure 47. RDATA Usage
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9.5.3.10 RREG: Read From Register
This command reads register data. The Register Read command is a two-byte command followed by the register
data output. The first byte contains the command and register address. The second command byte specifies the
number of registers to read – 1.
First command byte: 001r rrrr, where r rrrr is the starting register address.
Second command byte: 000n nnnn, where n nnnn is the number of registers to read – 1.
The 17th SCLK rising edge of the operation clocks out the MSB of the first register, as shown in Figure 48. When
the device is in read data continuous mode, an SDATAC command must be issued before the RREG command
can be issued. The RREG command can be issued any time. However, because this command is a multi-byte
command, there are SCLK rate restrictions depending on how the SCLKs are issued to meet the tSDECODE timing.
See the Serial Clock (SCLK) subsection of the SPI Interface section for more details. Note that CS must be low
for the entire command.
CS
1
9
17
25
SCLK
DIN
BYTE 1
BYTE 2
REG DATA
REG DATA + 1
DOUT
Figure 48. RREG Command Example: Read Two Registers Starting from Register 00h (ID Register)
(BYTE 1 = 0010 0000, BYTE 2 = 0000 0001)
9.5.3.11 WREG: Write to Register
This command writes register data. The Register Write command is a two-byte command followed by the register
data input. The first byte contains the command and register address. The second command byte specifies the
number of registers to write – 1.
First command byte: 010r rrrr, where r rrrr is the starting register address.
Second command byte: 000n nnnn, where n nnnn is the number of registers to write – 1.
After the command bytes, the register data follows (in MSB-first format), as shown in Figure 49. The WREG
command can be issued any time. However, because this command is a multi-byte command, there are SCLK
rate restrictions depending on how the SCLKs are issued to meet the tSDECODE timing. See the Serial Clock
(SCLK) subsection of the SPI Interface section for more details. Note that CS must be low for the entire
command.
CS
1
9
17
25
SCLK
DIN
BYTE 1
BYTE 2
REG DATA 1
REG DATA 2
DOUT
Figure 49. WREG Command Example: Write Two Registers Starting from 00h (ID Register)
(BYTE 1 = 0100 0000, BYTE 2 = 0000 0001)
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9.6 Register Maps
Table 11 describes the various ADS1299-x registers.
Table 11. Register Assignments
REGISTER BITS
DEFAULT
SETTING
ADDRESS
REGISTER
7
6
5
4
3
2
1
0
Read Only ID Registers
00h
ID
xxh
REV_ID[2:0]
1
DEV_ID[1:0]
NU_CH[1:0]
Global Settings Across Channels
01h
02h
CONFIG1
CONFIG2
96h
C0h
1
1
DAISY_EN
1
CLK_EN
0
1
0
0
DR[2:0]
CAL_FREQ[1:0]
INT_CAL
CAL_AMP0
PD_BIAS
BIAS_LOFF_
SENS
03h
04h
CONFIG3
LOFF
60h
00h
PD_REFBUF
1
1
BIAS_MEAS
0
BIASREF_INT
BIAS_STAT
COMP_TH[2:0]
ILEAD_OFF[1:0]
FLEAD_OFF[1:0]
Channel-Specific Settings
05h
06h
07h
08h
09h
0Ah
0Bh
0Ch
0Dh
0Eh
0Fh
10h
11h
CH1SET
CH2SET
CH3SET
CH4SET
61h
61h
61h
61h
61h
61h
61h
61h
00h
00h
00h
00h
00h
PD1
PD2
GAIN1[2:0]
GAIN2[2:0]
GAIN3[2:0]
GAIN4[2:0]
GAIN5[2:0]
GAIN6[2:0]
GAIN7[2:0]
GAIN8[2:0]
BIASP6(1)
BIASN6(1)
LOFFP6(1)
LOFFM6(1)
SRB2
SRB2
MUX1[2:0]
MUX2[2:0]
MUX3[2:0]
MUX4[2:0]
MUX5[2:0]
MUX6[2:0]
MUX7[2:0]
MUX8[2:0]
BIASP2
PD3
SRB2
PD4
SRB2
(1)
CH5SET
CH6SET
CH7SET
CH8SET
PD5
SRB2
(1)
(2)
(2)
PD6
SRB2
PD7
SRB2
PD8
SRB2
BIAS_SENSP
BIAS_SENSN
LOFF_SENSP
LOFF_SENSN
LOFF_FLIP
BIASP8(2)
BIASN8(2)
LOFFP8(2)
LOFFM8(2)
BIASP7(2)
BIASN7(2)
LOFFP7(2)
LOFFM7(2)
BIASP5(1)
BIASN5(1)
LOFFP5(1)
LOFFM5(1)
BIASP4
BIASN4
LOFFP4
LOFFM4
LOFF_FLIP4
BIASP3
BIASN3
BIASP1
BIASN1
BIASN2
LOFFP3
LOFFP2
LOFFP1
LOFFM3
LOFF_FLIP3
LOFFM2
LOFFM1
LOFF_FLIP1
LOFF_FLIP8(2) LOFF_FLIP7(2) LOFF_FLIP6(1) LOFF_FLIP5(1)
LOFF_FLIP2
Lead-Off Status Registers (Read-Only Registers)
12h
13h
LOFF_STATP
LOFF_STATN
00h
00h
IN8P_OFF
IN8M_OFF
IN7P_OFF
IN7M_OFF
IN6P_OFF
IN6M_OFF
IN5P_OFF
IN5M_OFF
IN4P_OFF
IN4M_OFF
IN3P_OFF
IN3M_OFF
IN2P_OFF
IN2M_OFF
IN1P_OFF
IN1M_OFF
GPIO and OTHER Registers
14h
15h
16h
GPIO
MISC1
MISC2
0Fh
00h
00h
GPIOD[4:1]
GPIOC[4:1]
0
0
0
0
SRB1
0
0
0
0
0
0
0
0
0
0
0
SINGLE_
SHOT
PD_LOFF_
COMP
17h
CONFIG4
00h
0
0
0
0
0
0
(1) Register or bit only available in the ADS1299-6 and ADS1299. Register bits set to 0h or 00h in the ADS1299-4.
(2) Register or bit only available in the ADS1299. Register bits set to 0h or 00h in the ADS1299-4 and ADS1299-6.
44
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9.6.1 User Register Description
The read-only ID control register is programmed during device manufacture to indicate device characteristics.
9.6.1.1 ID: ID Control Register (address = 00h) (reset = xxh)
Figure 50. ID Control Register
7
6
5
4
1
3
2
1
0
REV_ID[2:0]
R-xh
DEV_ID[1:0]
R-3h
NU_CH[1:0]
R-xh
R-1h
LEGEND: R/W = Read/Write; R = Read only; -n = value after reset
Table 12. ID Control Register Field Descriptions
Bit
Field
Type
Reset
Description
7:5
REV_ID[2:0]
R
xh
Reserved.
These bits indicate the revision of the device and are subject to
change without notice.
4
Reserved
R
R
1h
3h
Reserved.
Always read 1.
3:2
DEV_ID[1:0]
Device Identification.
These bits indicates the device.
11 : ADS1299-x
1:0
NU_CH[1:0]
R
xh
Number of Channels.
These bits indicates number of channels.
00 : 4-channel ADS1299-4
01 : 6-channel ADS1299-6
10 : 8-channel ADS1299
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9.6.1.2 CONFIG1: Configuration Register 1 (address = 01h) (reset = 96h)
This register configures the DAISY_EN bit, clock, and data rate.
Figure 51. CONFIG1: Configuration Register 1
7
1
6
5
4
1
3
0
2
1
0
DAISY_EN
R/W-0h
CLK_EN
R/W-0h
DR[2:0]
R/W-6h
R/W-1h
R/W-1h
R/W-0h
LEGEND: R/W = Read/Write; R = Read only; -n = value after reset
Table 13. Configuration Register 1 Field Descriptions
Bit
Field
Type
Reset
Description
7
Reserved
R/W
1h
Reserved
Always write 1h
6
5
DAISY_EN
CLK_EN
R/W
R/W
0h
0h
Daisy-chain or multiple readback mode
This bit determines which mode is enabled.
0 : Daisy-chain mode
1 : Multiple readback mode
CLK connection(1)
This bit determines if the internal oscillator signal is connected to
the CLK pin when the CLKSEL pin = 1.
0 : Oscillator clock output disabled
1 : Oscillator clock output enabled
4:3
2:0
Reserved
DR[2:0]
R/W
R/W
2h
6h
Reserved
Always write 2h
Output data rate
These bits determine the output data rate of the device. fMOD
fCLK / 2.
=
000 : fMOD / 64 (16 kSPS)
001 : fMOD / 128 (8 kSPS)
010 : fMOD / 256 (4 kSPS)
011 : fMOD / 512 (2 kSPS)
100 : fMOD / 1024 (1 kSPS)
101 : fMOD / 2048 (500 SPS)
110 : fMOD / 4096 (250 SPS)
111 : Reserved (do not use)
(1) Additional power is consumed when driving external devices.
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9.6.1.3 CONFIG2: Configuration Register 2 (address = 02h) (reset = C0h)
This register configures the test signal generation. See the Input Multiplexer section for more details.
Figure 52. CONFIG2: Configuration Register 2
7
1
6
1
5
0
4
3
0
2
1
0
INT_CAL
R/W-0h
CAL_AMP
R/W-0h
CAL_FREQ[1:0]
R/W-0h
R/W-1h
R/W-1h
R/W-0h
R/W-0h
LEGEND: R/W = Read/Write; R = Read only; -n = value after reset
Table 14. Configuration Register 2 Field Descriptions
Bit
Field
Type
Reset
Description
7:5
Reserved
R/W
6h
Reserved
Always write 6h
4
INT_CAL
R/W
0h
TEST source
This bit determines the source for the test signal.
0 : Test signals are driven externally
1 : Test signals are generated internally
3
2
Reserved
CAL_AMP
R/W
R/W
0h
0h
Reserved
Always write 0h
Test signal amplitude
These bits determine the calibration signal amplitude.
0 : 1 × –(VREFP – VREFN) / 2400
1 : 2 × –(VREFP – VREFN) / 2400
1:0
CAL_FREQ[1:0]
R/W
0h
Test signal frequency
These bits determine the calibration signal frequency.
00 : Pulsed at fCLK / 221
01 : Pulsed at fCLK / 220
10 : Do not use
11 : At dc
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9.6.1.4 CONFIG3: Configuration Register 3 (address = 03h) (reset = 60h)
Configuration register 3 configures either an internal or exteral reference and BIAS operation.
Figure 53. CONFIG3: Configuration Register 3
7
6
1
5
1
4
3
2
1
0
BIAS_LOFF_
SENS
PD_REFBUF
R/W-0h
BIAS_MEAS
R/W-0h
BIASREF_INT
R/W-0h
PD_BIAS
R/W-0h
BIAS_STAT
R-0h
R/W-1h
R/W-1h
R/W-0h
LEGEND: R/W = Read/Write; R = Read only; -n = value after reset
Table 15. Configuration Register 3 Field Descriptions
Bit
Field
Type
Reset
Description
7
PD_REFBUF
R/W
0h
Power-down reference buffer
This bit determines the power-down reference buffer state.
0 : Power-down internal reference buffer
1 : Enable internal reference buffer
6:5
4
Reserved
R/W
R/W
3h
0h
Reserved
Always write 3h.
BIAS_MEAS
BIAS measurement
This bit enables BIAS measurement. The BIAS signal may be
measured with any channel.
0 : Open
1 : BIAS_IN signal is routed to the channel that has the
MUX_Setting 010 (VREF
)
3
2
1
0
BIASREF_INT
PD_BIAS
R/W
R/W
R/W
R
0h
0h
0h
0h
BIASREF signal
This bit determines the BIASREF signal source.
0 : BIASREF signal fed externally
1 : BIASREF signal (AVDD + AVSS) / 2 generated internally
BIAS buffer power
This bit determines the BIAS buffer power state.
0 : BIAS buffer is powered down
1 : BIAS buffer is enabled
BIAS_LOFF_SENS
BIAS_STAT
BIAS sense function
This bit enables the BIAS sense function.
0 : BIAS sense is disabled
1 : BIAS sense is enabled
BIAS lead-off status
This bit determines the BIAS status.
0 : BIAS is connected
1 : BIAS is not connected
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9.6.1.5 LOFF: Lead-Off Control Register (address = 04h) (reset = 00h)
The lead-off control register configures the lead-off detection operation.
Figure 54. LOFF: Lead-Off Control Register
7
6
5
4
0
3
2
1
0
COMP_TH2[2:0]
R/W-0h
ILEAD_OFF[1:0]
R/W-0h
FLEAD_OFF[1:0]
R/W-0h
R/W-0h
LEGEND: R/W = Read/Write; R = Read only; -n = value after reset
Table 16. Lead-Off Control Register Field Descriptions
Bit
Field
Type
Reset
Description
7:5
COMP_TH[2:0]
R/W
0h
Lead-off comparator threshold
Comparator positive side
000 : 95%
001 : 92.5%
010 : 90%
011 : 87.5%
100 : 85%
101 : 80%
110 : 75%
111 : 70%
Comparator negative side
000 : 5%
001 : 7.5%
010 : 10%
011 : 12.5%
100 : 15%
101 : 20%
110 : 25%
111 : 30%
4
Reserved
R/W
R/W
0h
0h
Reserved
Always write 0h.
3:2
ILEAD_OFF[1:0]
Lead-off current magnitude
These bits determine the magnitude of current for the current
lead-off mode.
00 : 6 nA
01 : 24 nA
10 : 6 µA
11 : 24 µA
1:0
FLEAD_OFF[1:0]
R/W
0h
Lead-off frequency
These bits determine the frequency of lead-off detect for each
channel.
00 : DC lead-off detection
01 : AC lead-off detection at 7.8 Hz (fCLK / 218
)
10 : AC lead-off detection at 31.2 Hz (fCLK / 216
11 : AC lead-off detection at fDR / 4
)
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9.6.1.6 CHnSET: Individual Channel Settings (n = 1 to 8) (address = 05h to 0Ch) (reset = 61h)
The CH[1:8]SET control register configures the power mode, PGA gain, and multiplexer settings channels. See
the Input Multiplexer section for details. CH[2:8]SET are similar to CH1SET, corresponding to the respective
channels.
Figure 55. CHnSET: Individual Channel Settings Register
7
6
5
4
3
2
1
0
PDn
GAINn[2:0]
R/W-6h
SRB2
R/W-0h
MUXn[2:0]
R/W-0h
R/W-0h
LEGEND: R/W = Read/Write; R = Read only; -n = value after reset
Table 17. Individual Channel Settings (n = 1 to 8) Field Descriptions
Bit
Field
Type
Reset
Description
7
PDn
R/W
0h
Power-down
This bit determines the channel power mode for the
corresponding channel.
0 : Normal operation
1 : Channel power-down.
When powering down a channel, TI recommends that the
channel be set to input short by setting the appropriate
MUXn[2:0] = 001 of the CHnSET register.
6:4
GAINn[2:0]
R/W
6h
PGA gain
These bits determine the PGA gain setting.
000 : 1
001 : 2
010 : 4
011 : 6
100 : 8
101 : 12
110 : 24
111 : Do not use
3
SRB2
R/W
R/W
0h
1h
SRB2 connection
This bit determines the SRB2 connection for the corresponding
channel.
0 : Open
1 : Closed
2:0
MUXn[2:0]
Channel input
These bits determine the channel input selection.
000 : Normal electrode input
001 : Input shorted (for offset or noise measurements)
010 : Used in conjunction with BIAS_MEAS bit for BIAS
measurements.
011 : MVDD for supply measurement
100 : Temperature sensor
101 : Test signal
110 : BIAS_DRP (positive electrode is the driver)
111 : BIAS_DRN (negative electrode is the driver)
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9.6.1.7 BIAS_SENSP: Bias Drive Positive Derivation Register (address = 0Dh) (reset = 00h)
This register controls the selection of the positive signals from each channel for bias voltage (BIAS) derivation.
See the Bias Drive (DC Bias Circuit) section for details.
Registers bits[5:4] are not available for the ADS1299-4. Register bits[7:6] are not available for the ADS1299-4, or
ADS1299-6. Set unavailable bits for the associated device to 0 when writing to the register.
Figure 56. BIAS_SENSP: BIAS Positive Signal Derivation Register
7
6
5
4
3
2
1
0
BIASP8
R/W-0h
BIASP7
R/W-0h
BIASP6
R/W-0h
BIASP5
R/W-0h
BIASP4
R/W-0h
BIASP3
R/W-0h
BIASP2
R/W-0h
BIASP1
R/W-0h
LEGEND: R/W = Read/Write; R = Read only; -n = value after reset
Table 18. BIAS Positive Signal Derivation Field Descriptions
Bit
Field
Type
Reset
Description
7
BIASP8
R/W
0h
IN8P to BIAS
Route channel 8 positive signal into BIAS derivation
0 : Disabled
1 : Enabled
6
5
4
3
2
1
0
BIASP7
BIASP6
BIASP5
BIASP4
BIASP3
BIASP2
BIASP1
R/W
R/W
R/W
R/W
R/W
R/W
R/W
0h
0h
0h
0h
0h
0h
0h
IN7P to BIAS
Route channel 7 positive signal into BIAS derivation
0 : Disabled
1 : Enabled
IN6P to BIAS
Route channel 6 positive signal into BIAS derivation
0 : Disabled
1 : Enabled
IN5P to BIAS
Route channel 5 positive signal into BIAS derivation
0 : Disabled
1 : Enabled
IN4P to BIAS
Route channel 4 positive signal into BIAS derivation
0 : Disabled
1 : Enabled
IN3P to BIAS
Route channel 3 positive signal into BIAS derivation
0 : Disabled
1 : Enabled
IN2P to BIAS
Route channel 2 positive signal into BIAS channel
0 : Disabled
1 : Enabled
IN1P to BIAS
Route channel 1 positive signal into BIAS channel
0 : Disabled
1 : Enabled
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9.6.1.8 BIAS_SENSN: Bias Drive Negative Derivation Register (address = 0Eh) (reset = 00h)
This register controls the selection of the negative signals from each channel for bias voltage (BIAS) derivation.
See the Bias Drive (DC Bias Circuit) section for details.
Registers bits[5:4] are not available for the ADS1299-4. Register bits[7:6] are not available for the ADS1299-4, or
ADS1299-6. Set unavailable bits for the associated device to 0 when writing to the register.
Figure 57. BIAS_SENSN: BIAS Negative Signal Derivation Register
7
6
5
4
3
2
1
0
BIASN8
R/W-0h
BIASN7
R/W-0h
BIASN6
R/W-0h
BIASN5
R/W-0h
BIASN4
R/W-0h
BIASN3
R/W-0h
BIASN2
R/W-0h
BIASN1
R/W-0h
LEGEND: R/W = Read/Write; R = Read only; -n = value after reset
Table 19. BIAS Negative Signal Derivation Field Descriptions
Bit
Field
Type
Reset
Description
7
BIASN8
R/W
0h
IN8N to BIAS
Route channel 8 negative signal into BIAS derivation
0 : Disabled
1 : Enabled
6
5
4
3
2
1
0
BIASN7
BIASN6
BIASN5
BIASN4
BIASN3
BIASN2
BIASN1
R/W
R/W
R/W
R/W
R/W
R/W
R/W
0h
0h
0h
0h
0h
0h
0h
IN7N to BIAS
Route channel 7 negative signal into BIAS derivation
0 : Disabled
1 : Enabled
IN6N to BIAS
Route channel 6 negative signal into BIAS derivation
0 : Disabled
1 : Enabled
IN5N to BIAS
Route channel 5 negative signal into BIAS derivation
0 : Disabled
1 : Enabled
IN4N to BIAS
Route channel 4 negative signal into BIAS derivation
0 : Disabled
1 : Enabled
IN3N to BIAS
Route channel 3 negative signal into BIAS derivation
0 : Disabled
1 : Enabled
IN2N to BIAS
Route channel 2 negative signal into BIAS derivation
0 : Disabled
1 : Enabled
IN1N to BIAS
Route channel 1 negative signal into BIAS derivation
0 : Disabled
1 : Enabled
52
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9.6.1.9 LOFF_SENSP: Positive Signal Lead-Off Detection Register (address = 0Fh) (reset = 00h)
This register selects the positive side from each channel for lead-off detection. See the Lead-Off Detection
section for details. The LOFF_STATP register bits are only valid if the corresponding LOFF_SENSP bits are set
to 1.
Registers bits[5:4] are not available for the ADS1299-4. Register bits[7:6] are not available for the ADS1299-4, or
ADS1299-6. Set unavailable bits for the associated device to 0 when writing to the register.
Figure 58. LOFF_SENSP: Positive Signal Lead-Off Detection Register
7
6
5
4
3
2
1
0
LOFFP8
R/W-0h
LOFFP7
R/W-0h
LOFFP6
R/W-0h
LOFFP5
R/W-0h
LOFFP4
R/W-0h
LOFFP3
R/W-0h
LOFFP2
R/W-0h
LOFFP1
R/W-0h
LEGEND: R/W = Read/Write; R = Read only; -n = value after reset
Table 20. Positive Signal Lead-Off Detection Field Descriptions
Bit
Field
Type
Reset
Description
7
LOFFP8
R/W
0h
IN8P lead off
Enable lead-off detection on IN8P
0 : Disabled
1 : Enabled
6
5
4
3
2
1
0
LOFFP7
LOFFP6
LOFFP5
LOFFP4
LOFFP3
LOFFP2
LOFFP1
R/W
R/W
R/W
R/W
R/W
R/W
R/W
0h
0h
0h
0h
0h
0h
0h
IN7P lead off
Enable lead-off detection on IN7P
0 : Disabled
1 : Enabled
IN6P lead off
Enable lead-off detection on IN6P
0 : Disabled
1 : Enabled
IN5P lead off
Enable lead-off detection on IN5P
0 : Disabled
1 : Enabled
IN4P lead off
Enable lead-off detection on IN4P
0 : Disabled
1 : Enabled
IN3P lead off
Enable lead-off detection on IN3P
0 : Disabled
1 : Enabled
IN2P lead off
Enable lead-off detection on IN2P
0 : Disabled
1 : Enabled
IN1P lead off
Enable lead-off detection on IN1P
0 : Disabled
1 : Enabled
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9.6.1.10 LOFF_SENSN: Negative Signal Lead-Off Detection Register (address = 10h) (reset = 00h)
This register selects the negative side from each channel for lead-off detection. See the Lead-Off Detection
section for details. The LOFF_STATN register bits are only valid if the corresponding LOFF_SENSN bits are set
to 1.
Registers bits[5:4] are not available for the ADS1299-4. Register bits[7:6] are not available for the ADS1299-4, or
ADS1299-6. Set unavailable bits for the associated device to 0 when writing to the register.
Figure 59. LOFF_SENSN: Negative Signal Lead-Off Detection Register
7
6
5
4
3
2
1
0
LOFFM8
R/W-0h
LOFFM7
R/W-0h
LOFFM6
R/W-0h
LOFFM5
R/W-0h
LOFFM4
R/W-0h
LOFFM3
R/W-0h
LOFFM2
R/W-0h
LOFFM1
R/W-0h
LEGEND: R/W = Read/Write; R = Read only; -n = value after reset
Table 21. Negative Signal Lead-Off Detection Field Descriptions
Bit
Field
Type
Reset
Description
7
LOFFM8
R/W
0h
IN8N lead off
Enable lead-off detection on IN8N
0 : Disabled
1 : Enabled
6
5
4
3
2
1
0
LOFFM7
LOFFM6
LOFFM5
LOFFM4
LOFFM3
LOFFM2
LOFFM1
R/W
R/W
R/W
R/W
R/W
R/W
R/W
0h
0h
0h
0h
0h
0h
0h
IN7N lead off
Enable lead-off detection on IN7N
0 : Disabled
1 : Enabled
IN6N lead off
Enable lead-off detection on IN6N
0 : Disabled
1 : Enabled
IN5N lead off
Enable lead-off detection on IN5N
0 : Disabled
1 : Enabled
IN4N lead off
Enable lead-off detectionn on IN4N
0 : Disabled
1 : Enabled
IN3N lead off
Enable lead-off detectionion on IN3N
0 : Disabled
1 : Enabled
IN2N lead off
Enable lead-off detectionction on IN2N
0 : Disabled
1 : Enabled
IN1N lead off
Enable lead-off detectionction on IN1N
0 : Disabled
1 : Enabled
54
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9.6.1.11 LOFF_FLIP: Lead-Off Flip Register (address = 11h) (reset = 00h)
This register controls the direction of the current used for lead-off derivation. See the Lead-Off Detection section
for details.
Figure 60. LOFF_FLIP: Lead-Off Flip Register
7
6
5
4
3
2
1
0
LOFF_FLIP8
R/W-0h
LOFF_FLIP7
R/W-0h
LOFF_FLIP6
R/W-0h
LOFF_FLIP5
R/W-0h
LOFF_FLIP4
R/W-0h
LOFF_FLIP3
R/W-0h
LOFF_FLIP2
R/W-0h
LOFF_FLIP1
R/W-0h
LEGEND: R/W = Read/Write; R = Read only; -n = value after reset
Table 22. Lead-Off Flip Register Field Descriptions
Bit
Field
Type
Reset
Description
7
LOFF_FLIP8
R/W
0h
Channel 8 LOFF polarity flip
Flip the pull-up or pull-down polarity of the current source on
channel 8 for lead-off detection.
0 : No flip = IN8P is pulled to AVDD and IN8N pulled to AVSS
1 : Flipped = IN8P is pulled to AVSS and IN8N pulled to AVDD
6
5
4
3
2
1
0
LOFF_FLIP7
LOFF_FLIP6
LOFF_FLIP5
LOFF_FLIP4
LOFF_FLIP3
LOFF_FLIP2
LOFF_FLIP1
R/W
R/W
R/W
R/W
R/W
R/W
R/W
0h
0h
0h
0h
0h
0h
0h
Channel 7 LOFF polarity flip
Flip the pull-up or pull-down polarity of the current source on
channel 7 for lead-off detection.
0 : No flip = IN7P is pulled to AVDD and IN7N pulled to AVSS
1 : Flipped = IN7P is pulled to AVSS and IN7N pulled to AVDD
Channel 6 LOFF polarity flip
Flip the pull-up or pull-down polarity of the current source on
channel 6 for lead-off detection.
0 : No flip = IN6P is pulled to AVDD and IN6N pulled to AVSS
1 : Flipped = IN6P is pulled to AVSS and IN6N pulled to AVDD
Channel 5 LOFF polarity flip
Flip the pull-up or pull-down polarity of the current source on
channel 5 for lead-off detection.
0 : No flip = IN5P is pulled to AVDD and IN5N pulled to AVSS
1 : Flipped = IN5P is pulled to AVSS and IN5N pulled to AVDD
Channel 4 LOFF polarity flip
Flip the pull-up or pull-down polarity of the current source on
channel 4 for lead-off detection.
0 : No flip = IN4P is pulled to AVDD and IN4N pulled to AVSS
1 : Flipped = IN4P is pulled to AVSS and IN4N pulled to AVDD
Channel 3 LOFF polarity flip
Flip the pull-up or pull-down polarity of the current source on
channel 3 for lead-off detection.
0 : No flip = IN3P is pulled to AVDD and IN3N pulled to AVSS
1 : Flipped = IN3P is pulled to AVSS and IN3N pulled to AVDD
Channel 2 LOFF Polarity Flip
Flip the pull-up or pull-down polarity of the current source on
channel 2 for lead-off detection.
0 : No flip = IN2P is pulled to AVDD and IN2N pulled to AVSS
1 : Flipped = IN2P is pulled to AVSS and IN2N pulled to AVDD
Channel 1 LOFF Polarity Flip
Flip the pull-up or pull-down polarity of the current source on
channel 1 for lead-off detection.
0 : No flip = IN1P is pulled to AVDD and IN1N pulled to AVSS
1 : Flipped = IN1P is pulled to AVSS and IN1N pulled to AVDD
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9.6.1.12 LOFF_STATP: Lead-Off Positive Signal Status Register (address = 12h) (reset = 00h)
This register stores the status of whether the positive electrode on each channel is on or off. See the Lead-Off
Detection section for details. Ignore the LOFF_STATP values if the corresponding LOFF_SENSP bits are not set
to 1.
When the LOFF_SENSEP bits are 0, the LOFF_STATP bits should be ignored.
Figure 61. LOFF_STATP: Lead-Off Positive Signal Status Register (Read-Only)
7
6
5
4
3
2
1
0
IN8P_OFF
R-0h
IN7P_OFF
R-0h
IN6P_OFF
R-0h
IN5P_OFF
R-0h
IN4P_OFF
R-0h
IN3P_OFF
R-0h
IN2P_OFF
R-0h
IN1P_OFF
R-0h
LEGEND: R/W = Read/Write; R = Read only; -n = value after reset
Table 23. Lead-Off Positive Signal Status Field Descriptions
Bit
Field
Type
Reset
Description
7
IN8P_OFF
R
0h
Channel 8 positive channel lead-off status
Status of whether IN8P electrode is on or off
0 : Electrode is on
1 : Electrode is off
6
5
4
3
2
1
0
IN7P_OFF
IN6P_OFF
IN5P_OFF
IN4P_OFF
IN3P_OFF
IN2P_OFF
IN1P_OFF
R
R
R
R
R
R
R
0h
0h
0h
0h
0h
0h
0h
Channel 7 positive channel lead-off status
Status of whether IN7P electrode is on or off
0 : Electrode is on
1 : Electrode is off
Channel 6 positive channel lead-off status
Status of whether IN6P electrode is on or off
0 : Electrode is on
1 : Electrode is off
Channel 5 positive channel lead-off status
Status of whether IN5P electrode is on or off
0 : Electrode is on
1 : Electrode is off
Channel 4 positive channel lead-off status
Status of whether IN4P electrode is on or off
0 : Electrode is on
1 : Electrode is off
Channel 3 positive channel lead-off status
Status of whether IN3P electrode is on or off
0 : Electrode is on
1 : Electrode is off
Channel 2 positive channel lead-off status
Status of whether IN2P electrode is on or off
0 : Electrode is on
1 : Electrode is off
Channel 1 positive channel lead-off status
Status of whether IN1P electrode is on or off
0 : Electrode is on
1 : Electrode is off
56
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9.6.1.13 LOFF_STATN: Lead-Off Negative Signal Status Register (address = 13h) (reset = 00h)
This register stores the status of whether the negative electrode on each channel is on or off. See the Lead-Off
Detection section for details. Ignore the LOFF_STATN values if the corresponding LOFF_SENSN bits are not set
to 1.
When the LOFF_SENSEN bits are 0, the LOFF_STATP bits should be ignored.
Figure 62. LOFF_STATN: Lead-Off Negative Signal Status Register (Read-Only)
7
6
5
4
3
2
1
0
IN8N_OFF
R-0h
IN7N_OFF
R-0h
IN6N_OFF
R-0h
IN5N_OFF
R-0h
IN4N_OFF
R-0h
IN3N_OFF
R-0h
IN2N_OFF
R-0h
IN1N_OFF
R-0h
LEGEND: R/W = Read/Write; R = Read only; -n = value after reset
Table 24. Lead-Off Negative Signal Status Field Descriptions
Bit
Field
Type
Reset
Description
7
IN8N_OFF
R
0h
Channel 8 negative channel lead-off status
Status of whether IN8N electrode is on or off
0 : Electrode is on
1 : Electrode is off
6
5
4
3
2
1
0
IN7N_OFF
IN6N_OFF
IN5N_OFF
IN4N_OFF
IN3N_OFF
IN2N_OFF
IN1N_OFF
R
R
R
R
R
R
R
0h
0h
0h
0h
0h
0h
0h
Channel 7 negative channel lead-off status
Status of whether IN7N electrode is on or off
0 : Electrode is on
1 : Electrode is off
Channel 6 negative channel lead-off status
Status of whether IN6N electrode is on or off
0 : Electrode is on
1 : Electrode is off
Channel 5 negative channel lead-off status
Status of whether IN5N electrode is on or off
0 : Electrode is on
1 : Electrode is off
Channel 4 negative channel lead-off status
Status of whether IN4N electrode is on or off
0 : Electrode is on
1 : Electrode is off
Channel 3 negative channel lead-off status
Status of whether IN3N electrode is on or off
0 : Electrode is on
1 : Electrode is off
Channel 2 negative channel lead-off status
Status of whether IN2N electrode is on or off
0 : Electrode is on
1 : Electrode is off
Channel 1 negative channel lead-off status
Status of whether IN1N electrode is on or off
0 : Electrode is on
1 : Electrode is off
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9.6.1.14 GPIO: General-Purpose I/O Register (address = 14h) (reset = 0Fh)
The general-purpose I/O register controls the action of the three GPIO pins. When RESP_CTRL[1:0] is in mode
01 and 11, the GPIO2, GPIO3, and GPIO4 pins are not available for use.
Figure 63. GPIO: General-Purpose I/O Register
7
6
5
4
3
2
1
0
GPIOD[4:1]
R/W-0h
GPIOC[4:1]
R/W-Fh
LEGEND: R/W = Read/Write; R = Read only; -n = value after reset
Table 25. General-Purpose I/O Field Descriptions
Bit
Field
Type
Reset
Description
7:4
GPIOD[4:1]
R/W
0h
GPIO data
These bits are used to read and write data to the GPIO ports.
When reading the register, the data returned correspond to the
state of the GPIO external pins, whether they are programmed
as inputs or as outputs. As outputs, a write to the GPIOD sets
the output value. As inputs, a write to the GPIOD has no effect.
GPIO is not available in certain respiration modes.
3:0
GPIOC[4:1]
R/W
Fh
GPIO control (corresponding GPIOD)
These bits determine if the corresponding GPIOD pin is an input
or output.
0 : Output
1 : Input
58
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9.6.1.15 MISC1: Miscellaneous 1 Register (address = 15h) (reset = 00h)
This register provides the control to route the SRB1 pin to all inverting inputs of the four, six, or eight channels
(ADS1299-4, ADS1299-6, or ADS1299).
Figure 64. MISC1: Miscellaneous 1 Register
7
0
6
0
5
4
0
3
0
2
0
1
0
0
0
SRB1
R/W-0h
R/W-0h
R/W-0h
R/W-0h
R/W-0h
R/W-0h
R/W-0h
R/W-0h
LEGEND: R/W = Read/Write; R = Read only; -n = value after reset
Table 26. Miscellaneous 1 Register Field Descriptions
Bit
Field
Type
Reset
Description
7:6
Reserved
R/W
0h
Reserved
Always write 0h
5
SRB1
R/W
R/W
0h
0h
Stimulus, reference, and bias 1
This bit connects the SRB1 to all 4, 6, or 8 channels inverting
inputs
0 : Switches open
1 : Switches closed
4:0
Reserved
Reserved
Always write 0h
9.6.1.16 MISC2: Miscellaneous 2 (address = 16h) (reset = 00h)
This register is reserved for future use.
Figure 65. MISC1: Miscellaneous 1 Register
7
0
6
0
5
0
4
0
3
0
2
0
1
0
0
0
R/W-0h
R/W-0h
R/W-0h
R/W-0h
R/W-0h
R/W-0h
R/W-0h
R/W-0h
LEGEND: R/W = Read/Write; R = Read only; -n = value after reset
Table 27. Miscellaneous 1 Register Field Descriptions
Bit
Field
Type
Reset
Description
7:0
Reserved
R/W
0h
Reserved
Always write 0h
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9.6.1.17 CONFIG4: Configuration Register 4 (address = 17h) (reset = 00h)
This register configures the conversion mode and enables the lead-off comparators.
Figure 66. CONFIG4: Configuration Register 4
7
0
6
0
5
0
4
0
3
2
0
1
0
0
PD_LOFF_
COMP
SINGLE_SHOT
R/W-0h
R/W-0h
R/W-0h
R/W-0h
R/W-0h
R/W-0h
R/W-0h
R/W-0h
LEGEND: R/W = Read/Write; R = Read only; -n = value after reset
Table 28. Configuration Register 4 Field Descriptions
Bit
Field
Type
Reset
Description
7:4
Reserved
R/W
0h
Reserved
Always write 0h
3
SINGLE_SHOT
R/W
0h
Single-shot conversion
This bit sets the conversion mode.
0 : Continuous conversion mode
1 : Single-shot mode
2
1
Reserved
R/W
R/W
0h
0h
Reserved
Always write 0h
PD_LOFF_COMP
Lead-off comparator power-down
This bit powers down the lead-off comparators.
0 : Lead-off comparators disabled
1 : Lead-off comparators enabled
0
Reserved
R/W
0h
Reserved
Always write 0h
60
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10 Applications and Implementation
NOTE
Information in the following applications sections is not part of the TI component
specification, and TI does not warrant its accuracy or completeness. TI’s customers are
responsible for determining suitability of components for their purposes. Customers should
validate and test their design implementation to confirm system functionality.
10.1 Application Information
10.1.1 Unused Inputs and Outputs
Power down unused analog inputs and connect them directly to AVDD.
Power down the Bias amplifier if unused and float BIASOUT and BIASINV. BIASIN can also float or can be tied
directly to AVSS if unused.
Tie BIASREF directly to AVSS or leave floating if unused.
Tie SRB1 and SRB2 directly to AVSS or leave them floating if unused.
Do not float unused digital inputs because excessive power-supply leakage current might result. Set the two-
state mode setting pins high to DVDD or low to DGND through ≥10-kΩ resistors.
Pull DRDY to supply using weak pullup resistor if unused.
If not daisy-chaining devices, tie DAISYIN directly to DGND.
10.1.2 Setting the Device for Basic Data Capture
Figure 67 outlines the procedure to configure the device in a basic state and capture data. This procedure puts
the device into a configuration that matches the parameters listed in the specifications section, in order to check
if the device is working properly in the user system. Follow this procedure initially until familiar with the device
settings. After this procedure has been verified, the device can be configured as needed. For details on the
timings for commands, see the appropriate sections in the data sheet. Sample programming codes are added for
the ECG and EEG-specific functions.
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Application Information (continued)
Analog and Digital Power-Up
// Follow Power-Up Sequencing
Set CLKSEL Pin = 0
and Provide External Clock
fCLK = 2.048 MHz
Yes
External
Clock
No
Set CLKSEL Pin = 1
and Wait for Oscillator
to Wake Up
// If START is Tied High, After This Step
// DRDY Toggles at fCLK / 8192
Set PDWN = 1
Set RESET = 1
Wait > tPOR for
Power-On Reset
// Delay for Power-On Reset and Oscillator Start-Up
No
VCAP1 ≥ 1.1 V
// If VCAP1 < 1.1 V at tPOR, continue waiting until VCAP ≥ 1.1 V
// Activate DUT
// CS can be Either Tied Low Or Selectively
// Pulled Low Before Sending Commands and
// Data to the Device or Reading Data From
// The Device
Issue Reset Pulse,
Wait for 18 tCLKs
// Device Wakes Up in RDATAC Mode, so Send
// SDATAC Command so Registers can be Written
SDATAC
Send SDATAC
Command
No
Set PDB_REFBUF = 1
and Wait for Internal Reference
to Settle
External
Reference
// If Using Internal Reference, Send This Command
WREG CONFIG3 E0h
Yes
// Set Device for DR = fMOD / 4096
WREG CONFIG1 96h
WREG CONFIG2 C0h
// Set All Channels to Input Short
WREG CHnSET 01h
Write Certain Registers,
Including Input Short
// Activate Conversion
// After This Point DRDY Toggles at
// fCLK / 8192
Set START = 1
RDATAC
// Put the Device Back in RDATAC Mode
RDATAC
Capture Data
and Check Noise
// Look for DRDY and Issue 24 + n x 24 SCLKs
// Activate a (1 mV x VREF / 2.4) Square-Wave Test Signal
// On All Channels
SDATAC
WREG CONFIG2 D0h
WREG CHnSET 05h
RDATAC
Set Test Signals
Capture Data
and Test Signal
// Look for DRDY and Issue 24 + n x 24 SCLKs
Figure 67. Initial Flow at Power-Up
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Application Information (continued)
10.1.2.1 Lead-Off
Sample code to set dc lead-off with pull-up and pull-down resistors on all channels.
WREG LOFF
0x13
// Comparator threshold at 95% and 5%, pullup or pulldown resistor
// dc lead-off
WREG CONFIG4
WREG LOFF_SENSP 0xFF
WREG LOFF_SENSN 0xFF
0x02
// Turn on dc lead-off comparators
// Turn on the P-side of all channels for lead-off sensing
// Turn on the N-side of all channels for lead-off sensing
Observe the status bits of the output data stream to monitor lead-off status.
10.1.2.2 Bias Drive
Sample code to choose bias as an average of the first three channels.
WREG RLD_SENSP 0x07
WREG RLD_SENSN 0x07
// Select channel 1-3 P-side for RLD sensing
// Select channel 1-3 N-side for RLD sensing
WREG CONFIG3
b’x1xx 1100 // Turn on BIAS amplifier, set internal BIASREF voltage
Sample code to route the BIASOUT signal through channel 4 N-side and measure bias with channel 5. Make
sure the external side to the chip BIASOUT is connected to BIASIN.
WREG CONFIG3 b’xxx1 1100 // Turn on BIAS amp, set internal BIASREF voltage, set BIAS measurement bit
WREG CH4SET b’xxxx 0111 // Route BIASIN to channel 4 N-side
WREG CH5SET b’xxxx 0010 // Route BIASIN to be measured at channel 5 w.r.t BIASREF
10.1.3 Establishing the Input Common-Mode
The ADS1299-x measures fully-differential signals where the common-mode voltage point is the midpoint of the
positive and negative analog input. The internal PGA restricts the common-mode input range because of the
headroom required for operation. The human body is prone to common-mode drifts because noise easily couples
onto the human body, similar to an antenna. These common-mode drifts may push the ADS1299-x input
common-mode voltage out of the measurable range of the ADC.
If a patient-drive electrode is used by the system, the ADS1299-x includes an on-chip bias drive (BIAS) amplifier
that connects to the patient drive electrode. The BIAS amplifier function is to bias the patient to maintain the
other electrode common-mode voltages within the valid range. When powered on, the amplifier uses either the
analog midsupply voltage, or the voltage present at the BIASREF pin, as a reference input to drive the patient to
that voltage.
The ADS1299-x provides the option to use input electrode voltages as feedback to the amplifier to more
effectively stabilize the output to the amplifier reference voltage by setting corresponding bits in the
BIAS_SENSP and BIAS_SENSN registers. Figure 68 shows an example of a three-electrode system that
leverages this technique.
Antialiasing,
Protection
Electrode 1
INxP
Antialiasing,
Protection
INxN
Electrode 2
TI Device
BIASINV
1.5 nF
1 Mꢀ
BIAS Electrode
Protection
BIASOUT
Copyright © 2016, Texas Instruments Incorporated
Figure 68. Setting Common-Mode Using BIAS Electrode
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Application Information (continued)
10.1.4 Multiple Device Configuration
The ADS1299-x is designed to provide configuration flexibility when multiple devices are used in a system. The
serial interface typically needs four signals: DIN, DOUT, SCLK, and CS. With one additional chip select signal
per device, multiple devices can be connected together. The number of signals needed to interface n devices is
3 + n.
The BIAS drive amplifiers can be daisy-chained, as explained in the Bias Configuration with Multiple Devices
section. To use the internal oscillator in a daisy-chain configuration, one device must be set as the master for the
clock source with the internal oscillator enabled (CLKSEL pin = 1) and the internal oscillator clock brought out of
the device by setting the CLK_EN register bit to '1'. This master device clock is used as the external clock source
for other devices.
When using multiple devices, the devices can be synchronized with the START signal. The delay from START to
the DRDY signal is fixed for a given data rate (see the Start subsection of the SPI Interface section for more
details on the settling times). Figure 69 shows the behavior of two devices when synchronized with the START
signal.
There are two ways to connect multiple devices with a optimal number of interface pins: cascade mode and
daisy-chain mode.
Device 1
START
CLK
START1
CLK
DRDY1
DRDY
Device 2
START2
CLK
DRDY2
DRDY
CLK
START
DRDY1
DRDY2
Figure 69. Synchronizing Multiple Converters
10.1.4.1 Cascaded Mode
Figure 70a illustrates a configuration with two devices cascaded together. Together, the devices create a system
with 16 channels. DOUT, SCLK, and DIN are shared. Each device has its own chip select. When a device is not
selected by the corresponding CS being driven to logic 1, the DOUT of this device is high-impedance. This
structure allows the other device to take control of the DOUT bus. This configuration method is suitable for the
majority of applications.
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Application Information (continued)
10.1.4.2 Daisy-Chain Mode
Daisy-chain mode is enabled by setting the DAISY_EN bit in the CONFIG1 register. Figure 70b shows the daisy-
chain configuration. In this mode SCLK, DIN, and CS are shared across multiple devices. The DOUT of the
second device is connected to the DAISY_IN of the first device, thereby creating a chain. When using daisy-
chain mode, the multiple readback feature is not available. Short the DAISY_IN pin to digital ground if not used.
Figure 2 describes the required timing for the device shown in the configurations of Figure 70. Status and data
from device 1 appear first on DOUT, followed by the status and data from device 2. The ADS1299 can be daisy
chained with a second ADS1299, an ADS1299-6, or an ADS1299-4.
START(1)
CLK
START(1)
CLK
START
CLK
START
CLK
DRDY
CS
INT
DRDY
CS
INT
GPO0
GPO1
SCLK
MOSI
MISO
GPO
SCLK
DIN
SCLK
DIN
SCLK
MOSI
MISO
Device 1
Device 1
DOUT0
DOUT
DAISY_IN0
Host Processor
Host Processor
START
CLK
DOUT1
START
CLK
DRDY
CS
DRDY
CS
SCLK
DIN
SCLK
DIN
Device 2
Device 2
DOUT
DAISY_IN1
0
a) Standard Configuration
b) Daisy-Chain Configuration
(1) To reduce pin count, set the START pin low and use the START serial command to synchronize and start
conversions.
Figure 70. Multiple Device Configurations
When all devices in the chain operate in the same register setting, DIN can be shared as well. This configuration
reduces the SPI communication signals to four, regardless of the number of devices. The BIAS driver cannot be
shared among the multiple devices and an external clock must be used because the individual devices cannot be
programmed when sharing a common DIN.
Note that from Figure 2, the SCLK rising edge shifts data out of the device on DOUT. The SCLK negative edge
is used to latch data into the device DAISY_IN pin down the chain. This architecture allows for a faster SCLK
rate speed, but also makes the interface sensitive to board-level signal delays. The more devices in the chain,
the more challenging adhering to setup and hold times becomes. A star-pattern connection of SCLK to all
devices, minimizing DOUT length, and other printed circuit board (PCB) layout techniques helps. Placing delay
circuits (such as buffers) between DOUT and DAISY_IN are ways to mitigate this challenge. One other option is
to insert a D flip-flop between DOUT and DAISY_IN clocked on an inverted SCLK. Note also that daisy-chain
mode requires some software overhead to recombine data bits spread across byte boundaries. Figure 71 shows
a timing diagram for this mode.
DOUT1
MSB1
LSB1
DAISY_IN0
SCLK
1
2
3
216
217
218
219
337
MSB0
LSB0
MSB1
LSB1
DOUT
0
Data From Device 1
Data From Device 2
Figure 71. Daisy-Chain Timing
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Application Information (continued)
The maximum number of devices that can be daisy-chained depends on the data rate at which the device is
operated at. The maximum number of devices can be approximately calculated with Equation 10.
fSCLK
NDEVICES
=
fDR (NBITS)(NCHANNELS) + 24
where:
NBITS = device resolution (depending on data rate), and
NCHANNELS = number of channels in the device.
(10)
For example, when the 8-channel ADS1299 is operated at a 2-kSPS data rate with a 4-MHz fSCLK, 10 devices
can be daisy-chained.
10.2 Typical Application
The biopotential signals that are measured in electroencephalography (EEG) are small when compared to other
types of biopotential signals. The ADS1299 is equipped to measure such small signals due to its extremely low
input-referred noise from its high performance internal PGA. Figure 72 and Figure 73 are examples of how the
ADS1299 may be configured in typical EEG measurement setups. Figure 72 shows how to measure electrode
potentials in a sequential montage, whereas Figure 73 illustrates referential montage measurement connections.
+2.5 V
AVDD
RFilt
IN1P
Electrode 1
+
CFilt
ADC
ADC
IN1N
Electrode 2
Electrode 3
Electrode 4
RFilt
RFilt
IN2P
IN2N
+
CFilt
RFilt
.
.
.
.
.
.
.
.
.
BIASP1 BIASN1 BIASP2 BIASN2
BIASINV
220 kꢀ 220 kꢀ 220 kꢀ 220 kꢀ
RF
RP
CF
BIASOUT
Bias
Electrode
+
(AVDD + AVSS)/2
BIASREF_INT
AVSS
-2.5 V
Figure 72. Example Schematic Using the ADS1299 in an EEG Data Acquisition Application, Sequential
Montage
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Typical Application (continued)
+2.5 V
AVDD
RFilt
IN1P
Electrode 1
+
+
+
+
ADC
ADC
RFilt
IN2P
Electrode 2
RFilt
IN3P
Electrode 3
ADC
ADC
RFilt
IN4P
Electrode 4
.
.
.
.
.
.
.
.
.
CFilt CFilt CFilt CFilt
SRB1
SRB1
Reference
Electrode
BIASP1 BIASN1 BIASP2 BIASN2 BIASP3 BIASN3 BIASP4 BIASN4
RFilt
BIASINV
220 kꢀ 220 kꢀ 220 kꢀ 220 kꢀ
220 kꢀ 220 kꢀ 220 kꢀ 220 kꢀ
RF
RP
CF
BIASOUT
Bias
Electrode
+
(AVDD + AVSS)/2
BIASREF_INT
AVSS
-2.5 V
Figure 73. Example Schematic Using the ADS1299 in an EEG Data Acquisition Application, Referential
Montage
10.2.1 Design Requirements
Table 29 shows the design requirements for a typical EEG measurement system.
Table 29. EEG Data Acquisition Design Requirements
DESIGN PARAMETER
Bandwidth
VALUE
1 Hz - 50 Hz
10 μVPk
> 10 MΩ
dc
Minimum signal bandwidth
Input Impedance
Coupling
10.2.2 Detailed Design Procedure
Each channel on the ADS1299 is optimized to measure a separate EEG waveform. The specific connections
depend on the EEG montage. The sequential montage is a configuration where each channel represents the
voltage between two adjacent electrodes. For example, to measure the potential between electrode Fp1 and F7
on channel 1 of the ADS1299, route the Fp1 electrode to IN1P and the F7 electrode to IN1N. The connections
for a sequential montage are illustrated in Figure 72.
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Alternatively, EEG electrodes can be measured in a referential montage in which each of the electrodes is
measured with respect to a single reference electrode. This montage also allows calculation of the waveforms
that would have been measured in a sequential montage by finding the difference between two electrode
waveforms which were measured with respect to the same electrode. The ADS1299 allows for such a
configuration through the use of the SRB1 pin. The SRB1 pin on the ADS1299 may be internally routed to each
channel negative input by setting the SRB1 bit in the MISC1 register. When the reference electrode is connected
to the SRB1 pin and all other electrodes are connected to the respective positive channel inputs, the electrode
voltages can be measured with a referential montage. The referential montage is illustrated in Figure 73. See
Figure 18 for a diagram of the channel input multiplexer options.
The ADS1299 is designed to be an EEG front end such that no additional amplification or buffer stage is needed
between the electrodes and ADS1299. The ADS1299 has a low-noise PGA with excellent input-referred noise
performance. For certain data rate and gain settings, the ADS1299 introduces significantly less than 1 μVRMS of
input-referred noise to the signal chain making the device more than capable of handling the 10-μVPk minimum
signal amplitude. ADS1299 noise performance for different PGA gains and data rate settings is listed in Table 1,
Table 2, Table 3, and Table 4.
Traditional EEG data acquisition systems high-pass filter the signals in the front-end to remove dc signal content.
This topology allows the signal to be amplified by a large gain so the signal can be digitized by a 12- to 16-bit
ADC. The ADS1299 24-bit resolution allows the signal to be dc-coupled to the ADC because small EEG signal
information can be measured in addition to a significant dc offset.
The ADS1299 channel inputs have very low input bias current allowing electrodes to be connected to the inputs
of the ADS1299 with very little leakage current flowing on the patient cables. The ADS1299 has a minimum dc
input impedance of 1 GΩ when the lead-off current sources are disabled and 500 MΩ typically when the lead-off
current sources are enabled.
The passive components RFilt and CFilt form low-pass filters. In general, the filter is advised to be formed by using
a differential capacitor CFIlt that shunts the inputs rather than individual RC filters whose capacitors shunt to
ground. The differential capacitor configuration significantly improves common-mode rejection because this
approach removes dependence on component mismatch.
The cutoff frequency for the filter can be placed well past the data rate of the ADC because of the delta-sigma
ADC filter-then-decimate topology. Take care to prevent aliasing around the first repetition of the digital
decimation filter response at fMOD. Assuming a 2.048-MHz fCLK, fMOD = 1.024 MHz. The value of RFilt has a
minimum set by technical standards for medical electronics. The capacitor value must be set to arrange the
proper cutoff frequency.
If the system is likely to be exposed to high-frequency EMI, adding very small-value, common-mode capacitors to
the inputs is advisable to filter high-frequency common-mode signals. If these capacitors are added, then the
capacitors should be 10 or 20 times smaller than the differential capacitor to ensure their effect of CMRR is
minimized.
The integrated bias amplifier serves two purposes in an EEG data acquisition system with the ADS1299. The
bias amplifier provides a bias voltage that, when applied to the patient, keeps the measurement electrode
common-mode voltage within the rails of the ADS1299. This scenario allows for dc coupling. In addition, the bias
amplifier can be configured to provide negative common-mode feedback to the patient to cancel unwanted
common-mode signals appearing on the electrodes. This feature is especially helpful because biopotential
acquisition systems are notoriously prone to mains-frequency common-mode interference.
The bias amplifier is powered on by setting the PD_BIAS bit in the CONFIG3 register. Set the BIASREF_INT bit
in the CONFIG3 register to input the internally generated analog mid-supply voltage the noninverting input of the
bias amplifier. To enable an electrode as an input to the bias amplifier, set the corresponding bit in the
BIAS_SENSP or BIAS_SENSN register.
The dc gain of the bias amplifier is determined by RBias and the number of channel inputs enabled as inputs to
the bias amplifier. The bias amplifier circuit only passes common-mode signals. Therefore, the 330-kΩ resistors
at each PGA output are in parallel for common-mode signals. The bias amplifier is configured in an inverting gain
scheme. The formula for determining dc gain for common-mode signals input to the bias amplifier is shown in
Equation 11. The capacitor Cf sets the bandwidth for the bias amplifier. Ensure that the amplifier has enough
bandwidth to output all the intended common-mode signals.
Vout
Rf ìN
330kW
= -
V
in
(11)
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Another advantage to a dc-coupled EEG data acquisition system is the ability to detect when an electrode no
longer makes good contact with the patient. The ADS1299 features integrated lead-off detection electronics. The
Lead-Off Detection section explains how to use the lead-off feature on the ADS1299. Note that when configured
in a referential montage, only use one lead-off current source with the reference electrode.
10.2.3 Application Curves
Testing the capability of the ADS1299 to measure signals in the band and near the amplitude of typical EEG
signals can be done with a precision signal generator. The ADS1299 was tested in a configuration like the one
shown in Figure 74.
+2.5 V
AVDD
952 kꢀ
4.99 kꢀ
10.3 kꢀ
INxP
INxN
33 ꢁVRMS
10 Hz
4.7 nF
AVSS
-2.5 V
Figure 74. Example Schematic Using the ADS1299 in an EEG Data Acquisition Application, Referential
Montage
The 952-kΩ and 10.3-kΩ resistors were used to attenuate the voltage from the signal source because the source
could not reach the desired magnitude directly. With the voltage divider, the signal appearing at the inputs was a
3.5-μVRMS, 10-Hz sine wave. Figure 75 shows the input-referred conversion results from the ADS1299 following
calibration for offset. The signal that is measured is similar to some of the smallest extracranial EEG signals that
can be measured with typical EEG acquisition systems. The signal can be clearly identified. Given this
measurement setup was a single-ended configuration without shielding, the measurement setup was subject to
significant mains interference. A digital low-pass filter was applied to remove the interference.
4.5
3.5
2.5
1.5
0.5
-0.5
-1.5
-2.5
-3.5
-4.5
0
0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9
Time (s)
1
D001
Figure 75. ADS1299 10-Hz Input Signal Results
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11 Power Supply Recommendations
The ADS1299-x has three power supplies: AVDD, AVDD1, and DVDD. For best performance, both AVDD and
AVDD1 must be as quiet as possible. AVDD1 provides the supply to the charge pump block and has transients
at fCLK. Therefore, star connect AVDD1 to the AVDD pins and AVSS1 to the AVSS pins. AVDD and AVDD1
noise that is nonsynchronous with the ADS1299-x operation must be eliminated. Bypass each device supply with
10-μF and 0.1-μF solid ceramic capacitors. For best performance, place the digital circuits (DSP,
microcontrollers, FPGAs, and so forth) in the system so that the return currents on those devices do not cross
the analog return path of the device. Power the ADS1299-x from unipolar or bipolar supplies.
Use surface-mount, low-cost, low-profile, multilayer ceramic-type capacitors for decoupling. In most cases, the
VCAP1 capacitor is also a multilayer ceramic; however, in systems where the board is subjected to high- or low-
frequency vibration, install a nonferroelectric capacitor, such as a tantalum or class 1 capacitor (C0G or NPO).
EIA class 2 and class 3 dielectrics such as (X7R, X5R, X8R, and so forth) are ferroelectric. The piezoelectric
property of these capacitors can appear as electrical noise coming from the capacitor. When using internal
reference, noise on the VCAP1 node results in performance degradation.
11.1 Power-Up Sequencing
Before device power up, all digital and analog inputs must be low. At the time of power up, keep all of these
signals low until the power supplies have stabilized, as shown in Figure 76.
Allow time for the supply voltages to reach their final value, and then begin supplying the master clock signal to
the CLK pin. Wait for time tPOR, then transmit a reset pulse using either the RESET pin or RESET command to
initialize the digital portion of the chip. Issue the reset after tPOR or after the VCAP1 voltage is greater than 1.1 V,
whichever time is longer. Note that:
•
•
tPOR is described in Table 30.
The VCAP1 pin charge time is set by the RC time constant set by the capacitor value on VCAP1; see
Figure 25.
After releasing the RESET pin, program the configuration registers. The power-up sequence timing is shown in
Table 30.
(1)(2)
tPOR
Supplies
(1)
tBG
1.1V
VCAP1
VCAP = 1.1V
Start using
device
18 × tCLK
RESET
tRST
(1) Timing to reset pulse is tPOR or after tBG, whichever is longer.
(2) When using an external clock, tPOR timing does not start until CLK is present and valid.
Figure 76. Power-Up Timing Diagram
Table 30. Timing Requirements for Figure 76
MIN
218
2
MAX
UNIT
tCLK
tPOR
tRST
Wait after power up until reset
Reset low duration
tCLK
11.2 Connecting the Device to Unipolar (5 V and 3.3 V) Supplies
Figure 77 illustrates the ADS1299-x connected to a unipolar supply. In this example, analog supply (AVDD) is
referenced to analog ground (AVSS) and digital supply (DVDD) is referenced to digital ground (DGND).
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Connecting the Device to Unipolar (5 V and 3.3 V) Supplies (continued)
+5 V
+3.3 V
0.1 mF
1 mF
1 mF
0.1 mF
AVDD AVDD1 DVDD
VREFP
VREFN
0.1 mF
10 mF
VCAP1
VCAP2
VCAP3
VCAP4
RESV1
Device
1 mF
1 mF
0.1 mF
1 mF
100 mF
AVSS1 AVSS DGND
NOTE: Place the capacitors for supply, reference, and VCAP1 to VCAP4 as close to the package as possible.
Figure 77. Single-Supply Operation
11.3 Connecting the Device to Bipolar (±2.5 V and 3.3 V) Supplies
Figure 78 shows the ADS1299-x connected to a bipolar supply. In this example, the analog supplies connect to
the device analog supply (AVDD). This supply is referenced to the device analog return (AVSS), and the digital
supply (DVDD) is referenced to the device digital ground return (DGND).
+2.5 V
+3.3 V
1 mF
0.1 mF
0.1 mF
1 mF
AVDD AVDD1 DVDD
VREFP
0.1 mF
10 mF
VREFN
-2.5 V
VCAP1
VCAP2
VCAP3
VCAP4
Device
RESV1
AVSS1 AVSS DGND
1 mF
0.1 mF
1 mF
100 mF
1 mF
1 mF
0.1 mF
-2.5 V
NOTE: Place the capacitors for supply, reference, and VCAP1 to VCAP4 as close to the package as possible.
Figure 78. Bipolar Supply Operation
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12 Layout
12.1 Layout Guidelines
TI recommends employing best design practices when laying out a printed-circuit board (PCB) for both analog
and digital components. This recommendation generally means that the layout separates analog components
[such as ADCs, amplifiers, references, digital-to-analog converters (DACs), and analog MUXs] from digital
components [such as microcontrollers, complex programmable logic devices (CPLDs), field-programmable gate
arrays (FPGAs), radio frequency (RF) transceivers, universal serial bus (USB) transceivers, and switching
regulators]. An example of good component placement is shown in Figure 79. Although Figure 79 provides a
good example of component placement, the best placement for each application is unique to the geometries,
components, and PCB fabrication capabilities employed. That is, there is no single layout that is perfect for every
design and careful consideration must always be used when designing with any analog component.
Ground Fill or
Ground Plane
Ground Fill or
Ground Plane
Supply
Generation
Signal
Conditioning
(RC Filters
and
Interface
Transceiver
Device
Microcontroller
Connector
or Antenna
Amplifiers)
Ground Fill or
Ground Plane
Ground Fill or
Ground Plane
Figure 79. System Component Placement
The following outlines some basic recommendations for the layout of the ADS1299-x to get the best possible
performance of the ADC. A good design can be ruined with a bad circuit layout.
•
Separate analog and digital signals. To start, partition the board into analog and digital sections where the
layout permits. Route digital lines away from analog lines. This configuration prevents digital noise from
coupling back into analog signals.
•
The ground plane can be split into an analog plane (AGND) and digital plane (DGND), but is not necessary.
Place digital signals over the digital plane, and analog signals over the analog plane. As a final step in the
layout, the split between the analog and digital grounds must be connected together at the ADC.
•
•
Fill void areas on signal layers with ground fill.
Provide good ground return paths. Signal return currents flow on the path of least impedance. If the ground
plane is cut or has other traces that block the current from flowing right next to the signal trace, then the
current must find another path to return to the source and complete the circuit. If current is forced into a
longer path, the chances that the signal radiates increases. Sensitive signals are more susceptible to EMI
interference.
•
•
Use bypass capacitors on supplies to reduce high-frequency noise. Do not place vias between bypass
capacitors and the active device. Placing the bypass capacitors on the same layer as close to the active
device yields the best results.
Analog inputs with differential connections must have a capacitor placed differentially across the inputs. The
differential capacitors must be of high quality. The best ceramic chip capacitors are C0G (NPO), which have
stable properties and low noise characteristics.
12.2 Layout Example
Figure 80 is an example layout of the ADS1299 requiring a minimum of two PCB layers. The example circuit is
shown for either a single analog supply or a bipolar-supply connection. In this example, polygon pours are used
as supply connections around the device. If a three- or four-layer PCB is used, the additional inner layers can be
dedicated to route power traces. The PCB is partitioned with analog signals routed from the left, digital signals
routed to the right, and power routed above and below the device.
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Layout Example (continued)
Via to AVSS pour
or plane
Via to digital ground
pour or plane
1: IN8N
2: IN8P
48: DVDD
47: DRDY
3: IN7N
4: IN7P
5: IN6N
6: IN6P
46: GPIO4
45: GPIO3
44: GPIO2
43: DOUT
Input filtered with
differential capacitors
7: IN5N
8: IN5P
42: GPIO1
41: DAISY_
IN
!5{1299
9: IN4N
40: SCLK
39: CS
10: IN4P
11: IN3N
12: IN3P
13: IN2N
14: IN2P
15: IN1N
16: IN1P
38: START
37: CLK
36: RESET
35:PWDN
34: DIN
33: DGND
Long digital input lines
terminated with resistors
to prevent reflection
Reference, VCAP, and
power supply decoupling
capacitors close to pins
Figure 80. ADS1299 Example Layout
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13 器件和文档支持
13.1 文档支持
13.1.1 相关文档ꢀ
相关文档如下:
•
•
•
•
ADS129x 用于生理信号测量的低功耗、8 通道、24 位模拟前端
《REF50xx 低噪声、极低漂移、高精度电压基准》
使用右腿驱动放大器改进共模抑制
《ADS1299EEG-FE EEG 前端性能演示套件》
13.2 相关链接
以下表格列出了快速访问链接。范围包括技术文档、支持与社区资源、工具和软件,并且可通过快速访问立刻订
购。
表 31. 相关链接
器件
产品文件夹
请单击此处
请单击此处
请单击此处
立即订购
请单击此处
请单击此处
请单击此处
技术文档
请单击此处
请单击此处
请单击此处
工具与软件
请单击此处
请单击此处
请单击此处
支持与社区
请单击此处
请单击此处
请单击此处
ADS1299
ADS1299-4
ADS1299-6
13.3 接收文档更新通知
如需接收文档更新通知,请访问 www.ti.com.cn 网站上的器件产品文件夹。点击右上角的提醒我 (Alert me) 注册
后,即可每周定期收到已更改的产品信息。有关更改的详细信息,请查阅已修订文档中包含的修订历史记录。
13.4 社区资源
The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective
contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of
Use.
TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration
among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help
solve problems with fellow engineers.
Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and
contact information for technical support.
13.5 商标
E2E is a trademark of Texas Instruments.
All other trademarks are the property of their respective owners.
13.6 静电放电警告
ESD 可能会损坏该集成电路。德州仪器 (TI) 建议通过适当的预防措施处理所有集成电路。如果不遵守正确的处理措施和安装程序 , 可
能会损坏集成电路。
ESD 的损坏小至导致微小的性能降级 , 大至整个器件故障。 精密的集成电路可能更容易受到损坏 , 这是因为非常细微的参数更改都可
能会导致器件与其发布的规格不相符。
13.7 Glossary
SLYZ022 — TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.
74
版权 © 2012–2017, Texas Instruments Incorporated
ADS1299, ADS1299-4, ADS1299-6
www.ti.com.cn
ZHCS158C –JULY 2012–REVISED JANUARY 2017
14 机械、封装和可订购信息
以下页中包括机械、封装和可订购信息。这些信息是针对指定器件可提供的最新数据。这些数据会在无通知且不对
本文档进行修订的情况下发生改变。欲获得该数据表的浏览器版本,请查阅左侧的导航栏。
版权 © 2012–2017, Texas Instruments Incorporated
75
PACKAGE OPTION ADDENDUM
www.ti.com
10-Dec-2020
PACKAGING INFORMATION
Orderable Device
Status Package Type Package Pins Package
Eco Plan
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
Device Marking
Samples
Drawing
Qty
(1)
(2)
(3)
(4/5)
(6)
ADS1299-4PAG
ADS1299-4PAGR
ADS1299-6PAG
ADS1299-6PAGR
ADS1299IPAG
ACTIVE
ACTIVE
ACTIVE
ACTIVE
ACTIVE
ACTIVE
TQFP
TQFP
TQFP
TQFP
TQFP
TQFP
PAG
PAG
PAG
PAG
PAG
PAG
64
64
64
64
64
64
160
RoHS & Green
NIPDAU
Level-3-260C-168 HR
Level-3-260C-168 HR
Level-3-260C-168 HR
Level-3-260C-168 HR
Level-3-260C-168 HR
Level-3-260C-168 HR
-40 to 85
-40 to 85
-40 to 85
-40 to 85
-40 to 85
-40 to 85
ADS1299-4
1500 RoHS & Green
160 RoHS & Green
1500 RoHS & Green
160 RoHS & Green
1500 RoHS & Green
NIPDAU
NIPDAU
NIPDAU
NIPDAU
NIPDAU
ADS1299-4
ADS1299-6
ADS1299-6
ADS1299
ADS1299IPAGR
ADS1299
(1) The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based
flame retardants must also meet the <=1000ppm threshold requirement.
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6)
Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two
lines if the finish value exceeds the maximum column width.
Addendum-Page 1
PACKAGE OPTION ADDENDUM
www.ti.com
10-Dec-2020
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
Addendum-Page 2
PACKAGE MATERIALS INFORMATION
www.ti.com
5-Oct-2022
TAPE AND REEL INFORMATION
REEL DIMENSIONS
TAPE DIMENSIONS
K0
P1
W
B0
Reel
Diameter
Cavity
A0
A0 Dimension designed to accommodate the component width
B0 Dimension designed to accommodate the component length
K0 Dimension designed to accommodate the component thickness
Overall width of the carrier tape
W
P1 Pitch between successive cavity centers
Reel Width (W1)
QUADRANT ASSIGNMENTS FOR PIN 1 ORIENTATION IN TAPE
Sprocket Holes
Q1 Q2
Q3 Q4
Q1 Q2
Q3 Q4
User Direction of Feed
Pocket Quadrants
*All dimensions are nominal
Device
Package Package Pins
Type Drawing
SPQ
Reel
Reel
A0
B0
K0
P1
W
Pin1
Diameter Width (mm) (mm) (mm) (mm) (mm) Quadrant
(mm) W1 (mm)
ADS1299-4PAGR
ADS1299-6PAGR
ADS1299IPAGR
TQFP
TQFP
TQFP
PAG
PAG
PAG
64
64
64
1500
1500
1500
330.0
330.0
330.0
24.4
24.4
24.4
13.0
13.0
13.0
13.0
13.0
13.0
1.5
1.5
1.5
16.0
16.0
16.0
24.0
24.0
24.0
Q2
Q2
Q2
Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com
5-Oct-2022
TAPE AND REEL BOX DIMENSIONS
Width (mm)
H
W
L
*All dimensions are nominal
Device
Package Type Package Drawing Pins
SPQ
Length (mm) Width (mm) Height (mm)
ADS1299-4PAGR
ADS1299-6PAGR
ADS1299IPAGR
TQFP
TQFP
TQFP
PAG
PAG
PAG
64
64
64
1500
1500
1500
350.0
350.0
350.0
350.0
350.0
350.0
43.0
43.0
43.0
Pack Materials-Page 2
PACKAGE MATERIALS INFORMATION
www.ti.com
5-Oct-2022
TRAY
L - Outer tray length without tabs
KO -
Outer
tray
height
W -
Outer
tray
width
Text
P1 - Tray unit pocket pitch
CW - Measurement for tray edge (Y direction) to corner pocket center
CL - Measurement for tray edge (X direction) to corner pocket center
Chamfer on Tray corner indicates Pin 1 orientation of packed units.
*All dimensions are nominal
Device
Package Package Pins SPQ Unit array
Max
matrix temperature
(°C)
L (mm)
W
K0
P1
CL
CW
Name
Type
(mm) (µm) (mm) (mm) (mm)
ADS1299-4PAG
ADS1299-6PAG
ADS1299IPAG
PAG
PAG
PAG
TQFP
TQFP
TQFP
64
64
64
160
160
160
8 x 20
8 x 20
8 x 20
150
150
150
315 135.9 7620 15.2
315 135.9 7620 15.2
315 135.9 7620 15.2
13.1
13.1
13.1
13
13
13
Pack Materials-Page 3
MECHANICAL DATA
MTQF006A – JANUARY 1995 – REVISED DECEMBER 1996
PAG (S-PQFP-G64)
PLASTIC QUAD FLATPACK
0,27
0,17
0,50
48
M
0,08
33
49
32
64
17
0,13 NOM
1
16
7,50 TYP
Gage Plane
10,20
SQ
9,80
0,25
12,20
SQ
0,05 MIN
11,80
0°–7°
1,05
0,95
0,75
0,45
Seating Plane
0,08
1,20 MAX
4040282/C 11/96
NOTES: A. All linear dimensions are in millimeters.
B. This drawing is subject to change without notice.
C. Falls within JEDEC MS-026
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
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