AWR1443FQIGABLRQ1 [TI]
集成 MCU 和硬件加速器的单芯片 76GHz 至 81GHz 汽车雷达传感器 | ABL | 161 | -40 to 125;型号: | AWR1443FQIGABLRQ1 |
厂家: | TEXAS INSTRUMENTS |
描述: | 集成 MCU 和硬件加速器的单芯片 76GHz 至 81GHz 汽车雷达传感器 | ABL | 161 | -40 to 125 雷达 传感器 |
文件: | 总76页 (文件大小:2554K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
AWR1443
ZHCSHS2C – MAY 2017 – REVISED JANUARY 2022
AWR1443 单芯片 77GHz 和 79GHz FMCW 雷达传感器
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•
高速数据接口,可支持分布式应用(即中间数据)
主机接口
1 特性
•
FMCW 收发器
– 通过 SPI 与外部处理器进行控制连接
– 用于故障报告的中断
符合 AECQ-100 标准
– 集成 PLL、发送器、接收器、基带和 ADC
– 76GHz 至 81GHz 的覆盖范围,具有 4GHz 的可
用带宽
•
•
器件高级特性
– 四个接收通道
– 嵌入式自监控,无需使用主机处理器
– 三个发送通道(可以同时使用两个通道)
– 基于分数 N PLL 的超精确线性调频脉冲引擎
– TX 功率:12dBm
– 复基带架构
– 嵌入式干扰检测功能
电源管理
•
•
– RX 噪声系数:
– 内置 LDO 网络,可增强 PSRR
– I/O 支持双电压 3.3V/1.8V
时钟源
•
•
14dB(76 至 77GHz)
15dB(77 至 81GHz)
– 1MHz 时的相位噪声:
– 支持外部驱动、频率为 40MHz 的时钟(方波/正
•
•
–95dBc/Hz(76 至 77GHz)
弦波)
–93dBc/Hz(77 至 81GHz)
– 支持 40MHz 晶体与负载电容器相连接
轻松的硬件设计
•
•
内置校准和自检
•
•
®
–
基于 Arm® Cortex®-R4F 的无线电控制系统
– 0.65mm 间距、161 引脚 10.4mm × 10.4mm 覆
晶 BGA 封装,可实现轻松组装和低成本 PCB
设计
– 小尺寸解决方案
运行条件
– 内置固件 (ROM)
– 针对工艺和温度进行自校准的系统
适用于嵌入式用户应用的片上可编程内核
– 时钟频率为 200MHz 的集成 Cortex®-R4F 微控
制器
– 结温范围:–40°C 至 125°C
– 片上引导加载程序支持自主模式(从 QSPI 闪存
加载用户应用)
– 集成外设
•
•
•
具有 ECC 的内部存储器
雷达硬件加速器(FFT、对数幅度计算等)
集成计时器(看门狗以及多达四个 32 位计时
器或两个 64 位计时器)
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•
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I2C(支持控制器模式和目标模式)
两个 SPI 端口
CAN 端口
多达六个通用 ADC 端口
本文档旨在为方便起见,提供有关 TI 产品中文版本的信息,以确认产品的概要。有关适用的官方英文版本的最新信息,请访问
www.ti.com,其内容始终优先。TI 不保证翻译的准确性和有效性。在实际设计之前,请务必参考最新版本的英文版本。
English Data Sheet: SWRS202
AWR1443
www.ti.com.cn
ZHCSHS2C – MAY 2017 – REVISED JANUARY 2022
•
•
手势识别
车门开启器应用
2 应用
•
•
•
接近传感
泊车辅助
占位检测
Crystal
Power Management
RX1
RX2
Antenna
Structure
SPI/I2C
RX3
RX4
External
MCU
Interface to
External
Peripherals
mmWave Sensor
CSI2 (4 Lane Data + 1 Clock lane)
TX1
TX2
Reset
Error
TX3
MCU Clock
图 2-1. 适用于汽车应用的自主雷达传感器
3 说明
AWR1443 器件是一款能够在 76 至 81GHz 频带中运行的集成式单芯片 FMCW 雷达传感器。该器件采用 TI 的低
功耗 45nm RFCMOS 工艺构建,具有一个集成式 ARM R4F 处理器和一个硬件加速器,用于进行雷达数据处理,
该解决方案在极小的封装中实现了出色的集成度。AWR1443 是适用于汽车领域中的低功耗、自监控、超精确雷达
系统的理想解决方案。
AWR1443 器件是一种自包含 FMCW 雷达传感器单芯片解决方案,能够简化 76 至 81GHz 频带中的汽车雷达传感
器实施。它实现了一个具有内置 PLL 和 ADC 转换器的单片实施 3TX、4RX 系统。简单编程模型更改可支持各种
传感器实施(近距离、中距离和远距离),并且能够进行动态重新配置,从而实现多模式传感器。此外,该器件
作为完整的平台解决方案进行提供,其中包括 TI 参考设计、软件驱动程序、示例配置、API 指南以及用户文档。
不同的应用在雷达数据立方体存储器、处理能力和功能安全监控方面,对雷达器件的要求各不相同。因此,可以
将 AWR1443 视为适用于入门级雷达应用的 77GHz 片上雷达解决方案
器件信息
器件型号(2)
AWR1443FQIGABLQ1
AWR1443FQIGABLRQ1
封装(1)
封装尺寸
托盘/卷带包装
托盘
FCBGA (161)
10.4mm × 10.4mm
卷带包装
(1) 如需更多信息,请参阅节 12 机械、封装和可订购信息。
(2) 如需更多信息,请参阅节 11.1,器件命名规则。
Copyright © 2023 Texas Instruments Incorporated
English Data Sheet: SWRS202
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4 功能方框图
图 4-1 展示了器件的功能方框图
Cortex R4F
@ 200 MHz
RX1
RX2
RX3
RX4
LNA
LNA
LNA
LNA
IF
IF
IF
IF
ADC
ADC
ADC
ADC
(User programmable)
Digital Front
End
Boot
ROM
Prog RAM* Data RAM*
(Decimation
filter chain)
Serial Flash
interface
QSPI
SPI
Radar Data
Memory*
Optional External
MCU interface
ADC
Buffer
TX1
TX2
TX3
PA
Radar
Hardware
Accelerator
(FFT, Log-
Mag, and
others.)
PMIC control
SPI / I2C
DCAN
Synth
(20 GHz)
Ramp
Generator
PA
PA
x4
Primary communication
interface (automotive)
Debug
UARTs
DMA
For debug
RF Control/
BIST
Mailbox
Test/
Debug
JTAG for debug/
development
Osc.
VMON
Temp
GPADC
Main subsystem
(Customer programmed)
RF/Analog subsystem
* Total RAM available in Main subsystem is 576KB (for Cortex-R4F Program RAM, Data RAM, and Radar Data Memory)
Copyright © 2017, Texas Instruments Incorporated
图 4-1. 功能方框图
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English Data Sheet: SWRS202
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ZHCSHS2C – MAY 2017 – REVISED JANUARY 2022
Table of Contents
1 特性................................................................................... 1
2 应用................................................................................... 2
3 说明................................................................................... 2
4 功能方框图.........................................................................3
5 Revision History.............................................................. 5
6 Device Comparison.........................................................6
6.1 Related Products........................................................ 7
7 Terminal Configuration and Functions..........................8
7.1 Pin Diagram................................................................ 8
7.2 Signal Descriptions................................................... 13
7.3 Pin Multiplexing.........................................................17
8 Specifications................................................................ 22
8.1 Absolute Maximum Ratings...................................... 22
8.2 ESD Ratings............................................................. 22
8.3 Power-On Hours (POH)............................................23
8.4 Recommended Operating Conditions.......................23
8.5 Power Supply Specifications.....................................24
8.6 Power Consumption Summary................................. 25
8.7 RF Specification........................................................26
8.8 Thermal Resistance Characteristics for FCBGA
9.1 Overview...................................................................49
9.2 Functional Block Diagram.........................................49
9.3 External Interfaces....................................................50
9.4 Subsystems.............................................................. 51
9.5 Accelerators and Coprocessors................................57
9.6 Other Subsystems.................................................... 57
9.7 Boot Modes...............................................................58
10 Applications, Implementation, and Layout............... 62
10.1 Application Information........................................... 62
10.2 Short-Range Radar ................................................62
10.3 Blind Spot Detector and Ultrasonic Upgrades........ 63
10.4 Reference Schematic..............................................64
11 Device and Documentation Support..........................65
11.1 Device Nomenclature..............................................65
11.2 Tools and Software..................................................66
11.3 Documentation Support.......................................... 66
11.4 支持资源..................................................................66
11.5 Trademarks............................................................. 67
11.6 静电放电警告...........................................................67
11.7 术语表..................................................................... 67
12 Mechanical, Packaging, and Orderable
Package [ABL0161].....................................................27
8.9 Timing and Switching Characteristics....................... 27
9 Detailed Description......................................................49
Information.................................................................... 68
12.1 Packaging Information............................................ 68
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5 Revision History
Changes from April 30, 2020 to January 10, 2022 (from Revision B (April 2020) to Revision C
(January 2022))
Page
•
通篇:将“A2D”替换为“ADC”;将“主子系统”和“主 R4F”更改为“主要子系统”和“主要 R4F”;在主/从术语方面改
用了更具包容性的措辞 .......................................................................................................................................1
(特性):提及了毫米波传感器的额定工作温度范围;..................................................................................... 1
(特性):将 1MHz 时的相位噪声从“–94dBc/Hz(76GHz 至 77GHz)”更新/更改为“-95dBc/Hz”,并从“–
91dBc/Hz(77GHz 至 81GHz)”更新/更改为“–93dBc/Hz”.................................................................................1
(应用):添加了图示........................................................................................................................................2
更新/更改了“功能方框图”以改用包容性术语....................................................................................................... 3
(Device Comparison): Removed a row on Functional-Safety compliance; Added a table-note for LVDS
Interface; Additional information on Device security updated.............................................................................6
(Signal Descriptions): Updated descriptions for CLKP and CLKM pins for Reference Oscillator.....................13
(Absolute Maximum Ratings): Added entries for externally supplied power on the RF inputs (TX and RX) and
a table-note for the signal level applied on TX..................................................................................................22
(Average Power Consumption at Power Terminals): Added measurement conditions for the specified power
numbers............................................................................................................................................................25
(Maximum Current Rating at Power Terminals): Updated footnotes section to add estimation assumption for
VIOIN rail.......................................................................................................................................................... 25
(Synchronized Frame Triggering): Updated the maximum pulse width to 4000ns........................................... 28
(Clock Specifications): Updated/Changed 表 8-6 to reflect correct device operating temperature range........ 30
(Table. External Clock Mode Specifications): Revised frequency tolerance specs from +/-50 to +/-100 ppm..30
(Reference Schematics) : Added weblinks to device EVM documentation collateral ......................................64
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English Data Sheet: SWRS202
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ZHCSHS2C – MAY 2017 – REVISED JANUARY 2022
6 Device Comparison
FUNCTION
AWR1243
AWR1443
AWR1642
AWR1843
Number of receivers
Number of transmitters
On-chip memory
4
3
4
3
4
2
4
3
—
576KB
5
1.5MB
5
2MB
10
Max I/F (Intermediate Frequency) (MHz)
Max real/complex 2x sampling rate (Msps)
Max complex 1x sampling rate (Msps)
Device Security(1)
15
37.5
18.75
—
12.5
6.25
—
12.5
6.25
Yes
25
12.5
Yes
Processor
MCU (R4F)
—
—
Yes
—
Yes
Yes
Yes
Yes
DSP (C674x)
Peripherals
Serial Peripheral Interface (SPI) ports
Quad Serial Peripheral Interface (QSPI)
Inter-Integrated Circuit (I2C) interface
Controller Area Network (DCAN) interface
CAN-FD
1
—
—
—
—
—
—
—
—
Yes
Yes
—
Yes
—
—
2
1
2
2
Yes
1
Yes
1
Yes
1
Yes
—
Yes
Yes
Yes
Yes
Yes
Yes
Yes
—
Yes
Yes
Yes
Yes
Yes
Yes
Yes
—
Trace
—
PWM
—
Hardware In Loop (HIL/DMM)
—
GPADC
Yes
Yes
—
LVDS/Debug(2)
CSI2
Hardware accelerator
1-V bypass mode
Yes
Yes
—
—
Yes
Yes
—
Yes
—
Cascade (20-GHz sync)
JTAG
Yes
2
Yes
2
Yes
3(3)
Yes
Number of Tx that can be simultaneously used
Per chirp configurable Tx phase shifter
—
—
—
PRODUCT PREVIEW (PP),
Product
ADVANCE INFORMATION (AI),
status(4)
PD
PD
PD
PD
or PRODUCTION DATA (PD)
(1) Device security features including Secure Boot and Customer Programmable Keys are available in select devices for only select part
variants as indicated by the Device Type identifier in Section 3, Device Information table.
(2) The LVDS interface is not a production interface and is only used for debug.
(3) 3 Tx Simultaneous operation is supported only in AWR1843 with 1V LDO bypass and PA LDO disable mode. In this mode 1V supply
needs to be fed on the VOUT PA pin. Rest of the other devices only support simultaneous operation of 2 Transmitters.
(4) PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not necessarily include testing of all parameters.
Copyright © 2023 Texas Instruments Incorporated
English Data Sheet: SWRS202
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6.1 Related Products
For information about other devices in this family of products or related products see the links that follow.
mmWave sensors
TI’s mmWave sensors rapidly and accurately sense range, angle and velocity with
less power using the smallest footprint mmWave sensor portfolio for automotive
applications.
Automotive mmWave TI’s automotive mmWave sensor portfolio offers high-performance radar front end to
sensors
ultra-high resolution, small and low-power single-chip radar solutions. TI’s scalable
sensor portfolio enables design and development of ADAS system solution for every
performance, application and sensor configuration ranging from comfort functions to
safety functions in all vehicles.
Companion products Review products that are frequently purchased or used in conjunction with this product.
for AWR1443
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7 Terminal Configuration and Functions
7.1 Pin Diagram
图 7-1 shows the pin locations for the 161-pin FCBGA package. 图 7-2, 图 7-3, 图 7-4, and 图 7-5 show the
same pins, but split into four quadrants.
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
VOUT
_14APLL
VOUT
_14SYNTH
OSC
_CLKOUT
A
B
C
D
E
F
VSSA
VOUT_PA
VSSA
VSSA
VSSA
VSSA
VSSA
VIN
_18CLK
VIN
_18VCO
RESERVED
RESERVED
VOUT_PA
VSSA
VSSA
TX1
VSSA
VSSA
TX2
VSSA
VSSA
TX3
VSSA
VSSA
VBGAP
VSSA
VSSA
VIN
_13RF2
ANAMUX/
GPADC5
VSENSE/
GPADC6
VSSA
VSSA
VSSA
VSSA
VSSA
VIN
_13RF2
VIOIN
_18DIFF
RESERVED
RESERVED
VSSA
VSSA
VSSA
VSSA
VSSA
VSSA
RX4
VSSA
VSSA
VSSA
VSSA
VSSA
VSSA
VSSA
VSSA
VSSA
VSS
VSS
VSS
VSS
VSS
VSS
VSSA
VDDIN
Reserved
TDI
CLKP
CLKM
VSSA
VIN_18BB
VSS
VSS
VSS
LVDS_
TXP[0]
LVDS_
TXM[0]
VIN
_13RF1
G
H
J
VSSA
RX3
VSS
VSS
VSS
VSS
VSS
VSS
VSS
VIN
_13RF1
LVDS
_TXM[1]
LVDS
_TXP[1]
VSS
VIN
_13RF1
VSSA
RX2
VSS
VSS
VSS
VSS
VSS
VSS
VSS
TDO
LVDS_CLKM LVDS_CLKP
HS_
RESERVED
_TXM[2]
HS_
RESERVED
_TXP[2]
K
L
VIN_18BB
VSS
VIOIN_18
HS_
HS_
RESERVED
_TXP[3]
RESERVED
_TXM[3]
VSSA
RX1
VSS
VSS
TMS
LVDS_
FRCLKP
LVDS_
FRCLKM
M
N
P
R
TCK
HS_
HS_P_
Debug2_M
WARM
_RESET
VSSA
GPIO[0]
Reserved
Reserved
RS232_RX
RS232_TX
GPIO[1]
NERROR_OUTMCU_CLK_OUT
Sync_in
QSPI[3]
VDDIN
Sync_out
QSPI[0]
GPIO[2]
Debug2_M
Analog Test 1/ Analog Test 2/ Analog Test 3/
GPADC3
MISO_1 SPI_HOST_INTR_NERROR_IN
QSPI_CS
MOSI_1
QSPI[1]
NRESET PMIC_CLK_OUT
VNWA
VDDIN
GPADC1
GPADC2
Analog Test 4/
GPADC4
VSSA
Reserved
Reserved
VDDIN
SPI_CS_1
SPI_CLK_1
QSPI_CLK
QSPI[2]
VIOIN
VIN_SRAM
VSS
Not to scale
Copyright © 2017, Texas Instruments Incorporated
图 7-1. Pin Diagram
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English Data Sheet: SWRS202
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1
2
3
4
5
6
7
8
A
B
C
D
E
F
VSSA
VOUT_PA
VSSA
VSSA
VSSA
RESERVED
VOUT_PA
VSSA
VSSA
TX1
VSSA
VSSA
TX2
VSSA
VSSA
TX3
VIN
VSSA
VSSA
VSSA
VSSA
_13RF2
VIN
RESERVED
_13RF2
VSSA
VSSA
VSSA
VSSA
VSSA
VSS
VSS
VSS
RX4
VIN_18BB
VIN
VSS
G
VSSA
VSSA
VSS
VSS
_13RF1
Not to scale
1
2
4
3
图 7-2. Top Left Quadrant
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9
10
11
12
13
14
15
VOUT
_14APLL
VOUT
_14SYNTH
OSC
_CLKOUT
A
B
C
D
E
F
VSSA
VSSA
VSSA
VSSA
VIN
_18CLK
VIN
_18VCO
RESERVED
VBGAP
VSSA
VSSA
ANAMUX/
GPADC5
VSENSE/
GPADC6
VSSA
VIOIN
_18DIFF
RESERVED
VSS
VSS
VSS
VSSA
VDDIN
CLKP
CLKM
VSSA
VSS
LVDS_
TXM[0]
LVDS
_TXP[0]
G
VSS
Reserved
Not to scale
1
3
2
4
Copyright © 2017, Texas Instruments Incorporated
图 7-3. Top Right Quadrant
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English Data Sheet: SWRS202
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1
2
3
4
5
6
7
8
VIN
_13RF1
H
RX3
VSSA
VSS
VIN
_13RF1
J
VSSA
VSSA
RX2
VSSA
VSSA
VSSA
VSSA
VSSA
VSS
VSS
VSS
VSS
VSS
VSS
K
L
VIN_18BB
VSSA
VSSA
RX1
VSS
VSS
M
N
P
R
VSSA
VSSA
GPIO[0]
Reserved
Reserved
RS232_RX
MISO_1
RS232_TX
GPIO[1]
NERROR_IN
SPI_CS_1
NERROR_OUT
Analog Test 1/ Analog Test 2/ Analog Test 3/
GPADC3
SPI_HOST
_INTR_1
QSPI_CS
GPADC1
GPADC2
Analog Test 4/
GPADC4
VSSA
Reserved
Reserved
VDDIN
MOSI_1
Not to scale
1
3
2
4
Copyright © 2017, Texas Instruments Incorporated
图 7-4. Bottom Left Quadrant
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9
10
11
12
13
14
15
LVDS
LVDS
H
J
VSS
VSS
TDI
_TXM[1]
_TXP[1]
VSS
VSS
VSS
TDO
VIOIN_18
TMS
LVDS_CLKM
LVDS_CLKP
HS_RESERVED HS_RESERVED
_TXM[2] TXP[2]
K
L
VSS
VSS
_
HS_RESERVED HS_RESERVED
_TXM[3]
_TXP[3]
LVDS_
LVDS_
M
N
P
R
TCK
FRCLKM
FRCLKP
WARM
HS_
HS_
MCU_CLK_OUT
Sync_in
QSPI[3]
VDDIN
Sync_out
QSPI[0]
GPIO[2]
PMIC_CLK_OUT
VIOIN
_RESET
_Debug2_M
_Debug2_P
QSPI[1]
NRESET
VNWA
VDDIN
SPI_CLK_1
QSPI_CLK
QSPI[2]
VIN_SRAM
VSS
Not to scale
1
3
2
4
图 7-5. Bottom Right Quadrant
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7.2 Signal Descriptions
备注
All digital IO pins of the device (except NERROR IN, NERROR_OUT, and WARM_RESET) are
non-failsafe; hence, care needs to be taken that they are not driven externally without the VIO supply
being present to the device.
备注
The GPIO state during the power supply ramp is not ensured. In case the GPIO is used in the
application where the state of the GPIO is critical, even when NRESET is low, a tri-state buffer should
be used to isolate the GPIO output from the radar device and a pull resister used to define the
required state in the application. The NRESET signal to the radar device could be used to control the
output enable (OE) of the tri-state buffer.
7.2.1 Signal Descriptions
PIN
PIN
DEFAULT PULL
STATUS(1)
FUNCTION
SIGNAL NAME
DESCRIPTION
NUMBER TYPE
TX1
B4
B6
O
O
O
I
—
—
—
—
—
—
—
—
—
—
—
—
—
Single-ended transmitter1 o/p
Single-ended transmitter2 o/p
Single-ended transmitter3 o/p
Single-ended receiver1 i/p
Single-ended receiver2 i/p
Single-ended receiver3 i/p
Single-ended receiver4 i/p
Transmitters
TX2
TX3
B8
RX1
M2
K2
RX2
I
Receivers
RX3
H2
I
RX4
F2
I
LVDS_TXP[0]
LVDS_TXM[0]
LVDS_CLKP
LVDS_CLKM
LVDS_TXP[1]
LVDS_TXM[1]
G15
G14
J15
J14
H15
H14
O
O
O
O
O
O
Differential data Out – Lane 0
Differential clock Out
Differential data Out – Lane 1
HS_RESERVED_TX
P[2]
K15
K14
L15
L14
O
O
O
O
—
—
—
—
Differential data Out – Lane 2
Differential data Out – Lane 3
HS_RESERVED_TX
M[2]
LVDS TX
HS_RESERVED_TX
P[3]
HS_RESERVED_TX
M[3]
LVDS_FRCLKP
LVDS_FRCLKM
HS_DEBUG2_P
HS_DEBUG2_M
M15
M14
N15
N14
O
O
O
O
—
—
—
—
Differential debug port 1
Differential debug port 2
B1, B15, D1,
D15
RESERVED
—
—
Reference clock output from clocking subsystem
after cleanup PLL. Can be used by peripheral chip
in multichip cascading
Reference clock OSC_CLKOUT
A14
O
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PIN
PIN
DEFAULT PULL
STATUS(1)
FUNCTION
SIGNAL NAME
DESCRIPTION
NUMBER TYPE
Low-frequency frame synchronization signal output.
Can be used by peripheral chip in multichip
cascading
SYNC_OUT
P11
N10
O
I
Pull Down
Pull Down
System
synchronization
Low-frequency frame synchronization signal input.
This signal could also be used as a hardware trigger
for frame start
SYNC_IN
SPI_CS_1
R7
R9
R8
P5
P6
I
I
Pull Up
Pull Down
Pull Up
SPI chip select
SPI clock
SPI control
interface from
external MCU
(default
peripheral
mode)
SPI_CLK_1
MOSI_1
I
SPI data input
SPI data output
SPI interrupt to host
MISO_1
O
O
Pull Up
SPI_HOST_INTR_1
Pull Down
R3, R4, R5,
P4
RESERVED
NRESET
—
—
P12
I
Power on reset for chip. Active low
Open-drain fail-safe warm reset signal. Can be
driven from PMIC for diagnostic or can be used as
status signal that the device is going through reset.
Reset
Safety
WARM_RESET
NERROR_OUT
N12
IO
Open Drain
Open Drain
Open-drain fail-safe output signal. Connected to
PMIC/Processor/MCU to indicate that some severe
criticality fault has happened. Recovery would be
through reset.
N8
P7
O
I
Fail-safe input to the device. Error output from
any other device can be concentrated in the error
signaling monitor module inside the device and
appropriate action can be taken by firmware
NERROR_IN
Open Drain
TMS
TCK
TDI
L13
M13
H13
J13
I
I
Pull Up
Pull Down
Pull Up
—
JTAG
JTAG port for standard boundary scan
I
TDO
O
In XTAL mode: Input for the reference crystal
In External clock mode: Single ended input
reference clock port
CLKP
E14
I
—
Reference
oscillator
In XTAL mode: Feedback drive for the reference
crystal
In External clock mode: Connect this port to ground
CLKM
F14
B10
O
O
—
—
Band-gap
voltage
VBGAP
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FUNCTION
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PIN
PIN
DEFAULT PULL
STATUS(1)
SIGNAL NAME
DESCRIPTION
NUMBER TYPE
F13,N11,P15
POW
VDDIN
—
1.2-V digital power supply
,R6
VIN_SRAM
VNWA
R14
P14
POW
POW
—
—
1.2-V power rail for internal SRAM
1.2-V power rail for SRAM array back bias
I/O supply (3.3-V or 1.8-V): All CMOS I/Os would
operate on this supply.
VIOIN
R13
POW
—
VIOIN_18
K13
B11
POW
POW
POW
POW
POW
POW
POW
POW
—
—
—
—
—
—
—
—
1.8-V supply for CMOS IO
1.8-V supply for clock module
1.8-V supply for high speed interface port
No connect
VIN_18CLK
VIOIN_18DIFF
Reserved
D13
G13
VIN_13RF1
VIN_13RF2
VIN_18BB
G5,J5,H5
C2,D2
K5,F5
B12
1.3-V Analog and RF supply,VIN_13RF1 and
VIN_13RF2 could be shorted on the board
1.8-V Analog baseband power supply
1.8-V RF VCO supply
VIN_18VCO
E5,E6,E8,E1
0,E11,F9,F1
1,G6,G7,G8,
G10,H7,H9,
Power supply
VSS
H11,J6,J7,J8 GND
,J10,K7,K8,K
9,K10,K11,L
5,L6,L8,L10,
R15
—
Digital ground
A1,A3,A5,A7
,A9,A15,B3,
B5,B7,B9,B1
3,B14,C1,C3
,C4,C5,C6,C
7,C8,C9,C15
,E1,E2,E3,E GND
13,E15,F3,G
1,G2,G3,H3,
J1,J2,J3,K3,
L1,L2,L3,
VSSA
—
Analog ground
M3,N1,N2,N
3,R1
VOUT_14APLL
VOUT_14SYNTH
VOUT_PA
A10
A13
O
O
O
O
—
—
—
—
Internal LDO
output/inputs
A2,B2
P13
PMIC_CLK_OUT
Dithered clock input to PMIC
External clock
out
Programmable clock given out to external MCU or
the processor
MCU_CLK_OUT
N9
O
—
GPIO[0]
GPIO[1]
GPIO[2]
N4
N7
IO
IO
IO
Pull Down
Pull Down
Pull Down
General-purpose IO
General-purpose IO
General-purpose IO
General-
purpose I/Os
N13
Chip-select output from the device. Device is a
controller connected to serial flash peripheral.
QSPI_CS
P8
O
O
Pull Up
Clock output from the device. Device is a controller
connected to serial flash peripheral.
QSPI_CLK
R10
Pull Down
QSPI for Serial
Flash(2)
QSPI[0]
QSPI[1]
QSPI[2]
QSPI[3]
R11
P9
IO
IO
IO
IO
Pull Down
Pull Down
Pull Up
Data IN/OUT
Data IN/OUT
Data IN/OUT
Data IN/OUT
R12
P10
Pull Up
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PIN
PIN
DEFAULT PULL
STATUS(1)
FUNCTION
SIGNAL NAME
DESCRIPTION
NUMBER TYPE
Flash
RS232_TX
N6
N5
O
I
Pull Down
programming
and RS232
UART(2)
UART pins for programming external flash in
preproduction/debug hardware.
RS232_RX
Pull Up
Analog Test1 /
GPADC1
P1
P2
P3
IO
IO
IO
—
—
—
GP ADC channel 1
GP ADC channel 2
GP ADC channel 3
Test and Debug
output for
preproduction
phase. Can be
pinned out on
production
Analog Test2 /
GPADC2
Analog Test3 /
GPADC3
Analog Test4
R2
IO
IO
IO
—
—
—
GP ADC channel 4
GP ADC channel 5
GP ADC channel 6
hardware for
field debug
ANAMUX / GPADC5
VSENSE / GPADC6
C13
C14
(1) Status of PULL structures associated with the IO after device POWER UP.
(2) This option is for development/debug in preproduction phase. Can be disabled by firmware pin mux setting.
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7.3 Pin Multiplexing
表 7-1. Pin Multiplexing
PAD STATE
nReset = 0 [ASSERTED]
FUNCTION
SIGNAL DESCRIPTION
General Purpose IO
DIGITAL PIN
MUX CONFIG
VALUE [Bits3:0]
REGISTER
PIN NAME
PIN
ADDRESS(1)
INTERNAL WEAK
PULL STATE
SIGNAL NAME
GPIO_12
SIGNAL TYPE
STATE
Hi-Z
0
1
0
1
2
0
1
IO
O
Weak Pull Down
EA00h
GPIO_12
GPIO_0
P6
N4
SPI_HOST1_INTR
GPIO_13
General Purpose IO [AWR14xx]
General Purpose IO
IO
IO
O
Hi-Z
Hi-Z
Weak Pull Down
Weak Pull Down
EA04h
EA08h
GPIO_0
General Purpose IO
PMIC_CLKOUT
GPIO_16
Dithered Clock Output for PMIC
General Purpose IO
IO
IO
GPIO_1
General Purpose IO
GPIO_1
N7
Low Frequency Synchronization
Signal output
2
SYNC_OUT
O
0
1
2
0
1
2
0
1
GPIO_19
MOSI_1
General Purpose IO
SPI Channel#1 Data Input
CAN Interface
IO
IO
I
Hi-Z
Hi-Z
Hi-Z
Hi-Z
Hi-Z
Hi-Z
Weak Pull Up
Weak Pull Up
Weak Pull Up
Weak Pull Up
EA0Ch
EA10h
EA14h
EA18h
EA1Ch
EA20h
MOSI_1
MISO_1
R8
P5
R9
R7
R3
P4
CAN_RX
GPIO_20
MISO_1
General Purpose IO
SPI Channel#1 Data Output
CAN Interface
IO
IO
O
CAN_TX
GPIO_3
General Purpose IO
SPI Channel#1 Clock
IO
IO
O
SPI_CLK_1
SPI_CS_1
MOSI_2
SPI_CLK_1
RCOSC_CLK
GPIO_30
SPI_CS_1
RCOSC_CLK
GPIO_21
MOSI_2
0
1
General Purpose IO
IO
IO
O
SPI Channel#1 Chip Select
0
1
2
0
1
2
General Purpose IO
SPI Channel#2 Data Input
I2C Data
IO
IO
IO
IO
IO
IO
I2C_SDA
GPIO_22
MISO_2
General Purpose IO
SPI Channel#2 Data Output
I2C Clock
MISO_2
I2C_SCL
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表 7-1. Pin Multiplexing (continued)
PAD STATE
nReset = 0 [ASSERTED]
FUNCTION
DIGITAL PIN
MUX CONFIG
VALUE [Bits3:0]
REGISTER
PIN NAME
PIN
ADDRESS(1)
INTERNAL WEAK
PULL STATE
SIGNAL NAME
GPIO_5
SIGNAL DESCRIPTION
SIGNAL TYPE
STATE
0
1
General Purpose IO
SPI Channel#2 Clock
IO
IO
IO
O
Hi-Z
SPI_CLK_2
MSS_UARTA_RX
MSS_UARTB_TX
BSS_UART_TX
GPIO_4
EA24h
SPI_CLK_2
R5
6
7
0
1
Debug: Firmware Trace
Debug: Firmware Trace
General Purpose IO
O
IO
IO
IO
O
Hi-Z
SPI_CS_2
MSS_UARTA_TX
MSS_UARTB_TX
BSS_UART_TX
GPIO_8
SPI Channel#2 Chip Select
EA28h
SPI_CS_2
R4
6
7
0
1
2
0
1
2
0
1
0
1
0
Debug: Firmware Trace
Debug: Firmware Trace
General Purpose IO
QSPI Data IN/OUT
O
IO
IO
IO
IO
IO
IO
IO
IO
IO
I
Hi-Z
Hi-Z
Weak Pull Down
Weak Pull Down
EA2Ch
EA30h
QSPI[0]
QSPI[1]
R11
P9
QSPI[0]
MISO_2
SPI Channel#1 Data Output
General Purpose IO
QSPI Data IN/OUT
GPIO_9
QSPI[1]
MOSI_2
SPI Channel#2 Data Input
General Purpose IO
QSPI Data IN/OUT
GPIO_10
Hi-Z
Hi-Z
Hi-Z
Weak Pull Down
Weak Pull Down
Weak Pull Down
EA34h
EA38h
QSPI[2]
QSPI[3]
R12
P10
QSPI[2]
GPIO_11
General Purpose IO
QSPI Data IN/OUT
QSPI[3]
GPIO_7
General Purpose IO
IO
QSPI Clock output from the device.
Device operates as a master with
the serial flash being a slave
EA3Ch
EA40h
QSPI_CLK
QSPI_CS
R10
1
QSPI_CLK
O
2
0
SPI_CLK_2
GPIO_6
SPI Channel#2 Clock
General Purpose IO
IO
IO
Hi-Z
Weak Pull Up
QSPI Chip Select output from the
device.
Device operates as a master with
the serial flash being a slave
P8
1
2
QSPI_CS
SPI_CS_2
O
SPI Channel#2 Chip Select
IO
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表 7-1. Pin Multiplexing (continued)
PAD STATE
nReset = 0 [ASSERTED]
FUNCTION
DIGITAL PIN
MUX CONFIG
VALUE [Bits3:0]
REGISTER
PIN NAME
PIN
ADDRESS(1)
INTERNAL WEAK
PULL STATE
SIGNAL NAME
SIGNAL DESCRIPTION
SIGNAL TYPE
STATE
Failsafe input to the device. Nerror
output from any other device can be
concentrated in the error signaling
monitor module inside the device
and appropriate action can be taken
by Firmware
NERROR_IN
P7
NERROR_IN
I
Hi-Z
Open drain fail safe warm reset
signal. Can be driven from PMIC
for diagnostic or can be used as
status signal that the device is going
through reset.
WARM_RESET
NERROR_OUT
N12
N8
WARM_RESET
NERROR_OUT
IO
O
Hi-Z Input Open Drain
Open drain fail safe output signal.
Connected to PMIC/Processor/MCU
to indicate that some severe
criticality fault has happened.
Recovery would be through reset.
Hi-Z
Hi-Z
Open Drain
0
1
2
6
0
1
2
0
1
GPIO_17
General Purpose IO
JTAG Clock
IO
I
Weak Pull Down
TCK
EA50h
TCK
M13
MSS_UARTB_TX
BSS_UART_RX
GPIO_18
Debug: Firmware Trace
Debug: Firmware Trace
General Purpose IO
JTAG Test Mode Select
Debug: Firmware Trace
General Purpose IO
JTAG Test Data In
O
I
IO
IO
O
IO
I
Hi-Z
Hi-Z
Hi-Z
Weak Pull Up
Weak Pull Up
EA54h
EA58h
TMS
TDI
L13
H13
TMS
BSS_UART_TX
GPIO_23
TDI
MSS_UARTA_RX
GPIO_24
IO
IO
O
IO
O
O
0
1
General Purpose IO
JTAG Test Data Out
TDO
MSS_UARTA_TX
MSS_UARTB_TX
BSS_UART_TX
EA5Ch
TDO
J13
6
7
Debug: Firmware Trace
Debug: Firmware Trace
Sense On Power [Reset] Line
Impacts boot mode
SOP0
I
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表 7-1. Pin Multiplexing (continued)
PAD STATE
nReset = 0 [ASSERTED]
FUNCTION
DIGITAL PIN
MUX CONFIG
VALUE [Bits3:0]
REGISTER
PIN NAME
PIN
ADDRESS(1)
INTERNAL WEAK
PULL STATE
SIGNAL NAME
GPIO_25
SIGNAL DESCRIPTION
SIGNAL TYPE
STATE
0
1
General Purpose IO
IO
O
Hi-Z
Weak Pull Down
Programmable clock given out to
external MCU or the processor
EA60h
MCU_CLKOUT
N9
MCU_CLKOUT
10
0
BSS_UART_RX
GPIO_26
Debug: Firmware Trace
General Purpose IO
I
IO
IO
O
Hi-Z
Weak Pull Down
1
GPIO_2
General Purpose IO
7
MSS_UARTB_TX
BSS_UART_TX
Debug: Firmware Trace
Debug: Firmware Trace
EA64h
GPIO_2
N13
8
O
Low frequency Synchronization
signal output
9
SYNC_OUT
O
10
0
PMIC_CLKOUT
GPIO_27
Dithered clock input to PMIC
General Purpose IO
O
IO
O
Hi-Z
Hi-Z
Hi-Z
Weak Pull Down
Weak Pull Down
Weak Pull Down
1
PMIC_CLKOUT
Dithered Clock Output for PMIC
EA68h
EA6Ch
PMIC_CLKOUT
SYNC_IN
P13
N10
Sense On Power [Reset] Line
Impacts boot mode
SOP2
I
IO
I
0
1
GPIO_28
SYNC_IN
General Purpose IO
Low frequency Synchronization
signal input
6
0
MSS_UARTB_RX
GPIO_29
Debug: Firmware Trace
General Purpose IO
I
IO
Low frequency Synchronization
signal output
1
SYNC_OUT
RCOSC_CLK
SOP1
O
O
I
EA70h
EA74h
SYNC_OUT
P11
Sense On Power [Reset] Line
Impacts boot mode
0
1
GPIO_15
General Purpose IO
IO
IO
Hi-Z
Weak Pull Up
RS232_RX
Debug: Firmware load to RAM
FLASH Programming
Bootloader Controlled
RS232_RX
N5
2
MSS_UARTA_RX
I
6
7
BSS_UART_TX
Debug: Firmware Trace
Debug: Firmware Trace
O
I
MSS_UARTB_RX
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表 7-1. Pin Multiplexing (continued)
PAD STATE
nReset = 0 [ASSERTED]
FUNCTION
DIGITAL PIN
MUX CONFIG
VALUE [Bits3:0]
REGISTER
PIN NAME
PIN
ADDRESS(1)
INTERNAL WEAK
PULL STATE
SIGNAL NAME
GPIO_14
SIGNAL DESCRIPTION
SIGNAL TYPE
STATE
0
1
General Purpose IO
IO
IO
RS232_TX
Debug: Firmware load to RAM
FLASH Programming
Bootloader Controlled
EA78h
RS232_TX
N6
5
MSS_UARTA_TX
O
6
7
MSS_UARTB_TX
BSS_UART_TX
Debug: Firmware Trace
Debug: Firmware Trace
O
O
(1) Register addresses are of the form FFFF XXXXh, where XXXX is listed here.
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8 Specifications
8.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)
PARAMETERS(1) (2)
MIN
–0.5
–0.5
–0.5
MAX
UNIT
VDDIN
1.2 V digital power supply
1.4
1.4
1.4
V
V
V
VIN_SRAM
VNWA
1.2 V power rail for internal SRAM
1.2 V power rail for SRAM array back bias
I/O supply (3.3 V or 1.8 V): All CMOS I/Os would operate on this
supply.
VIOIN
–0.5
3.8
V
VIOIN_18
1.8 V supply for CMOS IO
–0.5
–0.5
2
2
V
V
VIN_18CLK
VIN_13RF1
VIN_13RF2
VIN_13RF1
1.8 V supply for clock module
1.3 V Analog and RF supply, VIN_13RF1 and VIN_13RF2 could
be shorted on the board.
–0.5
1.45
V
1-V Internal LDO bypass mode. Device supports mode
where external Power Management block can supply 1 V on
VIN_13RF1 and VIN_13RF2 rails. In this configuration, the
internal LDO of the device would be kept bypassed.
–0.5
1.4
V
VIN_13RF2
VIN_18BB
VIN_18VCO supply
RX1-4
1.8-V Analog baseband power supply
1.8-V RF VCO supply
–0.5
–0.5
2
V
2
V
Externally applied power on RF inputs
Externally applied power on RF outputs(3)
Dual-voltage LVCMOS inputs, 3.3 V or 1.8 V (Steady State)
10
10
dBm
dBm
TX1-3
–0.3V
VIOIN + 0.3
Input and output
voltage range
V
Dual-voltage LVCMOS inputs, operated at 3.3 V/1.8 V
(Transient Overshoot/Undershoot) or external oscillator input
VIOIN + 20% up to
20% of signal period
CLKP, CLKM
Clamp current
Input ports for reference crystal
–0.5
2
V
Input or Output Voltages 0.3 V above or below their respective
power rails. Limit clamp current that flows through the internal
diode protection cells of the I/O.
–20
20
mA
TJ
Operating junction temperature range
–40
–55
125
150
°C
°C
TSTG
Storage temperature range after soldered onto PC board
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating
Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltage values are with respect to VSS, unless otherwise noted.
(3) This value is for an externally applied signal level on the TX. Additionally, a reflection coefficient up to Gamma = 1 can be applied on
the TX output.
8.2 ESD Ratings
VALUE
±2000
±500
UNIT
Human-body model (HBM), per AEC Q100-002(1)
Charged-device model (CDM), per AEC
V(ESD)
Electrostatic discharge
V
Q100-011
Corner pins
±750
(1) AEC Q100-002 indicates that HBM stressing shall be in accordance with the ANSI/ESDA/JEDEC JS-001 specification.
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8.3 Power-On Hours (POH)
JUNCTION
OPERATING
TEMPERATURE (Tj)
NOMINAL CVDD VOLTAGE (V)
POWER-ON HOURS [POH] (HOURS)
CONDITION
(1) (2)
–40°C
600 (6%)
2000 (20%)
6500 (65%)
900 (9%)
75°C
100% duty cycle
95°C
1.2
125°C
(1) This information is provided solely for your convenience and does not extend or modify the warranty provided under TI's standard
terms and conditions for TI semiconductor products.
(2) The specified POH are applicable with max Tx output power settings using the default firmware gain tables. The specified POH would
not be applicable, if the Tx gain table is overwritten using an API.
8.4 Recommended Operating Conditions
over operating free-air temperature range (unless otherwise noted)
MIN
1.14
1.14
1.14
3.135
1.71
1.71
1.71
NOM
1.2
1.2
1.2
3.3
1.8
1.8
1.8
MAX
1.32
1.32
1.32
3.465
1.89
1.9
UNIT
VDDIN
1.2 V digital power supply
V
V
V
VIN_SRAM
VNWA
1.2 V power rail for internal SRAM
1.2 V power rail for SRAM array back bias
I/O supply (3.3 V or 1.8 V):
All CMOS I/Os would operate on this supply.
VIOIN
V
VIOIN_18
1.8 V supply for CMOS IO
V
V
VIN_18CLK
VIN_13RF1
VIN_13RF2
1.8 V supply for clock module
1.9
1.3 V Analog and RF supply. VIN_13RF1 and VIN_13RF2
could be shorted on the board
1.23
1.3
1.36
V
VIN_13RF1
(1-V Internal LDO
bypass mode)
0.95
1
1.05
V
VIN_13RF2
(1-V Internal LDO
bypass mode)
VIN18BB
1.8-V Analog baseband power supply
1.8V RF VCO supply
1.71
1.71
1.17
2.25
1.8
1.8
1.9
1.9
V
V
VIN_18VCO
Voltage Input High (1.8 V mode)
Voltage Input High (3.3 V mode)
Voltage Input Low (1.8 V mode)
Voltage Input Low (3.3 V mode)
High-level output threshold (IOH = 6 mA)
Low-level output threshold (IOL = 6 mA)
VIL (1.8V Mode)
VIH
VIL
V
V
0.3*VIOIN
0.62
VOH
VOL
VIOIN – 450
mV
mV
450
0.2
VIH (1.8V Mode)
0.96
1.57
NRESET
SOP[2:0]
V
VIL (3.3V Mode)
0.3
VIH (3.3V Mode)
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8.5 Power Supply Specifications
表 8-1 describes the four rails from an external power supply block of the AWR1443 device.
表 8-1. Power Supply Rails Characteristics
SUPPLY
DEVICE BLOCKS POWERED FROM THE SUPPLY
RELEVANT IOS IN THE DEVICE
Input: VIN_18VCO, VIN18CLK, VIN_18BB,
VIOIN_18DIFF, VIOIN_18
LDO Output: VOUT_14SYNTH, VOUT_14APLL
Synthesizer and APLL VCOs, crystal oscillator, IF
Amplifier stages, ADC, LVDS
1.8 V
1.3 V (or 1 V in internal
LDO bypass mode)(1)
Power Amplifier, Low Noise Amplifier, Mixers and LO
Distribution
Input: VIN_13RF2, VIN_13RF1
LDO Output: VOUT_PA
3.3 V (or 1.8 V for 1.8 V
I/O mode)
Digital I/Os
Input VIOIN
1.2 V
Core Digital and SRAMs
Input: VDDIN, VIN_SRAM
(1) Three simultaneous transmitter operation is supported only in 1-V LDO bypass and PA LDO disable mode. In this mode 1V supply
needs to be fed on the VOUT PA pin.
The 1.3-V (1.0 V) and 1.8-V power supply ripple specifications mentioned in are defined to meet a target spur
level of –105 dBc (RF Pin = –15 dBm) at the RX. The spur and ripple levels have a dB-to-dB relationship, for
example, a 1-dB increase in supply ripple leads to a ~1 dB increase in spur level. Values quoted are rms levels
for a sinusoidal input applied at the specified frequency.
表 8-2. Ripple Specifications
RF RAIL
VCO/IF RAIL
FREQUENCY (kHz)
1.0 V (INTERNAL LDO BYPASS)
1.3 V (µVRMS
)
1.8 V (µVRMS)
(µVRMS
)
137.5
275
7
5
648
76
22
4
83
21
11
6
550
3
1100
2200
4400
6600
2
11
13
22
82
93
117
13
19
29
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8.6 Power Consumption Summary
表 8-3 and 表 8-4 summarize the power consumption at the power terminals.
表 8-3. Maximum Current Ratings at Power Terminals
PARAMETER
SUPPLY NAME
DESCRIPTION
MIN
TYP
MAX
UNIT
Total current drawn by all
nodes driven by 1.2V rail
VDDIN, VIN_SRAM, VNWA
500
Total current drawn by all
nodes driven by 1.3V rail
VIN_13RF1, VIN_13RF2
2000
850
Current consumption(1)
mA
VIOIN_18, VIN_18CLK,
VIOIN_18DIFF, VIN_18BB,
VIN_18VCO
Total current drawn by all
nodes driven by 1.8V rail
Total current drawn by
all nodes driven by 3.3V
rail(2)
VIOIN
50
(1) The specified current values are at typical supply voltage level.
(2) The exact VIOIN current depends on the peripherals used and their frequency of operation.
表 8-4. Average Power Consumption at Power Terminals
PARAMETER
CONDITION
DESCRIPTION
MIN
TYP
MAX UNIT
1.0-V internal
LDO bypass
mode
1TX, 4RX
2TX, 4RX
1TX, 4RX
2TX, 4RX
1.72
1.89
1.90
2.10
Sampling: 16.66 MSps complex
Transceiver, 40-ms frame time, 512
chirps, 512 samples/chirp, 8.5-μs
interchirp time (50% duty cycle)
Data Port: MIPI-CSI-2
Average power
consumption
W
1.3-V internal
LDO enabled
mode
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8.7 RF Specification
over recommended operating conditions (unless otherwise noted)
PARAMETER
MIN
TYP
14
15
–8
48
24
2
MAX UNIT
76 to 77 GHz
Noise figure
dB
77 to 81 GHz
1-dB compression point (Out Of Band)(1)
Maximum gain
dBm
dB
Gain range
dB
Gain step size
dB
Image Rejection Ratio (IMRR)
IF bandwidth(2)
30
dB
5
MHz
ADC sampling rate (real/complex 2x)
ADC sampling rate (complex 1x)
ADC resolution
12.5 Msps
6.25 Msps
Receiver
12
<–10
±0.5
±3
Bits
dB
dB
°
Return loss (S11)
Gain mismatch variation (over temperature)
Phase mismatch variation (over temperature)
RX gain = 30dB
IF = 1.5, 2 MHz at
–12 dBFS
In-band IIP2
16
24
dBm
dBm
RX gain = 24dB
IF = 10 kHz at -10dBm,
1.9 MHz at -30 dBm
Out-of-band IIP2
Idle Channel Spurs
Output power
–90
12
dBFS
dBm
Transmitter
Amplitude noise
Frequency range
Ramp rate
–145
dBc/Hz
76
81 GHz
100 MHz/µs
Clock
subsystem
76 to 77 GHz
77 to 81 GHz
–95
–93
Phase noise at 1-MHz offset
dBc/Hz
(1) 1-dB Compression Point (Out Of Band) is measured by feed a Continuous wave Tone (10 kHz) well below the lowest HPF cut-off
frequency.
(2) The analog IF stages include high-pass filtering, with two independently configurable first-order high-pass corner frequencies. The set
of available HPF corners is summarized as follows:
Available HPF Corner Frequencies (kHz)
HPF1
HPF2
175, 235, 350, 700
350, 700, 1400, 2800
The filtering performed by the digital baseband chain is targeted to provide:
•
•
Less than ±0.5 dB pass-band ripple/droop, and
Better than 60 dB anti-aliasing attenuation for any frequency that can alias back into the pass-band.
图 8-1 shows variations of noise figure and in-band P1dB parameters with respect to receiver gain programmed.
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18
16
14
12
10
8
-18
NF (dB)
In-band P1DB (dBm)
-24
-30
-36
-42
-48
30
32
34
36
38 40
RX Gain (dB)
42
44
46
48
图 8-1. Noise Figure, In-band P1dB vs Receiver Gain
8.8 Thermal Resistance Characteristics for FCBGA Package [ABL0161]
THERMAL METRICS(1)
°C/W(2) (3)
5
RΘJC
RΘJB
RΘJA
RΘJMA
PsiJT
PsiJB
Junction-to-case
Junction-to-board
5.9
Junction-to-free air
Junction-to-moving air
Junction-to-package top
Junction-to-board
21.6
15.3 (4)
0.69
5.8
(1) For more information about traditional and new thermal metrics, see Semiconductor and IC Package Thermal Metrics.
(2) °C/W = degrees Celsius per watt.
(3) These values are based on a JEDEC-defined 2S2P system (with the exception of the Theta JC [RΘJC] value, which is based on
a JEDEC-defined 1S0P system) and will change based on environment as well as application. For more information, see these
EIA/JEDEC standards:
•
•
•
•
JESD51-2, Integrated Circuits Thermal Test Method Environmental Conditions - Natural Convection (Still Air)
JESD51-3, Low Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
JESD51-7, High Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
JESD51-9, Test Boards for Area Array Surface Mount Package Thermal Measurements
(4) Air flow = 1 m/s
8.9 Timing and Switching Characteristics
8.9.1 Power Supply Sequencing and Reset Timing
The AWR1443 device expects all external voltage rails to be stable before reset is deasserted. 图 8-2 describes
the device wake-up sequence.
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SOP
Setup
Time
SOP
Hold time to
nRESET
DC power
MSS
BOOT
START
nRESET
ASSERT
tPGDEL
DC
Power
notOK
Stable before
nRESET
release
DC
Power
OK
QSPI
READ
VDDIN,
VIN_SRAM
VNWA
VIOIN_18
VIN18_CLK
VIOIN_18DIFF
VIN18_BB
VIN_13RF1
VIN_13RF2
VIOIN
SOP[2.1.0]
nRESET
Warm reset
delay for crystal
or ext osc
WARMRESET
OUTPUT
VBGAP
OUTPUT
CLKP, CLKM
Using Crystal
MCUCLK
OUTPUT (1)
QSPI_CS
OUTPUT
7ms (XTAL Mode)
500 µs (REFCLK Mode)
A. MCU_CLK_OUT in autonomous mode, where AWR1443 application is booted from the serial flash, MCU_CLK_OUT is not enabled by
default by the device bootloader.
图 8-2. Device Wake-up Sequence
8.9.2 Synchronized Frame Triggering
The AWR1443 device supports a hardware based mechanism to trigger radar frames. An external host can
pulse the SYNC_IN signal to start radar frames. The typical time difference between the rising edge of
the external pulse and the frame transmission on air (Tlag) is about 160 ns. There is also an additional
programmable delay that the user can set to control the frame start time.
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Tactive_frame
SYNC_IN
(Hardware
Trigger)
Radar
Frames
Tpulse
Tlag
Frame-2
Frame-1
图 8-3. Sync In Hardware Trigger
表 8-5. Frame Trigger Timing
PARAMETER
DESCRIPTION
MIN
MAX
UNIT
Tactive_frame
Tpulse
Active frame duration
User defined
25
ns
4000
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8.9.3 Input Clocks and Oscillators
8.9.3.1 Clock Specifications
An external crystal is connected to the device pins. 图 8-4 shows the crystal implementation.
Cf1
CLKP
Cp
40 MHz
CLKM
Cf2
图 8-4. Crystal Implementation
备注
The load capacitors, Cf1 and Cf2 in 图 8-4, should be chosen such that 方程式 1 is satisfied. CL in the
equation is the load specified by the crystal manufacturer. All discrete components used to implement
the oscillator circuit should be placed as close as possible to the associated oscillator CLKP and
CLKM pins.Note that Cf1 and Cf2 include the parasitic capacitances due to PCB routing.
C f2
CL = C f1
´
+CP
C
f1 +C f2
(1)
表 8-6 lists the electrical characteristics of the clock crystal.
表 8-6. Crystal Electrical Characteristics (Oscillator Mode)
NAME
DESCRIPTION
MIN
TYP
MAX
UNIT
MHz
pF
fP
Parallel resonance crystal frequency
40
CL
Crystal load capacitance
Crystal ESR
5
8
12
ESR
50
Ω
Temperature range Expected temperature range of operation
–40
125
°C
Frequency
Crystal frequency tolerance(1) (2)
tolerance
–200
200
200
ppm
µW
Drive level
50
(1) The crystal manufacturer's specification must satisfy this requirement.
(2) Includes initial tolerance of the crystal, drift over temperature, aging and frequency pulling due to incorrect load capacitance.
In the case where an external clock is used as the clock resource, the signal is fed to the CLKP pin only; CLKM
is grounded. The phase noise requirement is very important when a 40-MHz clock is fed externally. 表 8-7 lists
the electrical characteristics of the external clock signal.
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表 8-7. External Clock Mode Specifications
SPECIFICATION
PARAMETER
UNIT
MIN
TYP
MAX
Frequency
40
MHz
mV (pp)
ns
AC-Amplitude
700
1200
10
DC-trise/fall
Input Clock:
External AC-coupled sine wave or DC-
coupled square wave
Phase Noise at 1 kHz
Phase Noise at 10 kHz
Phase Noise at 100 kHz
Phase Noise at 1 MHz
Duty Cycle
–132
–143
–152
–153
65
dBc/Hz
dBc/Hz
dBc/Hz
dBc/Hz
%
Phase Noise referred to 40 MHz
35
Freq Tolerance
–100
100
ppm
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8.9.4 Multibuffered / Standard Serial Peripheral Interface (MibSPI)
8.9.4.1 Peripheral Description
The SPI uses a MibSPI Protocol by TI.
The MibSPI/SPI is a high-speed synchronous serial input/output port that allows a serial bit stream of
programmed length (2 to 16 bits) to be shifted into and out of the device at a programmed bit-transfer rate.
The MibSPI/SPI is normally used for communication between the microcontroller and external peripherals or
another microcontroller.
Standard and MibSPI modules have the following features:
•
•
•
•
16-bit shift register
Receive buffer register
8-bit baud clock generator
SPICLK can be internally-generated (controller mode) or received from an external clock source
(peripheral mode)
•
•
Each word transferred can have a unique format.
SPI I/Os not used in the communication can be used as digital input/output signals
8.9.4.2 MibSPI Transmit and Receive RAM Organization
The Multibuffer RAM is comprised of 256 buffers. Each entry in the Multibuffer RAM consists of 4 parts: a 16-bit
transmit field, a 16-bit receive field, a 16-bit control field and a 16-bit status field. The Multibuffer RAM can be
partitioned into multiple transfer group with variable number of buffers each.
节 8.9.4.2.2 and 节 8.9.4.2.3 assume the operating conditions stated in 节 8.9.4.2.1.
8.9.4.2.1 SPI Timing Conditions
MIN
TYP
MAX
UNIT
Input Conditions
tR
tF
Input rise time
Input fall time
1
1
3
3
ns
ns
Output Conditions
CLOAD Output load capacitance
2
15
pF
8.9.4.2.2 SPI Controller Mode Switching Parameters (CLOCK PHASE = 0, SPICLK = output,
SPISIMO = output, and SPISOMI = input)(1) (2) (3)
NO.
PARAMETER
Cycle time, SPICLK(4)
MIN
25
TYP
MAX UNIT
1
tc(SPC)M
256tc(VCLK)
0.5tc(SPC)M + 4
0.5tc(SPC)M + 4
0.5tc(SPC)M + 4
0.5tc(SPC)M + 4
ns
tw(SPCH)M
tw(SPCL)M
tw(SPCL)M
tw(SPCH)M
Pulse duration, SPICLK high (clock polarity = 0)
Pulse duration, SPICLK low (clock polarity = 1)
Pulse duration, SPICLK low (clock polarity = 0)
Pulse duration, SPICLK high (clock polarity = 1)
0.5tc(SPC)M – 4
0.5tc(SPC)M – 4
0.5tc(SPC)M – 4
0.5tc(SPC)M – 4
0.5tc(SPC)M – 3
2(4)
ns
3(4)
ns
ns
td(SPCH-
Delay time, SPISIMO valid before SPICLK low, (clock
polarity = 0)
SIMO)M
4(4)
td(SPCL-
Delay time, SPISIMO valid before SPICLK high, (clock
polarity = 1)
0.5tc(SPC)M – 3
SIMO)M
tv(SPCL-
Valid time, SPISIMO data valid after SPICLK low, (clock
polarity = 0)
0.5tc(SPC)M
–
10.5
SIMO)M
5(4)
ns
tv(SPCH-
Valid time, SPISIMO data valid after SPICLK high, (clock
polarity = 1)
0.5tc(SPC)M
–
10.5
SIMO)M
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PARAMETER
MIN
TYP
MAX UNIT
(C2TDELAY+2)
CSHOLD = 0
CSHOLD = 1
CSHOLD = 0
CSHOLD = 1
(C2TDELAY+2)*
tc(VCLK) – 7.5
Setup time CS active until SPICLK
high
(clock polarity = 0)
* tc(VCLK) + 7
(C2TDELAY +3)
* tc(VCLK) – 7.5
(C2TDELAY+3)
* tc(VCLK) + 7
6(5)
tC2TDELAY
ns
(C2TDELAY+2)*
tc(VCLK) – 7.5
(C2TDELAY+2)
* tc(VCLK) + 7
Setup time CS active until SPICLK low
(clock polarity = 1)
(C2TDELAY +3)
* tc(VCLK) – 7.5
(C2TDELAY+3)
* tc(VCLK) + 7
Hold time, SPICLK low until CS inactive (clock polarity = 0)
0.5*tc(SPC)M
(T2CDELAY +
1) *tc(VCLK) – 7
+
0.5*tc(SPC)M
(T2CDELAY +
1) * tc(VCLK)
7.5
+
+
7(5)
tT2CDELAY
ns
Hold time, SPICLK high until CS inactive (clock polarity = 1)
0.5*tc(SPC)M
+
0.5*tc(SPC)M
+
(T2CDELAY +
1) *tc(VCLK) – 7
(T2CDELAY +
1) * tc(VCLK)
+
7.5
tsu(SOMI-
Setup time, SPISOMI before SPICLK low
(clock polarity = 0)
5
5
3
3
SPCL)M
8(4)
ns
ns
tsu(SOMI-
Setup time, SPISOMI before SPICLK high
(clock polarity = 1)
SPCH)M
th(SPCL-
Hold time, SPISOMI data valid after SPICLK low
(clock polarity = 0)
SOMI)M
9(4)
th(SPCH-
Hold time, SPISOMI data valid after SPICLK high
(clock polarity = 1)
SOMI)M
(1) The MASTER bit (SPIGCRx.0) is set and the CLOCK PHASE bit (SPIFMTx.16) is cleared (where x= 0 or 1).
(2) tc(MSS_VCLK) = main subsystem clock time = 1 / f(MSS_VCLK). For more details, see the Technical Reference Manual.
(3) When the SPI is in Controller mode, the following must be true: For PS values from 1 to 255: tc(SPC)M ≥ (PS +1)tc(MSS_VCLK) ≥ 25ns,
where PS is the prescale value set in the SPIFMTx.[15:8] register bits. For PS values of 0: tc(SPC)M = 2tc(MSS_VCLK) ≥ 25ns.
(4) The active edge of the SPICLK signal referenced is controlled by the CLOCK POLARITY bit (SPIFMTx.17).
(5) C2TDELAY and T2CDELAY is programmed in the SPIDELAY register
11
SPICLK
(clock polarity = 0)
2
3
SPICLK
(clock polarity = 1
4
5
Master Out Data Is Valid
SPISIMO
8
9
Master In Data
Must Be Valid
SPISOMI
图 8-5. SPI Controller Mode External Timing (CLOCK PHASE = 0)
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Write to buffer
SPICLK
(clock polarity=0)
SPICLK
(clock polarity=1)
SPISIMO
Master Out Data Is Valid
6
7
SPICSn
图 8-6. SPI Controller Mode Chip Select Timing (CLOCK PHASE = 0)
8.9.4.2.3 SPI Controller Mode Switching Parameters (CLOCK PHASE = 1, SPICLK = output,
SPISIMO = output, and SPISOMI = input)(1) (2) (3)
NO.
PARAMETER
Cycle time, SPICLK(4)
MIN
25
TYP
MAX UNIT
1
tc(SPC)M
256tc(VCLK)
ns
tw(SPCH)M
tw(SPCL)M
tw(SPCL)M
tw(SPCH)M
Pulse duration, SPICLK high (clock polarity = 0)
Pulse duration, SPICLK low (clock polarity = 1)
Pulse duration, SPICLK low (clock polarity = 0)
Pulse duration, SPICLK high (clock polarity = 1)
0.5tc(SPC)M – 4
0.5tc(SPC)M – 4
0.5tc(SPC)M – 4
0.5tc(SPC)M – 4
0.5tc(SPC)M + 4
0.5tc(SPC)M + 4
0.5tc(SPC)M + 4
0.5tc(SPC)M + 4
2(4)
ns
3(4)
ns
ns
td(SPCH-
Delay time, SPISIMO valid before SPICLK low, (clock polarity 0.5tc(SPC)M – 3
= 0)
SIMO)M
4(4)
td(SPCL-
Delay time, SPISIMO valid before SPICLK high, (clock
polarity = 1)
0.5tc(SPC)M – 3
SIMO)M
tv(SPCL-
Valid time, SPISIMO data valid after SPICLK low, (clock
polarity = 0)
0.5tc(SPC)M
–
10.5
SIMO)M
5(4)
ns
tv(SPCH-
Valid time, SPISIMO data valid after SPICLK high, (clock
polarity = 1)
0.5tc(SPC)M
–
10.5
SIMO)M
tC2TDELAY
Setup time CS active until SPICLK
high
(clock polarity = 0)
CSHOLD = 0
CSHOLD = 1
CSHOLD = 0
CSHOLD = 1
0.5*tc(SPC)M
+
(C2TDELAY +
2)*tc(VCLK) – 7
0.5*tc(SPC)M
(C2TDELAY+2
) * tc(VCLK)
7.5
+
+
0.5*tc(SPC)M
(C2TDELAY +
2)*tc(VCLK) – 7
+
0.5*tc(SPC)M
+
(C2TDELAY+2
) * tc(VCLK)
+
7.5
6(5)
ns
0.5*tc(SPC)M
(C2TDELAY+2
)*tc(VCLK) – 7
+
0.5*tc(SPC)M
+
(C2TDELAY+2
) * tc(VCLK)
+
Setup time CS active until SPICLK
low
(clock polarity = 1)
7.5
0.5*tc(SPC)M
(C2TDELAY+3
)*tc(VCLK) – 7
+
0.5*tc(SPC)M
+
(C2TDELAY+3
) * tc(VCLK)
+
7.5
Hold time, SPICLK low until CS inactive (clock polarity = 0)
Hold time, SPICLK high until CS inactive (clock polarity = 1)
(T2CDELAY +
(T2CDELAY +
1) *tc(VCLK) + 7
1) *tc(VCLK)
–
7.5
7(5)
tT2CDELAY
ns
(T2CDELAY +
(T2CDELAY +
1) *tc(VCLK) + 7
1) *tc(VCLK)
–
7.5
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PARAMETER
MIN
TYP
MAX UNIT
tsu(SOMI-
Setup time, SPISOMI before SPICLK low
(clock polarity = 0)
5
SPCL)M
8(4)
ns
tsu(SOMI-
Setup time, SPISOMI before SPICLK high
(clock polarity = 1)
5
3
3
SPCH)M
th(SPCL-
Hold time, SPISOMI data valid after SPICLK low
(clock polarity = 0)
SOMI)M
9(4)
ns
th(SPCH-
Hold time, SPISOMI data valid after SPICLK high
(clock polarity = 1)
SOMI)M
(1) The MASTER bit (SPIGCRx.0) is set and the CLOCK PHASE bit (SPIFMTx.16) is set ( where x = 0 or 1 ).
(2) tc(MSS_VCLK) = main subsystem clock time = 1 / f(MSS_VCLK). For more details, see the Technical Reference Manual.
(3) When the SPI is in Controller mode, the following must be true: For PS values from 1 to 255: tc(SPC)M ≥ (PS +1)tc(MSS_VCLK) ≥ 25 ns,
where PS is the prescale value set in the SPIFMTx.[15:8] register bits. For PS values of 0: tc(SPC)M = 2tc(MSS_VCLK) ≥ 25 ns.
(4) The active edge of the SPICLK signal referenced is controlled by the CLOCK POLARITY bit (SPIFMTx.17).
(5) C2TDELAY and T2CDELAY is programmed in the SPIDELAY register
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1
SPICLK
(clock polarity = 0)
2
3
SPICLK
(clock polarity = 1)
4
5
Master Out Data Is Valid
Data Valid
SPISIMO
8
9
Master In Data
Must Be Valid
SPISOMI
图 8-7. SPI Controller Mode External Timing (CLOCK PHASE = 1)
Write to buffer
SPICLK
(clock polarity=0)
SPICLK
(clock polarity=1)
SPISIMO
SPICSn
Master Out Data Is Valid
6
7
图 8-8. SPI Controller Mode Chip Select Timing (CLOCK PHASE = 1)
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8.9.4.3 SPI Peripheral Mode I/O Timings
8.9.4.3.1 SPI Peripheral Mode Switching Parameters (SPICLK = input, SPISIMO = input,
and SPISOMI = output)(1) (2) (3)
NO.
PARAMETER
MIN
25
TYP
MAX
UNIT
1
tc(SPC)S
Cycle time, SPICLK(4)
ns
tw(SPCH)S
tw(SPCL)S
tw(SPCL)S
tw(SPCH)S
td(SPCH-SOMI)S
Pulse duration, SPICLK high (clock polarity = 0)
Pulse duration, SPICLK low (clock polarity = 1)
Pulse duration, SPICLK low (clock polarity = 0)
Pulse duration, SPICLK high (clock polarity = 1)
10
2(5)
ns
ns
10
10
3(5)
10
Delay time, SPISOMI valid after SPICLK high
(clock polarity = 0)
10
10
4(5)
ns
ns
td(SPCL-SOMI)S
th(SPCH-SOMI)S
th(SPCL-SOMI)S
td(SPCH-SOMI)S
Delay time, SPISOMI valid after SPICLK low (clock
polarity = 1)
Hold time, SPISOMI data valid after SPICLK high
(clock polarity = 0)
2
2
5(5)
Hold time, SPISOMI data valid after SPICLK low
(clock polarity = 1)
Delay time, SPISOMI valid after SPICLK high
(clock polarity = 0; clock phase = 0) OR (clock
polarity = 1; clock phase = 1)
10
10
4(5)
5(5)
6(5)
7(5)
ns
ns
ns
ns
td(SPCL-SOMI)S
th(SPCH-SOMI)S
th(SPCL-SOMI)S
Delay time, SPISOMI valid after SPICLK low (clock
polarity = 1; clock phase = 0) OR (clock polarity =
0; clock phase = 1)
Hold time, SPISOMI data valid after SPICLK high
(clock polarity = 0; clock phase = 0) OR (clock
polarity = 1; clock phase = 1)
2
2
3
3
1
1
Hold time, SPISOMI data valid after SPICLK low
(clock polarity = 1; clock phase = 0) OR (clock
polarity = 0; clock phase = 1)
Setup time, SPISIMO before SPICLK low (clock
polarity = 0; clock phase = 0) OR (clock polarity =
1; clock phase = 1)
tsu(SIMO-SPCL)S
Setup time, SPISIMO before SPICLK high (clock
tsu(SIMO-SPCH)S polarity = 1; clock phase = 0) OR (clock polarity =
0; clock phase = 1)
Hold time, SPISIMO data valid after SPICLK low
(clock polarity = 0; clock phase = 0) OR (clock
polarity = 1; clock phase = 1)
th(SPCL-SIMO)S
Hold time, SPISIMO data valid after SPICLK high
(clock polarity = 1; clock phase = 0) OR (clock
polarity = 0; clock phase = 1)
th(SPCL-SIMO)S
(1) The MASTER bit (SPIGCRx.0) is cleared ( where x = 0 or 1 ).
(2) The CLOCK PHASE bit (SPIFMTx.16) is either cleared or set for CLOCK PHASE = 0 or CLOCK PHASE = 1 respectively.
(3) tc(MSS_VCLK) = main subsystem clock time = 1 / f(MSS_VCLK). For more details, see the Technical Reference Manual.
(4) When the SPI is in peripheral mode, the following must be true: For PS values from 1 to 255: tc(SPC)S ≥ (PS +1)tc(MSS_VCLK) ≥ 25 ns,
where PS is the prescale value set in the SPIFMTx.[15:8] register bits.For PS values of 0: tc(SPC)S = 2tc(MSS_VCLK) ≥ 25 ns.
(5) The active edge of the SPICLK signal referenced is controlled by the CLOCK POLARITY bit (SPIFMTx.17).
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1
SPICLK
(clock polarity = 0)
2
3
SPICLK
(clock polarity = 1)
5
4
SPISOMI
SPISOMI Data Is Valid
6
7
SPISIMO Data
Must Be Valid
SPISIMO
图 8-9. SPI peripheral Mode External Timing (CLOCK PHASE = 0)
1
SPICLK
(clock polarity = 0)
2
3
SPICLK
(clock polarity = 1)
4
5
SPISOMI
SPISOMI Data Is Valid
6
7
SPISIMO Data
Must Be Valid
SPISIMO
图 8-10. SPI peripheral Mode External Timing (CLOCK PHASE = 1)
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8.9.4.4 Typical Interface Protocol Diagram (Peripheral Mode)
1. Host should ensure that there is a delay of two SPI clocks between CS going low and start of SPI clock.
2. Host should ensure that CS is toggled for every 16 bits of transfer through SPI.
图 8-11 shows the SPI communication timing of the typical interface protocol.
2 SPI clocks
CS
CLK
0x4321
0x1234
CRC
0x5678
0x8765
MOSI
MISO
IRQ
0xDCBA
0xABCD
CRC
16 bytes
图 8-11. SPI Communication
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8.9.5 LVDS Interface Configuration
The AWR1443 supports seven differential LVDS IOs/Lanes. The lane configuration supported is four Data lanes
(LVDS_TXP/M), one Bit Clock lane (LVDS_CLKP/M) and one Frame clock lane (LVDS_FRCLKP/M), and one
HS_DEBUG LVDS pair. The LVDS interface is used for debugging. The LVDS interface supports the following
data rates:
•
•
•
•
•
•
•
900 Mbps (450 MHz DDR Clock)
600 Mbps (300 MHz DDR Clock)
450 Mbps (225 MHz DDR Clock)
400 Mbps (200 MHz DDR Clock)
300 Mbps (150 MHz DDR Clock)
225 Mbps (112.5 MHz DDR Clock)
150 Mbps (75 MHz DDR Clock)
Note that the bit clock is in DDR format and hence the numbers of toggles in the clock is equivalent to data.
LVDS_TXP/M
LVDS_FRCLKP/M
Data bitwidth
LVDS_CLKP/M
图 8-12. LVDS Interface Lane Configuration And Relative Timings
8.9.5.1 LVDS Interface Timings
表 8-8. LVDS Electrical Characteristics
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Duty Cycle Requirements
max 1 pF lumped capacitive load on
LVDS lanes
48%
52%
Output Differential Voltage
peak-to-peak single-ended with 100 Ω
resistive load between differential pairs
250
450
mV
Output Offset Voltage
Trise and Tfall
1125
1275
mV
ps
20%-80%, 900 Mbps
900 Mbps
330
80
Jitter (pk-pk)
ps
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Trise
LVDS_CLK
Clock Jitter = 6sigma
LVDS_TXP/M
LVDS_FRCLKP/M
1100 ps
图 8-13. Timing Parameters
8.9.6 General-Purpose Input/Output
节 8.9.6.1 lists the switching characteristics of output timing relative to load capacitance.
8.9.6.1 Switching Characteristics for Output Timing versus Load Capacitance (CL)
PARAMETER(1) (2)
TEST CONDITIONS
CL = 20 pF
VIOIN = 1.8V
VIOIN = 3.3V
UNIT
2.8
6.4
9.4
2.8
6.4
9.4
3.3
6.7
9.6
3.1
6.6
9.6
3.0
6.9
10.2
2.8
6.6
9.8
3.3
7.2
10.5
3.1
6.6
9.6
tr
tf
tr
tf
Max rise time
CL = 50 pF
ns
CL = 75 pF
Slew control = 0
CL = 20 pF
CL = 50 pF
CL = 75 pF
CL = 20 pF
CL = 50 pF
CL = 75 pF
CL = 20 pF
CL = 50 pF
CL = 75 pF
Max fall time
Max rise time
Max fall time
ns
ns
ns
Slew control = 1
(1) Slew control, which is configured by PADxx_CFG_REG, changes behavior of the output driver (faster or slower output slew rate).
(2) The rise/fall time is measured as the time taken by the signal to transition from 10% and 90% of VIOIN voltage.
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8.9.7 Controller Area Network Interface (DCAN)
The DCAN supports the CAN 2.0B protocol standard and uses a serial, multi-commander communication
protocol that efficiently supports distributed real-time control with robust communication rates of up to 1 Mbps.
The DCAN is ideal for applications operating in noisy and harsh environments that require reliable serial
communication or multiplexed wiring.
The DCAN has the following features:
•
•
•
•
•
•
•
•
•
•
Supports CAN protocol version 2.0 part A, B
Bit rates up to 1 Mbps
Configurable Message objects
Individual identifier masks for each message object
Programmable FIFO mode for message objects
Suspend mode for debug support
Programmable loop-back modes for self-test operation
Direct access to Message RAM in test mode
Supports two interrupt lines - Level 0 and Level 1
Automatic Message RAM initialization
8.9.7.1 Dynamic Characteristics for the DCANx TX and RX Pins
PARAMETER
MIN
TYP
MAX
15
UNIT
ns
td(CAN_tx)
td(CAN_rx)
Delay time, transmit shift register to CAN_tx pin(1)
Delay time, CAN_rx pin to receive shift register(1)
10
ns
(1) These values do not include rise/fall times of the output buffer.
8.9.8 Serial Communication Interface (SCI)
The SCI has the following features:
•
•
•
•
•
•
Standard universal asynchronous receiver-transmitter (UART) communication
Standard non-return to zero (NRZ) format
Double-buffered receive and transmit functions
Asynchronous or iso-synchronous communication modes with no CLK pin
Capability to use Direct Memory Access (DMA) for transmit and receive data
Two external pins: RS232_RX and RS232_TX
8.9.8.1 SCI Timing Requirements
MIN
TYP
MAX
UNIT
kHz
f(baud)
Supported baud rate at 20 pF
921.6
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8.9.9 Inter-Integrated Circuit Interface (I2C)
The inter-integrated circuit (I2C) module is a multicontroller communication module providing an interface
between devices compliant with Philips Semiconductor I2C-bus specification version 2.1 and connected by an
I2C-bus™. This module will support any target or controller I2C compatible device.
The I2C has the following features:
•
Compliance to the Philips I2C bus specification, v2.1 (The I2C Specification, Philips document number 9398
393 40011)
– Bit/Byte format transfer
– 7-bit and 10-bit device addressing modes
– General call
– START byte
– Multi-controller transmitter/ target receiver mode
– Multi-controller receiver/ target transmitter mode
– Combined controller transmit/receive and receive/transmit mode
– Transfer rates of 100 kbps up to 400 kbps (Phillips fast-mode rate)
Free data format
Two DMA events (transmit and receive)
DMA event enable/disable capability
Module enable/disable capability
The SDA and SCL are optionally configurable as general purpose I/O
Slew rate control of the outputs
Open drain control of the outputs
Programmable pullup/pulldown capability on the inputs
Supports Ignore NACK mode
•
•
•
•
•
•
•
•
•
备注
This I2C module does not support:
•
•
•
High-speed (HS) mode
C-bus compatibility mode
The combined format in 10-bit address mode (the I2C sends the target address second byte every
time it sends the target address first byte)
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UNIT
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8.9.9.1 I2C Timing Requirements(1)
STANDARD MODE
FAST MODE
MIN
10
MAX
MIN
2.5
MAX
tc(SCL)
Cycle time, SCL
μs
μs
tsu(SCLH-SDAL)
Setup time, SCL high before SDA low
(for a repeated START condition)
4.7
0.6
th(SCLL-SDAL)
Hold time, SCL low after SDA low
4
0.6
μs
(for a START and a repeated START condition)
tw(SCLL)
Pulse duration, SCL low
4.7
4
1.3
0.6
100
0
μs
μs
μs
μs
μs
tw(SCLH)
Pulse duration, SCL high
tsu(SDA-SCLH)
th(SCLL-SDA)
tw(SDAH)
Setup time, SDA valid before SCL high
Hold time, SDA valid after SCL low
250
0
3.45(1)
0.9
Pulse duration, SDA high between STOP and START
conditions
4.7
1.3
tsu(SCLH-SDAH)
tw(SP)
Setup time, SCL high before SDA high
(for STOP condition)
4
0.6
0
μs
Pulse duration, spike (must be suppressed)
Capacitive load for each bus line
50
ns
(2) (3)
Cb
400
400
pF
(1) The I2C pins SDA and SCL do not feature fail-safe I/O buffers. These pins could potentially draw current when the device is powered
down.
(2) The maximum th(SDA-SCLL) for I2C bus devices has only to be met if the device does not stretch the low period (tw(SCLL)) of the
SCL signal.
(3) Cb = total capacitance of one bus line in pF. If mixed with fast-mode devices, faster fall-times are allowed.
SDA
tw(SDAH)
tsu(SDA-SCLH)
tw(SP)
tw(SCLL)
tr(SCL)
tsu(SCLH-SDAH)
tw(SCLH)
SCL
tc(SCL)
th(SCLL-SDAL)
tf(SCL)
th(SCLL-SDAL)
tsu(SCLH-SDAL)
th(SDA-SCLL)
Stop
Start
Repeated Start
Stop
图 8-14. I2C Timing Diagram
备注
•
•
A device must internally provide a hold time of at least 300 ns for the SDA signal (referred to the
VIHmin of the SCL signal) to bridge the undefined region of the falling edge of SCL.
The maximum th(SDA-SCLL) has only to be met if the device does not stretch the LOW
period (tw(SCLL)) of the SCL signal. E.A Fast-mode I2C-bus device can be used in a Standard-
mode I2C-bus system, but the requirement tsu(SDA-SCLH) ≥ 250 ns must then be met. This will
automatically be the case if the device does not stretch the LOW period of the SCL signal. If such
a device does stretch the LOW period of the SCL signal, it must output the next data bit to the SDA
line tr max + tsu(SDA-SCLH)
.
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8.9.10 Quad Serial Peripheral Interface (QSPI)
The quad serial peripheral interface (QSPI) module is a kind of SPI module that allows single, dual, or quad read
access to external SPI devices. This module has a memory mapped register interface, which provides a direct
interface for accessing data from external SPI devices and thus simplifying software requirements. The QSPI
works as a controller only. The QSPI in the device is primarily intended for fast booting from quad-SPI flash
memories.
The QSPI supports the following features:
•
•
•
•
•
•
•
Programmable clock divider
Six-pin interface
Programmable length (from 1 to 128 bits) of the words transferred
Programmable number (from 1 to 4096) of the words transferred
Support for 3-, 4-, or 6-pin SPI interface
Optional interrupt generation on word or frame (number of words) completion
Programmable delay between chip select activation and output data from 0 to 3 QSPI clock cycles
节 8.9.10.2 and 节 8.9.10.3 assume the operating conditions stated in 节 8.9.10.1.
8.9.10.1 QSPI Timing Conditions
MIN
TYP
MAX
UNIT
Input Conditions
tR
tF
Input rise time
Input fall time
1
1
3
3
ns
ns
Output Conditions
CLOAD
Output load capacitance
2
15
pF
8.9.10.2 Timing Requirements for QSPI Input (Read) Timings(1) (2)
MIN
7.3
TYP
MAX
UNIT
ns
tsu(D-SCLK)
th(SCLK-D)
tsu(D-SCLK)
th(SCLK-D)
Setup time, d[3:0] valid before falling sclk edge (Q12)
Hold time, d[3:0] valid after falling sclk edge (Q13)
Setup time, final d[3:0] bit valid before final falling sclk edge
Hold time, final d[3:0] bit valid after final falling sclk edge
1.5
ns
7.3 – P(3)
1.5 + P(3)
ns
ns
(1) Clock Mode 0 (clk polarity = 0 ; clk phase = 0 ) is the mode of operation.
(2) The Device captures data on the falling clock edge in Clock Mode 0, as opposed to the traditional rising clock edge. Although
non-standard, the falling-edge-based setup and hold time timings have been designed to be compatible with standard SPI devices that
launch data on the falling edge in Clock Mode 0.
(3) P = SCLK period in ns.
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8.9.10.3 QSPI Switching Characteristics
NO.
Q1
Q2
Q3
Q4
Q5
Q6
Q7
Q8
PARAMETER
Cycle time, sclk
MIN
25
TYP
MAX
UNIT
ns
tc(SCLK)
tw(SCLKL)
Pulse duration, sclk low
0.5*P – 3(1)
0.5*P – 3
–M*P – 1(2)
N*P – 1(2)
–3.5
ns
tw(SCLKH)
Pulse duration, sclk high
ns
td(CS-SCLK)
td(SCLK-CS)
td(SCLK-D1)
tena(CS-D1LZ)
tdis(CS-D1Z)
td(SCLK-D1)
Delay time, sclk falling edge to cs active edge
Delay time, sclk falling edge to cs inactive edge
Delay time, sclk falling edge to d[0] transition
Enable time, cs active edge to d[0] driven (lo-z)
Disable time, cs active edge to d[0] tri-stated (hi-z)
–M*P + 2.5(2)
N*P + 2.5(2)
7
ns
ns
ns
–P – 4(2)
–P – 4(2)
–P +1(2)
–P +1(2)
ns
ns
Delay time, sclk first falling edge to first d[1] transition
(for PHA = 0 only)
ns
Q9
–3.5 – P(2)
7 – P(2)
(1) P = SCLK period in ns.
(2) M = QSPI_SPI_DC_REG.DDx + 1, N = 2
图 8-15. QSPI Read (Clock Mode 0)
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PHA=0
cs
Q5
Q4
Q1
Q2
Q3
POL=0
sclk
Q8
Q6
Q6
Q7
Q9
Q6
Command
Bit n-1
Command
Bit n-2
Write Data
Bit 1
Write Data
Bit 0
d[0]
d[3:1]
SPRS85v_TIMING_OSPI1_04
图 8-16. QSPI Write (Clock Mode 0)
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8.9.11 JTAG Interface
节 8.9.11.2 and 节 8.9.11.3 assume the operating conditions stated in 节 8.9.11.1.
8.9.11.1 JTAG Timing Conditions
MIN
TYP
MAX
UNIT
Input Conditions
tR
tF
Input rise time
Input fall time
1
1
3
3
ns
ns
Output Conditions
CLOAD
Output load capacitance
2
15
pF
8.9.11.2 Timing Requirements for IEEE 1149.1 JTAG
NO.
MIN
TYP
MAX
UNIT
ns
1
tc(TCK)
Cycle time TCK
66.66
26.67
26.67
2.5
1a
1b
tw(TCKH)
Pulse duration TCK high (40% of tc)
Pulse duration TCK low(40% of tc)
Input setup time TDI valid to TCK high
Input setup time TMS valid to TCK high
Input hold time TDI valid from TCK high
Input hold time TMS valid from TCK high
ns
tw(TCKL)
ns
tsu(TDI-TCK)
tsu(TMS-TCK)
th(TCK-TDI)
th(TCK-TMS)
ns
3
4
2.5
ns
18
ns
18
ns
8.9.11.3 Switching Characteristics Over Recommended Operating Conditions for IEEE 1149.1 JTAG
NO.
PARAMETER
MIN
TYP
MAX
UNIT
2
td(TCKL-TDOV)
Delay time, TCK low to TDO valid
0
25
ns
1
1a
1b
TCK
TDO
2
3
4
TDI/TMS
SPRS91v_JTAG_01
图 8-17. JTAG Timing
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9 Detailed Description
9.1 Overview
The AWR1443 device includes the entire millimeter wave blocks and analog baseband signal chain for three
transmitters (two usable at the same instance) and four receivers, as well as a customer-programmable MCU
with a hardware accelerator for radar signal processing. This device is applicable as a radar-on-a-chip in
use-cases with modest requirements for memory, processing capacity and application code size. These could
be cost-sensitive automotive applications that are evolving from 24 GHz narrowband implementation and some
emerging simple ultra-short-range radar applications. Typical application examples for this device include basic
Blind Spot Detect, Parking Assist, and so forth.
In terms of scalability, the AWR1443 device could be paired with a low-end external MCU, to address more
complex applications that might require additional memory for larger application software footprint and faster
interfaces. Because the AWR1443 device also provides high speed data interfaces, it is suitable for interfacing
with more capable external processing blocks. Here system designers can choose the AWR1443 to provide raw
ADC data or use the on-chip Hardware Accelerator for partial processing viz. first stage Fast Fourier Transform.
9.2 Functional Block Diagram
Cortex R4F
@ 200 MHz
RX1
RX2
RX3
RX4
LNA
LNA
LNA
LNA
IF
IF
IF
IF
ADC
ADC
ADC
ADC
(User programmable)
Digital Front
End
Boot
ROM
Prog RAM* Data RAM*
(Decimation
filter chain)
Serial Flash
interface
QSPI
Radar Data
Memory*
Optional External
MCU interface
SPI
ADC
Buffer
TX1
TX2
TX3
PA
Radar
PMIC control
SPI / I2C
DCAN
Hardware
Accelerator
(FFT, Log-
Mag, and
others.)
Synth
(20 GHz)
Ramp
Generator
PA
PA
x4
Primary communication
interface (automotive)
Debug
UARTs
DMA
For debug
RF Control/
BIST
Mailbox
Test/
Debug
JTAG for debug/
development
Osc.
VMON
Temp
GPADC
Main subsystem
(Customer programmed)
RF/Analog subsystem
* Total RAM available in Main subsystem is 576KB (for Cortex-R4F Program RAM, Data RAM, and Radar Data Memory)
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图 9-1. Functional Block Diagram
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9.3 External Interfaces
The AWR1443 device provides the following external interfaces:
•
•
Reference Clock – Reference clock available for Host Processor after device wakeup.
Low speed control information
– Up to two 4-line standard SPI interface
– One I2C interface (Pin multiplexed with one of the SPI ports)
One Controller Area Network (CAN) Port for Automotive Interfacing
Reset – Active Low reset for device wakeup from host General Purpose IOs
Error Signaling – Used for notifying the host in case the Radio Controller detects a fault
•
•
•
The AWR1443 device comprises of three main blocks – Radar (or the Millimeter Wave) System, Main (or the
Control) System and Processing System.
RADAR System
Radar Processing Inter-connect [128 Bit @ 200MHz]
RF/Analog/Monitoring
FFT
ADC
L3
ACCELERATOR
EDMA
LVDS
BUFFERS
RAM
MAILBOX
(384KB)
2x16KB
Main (Control) System Inter-connect [64 Bit @ 200MHz]
CRC
JTAG
DMA
Peripheral Inter-connect
SPI
Timer
UART
QSPI
CAN
I2C
PWM
SPI
图 9-2. System Interconnect
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9.4 Subsystems
9.4.1 RF and Analog Subsystem
The RF and analog subsystem includes the RF and analog circuitry – namely, the synthesizer, PA, LNA, mixer,
IF, and ADC. This subsystem also includes the crystal oscillator and temperature sensors. The three transmit
channels can be operated up to a maximum of two at a time (simultaneously) for transmit beamforming purpose
as required; whereas the four receive channels can all be operated simultaneously.
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9.4.1.1 Clock Subsystem
The AWR1443 clock subsystem generates 76 to 81 GHz from an input reference of 40-MHz crystal. It has
a built-in oscillator circuit followed by a clean-up PLL and a RF synthesizer circuit. The output of the RF
synthesizer is then processed by an X4 multiplier to create the required frequency in the 76 to 81 GHz spectrum.
The RF synthesizer output is modulated by the timing engine block to create the required waveforms for effective
sensor operation.
The clean-up PLL also provides a reference clock for the host processor after system wakeup.
The clock subsystem also has built-in mechanisms for detecting the presence of a crystal and monitoring the
quality of the generated clock.
图 9-3 describes the clock subsystem.
Self Test
Timing
Engine
RF SYNTH
1 GHz
(fixed clockdomain)
Lock Detect
SoC Clock
Clean-
Up PLL
x4
MULT
XO/
Slicer
CLK Detect
40 MHz
图 9-3. Clock Subsystem
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9.4.1.2 Transmit Subsystem
The AWR1443 transmit subsystem consists of three parallel transmit chains, each with independent phase and
amplitude control. A maximum of 2 transmit chains can be operational at the same time. However all 3 chains
can be operated together in a time multiplexed fashion. The device supports binary phase modulation for MIMO
radar and interference mitigation.
Each transmit chain can deliver a maximum of 12 dBm at the antenna port on the PCB. The transmit chains also
support programmable backoff for system optimization.
图 9-4 describes the transmit subsystem.
Loopback Path
Fine Phase Shifter Control
PCB
6 bits
12dBm
@ 50 Ω
û-
LO
0/180°
(from Timing Engine)
Self Test
图 9-4. Transmit Subsystem (Per Channel)
9.4.1.3 Receive Subsystem
The AWR1443 receive subsystem consists of four parallel channels. A single receive channel consists of an
LNA, mixer, IF filtering, ADC conversion, and decimation. All four receive channels can be operational at the
same time an individual power-down option is also available for system optimization.
Unlike conventional real-only receivers, the AWR1443 device supports a complex baseband architecture, which
uses quadrature mixer and dual IF and ADC chains to provide complex I and Q outputs for each receiver
channel. The AWR1443 is targeted for fast chirp systems. The band-pass IF chain has configurable lower cutoff
frequencies above 175 kHz and can support bandwidths up to 5 MHz.
图 9-5 describes the receive subsystem.
Self Test
DAC
Loopback
Path
DSM
PCB
I
RSSI
50 W
GSG
LO
Q
DSM
DAC
图 9-5. Receive Subsystem (Per Channel)
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9.4.1.4 Radio Processor Subsystem
The Radio Processor subsystem (also referred to as BIST Subsystem in this document) includes the digital
front-end, the ramp generator and an internal processor for control / configuration of the low-level RF/analog
and ramp generator registers. The Radar Processor also schedules periodic monitoring tasks. User applications,
running on
Master (Control) System, do not have direct access to Radar System; access is based on well-defined API
messages (over a hardware channel) from the master subsystem.
备注
This radio processor is programmed by TI and takes care of RF calibration and self-test/monitoring
functions (BIST). This processor is not available directly for customer use/application.
The digital front-end takes care of filtering and decimating the raw sigma-delta ADC output and provides the final
ADC data samples at a programmable sampling rate.
9.4.2 Main (Control) System
The Main (Control) System includes ARM’s automotive grade Cortex-R4F processor clocked at 200 MHz, which
is user programmable. User applications executing on this processor control the overall operation of the device,
including Radar Control via well-defined API messages, radar signal processing (assisted by the radar hardware
accelerator) and peripherals for external interface.
The Main (Control) System plays a big role in enabling autonomous operation of AWR1443 as a radar-on-a-chip
sensor. The device includes a quad serial peripheral interface (QSPI) which can be used to download customer
code directly from a serial flash. A (classic) CAN interface is included that can be used to communicate directly
from the device to a CAN bus. An SPI/I2C interface is available for power management IC (PMIC) control when
the AWR1443 is used as an autonomous sensor.
For more complex applications, the device can operate under the control of an external MCU, which can
communicate with AWR1443 device over an SPI interface. In this case, it is possible to use the AWR14xx as a
radar sensor, providing raw detected objects to the external MCU. External MCU could reduce the application
code complexity residing in the device and makes more memory available for radar data cube inside the
AWR1443. This configuration also eliminates the need for a separate serial flash to be connected to the
AWR1443.
Furthermore, the external MCU can provide faster interfaces, such as CAN-FD or Ethernet, for the radar sensor
to connect to a central processing unit (CPU). In such a distributed configuration, multiple AWR1443 devices
mounted around the vehicle can connect to the CPU, providing a surround view. The external MCU itself
is low-cost, because the low-level radar signal processing is accomplished inside the AWR1443, using the
hardware accelerator, while the higher-layer intelligence and complex algorithms reside in the common CPU,
making the overall solution cost-effective.
Note that although four interfaces – one CAN, one I2C and two SPI interfaces – are present in the AWR1443
device for external communication and PMIC control, only two of these interfaces are usable at any point in time.
The total memory (RAM) available in the Main subsystem is 576 KB. This is partitioned between the R4F
program RAM, R4F data RAM and radar data memory. The maximum usable size for R4F is 448 KB and this
is partitioned between the R4F’s tightly coupled interfaces TCMA (320 KB) and TCMB (128 KB). Although the
complete 448 KB is unified memory and can be used for program or data, typical applications use TCMA as
program and TCMB as data memory.
The remaining memory, starting at a minimum of 128 KB, is available to be used as radar data memory for
storing the ‘radar data cube’. It is possible to increase the radar data memory size in 64 KB increments, at the
cost of corresponding reduction in R4F program or data RAM size. The maximum size of radar data memory
possible is 384 KB. A few example configurations supported are listed in 表 9-1.
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表 9-1. R4F RAM(1)
R4F
R4F DATA
PROGRAM
RAM
RADAR DATA
MEMORY
OPTION
RAM
1
2
3
4
320KB
256KB
256KB
128KB
128KB
128KB
64KB
128KB
192KB
256KB
384KB
64KB
(1) For AWR1443 ES version 1.0, available RAM is 448 KB instead
of 576KB.
The Main Subsystem, Cortex-R4F memory map is shown in 表 9-2.
表 9-2. Main System Memory Map
Frame Address (Hex)
Name
Size
Description
Start
End
CPU Tightly Coupled Memories
TCMA ROM
TCM RAM-A
TCM RAM-B
0x0000_0000
0x0020_0000
0x0800_0000
0x0001_FFFF
0x0024_FFFF
0x0802_FFFF
96KiB
Program ROM
128–320KiB
64–128KiB
Memory size is dependant on the
allocation done in 表 9-1, R4F RAM
System Peripherals
0xF060_1000
0xF060_2000
0xF060_17FF
0xF060_27FF
2KiB
2KiB
RADARSS to MSS mailbox memory space
MSS to RADARSS mailbox memory space
Mail Box
MSS<->RADARSS
MSS to RADARSS mailbox Configuration
Registers
0xF060_8000
0xF060_8060
0xFFFF_E100
0xF060_80FF
0xF060_86FF
0xFFFF_E2FF
188B
188B
756B
RADARSS to MSS mailbox Configuration
Registers
TOP Level Reset, Clock management
registers
0xFFFF_FF00
0xFFFF_EA00
0xFFFF_F800
0xFFFF_FFFF
0xFFFF_EBFF
0xFFFF_FBFF
256B
512KiB
352B
MSS Reset, Clock management registers
IO Mux module registers
PRCM & Control Module
General-purpose control registers
TPCC,TPTC,ADC buffer configuration,
status registers
0x5000_0400
584B
GIO
DMA
VIM
0xFFF7_BC00
0xFFFF_F000
0xFFFF_FD00
0xFFFF_FC00
0xFFFF_EE00
0xFFF7_BDFF
0xFFFF_F3FF
0xFFFF_FEFF
0xFFFF_FCFF
0xFFFF_EEFF
180B
1KiB
512B
192B
192B
GIO module configuration registers
DMA-1 module configuration registers
VIM module configuration registers
RTI-A module
RTI-A
RTI-B
RTI-B module register space
Serial Interfaces and Connectivity
QSPI
0xC000_0000
0xC080_0000
0xFFF7_F400
0xFFF7_F600
0xFFF7_E500
0xFFF7_E700
0xFFF7_DC00
0xFFF7_D400
0x5200_0000
0x5202_0000
0xC07F_FFFF
0xC0FF_FFFF
0xFFF7_F5FF
0xFFF7_F7FF
0xFFF7_E5FF
0xFFF7_E7FF
0xFFF7_DDFF
0xFFF7_D4FF
8MB
116B
512B
512B
148B
148B
512B
112B
16KiB
16KiB
QSPI –Flash Memory space
QSPI module configuration registers
MIBSPI-A module configuration registers
SPI module configuration registers
SCI-A module configuration registers
SCI-B module configuration registers
CAN module configuration registers
I2C module configuration registers
ADC ping pong buffer memory space
Common buffer memory space
MIBSPI
SPI
SCI-A/UART
SCI-B/UART
CAN
I2C
ADC Buffer
CBUF_FIFO
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表 9-2. Main System Memory Map (continued)
Frame Address (Hex)
Name
Size
Description
Start
End
0x5008_0000
0x5008_0800
0x5008_1000
0x5203_0000
0x5203_8000
0x5008_07FF
0x5008_0FFF
512B
264B
4KiB
FFT Accelerator PARAM memory
FFT accelerator Configuration registors
FFT accelerator Window registers
FFT accelerator Memory -1 space
FFT accelerator Memory -2 space
Hardware FFT accelerator
0x5203_7FFF
32KiB
32KiB
L3 Memory
L3 Shared Memory
0x5100_0000
384KiB
L3 Shared memory space
Interconnects
0xFFF7_87FF
0xFCFF_17FF
PCR
PCR-2
0xFFF7_8000
0xFCFF_1000
0x5207_0000
1KiB
1KiB
128B
PCR-1 interconnect configuration port
PCR-2 interconnect configuration port
128 bit SCR configuration port
128 bit SCR
Safety Modules
CRC
PBIST
STC
0xFE00_0000
0xFFFF_E400
0xFFFF_E600
0xFFFF_EC00
0xFFFF_F400
0xFFFF_F500
0xFFFF_F600
0xFEFF_FFFF
0xFFFF_E5FF
0xFFFF_E7FF
0xFFFF_ECFF
0xFFFF_F4FF
0xFFFF_F5FF
0xFFFF_F6FF
16KiB
464B
284B
44B
CRC module configuration registers
PBIST module configuration registers
STC module configuration registers
DCC-A module configuration registers
DCC-B module configuration registers
ESM module configuration registers
CCMR4 module configuration registers
DCC-A
DCC-B
ESM
44B
156B
136B
CCMR4
Peripheral Memories (System & Non System)
CAN RAM
DMA RAM
0xFF1E_0000
0xFFF8_0000
0xFFF8_2000
0xFF0E_0000
0xFF0E_0200
0xFF1F_FFFF
0xFFF8_0FFF
0xFFF8_2FFF
0xFF0E_01FF
0xFF0E_03FF
128KB
4KB
CAN RAM memory space
DMA RAM memory space
VIM RAM
2KB
VIM RAM memory space
MIBSPIA-TX RAM
MIBSPIA- RX RAM
0.5KB
0.5KB
MIBSPIA-TX RAM memory space
MIBSPIA- RX RAM memory space
Debug Modules
0xFFAF_FFFF
Debug subsystem memory space and
registers
Debug Sub System
0xFFA0_0000
244KiB
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9.4.3 Host Interface
The AWR1443 device communicates with the host radar processor over the following main interfaces:
•
•
Reference Clock – Reference clock available for host processor after device wakeup
Control – 4-port standard SPI (peripheral) for host control . All radio control commands (and response) flow
through this interface.
•
•
•
Reset – Active-low reset for device wakeup from host
Out-of-band interrupt
Error – Used for notifying the host in case the radio controller detects a fault
9.5 Accelerators and Coprocessors
The Processing System in the AWR1443 device is an accelerator for FFT operations. The Radar Hardware
Accelerator is an IP that enables off-loading the burden of certain frequently used computations in FMCW radar
signal processing from the main processor. It is well-known that FMCW radar signal processing involves the use
of FFT and Log-Magnitude computations in order to obtain a radar image across the range, velocity and angle
dimensions. Some of the frequently used functions in FMCW radar signal processing can be done within the
Radar Hardware Accelerator, while still retaining the flexibility of implementing other proprietary algorithms in the
Master System processor.
Key features of the Radar Processing Accelerator are:
•
•
FFT computation, with programmable FFT sizes (powers of 2) up to 1024-pt complex FFT
Internal FFT bit-width of 24 bits (each for I and Q) for good SQNR performance, with fully programmable
butterfly scaling at every radix-2 stage for user flexibility
•
Built-in capabilities for simple pre-FFT processing – specifically, programmable windowing, basic interference
zeroing-out and basic BPM removal
•
•
Magnitude (absolute value) and Log-Magnitude computation capability
Flexible data flow and data sample arrangement to support efficient multi-dimensional FFT operations and
transpose accesses as required
•
Chaining and Looping mechanism to sequence a set of accelerator operations one-after-another with minimal
intervention from the main processor
•
•
CFAR-CA detector support (linear and logarithmic)
Miscellaneous other capabilities of the accelerator
– Stitching two or four 1024-point FFTs to get the equivalent of 2048-point or 4096-point FFT for industrial
level sensing applications where large FFT sizes are required
– Slow DFT mode, with resolution equivalent to 16K size FFT, for FFT peak interpolation (eg. range
interpolation) purpose
– Complex Vector Multiplication and Dot product capability for vectors of size up to 512
9.6 Other Subsystems
9.6.1 ADC Channels (Service) for User Application
The AWR1443 device includes provision for an ADC service for user application, where the
GPADC engine present inside the device can be used to measure up to six external voltages. The ADC1, ADC2,
ADC3, ADC4, ADC5, and ADC6 pins are used for this purpose.
•
ADC itself is controlled by TI firmware running inside the BIST subsystem and access to it for customer’s
external voltage monitoring purpose is via ‘monitoring API’ calls routed to the BIST subsystem. This API
could be linked with the user application running on MSS R4F.
•
BIST subsystem firmware will internally schedule these measurements along with other RF and Analog
monitoring operations. The API allows configuring the settling time (number of ADC samples to skip) and
number of consecutive samples to take. At the end of a frame, the minimum, maximum and average of the
readings will be reported for each of the monitored voltages.
GPADC Specifications:
625 Ksps SAR ADC
•
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•
•
•
0 to 1.8V input range
10-bit resolution
For 5 out of the 6 inputs, an optional internal buffer is available. Without the buffer, the ADC has a switched
capacitor input load modeled with 5pF of sampling capacitance and 12pF parasitic capacitance (GPADC
channel 6, the internal buffer is not available).
5
ANALOG TEST 1-4,
GPADC
ANAMUX
5
VSENSE
A. GPADC structures are used for measuring the output of internal temperature sensors. The accuracy of these measurements is ±7°C.
图 9-6. ADC Path
9.6.1.1 GP-ADC Parameter
PARAMETER
TYP
1.8
UNIT
V
ADC supply
ADC unbuffered input voltage range
ADC buffered input voltage range(1)
ADC resolution
0 – 1.8
0.4 – 1.3
10
V
V
bits
LSB
LSB
LSB
LSB
Ksps
ns
ADC offset error
±5
ADC gain error
±5
ADC DNL
–1/+2.5
±2.5
625
400
10
ADC INL
ADC sample rate(2)
ADC sampling time(2)
ADC internal cap
pF
ADC buffer input capacitance
ADC input leakage current
2
pF
3
uA
(1) Outside of given range, the buffer output will become nonlinear.
(2) ADC itself is controlled by TI firmware running inside the BIST subsystem. For more details please refer to the API calls.
9.7 Boot Modes
As soon as device reset is de-asserted, the R4F processor of the Main (Control) system starts executing its
bootloader from an on-chip ROM memory.
The bootloader of the Main system operates in two basic modes and these are specified on the user hardware
(Printed Circuit Board) by configuring what are termed as “Sense on Power” (SOP) pins. These pins on the
device boundary are scanned by the bootloader firmware and choice of mode for bootloader operation is made.
表 9-3 enumerates the relevant SOP combinations and how these map to bootloader operation.
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表 9-3. SOP Combinations
SOP2 (P13)
SOP1 (P11)
SOP0 (J13)
BOOTLOADER MODE AND OPERATION
Functional Mode
0
0
1
Device Bootloader loads user application from QSPI Serial Flash to
internal RAM and switches the control to it
Flashing Mode
1
0
0
1
1
1
Device Bootloader spins in loop to allow flashing of user application
(or device firmware patch – Supplied by TI) to the serial flash
Debug Mode
Bootloader is bypassed and R4F processor is halted. This allows
user to connect emulator at a known point
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9.7.1 Flashing Mode
In Flashing Mode, the Main System’s bootloader enables the UART driver and expects a data stream comprising
of User Application (Binary Image) and Device Firmware (referred to as Device Firmware Patch or Service Pack)
from an external flashing utility. 图 9-7 shows the flashing utility executing on a PC platform, but the protocol can
be accomplished on an embedded platform as well.
Serial
FLASH
User Application
And device firmware
Flashing
ROM
UART
FLASHING
UTILITY
Program
RAM
Integrated MCU
ARM Cortex-R4F
Radar
Section
RAM
Data
RAM
图 9-7. Figure 5. Bootloader Flashing Mode
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9.7.2 Functional Mode
In Functional Mode, the Main System’s bootloader looks for a valid image in the serial flash memory, interfaced
over the QSPI port. If a valid image is found, the bootloader transfers the same to Main System’s memory
subsystem. If the device firmware image is found, it gets transferred to the Radar section’s memory subsystem.
If a valid image (or the QSPI Serial Flash is not found), the bootloader initializes the SPI port and awaits for the
image transfer. This operation comes handy for configurations where the AWR1443 is interfaced to an external
processor which has its own nonvolatile storage hence can store the user application and the AWR1443 device’s
firmware image.
User Application is Loaded
Serial
From FLASH to R4F RAM and
Flash
Device Patch to Radar Section
ROM
UART
Data
RAM
Integrated MCU
ARM Cortex-R4F
Radar
Section
RAM
Histogram
RAM
External
Processor
SPI
User Application is Loaded
From FLASH to R4F RAM and
Device Patch to Radar Section
图 9-8. Bootloader’s Functional Mode
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10 Applications, Implementation, and Layout
备注
Information in the following Applications section is not part of the TI component specification, and
TI does not warrant its accuracy or completeness. TI's customers are responsible for determining
suitability of components for their purposes. Customers should validate and test their design
implementation to confirm system functionality.
10.1 Application Information
Key device features driving the following applications are:
•
•
•
Integration of Radar Front End and Programmable MCU
On-chip Hardware Accelerator for Radar Data Processing
Flexible boot modes: Autonomous Application boot using a serial flash or external boot over SPI.
10.2 Short-Range Radar
40-MHz
Crystal
Power
Management
Antenna
Structure
RX1
Integrated MCU
AcceARM Cortex-R4F
and
Hardware
Accelerator for
Radar Processing
RX2
RX3
Radar
Front End
RX4
SPI
TX1
TX2
Control
TX3
Detected
Objects
AWR1443
图 10-1. Short-Range Radar
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10.3 Blind Spot Detector and Ultrasonic Upgrades
40-MHZ
Crystal
Serial
Flash
Power
Management
Antenna
Structure
RX1
RX2
RX3
RX4
Integrated MCU
ARM Cortex-R4F
and
Hardware
Accelerator for
Radar Processing
Radar
Front End
Automotive
Network
CAN
PHY
CAN
TX1
TX2
TX3
AWR1443
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10.4 Reference Schematic
The reference schematic and power supply information can be found in the AWR1443 EVM Documentation.
Listed for convenience are: Design Files, Schematics, Layouts, and Stack up for PCB.
•
•
Altium AWR1443 EVM Design Files
AWR1443 EVM Schematic Drawing, Assembly Drawing, and Bill of Materials
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11 Device and Documentation Support
TI offers an extensive line of development tools. Tools and software to evaluate the performance of the device,
generate code, and develop solutions follow.
11.1 Device Nomenclature
To designate the stages in the product development cycle, TI assigns prefixes to the part numbers of all
microprocessors (MPUs) and support tools. Each device has one of three prefixes: X, P, or null (no prefix) (for
example, AWR1443). Texas Instruments recommends two of three possible prefix designators for its support
tools: TMDX and TMDS. These prefixes represent evolutionary stages of product development from engineering
prototypes (TMDX) through fully qualified production devices and tools (TMDS).
Device development evolutionary flow:
X
P
Experimental device that is not necessarily representative of the final device's electrical specifications and
may not use production assembly flow.
Prototype device that is not necessarily the final silicon die and may not necessarily meet final electrical
specifications.
null Production version of the silicon die that is fully qualified.
Support tool development evolutionary flow:
TMDX Development-support product that has not yet completed Texas Instruments internal qualification testing.
TMDS Fully-qualified development-support product.
X and P devices and TMDX development-support tools are shipped against the following disclaimer:
"Developmental product is intended for internal evaluation purposes."
Production devices and TMDS development-support tools have been characterized fully, and the quality and
reliability of the device have been demonstrated fully. TI's standard warranty applies.
Predictions show that prototype devices (X or P) have a greater failure rate than the standard production
devices. Texas Instruments recommends that these devices not be used in any production system because their
expected end-use failure rate still is undefined. Only qualified production devices are to be used.
TI device nomenclature also includes a suffix with the device family name. This suffix indicates the package
type (for example, ABL0161 ALB0161), the temperature range (for example, blank is the default commercial
temperature range). 图 11-1 provides a legend for reading the complete device name for any AWR1443 device.
For orderable part numbers of AWR1443 devices in the ABL0161 package types, see the Package Option
Addendum of this document , the TI website (www.ti.com), or contact your TI sales representative.
For additional description of the device nomenclature markings on the die, see the AWR1443 Device Errata .
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1
4
43
Q
I
AWR
G
ABL
Q1
Qualification
Q1 = AEC-Q100
Blank = no special Qual
Prefix
AWR = Production
Tray or Tape & Reel
Generation
1 = 76 œ 81 GHz
R = Big Reel
Blank = Tray
Variant
2 = FE
4 = FE + FFT + MCU
6 = FE + MCU + DSP + 1.5 MB
Package
ABL = BGA
Security
Num RX/TX Channels
G = General
S = Secure
D = Development Secure
RX = 1,2,3,4
TX = 1,2,3
Silicon PG Revision
Blank = Rev 1.0
E = Rev 2.0
Temperature (Tj)
C = 0°C to 70°C
K = œ40°C to 85°C
A = œ40°C to 105°C
I = œ40°C to 125°C
F = Rev 3.0
Features
Blank = Baseline
P = High Performance
Safety
Q = Non-Functional Safety
图 11-1. Device Nomenclature
11.2 Tools and Software
Models
AWR1443 BSDL model
AWR1x43 IBIS model
Boundary scan database of testable input and output pins for IEEE 1149.1 of the
specific device.
IO buffer information model for the IO buffers of the device. For simulation on a
circuit board, see IBIS Open Forum.
AWR1443 checklist for
schematic review, layout
review, bringup/wakeup
A set of steps in spreadsheet form to select system functions and pinmux options.
Specific EVM schematic and layout notes to apply to customer engineering. A
bringup checklist is suggested for customers.
11.3 Documentation Support
To receive notification of documentation updates, navigate to the device product folder on ti.com. Click on
Subscribe to updates to register and receive a weekly digest of any product information that has changed. For
change details, review the revision history included in any revised document.
The current documentation that describes the DSP, related peripherals, and other technical collateral follows.
Errata
AWR1443 device errata Describes known advisories, limitations, and cautions on silicon and provides
workarounds.
11.4 支持资源
TI E2E™ 支持论坛是工程师的重要参考资料,可直接从专家获得快速、经过验证的解答和设计帮助。搜索现有解
答或提出自己的问题可获得所需的快速设计帮助。
链接的内容由各个贡献者“按原样”提供。这些内容并不构成 TI 技术规范,并且不一定反映 TI 的观点;请参阅 TI
的《使用条款》。
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11.5 Trademarks
TI E2E™ is a trademark of Texas Instruments.
®, Arm®, and Cortex® are registered trademarks of ARM Limited.
所有商标均为其各自所有者的财产。
11.6 静电放电警告
静电放电 (ESD) 会损坏这个集成电路。德州仪器 (TI) 建议通过适当的预防措施处理所有集成电路。如果不遵守正确的处理
和安装程序,可能会损坏集成电路。
ESD 的损坏小至导致微小的性能降级,大至整个器件故障。精密的集成电路可能更容易受到损坏,这是因为非常细微的参
数更改都可能会导致器件与其发布的规格不相符。
11.7 术语表
TI 术语表
本术语表列出并解释了术语、首字母缩略词和定义。
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12 Mechanical, Packaging, and Orderable Information
12.1 Packaging Information
The following pages include mechanical, packaging, and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and revision of
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.
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PACKAGE OUTLINE
ABL0161B
FCBGA - 1.17 mm max height
SCALE 1.400
PLASTIC BALL GRID ARRAY
10.5
10.3
B
A
BALL A1 CORNER
10.5
10.3
1.17 MAX
C
SEATING PLANE
0.1 C
BALL TYP
0.37
0.27
TYP
9.1 TYP
PKG
(0.65) TYP
(0.65) TYP
R
P
N
M
L
K
J
PKG
H
G
F
9.1
TYP
E
D
C
0.45
161X
0.35
0.15
0.08
C A B
C
B
A
0.65 TYP
BALL A1 CORNER
1
2
3
4
5
6
7
8
9 10 11
12 13 14 15
0.65 TYP
4223365/A 10/2016
NOTES:
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
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EXAMPLE BOARD LAYOUT
ABL0161B
FCBGA - 1.17 mm max height
PLASTIC BALL GRID ARRAY
(0.65) TYP
161X ( 0.32)
1
2
3
4
5
6
7
8
9
10 11 12 13 14 15
A
B
C
(0.65) TYP
D
E
F
G
H
J
PKG
K
L
M
N
P
R
PKG
LAND PATTERN EXAMPLE
SCALE:10X
0.05 MAX
0.05 MIN
METAL UNDER
SOLDER MASK
( 0.32)
METAL
(
0.32)
SOLDER MASK
OPENING
SOLDER MASK
OPENING
SOLDER MASK
DEFINED
NON-SOLDER MASK
DEFINED
(PREFERRED)
SOLDER MASK DETAILS
NOT TO SCALE
4223365/A 10/2016
NOTES: (continued)
3. Final dimensions may vary due to manufacturing tolerance considerations and also routing constraints.
For information, see Texas Instruments literature number SPRAA99 (www.ti.com/lit/spraa99).
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EXAMPLE STENCIL DESIGN
ABL0161B
FCBGA - 1.17 mm max height
PLASTIC BALL GRID ARRAY
(0.65) TYP
161X ( 0.32)
1
2
3
4
5
6
7
8
9
10 11 12 13 14 15
A
B
C
(0.65) TYP
D
E
F
G
H
J
PKG
K
L
M
N
P
R
PKG
SOLDER PASTE EXAMPLE
BASED ON 0.125 mm THICK STENCIL
SCALE:10X
4223365/A 10/2016
NOTES: (continued)
4. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release.
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PACKAGE OPTION ADDENDUM
www.ti.com
2-Jun-2023
PACKAGING INFORMATION
Orderable Device
AWR1443FQIGABLQ1
AWR1443FQIGABLRQ1
Status Package Type Package Pins Package
Eco Plan
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
-40 to 125
Device Marking
Samples
Drawing
Qty
(1)
(2)
(3)
(4/5)
(6)
ACTIVE
FCCSP
FCCSP
ABL
161
161
176
RoHS & Green
Call TI
Level-3-260C-168 HR
Level-3-260C-168 HR
AWR1443
Samples
Samples
IG
964FC
ACTIVE
ABL
1000 RoHS & Green
Call TI
-40 to 125
AWR1443
IG
964FC
(1) The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based
flame retardants must also meet the <=1000ppm threshold requirement.
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6)
Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two
lines if the finish value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
Addendum-Page 1
PACKAGE OPTION ADDENDUM
www.ti.com
2-Jun-2023
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
Addendum-Page 2
PACKAGE MATERIALS INFORMATION
www.ti.com
3-Jun-2023
TRAY
L - Outer tray length without tabs
KO -
Outer
tray
height
W -
Outer
tray
width
Text
P1 - Tray unit pocket pitch
CW - Measurement for tray edge (Y direction) to corner pocket center
CL - Measurement for tray edge (X direction) to corner pocket center
Chamfer on Tray corner indicates Pin 1 orientation of packed units.
*All dimensions are nominal
Device
Package Package Pins SPQ Unit array
Max
matrix temperature
(°C)
L (mm)
W
K0
P1
CL
CW
Name
Type
(mm) (µm) (mm) (mm) (mm)
AWR1443FQIGABLQ1
ABL
FCCSP
161
176
8 x 22
150
315 135.9 7620 13.4
16.8
17.2
Pack Materials-Page 1
GENERIC PACKAGE VIEW
ABL 161
10.4 x 10.4, 0.65 mm pitch
FCBGA - 1.17 mm max height
PLASTIC BALL GRID ARRAY
This image is a representation of the package family, actual package may vary.
Refer to the product data sheet for package details.
4225978/A
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