BQ4852YMC-85 [TI]

RTC Module With 512Kx8 NVSRAM; RTC模块512Kx8 NVSRAM
BQ4852YMC-85
型号: BQ4852YMC-85
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

RTC Module With 512Kx8 NVSRAM
RTC模块512Kx8 NVSRAM

外围集成电路 静态存储器 光电二极管 双倍数据速率 时钟
文件: 总16页 (文件大小:591K)
中文:  中文翻译
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bq4852Y  
RTC Module With 512Kx8 NVSRAM  
Registers for the rea l-time clock,  
alarm and other special functions  
Features  
General Description  
I n t e gr a t e d S R AM , r e a l-t im e  
clock, CPU supervisor, crysta l,  
power-fa il con t r ol cir cu it , a n d  
battery  
The bq4852Y RTC Module is a non-  
volatile 4,194,304-bit SRAM organ-  
ized as 524,288 words by 8 bits with  
a n in t egr a l a ccessible r ea l-t im e  
clock and CPU supervisor. The CPU  
supervisor provides a programmable  
watchdog timer and a microproces-  
sor reset. Other features include  
alarm, power-fail, and periodic inter-  
rupts, and a battery-low warning.  
are located in registers 7FFF0h–  
7FFFFh of the memory array.  
The clock and alarm registers are  
du a l-por t r ea d/wr it e SRAM loca-  
tions that are updated once per sec-  
ond by a clock control circuit from  
the internal clock counters. The  
dual-port registers allow clock up-  
dates to occur without interrupting  
n or m a l a ccess t o t h e r est of t h e  
SRAM array.  
Rea l-Tim e Clock cou n t s h u n-  
dredths of seconds through years  
in BCD format  
RAM-like clock access  
Compatible with industry-  
The device combines an internal lith-  
ium battery, quartz crystal, clock and  
power-fail chip, and a full CMOS  
SRAM in a plastic 36-pin DIP mod-  
ule. The RTC Module directly re-  
places industry-standard SRAMs and  
also fits into many EPROM and EE-  
PROM sockets without any require-  
ment for special write timing or limi-  
tations on the number of write cycles.  
standard 512K x 8 SRAMs  
The bq4852Y also contains a power-  
fail-detect circuit. The circuit dese-  
lects the device whenever VCC falls  
below tolerance, providing a high de-  
gree of data security. The battery is  
electrically isolated when shipped  
from the factory to provide maxi-  
mum battery capacity. The battery  
remains disconnected until the first  
Unlimited write cycles  
10-year minimum data retention  
and clock operation in the ab-  
sence of power  
Automatic power-fail chip dese-  
lect and write-protection  
Watchdog timer, power-on reset,  
alarm/periodic interrupt, power-  
fail and battery-low warning  
application of VCC  
.
Soft wa r e clock ca libr a t ion for  
gr e a t e r t h a n ±1 m in u t e p e r  
month accuracy  
Pin Connections  
Pin Names  
A0–A18  
CE  
Address input  
Chip enable  
RST  
NC  
36  
V
CC  
1
2
3
4
5
6
7
8
NC  
35  
34  
33  
32  
31  
30  
29  
28  
27  
26  
A
A
A
A
A
A
6
A
A
4
A
A
2
A
INT  
18  
16  
14  
12  
A
A
15  
17  
RST  
WE  
Microprocessor reset  
Write enable  
WE  
A
A
A
9
A
13  
8
7
9
OE  
Output enable  
5
10  
11  
12  
13  
14  
15  
16  
17  
18  
11  
OE  
3
DQ0–DQ7 Data in/data out  
A
25  
24  
23  
22  
21  
20  
19  
10  
CE  
DQ  
1
INT  
VCC  
VSS  
Programmable interrupt  
A
0
7
DQ  
0
DQ  
DQ  
DQ  
DQ  
6
5
4
3
DQ  
+5 volts  
Ground  
1
DQ  
2
V
SS  
36-Pin DIP Module  
PN485201.eps  
Aug. 1996  
1
bq4852Y  
modes, power-on reset timing, watchdog timer activa-  
tion, and interrupt generation.  
Functional Description  
Figure 1 is a block diagram of the bq4852Y. The follow-  
ing sections describe the bq4852Y functional operation,  
including memory and clock interface, data-retention  
Internal  
Quartz  
Crystal  
Time-  
Base  
Oscillator  
.
.
.
.
.
.
-
-
-
64  
8
64  
4
3
:
16 1 MUX  
Control/Status  
Registers  
CE  
OE  
RST  
INT  
Reset and  
DQ -DQ  
Interrupt  
0
7
Clock/Calendar,  
Alarm,  
P
Bus  
I/F  
Generator  
and Control Bytes  
AD -AD  
0
18  
User Buffer  
(16 Bytes)  
WE  
Clock/Calendar  
Update  
Storage  
Registers  
(524,288 Bytes)  
V
Power-  
Fail  
Control  
CC  
Write-  
Protect  
Internal  
Battery  
BD-962  
Figure 1. Block Diagram  
Truth Table  
VCC  
CE  
VIH  
VIL  
VIL  
VIL  
X
OE  
X
WE  
X
Mode  
Deselect  
Write  
DQ  
Power  
Standby  
Active  
< VCC (max.)  
High Z  
DIN  
X
VIL  
VIH  
VIH  
X
> VCC (min.)  
VIL  
VIH  
X
Read  
DOUT  
Active  
Read  
High Z  
High Z  
High Z  
Active  
< VPFD (min.) > VSO  
Deselect  
Deselect  
CMOS standby  
X
X
X
Battery-backup mode  
VSO  
Aug. 1996  
2
bq4852Y  
output data remains valid for tOH (output data hold time),  
but goes indeterminate until the next address access.  
Address Map  
The bq4852Y provides 16 bytes of clock and control status  
registers and 524,272 bytes of storage RAM.  
Write Mode  
Figure 2 illustrates the address map for the bq4852Y. Table  
1 is a map of the bq4852Y registers, and Table 2 describes  
the register bits.  
The bq4852Y is in write mode whenever WE and CE are  
active. The start of a write is referenced from the latter-  
occurring falling edge of WE or CE. A write is terminated  
by the earlier rising edge of WE or CE. The addresses  
must be held valid throughout the cycle. CE or WE must  
return high for a minimum of tWR2 from CE or tWR1 from  
WE prior to the initiation of another read or write cycle.  
Memory Interface  
Read Mode  
Data-in must be valid tDW prior to the end of write and re-  
main valid for tDH1 or tDH2 afterward. OE should be kept  
high during write cycles to avoid bus contention; although,  
if the output bus has been activated by a low on CE and  
OE, a low on WE disables the outputs tWZ after WE falls.  
The bq4852Y is in read mode whenever OE (output enable)  
is low and CE (chip enable) is low. The device architecture  
allows ripple-through access of data from eight of 4,194,304  
locations in the static storage array. Thus, the unique ad-  
dress specified by the 19 address inputs defines which one  
of the 524,288 bytes of data is to be accessed. Valid data is  
available at the data I/O pins within tAA (address access  
time) after the last address input signal is stable, providing  
that the CE and OE (output enable) access times are also  
satisfied. If the CE and OE access times are not met, valid  
data is available after the latter of chip enable access time  
(tACE) or output enable access time (tOE).  
Data-Retention Mode  
With valid VCC applied, the bq4852Y operates as a  
conventional static RAM. Should the supply voltage  
decay, t he RAM a ut om a t ica lly power-fa il deselect s,  
write-protecting itself tWPT after VCC falls below VPFD  
.
All outputs become high impedance, and all inputs are  
treated as dont care.”  
CE and OE control the state of the eight three-state data  
I/O signals. If the outputs are activated before tAA, the data  
lines are driven to an indeterminate state until tAA. If the  
address inputs are changed while CE and OE remain low,  
If power-fail detection occurs during a valid access, the  
memory cycle continues to completion. If the memory cycle  
fails to terminate within time tWPT, write-protection takes  
0
1
Year  
7FFFF  
7FFFE  
7FFFD  
7FFFC  
7FFFB  
7FFFA  
7FFF9  
7FFF8  
7FFF7  
7FFF6  
7FFF5  
7FFFF  
Clock and  
Control Status  
Registers  
16 Bytes  
Month  
Date  
7FFF0  
2
7FFEF  
3
Days  
4
Hours  
5
Minutes  
6
Seconds  
Control  
7
8
Watchdog  
Interrupts  
Storage  
RAM  
524,272  
Bytes  
9
10  
11  
Alarm Date  
Alarm Hours 7FFF4  
12 Alarm Minutes 7FFF3  
Alarm Seconds  
13  
14  
15  
7FFF2  
7FFF1  
7FFF0  
Tenths/  
Hundredths  
0000  
Flags  
FG4852Y1  
Figure 2. Address Map  
3
Aug. 1996  
bq4852Y  
place. When VCC drops below VSO, the control circuit  
switches power to the internal energy source, which pre-  
serves data.  
are inhibited. Once the frozen clock information is re-  
trieved by reading the appropriate clock memory loca-  
tions, the read bit should be reset to 0 in order to allow  
updates to occur from the internal counters. Because  
the internal counters are not halted by setting the read  
bit, reading the clock locations has no effect on clock ac-  
curacy. Once the read bit is reset to 0, within one second  
the internal registers update the user-accessible regis-  
ters with the correct time. A halt command issued dur-  
ing a clock update allows the update to occur before  
freezing the data.  
The internal coin cell maintains data in the bq4852Y af-  
ter the initial application of VCC for an accumulated period  
of at least 10 years when VCC is less than VSO. As system  
power returns and VCC rises above VSO, the battery is discon-  
nected, and the power supply is switched to external VCC  
.
Write-protection continues for tCER after VCC reaches VPFD to  
allow for processor stabilization. After tCER, normal RAM op-  
eration can resume.  
Setting the Clock  
Clock Interface  
Bit D7 of the control register is the write bit. Like the  
read bit, the write bit when set to a 1 halts updates to  
the clock/calendar memory locations. Once frozen, the  
locations can be written with the desired information in  
24-hour BCD format. Resetting the write bit to 0 causes  
the written values to be transferred to the internal clock  
counters and allows updates to the user-accessible regis-  
ters to resume within one second. Use the write bit, D7,  
only when updating the time registers (7FFFF–7FFF9).  
Reading the Clock  
The interface to the clock and control registers of the  
bq4852Y is the same as that for the general-purpose  
storage memory. Once every second, the user-accessible  
clock/calendar locations are updated simultaneously  
from the internal real time counters. To prevent reading  
data in transition, updates to the bq4852Y clock regis-  
ters should be halted. Updating is halted by setting the  
read bit D6 of the control register to 1. As long as the  
read bit is 1, updates to user-accessible clock locations  
Table 1. bq4842 Clock and Control Register Map  
Address  
7FFFF  
7FFFF  
7FFFD  
7FFFC  
7FFFB  
7FFFA  
7FFF9  
7FFF8  
7FFF7  
7FFF6  
7FFF5  
7FFF4  
7FFF3  
7FFF2  
7FFF1  
7FFF0  
D7  
D6  
D5  
X
D4  
D3  
D2  
Year  
D1  
D0  
Range (h)  
00–99  
01–12  
01–31  
01–07  
00–23  
00–59  
00–59  
00–31  
Register  
Year  
10 Years  
X
X
X
X
10 Month  
Month  
Date  
Month  
10 Date  
Date  
X
FTE  
X
X
X
X
Day  
Hours  
Days  
X
10 Hours  
Hours  
X
10 Minutes  
10 Seconds  
S
Minutes  
Seconds  
Minutes  
OSC  
W
Seconds  
R
Calibration  
Control  
WDS  
AIE  
ALM3  
ALM2  
ALM1  
ALM0  
BM4  
BM3  
BM2  
PIE  
BM1  
RS3  
BM0  
RS2  
WD1 WD0  
RS1 RS0  
Watchdog  
Interrupts  
Alarm date  
Alarm hours  
Alarm minutes  
Alarm seconds  
0.1/0.01 seconds  
Flags  
PWRIE ABE  
X
X
10-date alarm  
10-hour alarm  
Alarm date  
Alarm hours  
Alarm minutes  
Alarm seconds  
0.01 seconds  
01–31  
00–23  
00–59  
00–59  
00–99  
Alarm 10 minutes  
Alarm 10 seconds  
0.1 seconds  
AF PWRF  
WDF  
BLF  
PF  
X
X
X
Notes:  
X = Unused bits; can be written and read.  
Clock/Calendar data in 24-hour BCD format.  
BLF = 1 for low battery.  
OSC = 1 stops the clock oscillator.  
Interrupt enables are cleared on power-up.  
Aug. 1996  
4
bq4852Y  
adjust the calibration based on the typical operating  
temperature of individual applications.  
Table 2. Clock and Control Register Bits  
The software calibration bits are located in the control  
register. Bits D0–D4 control the magnitude of correc-  
tion, and bit D5 the direction (positive or negative) of  
correction. Assuming that the oscillator is running at  
exactly 32,786 Hz, each calibration step of D0–D4 ad-  
justs the clock rate by +4.068 ppm (+10.7 seconds per  
month) or -2.034 ppm (-5.35 seconds per month) depend-  
ing on the value of the sign bit D5. When the sign bit is  
1, positive adjustment occurs; a 0 activates negative ad-  
justment. The total range of clock calibration is +5.5 or  
-2.75 minutes per month.  
Bits  
Description  
Alarm interrupt enable in  
battery-backup mode  
ABE  
AF  
Alarm interrupt flag  
AIE  
Alarm interrupt enable  
ALM0–ALM3 Alarm repeat rate  
BLF  
Battery-low flag  
BM0–BM4  
FTE  
Watchdog multiplier  
Frequency test mode enable  
Oscillator stop  
Two methods can be used to ascertain how much cali-  
bration a given bq4852Y may require in a system. The  
first involves simply setting the clock, letting it run for a  
month, and then comparing the time to an accurate  
known reference like WWV radio broadcasts. Based on  
the variation to the standard, the end user can adjust  
the clock to match the systems environment even after  
the product is packaged in a non-serviceable enclosure.  
The only requirement is a utility that allows the end  
user to access the calibration bits in the control register.  
OSC  
PF  
Periodic interrupt flag  
Periodic interrupt enable  
Power-fail interrupt flag  
Power-fail interrupt enable  
Read clock enable  
PIE  
PWRF  
PWRIE  
R
RS0–RS3  
S
Periodic interrupt rate  
Calibration sign  
The second approach uses a bq4852Y test mode. When  
the frequency test mode enable bit FTE in the days reg-  
ister is set to a 1, and the oscillator is running at exactly  
32,768 Hz, the LSB of the seconds register toggles at  
512 Hz. Any deviation from 512 Hz indicates the degree  
and direction of oscillator frequency shift at the test  
temperature. For example, a reading of 512.01024 Hz  
W
Write clock enable  
WD0–WD1  
WDF  
WDS  
Watchdog resolution  
Watchdog flag  
indicates a (1E6 0.01024)/512 or +20 ppm oscillator fre-  
Watchdog steering  
*
quency error, requiring ten steps of negative calibration  
(10 -2.034 or -20.34) or 001010 to be loaded into the calibra-  
*
Stopping and Starting the Clock Oscillator  
The OSC bit in the seconds register turns the clock on or  
off. If the bq4852Y is to spend a significant period of  
time in storage, the clock oscillator can be turned off to  
preserve battery capacity. OSC set to 1 stops the clock  
oscillator. When OSC is reset to 0, the clock oscillator is  
turned on and clock updates to user-accessible memory  
locations occur within one second.  
The OSC bit is set to 1 when shipped from the Bench-  
marq factory.  
Calibrating the Clock  
The bq4852Y real-time clock is driven by a quartz con-  
trolled oscillator with a nominal frequency of 32,768 Hz.  
The quartz crystal is contained within the bq4852Y  
package along with the battery. The clock accuracy of  
the bq4852Y module is tested to be within 20ppm or  
about 1 minute per month at 25°C. The oscillation rates  
of crystals change with temperature as Figure 3 shows.  
To compensate for the frequency shift, the bq4852Y of-  
fers onboard software clock calibration. The user can  
Figure 3. Frequency Error  
Aug. 1996  
5
bq4852Y  
tion byte for correction. To read the test frequency, the  
bq4852Y must be selected and held in an extended read  
of the seconds register, location 7FFF9, without having  
the read bit set. The frequency appears on DQ0. The FTE  
bit must be set using the write bit control. The FTE bit must  
be reset to 0 for normal clock operation to resume.  
Interrupts  
The bq4852Y allows four individually selected interrupt  
events to generate an interrupt request on the INT pin.  
These four interrupt events are:  
The watchdog timer interrupt, programmable to  
occur according to the time-out period and conditions  
described in the watchdog timer section  
Power-On Reset  
The bq4852Y provides a power-on reset, which pulls the  
RST pin low on power-down and remains low on power-  
up for tCER after VCC passes VPFD.  
The periodic interrupt, programmable to occur once  
every 122µs to 500ms.  
The alarm interrupt, programmable to occur once per  
second to once per month  
Watchdog Timer  
The power-fail interrupt, which can be enabled to be  
asserted when the bq4852Y detects a power failure  
The watchdog circuit monitors the microprocessors ac-  
tivity. If the processor does not reset the watchdog timer  
within the programmed time-out period, the circuit as-  
serts the INT or RST pin. The watchdog timer is acti-  
vated by writing the desired time-out period into the  
eight-bit watchdog register described in Table 3 (device  
address 7FFF7). The five bits (BM4–BM0) store a bi-  
The periodic, alarm, and power-fail interrupts are en-  
abled by an individual interrupt-enable bit in register  
7FFF6, the interrupts register. When an event occurs,  
its event flag bit in the flags register, location 7FFF0, is  
set. If the corresponding event enable bit is also set,  
then an interrupt request is generated. Reading the  
flags register clears all flag bits and makes INT high im-  
pedance. To reset the flag register, the bq4852Y ad-  
dresses must be held stable at location 7FFF0 for at  
least 50ns to avoid inadvertent resets.  
n a r y m u lt ip lie r, a n d t h e t w o low e r -or d e r b it s  
1
(WD1–WD0) select the resolution, where 00 =  
second,  
01 = second, 10 = 1 second, and 11 = 4 seconds. 16  
1
4
The time-out period is the multiplication of the five-bit  
multiplier with the two-bit resolution. For example,  
writing 00011 in BM4–BM0 and 10 in WD1–WD0 re-  
sults in a total time-out setting of 3 x 1 or 3 seconds. A  
multiplier of zero disables the watchdog circuit. Bit 7 of  
the watchdog register (WDS) is the watchdog steering  
bit. When WDS is set to a 1 and a time-out occurs, the  
watchdog asserts a reset pulse for tCER on the RST pin.  
During the reset pulse, the watchdog register is cleared to all  
zeros disabling the watchdog. When WDS is set to a 0, the  
watchdog asserts the INT pin on a time-out. The INT pin re-  
mains low until the watchdog is reset by the microprocessor  
or a power failure occurs. Additionally, when the watchdog  
times out, the watchdog flag bit (WDF) in the flags register,  
location 7FFF0, is set.  
Periodic Interrupt  
Bits RS3–RS0 in the interrupts register program the  
rate for the periodic interrupt. The user can interpret  
the interrupt in two ways: either by polling the flags  
register for PF assertion or by setting PIE so that INT  
goes active when the bq4852Y sets the periodic flag. Read-  
ing the flags register resets the PF bit and returns INT to  
the high-impedance state. Table 4 shows the periodic  
rates.  
Alarm Interrupt  
Registers 7FFF5–7FFF2 program the real-time clock  
alarm. During each update cycle, the bq4852Y com-  
pares the date, hours, minutes, and seconds in the clock  
registers with the corresponding alarm registers. If a  
match between all the corresponding bytes is found, the  
alarm flag AF in the flags register is set. If the alarm  
interrupt is enabled with AIE, an interrupt request is  
generated on INT. The alarm condition is cleared by a  
To reset the watchdog timer, the microprocessor must  
write to the watchdog register. After being reset by a  
write, the watchdog time-out period starts over. As a  
precaution, the watchdog circuit is disabled on a power  
failure. The user must, therefore, set the watchdog at  
boot-up for activation.  
Table 3. Watchdog Register Bits  
MSB  
7
Bits  
LSB  
0
6
5
4
3
2
1
WDS  
BM4  
BM3  
BM2  
BM1  
BM0  
WD1  
WD0  
Aug. 1996  
6
bq4852Y  
read to the flags register. ALM3–ALM0 puts the alarm  
into a periodic mode of operation. Table 5 describes the  
selectable rates.  
Power-Fail Interrupt  
When VCC falls to the power-fail-detect point, the power-  
fail flag PWRF is set. If the power-fail interrupt enable bit  
(PWRIE) is also set, then INT is asserted low. The power-  
fail interrupt occurs tWPT before the bq4852Y generates a  
reset and deselects. The PWIE bit is cleared on power-up.  
The a la rm int errupt ca n be m a de a ct ive while t he  
bq4852Y is in the battery-backup mode by setting ABE  
in the interrupts register. Normally, the INT pin tri-  
states during battery backup. With ABE set, however, INT  
is driven low if an alarm condition occurs and the AIE bit is  
set. Because the AIE bit is reset during power-on reset, an  
alarm generated during power-on reset updates only the  
flags register. The user can read the flags register during  
boot-up to determine if an alarm was generated during  
power-on reset.  
Battery-Low Warning  
The bq4852Y checks the internal battery on power-up.  
If the battery voltage is below 2.2V, the battery-low flag  
BLF in the flags register is set to a 1 indicating that  
clock and RAM data may be invalid.  
Table 4. Periodic Rates  
RS3  
0
RS2  
0
RS1  
0
RS0  
0
Interrupt Rate  
None  
0
0
0
1
10ms  
0
0
1
0
100ms  
0
0
1
1
122.07µs  
244.14µs  
488.281  
976.5625  
1.953125ms  
3.90625ms  
7.8125ms  
15.625ms  
31.25ms  
62.5ms  
0
1
0
0
0
1
0
1
0
1
1
0
0
1
1
1
1
0
0
0
1
0
0
1
1
0
1
0
1
0
1
1
1
1
0
0
1
1
0
1
125ms  
1
1
1
0
250ms  
1
1
1
1
500ms  
Table 5. Alarm Frequency (Alarm Bits DQ7 of Alarm Registers)  
ALM3  
ALM2  
ALM1  
ALM0  
Alarm Frequency  
1
1
1
1
0
1
1
1
0
0
1
1
0
0
0
1
0
0
0
0
Once per second  
Once per minute when seconds match  
Once per hour when minutes, and seconds match  
Once per day when hours, minutes, and seconds match  
When date, hours, minutes, and seconds match  
Aug. 1996  
7
bq4852Y  
Absolute Maximum Ratings  
Symbol  
Parameter  
Value  
Unit  
Conditions  
VCC  
DC voltage applied on VCC relative to VSS  
-0.3 to 7.0  
V
DC voltage applied on any pin excluding VCC  
relative to VSS  
VT  
-0.3 to 7.0  
V
V
T VCC + 0.3  
TOPR  
TSTG  
TBIAS  
Operating temperature  
0 to +70  
-40 to +70  
-10 to +70  
+260  
°C  
°C  
°C  
°C  
Storage temperature (VCC off; oscillator off)  
Temperature under bias  
TSOLDER Soldering temperature  
For 10 seconds  
Note:  
Permanent device damage may occur if Absolu te Maxim u m Ratin gs are exceeded. Functional operation  
should be limited to the Recommended DC Operating Conditions detailed in this data sheet. Exposure to con-  
ditions beyond the operational limits for extended periods of time may affect device reliability.  
Recommended DC Operating Conditions (T = T  
)
OPR  
A
Symbol  
VCC  
Parameter  
Supply voltage  
Minimum  
Typical  
Maximum  
Unit  
V
Notes  
4.5  
0
5.0  
5.5  
0
VSS  
Supply voltage  
0
-
V
VIL  
Input low voltage  
Input high voltage  
-0.3  
2.2  
0.8  
V
VIH  
-
VCC + 0.3  
V
Note:  
Typical values indicate operation at TA = 25°C.  
Aug. 1996  
8
bq4852Y  
DC Electrical Characteristics (T = T  
V
V  
V  
CC CCMAX)  
A
OPR, CCMIN  
Symbol  
Parameter  
Minimum  
Typical  
Maximum  
Unit  
Conditions/Notes  
VIN = VSS to VCC  
ILI  
Input leakage current  
-
-
± 1  
µA  
CE = VIH or OE = VIH or  
WE = VIL  
ILO  
Output leakage current  
-
-
± 1  
µA  
VOH  
VOL  
IOD  
Output high voltage  
Output low voltage  
2.4  
-
-
-
-
0.4  
-
V
V
IOH = -1.0 mA  
IOL = 2.1 mA  
VOL = 0.4V  
CE = VIH  
RST, INT sink current  
Standby supply current  
10  
-
-
mA  
mA  
ISB1  
3
6
CE VCC - 0.2V,  
0V VIN 0.2V,  
or VIN VCC - 0.2V  
ISB2  
Standby supply current  
-
2
4
mA  
Min. cycle, duty = 100%,  
CE = VIL, II/O = 0mA  
ICC  
Operating supply current  
-
-
90  
mA  
VPFD  
VSO  
Power-fail-detect voltage  
Supply switch-over voltage  
4.30  
-
4.37  
3
4.50  
-
V
V
Notes:  
Typical values indicate operation at TA = 25°C, VCC = 5V.  
RST and INT are open-drain outputs.  
Capacitance (T = 25°C, F = 1MHz, V  
= 5.0V)  
A
CC  
Symbol  
CI/O  
Parameter  
Minimum  
Typical  
Maximum  
Unit  
pF  
Conditions  
Output voltage = 0V  
Input voltage = 0V  
Input/output capacitance  
Input capacitance  
-
-
-
-
10  
10  
CIN  
pF  
Note:  
These parameters are sampled and not 100% tested.  
Aug. 1996  
9
bq4852Y  
AC Test Conditions  
Parameter  
Test Conditions  
0V to 3.0V  
Input pulse levels  
Input rise and fall times  
5 ns  
Input and output timing reference levels  
Output load (including scope and jig)  
1.5 V (unless otherwise specified)  
See Figures 4 and 5  
Figure 4. Output Load A  
Figure 5. Output Load B  
Read Cycle (T = T  
V
V  
CCMAX)  
A
OPR, CCMIN VCC  
-85  
Min.  
Max.  
Symbol  
Parameter  
Unit  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
Conditions  
tRC  
Read cycle time  
85  
-
-
85  
85  
45  
-
tAA  
Address access time  
Output load A  
tACE  
tOE  
Chip enable access time  
-
Output load A  
Output load A  
Output load B  
Output load B  
Output load B  
Output load B  
Output load A  
Output enable to output valid  
Chip enable to output in low Z  
Output enable to output in low Z  
Chip disable to output in high Z  
Output disable to output in high Z  
Output hold from address change  
-
tCLZ  
tOLZ  
tCHZ  
tOHZ  
tOH  
5
0
-
0
35  
25  
-
0
10  
Aug. 1996  
10  
bq4852Y  
1,2  
Read Cycle No. 1 (Address Access)  
1,3,4  
Read Cycle No. 2 (CE Access)  
1,5  
Read Cycle No. 3 (OE Access)  
Notes:  
1. WE is held high for a read cycle.  
2. Device is continuously selected: CE = OE = VIL  
3. Address is valid prior to or coincident with CE transition low.  
4. OE = VIL  
5. Device is continuously selected: CE = VIL  
.
.
.
Aug. 1996  
11  
bq4852Y  
Write Cycle (T =T  
V
V
V  
)
A
OPR , CCMIN CC  
CCMAX  
-85  
Min.  
85  
Max.  
Symbol  
tWC  
Parameter  
Write cycle time  
Units  
ns  
Conditions/Notes  
-
-
-
tCW  
Chip enable to end of write  
Address valid to end of write  
75  
ns  
(1)  
(1)  
tAW  
75  
ns  
Measured from address valid to begin-  
ning of write. (2)  
tAS  
Address setup time  
0
-
-
-
-
-
-
-
ns  
ns  
ns  
ns  
ns  
ns  
ns  
Measured from beginning of write to  
end of write. (1)  
tWP  
Write pulse width  
65  
5
Measured from WE going high to end  
of write cycle. (3)  
tWR1  
tWR2  
tDW  
tDH1  
tDH2  
Write recovery time (write cycle 1)  
Write recovery time (write cycle 2)  
Data valid to end of write  
Data hold time (write cycle 1)  
Data hold time (write cycle 2)  
Measured from CE going high to end of  
write cycle. (3)  
15  
35  
0
Measured to first low-to-high transi-  
tion of either CE or WE.  
Measured from WE going high to end  
of write cycle. (4)  
Measured from CE going high to end of  
write cycle. (4)  
10  
tWZ  
tOW  
Write enabled to output in high Z  
Output active from end of write  
0
0
30  
-
ns  
ns  
I/O pins are in output state. (5)  
I/O pins are in output state. (5)  
Notes:  
1. A write ends at the earlier transition of CE going high and WE going high.  
2. A write occurs during the overlap of a low CE and a low WE. A write begins at the later transition  
of CE going low and WE going low.  
3. Either tWR1 or tWR2 must be met.  
4. Either tDH1 or tDH2 must be met.  
5. If CE goes low simultaneously with WE going low or after WE going low, the outputs remain in  
high-impedance state.  
Aug. 1996  
12  
bq4852Y  
1,2,3  
Write Cycle No. 1 (WE-Controlled)  
1,2,3,4,5  
Write Cycle No. 2 (CE-Controlled)  
Notes:  
1. CE or WE must be high during address transition.  
2. Because I/O may be active (OE low) during this period, data input signals of opposite polarity to the  
outputs must not be applied.  
3. If OE is high, the I/O pins remain in a state of high impedance.  
4. Either tWR1 or tWR2 must be met.  
5. Either tDH1 or tDH2 must be met.  
Aug. 1996  
13  
bq4852Y  
Power-Down/Power-Up Cycle (T = T  
A
OPR)  
Typical  
Symbol  
tPF  
Parameter  
Minimum  
300  
Maximum  
Unit  
µs  
Conditions  
VCC slew, 4.50 to 4.20 V  
VCC slew, 4.20 to VSO  
-
-
-
-
tFS  
10  
µs  
VCC slew, VSO to VPFD  
(max.)  
tPU  
0
-
-
µs  
Time during which SRAM is  
write-protected after VCC  
passes VFPD on power-up.  
tCER  
Chip enable recovery time  
40  
100  
200  
ms  
Data-retention time in  
absence of VCC  
tDR  
10  
40  
-
-
years TA = 25°C. (2)  
Delay after VCC slews down  
tWPT  
Write-protect time  
100  
160  
µs  
past VPFD before SRAM is  
write-protected.  
Notes:  
1. Typical values indicate operation at TA = 25°C, VCC = 5V.  
2. Battery is disconnected from circuit until after VCC is applied for the first time. tDR is the  
accumulated time in absence of power beginning when power is first applied to the device.  
Ca u tion : Nega tive u n d er sh oots below th e a bsolu te m a xim u m r a tin g of -0.3V in ba tter y-ba ck u p m od e  
m a y a ffect d a ta in tegr ity.  
Power-Down/Power-Up Timing  
Notes:  
1. PWRIE is set to 1 to enable power fail interrupt.  
2. RST and INT are open drain and require an external pull-up resistor.  
Aug. 1996  
14  
bq4852Y  
MC: 36-Pin C-Type Module  
(C-Type Module)  
36-Pin MC  
Inches  
Millimeters  
Min.  
0.365  
0.015  
0.017  
0.008  
2.070  
0.710  
0.590  
0.090  
0.120  
0.175  
Max.  
0.375  
-
Min.  
9.27  
0.38  
0.43  
0.20  
52.58  
18.03  
14.99  
2.29  
3.05  
4.45  
Max.  
9.53  
-
Dimension  
A
A1  
B
C
D
E
0.023  
0.013  
2.100  
0.740  
0.630  
0.110  
0.150  
0.210  
0.58  
0.33  
53.34  
18.80  
16.00  
2.79  
3.81  
5.33  
e
G
L
S
Ordering Information  
bq4852Y MC -  
Sp eed Op tion s:  
85 = 85 ns  
Pa ck a ge Op tion :  
MC = C-type module  
Device:  
bq4852Y 512K x 8 Real-Time Clock Module  
May 1997  
15  
IMPORTANT NOTICE  
Texas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue  
any product or service without notice, and advise customers to obtain the latest version of relevant information  
to verify, before placing orders, that information being relied on is current and complete. All products are sold  
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those  
pertaining to warranty, patent infringement, and limitation of liability.  
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in  
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent  
TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily  
performed, except those mandated by government requirements.  
CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF  
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL  
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR  
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER  
CRITICAL APPLICATIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERSTOOD TO  
BE FULLY AT THE CUSTOMER’S RISK.  
In order to minimize risks associated with the customer’s applications, adequate design and operating  
safeguards must be provided by the customer to minimize inherent or procedural hazards.  
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent  
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other  
intellectual property right of TI covering or relating to any combination, machine, or process in which such  
semiconductor products or services might be or are used. TI’s publication of information regarding any third  
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.  
Copyright 1999, Texas Instruments Incorporated  

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