CSD15571Q2 [TI]

20-V N-Channel NexFET Power MOSFETs; 20 -V N通道NexFET功率MOSFET
CSD15571Q2
型号: CSD15571Q2
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

20-V N-Channel NexFET Power MOSFETs
20 -V N通道NexFET功率MOSFET

文件: 总10页 (文件大小:836K)
中文:  中文翻译
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CSD15571Q2  
www.ti.com  
SLPS435 AUGUST 2013  
20-V N-Channel NexFET™ Power MOSFETs  
Check for Samples: CSD15571Q2  
1
FEATURES  
PRODUCT SUMMARY  
Drain to Source Voltage  
2
Ultralow Qg and Qgd  
Low Thermal Resistance  
Avalanche Rated  
VDS  
Qg  
20  
2.5  
V
Gate Charge Total (4.5V)  
Gate Charge Gate to Drain  
nC  
nC  
m  
mΩ  
V
Qgd  
0.66  
VGS = 4.5V  
VGS = 10V  
1.45  
16  
12  
Pb Free Terminal Plating  
RoHS Compliant  
RDS(on) Drain to Source On Resistance  
VGS(th) Threshold Voltage  
Halogen Free  
SON 2-mm × 2-mm Plastic Package  
ORDERING INFORMATION  
Device  
CSD15571Q2  
Package  
Media  
Qty  
Ship  
APPLICATIONS  
SON 2-mm × 2-mm  
Plastic Package  
7-Inch  
Reel  
Tape and  
Reel  
3000  
Optimized for Load Switch Applications  
Storage, Tablets, and Handheld Devices  
Optimized for Control FET Applications  
Point of Load Synchronous Buck Converters  
ABSOLUTE MAXIMUM RATINGS  
TA = 25°C unless otherwise stated  
VALUE  
UNIT  
V
VDS  
VGS  
Drain to Source Voltage  
20  
Gate to Source Voltage  
±20  
22  
V
DESCRIPTION  
Continuous Drain Current (Package Limit)  
Continuous Drain Current(1)  
Pulsed Drain Current, TA = 25°C(2)  
Power Dissipation(1)  
A
ID  
The NexFET™ power MOSFET has been designed  
to minimize losses in power conversion and load  
management applications. The SON 2x2 offers  
excellent thermal performance for the size of the  
package.  
10  
A
IDM  
PD  
TJ,  
52  
A
2.5  
W
Operating Junction and Storage  
–55 to 150  
18  
°C  
TSTG Temperature Range  
Avalanche Energy, single pulse  
ID = 19A, L = 0.1mH, RG = 25Ω  
Top View  
EAS  
mJ  
(1) RθJA = 50 on 1in² Cu (2 oz.) on .060" thick FR4 PCB.  
D
D
G
1
2
3
6
5
4
D
D
S
D
(2) Pulse duration 10μs, duty cycle 2%  
S
P0108-01  
RDS(on) vs VGS  
GATE CHARGE  
30  
28  
26  
24  
22  
20  
18  
16  
14  
12  
10  
8
10  
TC = 25°C,I D = 5A  
TC = 125°C,I D = 5A  
ID = 5A  
VDS =10V  
9
8
7
6
5
4
3
2
1
0
0
2
4
6
8
10  
12  
14  
16  
18  
20  
0
0.5  
1
1.5  
2
2.5  
3
3.5  
4
4.5  
5
5.5  
Qg - Gate Charge (nC)  
VGS - Gate-to- Source Voltage (V)  
G001  
G001  
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
NexFET is a trademark of Texas Instruments.  
2
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
Copyright © 2013, Texas Instruments Incorporated  
 
 
CSD15571Q2  
SLPS435 AUGUST 2013  
www.ti.com  
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam  
during storage or handling to prevent electrostatic damage to the MOS gates.  
ELECTRICAL CHARACTERISTICS  
TA = 25°C, unless otherwise specified  
PARAMETER  
Static Characteristics  
TEST CONDITIONS  
MIN TYP MAX UNIT  
BVDSS  
IDSS  
Drain to Source Voltage  
VGS = 0V, ID = 250μA  
20  
V
μA  
nA  
V
Drain to Source Leakage Current  
Gate to Source Leakage Current  
Gate to Source Threshold Voltage  
VGS = 0V, VDS = 20V  
VDS = 0V, VGS = 20V  
VDS = VGS, IDS = 250μA  
VGS = 4.5V, IDS = 5A  
VGS = 10V, IDS = 5A  
VDS = 16V, IDS = 5A  
1
IGSS  
100  
VGS(th)  
1.10 1.45 1.90  
16.0 19.2  
12.0 15.0  
25  
mΩ  
mΩ  
S
RDS(on)  
Drain to Source On Resistance  
gfs  
Transconductance  
Dynamic Characteristics  
CISS  
COSS  
CRSS  
Rg  
Input Capacitance  
320  
184  
32  
419  
239  
42  
pF  
pF  
pF  
Output Capacitance  
Reverse Transfer Capacitance  
Series Gate Resistance  
Gate Charge Total (4.5V)  
Gate Charge Total (10V)  
Gate Charge – Gate to Drain  
Gate Charge Gate to Source  
Gate Charge at Vth  
Output Charge  
VGS = 0V, VDS = 10V, f = 1MHz  
3.8  
7.6  
3.3  
6.7  
Qg  
2.5  
nC  
nC  
nC  
nC  
nC  
nC  
ns  
ns  
ns  
ns  
Qg  
5.1  
Qgd  
Qgs  
Qg(th)  
QOSS  
td(on)  
tr  
VDS = 10V, IDS = 5A  
VDS = 10V, VGS = 0V  
0.66  
0.93  
0.52  
4.1  
Turn On Delay Time  
Rise Time  
4.7  
17.2  
9.9  
VDS = 10V, VGS = 4.5V, IDS = 5A  
RG = 2Ω  
td(off)  
tf  
Turn Off Delay Time  
Fall Time  
4.1  
Diode Characteristics  
VSD  
Qrr  
trr  
Diode Forward Voltage  
IDS = 5A, VGS = 0V  
0.82  
10.7  
19  
1
V
Reverse Recovery Charge  
Reverse Recovery Time  
nC  
ns  
VDD = 10V, IF = 5A, di/dt = 300A/μs  
THERMAL CHARACTERISTICS  
(TA = 25°C unless otherwise stated)  
PARAMETER  
Thermal Resistance Junction to Case(1)  
Thermal Resistance Junction to Ambient(1)(2)  
MIN  
TYP  
MAX  
UNIT  
°C/W  
°C/W  
RθJC  
RθJA  
4.5  
65  
(1)  
R
θJC is determined with the device mounted on a 1-inch2 (6.45-cm2), 2-oz. (0.071-mm thick) Cu pad on a 1.5-inch × 1.5-inch (3.81-cm ×  
3.81-cm), 0.06-inch (1.52-mm) thick FR4 PCB. RθJC is specified by design, whereas RθJA is determined by the user’s board design.  
(2) Device mounted on FR4 material with 1-inch2 (6.45-cm2), 2-oz. (0.071-mm thick) Cu.  
2
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Product Folder Links: CSD15571Q2  
CSD15571Q2  
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SLPS435 AUGUST 2013  
GATE  
Source  
GATE  
Source  
Max RθJA = 65 when  
mounted on 1 inch2  
(6.45 cm2) of 2-oz.  
(0.071-mm thick) Cu.  
Max RθJA = 235 when  
mounted on minimum  
pad area of 2-oz.  
(0.071-mm thick) Cu.  
DRAIN  
DRAIN  
M0164-02  
M0164-01  
TYPICAL MOSFET CHARACTERISTICS  
(TA = 25°C unless otherwise stated)  
Figure 1. Transient Thermal Impedance  
TEXT ADDED FOR SPACING  
TEXT ADDED FOR SPACING  
50  
45  
40  
35  
30  
25  
20  
15  
10  
5
30  
27  
24  
21  
18  
15  
12  
9
VDS = 5V  
VGS =10V  
VGS =6V  
VGS =4.5V  
TC = 125°C  
TC = 25°C  
TC = −55°C  
6
3
0
0
0
0.3  
0.6  
0.9  
1.2  
1.5  
0
0.5  
1
1.5  
2
2.5  
3
3.5  
VDS - Drain-to-Source Voltage (V)  
VGS - Gate-to-Source Voltage (V)  
G001  
G001  
Figure 2. Saturation Characteristics  
Figure 3. Transfer Characteristics  
Copyright © 2013, Texas Instruments Incorporated  
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3
Product Folder Links: CSD15571Q2  
CSD15571Q2  
SLPS435 AUGUST 2013  
www.ti.com  
TYPICAL MOSFET CHARACTERISTICS (continued)  
(TA = 25°C unless otherwise stated)  
TEXT ADDED FOR SPACING  
TEXT ADDED FOR SPACING  
10  
9
8
7
6
5
4
3
2
1
0
1000  
100  
10  
ID = 5A  
VDS =10V  
Ciss = Cgd + Cgs  
Coss = Cds + Cgd  
Crss = Cgd  
0
0.5  
1
1.5  
2
2.5  
3
3.5  
4
4.5  
5
5.5  
0
3
6
9
12  
15  
18  
20  
Qg - Gate Charge (nC)  
VDS - Drain-to-Source Voltage (V)  
G001  
G001  
Figure 4. Gate Charge  
TEXT ADDED FOR SPACING  
Figure 5. Capacitance  
TEXT ADDED FOR SPACING  
1.9  
1.8  
1.7  
1.6  
1.5  
1.4  
1.3  
1.2  
1.1  
1
30  
28  
26  
24  
22  
20  
18  
16  
14  
12  
10  
8
ID = 250uA  
TC = 25°C,I D = 5A  
TC = 125°C,I D = 5A  
0.9  
0.8  
−75  
−25  
25  
75  
125  
175  
0
2
4
6
8
10  
12  
14  
16  
18  
20  
TC - Case Temperature (ºC)  
VGS - Gate-to- Source Voltage (V)  
G001  
G001  
Figure 6. Threshold Voltage vs. Temperature  
TEXT ADDED FOR SPACING  
Figure 7. On-State Resistance vs. Gate-to-Source Voltage  
TEXT ADDED FOR SPACING  
1.8  
1.6  
1.4  
1.2  
1
10  
VGS = 4.5V  
VGS = 10V  
ID = 5A  
TC = 25°C  
TC = 125°C  
1
0.1  
0.01  
0.001  
0.0001  
0.8  
0.6  
−75  
−25  
25  
75  
125  
175  
0
0.2  
0.4  
0.6  
0.8  
1
TC - Case Temperature (ºC)  
VSD − Source-to-Drain Voltage (V)  
G001  
G001  
Figure 8. Normalized On-State Resistance vs. Temperature  
Figure 9. Typical Diode Forward Voltage  
4
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CSD15571Q2  
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SLPS435 AUGUST 2013  
TYPICAL MOSFET CHARACTERISTICS (continued)  
(TA = 25°C unless otherwise stated)  
TEXT ADDED FOR SPACING  
TEXT ADDED FOR SPACING  
1000  
100  
10  
100  
10  
1
TC = 25ºC  
TC = 125ºC  
1ms  
100ms  
1s  
DC  
10ms  
1
0.1  
0.01  
Single Pulse  
TypicalRthetaJA =190ºC/W(min Cu)  
0.1  
0.001  
0.01  
0.1  
1
10  
50  
0.01  
0.1  
1
VDS - Drain-to-Source Voltage (V)  
TAV - Time in Avalanche (mS)  
G001  
G001  
Figure 10. Maximum Safe Operating Area  
Figure 11. Single Pulse Unclamped Inductive Switching  
TEXT ADDED FOR SPACING  
27.0  
24.0  
21.0  
18.0  
15.0  
12.0  
9.0  
6.0  
3.0  
0.0  
−50 −25  
0
25  
50  
75  
100 125 150 175  
TA - AmbientTemperature (ºC)  
G001  
Figure 12. Maximum Drain Current vs. Temperature  
Copyright © 2013, Texas Instruments Incorporated  
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Product Folder Links: CSD15571Q2  
CSD15571Q2  
SLPS435 AUGUST 2013  
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MECHANICAL DATA  
Q2 Package Dimensions  
D2  
D
K2  
K1  
K3  
6
5
4
4
5
6
1
2
3
3
2
1
Pin 1 ID  
b
e
Pin 1 Dot  
Top View  
D1  
Bottom View  
Front View  
M0165-01  
DIM  
MILLIMETERS  
NOM  
INCHES  
NOM  
MIN  
MAX  
0.800  
0.050  
0.350  
MIN  
MAX  
0.032  
0.002  
0.014  
A
A1  
b
0.700  
0.000  
0.250  
0.750  
0.028  
0.000  
0.010  
0.030  
0.300  
0.203 TYP  
2.000 TYP  
0.950  
0.012  
C
0.008 TYP  
0.080 TYP  
0.038  
D
D1  
D2  
E
0.900  
0.900  
1.000  
1.100  
0.036  
0.036  
0.040  
0.044  
0.300 TYP  
2.000 TYP  
1.000  
0.012 TYP  
0.080 TYP  
0.040  
E1  
E2  
E3  
e
0.280 TYP  
0.470 TYP  
0.650 BSC  
0.280 TYP  
0.350 TYP  
0.200 TYP  
0.200 TYP  
0.470 TYP  
0.25  
0.0112 TYP  
0.0188 TYP  
0.026 TYP  
0.0112 TYP  
0.014 TYP  
0.008 TYP  
0.008 TYP  
0.0188 TYP  
0.010  
K
K1  
K2  
K3  
K4  
L
0.200  
0.300  
0.008  
0.012  
6
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CSD15571Q2  
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SLPS435 AUGUST 2013  
Recommended PCB Pattern  
For recommended circuit layout for PCB designs, see application note SLPA005 Reducing Ringing Through  
PCB Layout Techniques.  
Recommended Stencil Pattern  
Note: All dimensions are in mm, unless otherwise specified.  
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7
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SLPS435 AUGUST 2013  
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Q2 Tape and Reel Information  
4.00 0.10  
2.00 0.0ꢀ  
Ø 1.ꢀ0 0.10  
10° Max  
4.00 0.10  
Ø 1.00 0.2ꢀ  
1.00 0.0ꢀ  
0.2ꢀ4 0.02  
10° Max  
2.30 0.0ꢀ  
M0168-01  
Notes: 1. Measured from centerline of sprocket hole to centerline of pocket  
2. Cumulative tolerance of 10 sprocket holes is ±0.20  
3. Other material available  
4. Typical SR of form tape Max 109 OHM/SQ  
5. All dimensions are in mm, unless otherwise specified.  
8
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PACKAGE OPTION ADDENDUM  
www.ti.com  
9-Aug-2013  
PACKAGING INFORMATION  
Orderable Device  
Status Package Type Package Pins Package  
Eco Plan Lead/Ball Finish  
MSL Peak Temp  
Op Temp (°C)  
Device Marking  
Samples  
Drawing  
Qty  
(1)  
(2)  
(3)  
(4/5)  
CSD15571Q2  
ACTIVE  
SON  
DQK  
6
3000  
Green (RoHS  
& no Sb/Br)  
CU SN  
Level-1-260C-UNLIM  
-55 to 150  
(1) The marketing status values are defined as follows:  
ACTIVE: Product device recommended for new designs.  
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.  
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.  
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.  
OBSOLETE: TI has discontinued the production of the device.  
(2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability  
information and additional product content details.  
TBD: The Pb-Free/Green conversion plan has not been defined.  
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that  
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.  
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between  
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.  
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight  
in homogeneous material)  
(3) MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.  
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.  
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation  
of the previous line and the two combined represent the entire Device Marking for that device.  
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Addendum-Page 1  
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ETC

CSD1563AQ

TRANSISTOR | BJT | NPN | 160V V(BR)CEO | 1.5A I(C) | TO-126
ETC

CSD1563N

TRANSISTOR | BJT | NPN | 120V V(BR)CEO | 1.5A I(C) | TO-126
ETC

CSD1563P

TRANSISTOR | BJT | NPN | 120V V(BR)CEO | 1.5A I(C) | TO-126
ETC

CSD1563Q

TRANSISTOR | BJT | NPN | 120V V(BR)CEO | 1.5A I(C) | TO-126
ETC

CSD1563R

TRANSISTOR | BJT | NPN | 120V V(BR)CEO | 1.5A I(C) | TO-126
ETC

CSD1616

NPN SILICON EPITAXIAL TRANSISTOR
CDIL

CSD1616G

NPN SILICON EPITAXIAL TRANSISTOR
CDIL

CSD1616L

NPN SILICON EPITAXIAL TRANSISTOR
CDIL