CSD17382F4T [TI]

采用 1mm x 0.6mm LGA 封装、具有栅极 ESD 保护的单路、67mΩ、30V、N 沟道 NexFET™ 功率 MOSFET | YJC | 3 | -55 to 150;
CSD17382F4T
型号: CSD17382F4T
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

采用 1mm x 0.6mm LGA 封装、具有栅极 ESD 保护的单路、67mΩ、30V、N 沟道 NexFET™ 功率 MOSFET | YJC | 3 | -55 to 150

栅 开关 脉冲 晶体管 栅极
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CSD17382F4  
SLPS562C – APRIL 2016 – REVISED FEBRUARY 2022  
CSD17382F4 30-V N-Channel FemtoFETMOSFET  
Product Summary  
1 Features  
TA = 25°C  
TYPICAL VALUE  
UNIT  
V
Low on-resistance  
Low Qg and Qgd  
Low threshold voltage  
Ultra-small footprint (0402 case size)  
– 1.0 mm × 0.6 mm  
Ultra-low profile  
VDS  
Qg  
Drain-to-Source Voltage  
30  
2.1  
Gate Charge Total (4.5 V)  
Gate Charge Gate-to-Drain  
nC  
nC  
mΩ  
mΩ  
mΩ  
mΩ  
V
Qgd  
0.63  
VGS = 1.8 V  
110  
67  
VGS = 2.5 V  
VGS = 4.5 V  
VGS = 8.0 V  
RDS(on) Drain-to-Source On-Resistance  
56  
– 0.36-mm height  
54  
Integrated ESD protection diode  
– Rated > 3-kV HBM  
– Rated > 2-kV CDM  
Lead and halogen free  
RoHS compliant  
VGS(th) Threshold Voltage  
0.9  
.
Device Information  
DEVICE(1)  
CSD17382F4  
CSD17382F4T  
QTY  
3000  
250  
MEDIA  
PACKAGE  
SHIP  
7-Inch  
Reel  
Femto (0402) 1.0-mm ×  
0.6-mm SMD Lead Less  
Tape and  
Reel  
2 Applications  
Optimized for load switch applications  
Optimized for general purpose switching  
applications  
Single-cell battery applications  
Handheld and mobile applications  
(1) For all available packages, see the orderable addendum at  
the end of the data sheet.  
Absolute Maximum Ratings  
TA = 25°C  
VALUE  
UNIT  
V
VDS  
VGS  
ID  
Drain-to-Source Voltage  
30  
3 Description  
Gate-to-Source Voltage  
Continuous Drain Current(1)  
Pulsed Drain Current(2)  
Power Dissipation(1)  
10  
V
This 30-V, 54-mΩ, N-Channel FemtoFETMOSFET  
technology is designed and optimized to minimize the  
footprint in many handheld and mobile applications.  
This technology is capable of replacing standard  
small signal MOSFETs while providing at least a 60%  
reduction in footprint size.  
2.3  
A
IDM  
PD  
14.8  
500  
A
mW  
V
Human Body Model (HBM)  
Charged Device Model (CDM)  
3000  
2000  
ESD  
Rating  
V
TJ,  
Tstg  
Operating Junction,  
Storage Temperature  
–55 to 150  
2.1  
°C  
.
Avalanche Energy, Single Pulse ID = 6.5 A,  
L = 0.1 mH, RG = 25 Ω  
EAS  
mJ  
(1) Typical RθJA = 245°C/W on 1-in2 (6.45-cm2), 2-oz.  
0.36 mm  
(0.071-mm) thick Cu pad on a 0.06-in (1.52-mm) thick FR4  
PCB.  
(2) Pulse duration ≤100 μs, duty cycle ≤1%.  
1.00 mm  
0.60 mm  
D
Typical Part Dimensions  
.
.
.
.
G
S
Top View  
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,  
intellectual property matters and other important disclaimers. PRODUCTION DATA.  
 
 
 
 
 
 
 
 
CSD17382F4  
SLPS562C – APRIL 2016 – REVISED FEBRUARY 2022  
www.ti.com  
Table of Contents  
1 Features............................................................................1  
2 Applications.....................................................................1  
3 Description.......................................................................1  
4 Revision History.............................................................. 2  
5 Specifications.................................................................. 3  
5.1 Electrical Characteristics.............................................3  
5.2 Thermal Information....................................................3  
5.3 Typical MOSFET Characteristics................................4  
6 Device and Documentation Support..............................7  
6.1 Support Resources..................................................... 7  
6.2 Receiving Notification of Documentation Updates......7  
6.3 Trademarks.................................................................7  
6.4 Electrostatic Discharge Caution..................................7  
6.5 Glossary......................................................................7  
7 Mechanical, Packaging, and Orderable Information....8  
7.1 Mechanical Dimensions..............................................8  
7.2 Recommended Minimum PCB Layout........................9  
7.3 Recommended Stencil Pattern................................... 9  
7.4 CSD17382F4 Embossed Carrier Tape Dimensions..10  
4 Revision History  
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.  
Changes from Revision B (October 2021) to Revision C (February 2022)  
Page  
Changed ultra-low profile bullet from 0.35 mm to 0.36 mm in height................................................................. 1  
Updated ultra-low profile image height from 0.35 mm to 0.36 mm.....................................................................1  
Changed ultra-low profile image height from 0.35 mm to 0.36 mm....................................................................8  
Added FemtoFET Surface Mount Guide note.................................................................................................... 9  
Changes from Revision A (December 2016) to Revision B (October 2021)  
Page  
Updated the numbering format for tables, figures, and cross-references throughout the document..................1  
Changes from Revision * (April 2016) to Revision A (December 2016)  
Page  
Changed the TEST CONDITIONS for gfsTransconductance From: VDS = 15 V To: VDS = 3 V in the Section  
5.1 section. ........................................................................................................................................................ 3  
Added Section 6.2 in the Section 6 section. ...................................................................................................... 7  
Updated all mechanical drawings. .....................................................................................................................8  
Copyright © 2022 Texas Instruments Incorporated  
2
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CSD17382F4  
SLPS562C – APRIL 2016 – REVISED FEBRUARY 2022  
www.ti.com  
5 Specifications  
5.1 Electrical Characteristics  
TA = 25°C (unless otherwise stated)  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
STATIC CHARACTERISTICS  
BVDSS  
IDSS  
Drain-to-source voltage  
VGS = 0 V, IDS = 250 μA  
30  
V
Drain-to-source leakage current  
Gate-to-source leakage current  
Gate-to-source threshold voltage  
VGS = 0 V, VDS = 24 V  
VDS = 0 V, VGS = 10 V  
VDS = VGS, IDS = 250 μA  
VGS = 1.8 V, IDS =0.5 A  
VGS = 2.5 V, IDS =0.5 A  
VGS = 4.5 V, IDS = 0.5 A  
VGS = 8.0 V, IDS = 0.5 A  
VDS = 3 V, IDS = 0.5 A  
1
5
µA  
µA  
V
IGSS  
VGS(th)  
0.7  
0.9  
110  
67  
1.2  
180  
82  
mΩ  
mΩ  
mΩ  
mΩ  
S
RDS(on)  
Drain-to-source on-resistance  
56  
67  
54  
64  
gfs  
Transconductance  
5.9  
DYNAMIC CHARACTERISTICS  
Ciss  
Coss  
Crss  
RG  
Input capacitance  
267  
31.0  
15.0  
220  
2.1  
347  
40.3  
19.5  
pF  
pF  
pF  
VGS = 0 V, VDS = 15 V,  
ƒ = 1 MHz  
Output capacitance  
Reverse transfer capacitance  
Series gate resistance  
Gate charge total (4.5 V)  
Gate charge gate-to-drain  
Gate charge gate-to-source  
Gate charge at Vth  
Output charge  
Qg  
2.7  
nC  
nC  
nC  
nC  
nC  
ns  
ns  
ns  
ns  
Qgd  
Qgs  
Qg(th)  
Qoss  
td(on)  
tr  
0.63  
0.41  
0.12  
1.53  
59  
VDS = 15 V, IDS = 0.5 A  
VDS = 15 V, VGS = 0 V  
Turn on delay time  
Rise time  
111  
VDS = 15 V, VGS = 4.5 V,  
IDS = 0.5 A, RG = 0 Ω  
td(off)  
tf  
Turn off delay time  
Fall time  
279  
270  
DIODE CHARACTERISTICS  
VSD Diode forward voltage  
ISD = 0.5 A, VGS = 0 V  
0.7  
1.0  
V
5.2 Thermal Information  
TA = 25°C (unless otherwise stated)  
THERMAL METRIC  
Junction-to-ambient thermal resistance(1)  
Junction-to-ambient thermal resistance(2)  
TYPICAL VALUES  
UNIT  
°C/W  
°C/W  
85  
RθJA  
245  
(1) Device mounted on FR4 material with 1-in2 (6.45-cm2), 2-oz. (0.071-mm) thick Cu.  
(2) Device mounted on FR4 material with minimum Cu mounting area.  
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CSD17382F4  
SLPS562C – APRIL 2016 – REVISED FEBRUARY 2022  
www.ti.com  
5.3 Typical MOSFET Characteristics  
TA = 25°C (unless otherwise stated)  
Figure 5-1. Transient Thermal Impedance  
10  
9
8
7
6
5
4
3
2
1
0
10  
9
8
7
6
5
4
3
2
1
0
VGS = 1.8 V  
VGS = 2.5 V  
VGS = 4.5 V  
VGS = 8.0 V  
TC = 125°C  
TC = 25°C  
TC = -55°C  
0
0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9  
VDS - Drain-to-Source Voltage (V)  
1
0
0.5  
1
1.5  
VGS - Gate-to-Source Voltage (V)  
2
2.5  
3
D002  
D003  
VDS = 5 V  
Figure 5-2. Saturation Characteristics  
Figure 5-3. Transfer Characteristics  
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CSD17382F4  
SLPS562C – APRIL 2016 – REVISED FEBRUARY 2022  
www.ti.com  
8
7
6
5
4
3
2
1
1000  
100  
10  
Ciss = Cgd + Cgs  
Coss = Cds + Cgd  
Crss = Cgd  
0
0
0
3
6
9
12  
15  
18  
21  
VDS - Drain-to-Source Voltage (V)  
24  
27  
30  
0.4 0.8 1.2 1.6  
2
Qg - Gate Charge (nC)  
2.4 2.8 3.2 3.6  
4
D005  
D004  
Figure 5-5. Capacitance  
ID = 0.5 A  
VDS = 15 V  
Figure 5-4. Gate Charge  
1.3  
1.2  
1.1  
1
130  
120  
110  
100  
90  
TC = 25°C, ID = 0.5 A  
TC = 125°C, ID = 0.5 A  
0.9  
0.8  
0.7  
0.6  
0.5  
0.4  
0.3  
80  
70  
60  
50  
40  
0
1
2
3
4
5
6
7
VGS - Gate-to-Source Voltage (V)  
8
9
10  
-75 -50 -25  
0
25  
50  
TC - Case Temperature (°C)  
75 100 125 150 175  
D007  
D006  
Figure 5-7. On-State Resistance vs Gate-to-Source  
Voltage  
ID = 250 µA  
Figure 5-6. Threshold Voltage vs Temperature  
10  
1.5  
TC = 25èC  
TC = 125èC  
VGS = 2.5 V  
VGS = 8.0 V  
1.4  
1.3  
1.2  
1.1  
1
1
0.1  
0.01  
0.9  
0.8  
0.7  
0.001  
0.0001  
0
0.2  
0.4  
0.6  
VSD - Source-To-Drain Voltage (V)  
0.8  
1
-75 -50 -25  
0
25  
50  
75 100 125 150 175  
D009  
TC - Case Temperature (èC)  
D008  
Figure 5-9. Typical Diode Forward Voltage  
ID = 0.5 A  
Figure 5-8. Normalized On-State Resistance vs  
Temperature  
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CSD17382F4  
SLPS562C – APRIL 2016 – REVISED FEBRUARY 2022  
www.ti.com  
100  
10  
1
100  
10  
1
TC = 25è C  
TC = 125è C  
0.1  
100 ms  
10 ms  
1 ms  
100 µs  
10 µs  
0.01  
0.1  
0.1  
0.001  
1
10  
VDS - Drain-To-Source Voltage (V)  
100  
0.01  
TAV - Time in Avalanche (ms)  
0.1  
D010  
D011  
Single Pulse, Typ RθJA = 245°C/W (min Cu)  
Figure 5-11. Single Pulse Unclamped Inductive  
Switching  
Figure 5-10. Maximum Safe Operating Area (SOA)  
3.5  
3
2.5  
2
1.5  
1
0.5  
0
-50  
-25  
0
25  
50  
TA - Ambient Temperature (°C)  
75  
100 125 150 175  
D012  
Typical RθJA = 245°C/W (min Cu)  
Figure 5-12. Maximum Drain Current vs Temperature  
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CSD17382F4  
SLPS562C – APRIL 2016 – REVISED FEBRUARY 2022  
www.ti.com  
6 Device and Documentation Support  
6.1 Support Resources  
TI E2Esupport forums are an engineer's go-to source for fast, verified answers and design help — straight  
from the experts. Search existing answers or ask your own question to get the quick design help you need.  
Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do  
not necessarily reflect TI's views; see TI's Terms of Use.  
6.2 Receiving Notification of Documentation Updates  
To receive notification of documentation updates, navigate to the device product folder on ti.com. In the upper  
right corner, click on Alert me to register and receive a weekly digest of any product information that has  
changed. For change details, review the revision history included in any revised document.  
6.3 Trademarks  
FemtoFETis a trademark of Texas Instruments.  
TI E2Eis a trademark of Texas Instruments.  
All trademarks are the property of their respective owners.  
6.4 Electrostatic Discharge Caution  
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled  
with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.  
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may  
be more susceptible to damage because very small parametric changes could cause the device not to meet its published  
specifications.  
6.5 Glossary  
TI Glossary  
This glossary lists and explains terms, acronyms, and definitions.  
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CSD17382F4  
SLPS562C – APRIL 2016 – REVISED FEBRUARY 2022  
www.ti.com  
7 Mechanical, Packaging, and Orderable Information  
The following pages include mechanical, packaging, and orderable information. This information is the most  
current data available for the designated devices. This data is subject to change without notice and revision of  
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.  
7.1 Mechanical Dimensions  
1.04  
B
A
0.96  
PIN 1 INDEX AREA  
0.64  
0.56  
0.36 MAX  
C
SEATING PLANE  
0.65  
0.325  
0.175  
2
3
0.51  
0.35  
0.49  
1
0.16  
2X  
0.14  
0.26  
0.015  
C B  
A
2X  
0.26  
0.24  
0.015  
0.24  
C A  
B
A. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing per ASME  
Y14.5M.  
B. This drawing is subject to change without notice.  
C. This package is a Pb-free bump design. Bump finish may vary. To determine the exact finish, refer to the device datasheet or contact a  
local TI representative.  
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CSD17382F4  
SLPS562C – APRIL 2016 – REVISED FEBRUARY 2022  
www.ti.com  
7.2 Recommended Minimum PCB Layout  
(0.25)  
2X (0.25)  
PKG  
0.05 MIN  
ALL AROUND  
2X (0.15)  
1
3
SYMM  
(0.5)  
(0.35)  
2
(R0.05) TYP  
SOLDER MASK  
OPENING  
(0.65)  
METAL UNDER  
SOLDER MASK  
LAND PATTERN EXAMPLE  
SOLDER MASK DEFINED  
A. All dimensions are in millimeters.  
B. For more information, see FemtoFET Surface Mount Guide (SLRA003D).  
7.3 Recommended Stencil Pattern  
2X (0.25)  
PKG  
2X (0.2)  
(0.25)  
1
SYMM  
3
(0.4)  
(0.5)  
2
2X (0.15)  
(R0.05) TYP  
(0.65)  
2X SOLDER MASK EDGE  
SOLDER PASTE EXAMPLE  
A. All dimensions are in millimeters.  
B. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate design  
recommendations.  
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CSD17382F4  
SLPS562C – APRIL 2016 – REVISED FEBRUARY 2022  
www.ti.com  
7.4 CSD17382F4 Embossed Carrier Tape Dimensions  
A. Pin 1 is oriented in the top-right quadrant of the tape enclosure (quadrant 2), closest to the carrier tape sprocket holes.  
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PACKAGE OPTION ADDENDUM  
www.ti.com  
11-Jan-2022  
PACKAGING INFORMATION  
Orderable Device  
Status Package Type Package Pins Package  
Eco Plan  
Lead finish/  
Ball material  
MSL Peak Temp  
Op Temp (°C)  
Device Marking  
Samples  
Drawing  
Qty  
(1)  
(2)  
(3)  
(4/5)  
(6)  
CSD17382F4  
ACTIVE  
ACTIVE  
PICOSTAR  
PICOSTAR  
YJC  
YJC  
3
3
3000 RoHS & Green  
250 RoHS & Green  
NIAU  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
-55 to 150  
-55 to 150  
HM  
HM  
CSD17382F4T  
NIAU  
(1) The marketing status values are defined as follows:  
ACTIVE: Product device recommended for new designs.  
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.  
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.  
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.  
OBSOLETE: TI has discontinued the production of the device.  
(2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance  
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may  
reference these types of products as "Pb-Free".  
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.  
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based  
flame retardants must also meet the <=1000ppm threshold requirement.  
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.  
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.  
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation  
of the previous line and the two combined represent the entire Device Marking for that device.  
(6)  
Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two  
lines if the finish value exceeds the maximum column width.  
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information  
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and  
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TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.  
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.  
Addendum-Page 1  
PACKAGE OPTION ADDENDUM  
www.ti.com  
11-Jan-2022  
Addendum-Page 2  
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