CY74FCT2541ATSOCR [TI]
暂无描述;型号: | CY74FCT2541ATSOCR |
厂家: | TEXAS INSTRUMENTS |
描述: | 暂无描述 驱动器 逻辑集成电路 光电二极管 输出元件 |
文件: | 总6页 (文件大小:53K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
Data sheet acquired from Cypress Semiconductor Corporation.
Data sheet modified to remove devices not offered.
CY74FCT2541T
SCCS041 - September 1994 - Revised March 2000
8-Bit Buffer/Line Driver
• Extended commercial temp. range of –40˚C to +85˚C
• Three-state outputs
Features
• Function and pinout compatible with FCT and F logic
Functional Description
• FCT-C speed at 4.1 ns max.
FCT-A speed at 4.8 ns max.
The FCT2541T is an octal buffer and line driver designed
to be employed as a memory address driver, clock driver,
and bus-oriented transmitter/receiver. On-chip termination resistors
have been added to the outputs to reduce system noise caused by
reflections. The FCT2541T can be used to replace the FCT541T to
reduce noise in an existing design. The speed of the FCT2541T is
comparable to bipolar logic counterparts while reducing power dis-
sipation. The input and output voltage levels allow direct interface
with TTL and CMOS devices without external components.
• 25Ωoutputseriestoreducetransmissionlinereflection
noise
• Reduced VOH (typically = 3.3V) versions of equivalent
FCT functions
• Edge-rate control circuitry for significantly improved
noise characteristics
• Power-off disable feature
• ESD > 2000V
• Matched rise and fall times
• Fully compatible with TTL input and output logic levels
The outputs are designed with a power-off disable feature to
allow for live insertion of boards.
• Sink current
Source current
12 mA
15 mA
Logic Block Diagram
Pin Configurations
OE
OE
O
A
B
SOIC/QSOP
Top View
D
0
D
1
D
2
D
3
D
4
D
5
D
6
D
7
OE
V
CC
1
2
20
19
0
1
2
3
4
5
6
7
A
D
OE
0
B
O
O
O
O
O
O
O
D
D
D
O
0
3
4
5
18
17
16
1
2
3
O
1
O
2
D
D
D
D
O
3
6
15
14
13
12
11
4
5
6
7
O
4
7
O
5
8
O
6
9
GND
O
7
10
FCT2541T–2
FCT2541T–3
]
Function Table[1]
Inputs
OEA
OEB
D
Output
L
L
H
L
L
H
L
H
X
L
H
Z
Note:
1. H = HIGH Voltage Level
L = LOW Voltage Level
X = Don’t Care
Z = High Impedance
Copyright © 2000, Texas Instruments Incorporated
CY74FCT2541T
Maximum Ratings[2,3]
DC Output Current (Maximum Sink Current/Pin) ......120 mA
Power Dissipation..........................................................0.5W
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Static Discharge Voltage............................................>2001V
(per MIL-STD-883, Method 3015)
Storage Temperature .....................................−65°C to +150°C
Ambient Temperature with
Power Applied..................................................−65°C to +135°C
Operating Range
Ambient
Supply Voltage to Ground Potential..................−0.5V to +7.0V
DC Input Voltage .................................................−0.5V to +7.0V
DC Output Voltage ..............................................−0.5V to +7.0V
Range
Temperature
VCC
Commercial
−40°C to +85°C
5V ± 5%
Electrical Characteristics Over the Operating Range
Parameter
VOH
VOL
ROUT
VIH
Description
Output HIGH Voltage
Output LOW Voltage
Output Resistance
Input HIGH Voltage
Input LOW Voltage
Hysteresis[6]
Test Conditions
VCC = Min., IOH = −15 mA
VCC = Min., IOL = 12 mA
VCC = Min., IOL = 12 mA
Min.
Typ.[5]
Max.
Unit
2.4
3.3
0.3
25
V
V
0.55
40
20
Ω
2.0
V
VIL
0.8
V
VH
All inputs
0.2
V
VIK
Input Clamp Diode Voltage
Input HIGH Current
Input HIGH Current
Input LOW Current
VCC = Min., IIN = −18 mA
VCC = Max., VIN = VCC
VCC = Max., VIN = 2.7V
VCC = Max., VIN = 0.5V
VCC = Max., VOUT = 2.7V
−0.7
−1.2
5
V
II
µA
µA
µA
µA
IIH
±1
±1
15
IIL
IOZH
Off State HIGH-Level
Output Current
IOZL
Off State LOW-Level
Output Current
VCC = Max., VOUT = 0.5V
−15
µA
IOS
Output Short Circuit Current[7] VCC = Max., VOUT = 0.0V
−60
−120
−225
±1
mA
IOFF
Power-Off Disable
VCC = 0V, VOUT = 4.5V
µA
Capacitance[6]
Parameter
Description
Typ.[5]
Max.
Unit
pF
CIN
Input Capacitance
Output Capacitance
5
9
10
12
COUT
pF
Notes:
2. Unless otherwise noted, these limits are over the operating free-air temperature range.
3. Unused inputs must always be connected to an appropriate logic voltage level, preferably either VCC or ground.
4. TA is the “instant on” case temperature.
5. Typical values are at VCC=5.0V, TA=+25˚C ambient.
6. This parameter is specified but not tested.
7. Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample
and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter
tests, IOS tests should be performed last.
2
CY74FCT2541T
Power Supply Characteristics
Parameter
Description
Test Conditions
VCC=Max., VIN≤0.2V,
IN≥VCC−0.2V
Typ.[5]
Max.
Unit
ICC
Quiescent Power Supply
Current
0.1
0.2
mA
V
∆ICC
Quiescent Power Supply
Current (TTL inputs)
VCC=Max., VIN=3.4V,[8]
f1=0, Outputs Open
0.5
2.0
mA
ICCD
Dynamic Power Supply
Current[9]
VCC=Max., 50% Duty Cycle, Outputs Open,
One Bit Toggling,
0.06
0.12
mA/
MHz
OEA=OEB=GND, VIN≤0.2V or
VIN≥VCC−0.2V
IC
Total Power Supply Current[10]
VCC=Max., 50% Duty Cycle, Outputs Open,
One Bit Toggling at f1=10 MHz,
OEA=OEB=GND, VIN≤0.2V or VIN≥VCC−0.2V
0.7
1.0
1.3
3.3
1.4
2.4
mA
mA
mA
mA
VCC=Max., 50% Duty Cycle, Outputs Open,
One Bit Toggling at f1=10 MHz,
OEA=OEB=GND, VIN=3.4V or VIN=GND
VCC=Max., 50% Duty Cycle, Outputs Open,
Eight Bits Toggling at f1=2.5 MHz,
OEA=OEB=GND, VIN≤0.2V or VIN≥VCC−0.2V
2.6[11]
10.6[11]
VCC=Max., 50% Duty Cycle, Outputs Open,
Eight Bits Toggling at f1=2.5 MHz,
OEA=OEB=GND, VIN=3.4V or VIN=GND
Switching Characteristics Over the Operating Range[12]
Fig.
CY74FCT2541T
CY74FCT2541AT
CY74FCT2541AT
Unit
No.[13]
Parameter
Description
Min.
Max.
Min.
Max.
Min.
Max.
tPLH
tPHL
Propagation Delay
Data to Output
1.5
8.0
1.5
4.8
1.5
4.1
ns
ns
ns
1, 3
tPZH
tPZL
Output Enable Time
1.5
1.5
10.0
9.5
1.5
1.5
6.2
5.6
1.5
1.5
5.8
5.2
1, 7, 8
1, 7, 8
tPHZ
tPLZ
Output Disable Time
Notes:
8. Per TTL driven input (VIN=3.4V); all other inputs at VCC or GND.
9. This parameter is not directly testable, but is derived for use in Total Power Supply calculations.
10. IC
IC
=
=
=
=
=
=
=
=
=
=
IQUIESCENT + IINPUTS + IDYNAMIC
ICC+∆ICCDHNT+ICCD(f0/2 + f1N1)
Quiescent Current with CMOS input levels
Power Supply Current for a TTL HIGH input (VIN=3.4V)
Duty Cycle for TTL inputs HIGH
ICC
∆ICC
DH
NT
ICCD
f0
Number of TTL inputs at DH
Dynamic Current caused by an input transition pair (HLH or LHL)
Clock frequency for registered devices, otherwise zero
Input signal frequency
f1
N1
Number of inputs changing at f1
All currents are in milliamps and all frequencies are in megahertz.
11. Values for these conditions are examples of the ICC formula. These limits are specified but not tested.
12. Minimum limits are specified but not tested on Propagation Delays.
13. See “Parameter Measurement Information” in the General Information section.
3
CY74FCT2541T
Ordering Information
Speed
Package
Name
Operating
Range
(ns)
Ordering Code
Package Type
20-Lead (150-Mil) QSOP
4.1
CY74FCT2541CTQCT
Q5
S5
Q5
S5
Q5
S5
Commercial
Commercial
Commercial
CY74FCT2541CTSOC/SOCT
CY74FCT2541ATQCT
20-Lead (300-Mil) Molded SOIC
20-Lead (150-Mil) QSOP
4.8
8.0
CY74FCT2541ATSOC/SOCT
CY74FCT2541TQCT
20-Lead (300-Mil) Molded SOIC
20-Lead (150-Mil) QSOP
CY74FCT2541TSOC/SOCT
20-Lead (300-Mil) Molded SOIC
Document #: 38−00342−A
4
CY74FCT2541T
Package Diagrams
20-Lead Quarter Size Outline Q5
20-Lead (300-Mil) Molded SOIC S5
5
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accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
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Copyright 2000, Texas Instruments Incorporated
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