CY74FCT827CTSOC [TI]
10-Bit Buffer; 10位缓冲
| 型号： | CY74FCT827CTSOC |
| 厂家： | 
TEXAS INSTRUMENTS |
| 描述： | 10-Bit Buffer |
| 文件： | 总7页 (文件大小：69K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
Data sheet acquired from Cypress Semiconductor Corporation.
Data sheet modified to remove devices not offered.
CY54/74FCT827T
SCCS034 - September 1994 - Revised March 2000
10-Bit Buffer
•
Sink current
64 mA (Com’l),
Features
32 mA (Mil)
Source current
32 mA (Com’l),
12 mA (Mil)
• Function, pinout, and drive compatible with FCT, F, and
AM29827 logic
• FCT-C speed at 4.4 ns max. (Com’l)
FCT-A speed at 5.0 ns max. (Com’l)
Functional Description
• Reduced VOH (typically = 3.3V) versions of equivalent
FCT functions
• Edge-rate control circuitry for significantly improved
noise characteristics
• Power-off disable feature
• ESD > 2000V
The FCT827T 10-bit bus driver provides high-performance
bus interface buffering for wide data/address paths or buses
carrying parity. The 10-bit buffers have NAND-ed output
enables for maximum control flexibility. The FCT827T is
designed for high-capacitance load drive capability, while providing
low-capacitance bus loading at both inputs and outputs. All outputs
are designed for low-capacitance bus loading in the
high-impedance state and are designed with a power-off disable
feature to allow for live insertion of boards.
• Matched rise and fall times
• Fully compatible with TTL input and output logic levels
Logic Block Diagram
Pin Configurations
LCC/PLCC
Top View
Y
0
Y
1
Y
2
Y
3
Y
4
Y
5
Y
6
Y
7
Y
8
Y
9
1110 9
12
8 7 6 5
D
D
GND
NC
4
D
D
8
1
13
14
3
2
1
9
0
OE
1
15
16
17
NC
V
OE
2
28
27
26
CC
Y
9
Y
0
Y
8
18
Y
1
1920 2122 23 24 25
D
0
D
1
D
2
D
3
D
4
D
5
D
6
D
7
D
8
D
9
OE OE
1
2
SOIC/QSOP
Top View
1
OE
1
24
V
CC
2
3
4
5
6
D
D
23
22
21
Y
0
0
1
Y
1
D
2
D
3
D
4
D
5
D
6
D
7
D
8
D
9
Y
2
Y
3
20
19
18
17
16
Y
4
Y
5
7
Y
6
8
Y
7
9
Y
8
10
11
12
15
14
13
Y
9
GND
OE
2
Function Table[1]
Inputs
OE2
Outputs
Y
OE1
D
Function
L
L
L
L
L
H
L
H
Transparent
H
X
X
H
X
X
Z
Z
Three-State
Note:
1. H = HIGH Voltage Level. L = LOW Voltage Level. X = Don’t Care
Copyright © 2000, Texas Instruments Incorporated
CY54/74FCT827T
Maximum Ratings[2, 3]
Power Dissipation..........................................................0.5W
Static Discharge Voltage............................................>2001V
(per MIL-STD-883, Method 3015)
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Storage Temperature .................................–65°C to +150°C
Operating Range
Ambient Temperature with
Ambient
Power Applied.............................................–65°C to +135°C
Range
Range
Temperature
–40°C to + 85°C
–55°C to +125°C
VCC
Supply Voltage to Ground Potential ............... –0.5V to +7.0V
DC Input Voltage............................................ –0.5V to +7.0V
DC Output Voltage......................................... –0.5V to +7.0V
DC Output Current (Maximum Sink Current/Pin).......120 mA
Commercial All
Military[4]
5V ± 5%
5V ± 10%
All
Electrical Characteristics Over the Operating Range
Parameter
Description
Test Conditions
VCC= Min., IOH= –32 mA
Min.
2.0
Typ.[5]
Max.
Unit
V
VOH
Output HIGH Voltage
Com’l
Com’l
Mil
VCC= Min., IOH= –15 mA
VCC= Min., IOH= –12 mA
VCC= Min., IOL= 64 mA
VCC= Min., IOL= 32 mA
2.4
3.3
3.3
0.3
0.3
V
2.4
V
VOL
Output LOW Voltage
Com’l
Mil
0.55
0.55
V
V
VIH
VIL
VH
VIK
II
Input HIGH Voltage
Input LOW Voltage
Hysteresis[6]
2.0
V
0.8
V
All inputs
0.2
V
Input Clamp Diode Voltage
Input HIGH Current
Input HIGH Current
Input LOW Current
VCC= Min., IIN= –18 mA
VCC= Max., VIN= VCC
VCC= Max., VIN= 2.7V
VCC= Max., VIN= 0.5V
VCC = Max., VOUT = 2.7V
–0.7
–1.2
5
V
µA
µA
µA
µA
IIH
±1
±1
10
IIL
IOZH
Off State HIGH-Level Output
Current
IOZL
Off State LOW-Level
Output Current
VCC = Max., VOUT = 0.5V
–10
µA
IOS
Output Short Circuit Current[7] VCC= Max., VOUT= 0.0V
–60
–120
–225
mA
IOFF
Power-Off Disable
VCC= 0V, VOUT= 4.5V
±1
µA
Capacitance[6]
Parameter
Description
Typ.[5]
Max.
10
Unit
CIN
Input Capacitance
Output Capacitance
5
9
pF
pF
COUT
12
Notes:
2. Unless otherwise noted, these limits are over the operating free-air temperature range.
3. Unused inputs must always be connected to an appropriate logic voltage level, preferably either VCC or ground.
4. TA is the “instant on” case temperature.
5. Typical values are at VCC=5.0V, TA=+25˚C ambient.
6. This parameter is specified but not tested.
7. Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample
and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting of
a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter
tests, IOS tests should be performed last.
2
CY54/74FCT827T
Power Supply Characteristics
Parameter
ICC
Description
Test Conditions
Typ.[5]
0.1
Max.
0.2
Unit
mA
mA
Quiescent Power Supply Current
VCC=Max., VIN≤0.2V, VIN≥VCC–0.2V
VCC=Max., VIN=3.4V,[8]
f1=0, Outputs Open
∆ICC
Quiescent Power Supply Current
(TTL inputs HIGH)
0.5
2.0
ICCD
Dynamic Power Supply
Current[9]
VCC=Max., One Input Toggling,
50% Duty Cycle, Outputs Open,
OE1 or OE2=GND,
0.06
0.7
0.12
1.4
mA/MHz
VIN≤0.2V or VIN≥VCC–0.2V
IC
Total Power Supply Current[10]
VCC=Max., 50% Duty Cycle, Outputs Open,
One Bit Toggling at f1=10 MHz,
OE1 or OE2=GND,
mA
VIN≤0.2V or VIN≥VCC–0.2V
VCC=Max.,50% Duty Cycle, Outputs Open,
One Bit Toggling at f1=10 MHz,
OE1 or OE2=GND, VIN=3.4V or VIN=GND
1.0
1.6
2.4
mA
mA
VCC=Max., 50% Duty Cycle, Outputs Open,
Ten Bits Toggling at f1=2.5 MHz,
OE1 or OE2=GND,
3.2[11]
VIN≤0.2V or VIN≥VCC–0.2V
VCC=Max., 50% Duty Cycle, Outputs Open,
Ten Bits Toggling at f1=2.5 MHz,
4.1
13.2[11]
mA
OE1 or OE2=GND,VIN=3.4V or VIN=GND
Notes:
8. Per TTL driven input (VIN=3.4V); all other inputs at VCC or GND.
9. This parameter is not directly testable, but is derived for use in Total Power Supply calculations.
10. IC
IC
=
=
=
=
=
=
=
=
=
=
IQUIESCENT + IINPUTS + IDYNAMIC
ICC+∆ICCDHNT+ICCD(f0/2 + f1N1)
Quiescent Current with CMOS input levels
Power Supply Current for a TTL HIGH input VIN=3.4V)
Duty Cycle for TTL inputs HIGH
ICC
∆ICC
DH
NT
ICCD
f0
Number of TTL inputs at DH
Dynamic Current caused by an input transition pair HLH or LHL)
Clock frequency for registered devices, otherwise zero
Input signal frequency
f1
N1
Number of inputs changing at f1
All currents are in milliamps and all frequencies are in megahertz.
11. Values for these conditions are examples of the ICC formula. These limits are specified but not tested.
3
CY54/74FCT827T
Switching Characteristics Over the Operating Range[12]
FCT827AT
Military Commercial
Test Load Min. Max. Min. Max. Unit No.[13]
Fig.
Parameter
Description
tPLH
tPHL
Propagation Delay
D to Y
CL=50 pF
RL=500Ω
1.5
1.5
1.5
1.5
1.5
1.5
9.0
17.0
13.0
25.0
9.0
1.5
1.5
1.5
1.5
1.5
1.5
8.0
15.0
12.0
23.0
9.0
ns
1, 3
1, 3
tPLH
tPHL
Propagation Delay
D to Y[12]
CL=300 pF
RL=500Ω
ns
tPZH
tPZL
Output Enable Time
OE to Y
CL=50 pF
RL=500Ω
ns 1, 7, 8
ns 1, 7, 8
ns 1, 7, 8
ns 1, 7, 8
tPZH
tPZL
Output Enable Time
OE to Y[12]
CL=300 pF
RL=500Ω
tPHZ
tPHL
Output Disable Time
OE to Y[12]
CL=5 pF
RL=500Ω
tPHZ
tPHL
Output Disable Time
OE to Y
CL=50 pF
RL=500Ω
10.0
10.0
FCT827CT
Commercial
Parameter
Description
Propagation Delay D to Y
Test Load
Min.
Max.
Unit Fig. No.[13]
tPLH
tPHL
CL=50 pF
RL=500Ω
1.5
4.4
10.0
7.0
ns
ns
ns
ns
ns
ns
1, 3
tPLH
tPHL
Propagation Delay D to Y[12]
Output Enable Time OE to Y
Output Enable Time OE to Y[12]
Output Disable Time OE to Y[12]
Output Disable Time OE to Y
CL=300 pF
RL=500Ω
1.5
1.5
1.5
1.5
1.5
1, 3
tPZH
tPZL
CL=50 pF
RL=500Ω
1, 7, 8
1, 7, 8
1, 7, 8
1, 7, 8
tPZH
tPZL
CL=300 pF
RL=500Ω
14.0
5.7
tPHZ
tPHL
CL=5 pF
RL=500Ω
tPHZ
tPHL
CL=50 pF
RL=500Ω
6.0
Ordering Information
Speed
(ns)
Package
Name
Operating
Range
Ordering Code
Package Type
4.4
CY74FCT827CTQCT
Q13
S13
Q13
S13
L64
24-Lead (150-Mil) QSOP
Commercial
Commercial
Military
CY74FCT827CTSOC/SOCT
CY74FCT827ATQCT
24-Lead (300-Mil) Molded SOIC
24-Lead (150-Mil) QSOP
8.0
CY74FCT827ATSOC/SOCT
CY54FCT827ATLMB
24-Lead (300-Mil) Molded SOIC
28-Square Leadless Chip Carrier
9.0
Notes:
12. Minimum limits are specified but not tested on Propagation Delays.
13. See “Parameter Measurement Information” in the General Information section.
Document #: 38-00326-A
4
CY54/74FCT827T
Package Diagrams
28-Square Leadless Chip Carrier L64
MIL-STD-1835 C-4
24-Lead Quarter Size Outline Q13
5
CY54/74FCT827T
Package Diagrams (continued)
24-Lead (300-Mil) Molded SOIC S13
6
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Copyright 2000, Texas Instruments Incorporated
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