DAC8043UCG4 [TI]

CMOS 12-Bit Serial Input Multiplying DIGITAL-TO-ANALOG CONVERTER; CMOS 12位串行输入乘法数位类比转换器
DAC8043UCG4
型号: DAC8043UCG4
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

CMOS 12-Bit Serial Input Multiplying DIGITAL-TO-ANALOG CONVERTER
CMOS 12位串行输入乘法数位类比转换器

转换器 数模转换器 光电二极管
文件: 总11页 (文件大小:264K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
®
DAC8043  
DAC8043  
CMOS 12-Bit Serial Input Multiplying  
DIGITAL-TO-ANALOG CONVERTER  
FEATURES  
APPLICATIONS  
12-BIT ACCURACY IN 8-PIN SOIC  
FAST 3-WIRE SERIAL INTERFACE  
LOW INL AND DNL: ±1/2 LSB max  
GAIN ACCURACY TO ±1LSB max  
LOW GAIN TEMPCO: 5ppm/°C max  
OPERATES WITH +5V SUPPLY  
TTL/CMOS COMPATIBLE  
AUTOMATIC CALIBRATION  
MOTION CONTROL  
MICROPROCESSOR CONTROL SYSTEMS  
PROGRAMMABLE AMPLIFIER/  
ATTENUATORS  
DIGITALLY CONTROLLED FILTERS  
ESD PROTECTED  
DESCRIPTION  
The DAC8043 is a 12-bit current output multiplying  
digital-to-analog converter (DAC) that is packaged in a  
space-saving, surface-mount 8-pin SOIC. Its 3-wire se-  
rial interface saves additional circuit board space which  
results in low power dissipation. When used with micro-  
processors having a serial port, the DAC8043 minimizes  
the digital noise feedthrough from its input to output.  
The serial port can be used as a dedicated analog bus and  
kept inactive while the DAC8043 is in use. Serial inter-  
facing reduces the complexity of opto or transformer  
isolation applications.  
RFB  
2
RFB  
12-Bit  
D/A  
Converter  
1
5
3
VREF  
IOUT  
12  
12-Bit  
DAC Register  
LD  
The DAC8043 contains a 12-bit serial-in, parallel-out  
shift register, a 12-bit DAC register, a 12-bit CMOS  
DAC, and control logic. Serial input (SRI) data is clocked  
into the input register on the rising edge of the clock  
(CLK) pulse. When the new data word had been clocked  
in, it is loaded into the DAC register by taking the LD  
input low. Data in the DAC register is converted to an  
output current by the D/A converter.  
8
4
VDD  
12  
GND  
7
6
CLK  
SRI  
12-Bit Input  
Shift Register  
The DAC8043 operates from a single +5V power supply  
which makes the DAC8043 an ideal low power, small  
size, high performance solution for several applications.  
International Airport Industrial Park  
Mailing Address: PO Box 11400, Tucson, AZ 85734  
FAXLine: (800) 548-6133 (US/Canada Only)  
• Street Address: 6730 S. Tucson Blvd., Tucson, AZ 85706 • Tel: (520) 746-1111 • Twx: 910-952-1111  
Internet: http://www.burr-brown.com/  
Cable: BBRCORP  
Telex: 066-6491  
FAX: (520) 889-1510  
Immediate Product Info: (800) 548-6132  
©1993 Burr-Brown Corporation  
PDS-1197B  
Printed in U.S.A. March, 1998  
SBAS028  
SPECIFICATIONS  
ELECTRICAL CHARACTERISTICS  
At VDD = +5V; VREF = +10V; IOUT = GND = 0V; TA = Full Temperature Range specified under Absolute Maximum Ratings, unless otherwise noted.  
DAC8043U  
TYP  
DAC8043UC  
TYP  
PARAMETER  
SYMBOL  
CONDITIONS  
MIN  
MAX  
MIN  
MAX  
UNITS  
STATIC PERFORMANCE  
Resolution  
N
12  
12  
Bits  
LSB  
LSB  
LSB  
LSB  
ppm/°C  
%/%  
nA  
Nonlinearity(1)  
INL  
DNL  
FSE  
±1  
±1  
±2  
±2  
±5  
±1/2  
±1/2  
±1  
±2  
±5  
Differential Nonlinearity(2)  
Gain Error(3)  
TA = +25°C  
TA = Full Temp Range  
Gain Tempco(5)  
Power Supply Rejection Ratio  
Output Leakage Current(4)  
TCFSE  
PSRR  
ILKG  
VDD = ±5%  
TA = +25°C  
±0.0006  
±0.002  
±5  
±0.0006  
±0.002  
±5  
TA = Full Temp Range  
TA = +25°C  
TA = Full Temp Range  
±100  
0.03  
0.60  
15  
±25  
0.03  
0.15  
15  
nA  
Zero Scale Error(7, 12)  
Input Resistance(8)  
IZSE  
RIN  
LSB  
LSB  
kΩ  
7
11  
7
11  
AC PERFORMANCE  
Output Current Settling Time(5, 6)  
Digital-to-Analog Glitch  
Energy(5, 10)  
tS  
TA = +25°C  
0.25  
2
1
20  
0.25  
2
1
20  
µs  
nVs  
V
REF = 0V  
Q
IOUT = Load = 100Ω  
CEXT = 13pF  
DAC Register Loaded Alternately with all 0s and all 1s  
Feedthrough Error(5, 11)  
FT  
VREF = 20Vp-p at f = 10kHz  
0.7  
1
0.7  
1
mVp-p  
(VREF to IOUT  
)
Digital Input = 0000 0000 0000  
T
A = +25°C  
Total Harmonic Distortion(5)  
THD  
eN  
VREF = 6VRMS at 1kHz  
DAC Register Loaded with all 1s  
10Hz to 100kHz  
–85  
–85  
dB  
Output Noise Voltage Density(5, 13)  
17  
17  
nV/Hz  
Between RFB and IOUT  
DIGITAL INPUTS  
Digital Input High  
Digital Input Low  
Input Leakage Current(9)  
Input Capacitance(5, 11)  
VIH  
VIL  
IIL  
2.4  
2.4  
V
V
µA  
pF  
0.8  
±1  
8
0.8  
±1  
8
VIN = 0V to +5V  
VIN = 0V  
CIN  
ANALOG OUTPUTS  
Output Capacitance(5)  
COUT  
Digital Inputs = VIH  
Digital Inputs = VIL  
110  
80  
110  
80  
pF  
pF  
TIMING CHARACTERISTICS(5, 14)  
Data Setup Time  
Data Hold Time  
Clock Pulse Width High  
Clock Pulse Width Low  
Load Pulse Width  
tDS  
tDH  
tCH  
tCL  
tLD  
TA = Full Temperature Range  
TA = Full Temperature Range  
TA = Full Temperature Range  
TA = Full Temperature Range  
TA = Full Temperature Range  
40  
80  
90  
120  
120  
40  
80  
90  
120  
120  
ns  
ns  
ns  
ns  
ns  
LSB Clock into Input Register  
to Load DAC Register Time  
tASB  
TA = Full Temperature Range  
0
0
ns  
POWER SUPPLY  
Supply Voltage  
Supply Current  
VDD  
IDD  
4.75  
5
5.25  
500  
100  
4.75  
5
5.25  
500  
100  
V
µA  
µA  
Digital Inputs = VIH or VIL  
Digital Inputs = 0V or VDD  
NOTES: (1) ±1/2 LSB = ±0.012% of Full Scale. (2) All grades are monotonic to 12-bits over temperature. (3) Using internal feedback resistor. (4) Applies to IOUT; All  
digital inputs = 0V. (5) Guaranteed by design and not tested. (6) IOUT Load = 100, CEXT = 13pF, digital input = 0V to VDD or VDD to 0V. Extrapolated to 1/2 LSB:  
t
S = propagation delay (tPD) + 9τ where τ = measured time constant of the final RC decay. (7) VREF = +10V, all digital inputs = 0V. (8) Absolute temperature coefficient  
is less than ±50ppm/°C. (9) Digital inputs are CMOS gates: IIN is typically 1nA at +25°C. (10) VREF = 0V, all digital inputs = 0V to VDD or VDD to 0V. (11) All digital  
inputs = 0V. (12) Calculated from worst case RREF: IZSE (in LSBs) = (RREF X ILKG X 4096)/VREF. (13) Calculations from en = 4K TRB where: K = Boltzmann constant,  
J/°K, R = resistance, . T = Resistor temperature, °K, B = bandwidth, Hz. (14) Tested at VIN = 0V or VDD  
.
The information provided herein is believed to be reliable; however, BURR-BROWN assumes no responsibility for inaccuracies or omissions. BURR-BROWN assumes  
no responsibility for the use of this information, and all use of such information shall be entirely at the user’s own risk. Prices and specifications are subject to change  
without notice. No patent rights or licenses to any of the circuits described herein are implied or granted to any third party. BURR-BROWN does not authorize or warrant  
any BURR-BROWN product for use in life support devices and/or systems.  
®
2
DAC8043  
WAFER TEST LIMITS  
At VDD = +5V; VREF = +10V; IOUT = GND = 0V; TA = +25°C.  
DAC8043  
UNITS  
PARAMETER  
SYMBOL  
CONDITIONS  
LIMIT  
STATIC ACCURACY  
Resolution  
Integral Nonlinearity  
Differential Nonlinearity  
Gain Error  
N
INL  
DNL  
GFSE  
PSRR  
ILKG  
12  
±1  
±1  
±2  
±0.002  
±5  
Bits min  
LSB max  
LSB max  
LSB max  
%/% max  
nA max  
Using Internal Feedback Resistor  
VDD = ±5%  
Power Supply Rejection Ratio  
Output Leakage Current (IOUT  
)
Digital Inputs = VIL  
REFERENCE INPUT  
Input Resistance  
RIN  
7/15  
kmin/max  
DIGITAL INPUTS  
Digital Input HIGH  
Digital Input LOW  
Input Leakage Current  
VIH  
VIL  
IIL  
2.4  
0.8  
±1  
V min  
V max  
µA max  
VIN = 0V to VDD  
POWER SUPPLY  
Supply Current  
IDD  
Digital Inputs = VIH or VIL  
Digital Inputs = 0V to VDD  
500  
100  
µA max  
µA max  
NOTE: Electrical tests are performed at wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packaging is not  
guaranteed for standard product dice. Consult factory to negotiate specifications based on dice lot qualifications through sample lot assembly and testing.  
ABSOLUTE MAXIMUM RATINGS  
PIN CONFIGURATION  
VDD to GND .................................................................................. 0V, +7V  
VREF to GND ...................................................................................... ±25V  
VRFB to GND ...................................................................................... ±25V  
Digital Input Voltage Range ................................................. –0.3V to VDD  
Output Voltage (Pin 3)......................................................... –0.3 V to VDD  
Operating Temperature Range  
AD ........................................................................................0°C to +70°C  
U, UC ............................................................................... –40°C to +85°C  
Junction Temperature .................................................................... +150°C  
Storage Temperature.................................................... –65°C to + 150°C  
Lead Temperature (soldering, 10s) .............................................. +300° C  
Top View  
8-Pin SOIC  
VREF  
1
2
3
4
8
7
6
5
VDD  
RFB  
IOUT  
CLK  
SRI  
LD  
GND  
θJA  
.......................................................................................................................... +100°C/W  
θJC ........................................................................................... +42°C/W  
CAUTION: 1. Do not apply voltages higher than VDD or less than GND  
potential on any terminal except VREF (Pin 1) and RFB (Pin 2). 2. The digital  
control inputs are ESD protected: however, permanent damage may occur on  
unprotected units from high-energy electrostatic fields. Keep units in conduc-  
tive foam at all times until ready to use. 3. Use proper anti-static handling  
procedures. 4. Absolute Maximum Ratings apply to both packaged devices.  
Stresses above those listed under Absolute Maximum Ratings may cause  
permanent damage to the device.  
ELECTROSTATIC  
DISCHARGE SENSITIVITY  
Any integrated circuit can be damaged by ESD. Burr-Brown  
recommends that all integrated circuits be handled with  
appropriate precautions. Failure to observe proper handling  
and installation procedures can cause damage.  
PACKAGE/ORDERING INFORMATION  
PACKAGE  
DRAWING  
NUMBER(1)  
TEMPERATURE  
RANGE  
PRODUCT  
INL  
PACKAGE  
ESD damage can range from subtle performance degrada-  
tion to complete device failure. Precision integrated circuits  
may be more susceptible to damage because very small  
parametric changes could cause the device not to meet  
published specifications.  
DAC8043U  
DAC8043UC 1/2LSB  
1LSB  
–40°C to +85°C  
–40°C to +85°C  
8-pin SOIC  
8-pin SOIC  
182  
182  
NOTE: (1) For detailed drawing and dimension table, please see end of data  
sheet, or Appendix C of Burr-Brown IC Data Book.  
Digital Inputs: All digital inputs of the DAC8043 incorpo-  
rate on-chip ESD protection circuitry. This protection is  
designed and has been tested to withstand five 2500V  
positive and negative discharges (100pF in series with 1500)  
applied to each digital input.  
Analog Pins: Each analog pin has been tested to Burr-  
Brown’s analog ESD test consisting of five 1000V positive  
and negative discharges (100pF in series with 1500) ap-  
plied to each pin. VREF and RFB show some sensitivity.  
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3
DAC8043  
WRITE CYCLE TIMING DIAGRAM  
Bit 1  
Bit 12  
LSB  
SRI  
Bit 2  
Bit 11  
11  
MSB(1)  
tDH  
tDS  
1
tCL  
tCH  
2
CLK INPUT  
tASB  
Load Serial Data  
Into Input Register  
tLD  
LD  
Load Input Register's  
Data Into DAC Register  
NOTE: (1) Data loaded MSB first.  
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4
DAC8043  
TYPICAL PERFORMANCE CURVES  
At VDD = +5V; VREF = +10V; IOUT = GND = 0V; TA = Full Temperature Range specified under Absolute Maximum Ratings, unless otherwise noted.  
LINEARITY ERROR vs REFERENCE VOLTAGE  
GAIN vs FREQUENCY  
0
–20  
0.5  
0.25  
0
Digital Input  
= 1111 1111 1111  
–40  
–60  
Digital Input  
= 0000 0000 0000  
–80  
–0.25  
–0.5  
VDD = +5V  
VREF = 100mV  
TA = +25°C  
–100  
–120  
1k  
10k  
100k  
Frequency (Hz)  
1M  
10M  
2
4
6
8
10  
VREF (V)  
TOTAL HARMONIC DISTORTION vs FREQUENCY  
(Multiplying Mode)  
SUPPLY CURRENT vs LOGIC INPUT VOLTAGE  
VDD = +5V  
1.6  
1.4  
1.2  
1.0  
0.8  
0.6  
0.4  
0.2  
0
0
–20  
VDD = +5V  
VIN = 6Vrms  
TA = +25°C  
–40  
–60  
–80  
–100  
–120  
10  
100  
1000  
Frequency (Hz)  
10000  
0
1
2
3
4
VIN (V)  
LINEARITY ERROR vs DIGITAL CODE  
DNL ERROR vs REFERENCE VOLTAGE  
1
0.75  
0.5  
0.5  
0.25  
0
TA = +25°C  
REF = +10V  
V
0.25  
0
–0.25  
–0.5  
–0.75  
–1  
–0.25  
–0.5  
2
4
6
8
10  
0
1024  
2048  
3072  
4096  
Digital Input Code (Decimal)  
VREF (V)  
®
5
DAC8043  
tains a constant current in each leg of the ladder regardless of  
the input code. The input resistance at VREF is therefore  
constant and can be driven by either a voltage or current, AC  
or DC, positive or negative polarity, and have a voltage range  
up to ±20V.  
DISCUSSION OF  
SPECIFICATIONS  
RELATIVE ACCURACY  
This term, also known as end point linearity or integral  
linearity, describes the transfer function of analog output to  
digital input code. Relative accuracy describes the deviation  
from a straight line, after zero and full scale errors have been  
adjusted to zero.  
A CMOS switch transistor, included in series with the ladder  
terminating resistor and in series with the feedback resistor,  
RFB, compensates for the temperature drift of the ON resis-  
tance of the ladder switches.  
Figure 2 shows an equivalent circuit for the DAC. COUT is the  
output capacitance due to the N-channel switches and varies  
from about 80pF to 110pF with digital input code. The current  
source ILKG is the combination of surface and junction leak-  
ages to the substrate. ILKG approximately doubles every 10°C.  
RO is the equivalent output resistance of the D/A and it varies  
with input code.  
DIFFERENTIAL NONLINEARITY  
Differential nonlinearity is the deviation from an ideal 1LSB  
change in the output when the input code changes by 1LSB.  
A differential nonlinearity specification of 1LSB maximum  
guarantees monotonicity.  
GAIN ERROR  
Gain error is the difference between the full-scale DAC  
output and the ideal value. The ideal full scale output value  
for the DAC8043 is –(4095/4096)VREF. Gain error may be  
adjusted to zero using external trims as shown in Figure 4.  
R
RFB  
VREF  
IOUT  
ILKG  
DIN VREF  
COUT  
RO  
x
R
4096  
R
OUTPUT LEAKAGE CURRENT  
GND  
The current which appears at IOUT with the DAC loaded with  
all zeros.  
FIGURE 2. Equivalent Circuit for the DAC.  
OUTPUT CAPACITANCE  
The parasitic capacitance measured from IOUT to GND.  
INSTALLATION  
ESD PROTECTION  
FEEDTHROUGH ERROR  
The AC output error due to capacitive coupling from VREF to  
IOUT with the DAC loaded with all zeros.  
All digital inputs of the DAC8043 incorporate on-chip ESD  
protection circuitry. This protection is designed to withstand  
2.5kV (using the Human Body Model, 100pF and 1500).  
However, industry standard ESD protection methods should  
be used when handling or storing these components. When  
not in use, devices should be stored in conductive foam or  
rails. The foam or rails should be discharged to the destina-  
tion socket potential before devices are removed.  
OUTPUT CURRENT SETTLING TIME  
The time required for the output current to settle to within  
+0.01% of final value for a full scale step.  
DIGITAL-TO-ANALOG GLITCH ENERGY  
The integrated area of the glitch pulse measured in nanovolt-  
seconds. The key contributor to digital-to-analog glitch is  
charge injected by digital logic switching transients.  
POWER SUPPLY CONNECTIONS  
The DAC8043 is designed to operate on VDD = +5V ±5%.  
For optimum performance and noise rejection, power supply  
decoupling capacitors CD should be added as shown in the  
application circuits. These capacitors (1µF tantalum recom-  
mended) should be located close to the D/A. Output op amp  
analog common (+ input) should be connected as near to the  
GND pins of the DAC8043 as possible.  
CIRCUIT DESCRIPTION  
Figure 1 shows a simplified schematic of a DAC8043. The  
current from the VREF pin is switched between IOUT and GND  
by 12 single-pole double-throw CMOS switches. This main-  
VREF  
R
R
R
WIRING PRECAUTIONS  
To minimize AC feedthrough when designing a PC board,  
care should be taken to minimize capacitive coupling be-  
tween the VREF lines and the IOUT lines. Coupling from any  
of the digital control or data lines might degrade the glitch  
performance. Solder the DAC8043 directly into the PC board  
without a socket. Sockets add parasitic capacitance (which  
can degrade AC performance).  
RFB  
R
2R  
2R  
2R  
2R  
2R  
IOUT  
GND  
Bit 1  
(MSB)  
Bit 2  
Bit 3  
Bit 12  
(LSB)  
FIGURE 1. Simplified Circuit Diagram for the DAC.  
®
6
DAC8043  
AMPLIFIER OFFSET VOLTAGE  
versus digital input code are listed in Table I. The operational  
amplifiers used in this circuit can be single amplifiers such as  
the OPA602, or a dual amplifier such as the OPA2107. C1  
provides phase compensation to minimize settling time and  
overshoot when using a high speed operational amplifier.  
The output amplifier used with the DAC8043 should have  
low input offset voltage to preserve the transfer function  
linearity. The voltage output of the amplifier has an error  
component which is the offset voltage of the op amp multi-  
plied by the “noise gain” of the circuit. This “noise gain” is  
equal to (RF/RO + 1) where RO is the output impedance of the  
D/A IOUT terminal and RF is the feedback network imped-  
ance. The nonlinearity occurs due to the output impedance  
varying with code. If the 0 code case is excluded (where  
RO = infinity), the RO will vary from R to 3R providing a  
“noise gain” variation between 4/3 and 2. In addition, the  
variation of RO is nonlinear with code, and the largest steps  
in RO occur at major code transitions where the worst  
differential nonlinearity is also likely to be experienced. The  
nonlinearity seen at the amplifier output is  
If an application requires the D/A to have zero gain error, the  
circuit shown in Figure 4 may be used. Resistor R2 induces  
a positive gain error greater than worst-case initial negative  
gain error. Trim resistor R1 provides a variable negative gain  
error and have sufficient trim range to correct for the worst-  
case initial positive gain error plus the error produced by R2.  
BIPOLAR CONFIGURATION  
Figure 5 shows the DAC8043 in a typical bipolar (four-  
quadrant) multiplying configuration. The analog output val-  
ues versus digital input code are listed in Table II.  
2VOS – 4VOS/3 = 2VOS/3.  
The operational amplifiers used in this circuit can be single  
amplifiers such as the OPA602 or a dual amplifier such as  
the OPA2107. C1 provides phase compensation to minimize  
settling time and overshoot when using a high speed opera-  
tional amplifier. The bipolar offset resistors R1–R2 should  
be ratio-matched to 0.01% to ensure the specified gain error  
performance.  
Thus, to maintain good nonlinearity the op amp offset should  
be much less than 1/2LSB.  
UNIPOLAR CONFIGURATION  
Figure 3 shows DAC8043 in a typical unipolar (two-quad-  
rant) multiplying configuration. The analog output values  
DATA INPUT  
LSB  
1111 1111 1111  
1000 0000 0001  
1000 0000 0000  
0111 1111 1111  
0000 0000 0000  
ANALOG OUTPUT  
DATA INPUT  
LSB  
1111 1111 1111  
1000 0000 0000  
0000 0000 0001  
0000 0000 0000  
ANALOG OUTPUT  
MSB ↓  
MSB ↓  
+VREF (2047/2048)  
+VREF (1/2048)  
0 Volts  
–VREF (1/2048)  
–VREF (2048/2048)  
–VREF (4095/4096)  
–VREF (2048/4096) = –1/2VREF  
–VREF (1/4096)  
0 Volts  
TABLE I. Unipolar Output Code.  
TABLE II. Bipolar Output Code.  
VDD  
+5V  
VIN  
VDDVREF  
+5V  
R1  
100Ω  
VREF  
+
CD  
1µF  
+
CD  
1µF  
RFB  
R2  
RFB  
C1  
C1 10pF  
A1  
+
IOUT  
10pF  
47Ω  
A1  
+
IOUT  
DAC  
GND  
VOUT  
DAC  
GND  
VOUT  
DAC8043  
DAC8043  
A1 OPA602 or 1/2 OPA2107.  
A1 OPA602 or 1/2 OPA2107.  
FIGURE 3. Unipolar Configuration.  
FIGURE 4. Unipolar Configuration with Gain Trim.  
+5V  
R1  
VDD  
20k  
VREF  
R2  
20kΩ  
+
CD  
1µF  
VOUT  
A2  
R3  
+
10kΩ  
RFB  
IOUT  
C1  
10pF  
+
A1  
DAC  
GND  
A1–A2, OPA602 or 1/2 OPA2107.  
DAC8043  
FIGURE 5. Bipolar Configuration.  
®
7
DAC8043  
PACKAGE OPTION ADDENDUM  
www.ti.com  
16-Feb-2009  
PACKAGING INFORMATION  
Orderable Device  
DAC8043U  
Status (1)  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
Package Package  
Pins Package Eco Plan (2) Lead/Ball Finish MSL Peak Temp (3)  
Qty  
Type  
Drawing  
SOIC  
D
8
8
8
8
8
8
8
8
75 Green (RoHS & CU NIPDAU Level-3-260C-168 HR  
no Sb/Br)  
DAC8043U/2K5  
DAC8043U/2K5G4  
DAC8043UC  
SOIC  
SOIC  
SOIC  
SOIC  
SOIC  
SOIC  
SOIC  
D
D
D
D
D
D
D
2500 Green (RoHS & CU NIPDAU Level-3-260C-168 HR  
no Sb/Br)  
2500 Green (RoHS & CU NIPDAU Level-3-260C-168 HR  
no Sb/Br)  
75 Green (RoHS & CU NIPDAU Level-3-260C-168 HR  
no Sb/Br)  
DAC8043UC/2K5  
DAC8043UC/2K5G4  
DAC8043UCG4  
DAC8043UG4  
2500 Green (RoHS & CU NIPDAU Level-3-260C-168 HR  
no Sb/Br)  
2500 Green (RoHS & CU NIPDAU Level-3-260C-168 HR  
no Sb/Br)  
75 Green (RoHS & CU NIPDAU Level-3-260C-168 HR  
no Sb/Br)  
75 Green (RoHS & CU NIPDAU Level-3-260C-168 HR  
no Sb/Br)  
(1) The marketing status values are defined as follows:  
ACTIVE: Product device recommended for new designs.  
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.  
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in  
a new design.  
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.  
OBSOLETE: TI has discontinued the production of the device.  
(2)  
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check  
http://www.ti.com/productcontent for the latest availability information and additional product content details.  
TBD: The Pb-Free/Green conversion plan has not been defined.  
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements  
for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered  
at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.  
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and  
package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS  
compatible) as defined above.  
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame  
retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material)  
(3)  
MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder  
temperature.  
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is  
provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the  
accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and continues to take  
reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on  
incoming materials and chemicals. TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited  
information may not be available for release.  
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI  
to Customer on an annual basis.  
Addendum-Page 1  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
11-Mar-2008  
TAPE AND REEL INFORMATION  
*All dimensions are nominal  
Device  
Package Package Pins  
Type Drawing  
SPQ  
Reel  
Reel  
A0 (mm)  
B0 (mm)  
K0 (mm)  
P1  
W
Pin1  
Diameter Width  
(mm) W1 (mm)  
(mm) (mm) Quadrant  
DAC8043U/2K5  
SOIC  
SOIC  
D
D
8
8
2500  
2500  
330.0  
330.0  
12.4  
12.4  
6.4  
6.4  
5.2  
5.2  
2.1  
2.1  
8.0  
8.0  
12.0  
12.0  
Q1  
Q1  
DAC8043UC/2K5  
Pack Materials-Page 1  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
11-Mar-2008  
*All dimensions are nominal  
Device  
Package Type Package Drawing Pins  
SPQ  
Length (mm) Width (mm) Height (mm)  
DAC8043U/2K5  
SOIC  
SOIC  
D
D
8
8
2500  
2500  
346.0  
346.0  
346.0  
346.0  
29.0  
29.0  
DAC8043UC/2K5  
Pack Materials-Page 2  
IMPORTANT NOTICE  
Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, modifications, enhancements, improvements,  
and other changes to its products and services at any time and to discontinue any product or service without notice. Customers should  
obtain the latest relevant information before placing orders and should verify that such information is current and complete. All products are  
sold subject to TI’s terms and conditions of sale supplied at the time of order acknowledgment.  
TI warrants performance of its hardware products to the specifications applicable at the time of sale in accordance with TI’s standard  
warranty. Testing and other quality control techniques are used to the extent TI deems necessary to support this warranty. Except where  
mandated by government requirements, testing of all parameters of each product is not necessarily performed.  
TI assumes no liability for applications assistance or customer product design. Customers are responsible for their products and  
applications using TI components. To minimize the risks associated with customer products and applications, customers should provide  
adequate design and operating safeguards.  
TI does not warrant or represent that any license, either express or implied, is granted under any TI patent right, copyright, mask work right,  
or other TI intellectual property right relating to any combination, machine, or process in which TI products or services are used. Information  
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Copyright © 2009, Texas Instruments Incorporated  

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