DAC8563-Q1 [TI]
双路 16 位超低毛刺脉冲低功耗缓冲器电压输出 DAC;型号: | DAC8563-Q1 |
厂家: | TEXAS INSTRUMENTS |
描述: | 双路 16 位超低毛刺脉冲低功耗缓冲器电压输出 DAC 脉冲 |
文件: | 总57页 (文件大小:2396K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
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DAC7562-Q1, DAC7563-Q1
DAC8162-Q1, DAC8163-Q1
DAC8562-Q1, DAC8563-Q1
ZHCSB22A –MAY 2013–REVISED JUNE 2015
DACxx6x-Q1 具有 2.5V、4PPM/°C 内部基准的汽车类双路 16 位、14
位、12 位低功耗、经缓冲的、
电压输出 DAC
1 特性
3 说明
1
•
适用于汽车电子 应用
DAC756x-Q1、DAC816x-Q1 和 DAC856x-Q1
(DACxx6x-Q1) 器件分别为 12 位、14 位和 16 位低功
耗、电压输出、双通道数模转换器 (DAC)。这些器件
包括一个 2.5V,4ppm/°C 内部基准,从而提供了一个
2.5V 或 5V 的满量程输出电压范围。此内部基准有一
个 ±5mV 的初始精度,并且能够在 VREFIN/VREFOUT
引脚上提供或吸收高达 20mA 的电流。
•
具有符合 AEC-Q100 的下列结果:
–
–
–
器件温度 1 级:-40°C 至 125°C 的环境运行温
度范围
器件人体模型 (HBM) 静电放电 (ESD) 分类等级
2
器件组件充电模式 (CDM) ESD 分类等级 C4B
•
相对精度:
这些器件是单片器件,从而提供了出色的线性并大大降
低了有害的代码至代码转换时的瞬态电压(毛刺脉
冲)。它们使用一个运行时钟速率高达 50MHz 的多用
途 3 线制串口。此接口与标准 SPI™, QSPI
–
DAC756x(12 位):0.3 最低有效位 (LSB) 最
大积分非线性 (INL)
–
–
DAC816x(14 位):1 LSB INL
DAC856x(16 位):4 LSB INL
™,Microwire,以及数字信号处理器 (DSP) 接口兼
容。DACxx62-Q1 器件配有一个上电复位电路,此电
路可确保在一个有效编码被写入此器件前,DAC 输出
上电并保持零量程,而 DACxx63-Q1 器件在量程中点
上电。这些器件包含一个断电特性,此特性可将 5V 电
压时的流耗减少至 550nA(典型值)。此低功耗、内
部基准和小封装尺寸使得这些器件非常适合于便携式、
电池供电运行类设备。
•
•
毛刺脉冲:0.1 nV-s
双向基准:输入或 2.5V 输出
–
–
–
–
–
缺省情况下,输出被禁用
±5mV 初始精度(最大值)
4ppm/°C 温度漂移(典型值)
10ppm/°C 温度漂移(最大值)
20mA 拉灌电流能力
•
•
加电复位至零量程或量程中点
与 DACxx63-Q1 器件一样,DACxx62-Q1 器件之间可
互相插接并且功能兼容。整个系列均采用 10 引脚
VSSOP-10 (DGS) 封装。
低功率:4mW(典型值,5V AVDD,其中包括内部
基准电流)
•
•
•
•
•
宽电源范围:2.7V 至 5.5V
带有施密特触发输入的 50MHz 串行外设接口 (SPI)
LDAC 和 CLR 功能
器件信息(1)
器件型号
DAC7562-Q1
DAC7563-Q1
DAC8162-Q1
DAC8163-Q1
DAC8562-Q1
DAC8563-Q1
封装
封装尺寸(标称值)
支持轨到轨运行的输出缓冲器
封装:超薄小外形尺寸封装 (VSSOP)-10
2 应用
VSSOP (10)
3.00mm × 3.00mm
•
•
•
•
•
•
便携式仪表
可编程逻辑控制器 (PLC) 模拟输出模块
闭环伺服器控制
(1) 如需了解所有可用封装,请见数据表末尾的可订购产品附录。
压控振荡器调谐
数据采集系统
可编程增益和偏移调整
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
English Data Sheet: SLAS950
DAC7562-Q1, DAC7563-Q1
DAC8162-Q1, DAC8163-Q1
DAC8562-Q1, DAC8563-Q1
ZHCSB22A –MAY 2013–REVISED JUNE 2015
www.ti.com.cn
简化框图
GND
AVDD
LDAC
CLR
VREFIN/VREFOUT
Power-
Down
Control
Logic
DIN
Buffer Control
Register Control
2.5-V
Reference
Input Control Logic
SCLK
SYNC
Control Logic
DAC Register B
DAC Register A
VOUT
B
Data Buffer B
Data Buffer A
DAC
DAC756x-Q1 (12-Bit)
DAC816x-Q1 (14-Bit)
DAC856x-Q1 (16-Bit)
VOUTA
DAC
2
版权 © 2013–2015, Texas Instruments Incorporated
DAC7562-Q1, DAC7563-Q1
DAC8162-Q1, DAC8163-Q1
DAC8562-Q1, DAC8563-Q1
www.ti.com.cn
ZHCSB22A –MAY 2013–REVISED JUNE 2015
目录
8.4 Device Functional Modes........................................ 31
8.5 Programming........................................................... 35
Application and Implementation ........................ 38
9.1 Application Information............................................ 38
9.2 Typical Applications ................................................ 40
9.3 System Examples ................................................... 44
1
2
3
4
5
6
7
特性.......................................................................... 1
应用.......................................................................... 1
说明.......................................................................... 1
修订历史记录 ........................................................... 3
Device Comparison Table..................................... 4
Pin Configuration and Functions......................... 4
Specifications......................................................... 5
7.1 Absolute Maximum Ratings ...................................... 5
7.2 ESD Ratings.............................................................. 5
7.3 Recommended Operating Conditions....................... 5
7.4 Thermal Information.................................................. 5
7.5 Electrical Characteristics........................................... 6
7.6 Timing Requirements................................................ 8
7.7 Typical Characteristics.............................................. 9
Detailed Description ............................................ 27
8.1 Overview ................................................................. 27
8.2 Functional Block Diagram ....................................... 27
8.3 Feature Description................................................. 27
9
10 Power Supply Recommendations ..................... 45
11 Layout................................................................... 45
11.1 Layout Guidelines ................................................. 45
11.2 Layout Example .................................................... 46
12 器件和文档支持 ..................................................... 47
12.1 文档支持................................................................ 47
12.2 相关链接................................................................ 47
12.3 社区资源................................................................ 47
12.4 商标....................................................................... 47
12.5 静电放电警告......................................................... 47
12.6 Glossary................................................................ 47
13 机械、封装和可订购信息....................................... 48
8
4 修订历史记录
注:之前版本的页码可能与当前版本有所不同。
Changes from Original (May 2013) to Revision A
Page
•
已更改 引脚配置和功能部分,ESD 额定值表,特性 描述部分,器件功能模式,应用和实施部分,电源相关建议部
分,布局部分,器件和文档支持部分,以及机械、封装和可订购信息部分............................................................................. 1
•
•
已发布 DAC8563-Q1、DAC8162-Q1、DAC8163-Q1、DAC7562-Q1 和 DAC7563-Q1 器件 ............................................... 1
已添加 the code-change total glitch amplitude parameter to the Electrical Characteristics table ......................................... 6
Copyright © 2013–2015, Texas Instruments Incorporated
3
DAC7562-Q1, DAC7563-Q1
DAC8162-Q1, DAC8163-Q1
DAC8562-Q1, DAC8563-Q1
ZHCSB22A –MAY 2013–REVISED JUNE 2015
www.ti.com.cn
RESET TO
5 Device Comparison Table
MAXIMUM RELATIVE
ACCURACY (LSB)
MAXIMUM DIFFERENTIAL
NONLINEARITY (LSB)
MAXIMUM REFERENCE
DRIFT (ppm/°C)
PART NUMBER
RESOLUTION
DAC7562-Q1
DAC7563-Q1
DAC8162-Q1
DAC8163-Q1
DAC8562-Q1
DAC8563-Q1
Zero
Mid-scale
Zero
12-bit
±0.75
±3
±0.25
±0.5
±1
10
10
10
14-bit
16-bit
Mid-scale
Zero
±12
Mid-scale
6 Pin Configuration and Functions
DGS Package
10-Pin VSSOP
Top View
VOUT
A
VREFIN/VREFOUT
1
2
3
4
5
10
9
VOUT
B
AVDD
DIN
8
GND
LDAC
CLR
7
SCLK
SYNC
6
Pin Functions
PIN
NAME
AVDD
DESCRIPTION
NO.
9
Power-supply input, 2.7 V to 5.5 V
Asynchronous clear input. The CLR input is falling-edge sensitive. When CLR is activated, zero scale (DACxx62-
Q1) or mid-scale (DACxx63-Q1) is loaded to all input and DAC registers. This sets the DAC output voltages
accordingly. The part exits clear code mode on the 24th falling edge of the next write to the part. If CLR is
activated during a write sequence, the write is aborted.
CLR
5
Serial data input. Data are clocked into the 24-bit input shift register on each falling edge of the serial clock input.
Schmitt-trigger logic input
DIN
8
3
GND
Ground reference point for all circuitry on the device
In synchronous mode, data are updated with the falling edge of the 24th SCLK cycle, which follows a falling edge
of SYNC. For such synchronous updates, the LDAC pin is not required, and it must be connected to GND
permanently or asserted and held low before sending commands to the device.
In asynchronous mode, the LDAC pin is used as a negative edge-triggered timing signal for simultaneous DAC
updates. Multiple single-channel commands can be written in order to set different channel buffers to desired
values and then make a falling edge on LDAC pin to simultaneously update the DAC output registers.
LDAC
4
SCLK
SYNC
7
6
Serial clock input. Data can be transferred at rates up to 50 MHz. Schmitt-trigger logic input
Level-triggered control input (active-low). This input is the frame synchronization signal for the input data. When
SYNC goes low, it enables the input shift register, and data are sampled on subsequent falling clock edges. The
DAC output updates following the 24th clock falling edge. If SYNC is taken high before the 23rd clock edge, the
rising edge of SYNC acts as an interrupt, and the write sequence is ignored by the DAC756x-Q1, DAC816x-Q1,
DAC856x-Q1. Schmitt-trigger logic input
VOUT
A
B
1
2
Analog output voltage from DAC-A
VOUT
Analog output voltage from DAC-B
VREFIN/VREFOUT
10
Bidirectional voltage reference pin. If internal reference is used, 2.5-V output.
4
Copyright © 2013–2015, Texas Instruments Incorporated
DAC7562-Q1, DAC7563-Q1
DAC8162-Q1, DAC8163-Q1
DAC8562-Q1, DAC8563-Q1
www.ti.com.cn
ZHCSB22A –MAY 2013–REVISED JUNE 2015
7 Specifications
7.1 Absolute Maximum Ratings
Over operating free-air temperature range (unless otherwise noted).(1)
MIN
–0.3
–0.3
–0.3
–0.3
–40
MAX
6
UNIT
V
AVDD to GND
CLR, DIN, LDAC, SCLK and SYNC input voltage to GND
VOUT[A, B] to GND
AVDD + 0.3
AVDD + 0.3
AVDD + 0.3
125
V
V
VREFIN/VREFOUT to GND
V
Operating temperature
°C
°C
°C
Junction temperature, TJ max
Storage temperature, Tstg
150
–65
150
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating
Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
7.2 ESD Ratings
VALUE
±2000
±500
UNIT
Human-body model (HBM), per AEC Q100-002(1)
V(ESD)
Electrostatic discharge
All pins
V
Charged-device model (CDM), per
AEC Q100-011
Corner pins (1, 5, 6, and 10)
±750
(1) AEC Q100-002 indicates that HBM stressing shall be in accordance with the ANSI/ESDA/JEDEC JS-001 specification.
7.3 Recommended Operating Conditions
over operating free-air temperature range (unless otherwise noted)
MIN
2.7
0
NOM
MAX
5.5
UNIT
V
POWER SUPPLY
Supply voltage
DIGITAL INPUTS
Digital input voltage
REFERENCE INPUT
AVDD to GND
CLR, DIN, LDAC, SCLK and SYNC
AVDD
AVDD
125
V
VREFIN
Reference input voltage
0
V
TEMPERATURE RANGE
TA
Operating ambient temperature
–40
°C
7.4 Thermal Information
DACxx6x-Q1
DGS (VSSOP)
10 PINS
173.8
THERMAL METRIC(1)
UNIT
RθJA
RθJC(top)
RθJB
ψJT
Junction-to-ambient thermal resistance
Junction-to-case (top) thermal resistance
°C/W
°C/W
°C/W
°C/W
°C/W
48.5
Junction-to-board thermal resistance
79.9
Junction-to-top characterization parameter
Junction-to-board characterization parameter
1.7
ψJB
68.4
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application
report, SPRA953.
版权 © 2013–2015, Texas Instruments Incorporated
5
DAC7562-Q1, DAC7563-Q1
DAC8162-Q1, DAC8163-Q1
DAC8562-Q1, DAC8563-Q1
ZHCSB22A –MAY 2013–REVISED JUNE 2015
www.ti.com.cn
7.5 Electrical Characteristics
At AVDD = 2.7 V to 5.5 V and TA = –40°C to 125°C (unless otherwise noted).
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
STATIC PERFORMANCE(1)
Resolution
16
Bits
Using line passing through codes 512 and
65,024
DAC856x-Q1
Relative accuracy
±4
±12
±1
LSB
Differential nonlinearity 16-bit monotonic
Resolution
±0.2
LSB
Bits
14
12
Using line passing through codes 128 and
16,256
DAC816x-Q1
DAC756x-Q1
Relative accuracy
±1
±3
LSB
Differential nonlinearity 14-bit monotonic
Resolution
±0.1
±0.5
LSB
Bits
Relative accuracy
Using line passing through codes 32 and 4,064
±0.3 ±0.75
±0.05 ±0.25
LSB
Differential nonlinearity 12-bit monotonic
LSB
Offset error
Extrapolated from two-point line(1), unloaded
±1
±2
±4
mV
Offset error drift
µV/°C
% FSR
mV
Full-scale error
DAC register loaded with all 1s
DAC register loaded with all 0s
±0.03
1
±0.2
4
Zero-code error
Zero-code error drift
Gain error
±2
µV/°C
% FSR
ppm FSR/°C
Extrapolated from two-point line(1), unloaded
±0.01 ±0.15
±1
Gain temperature coefficient
OUTPUT CHARACTERISTICS(2)
Output voltage range
0
AVDD
V
DACs unloaded
7
Output voltage settling time(3)
µs
RL = 1 MΩ
10
Measured between 20% - 80% of a full-scale
transition
Slew rate
0.75
V/µs
nF
RL = ∞
1
3
Capacitive load stability
RL = 2 kΩ
Code-change glitch impulse
Digital feedthrough
1-LSB change around major carry
SCLK toggling, SYNC high
RL = 2 kΩ, CL = 470 pF, AVDD = 5.5 V
0.1
0.1
40
nV-s
nV-s
mV
Power-on glitch impulse
1-LSB change around major carry. Includes
glitch impulse and digital feedthrough.
RL = 2 kΩ, CL = 470 pF, AVDD = 5.5 V
Code-change total glitch amplitude
Channel-to-channel DC crosstalk
3
5
mV
Full-scale swing on adjacent channel,
External reference
µV
Full-scale swing on adjacent channel,
Internal reference
15
5
DC output impedance
Short-circuit current
At mid-scale input
Ω
mA
µs
DAC outputs at full-scale, DAC outputs shorted
to GND
40
50
Power-up time, including settling time
AC PERFORMANCE(2)
Coming out of power-down mode
DAC output noise density
DAC output noise
TA = 25°C, at mid-scale input, fOUT = 1 kHz
TA = 25°C, at mid-scale input, 0.1 Hz to 10 Hz
90
nV/√Hz
2.6
µVPP
(1) 16-bit: codes 512 and 65,024; 14-bit: codes 128 and 16,256; 12-bit: codes 32 and 4,064
(2) Specified by design or characterization
(3) Transition time between ¼ scale and ¾ scale including settling to within ±0.024% FSR
6
版权 © 2013–2015, Texas Instruments Incorporated
DAC7562-Q1, DAC7563-Q1
DAC8162-Q1, DAC8163-Q1
DAC8562-Q1, DAC8563-Q1
www.ti.com.cn
ZHCSB22A –MAY 2013–REVISED JUNE 2015
Electrical Characteristics (接下页)
At AVDD = 2.7 V to 5.5 V and TA = –40°C to 125°C (unless otherwise noted).
PARAMETER
LOGIC INPUTS(2)
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Input pin Leakage current
–1
0
±0.1
1
µA
V
Logic input LOW voltage VIN
L
0.8
0.7 ×
AVDD
Logic input HIGH voltage VIN
H
AVDD
3
V
Pin capacitance
pF
REFERENCE
External VREF = 2.5 V (when internal reference
is disabled), all channels active using gain = 1
External reference current
Reference input impedance
15
µA
Internal reference disabled, gain = 1
Internal reference disabled, gain = 2
170
85
kΩ
REFERENCE OUTPUT
Output voltage
TA = 25°C
TA = 25°C
2.495
–5
2.5 2.505
V
Initial accuracy
±0.1
5
mV
Output voltage temperature drift
Output voltage noise
4
12
10
ppm/°C
µVPP
f = 0.1 Hz to 10 Hz
TA = 25°C, f = 1 kHz, CL = 0 µF
TA = 25°C, f = 1 MHz, CL = 0 µF
TA = 25°C, f = 1 MHz, CL = 4.7 µF
TA = 25°C
250
30
Output voltage noise density (high-frequency
noise)
nV/√Hz
10
Load regulation, sourcing(4)
Load regulation, sinking(4)
Output current load capability(2)
Line regulation
20
µV/mA
µV/mA
mA
TA = 25°C
185
±20
50
TA = 25°C
µV/V
ppm
Long-term stability and drift (aging)(4)
TA = 25°C, time = 0 to 1900 hours
First cycle
100
200
50
Thermal hysteresis(4)
ppm
Additional cycles
POWER REQUIREMENTS(5)
Normal mode, internal reference off
Normal mode, internal reference on
Power-down modes(6)
0.25
0.9
0.5
1.6
2
mA
µA
AVDD = 3.6 V to 5.5 V
0.55
0.55
0.2
Power-down modes(7)
4
IDD
Normal mode, internal reference off
Normal mode, internal reference on
Power-down modes(6)
0.4
1.4
2
mA
µA
0.73
0.35
0.35
0.9
AVDD = 2.7 V to 3.6 V
Power-down modes(7)
3
Normal mode, internal reference off
Normal mode, internal reference on
Power-down modes(6)
2.75
8.8
11
mW
µW
mW
µW
3.2
AVDD = 3.6 V to 5.5 V
2
Power-down modes(7)
2
22
Power dissipation
Normal mode, internal reference off
Normal mode, internal reference on
Power-down modes(6)
0.54
1.97
0.95
0.95
1.44
5
AVDD = 2.7 V to 3.6 V
7.2
10.8
Power-down modes(7)
(4) See the Application Information section of this data sheet.
(5) Input code = mid-scale, no load, VINH = AVDD, and VINL = GND
(6) Temperature range –40°C to 105°C
(7) Temperature range –40°C to 125°C
版权 © 2013–2015, Texas Instruments Incorporated
7
DAC7562-Q1, DAC7563-Q1
DAC8162-Q1, DAC8163-Q1
DAC8562-Q1, DAC8563-Q1
ZHCSB22A –MAY 2013–REVISED JUNE 2015
www.ti.com.cn
7.6 Timing Requirements(1)(2)
At AVDD = 2.7 V to 5.5 V and over –40°C to 125°C (unless otherwise noted). See 图 1.
MIN
NOM
MAX
50
UNIT
MHz
ns
f(SCLK)
t1
Serial clock frequency
SCLK falling edge to SYNC falling edge (for successful write operation)
SCLK cycle time
10
20
13
80
13
8
t2
ns
t3
SYNC rising edge to 23rd SCLK falling edge (for successful SYNC interrupt)
ns
t4
Minimum SYNC HIGH time
ns
t5
SYNC to SCLK falling edge setup time
SCLK LOW time
ns
t6
ns
t7
SCLK HIGH time
8
ns
t8
SCLK falling edge to SYNC rising edge
Data setup time
10
6
ns
t9
ns
t10
t11
t12
t13
t14
Data hold time
5
ns
SCLK falling edge to LDAC falling edge for asynchronous LDAC update mode
LDAC pulse duration, LOW time
5
ns
10
80
ns
CLR pulse duration, LOW time
ns
CLR falling edge to start of VOUT transition
100
ns
(1) All input signals are specified with tR = tF = 3 ns (10% to 90% of AVDD) and timed from a voltage level of (VINL + VINH) / 2.
(2) See the Serial Write Operation timing diagram (图 1).
t(1)
t(2)
SCLK
SYNC
DIN
t(5)
t(6)
t(3)
t(7)
t(8)
t(4)
t(10)
t(9)
DB23
DB0
t(11)
t(12)
LDAC(1)
LDAC(2)
t(13)
CLR
t(14)
VOUT
x
(1) Asynchronous LDAC update mode. For more information, see the LDAC Functionality section.
(2) Synchronous LDAC update mode; LDAC remains low. For more information, see the LDAC Functionality section.
图 1. Serial Write Operation
8
版权 © 2013–2015, Texas Instruments Incorporated
DAC7562-Q1, DAC7563-Q1
DAC8162-Q1, DAC8163-Q1
DAC8562-Q1, DAC8563-Q1
www.ti.com.cn
ZHCSB22A –MAY 2013–REVISED JUNE 2015
7.7 Typical Characteristics
7.7.1 Tables of Graphs
表 1. Typical Characteristics: Internal Reference Performance
POWER-SUPPLY
VOLTAGE
MEASUREMENT
FIGURE NUMBER
Internal Reference Voltage vs Temperature
图 2
图 3
图 4
图 5
图 6
图 7
Internal Reference Voltage Temperature Drift Histogram
Internal Reference Voltage vs Load Current
Internal Reference Voltage vs Time
5.5 V
Internal Reference Noise Density vs Frequency
Internal Reference Voltage vs Supply Voltage
2.7 V – 5.5 V
表 2. Typical Characteristics: DAC Static Performance
POWER-SUPPLY
MEASUREMENT
VOLTAGE
FIGURE NUMBER
FULL-SCALE, GAIN, OFFSET AND ZERO-CODE ERRORS
Full-Scale Error vs Temperature
Gain Error vs Temperature
图 16
图 17
图 18
图 19
图 63
图 64
图 65
图 66
5.5 V
Offset Error vs Temperature
Zero-Code Error vs Temperature
Full-Scale Error vs Temperature
Gain Error vs Temperature
2.7 V
Offset Error vs Temperature
Zero-Code Error vs Temperature
LOAD REGULATION
5.5 V
图 30
图 74
DAC Output Voltage vs Load Current
2.7 V
DIFFERENTIAL NONLINEARITY ERROR
T = –40°C
T = 25°C
T = 125°C
图 9
Differential Linearity Error vs Digital Input Code
Differential Linearity Error vs Temperature
Differential Linearity Error vs Digital Input Code
Differential Linearity Error vs Temperature
图 11
图 13
图 15
图 56
图 58
图 60
图 62
5.5 V
T = –40°C
T = 25°C
T = 125°C
2.7 V
INTEGRAL NONLINEARITY ERROR (RELATIVE ACCURACY)
T = –40°C
图 8
Linearity Error vs Digital Input Code
Linearity Error vs Temperature
Linearity Error vs Digital Input Code
Linearity Error vs Temperature
T = 25°C
图 10
图 12
图 14
图 55
图 57
图 59
图 61
5.5 V
T = 125°C
T = –40°C
T = 25°C
2.7 V
T = 125°C
版权 © 2013–2015, Texas Instruments Incorporated
9
DAC7562-Q1, DAC7563-Q1
DAC8162-Q1, DAC8163-Q1
DAC8562-Q1, DAC8563-Q1
ZHCSB22A –MAY 2013–REVISED JUNE 2015
www.ti.com.cn
表 2. Typical Characteristics: DAC Static Performance (接下页)
POWER-SUPPLY
VOLTAGE
MEASUREMENT
FIGURE NUMBER
POWER-DOWN CURRENT
Power-Down Current vs Temperature
5.5 V
2.7 V – 5.5 V
2.7 V
图 28
图 29
图 73
Power-Down Current vs Power-Supply Voltage
Power-Down Current vs Temperature
POWER-SUPPLY CURRENT
External VREF
Internal VREF
External VREF
Internal VREF
External VREF
Internal VREF
External VREF
Internal VREF
External VREF
Internal VREF
External VREF
Internal VREF
External VREF
Internal VREF
External VREF
Internal VREF
External VREF
Internal VREF
External VREF
Internal VREF
图 20
图 21
图 22
图 23
图 24
图 25
图 26
图 27
图 49
图 50
图 51
图 52
图 53
图 54
图 67
图 68
图 69
图 70
图 71
图 72
Power-Supply Current vs Temperature
Power-Supply Current vs Digital Input Code
Power-Supply Current Histogram
5.5 V
2.7 V – 5.5 V
3.6 V
Power-Supply Current vs Power-Supply Voltage
Power-Supply Current vs Temperature
Power-Supply Current vs Digital Input Code
Power-Supply Current Histogram
Power-Supply Current vs Temperature
Power-Supply Current vs Digital Input Code
Power-Supply Current Histogram
2.7 V
表 3. Typical Characteristics: DAC Dynamic Performance
POWER-SUPPLY
MEASUREMENT
VOLTAGE
FIGURE NUMBER
CHANNEL-TO-CHANNEL CROSSTALK
5-V Rising Edge
图 43
图 44
Channel-to-Channel Crosstalk
Clock Feedthrough
5.5 V
5-V Falling Edge
CLOCK FEEDTHROUGH
5.5 V
图 48
图 87
500 kHz, Mid-Scale
2.7 V
GLITCH IMPULSE
Rising Edge, Code 7FFFh to 8000h
Falling Edge, Code 8000h to 7FFFh
图 37
图 38
图 39
图 40
图 41
图 42
Glitch Impulse, 1-LSB Step
Glitch Impulse, 4-LSB Step
Glitch Impulse, 16-LSB Step
Rising Edge, Code 7FFCh to 8000h
5.5 V
Falling Edge, Code 8000h to 7FFCh
Rising Edge, Code 7FF0h to 8000h
Falling Edge, Code 8000h to 7FF0h
10
版权 © 2013–2015, Texas Instruments Incorporated
DAC7562-Q1, DAC7563-Q1
DAC8162-Q1, DAC8163-Q1
DAC8562-Q1, DAC8563-Q1
www.ti.com.cn
ZHCSB22A –MAY 2013–REVISED JUNE 2015
表 3. Typical Characteristics: DAC Dynamic Performance (接下页)
POWER-SUPPLY
VOLTAGE
MEASUREMENT
FIGURE NUMBER
Rising Edge, Code 7FFFh to 8000h
图 79
图 80
图 81
图 82
图 83
图 84
Glitch Impulse, 1-LSB Step
Glitch Impulse, 4-LSB Step
Glitch Impulse, 16-LSB Step
Falling Edge, Code 8000h to 7FFFh
Rising Edge, Code 7FFCh to 8000h
Falling Edge, Code 8000h to 7FFCh
Rising Edge, Code 7FF0h to 8000h
Falling Edge, Code 8000h to 7FF0h
NOISE
2.7 V
External VREF
图 45
图 46
图 47
DAC Output Noise Density vs
Frequency
Internal VREF
5.5 V
DAC Output Noise 0.1 Hz to 10 Hz
External VREF
POWER-ON GLITCH
Reset to Zero Scale
图 35
图 36
图 85
图 86
5.5 V
2.7 V
Reset to Mid-Scale
Power-on Glitch
Reset to Zero Scale
Reset to Mid-Scale
SETTLING TIME
Rising Edge, Code 0h to FFFFh
Falling Edge, Code FFFFh to 0h
Rising Edge, Code 4000h to C000h
Falling Edge, Code C000h to 4000h
Rising Edge, Code 0h to FFFFh
Falling Edge, Code FFFFh to 0h
Rising Edge, Code 4000h to C000h
Falling Edge, Code C000h to 4000h
图 31
图 32
图 33
图 34
图 75
图 76
图 77
图 78
Full-Scale Settling Time
Half-Scale Settling Time
Full-Scale Settling Time
Half-Scale Settling Time
5.5 V
2.7 V
版权 © 2013–2015, Texas Instruments Incorporated
11
DAC7562-Q1, DAC7563-Q1
DAC8162-Q1, DAC8163-Q1
DAC8562-Q1, DAC8563-Q1
ZHCSB22A –MAY 2013–REVISED JUNE 2015
www.ti.com.cn
7.7.2 Internal Reference
At TA = 25°C, AVDD = 5.5 V, gain = 2 and VREFOUT, unloaded unless otherwise noted.
30
25
20
15
10
5
0
Temperature Drift (ppm/èC)
图 2. Internal Reference Voltage vs Temperature
图 3. Internal Reference Voltage Temperature Drift
Histogram
2.510
2.505
2.500
2.495
2.490
16 units shown
−20
−15
−10
−5
0
5
10
15
20
Load Current (mA)
图 5. Internal Reference Voltage vs Time
图 4. Internal Reference Voltage vs Load Current
400
350
300
250
200
150
100
50
2.505
No Load
4.7 µF Load
−40°C
+25°C
+125°C
2.504
2.503
2.502
2.501
2.500
2.499
2.498
2.497
2.496
2.495
0
10
100
1k
10k
100k
1M
2.7
3.1
3.5
3.9
4.3
4.7
5.1
5.5
Frequency (Hz)
AVDD (V)
图 6. Internal Reference Noise Density vs Frequency
图 7. Internal Reference Voltage vs Supply Voltage
版权 © 2013–2015, Texas Instruments Incorporated
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DAC7562-Q1, DAC7563-Q1
DAC8162-Q1, DAC8163-Q1
DAC8562-Q1, DAC8563-Q1
www.ti.com.cn
ZHCSB22A –MAY 2013–REVISED JUNE 2015
7.7.3 DAC at AVDD = 5.5 V
At TA = 25°C, 5-V external reference used, gain = 1 and DAC output not loaded, unless otherwise noted.
12
9
1.0
0.8
0.6
6
0.4
3
0.2
0
0.0
−0.2
−0.4
−0.6
−0.8
−1.0
−3
−6
−9
−12
Typical channel shown
−40°C
Typical channel shown
−40°C
0
8192 16384 24576 32768 40960 49152 57344 65536
Digital Input Code
0
8192 16384 24576 32768 40960 49152 57344 65536
Digital Input Code
图 8. Linearity Error vs Digital Input Code (–40°C)
图 9. Differential Linearity Error vs Digital Input Code
(–40°C)
12
1.0
0.8
0.6
0.4
0.2
0.0
9
6
3
0
−0.2
−3
−6
−9
−12
−0.4
−0.6
−0.8
−1.0
Typical channel shown
25°C
Typical channel shown
25°C
0
8192 16384 24576 32768 40960 49152 57344 65536
Digital Input Code
0
8192 16384 24576 32768 40960 49152 57344 65536
Digital Input Code
图 10. Linearity Error vs Digital Input Code (25°C)
图 11. Differential Linearity Error vs Digital Input Code
(25°C)
12
1.0
0.8
0.6
0.4
0.2
0.0
9
6
3
0
−0.2
−3
−6
−9
−12
−0.4
−0.6
−0.8
−1.0
Typical channel shown
125°C
Typical channel shown
125°C
0
8192 16384 24576 32768 40960 49152 57344 65536
Digital Input Code
0
8192 16384 24576 32768 40960 49152 57344 65536
Digital Input Code
图 12. Linearity Error vs Digital Input Code (125°C)
图 13. Differential Linearity Error vs Digital Input Code
(125°C)
版权 © 2013–2015, Texas Instruments Incorporated
13
DAC7562-Q1, DAC7563-Q1
DAC8162-Q1, DAC8163-Q1
DAC8562-Q1, DAC8563-Q1
ZHCSB22A –MAY 2013–REVISED JUNE 2015
www.ti.com.cn
DAC at AVDD = 5.5 V (接下页)
At TA = 25°C, 5-V external reference used, gain = 1 and DAC output not loaded, unless otherwise noted.
12
1.0
INL Max
INL Min
DNL Max
DNL Min
0.8
9
0.6
6
0.4
3
0.2
0
0.0
−0.2
−0.4
−0.6
−0.8
−1.0
−3
−6
−9
−12
Typical channel shown
−40 −25 −10
Typical channel shown
−40 −25 −10
5
20 35 50 65 80 95 110 125
Temperature (°C)
5
20 35 50 65 80 95 110 125
Temperature (°C)
图 14. Linearity Error vs Temperature
图 15. Differential Linearity Error vs Temperature
0.20
0.15
0.15
0.10
Ch A
Ch B
Ch A
Ch B
0.10
0.05
0.05
0.00
0.00
−0.05
−0.10
−0.15
−0.20
−0.05
−0.10
−0.15
−40 −25 −10
5
20 35 50 65 80 95 110 125
Temperature (°C)
−40 −25 −10
5
20 35 50 65 80 95 110 125
Temperature (°C)
图 16. Full-Scale Error vs Temperature
图 17. Gain Error vs Temperature
4
3
4.0
3.5
3.0
2.5
2.0
1.5
1.0
0.5
0.0
Ch A
Ch B
Ch A
Ch B
2
1
0
−1
−2
−3
−4
−40 −25 −10
5
20 35 50 65 80 95 110 125
Temperature (°C)
−40 −25 −10
5
20 35 50 65 80 95 110 125
Temperature (°C)
图 18. Offset Error vs Temperature
图 19. Zero-code Error vs Temperature
14
版权 © 2013–2015, Texas Instruments Incorporated
DAC7562-Q1, DAC7563-Q1
DAC8162-Q1, DAC8163-Q1
DAC8562-Q1, DAC8563-Q1
www.ti.com.cn
ZHCSB22A –MAY 2013–REVISED JUNE 2015
DAC at AVDD = 5.5 V (接下页)
At TA = 25°C, 5-V external reference used, gain = 1 and DAC output not loaded, unless otherwise noted.
0.50
0.45
0.40
0.35
0.30
0.25
0.20
0.15
0.10
0.05
0.00
1.3
1.2
1.1
1.0
0.9
0.8
0.7
0.6
0.5
Internal reference enabled
DACs at midscale code, Gain = 2
DACs at midscale code
−40 −25 −10 20 35 50 65 80 95 110 125
Temperature (°C)
5
−40 −25 −10
5
20 35 50 65 80 95 110 125
Temperature (°C)
图 20. Power-supply Current vs Temperature
图 21. Power-supply Current vs Temperature
0.50
0.45
0.40
0.35
0.30
0.25
0.20
0.15
0.10
0.05
0.00
1.3
1.2
1.1
1.0
0.9
0.8
0.7
0.6
0.5
Internal reference enabled, Gain = 2
0
8192 16384 24576 32768 40960 49152 57344 65536
Digital Input Code
0
8192 16384 24576 32768 40960 49152 57344 65536
Digital Input Code
图 22. Power-Supply Current vs Digital Input Code
图 23. Power-Supply Current vs Digital Input Code
30
25
20
15
10
5
30
25
20
15
10
5
Internal reference enabled
Gain = 2
0
0
Power Supply Current (mA)
Power Supply Current (mA)
图 24. Power-Supply Current Histogram
图 25. Power-Supply Current Histogram
版权 © 2013–2015, Texas Instruments Incorporated
15
DAC7562-Q1, DAC7563-Q1
DAC8162-Q1, DAC8163-Q1
DAC8562-Q1, DAC8563-Q1
ZHCSB22A –MAY 2013–REVISED JUNE 2015
www.ti.com.cn
DAC at AVDD = 5.5 V (接下页)
At TA = 25°C, 5-V external reference used, gain = 1 and DAC output not loaded, unless otherwise noted.
0.50
0.45
0.40
0.35
0.30
0.25
0.20
0.15
0.10
0.05
0.00
1.3
1.2
1.1
1.0
0.9
0.8
0.7
0.6
0.5
VREFIN = 2.5 V
DACs at midscale code, Gain = 1
Internal reference enabled
DACs at midscale code, Gain = 1
2.7
3.1
3.5
3.9
4.3
4.7
5.1
5.5
2.7
3.1
3.5
3.9
4.3
4.7
5.1
5.5
AVDD (V)
AVDD (V)
图 26. Power-Supply Current vs Power-Supply Voltage
图 27. Power-Supply Current vs Power-Supply Voltage
4.0
3.5
3.0
2.5
2.0
1.5
1.0
0.5
0.0
0.60
IDD (µA)
IREFIN (µA)
0.50
0.40
0.30
0.20
0.10
0.00
−40 −25 −10
5
20 35 50 65 80 95 110 125
Temperature (°C)
2.7
3.1
3.5
3.9
4.3
4.7
5.1
5.5
AVDD (V)
G028
G029
图 28. Power-Down Current vs Temperature
图 29. Power-Down Current vs Power-Supply Voltage
7.0
6.0
5.0
4.0
3.0
2.0
1.0
0.0
−1.0
Typical channel shown
Full scale
Mid scale
Zero scale
LDAC Trigger (5 V/div)
Large Signal VOUT (2 V/div)
Small Signal Settling
(1.22 mV/div = 0.024% FSR)
From Code: 0h
To Code: FFFFh
−20
−15
−10
−5
0
5
10
15
20
ILOAD (mA)
Time (5 μs/div)
图 31. Full-Scale Settling Time: Rising Edge
图 30. DAC Output Voltage vs Load Current
16
版权 © 2013–2015, Texas Instruments Incorporated
DAC7562-Q1, DAC7563-Q1
DAC8162-Q1, DAC8163-Q1
DAC8562-Q1, DAC8563-Q1
www.ti.com.cn
ZHCSB22A –MAY 2013–REVISED JUNE 2015
DAC at AVDD = 5.5 V (接下页)
At TA = 25°C, 5-V external reference used, gain = 1 and DAC output not loaded, unless otherwise noted.
LDAC Trigger (5 V/div)
LDAC Trigger (5 V/div)
Large Signal VOUT (2 V/div)
Large Signal VOUT (2 V/div)
Small Signal Settling (1.22 mV/div = 0.024% FSR)
Small Signal Settling (1.22 mV/div = 0.024% FSR)
From Code: FFFFh
To Code: 0h
From Code: 4000h
To Code: C000h
Time (5 μs/div)
Time (5 μs/div)
图 32. Full-Scale Settling Time: Falling Edge
图 33. Half-Scale Settling Time: Rising Edge
LDAC Trigger (5 V/div)
AVDD (2 V/div)
Large Signal VOUT (2 V/div)
Small Signal Settling (1.22 mV/div = 0.024% FSR)
VOUTA (50 mV/div)
VOUTB (50 mV/div)
From Code: C000h
To Code: 4000h
VREFIN shorted to AVDD
Time (5 μs/div)
Time (1 ms/div)
图 34. Half-Scale Settling Time: Falling Edge
图 35. Power-On Glitch Reset to Zero Scale
LDAC Trigger (5 V/div)
AVDD (2 V/div)
Glitch Impulse » 0.1 nV-s
VOUTA (1 V/div)
VOUTB (1 V/div)
VOUT (100 μV/div)
LDAC Feedthrough
From Code: 7FFFh
To Code: 8000h
VREFIN shorted to AVDD
Time (1 ms/div)
Time (5 μs/div)
图 36. Power-On Glitch Reset to Mid-Scale
图 37. Glitch Impulse Rising Edge, 1-LSB Step
版权 © 2013–2015, Texas Instruments Incorporated
17
DAC7562-Q1, DAC7563-Q1
DAC8162-Q1, DAC8163-Q1
DAC8562-Q1, DAC8563-Q1
ZHCSB22A –MAY 2013–REVISED JUNE 2015
www.ti.com.cn
DAC at AVDD = 5.5 V (接下页)
At TA = 25°C, 5-V external reference used, gain = 1 and DAC output not loaded, unless otherwise noted.
LDAC Trigger (5 V/div)
LDAC Feedthrough
LDAC Trigger (5 V/div)
Glitch Impulse » 0.1 nV-s
VOUT (100 μV/div)
VOUT (100 μV/div)
LDAC Feedthrough
Glitch Impulse » 0.12 nV-s
From Code: 8000h
To Code: 7FFFh
From Code: 7FFCh
To Code: 8000h
Time (5 μs/div)
Time (5 μs/div)
图 38. Glitch Impulse Falling Edge, 1-LSB Step
图 39. Glitch Impulse Rising Edge, 4-LSB Step
LDAC Trigger (5 V/div)
LDAC Trigger (5 V/div)
Glitch Impulse » 0.1 nV-s
VOUT (500 μV/div)
LDAC Feedthrough
VOUT (100 μV/div)
LDAC Feedthrough
Glitch Impulse » 0.14 nV-s
From Code: 8000h
To Code: 7FFCh
From Code: 7FF0h
To Code: 8000h
Time (5 μs/div)
Time (5 μs/div)
图 40. Glitch Impulse Falling Edge, 4-LSB Step
图 41. Glitch Impulse Rising Edge, 16-LSB Step
LDAC Trigger (5 V/div)
LDAC Trigger (5 V/div)
VOUTB (1 V/div)
LDAC Feedthrough
VOUTA (500 μV/div)
Glitch Area (Between Cursors) = 1.6 nV-s
7.3 μs
VOUT (500 μV/div)
VOUTA at Midscale Code
Glitch Impulse » 0.1 nV-s
Internal Reference Enabled
Gain = 2
From Code: 8000h
To Code: 7FF0h
Time (5 μs/div)
Time (5 μs/div)
图 42. Glitch Impulse Falling Edge, 16-LSB Step
图 43. Channel-to-Channel Crosstalk 5-V Rising Edge
18
版权 © 2013–2015, Texas Instruments Incorporated
DAC7562-Q1, DAC7563-Q1
DAC8162-Q1, DAC8163-Q1
DAC8562-Q1, DAC8563-Q1
www.ti.com.cn
ZHCSB22A –MAY 2013–REVISED JUNE 2015
DAC at AVDD = 5.5 V (接下页)
At TA = 25°C, 5-V external reference used, gain = 1 and DAC output not loaded, unless otherwise noted.
1400
Internal reference disabled
VREFIN = 5 V, Gain = 1
Full Scale
Mid Scale
Zero Scale
LDAC Trigger (5 V/div)
1200
1000
Glitch Area (Between Cursors) = 2 nV-s
6.4 μs
800
VOUTA (500 μV/div)
600
VOUTA at Midscale Code
400
Internal Reference Enabled
Gain = 2
200
VOUTB (1 V/div)
0
10
100
1k
10k
100k
Frequency (Hz)
Time (5 μs/div)
图 45. DAC Output Noise Density vs Frequency
图 44. Channel-to-Channel Crosstalk 5-V Falling Edge
1400
1200
1000
800
600
400
200
0
Internal reference enabled
Gain = 2
Full Scale
Mid Scale
Zero Scale
» 2.5 μVPP
10
100
1k
10k
100k
DAC = Midscale
Frequency (Hz)
图 47. DAC Output Noise 0.1 Hz TO 10 Hz
图 46. DAC Output Noise Density vs Frequency
SCLK (5 V/div)
VOUT (500 μV/div)
Clock Feedthrough Impulse » 0.06 nV-s
Time (500 ns/div)
图 48. Clock Feedthrough 500 kHz, Mid-Scale
版权 © 2013–2015, Texas Instruments Incorporated
19
DAC7562-Q1, DAC7563-Q1
DAC8162-Q1, DAC8163-Q1
DAC8562-Q1, DAC8563-Q1
ZHCSB22A –MAY 2013–REVISED JUNE 2015
www.ti.com.cn
7.7.4 Typical Characteristics: DAC at AVDD = 3.6 V
At TA = 25°C, 3.3-V external reference used, gain = 1 and DAC output not loaded, unless otherwise noted.
0.50
0.45
0.40
0.35
0.30
0.25
0.20
0.15
0.10
0.05
0.00
1.3
1.2
1.1
1.0
0.9
0.8
0.7
0.6
0.5
Internal reference enabled
DACs at midscale code, Gain = 1
DACs at midscale code
−40 −25 −10 20 35 50 65 80 95 110 125
Temperature (°C)
5
−40 −25 −10
5
20 35 50 65 80 95 110 125
Temperature (°C)
图 49. Power-Supply Current vs Temperature
图 50. Power-Supply Current vs Temperature
0.50
0.45
0.40
0.35
0.30
0.25
0.20
0.15
0.10
0.05
0.00
1.3
1.2
1.1
1.0
0.9
0.8
0.7
0.6
0.5
0.4
Internal reference enabled, Gain = 1
0
8192 16384 24576 32768 40960 49152 57344 65536
Digital Input Code
0
8192 16384 24576 32768 40960 49152 57344 65536
Digital Input Code
图 51. Power-Supply Current vs Digital Input Code
图 52. Power-Supply Current vs Digital Input Code
30
25
20
15
10
5
30
25
20
15
10
5
Internal reference enabled
Gain = 1
0
0
Power Supply Current (mA)
Power Supply Current (mA)
图 53. Power-Supply Current Histogram
图 54. Power-Supply Current Histogram
20
版权 © 2013–2015, Texas Instruments Incorporated
DAC7562-Q1, DAC7563-Q1
DAC8162-Q1, DAC8163-Q1
DAC8562-Q1, DAC8563-Q1
www.ti.com.cn
ZHCSB22A –MAY 2013–REVISED JUNE 2015
7.7.5 Typical Characteristics: DAC at AVDD = 2.7 V
At TA = 25°C, 2.5-V external reference used, gain = 1 and DAC output not loaded, unless otherwise noted.
12
9
1.0
0.8
0.6
6
0.4
3
0.2
0
0.0
−0.2
−0.4
−0.6
−0.8
−1.0
−3
−6
−9
−12
Typical channel shown
−40°C
Typical channel shown
−40°C
0
8192 16384 24576 32768 40960 49152 57344 65536
Digital Input Code
0
8192 16384 24576 32768 40960 49152 57344 65536
Digital Input Code
图 55. Linearity Error vs Digital Input Code (–40°C)
图 56. Differential Linearity Error vs Digital Input Code
(–40°C)
12
1.0
0.8
0.6
0.4
0.2
0.0
9
6
3
0
−0.2
−3
−6
−9
−12
−0.4
−0.6
−0.8
−1.0
Typical channel shown
25°C
Typical channel shown
25°C
0
8192 16384 24576 32768 40960 49152 57344 65536
Digital Input Code
0
8192 16384 24576 32768 40960 49152 57344 65536
Digital Input Code
图 57. Linearity Error vs Digital Input Code (25°C)
图 58. Differential Linearity Error vs Digital Input Code
(25°C)
12
1.0
0.8
0.6
0.4
0.2
0.0
9
6
3
0
−0.2
−3
−6
−9
−12
−0.4
−0.6
−0.8
−1.0
Typical channel shown
125°C
Typical channel shown
125°C
0
8192 16384 24576 32768 40960 49152 57344 65536
Digital Input Code
0
8192 16384 24576 32768 40960 49152 57344 65536
Digital Input Code
图 59. Linearity Error vs Digital Input Code (125°C)
图 60. Differential Linearity Error vs Digital Input Code
(125°C)
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Typical Characteristics: DAC at AVDD = 2.7 V (接下页)
At TA = 25°C, 2.5-V external reference used, gain = 1 and DAC output not loaded, unless otherwise noted.
12
1.0
INL Max
INL Min
DNL Max
DNL Min
0.8
9
0.6
6
0.4
3
0.2
0
0.0
−0.2
−0.4
−0.6
−0.8
−1.0
−3
−6
−9
−12
Typical channel shown
−40 −25 −10
Typical channel shown
−40 −25 −10
5
20 35 50 65 80 95 110 125
Temperature (°C)
5
20 35 50 65 80 95 110 125
Temperature (°C)
图 61. Linearity Error vs Temperature
图 62. Differential Linearity Error vs Temperature
0.20
0.15
0.15
0.10
Ch A
Ch B
Ch A
Ch B
0.10
0.05
0.05
0.00
0.00
−0.05
−0.10
−0.15
−0.20
−0.05
−0.10
−0.15
−40 −25 −10
5
20 35 50 65 80 95 110 125
Temperature (°C)
−40 −25 −10
5
20 35 50 65 80 95 110 125
Temperature (°C)
图 63. Full-Scale Error vs Temperature
图 64. Gain Error vs Temperature
4
3
4.0
3.5
3.0
2.5
2.0
1.5
1.0
0.5
0.0
Ch A
Ch B
Ch A
Ch B
2
1
0
−1
−2
−3
−4
−40 −25 −10
5
20 35 50 65 80 95 110 125
Temperature (°C)
−40 −25 −10
5
20 35 50 65 80 95 110 125
Temperature (°C)
图 65. Offset Error vs Temperature
图 66. Zero-Code Error vs Temperature
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Typical Characteristics: DAC at AVDD = 2.7 V (接下页)
At TA = 25°C, 2.5-V external reference used, gain = 1 and DAC output not loaded, unless otherwise noted.
0.40
0.35
0.30
0.25
0.20
0.15
0.10
0.05
0.00
1.3
1.2
1.1
1.0
0.9
0.8
0.7
0.6
0.5
Internal reference enabled
DACs at midscale code, Gain = 1
DACs at midscale code
−40 −25 −10 20 35 50 65 80 95 110 125
Temperature (°C)
5
−40 −25 −10
5
20 35 50 65 80 95 110 125
Temperature (°C)
图 67. Power-Supply Current vs Temperature
图 68. Power-Supply Current vs Temperature
0.40
0.35
0.30
0.25
0.20
0.15
0.10
0.05
0.00
1.3
1.2
1.1
1.0
0.9
0.8
0.7
0.6
0.5
0.4
Internal reference enabled, Gain = 1
0
8192 16384 24576 32768 40960 49152 57344 65536
Digital Input Code
0
8192 16384 24576 32768 40960 49152 57344 65536
Digital Input Code
图 69. Power-Supply Current vs Digital Input Code
图 70. Power-Supply Current vs Digital Input Code
30
25
20
15
10
5
30
25
20
15
10
5
Internal reference enabled
Gain = 1
0
0
Power Supply Current (mA)
Power Supply Current (mA)
图 71. Power-Supply Current Histogram
图 72. Power-Supply Current Histogram
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Typical Characteristics: DAC at AVDD = 2.7 V (接下页)
At TA = 25°C, 2.5-V external reference used, gain = 1 and DAC output not loaded, unless otherwise noted.
3.0
2.5
2.0
1.5
1.0
0.5
0.0
4
Typical channel shown
Full scale
Mid scale
Zero scale
3
2
1
0
−1
−20
−15
−10
−5
0
5
10
15
20
−40 −25 −10
5
20 35 50 65 80 95 110 125
Temperature (°C)
ILOAD (mA)
G073
图 74. DAC Output Voltage vs Load Current
图 73. Power-Down Current vs Temperature
LDAC Trigger (5 V/div)
LDAC Trigger (5 V/div)
Large Signal VOUT (1 V/div)
Large Signal VOUT (1 V/div)
Small Signal Settling (0.61 mV/div = 0.024% FSR)
Small Signal Settling (0.61 mV/div = 0.024% FSR)
From Code: 0h
To Code: FFFFh
From Code: FFFFh
To Code: 0h
Time (5 μs/div)
Time (5 μs/div)
图 75. Full-Scale Settling Time: Rising Edge
图 76. Full-Scale Settling Time: Falling Edge
LDAC Trigger (5 V/div)
LDAC Trigger (5 V/div)
Large Signal VOUT (1 V/div)
Large Signal VOUT (1 V/div)
Small Signal Settling (0.61 mV/div = 0.024% FSR)
Small Signal Settling (0.61 mV/div = 0.024% FSR)
From Code: 4000h
To Code: C000h
From Code: C000h
To Code: 4000h
Time (5 μs/div)
Time (5 μs/div)
图 77. Half-Scale Settling Time: Rising Edge
图 78. Half-Scale Settling Time: Falling Edge
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Typical Characteristics: DAC at AVDD = 2.7 V (接下页)
At TA = 25°C, 2.5-V external reference used, gain = 1 and DAC output not loaded, unless otherwise noted.
LDAC Trigger (5 V/div)
LDAC Trigger (5 V/div)
VOUT (100 μV/div)
LDAC Feedthrough
Glitch Impulse » 0.1 nV-s
VOUT (100 μV/div)
LDAC Feedthrough
Glitch Impulse » 0.1 nV-s
From Code: 7FFFh
To Code: 8000h
From Code: 8000h
To Code: 7FFFh
Time (5 μs/div)
Time (5 μs/div)
图 79. Glitch Impulse Rising Edge, 1-LSB Step
图 80. Glitch Impulse Falling Edge, 1-LSB Step
LDAC Trigger (5 V/div)
LDAC Trigger (5 V/div)
LDAC Feedthrough
Glitch Impulse » 0.1 nV-s
VOUT (100 μV/div)
VOUT (100 μV/div)
LDAC Feedthrough
Glitch Impulse » 0.1 nV-s
From Code: 7FFCh
To Code: 8000h
From Code: 8000h
To Code: 7FFCh
Time (5 μs/div)
Time (5 μs/div)
图 81. Glitch Impulse Rising Edge, 4-LSB Step
图 82. Glitch Impulse Falling Edge, 4-LSB Step
LDAC Trigger (5 V/div)
LDAC Trigger (5 V/div)
LDAC Feedthrough
Glitch Impulse » 0.1 nV-s
VOUT (200 μV/div)
LDAC Feedthrough
VOUT (200 μV/div)
Glitch Impulse » 0.1 nV-s
From Code: 7FF0h
To Code: 8000h
From Code: 8000h
To Code: 7FF0h
Time (5 μs/div)
Time (5 μs/div)
图 83. Glitch Impulse Rising Edge, 16-LSB Step
图 84. Glitch Impulse Falling Edge, 16-LSB Step
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Typical Characteristics: DAC at AVDD = 2.7 V (接下页)
At TA = 25°C, 2.5-V external reference used, gain = 1 and DAC output not loaded, unless otherwise noted.
AVDD (2 V/div)
AVDD (2 V/div)
VOUTA (500 mV/div)
VOUTB (500 mV/div)
VOUTA (50 mV/div)
VOUTB (50 mV/div)
VREFIN shorted to AVDD
VREFIN shorted to AVDD
Time (1 ms/div)
Time (1 ms/div)
图 85. Power-On Glitch Reset to Zero Scale
图 86. Power-On Glitch Reset to Mid-Scale
SCLK (2 V/div)
Clock Feedthrough Impulse » 0.02 nV-s
VOUT (500 μV/div)
Time (500 ns/div)
图 87. Clock Feedthrough 500 kHz, Mid-Scale
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8 Detailed Description
8.1 Overview
The DAC756x-Q1, DAC816x-Q1, and DAC856x-Q1 devices are low-power, voltage-output, dual-channel, 12-,
14-, and 16-bit digital-to-analog converters (DACs), respectively. These devices include a 2.5-V, 4-ppm/°C
internal reference, giving a full-scale output voltage range of 2.5 V or 5 V. The internal reference has an initial
accuracy of ±5 mV and can source or sink up to 20 mA at the VREFIN/VREFOUT pin.
8.2 Functional Block Diagram
GND
AVDD
LDAC
CLR
VREFIN/VREFOUT
Power-
Down
Control
Logic
DIN
Buffer Control
Register Control
2.5-V
Reference
Input Control Logic
SCLK
SYNC
Control Logic
DAC Register B
DAC Register A
VOUT
B
Data Buffer B
Data Buffer A
DAC
DAC756x-Q1 (12-Bit)
DAC816x-Q1 (14-Bit)
DAC856x-Q1 (16-Bit)
VOUTA
DAC
8.3 Feature Description
8.3.1 Digital-to-Analog Converter (DAC)
The DAC756x-Q1, DAC816x-Q1, and DAC856x-Q1 architecture consists of two string DACs, each followed by
an output buffer amplifier. The devices include an internal 2.5-V reference with 4-ppm/°C temperature drift
performance. 图 88 shows a principal block diagram of the DAC architecture.
VREFIN
/
VREFOUT
150 kW
150 kW
Gain
Register
VOUT
REF(+)
Resistor String
REF(-)
DAC
Register
DIN
n
GND
图 88. DAC Architecture
The input coding to the DAC756x-Q1, DAC816x-Q1, and DAC856x-Q1 devices is straight binary, so the ideal
output voltage is given by 公式 1:
D
æ
ç
è
IN ö
VOUT
=
´ VREF ´ Gain
÷
2n
ø
(1)
where:
n = resolution in bits; either 12 (DAC756x-Q1), 14 (DAC816x-Q1) or 16 (DAC856x-Q1)
DIN = decimal equivalent of the binary code that is loaded to the DAC register. DIN ranges from 0 to 2n – 1.
VREF = DAC reference voltage; either VREFOUT from the internal 2.5-V reference or VREFIN from an
aaa external reference.
Gain = 1 by default when internal reference is disabled (using external reference), and gain = 2 by default
aaa when using internal reference. Gain can also be manually set to either 1 or 2 using the gain register.
aaa See the Gain Function section for more information.
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Feature Description (接下页)
8.3.1.1 Resistor String
The resistor string section is shown in 图 89. It is simply a string of resistors, each of value R. The code loaded
into the DAC register determines at which node on the string the voltage is tapped off to be fed into the output
amplifier by closing one of the switches connecting the string to the amplifier. The resistor string architecture
results in monotonicity. The RDIVIDER switch is controlled by the gain registers (see the Gain Function section).
Because the output amplifier has a gain of 2, RDIVIDER is not shorted when the DAC-n gain is set to 1 (default if
internal reference is disabled), and is shorted when the DAC-n gain is set to 2 (default if internal reference is
enabled).
VREFIN/VREFOUT
RDIVIDER
VREF
2
R
To Output Amplifier
R
R
R
图 89. Resistor String
8.3.1.2 Output Amplifier
The output buffer amplifier is capable of generating rail-to-rail voltages on its output, giving a maximum output
range of 0 V to AVDD. It is capable of driving a load of 2 kΩ in parallel with 3 nF to GND. The typical slew rate is
0.75 V/µs, with a typical full-scale settling time of 14 µs as shown in 图 31, 图 32, 图 75 and 图 76.
28
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Feature Description (接下页)
8.3.2 Internal Reference
The DAC756x-Q1, DAC816x-Q1, and DAC856x-Q1 devices include a 2.5-V internal reference that is disabled by
default. The internal reference is externally available at the VREFIN/VREFOUT pin. The internal reference output
voltage is 2.5 V and can sink and source up to 20 mA.
A minimum 150-nF capacitor is recommended between the reference output and GND for noise filtering.
The internal reference of the DAC756x-Q1, DAC816x-Q1, and DAC856x-Q1 devices is a bipolar transistor-based
precision band-gap voltage reference. 图 90 shows the basic band-gap topology. Transistors Q1 and Q2 are
biased such that the current density of Q1 is greater than that of Q2. The difference of the two base-emitter
voltages (VBE1 – VBE2) has a positive temperature coefficient and is forced across resistor R1. This voltage is
amplified and added to the base-emitter voltage of Q2, which has a negative temperature coefficient. The
resulting output voltage is virtually independent of temperature. The short-circuit current is limited by design to
approximately 100 mA.
VREFIN/VREFOUT
Reference
Enable
Q1
Q2
R1
R2
图 90. Band-Gap Reference Simplified Schematic
8.3.3 Power-On Reset
8.3.3.1 Power-On Reset to Zero-Scale
The DAC7562-Q1, DAC8162-Q1, and DAC8562-Q1 devices contain a power-on-reset circuit that controls the
output voltage during power up. All device registers are reset as shown in 表 4. At power up, all DAC registers
are filled with zeros and the output voltages of all DAC channels are set to zero volts. Each DAC channel
remains that way until a valid load command is written to it. The power-on reset is useful in applications where it
is important to know the state of the output of each DAC while the device is in the process of powering up. No
device pin should be brought high before applying power to the device. The internal reference is disabled by
default and remains that way until a valid reference-change command is executed.
8.3.3.2 Power-On Reset to Mid-Scale
The DAC7563-Q1, DAC8163-Q1, and DAC8563-Q1 devices contain a power-on reset circuit that controls the
output voltage during power up. At power up, all DAC registers are reset to mid-scale code and the output
voltages of all DAC channels are set to VREFIN / 2 V. Each DAC channel remains that way until a valid load
command is written to it. The power-on reset is useful in applications where it is important to know the state of
the output of each DAC while the device is in the process of powering up. No device pin should be brought high
before applying power to the device. The internal reference is powered off or down by default and remains that
way until a valid reference-change command is executed. If using an external reference, it is acceptable to power
on the VREFIN pin either at the same time as or after applying AVDD
.
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表 4. DACxx62-Q1 and DACxx63-Q1 Power-On Reset Values
REGISTER
DEFAULT SETTING
Zero-scale
DACxx62-Q1
DACxx63-Q1
DAC and input registers
Mid-scale
LDAC registers
LDAC pin enabled for both channels
DACs powered up
Power-down registers
Internal reference register
Gain registers
Internal reference disabled
Gain = 1 for both channels
8.3.3.3 Power-On Reset (POR) Levels
When the device powers up, a POR circuit sets the device in default mode as shown in 表 4. The POR circuit
requires specific AVDD levels, as indicated in 图 91, to ensure discharging of internal capacitors and to reset the
device on power up. In order to ensure a power-on reset, AVDD must be below 0.7 V for at least 1 ms. When
AVDD drops below 2.2 V but remains above 0.7 V (shown as the undefined region), the device may or may not
reset under all specified temperature and power-supply conditions. In this case, TI recommends a power-on
reset. When AVDD remains above 2.2 V, a power-on reset does not occur.
AVDD (V)
5.50
Specified Supply
Voltage Range
No Power-On Reset
2.70
2.20
Undefined
0.70
Power-On Reset
0.00
图 91. Relevant Voltage Levels for POR Circuit
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8.4 Device Functional Modes
8.4.1 Power-Down Modes
The DAC756x-Q1, DAC816x-Q1, and DAC856x-Q1 devices have two separate sets of power-down commands.
One set is for the DAC channels and the other set is for the internal reference. The internal reference is forced to
a powered-down state while both DAC channels are powered down, and is only enabled if any DAC channel is
also in the normal mode of operation. For more information on the internal reference control, see the Internal
Reference Enable Register section.
8.4.1.1 DAC Power-Down Commands
The DAC756x-Q1, DAC816x-Q1, and DAC856x-Q1 DACs use four modes of operation. These modes are
accessed by setting the serial interface command bits to 100. Once the command bits are set correctly, the four
different power-down modes are software programmable by setting bits DB5 and DB4 in the shift register. 表 5
and 表 6 show the different power-down options. For more information on how to set the DAC operating mode
see 表 17.
表 5. DAC-n Operating Modes
DB5
DB4
DAC MODES OF OPERATION
Selected DACs power up (normal mode, default)
Selected DACs power down, output 1 kΩ to GND
Selected DACs power down, output 100 kΩ to GND
Selected DACs power down, output Hi-Z to GND
0
0
1
1
0
1
0
1
表 6. DAC-n Selection for Operating Modes
DAC-B (DB1), DAC-A (DB0)
OPERATING MODE
DAC-n does not change operating mode
DAC-n operating mode set to value on PD1 and PD0
0
1
It is possible to write to the DAC register or buffer of the DAC channel that is powered down. When the DAC
channel is then powered up, it powers up to this new value.
The advantage of the available power-down modes is that the output impedance of the device is known while it is
in power-down mode. As described in 表 5, there are three different power-down options. VOUT can be connected
internally to GND through a 1-kΩ resistor, a 100-kΩ resistor, or open-circuited (Hi-Z). The DAC power-down
circuitry is shown in 图 92.
Resistor
String
DAC
Amplifier
VOUTX
Power-Down
Circuitry
Resistor
Network
图 92. Output Stage
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8.4.2 Gain Function
The gain register controls the GAIN setting in the DAC transfer function:
D
æ
ç
è
IN ö
VOUT
=
´ VREF ´ Gain
÷
2n
ø
(2)
The DAC756x-Q1, DAC816x-Q1, and DAC856x-Q1 devices have a gain register for each channel. The gain for
each channel, in 公式 2, is either 1 or 2. This gain is automatically set to 2 when using the internal reference, and
is automatically set to 1 when the internal reference is disabled (default). However, each channel can have either
gain by setting the registers appropriately. The gain registers are accessible by setting the serial interface
command bits to 000, address bits to 010, and using DB1 for DAC-B and DB0 for DAC-A. See 表 7 and 表 17 for
the full command structure. The gain registers are automatically reset to provide either gain of 1 or 2 when the
internal reference is powered off or on, respectively. After the reference is powered off or on, the gain register is
again accessible to change the gain.
表 7. DAC-n Selection for Gain Register Command
DB1, DB0
VALUE
GAIN
DB0
0
1
0
1
DAC-A uses gain = 2 (default with internal reference)
DAC-A uses gain = 1 (default with external reference)
DAC-B uses gain = 2 (default with internal reference)
DAC-B uses gain = 1 (default with external reference)
DB1
8.4.3 Software Reset Function
The DAC756x-Q1, DAC816x-Q1, and DAC856x-Q1 devices contain a software reset feature. The software reset
function is accessed by setting the serial interface command bits to 101. The software reset command contains
two reset modes which are software-programmable by setting bit DB0 in the shift register. 表 8 and 表 17 show
the available software reset commands.
表 8. Software Reset
DB0
REGISTERS RESET TO DEFAULT VALUES
0
DAC registers
Input registers
1
DAC registers
Input registers
LDAC registers
Power-down registers
Internal reference register
Gain registers
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8.4.4 Internal Reference Enable Register
The internal reference in the DAC756x-Q1, DAC816x-Q1, and DAC856x-Q1 devices is disabled by default for
debugging, evaluation purposes, or when using an external reference. The internal reference can be powered up
and powered down by setting the serial interface command bits to 111 and configuring DB0 (see 表 9). The
internal reference is forced to a powered down state while both DAC channels are powered down, and can only
be enabled if any DAC channel is in normal mode of operation. During the time that the internal reference is
disabled, the DAC functions normally using an external reference. At this point, the internal reference is
disconnected from the VREFIN/VREFOUT pin (Hi-Z output).
表 9. Internal Reference
DB0
INTERNAL REFERENCE CONFIGURATION
Disable internal reference and reset DACs to gain = 1
Enable internal reference and reset DACs to gain = 2
0
1
8.4.4.1 Enabling Internal Reference
To enable the internal reference, refer to the command structure in 表 17. When performing a power cycle to
reset the device, the internal reference is switched off (default mode). In the default mode, the internal reference
is powered down until a valid write sequence powers up the internal reference. However, the internal reference is
forced to a disabled state while both DAC channels are powered down, and remains disabled until either DAC
channel is returned to the normal mode of operation. See DAC Power-Down Commands for more information on
DAC channel modes of operation.
8.4.4.2 Disabling Internal Reference
To disable the internal reference, refer to the command structure in 表 17. When performing a power cycle to
reset the device, the internal reference is disabled (default mode).
8.4.5 CLR Functionality
The edge-triggered CLR pin can be used to set the input and DAC registers immediately according to 表 10.
When the CLR pin receives a falling edge signal the clear mode is activated and changes the DAC output
voltages accordingly. The device exits clear mode on the 24th falling edge of the next write to the device. If the
CLR pin receives a falling edge signal during a write sequence in normal operation, the clear mode is activated
and changes the input and DAC registers immediately according to 表 10.
表 10. Clear Mode Reset Values
DEVICE
DAC OUTPUT ENTERING CLEAR MODE
DAC8562-Q1, DAC8162-Q1, DAC7562-Q1
DAC8563-Q1, DAC8163-Q1, DAC7563-Q1
Zero-scale
Mid-scale
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8.4.6 LDAC Functionality
The DAC756x-Q1, DAC816x-Q1, and DAC856x-Q1 devices offer both a software and hardware simultaneous
update and control function. The DAC double-buffered architecture has been designed so that new data can be
entered for each DAC without disturbing the analog outputs.
DAC756x-Q1, DAC816x-Q1, and DAC856x-Q1 data updates can be performed either in synchronous or in
asynchronous mode.
In asynchronous mode, the LDAC pin is used as a negative edge-triggered timing signal for simultaneous DAC
updates. Multiple single-channel writes can be done in order to set different channel buffers to desired values
and then make a falling edge on LDAC pin to simultaneously update the DAC output registers. Data buffers of all
channels must be loaded with desired data before an LDAC falling edge. After a high-to-low LDAC transition, all
DACs are simultaneously updated with the last contents of the corresponding data buffers. If the content of a
data buffer is not changed, the corresponding DAC output remains unchanged after the LDAC pin is triggered.
LDAC must be returned high before the next serial command is initiated.
In synchronous mode, data are updated with the falling edge of the 24th SCLK cycle, which follows a falling edge
of SYNC. For such synchronous updates, the LDAC pin is not required, and it must be connected to GND
permanently or asserted and held low before sending commands to the device.
Alternatively, all DAC outputs can be updated simultaneously using the built-in software function of LDAC. The
LDAC register offers additional flexibility and control by allowing the selection of which DAC channel(s) should be
updated simultaneously when the LDAC pin is being brought low. The LDAC register is loaded with a 2-bit word
(DB1 and DB0) using command bits C2, C1, and C0 (see 表 17). The default value for each bit, and therefore for
each DAC channel, is zero. If the LDAC register bit is set to 1, it overrides the LDAC pin (the LDAC pin is
internally tied low for that particular DAC channel) and this DAC channel updates synchronously after the falling
edge of the 24th SCLK cycle. However, if the LDAC register bit is set to 0, the DAC channel is controlled by the
LDAC pin.
The combination of software and hardware simultaneous update functions is particularly useful in applications
when updating a DAC channel, while keeping the other channel unaffected; see 表 11 and 表 17 for more
information.
表 11. DAC-n Selection for LDAC Register Command
DB1, DB0
VALUE
LDAC PIN FUNCTIONALITY
DB0
0
1
0
1
DAC-A uses LDAC pin
DAC-A operates in synchronous mode
DAC-B uses LDAC pin
DB1
DAC-B operates in synchronous mode
34
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8.5 Programming
The DAC756x-Q1, DAC816x-Q1, and DAC856x-Q1 devices have a three-wire serial interface (SYNC, SCLK,
and DIN; see the table) compatible with SPI, QSPI, and Microwire interface standards, as well as most DSPs.
See the Serial Write Operation timing diagram (图 1) for an example of a typical write sequence.
The DAC756x-Q1, DAC816x-Q1, or DAC856x-Q1 input shift register is 24 bits wide, consisting of two don’t care
bits (DB23 to DB22), three command bits (DB21 to DB19), three address bits (DB18 to DB16), and 16 data bits
(DB15 to DB0). All 24 bits of data are loaded into the DAC under the control of the serial clock input, SCLK.
DB23 (MSB) is the first bit that is loaded into the DAC shift register. DB23 is followed by the rest of the 24-bit
word pattern, left-aligned. This configuration means that the first 24 bits of data are latched into the shift register,
and any further clocking of data is ignored.
The write sequence begins by bringing the SYNC line low. Data from the DIN line are clocked into the 24-bit shift
register on each falling edge of SCLK. The serial clock frequency can be as high as 50 MHz, making the
DAC756x-Q1, DAC816x-Q1, and DAC856x-Q1 devices compatible with high-speed DSPs. On the 24th falling
edge of the serial clock, the last data bit is clocked into the shift register and the shift register locks. Further
clocking does not change the shift register data.
After receiving the 24th falling clock edge, the DAC756x-Q1, DAC816x-Q1, and DAC856x-Q1 devices decode the
three command bits, three address bits and 16 data bits to perform the required function, without waiting for a
SYNC rising edge. After the 24th falling edge of SCLK is received, the SYNC line may be kept low or brought
high. In either case, the minimum delay time from the 24th falling SCLK edge to the next falling SYNC edge must
be met in order to begin the next cycle properly; see the Serial Write Operation timing diagram (图 1).
A rising edge of SYNC before the 24-bit sequence is complete resets the SPI interface; no data transfer occurs.
A new write sequence starts at the next falling edge of SYNC. To assure the lowest power consumption of the
device, care should be taken that the levels are as close to each rail as possible.
8.5.1 SYNC Interrupt
In a normal write sequence, the SYNC line stays low for at least 24 falling edges of SCLK and the addressed
DAC register updates on the 24th falling edge. However, if SYNC is brought high before the 23rd falling edge, it
acts as an interrupt to the write sequence; the shift register resets and the write sequence is discarded. Neither
an update of the data buffer contents, DAC register contents, nor a change in the operating mode occurs (as
shown in 图 93).
24th Falling Edge
24th Falling Edge
CLK
SYNC
DIN
DB23
DB0
DB23
DB0
Invalid/Interrupted Write Sequence:
Output/Mode Does Not Update on the Falling Edge
Valid Write Sequence:
Output/Mode Updates on the Falling Edge
图 93. SYNC Interrupt Facility
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Programming (接下页)
8.5.2 DAC Register Configuration
When the DAC registers are being written to, the DAC756x-Q1, DAC816x-Q1, and DAC856x-Q1 devices receive
all 24 bits of data, ignore DB23 and DB22, and decode the next three bits (DB21 to DB19) in order to determine
the DAC operating or control mode (see 表 12). Bits DB18 to DB16 are used to address the DAC channels (see
表 13).
表 12. Commands for the DAC756x-Q1, DAC816x-Q1, and DAC856x-Q1 Devices
C2
(DB21)
C1
(DB20)
C0
(DB19)
COMMAND
0
0
0
0
1
1
1
1
0
0
1
1
0
0
1
1
0
1
0
1
0
1
0
1
Write to input register n (表 13)
Software LDAC, update DAC register n (表 13)
Write to input register n (表 13) and update all DAC registers
Write to input register n and update DAC register n (表 13)
Set DAC power-up or -down mode
Software reset
Set LDAC registers
Enable or disable the internal reference
表 13. Address Select for the DAC756x-Q1, DAC816x-Q1, and DAC856x-Q1
Devices
A2
(DB18)
A1
(DB17)
A0
(DB16)
CHANNEL (n)
0
0
0
0
1
1
1
1
0
0
1
1
0
0
1
1
0
1
0
1
0
1
0
1
DAC-A
DAC-B
Gain (only use with command 000)
Reserved
Reserved
Reserved
Reserved
DAC-A and DAC-B
When writing to the DAC input registers the next 16, 14, or 12 bits of data that follow are decoded by the DAC to
determine the equivalent analog output (see 表 14 through 表 16). The data format is straight binary, with all 0s
corresponding to 0-V output and all 1s corresponding to full-scale output. For all documentation purposes, the
data format and representation used here is a true 16-bit pattern (that is, FFFFh data word for full scale) that the
DAC756x-Q1, DAC816x-Q1, and DAC856x-Q1 devices require.
表 14. DAC856x-Q1 Data Input Register Format
COMMAND
ADDRESS
DATA
X(1)
X
C2 C1 C0 A2 A1 A0 D15 D14 D13 D12 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0
DB0
DB23
(1) X' denotes don't care bits.
表 15. DAC816x-Q1 Data Input Register Format
COMMAND
ADDRESS
DATA
X
X
X
C2 C1 C0 A2 A1 A0 D13 D12 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0
X
X
X
DB23
DB0
表 16. DAC756x-Q1 Data Input Register Format
COMMAND
ADDRESS
DATA
X
C2 C1 C0 A2 A1 A0 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0
X
X
X
DB23
DB0
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In additon to DAC input register updates, the DAC756x-Q1, DAC816x-Q1, and DAC856x-Q1 devices support a
number of functional mode commands (such as write to LDAC register, power down DACs and so on). The
complete set of functional mode commands is shown in 表 17.
表 17. Command Matrix for the DAC756x-Q1, DAC816x-Q1, and DAC856x-Q1 Devices
COMMAND
ADDRESS
DATA
DB23-
DB22
DESCRIPTION
DB15-
DB6
DB3-
C2
C1
C0
A2
A1
A0
DB5
DB4
DB1
DB0
DB2
0
0
1
0
0
1
0
0
1
0
0
1
0
0
1
0
0
1
0
0
1
0
0
1
0
1
1
0
1
1
0
1
1
0
1
1
16-, 14-, or 12-bit DAC data
16-, 14-, or 12-bit DAC data
16-, 14-, or 12-bit DAC data
16-, 14-, or 12-bit DAC data
16-, 14-, or 12-bit DAC data
16-, 14-, or 12-bit DAC data
16-, 14-, or 12-bit DAC data
16-, 14-, or 12-bit DAC data
16-, 14-, or 12-bit DAC data
X
Write to DAC-A input register
X(1)
0
0
1
1
0
0
Write to DAC-B input register
Write to DAC-A and DAC-B input registers
Write to DAC-A input register and update all DACs
Write to DAC-B input register and update all DACs
Write to DAC-A and DAC-B input register and update all DACs
Write to DAC-A input register and update DAC-A
Write to DAC-B input register and update DAC-B
Write to DAC-A and DAC-B input register and update all DACs
Update DAC-A
X
0
0
0
0
1
1
X
X
X
Update DAC-B
X
Update all DACs
0
0
1
0
1
1
0
1
1
0
1
1
0
1
1
0
1
0
1
0
1
0
1
0
1
Gain: DAC-B gain = 2, DAC-A gain = 2 (default with internal VREF
Gain: DAC-B gain = 2, DAC-A gain = 1
Gain: DAC-B gain = 1, DAC-A gain = 2
Gain: DAC-B gain = 1, DAC-A gain = 1 (power-on default)
Power up DAC-A
)
0
X
0
0
0
0
1
0
X
1
1
0
X
X
X
1
1
1
0
0
0
0
0
0
X
X
X
X
X
X
X
0
0
1
1
0
1
0
1
X
X
X
X
1
1
0
1
1
0
1
1
0
1
1
X
X
0
0
1
1
X
X
Power up DAC-B
Power up DAC-A and DAC-B
Power down DAC-A; 1 kΩ to GND
Power down DAC-B; 1 kΩ to GND
Power down DAC-A and DAC-B; 1 kΩ to GND
Power down DAC-A; 100 kΩ to GND
Power down DAC-B; 100 kΩ to GND
Power down DAC-A and DAC-B; 100 kΩ to GND
Power down DAC-A; Hi-Z
X
X
1
1
0
0
0
1
X
X
Power down DAC-B; Hi-Z
Power down DAC-A and DAC-B; Hi-Z
Reset DAC-A and DAC-B input register and update all DACs
Reset all registers and update all DACs (Power-on-reset update)
LDAC pin active for DAC-B and DAC-A
LDAC pin active for DAC-B; inactive for DAC-A
LDAC pin inactive for DAC-B; active for DAC-A
LDAC pin inactive for DAC-B and DAC-A
Disable internal reference and reset DACs to gain = 1
Enable internal reference and reset DACs to gain = 2
X
X
X
X
X
1
1
1
1
0
1
X
X
(1) X denotes don't care bits.
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9 Application and Implementation
注
Information in the following applications sections is not part of the TI component
specification, and TI does not warrant its accuracy or completeness. TI’s customers are
responsible for determining suitability of components for their purposes. Customers should
validate and test their design implementation to confirm system functionality.
9.1 Application Information
9.1.1 DAC Internal Reference
The internal reference of the DAC756x-Q1, DAC816x-Q1, and DAC856x-Q1 devices does not require an
external load capacitor for stability because it is stable without any capacitive load. However, for improved noise
performance, an external load capacitor of 150 nF or larger connected to the VREFIN/VREFOUT output is
recommended. 图 94 shows the typical connections required for operation of the DAC756x-Q1, DAC816x-Q1,
and DAC856x-Q1 internal reference. A supply bypass capacitor at the AVDD input is also recommended.
DGS
150 nF
1
2
3
4
5
10
9
VOUT
VOUT
GND
A
VREFIN/VREFOUT
AVDD
B
AVDD
1 mF
8
DIN
7
LDAC
CLR
SCLK
6
SYNC
图 94. Typical Connection for Operating the DAC756x-Q1, DAC816x-Q1, and DAC856x-Q1 Internal
Reference
9.1.1.1 Supply Voltage
The internal reference features an extremely low dropout voltage. It can be operated with a supply of only 5 mV
above the reference output voltage in an unloaded condition. For loaded conditions, see the Load Regulation
section. The stability of the internal reference with variations in supply voltage (line regulation, dc PSRR) is also
exceptional. Within the specified supply voltage range of 2.7 V to 5.5 V, the variation at VREFIN/VREFOUT is
typically 50 μV/V; see 图 7.
9.1.1.2 Temperature Drift
The internal reference is designed to exhibit minimal drift error, defined as the change in reference output voltage
over varying temperature. The drift is calculated using the box method described by 公式 3:
V
- VREF _MIN
æ
ö
REF _MAX
Drift Error =
´106 ppm/°C
(
)
ç
ç
÷
÷
VREF ´ TRANGE
è
ø
(3)
where:
VREF_MAX = maximum reference voltage observed within temperature range TRANGE
.
VREF_MIN = minimum reference voltage observed within temperature range TRANGE
.
VREF = 2.5 V, target value for reference output voltage.
TRANGE = the characterized range from –40°C to 125°C (165°C range)
The internal reference features an exceptional typical drift coefficient of 4 ppm/°C from –40°C to 125°C.
Characterizing a large number of units, a maximum drift coefficient of 10 ppm/°C is observed. Temperature drift
results are summarized in 图 3.
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Application Information (接下页)
9.1.1.3 Noise Performance
Typical 0.1-Hz to 10-Hz voltage noise and noise spectral density performance are listed in the Electrical
Characteristics. Additional filtering can be used to improve output noise levels, although care should be taken to
ensure the output impedance does not degrade the ac performance. The output noise spectrum at the
VREFIN/VREFOUT pin, both unloaded and with an external 4.7-µF load capacitor, is shown in 图 6. Internal reference
noise impacts the DAC output noise when the internal reference is used.
9.1.1.4 Load Regulation
Load regulation is defined as the change in reference output voltage as a result of changes in load current. The
load regulation of the internal reference is measured using force and sense contacts as shown in 图 95. The
force and sense lines reduce the impact of contact and trace resistance, resulting in accurate measurement of
the load regulation contributed solely by the internal reference. Measurement results are shown in 图 4. Force
and sense lines should be used for applications that require improved load regulation.
Output Pin
Contact and
Trace Resistance
VOUT
Force Line
IL
Sense Line
Load
Meter
图 95. Accurate Load Regulation of the DAC756x-Q1, DAC816x-Q1, and DAC856x-Q1 Internal Reference
9.1.1.4.1 Long-Term Stability
Long-term stability or aging refers to the change of the output voltage of a reference over a period of months or
years. This effect lessens as time progresses. The typical drift value for the internal reference is listed in the
Electrical Characteristics and measurement results are shown in 图 5. This parameter is characterized by
powering up multiple devices and measuring them at regular intervals.
9.1.1.5 Thermal Hysteresis
Thermal hysteresis for a reference is defined as the change in output voltage after operating the device at 25°C,
cycling the device through the operating temperature range, and returning to 25°C. Hysteresis is expressed by 公
式 4:
é
ê
ê
ë
ù
ú
ú
û
V
- V
REF_PRE
REF_POST
6
V
=
´ 10 (ppm/°C)
HYST
V
REF_NOM
(4)
where:
VHYST = thermal hysteresis.
VREF_PRE = output voltage measured at 25°C pre-temperature cycling.
VREF_POST = output voltage measured after the device cycles through the temperature range of –40°C to
aaa 125°C, and returns to 25°C.
VREF_NOM = 2.5 V, target value for reference output voltage.
9.1.2 DAC Noise Performance
Output noise spectral density at the VOUT-n pin versus frequency is depicted in 图 45 and 图 46 for full-scale,
mid-scale, and zero-scale input codes. The typical noise density for mid-scale code is 90 nV/√Hz at 1 kHz. High-
frequency noise can be improved by filtering the reference noise. Integrated output noise between 0.1 Hz and
10 Hz is close to 2.5 µVPP (mid-scale), as shown in 图 47.
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9.2 Typical Applications
9.2.1 Combined Voltage and Current Analog Output Module Using the XTR300
The design features two independent outputs that can source and sink voltage and current over the standard
industrial output ranges. The possible outputs of the design include: –24 mA to 24 mA, 4 mA–20 mA, 0 mA to 24
mA, 0 V to 5 V, 0 V to 10 V, –5 V to5 V, and –10 V to 10 V.
VREF
CCOMP
RSET
5.5 V
0.1 µF
15 V
–15 V
0.1 µF
0.1 µF
4.7 µF
XTR300 V+
V–
RIMON
AVDD
IMON
Current
Copy
ICOPY
LDAC
SCLK
DIN
DRV
IAIN+
VDAC
CH2
IDRV
V or I OUTA
RIN
VIN
DAC8563-Q1
VOUT
A
0 V to 5 V, 0 V to 10 V, –5 to 5 V,
–10 V to 10 V, –24 mA to 24 mA,
0 mA to 24 mA, 4mA to 20 mA
OPA
SET
SYNC
+
VOUT
B
IIA
RG1
RG2
RIA
VREFIN
/
IAOUT
IA
RG
VREFOUT
GND
GND
VREF
0.022 µF
IAIN–
DGND
图 96. DAC8563-Q1 and XTR300 Discrete Analog Output Module
9.2.1.1 Design Requirements
The design uses a DAC and a current-or-voltage output driver to create a discrete analog output design that can
output either voltage or current from the same pin while focusing on high-accuracy specifications. The choice of
the DAC8563-Q1 device takes advantage of its 16-bit resolution as well as its low typical offset error of 1 mV and
gain error of 0.01% FSR. The choice of the XTR300 device is based on its strong dc performance, having a
typical error of 400 µV and 0.04% FSR gain error. The XTR300 device allows a variety of both current and
voltage outputs on the same pin while providing load monitoring and error status pins.
The power-on reset-to-midscale feature of the DAC8563-Q1 makes the bipolar output of the XTR300 power up at
0 V or 0 A. If using a unipolar output, the recommended device to achieve a system power-on output of 0 V, 0 A
or 4 mA is the DAC8562-Q1 device.
A recommendation for minimizing the introduction of errors into the system is to use ±0.01% tolerance RG and
RSET resistors. The bypass capacitors on AVDD, VREF, V+ and V– should have values between 100 nF and
10 µF. Smaller capacitors filter fast low-energy transients, whereas the large capacitors filter the slow high-
energy transients. If there is an expectation of both types of signals in the system, the recommendation is to use
a pair of small and large values as shown on the AVDD pin of the DAC8563-Q1 device in 图 96.
9.2.1.2 Detailed Design Procedure
When configured for voltage mode, the output of the instrumentation amplifier (IA), internal to the XTR300
device, is routed to the SET pin. The SET output provides feedback for the IA based on the IA input voltage. The
feedback from the IA provides high-impedance remote sensing of the voltage at the output load. Using the output
voltage can overcome errors from PCB traces and protection component impedances. The DAC provides a
unipolar input voltage to the VIN pin of the XTR300 device. The XTR300 device offsets the VDAC range by a
negative VREF and amplifies the difference by a value set by the RG and RSET resistors, as shown in 公式 5.
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Typical Applications (接下页)
æ
ö
÷
÷
ø
RG
2
VDAC - VREF
VOUT
=
´ ç
ç
RSET
è
(5)
When configured for current mode, the XTR300 routes the internal output of its current copy circuitry to the SET
pin. This provides feedback for the internal OPA driver based on 1 / 10th of the output current, resulting in a
voltage-to-current transfer function. Generating bipolar current outputs from the single-ended DAC output
voltage, VDAC, requires the application of an offset to the XTR300 SET pin. Connect the RSET resistor from the
SET pin to VREF to apply the offset and obtain the transfer function shown in 公式 6.
æ
ö
÷
÷
ø
VDAC - VREF
IOUT = 10´ ç
ç
è
R SET
(6)
The desired output ranges for VDAC and VREF voltages determine the RSET and RG resistor values, calculated
using 公式 7 and 公式 8. The system design requires a VDAC voltage range of 0.04 V to 4.96 V in order to
operate the DAC8563-Q1 in the specified linear output range from codes 512 to 65 024.
æ
ö
VDAC - VREF
4.96 V - 2.5 V
æ
ö
RSET = 10´ ç
÷ = 10´
= 1025 Ω
ç
÷
ç
è
÷
ø
IOUT
0.024 A
è
ø
(7)
(8)
2´ VOUT_MAX´ RSET
2´10 V ´1020 Ω
4.96 V - 2.5 V
RG
=
=
= 8292 Ω
VDAC - VREF
IMON and IAOUT accomplish load monitoring. The sizing of RIMON and RIA determine the monitoring output voltage
across the resistors. Size the resistors according to 公式 9 and 公式 10 and the expected output load current
IDRV
.
10´ VIMON
RIMON
=
IDRV
(9)
10´ VIA
RIA
=
IIA
(10)
For more detailed information about the design procedure of this circuit and how to isolate it, see Two-Channel
Source/Sink Combined Voltage & Current Output, Isolated, EMC/EMI Tested Reference Design (TIDU434).
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Typical Applications (接下页)
9.2.1.3 Application Curves
图 97 shows the transfer function for the bipolar ±10 V voltage range. This design also supports output voltage
ranges of 0–5 V, 0–10 V and ±5 V. 图 98 shows the transfer function for the unipolar 0–24 mA current range.
This design also supports output current ranges of ±24 mA and 4 mA–20 mA.
10
8
24
20
16
12
8
6
4
2
4
0
0
-4
-2
-4
-6
-8
-10
-8
-12
-16
-20
-24
0
10k
20k
30k
40k
50k
60k65535
0
10k
20k
30k
40k
50k
60k65535
Input Code
Input Code
D001
D002
图 97. Output Voltage vs Input Code
图 98. Output Current vs Input Code
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Typical Applications (接下页)
9.2.2 Up to ±15-V Bipolar Output Using the DAC8562-Q1
The DAC8562-Q1 is designed to be operate from a single power supply providing a maximum output range of
AVDD volts. However, the DAC can be placed in the configuration shown in 图 99 in order to be designed into
bipolar systems. Depending on the ratio of the resistor values, the output of the circuit can range anywhere from
±5 V to ±15 V. The design example below shows that the DAC is configured to have its internal reference
enabled and the DAC8562-Q1 internal gain set to 2, however, an external 2.5-V reference could also be used
(with DAC8562-Q1 internal gain set to 2).
R
G ´ R
5.5 V
18 V
VOUT
–
+
R
VREFOUT
OPA140
G ´ R
DAC8562-Q1
–18 V
图 99. Bipolar Output Range Circuit Using DAC8562-Q1
The transfer function shown in Equation 5 can be used to calculate the output voltage as a function of the DAC
code, reference voltage and resistor ratio:
DIN
æ
ç
ö
VOUT = G × VREFOUT 2 ×
è
-1
÷
65,536
ø
(11)
where:
DIN = decimal equivalent of the binary code that is loaded to the DAC register, ranging from 0 to 65,535 for
DAC8562-Q1 (16 bit).
VREFOUT = reference output voltage with the internal reference enabled from the DAC VREFIN/VREFOUT pin
G = ratio of the resistors
An example configuration to generate a ±10-V output range is shown below in Equation 6 with G = 4 and
VREFOUT = 2.5 V:
DIN
VOUT = 20 ×
-10 V
65,536
(12)
In this example, the range is set to ±10 V by using a resistor ratio of four, VREFOUT of 2.5 V, and DAC8562-Q1
internal gain of 2. The resistor sizes must be selected keeping in mind the current sink or source capability of the
DAC8562-Q1 internal reference. Using larger resistor values, for example, R = 10 kΩ or larger, is recommended.
The op amp is selectable depending on the requirements of the system.
The DAC8562EVM and DAC7562EVM boards have the option to evaluate the bipolar output application by
installing the components on the pre-placed footprints. For more information see either the DAC8562EVM or
DAC7562EVM product folder.
版权 © 2013–2015, Texas Instruments Incorporated
43
DAC7562-Q1, DAC7563-Q1
DAC8162-Q1, DAC8163-Q1
DAC8562-Q1, DAC8563-Q1
ZHCSB22A –MAY 2013–REVISED JUNE 2015
www.ti.com.cn
9.3 System Examples
9.3.1 MSP430 Microprocessor Interfacing
图 100 shows a serial interface between the DAC756x-Q1, DAC816x-Q1, or DAC856x-Q1 device and a typical
MSP430 USI port such as the one found on the MSP430F2013. The port is configured in SPI master mode by
setting bits 3, 5, 6, and 7 in USICTL0. The USI counter interrupt is set in USICTL1 to provide an efficient means
of SPI communication with minimal software overhead. The serial clock polarity, source, and speed are
controlled by settings in the USI clock control register (USICKCTL). The SYNC signal is derived from a bit-
programmable pin on port 1; in this case, port line P1.4 is used. When data are to be transmitted to the
DAC756x-Q1, DAC816x-Q1, or DAC856x-Q1 device, P1.4 is taken low. The USI transmits data in 8-bit bytes;
thus, only eight falling clock edges occur in the transmit cycle. To load data to the DAC, P1.4 is left low after the
first eight bits are transmitted; then, a second write cycle is initiated to transmit the second byte of data. P1.4 is
taken high following the completion of the third write cycle.
MSP430F2013
DAC
SYNC
P1.4/GPIO
P1.5/SCLK
P1.6/SDO
SCLK
DIN
NOTE: Additional pins omitted for clarity.
图 100. DAC756x-Q1, DAC816x-Q1, or DAC856x-Q1 Device to MSP430 Interface
9.3.2 TMS320 McBSP Microprocessor Interfacing
图 101 shows an interface between the DAC756x-Q1, DAC816x-Q1, or DAC856x-Q1 device and any TMS320
series DSP from Texas Instruments with a multi-channel buffered serial port (McBSP). Serial data are shifted out
on the rising edge of the serial clock and are clocked into the DAC756x-Q1, DAC816x-Q1, or DAC856x-Q1
device on the falling edge of the SCLK signal.
TMS320F28062
DAC
SYNC
MFSxA
MCLKxA
MDxA
SCLK
DIN
NOTE: Additional pins omitted for clarity.
图 101. DAC756x-Q1, DAC816x-Q1, or DAC856x-Q1 Device to TMS320 McBSP Interface
9.3.3 OMAP-L1x Processor Interfacing
图 102 shows a serial interface between the DAC756x-Q1, DAC816x-Q1, or DAC856x-Q1 device and the
OMAP-L138 processor. The transmit clock CLKx0 of the L138 drives SCLK of the DAC756x-Q1, DAC816x-Q1,
or DAC856x-Q1 device, and the data transmit (Dx0) output drives the serial data line of the DAC. The SYNC
signal is derived from the frame sync transmit (FSx0) line, similar to the TMS320 interface.
OMAP-L138
FSx0
DAC
SYNC
CLKx0
Dx0
SCLK
DIN
NOTE: Additional pins omitted for clarity.
图 102. DAC756x-Q1, DAC816x-Q1, or DAC856x-Q1 Device to OMAP-L1x Processor
44
版权 © 2013–2015, Texas Instruments Incorporated
DAC7562-Q1, DAC7563-Q1
DAC8162-Q1, DAC8163-Q1
DAC8562-Q1, DAC8563-Q1
www.ti.com.cn
ZHCSB22A –MAY 2013–REVISED JUNE 2015
10 Power Supply Recommendations
These devices can operate within the specified supply voltage range of 2.7 V to 5.5 V. The power applied to
AVDD should be well-regulated and low-noise. In order to further minimize noise from the power supplies, a
strong recommendation is to include a pair of 100-pF and 1-nF capacitors and a 0.1-μF to 1-μF bypass
capacitor. The current consumption of the AVDD pin, the short-circuit current limit, and the load current for these
devices are listed in the Electrical Characteristics table. Choose the power supplies for these devices to meet the
aforementioned current requirements.
11 Layout
11.1 Layout Guidelines
A precision analog component requires careful layout, adequate bypassing, and clean, well-regulated power
supplies. The DAC756x-Q1, DAC816x-Q1, and DAC856x-Q1 devices offer single-supply operation, and are often
used in close proximity with digital logic, microcontrollers, microprocessors, and digital signal processors. The
more digital logic present in the design and the higher the switching speed, the more difficult it is to keep digital
noise from appearing at the output. As a result of the single ground pin of the DAC756x-Q1, DAC816x-Q1, and
DAC856x-Q1 devices, all return currents (including digital and analog return currents for the DAC) must flow
through a single point. Ideally, GND would be connected directly to an analog ground plane. This plane would be
separate from the ground connection for the digital components until they were connected at the power-entry
point of the system. The power applied to AVDD should be well-regulated and low noise. Switching power
supplies and dc-dc converters often have high-frequency glitches or spikes riding on the output voltage. In
addition, digital components can create similar high-frequency spikes as their internal logic switches states. This
noise can easily couple into the DAC output voltage through various paths between the power connections and
analog output. As with the GND connection, AVDD should be connected to a power-supply plane or trace that is
separate from the connection for digital logic until they are connected at the power-entry point. In addition, a pair
of 100-pF to 1-nF capacitors and a 0.1-µF to 1-µF bypass capacitor are strongly recommended. In some
situations, additional bypassing may be required, such as a 100-µF electrolytic capacitor or even a pi filter made
up of inductors and capacitors – all designed essentially to provide low-pass filtering for the supply and remove
the high-frequency noise.
版权 © 2013–2015, Texas Instruments Incorporated
45
DAC7562-Q1, DAC7563-Q1
DAC8162-Q1, DAC8163-Q1
DAC8562-Q1, DAC8563-Q1
ZHCSB22A –MAY 2013–REVISED JUNE 2015
www.ti.com.cn
11.2 Layout Example
0.1 µF
Bypass Capacitors
100 pF
AVDD
DIN
SCLK
Digital Lines
VREFIN/VREFOUT
SYNC
GND
Digital Lines
LDAC
VOUT
A
B
Analog Lines
VOUT
CLK
图 103. DACxx6x-Q1 Layout Example
46
版权 © 2013–2015, Texas Instruments Incorporated
DAC7562-Q1, DAC7563-Q1
DAC8162-Q1, DAC8163-Q1
DAC8562-Q1, DAC8563-Q1
www.ti.com.cn
ZHCSB22A –MAY 2013–REVISED JUNE 2015
12 器件和文档支持
12.1 文档支持
12.1.1 相关文档ꢀ
相关文档如下:
•
《DAC7562EVM、DAC8562EVM 用户手册》(文献编号:SBAU183),或者访问以下工具文件夹:
–
–
DAC8562 EVM
DAC7562 EVM
•
•
•
•
MSP430F2013,《混合信号微控制器》(文献编号:SLAS491)
《OMAP-L138 C6000™ DSP+ ARM® 处理器》(文献编号:SPRS586)
《TMS320F2806x Piccolo™ 微控制器》(文献编号:SPRS698)
XTR111,《精密电压电流转换器/发送器》(文献编号:SBOS375)
12.2 相关链接
以下表格列出了快速访问链接。范围包括技术文档、支持与社区资源、工具和软件,并且可以快速访问样片或购买
链接。
表 18. 相关链接
器件
产品文件夹
请单击此处
请单击此处
请单击此处
请单击此处
请单击此处
请单击此处
样片与购买
请单击此处
请单击此处
请单击此处
请单击此处
请单击此处
请单击此处
技术文档
请单击此处
请单击此处
请单击此处
请单击此处
请单击此处
请单击此处
工具与软件
请单击此处
请单击此处
请单击此处
请单击此处
请单击此处
请单击此处
支持与社区
请单击此处
请单击此处
请单击此处
请单击此处
请单击此处
请单击此处
DAC8562-Q1
DAC8563-Q1
DAC8162-Q1
DAC8163-Q1
DAC7562-Q1
DAC7563-Q1
12.3 社区资源
The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective
contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of
Use.
TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration
among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help
solve problems with fellow engineers.
Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and
contact information for technical support.
12.4 商标
E2E is a trademark of Texas Instruments.
SPI, QSPI are trademarks of Motorola, Inc.
All other trademarks are the property of their respective owners.
12.5 静电放电警告
这些装置包含有限的内置 ESD 保护。 存储或装卸时,应将导线一起截短或将装置放置于导电泡棉中,以防止 MOS 门极遭受静电损
伤。
12.6 Glossary
SLYZ022 — TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.
版权 © 2013–2015, Texas Instruments Incorporated
47
DAC7562-Q1, DAC7563-Q1
DAC8162-Q1, DAC8163-Q1
DAC8562-Q1, DAC8563-Q1
ZHCSB22A –MAY 2013–REVISED JUNE 2015
www.ti.com.cn
13 机械、封装和可订购信息
以下页中包括机械、封装和可订购信息。这些信息是针对指定器件可提供的最新数据。这些数据会在无通知且不对
本文档进行修订的情况下发生改变。欲获得该数据表的浏览器版本,请查阅左侧的导航栏。
48
版权 © 2013–2015, Texas Instruments Incorporated
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Copyright © 2016, 德州仪器半导体技术(上海)有限公司
PACKAGE OPTION ADDENDUM
www.ti.com
10-Dec-2020
PACKAGING INFORMATION
Orderable Device
Status Package Type Package Pins Package
Eco Plan
Lead finish/
Ball material
MSL Peak Temp
Op Temp (°C)
Device Marking
Samples
Drawing
Qty
(1)
(2)
(3)
(4/5)
(6)
DAC7562SQDGSRQ1
DAC7563SQDGSRQ1
DAC8162SQDGSRQ1
DAC8163SQDGSRQ1
DAC8562SQDGSRQ1
DAC8563SQDGSRQ1
ACTIVE
ACTIVE
ACTIVE
ACTIVE
ACTIVE
ACTIVE
VSSOP
VSSOP
VSSOP
VSSOP
VSSOP
VSSOP
DGS
DGS
DGS
DGS
DGS
DGS
10
10
10
10
10
10
2500 RoHS & Green
2500 RoHS & Green
2500 RoHS & Green
2500 RoHS & Green
2500 RoHS & Green
2500 RoHS & Green
NIPDAUAG
Level-2-260C-1 YEAR
Level-2-260C-1 YEAR
Level-2-260C-1 YEAR
Level-2-260C-1 YEAR
Level-2-260C-1 YEAR
Level-2-260C-1 YEAR
-40 to 125
-40 to 125
-40 to 125
-40 to 125
-40 to 125
-40 to 125
ZADV
ZAIV
NIPDAUAG
NIPDAUAG
NIPDAUAG
NIPDAUAG
NIPDAUAG
ZAGV
ZAHV
ZAAQ
ZAJV
(1) The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based
flame retardants must also meet the <=1000ppm threshold requirement.
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6)
Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two
lines if the finish value exceeds the maximum column width.
Addendum-Page 1
PACKAGE OPTION ADDENDUM
www.ti.com
10-Dec-2020
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
Addendum-Page 2
PACKAGE MATERIALS INFORMATION
www.ti.com
5-Jan-2021
TAPE AND REEL INFORMATION
*All dimensions are nominal
Device
Package Package Pins
Type Drawing
SPQ
Reel
Reel
A0
B0
K0
P1
W
Pin1
Diameter Width (mm) (mm) (mm) (mm) (mm) Quadrant
(mm) W1 (mm)
DAC7562SQDGSRQ1
DAC7563SQDGSRQ1
DAC8162SQDGSRQ1
DAC8163SQDGSRQ1
DAC8562SQDGSRQ1
DAC8563SQDGSRQ1
VSSOP
VSSOP
VSSOP
VSSOP
VSSOP
VSSOP
DGS
DGS
DGS
DGS
DGS
DGS
10
10
10
10
10
10
2500
2500
2500
2500
2500
2500
330.0
330.0
330.0
330.0
330.0
330.0
12.4
12.4
12.4
12.4
12.4
12.4
5.3
5.3
5.3
5.3
5.3
5.3
3.3
3.3
3.3
3.3
3.3
3.3
1.3
1.3
1.3
1.3
1.3
1.3
8.0
8.0
8.0
8.0
8.0
8.0
12.0
12.0
12.0
12.0
12.0
12.0
Q1
Q1
Q1
Q1
Q1
Q1
Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com
5-Jan-2021
*All dimensions are nominal
Device
Package Type Package Drawing Pins
SPQ
Length (mm) Width (mm) Height (mm)
DAC7562SQDGSRQ1
DAC7563SQDGSRQ1
DAC8162SQDGSRQ1
DAC8163SQDGSRQ1
DAC8562SQDGSRQ1
DAC8563SQDGSRQ1
VSSOP
VSSOP
VSSOP
VSSOP
VSSOP
VSSOP
DGS
DGS
DGS
DGS
DGS
DGS
10
10
10
10
10
10
2500
2500
2500
2500
2500
2500
367.0
370.0
370.0
370.0
370.0
367.0
367.0
355.0
355.0
355.0
355.0
367.0
38.0
55.0
55.0
55.0
55.0
38.0
Pack Materials-Page 2
PACKAGE OUTLINE
DGS0010A
VSSOP - 1.1 mm max height
S
C
A
L
E
3
.
2
0
0
SMALL OUTLINE PACKAGE
C
SEATING PLANE
0.1 C
5.05
4.75
TYP
PIN 1 ID
AREA
A
8X 0.5
10
1
3.1
2.9
NOTE 3
2X
2
5
6
0.27
0.17
10X
3.1
2.9
1.1 MAX
0.1
C A
B
B
NOTE 4
0.23
0.13
TYP
SEE DETAIL A
0.25
GAGE PLANE
0.15
0.05
0.7
0.4
0 - 8
DETAIL A
TYPICAL
4221984/A 05/2015
NOTES:
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.
3. This dimension does not include mold flash, protrusions, or gate burrs. Mold flash, protrusions, or gate burrs shall not
exceed 0.15 mm per side.
4. This dimension does not include interlead flash. Interlead flash shall not exceed 0.25 mm per side.
5. Reference JEDEC registration MO-187, variation BA.
www.ti.com
EXAMPLE BOARD LAYOUT
DGS0010A
VSSOP - 1.1 mm max height
SMALL OUTLINE PACKAGE
10X (1.45)
(R0.05)
TYP
SYMM
10X (0.3)
1
5
10
SYMM
6
8X (0.5)
(4.4)
LAND PATTERN EXAMPLE
SCALE:10X
SOLDER MASK
OPENING
SOLDER MASK
OPENING
METAL UNDER
SOLDER MASK
METAL
0.05 MAX
ALL AROUND
0.05 MIN
ALL AROUND
SOLDER MASK
DEFINED
NON SOLDER MASK
DEFINED
SOLDER MASK DETAILS
NOT TO SCALE
4221984/A 05/2015
NOTES: (continued)
6. Publication IPC-7351 may have alternate designs.
7. Solder mask tolerances between and around signal pads can vary based on board fabrication site.
www.ti.com
EXAMPLE STENCIL DESIGN
DGS0010A
VSSOP - 1.1 mm max height
SMALL OUTLINE PACKAGE
10X (1.45)
SYMM
(R0.05) TYP
10X (0.3)
8X (0.5)
1
5
10
SYMM
6
(4.4)
SOLDER PASTE EXAMPLE
BASED ON 0.125 mm THICK STENCIL
SCALE:10X
4221984/A 05/2015
NOTES: (continued)
8. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate
design recommendations.
9. Board assembly site may have different recommendations for stencil design.
www.ti.com
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