DM54LS00W/883 [TI]

LS SERIES, QUAD 2-INPUT NAND GATE, CDFP14;
DM54LS00W/883
型号: DM54LS00W/883
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

LS SERIES, QUAD 2-INPUT NAND GATE, CDFP14

CD 输入元件 逻辑集成电路
文件: 总6页 (文件大小:15K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
MICROCIRCUIT DATA SHEET  
Original Creation Date: 04/23/98  
Last Update Date: 05/14/98  
MNDM54LS00-X REV 1A0  
Last Major Revision Date: 04/23/98  
QUAD 2-INPUT NAND GATE  
General Description  
This device contains four independent gates, each of which performs the logic NAND  
function.  
Industry Part Number  
NS Part Numbers  
54LS00  
DM54LS00E/883  
DM54LS00J/883  
DM54LS00W/883  
Prime Die  
L000  
Processing  
Subgrp Description  
Temp (oC)  
MIL-STD-883, Method 5004  
1
Static tests at  
+25  
2
Static tests at  
+125  
-55  
3
Static tests at  
4
Dynamic tests at  
Dynamic tests at  
Dynamic tests at  
Functional tests at  
Functional tests at  
Functional tests at  
Switching tests at  
Switching tests at  
Switching tests at  
+25  
Quality Conformance Inspection  
5
+125  
-55  
6
MIL-STD-883, Method 5005  
7
+25  
8A  
8B  
9
+125  
-55  
+25  
10  
11  
+125  
-55  
1
MICROCIRCUIT DATA SHEET  
MNDM54LS00-X REV 1A0  
Features  
2
MICROCIRCUIT DATA SHEET  
MNDM54LS00-X REV 1A0  
(Absolute Maximum Ratings)  
(Note 1)  
Storage Temperature  
-65 C to +150 C  
Ambient Temperature under Bias  
Input Voltage  
-55 C to +125 C  
-0.5V to +10.0V  
VCC Pin Potential to Ground Pin  
Junction Temperature under Bias  
Current Applied to Output in LOW state (Max)  
-0.5V to +7.0V  
-55 C to +175 C  
twice the rated Iol (ma)  
Note 1: Absolute Maximum ratings are those values beyond which the device may be damaged or  
have its useful life impaired. Functional operation under these conditions is not  
implied.  
Recommended Operating Conditions  
Free Air Ambient Temperature  
Military  
-55 C to +125 C  
+4.5V to +5.5V  
Supply Voltage  
Military  
3
MICROCIRCUIT DATA SHEET  
MNDM54LS00-X REV 1A0  
Electrical Characteristics  
DC PARAMETER  
(The following conditions apply to all the following parameters, unless otherwise specified.)  
DC: VCC 4.5V to 5.5V, Temp range: -55C to 125C  
PIN-  
SUB-  
SYMBOL  
IIH  
PARAMETER  
CONDITIONS  
NOTES  
MIN  
MAX UNIT  
NAME  
GROUPS  
Input High  
Current  
VCC=5.5V, VM=2.7V, VINH=4.5V,  
VINL=0.0V  
1, 3 INPUTS  
1, 3 INPUTS  
20.0  
100  
uA  
uA  
mA  
V
1, 2,  
3
IBVI  
IIL  
Input High  
Current  
VCC=5.5V, VM=10.0V, VINH=4.5V,  
VINL=0.0V  
1, 2,  
3
Input LOW Current VCC=5.5V, VM=0.4V, VINH=4.5V  
1, 3 INPUTS -0.03 -0.4  
1, 2,  
3
VOL  
Output LOW  
Voltage  
VCC=4.5V, VIH=2.0V, IOL=4.0mA,  
VINH=4.5V  
1, 3 OUTPUTS  
1, 3 OUTPUTS 2.5  
1, 3 OUTPUTS -20  
1, 3 INPUTS  
1, 3 VCC  
0.4  
1, 2,  
3
VOH  
Output HIGH  
Voltage  
VCC=4.5V, VIL=0.7V, IOH=-0.4mA,  
VINH=4.5V  
V
1, 2,  
3
IOS  
Short-Circuit  
Current  
VCC=5.5V, VINL=0.0V, VOUT=0.0V  
-100  
-1.5  
1.6  
mA  
V
1, 2,  
3
VCD  
Input Clamp Diode VCC=4.5V, IM=-18mA, VINH=4.5V  
Voltage  
1, 2,  
3
ICCH  
ICCL  
Supply Current  
VCC=5.5V, VINL=0.0V  
mA  
mA  
1, 2,  
3
Supply Current  
VCC=5.5V, VINH=4.5V  
1, 3 VCC  
4.4  
1, 2,  
3
AC PARAMETER - 15pF  
(The following conditions apply to all the following parameters, unless otherwise specified.)  
AC: CL=15pF, RL=2k ohms Temp range: +25C  
tpLH Propagation Delay VCC=5.0V  
5
In to  
On  
10.0  
ns  
ns  
9
9
tpHL  
Propagation Delay VCC=5.0V  
5
In to  
On  
10.0  
AC PARAMETER - 50pF  
(The following conditions apply to all the following parameters, unless otherwise specified.)  
AC: CL=50pF, RL=2k ohms Temp range: -55C to +125C  
tpLH  
Propagation Delay VCC=5.0V  
2, 4 In to  
On  
2.0  
2.0  
2.0  
2.0  
15.0  
20.0  
17.0  
24.0  
ns  
ns  
ns  
ns  
9
2, 4 In to  
On  
10, 11  
9
tpHL  
Propagation Delay VCC=5.0V  
2, 4 In to  
On  
2, 4 In to  
On  
10, 11  
Note 1: Screen tested 100% on each device at -55C, +25C & +125C temperature, subgroups A1, 2,  
3, 7 & 8.  
Note 2: Screen tested 100% on each device at +25C temperature only, subgroup A9.  
4
MICROCIRCUIT DATA SHEET  
MNDM54LS00-X REV 1A0  
(Continued)  
Note 3: Sample tested (Method 5005, Table 1) on each MFG. lot at +25C, +125C & -55C  
temperature, subgroups A1, 2, 3, 7 & 8.  
Note 4: Sample tested (Method 5005, Table 1) on each MFG. lot at +25C, subgroup A9.  
Subgroups 10 & 11 are guaranteed, not tested.  
Note 5: Guaranteed, not tested.  
5
MICROCIRCUIT DATA SHEET  
MNDM54LS00-X REV 1A0  
Revision History  
Rev ECN # Rel Date Originator Changes  
1A0  
M0001200 05/14/98  
Linda Collins  
Initial release: MNDM54LS00-X Rev. 1A0 Added note 4 to  
the AC (50pF) notes reference column. Reworded note 4  
from "and periodically at +125C & -55C, subgroups 10 &  
11" to "Subgroups 10 & 11 are guaranteed, not  
tested". Changed the VOL test condition from VIL=2.0V  
to VIH=2.0V.  
6

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