EMB1499Q [TI]

EMB1499Q Bidirectional Current DC-DC Controller; EMB1499Q双向电流DC-DC控制器
EMB1499Q
型号: EMB1499Q
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

EMB1499Q Bidirectional Current DC-DC Controller
EMB1499Q双向电流DC-DC控制器

控制器
文件: 总24页 (文件大小:908K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
EMB1499Q  
www.ti.com  
SNOSCV7B NOVEMBER 2011REVISED SEPTEMBER 2013  
EMB1499Q Bidirectional Current DC-DC Controller  
Check for Samples: EMB1499Q  
1
FEATURES  
DESCRIPTION  
The EMB1499Q bidirectional current dc/dc controller  
IC works in conjunction with the EMB1428 switch  
matrix gate driver IC to support TI’s switch matrix  
based active cell balancing scheme for a battery  
management system. The EMB1499Q provides three  
PWM MOSFET gate signals to a bidirectional forward  
converter so that its output current, either positive or  
60-V Maximum Stack Operating Voltage  
Bidirectional Balancing Current  
Fully Synchronous Operation  
Active Clamp Signal  
250-kHz Switching Frequency  
Fault Detection Includes Two Separate UVLO  
Cells (One for Each External Supply), Primary  
and Secondary Side Current Limit, OVP/UVP  
Sense on Cell Being Charged, Thermal  
Shutdown, and Watchdog Timer  
negative, is regulated around  
a
user-defined  
magnitude. This inductor current is channeled by the  
EMB1428 through the switch matrix to the cell that  
needs to be charged or discharged. In a typical  
scheme, the EMB1499Q-based forward converter  
exchanges energy between a single cell and the  
battery stack to which it belongs, with a maximum  
stack voltage of up to 60 V. The switching frequency  
is fixed at 250 kHz. The EMB1499Q senses cell  
voltage, inductor current and stack current and  
provides protection from abnormal conditions during  
balancing.  
Balancing Current User-selectable Through  
External Voltage  
EMB1499Q is an Automotive Grade Product  
that is AEC-Q100 Grade 1 Qualified (–40°C to  
+125°C Operating Junction Temperature)  
APPLICATIONS  
The EMB1499Q also provides an active clamp timing  
signal to control an external FET driver for the  
primary-side active clamp FET. The EMB1499Q is  
enabled and disabled by the EMB1428. Fault  
conditions detected by the EMB1499Q are  
communicated to the EMB1428 through the DONE  
and FAULT pins.  
Li-Ion Battery Management Systems  
Hybrid and Electric Vehicles  
Grid Storage  
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
Copyright © 2011–2013, Texas Instruments Incorporated  
EMB1499Q  
SNOSCV7B NOVEMBER 2011REVISED SEPTEMBER 2013  
www.ti.com  
Typical Application  
Vstack  
Vstack  
­
°
EMB1499  
7-Cell  
Half-  
Stack  
GATE_LS  
GATE_HS2  
®
GATE_HS1  
VSENSE_HS  
VSENSE_LS  
MOSFET  
DRIVER  
PWM_CLAMP  
CELLPLUS  
+12V  
VINA  
VINP  
VINF  
PVINF  
Floating  
12V Supply  
PGNDF  
GNDF  
°
¯
VSET  
DAC  
EMB1428  
EN  
DIR  
EN  
DIR  
DIR_RT  
DONE  
SOURCE[11..0]  
GATE[11..0]  
DIR_RT  
DONE  
FAULT2  
FAULT1  
FAULT0  
FAULT2  
FAULT1  
FAULT0  
VDDCP  
CEXT2  
GNDA GNDP  
CEXT1  
CPU OR  
MCU  
SPI BUS  
CS  
SD0  
VSTACK  
SDI  
+12V  
VDD12V  
VDDP  
SCLK  
VDD5V  
VDDIO  
+5V  
+3.3V  
TO OTHER BALANCING CIRCUIT  
FAULT_INT  
RST  
GNDP GND  
Figure 1. Typical Application  
Connection Diagram  
1
2
28  
27  
26  
25  
24  
23  
22  
21  
20  
19  
18  
17  
16  
15  
VSENSE_HS  
CELLPLUS  
LOR  
VINF  
GNDF  
3
N/C  
4
TM  
GATE_HS2  
PGNDF  
GATE_HS1  
PVINF  
5
GNDA  
VSET  
6
7
WDOR  
EN  
EMB1499  
(Top View)  
8
VINP  
9
DIR  
GNDP  
10  
11  
12  
13  
14  
DIR_RT  
DONE  
FAULT0  
FAULT1  
FAULT2  
GATE_LS  
PWM_CLAMP  
GNDA  
VINA  
VSENSE_LS  
Figure 2. 28-Pin HTSSOP  
See PWP Package  
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SNOSCV7B NOVEMBER 2011REVISED SEPTEMBER 2013  
PIN DESCRIPTIONS  
Pin  
1
Name  
Description  
Application Information  
VSENSE_HS  
CELLPLUS  
Secondary side current sense input  
Connect to transformer side of secondary sense resistor  
2
Senses the cell voltage, used for  
OVP/UVP fault detection  
Connect to top of secondary side of the converter. This is the  
top of the cell being charged.  
3
4
LOR  
TM  
Fault latch override input  
Test mode input  
Grounded for normal operation.  
Grounded for normal operation.  
Connect to module ground at board level.  
This voltage is set by the user.  
5, 17  
6
GNDA  
VSET  
IC signal ground  
Control voltage for adjusting the  
balancing current  
7
8
WDOR  
EN  
Watchdog timer override  
Grounded for normal operation.  
Input from EMB1428, signals charge or  
discharge cycle to begin.  
Rising edge of this signal clears all fault latches, the DONE  
latch, and initiates charge or discharge current. Falling edge of  
this signal causes the charge current to ramp down to zero,  
then asserts the DONE signal, causing shutdown.  
9
DIR  
Input from EMB1428, determines the  
direction of the converter output current  
"High" indicates charge mode, "Low" indicates discharge  
mode.  
10  
11  
DIR_RT  
DONE  
Output to EMB1428, inverted copy of the Used as a handshake signal to ensure DIR signal has been  
DIR signal  
received correctly.  
Output to EMB1428, indicates that the  
balancing current has ramped down  
towards zero.  
When the EMB1499Q is disabled by toggling the EN pin low,  
the chip goes into a 'soft shutdown', ramping the charging  
current down within several hundred microseconds. When the  
current has ramped down, the EMB1499Q shuts down and the  
DONE signal latches high. The DONE latch is cleared at the  
next rising edge of the EN signal.  
12,13,14  
FAULT[0,1,2]  
Outputs to EMB1428, three bit digital fault If a fault condition is detected, the proper three bit word is  
code  
latched into the FAULT pins and the EMB1499Q is shut down.  
The FAULT pins are cleared by the rising edge of the EN input.  
15  
16  
VSENSE_LS  
VINA  
Primary side current sense input  
External 12V supply  
Connect to transformer side of primary sense resistor.  
Powers all internal circuitry besides the primary gate side  
driver. VINA and VINP should be connected together at the  
board level.  
18  
PWM_CLAMP  
Output, PWM signal used to control  
primary side active clamp (external driver  
required)  
19  
20  
21  
22  
GATE_LS  
GNDP  
VINP  
Output, gate signal for external primary  
side power FET  
IC power ground  
Provides ground return for primary side gate driver. Connect to  
board level ground.  
External 12V supply  
External floating 12V supply  
Powers the primary side gate driver. VINP and VINA should be  
connected together at the board level.  
PVINF  
This floating supply must be referenced to the bottom of the  
transformer secondary. Supplies power to the secondary side  
gate drivers. PVINF and VINF should be connected together at  
the board level.  
23  
24  
25  
GATE_HS1  
PGNDF  
Output, gate signal for external secondary  
side power FET  
Floating power ground  
Connect to secondary side of converter. Provides the ground  
return for the secondary side gate drivers.  
GATE_HS2  
Output, gate signal for external secondary  
side power FET  
26  
27  
N/C  
No connect  
No connect pin. Do not connect  
GNDF  
Floating signal ground  
Connected to secondary side of converter. Provides ground  
reference for all internal circuitry that floats with the transformer  
secondary except the secondary side gate drivers.  
28  
VINF  
External floating 12V supply  
This floating supply must be referenced to the bottom of the  
transformer secondary. Supplies power to all internal circuitry  
that floats with the transformer secondary except the  
secondary side gate drivers. PVINF and VINF should be  
connected together at the board level.  
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EMB1499Q  
SNOSCV7B NOVEMBER 2011REVISED SEPTEMBER 2013  
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These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam  
during storage or handling to prevent electrostatic damage to the MOS gates.  
ABSOLUTE MAXIMUM RATINGS(1)  
VINA, VINP to GND  
VINF, PVINF to GNDF  
GNDF to GND  
-0.5V to 15V  
-0.5V to 15V  
-0.5V to 60V  
-0.5V to 0.5V  
-0.5V to 0.5V  
-0.5V to 7.5V  
-0.5V to 7.5V  
-0.5V to 15V  
±2kV  
VSENSE_LS to GND  
VSENSE_HS to GNDF  
VSET to GND  
CELLPLUS to GNDF  
All other inputs to GND  
ESD Rating(2)  
Human Body Model  
Junction Temperature  
Storage Temperature  
Soldering Information  
150°C  
-65°C to 150°C  
(1) Absolute Maximum Ratings indicate limits beyond which damage to the device may occur, including inoperability and degradation of  
device reliability and/ or performance. Functional operation of the device and/or non-degradation at the Absolute Maximum Ratings or  
other conditions beyond those indicated in the recommended Operating Ratings is not implied. The recommended Operating Ratings  
indicate conditions at which the device is functional and should not be operated beyond such conditions.  
(2) The human body model is a 100pF capacitor discharged through a 1.5 kresistor into each pin. Test method is per JESD22–A114.  
OPERATING RATINGS  
VINA, VINP to GND  
VINF, PVINF to GNDF  
GNDF to GND  
10V to 14V  
10V to 14V  
0V to 56V  
VSENSE_LS to GND  
VSENSE_HS to GNDF  
VSET to GND  
-0.2V to 0.2V  
-0.2V to 0.2V  
1V to 2.2V  
0V to 6V  
CELLPLUS to GNDF  
All other inputs to GND  
Junction Temperature (TJ)  
0V to 14V  
-40°C to 125°C  
4
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EMB1499Q  
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SNOSCV7B NOVEMBER 2011REVISED SEPTEMBER 2013  
ELECTRICAL CHARACTERISTICS  
Limits in standard type are for TJ = 25°C only; limits in boldface type apply over the junction temperature (TJ) range of 40°C  
to +125°C. Minimum and Maximum limits are specified through test, design, or statistical correlation. Typical values represent  
the most likely parametric norm at TJ = 25°C, and are provided for reference purposes only. For all tests, VINA = VINP =  
VINF = PVINF = 12V unless otherwise specified.  
Symbol  
Parameter  
Conditions  
Min  
Typ(1)  
Max  
Units  
Feedback Voltage  
VSENSE_HS  
Feedback Voltage  
VSET = 2V  
45  
24  
50  
30  
55  
36  
mV  
mV  
VSET = 1.2V  
Switching Parameters  
FSW  
Switching Frequency  
220  
250  
91  
290  
kHz  
%
DMAX  
Maximum Duty Cycle  
Charge  
Direction  
Discharge  
Direction  
91  
4
%
%
%
DMIN  
Minimum Duty Cycle  
Charge  
Direction  
Discharge  
Direction  
3
Operating Thresholds  
UVLO  
Under-voltage Lockout  
VINA, VINP,  
VINF, PVINF  
Rising  
10.8  
V
V
VINA, VINP,  
VINF, PVINF  
Falling  
5
VEN_TH  
Enable Threshold  
EN Rising  
EN Falling  
DIR Rising  
DIR Falling  
1.55  
2.75  
V
V
V
V
0.45  
2.2  
VDIR_TH  
Direction Threshold  
Quiescent Currents  
IQ_VINA  
VINA Quiescent Current  
(Operating)  
VSET = 2V,  
VSENSE_HS =  
0V  
2
2.8  
mA  
VINA Quiescent Current  
(Shutdown)  
EN = 0V  
<1  
<1  
2.3  
2.3  
1.9  
µA  
µA  
IQ_VINP  
IQ_VINF  
VINP Quiescent Current  
(Shutdown)  
VEN = 0V  
VINF Quiescent Current  
(Operating)  
VSET = 2V,  
VSENSE_HS =  
0V  
1.5  
mA  
VINF Quiescent Current  
(Shutdown)  
EN = 0V  
<1  
<1  
18  
2
µA  
µA  
µA  
IQ_PVINF  
VPINF Quiescent Current  
(Shutdown)  
EN = 0V  
2.5  
30  
IQ_CELLPLUS  
CELLPLUS Quiescent Current  
(Operating)  
VSET = 2V,  
VSENSE_HS =  
0V  
Fault Detection  
VCL_LS  
Primary Side Current Limit  
Secondary Side Current Limit  
Cell OVP Threshold Voltage  
100  
95  
132  
136  
5.5  
170  
185  
7
mV  
mV  
V
VCL_HS  
VOVP  
CELLPLUS  
Rising  
4.5  
CELLPLUS  
Falling  
5
V
(1) Typical specifications represent the most likely parametric norm at 25°C operation.  
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ELECTRICAL CHARACTERISTICS (continued)  
Limits in standard type are for TJ = 25°C only; limits in boldface type apply over the junction temperature (TJ) range of 40°C  
to +125°C. Minimum and Maximum limits are specified through test, design, or statistical correlation. Typical values represent  
the most likely parametric norm at TJ = 25°C, and are provided for reference purposes only. For all tests, VINA = VINP =  
VINF = PVINF = 12V unless otherwise specified.  
Symbol  
Parameter  
Conditions  
Min  
Typ(1)  
Max  
Units  
VUVP  
Cell UVP Threshold Voltage  
CELLPLUS  
Rising  
1.17  
V
CELLPLUS  
Falling  
0.55  
0.74  
0.95  
V
tWD  
Watchdog Timeout  
Thermal Shutdown  
8
s
TSD  
165  
°C  
Output Drivers  
RON_LS_HIGH  
Primary Side Driver Pull-up Output IGATE_LS =  
3.6  
1.1  
7
5.5  
1.7  
11  
8.4  
3.2  
16  
3.2  
16  
3
Resistance  
100mA  
RON_LS_LOW  
RON_HS1_HIGH  
RON_HS1_LOW  
RON_HS2_HIGH  
RON_HS2_LOW  
Primary Side Driver Pull-down  
Output Resistance  
IGATE_LS =  
100mA  
Secondary Side Driver (HS1) Pull- IGATE_LS =  
up Output Resistance 100mA  
Secondary Side Driver (HS1) Pull- IGATE_LS =  
down Output Resistance 100mA  
1.1  
7
1.7  
11  
Secondary Side Driver (HS2) Pull- IGATE_LS =  
up Output Resistance 100mA  
Secondary Side Driver (HS2) Pull- IGATE_LS =  
down Output Resistance 100mA  
0.9  
1.5  
6
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SNOSCV7B NOVEMBER 2011REVISED SEPTEMBER 2013  
VINA  
VINF  
VDDI  
VDDIF  
PVINF  
PWM_HS1  
VSENSE_HS  
GATE_HS1  
VSENSE_LS  
PWM_HS2  
GATE_HS2  
EN  
VSET  
DIR  
PGNDF  
Controller  
BIAS  
VREF  
VINP  
DIR (HS and LS)  
CLK  
FAULT  
PWM_LS  
GATE_LS  
Support  
Circuitry  
ILIMIT (HS and LS)  
CELLPLUS  
TM  
(Bias, LDOs, UVLO,  
Fault Logic)  
PWM_CLAMP  
GNDP  
WDOR  
LDOR  
DONE  
DIR_RT  
FAULT[2:0]  
GNDA  
GNDF  
Figure 3. Top-level Block Diagram  
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Upper Voltage Domain  
(referenced to GNDF)  
VDDIF  
(From  
Support  
Circuitry)  
DIR_HS  
Error Amp  
(From  
Support  
Iref  
Circuitry)  
(From  
Support  
Circuitry)  
Iref  
VSENSE_HS  
Secondary Side  
Current Sense  
Amp  
VREF  
2.5V  
Trim  
Iref  
GNDF  
Buffer  
IsenseHS  
ILIMIT_HS  
(From  
Support  
Circuitry)  
Current Limit  
Comparators  
VDDI  
ILIMIT_LS  
Primary Side  
Current Sense Amp  
200 mV  
VSENSE_LS  
(From  
Support  
Circuitry)  
PWM_HS2  
IsenseLS  
(TO  
DRIVERS)  
DIR_LS  
Isense  
Icontrol  
PWM_HS1  
PWM  
Logic  
Timing  
Generator  
Artificial Ramp  
PWM Comparator  
PWM_LS  
Iramp  
250 kHz  
PWM_CLAMP  
GNDA  
CLK  
(To Support  
Circuitry)  
Figure 4. Controller Block Diagram  
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CELLPLUS  
VINA  
VDDIF  
OVP/UVP  
LDO  
UVLO  
V
V
OVP  
L/S  
DIR_HS  
Upper Voltage Domain  
(referenced to GNDF)  
(TO  
CONTROLLER)  
UVP  
GNDF  
VNA  
VDDI  
LDO  
UVLO  
EN  
DIR_RT  
DIR_LS  
DONE Signal  
DIR  
(TO  
OVP  
UVP  
CONTROLLER)  
Q
FAULT2  
D
1
1
Thermal Fault  
Thermal  
DFF  
Shutdown  
CLR  
LOR  
FAULT1  
D
Q
ILIMIT_HS Fault  
ILIMIT_LS Fault  
ILIMIT_HS  
ILIMIT_LS  
Fault  
Encoder  
ILIMIT  
Counter  
DFF  
CLR  
(FROM CONTROLLER)  
(FROM CONTROLLER)  
1
1
D
Q
FAULT0  
DONE  
Watchdog T/O  
N
CLK  
Freq/2  
DFF  
CLR  
WDOR  
D
Q
DFF  
CLR  
Startup Circuitry  
EN  
Istartup  
Adjust Line  
VSET  
VREF  
VDDI  
Ideal Diode  
Vd = 0V  
(TO  
Ishutdown  
Cstart  
Latch Clear  
CONTROLLER)  
100 mV  
~10 Ps  
GNDA  
Figure 5. Support Circuitry Block Diagram  
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APPLICATION INFORMATION  
The EMB1499Q and the EMB1428 work in conuction to control an active balancing circuit for up to 7 battery cells  
connected in series. See Typical Application (Figure 1) for the typical system architecture. The EMB1499Q is a  
PWM controller that regulates the inductor current in the bidirectional forward converter. The EMB1428 provides  
12 floating gate drivers that are needed for the control of the FET switch matrix in the circuit. In a typical  
application, the forward converter has the inductor side (also called “secondary side”, “floating side” or “high  
side”) connected to the switch matrix and the other side (also called “primary side”, “non-floating side” or “low  
side”) to the battery stack. With such an arrangement, every cell balancing action is an energy exchange  
between a cell and the whole stack. The EMB1499Q can handle up to 56V between the top cell’s negative  
terminal and the bottom of the stack (bottom cell negative terminal).  
Driving the EN pin high initiates the normal operating cycle. Once EN goes high, the EMB1499Q drives the  
DONE pin low. A normal operation cycle begins when the EMB1499Q DONE pin is driven low upon seeing the  
EN pin go high. The IC will then set the DIR_RT pin to the logic opposite of the DIR pin. This completes the initial  
handshaking with the EMB1428. The EMB1499Q will then start toggling the gate signals and the PWM_CLAMP  
signal and ramp the inductor current toward the target current magnitude set by the VSET pin, and in the polarity  
set by the DIR pin. After a few seconds (less than 8 sec.) of constant current operation, the EMB1499Q sees its  
EN pin de-asserted by the EMB1428 and it will immediately start to ramp down the inductor current toward zero.  
When the inductor current is typically 5% of steady state value, the EMB1499Q will pull the DONE pin high to the  
EMB1428 that the forward converter has shut off. This completes one normal operation cycle for the EMB1499Q.  
During operation, the DONE pin will be driven high and the converter shutdown if the following abnormalities are  
detected during normal operation: over current, over voltage, under voltage, watchdog timeout, and thermal  
shutdown. The EMB1428 will then assert its FAULT_INT to inform the system controller of this EMB1499Q Error  
and read the fault code on the EMB1499Q FAULT pins.  
To provide extra protection to the battery management system, the EMB1499Q has a built-in watchdog timer and  
will automatically shut down the forward converter after 8 seconds of continuous operation. To keep charging or  
discharging the same cell for more than 8 seconds, the microcontroller has to issue a stop and start command at  
least once every 8 seconds.  
The EMB1499Q needs two separate 12V supplies (10V to 14V) to function. One of the 12V supplies is  
referenced to the stack ground and the other the floating ground.  
Block Descriptions  
This section contains descriptions of the individual circuit blocks in the EMB1499Q.  
Voltage Domain Definitions  
The EMB1499Q has been divided into two voltage domains. In this document the two domains are called the  
upper voltage domain and the lower voltage domain.  
The upper voltage domain refers to all circuitry that is referenced to GNDF, which is the floating ground. The  
floating ground is connected to the bottom of the secondary side of the isolated converter. This is also the  
negative side of the current cell being charged. The circuitry in this domain is powered by VINF, which is an  
external floating supply. There is also an internal regulator powered from VINF that creates an internal floating  
5V rail.  
The lower voltage domain refers to all circuitry that is ground referenced. This domain is required to interface  
with all signals to and from the microcontroller and EMB1428, as these signals are ground referenced. Most of  
the circuitry in this domain is powered either directly from VINA or from an internal 5V rail powered by VINA. The  
primary side driver is powered from VINP.  
All interfaces between the upper and lower voltage domains require level shift circuitry implemented internally  
within the EMB1499Q.  
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FET Gate Drivers  
The EMB1499Q includes one primary side gate driver and two secondary side gate drivers. A logic signal for the  
driver of a primary side active clamp FET is also available. Input PWM signal for each of the three gate drivers is  
level shifted from the internal digital supply rail (VDD) to the external power rail, either PVINF or VINP. Each  
driver output buffer contains shoot through protection. All drivers are forced into an off state if any power rail  
goes lower than the UVLO threshold.  
Timing Generator  
Depending on the desired direction of the balancing current (as dictated by the state of the DIR pin), the timing  
generator will adjust the relative timing of the gate signals and PWM_CLAMP signal.  
Based on the state of the DIR pin, the internal logic of the EMB1499Q assigns one of the gate signals as the  
“control” signal and the others as the “synchronous” signals. The “control” signal is used to establish the required  
duty cycle and the “synchronous” signals are timed relative to the “control” signal with the proper dead times or  
overlap times. These two signal types are also treated differently by the internal logic for the purposes of startup,  
shutdown, and fault handling.  
Figure 6 and Figure 7 show typical relative timings for the gate signals in both balancing directions. Also noted in  
each figure is the assignment of the “control” signal for the balancing current direction. Note that these diagrams  
are ideal, indicating negligible capacitive loading on the pins. In reality, these gate signals would have finite rise  
and fall times that are dictated by the CG of the external MOSFET and the output resistance of the internal driver  
(consult the ELECTRICAL CHARACTERISTICS for the RON data).  
GATE_LS  
(Control)  
95 ns  
115 ns  
GATE_HS1  
95 ns  
75 ns  
GATE_HS2  
115 ns  
85 ns  
PWM_CLAMP  
Figure 6. Charge Direction (DIR high)  
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115 ns  
95 ns  
GATE_LS  
GATE_HS1  
(Control)  
GATE_HS2  
40 ns  
40 ns  
85 ns  
100 ns  
PWM_CLAMP  
Figure 7. Discharge Direction (DIR low)  
It should be noted here that for proper operation of the active clamp, an external delay network is required in  
series with the external active clamp driver that delays the turn-on transition of the active clamp transistor (falling  
edge of the PWM_CLAMP signal) by a specified amount. This is discussed in detail in the Application Hints.  
PWM Controller Blocks  
The DC voltage appearing at VREF (determined by applied to the VSET pin) sets the desired inductor current.  
As can be seen in the Controller Block Diagram (Figure 4), the VREF voltage is transformed into a GNDF  
referenced voltage through a current mirror (Iref, 25 μA) and that voltage is compared with the voltage across the  
secondary side sense resistor. The difference between the two signals is fed to the error amplifier as the error  
signal. The amplified and filtered/ compensated error signal becomes the current command signal and is  
compared at the PWM comparator with sensed inductor current. The feedback loop forces the error toward zero  
which means the inductor current will be regulated at the desired level set by VREF. The current sense amplifier  
that senses the inductor current switches polarity when there is a change in the DIR logic level, so as to achieve  
the bidirectional operation. There is also an internal soft start voltage ramp that forces a gradual turn-on and turn-  
off of the inductor current. The final reference appearing at the error amplifier is determined by the lower of the  
said soft start voltage ramp and the voltage at VREF.  
Current Limit Comparators  
As shown in the Controller Block Diagram (Figure 4), both primary and secondary side currents of the forward  
converter are internally turned into current sources by the current sense amplifiers. The current sources flow into  
two resistors whose voltages are then compared with a 200mV reference by two current limit comparators. The  
trigger point for both primary and secondary currents is typically 134mV across each sense resistor.  
PWM Comparator  
The EMB1499Q employs a Peak Current Mode control method. Basically the amplified inductor current  
(IsenseHS) is compared to the current command (Icontrol) at the PWM comparator, generating the PWM signal  
for gate drivers. To prevent a potential half-switching frequency (sub-harmonic) oscillation issue associated with  
peak current control, an artificial ramp is added on top of the sensed inductor current before the latter is  
compared with the current command.  
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Startup Circuitry  
The startup circuitry (Figure 5) performs three functions. The ramp generator charges an internal Cstart capacitor  
during startup, generating a gradually increasing voltage ramp until the voltage reaches VSET value and is  
clamped by it. This voltage ramp is used by the controller block to generate the ramp in the current reference  
and bring up the inductor current in a soft start manner. The ramp generator also discharges the internal Cstart  
capacitor during shutdown. The down slope in the VREF voltage as a result of the discharge will cause the  
inductor current to ramp down gradually. Besides the ramp generator, there is also a comparator that will toggle  
if the Cstart voltage dips below 100mV. This is to flag that the shutdown is considered complete. The startup  
circuitry also generates a starthold pulse, which is a 10 μs long pulse that is activated upon the assertion of the  
EN pin. While this pulse is active, the DONE and FAULT pins are held in the clear state, and the part is not  
allowed to switch.  
UVLO Blocks  
The EMB1499Q has two under-voltage lockout (UVLO) blocks each monitoring one external 12V supply. Block  
UVLO_LS monitors VINA with respect to GNDA and block UVLO_HS monitors VINF with respect to GNDF.  
UVLO_HS will not be activated until UVLO_LS shows that VINA has crossed the UVLO rirsing threshold voltage.  
UVLO_LS is activated if either EN is high or DONE is low. When UVLO_LS has a positive output, bias current is  
sent to the UVLO_HS to activate it. Once both UVLOs have positive outputs, the internal chip enable signals are  
activated, internal rails are powered up and gate drivers are unlocked.  
Enable/Shutdown Sequencing  
Shutdown Behavior  
The standard shutdown sequence can be described as follows:  
1. Initial State: DONE low, EN high, part operating in steady state.  
2. The EMB1428 drops EN signal low.  
3. Inductor current ramps down (typically 300 µs).  
4. When inductor current has ramped sufficiently low, the EMB1499Q shuts down and DONE signal is asserted  
high to tell the EMB1499Q that the shutdown process has finished, and can accept new commands.  
5. DONE signal remains latched high, and is not cleared until the next enable sequence.  
Enable Behavior  
The standard enable sequence can be described as follows:  
1. Initial State: DONE high, EN low, external supplies above UVLO voltage (from previous shutdown  
sequence).  
2. The EMB1428 asserts EN high.  
3. EN activates the UVLO blocks, which then allow the internal rails to power up.  
4. Internal “starthold” pulse remains high for first 10us, clears DONE latch and all fault latches.  
5. When “starthold” drops low, part is allowed to start up normally, and all output latches are now free to be  
clocked.  
Fault Detection and Fault Codes  
The fault detection circuitry of the EMB1499Q consists of a three-bit encoder which has as its input six different  
fault modes. Its output is a digital word which is passed to the system microcontroller through the EMB1428. The  
fault codes (FAULT[2:0])that are passed can be read as follows:  
000 = No Fault 001 = Primary Side Current Limit  
010 = Secondary Side Current Limit  
011 = Thermal Shutdown  
100 = Watchdog Timeout  
101 = UVP Fault  
110 = OVP Fault The fault detection process can be described as follows:  
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1. Fault signals passed into the three-bit encoder  
2. Internal fault signal passed to PWM logic and all gates are forced off and latched  
3. Internal fault signal passed to the soft start comparator and asserts start-low, and therefore latches DONE  
output high  
4. Three-bit fault word is level shifted to the external supply, and external fault code is latched into output buffer  
for FAULT 0..2 pins.  
5. The EMB1428 reads the fault code on the FAULT 0..2 pins and drops EN voltage, shutting the EMB1499Q  
down  
6. Fault code and DONE signal remain latched until next startup cycle  
Secondary OVP/UVP  
This block senses the voltage of the cell being charged/discharged. If this voltage is outside a predefined range,  
a fault is detected and the IC is disabled.  
Current Limit Counter  
The current limit counter monitors both the primary and secondary side current limit signals. The counter is reset  
every 32 clock pulses. If a specified number of current limit events are detected (4 for primary side and 8 for  
secondary side) within this 32 clock pulse window, a fault is flagged and the part is disabled.  
Watchdog Timer  
The purpose of this block is to create a maximum running time of 8 seconds for the chip. This timer is created by  
using a string of flip-flops to count clock pulses. After 221 clock pulses (typically 8 seconds at 250kHz switching  
frequency), if EN is still high, a fault is flagged and the IC is shut down.  
Thermal Shutdown  
This block senses the internal temperature of the die and flag output if that temperature exceeds a  
predetermined threshold, TSD. If this fault flag is activated, the IC will shut down and charging operation will  
cease.  
Application Hints  
Setting the Balancing Current (VSET and Secondary Sense Resistor)  
If the secondary side of the forward converter is connected to battery cells via a switch matrix, the cell balancing  
current is equal to the steady state value of the main inductor current. Two external parameters determine the  
balancing current (Ibalancing): the voltage at the VSET pin and the secondary side sense resistance  
(RSENSE2). The voltage at the VSET pin controls the reference voltage at the error amplifier, and therefore the  
voltage at the VSENSE_HS pin. The equation for selecting the secondary side sense resistance is:  
VSENSEHS  
RSENSE2  
=
Ibalancing  
The equation for selecting the secondary side sense resistance is:  
VSET  
40  
VSENSE_HS  
=
Supported values for VSET range from 1V to 2.2V. However, the EMB1499Q is factory trimmed at VSET = 2V.  
Therefore, it is recommended to use VSET = 2V for highest balancing current accuracy. See ELECTRICAL  
CHARACTERISTICS for specified tolerances on VSENSE_HS when for VSET = 2V and 1.2V. Due to switching  
noise present at the secondary side current sense resistor, it is possible that current values are slightly different  
for different directions of balancing, even if VSET is constant. In such a case, it is recommended that a  
calibration be conducted at the system level so that a slightly different VSET is programmed when changing the  
direction of balancing.  
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Primary Sense Resistor Selection  
The primary sense resistor should be chosen in conjunction with the secondary sense resistor so that the ratio  
between the two resistors is approximately equal to the transformer turns ratio. For example if the secondary  
sense resistor is 10m, and the transformer turns ratio is 3.5:1 (recommended for a 14 cell application – see the  
Transformer Selection section), the primary sense resistor should be chosen to be approximately 35m.  
Inductor Selection  
The value of the inductor, along with the converter input/output voltages, determines the AC ripple of the inductor  
current. A good practice is to choose an inductance value so that the peak-to-peak ripple falls somewhere  
between 20% and 40% of the steady state balancing current during typical operation. If the transformer turns  
ratio is selected properly (see the Transformer Selection section), and assuming a typical 250kHz switching  
frequency, then the equation relating inductance to current ripple for the EMB1499Q can be reduced to:  
L = 3 x 10-6sec-1 x VCELL x ΔiL  
where VCELL is the typical cell voltage in the given application, and ΔiL is the peak-to-peak current ripple value.  
The EMB1499Q utilizes peak current mode control, which means that the inductor current is sampled in real time  
and used for loop control. In this type of control method, the slope of the sensed inductor current ripple is an  
important parameter. This sensed slope is inversely proportional to the inductor value, and directly proportional to  
the gain of the current sense path. In other words:  
dISENSE RSENSE2Ai  
D
dt  
L
Where ISENSE is the sensed inductor current, RSENSE2 is the secondary side sense resistor value, and Ai is the  
gain of the internal current sense amplifier.  
In order to ensure stability of the internal current sense loop, it is recommended that the slope of the sensed  
inductor current remain somewhat constant if external component values are changed. From the above equation,  
this means that if the value of the secondary sense resistor is increased (possibly to achieve lower balancing  
current), then the value of the output inductor should be increased with approximately the same scale.  
In addition, it is important to choose an inductor that can support the peak output current without saturating.  
Inductor saturation will cause a sudden reduction in the inductance value, and cause the converter to operate  
incorrectly. It is also recommended to choose an inductor with minimal DC winding resistance in order to  
minimize conduction losses and maximize efficiency.  
Transformer Selection  
The EMB1499Q is designed to work optimally with a transformer turns ratio of 3.5:1 when operating within a  
stack of 14 cells. In order to maintain proper peak currents and voltage stresses on the drains of the power  
MOSFETs, it is recommended that this relationship between turns ratio and number of cells be maintained. In  
other words, follow the following equation when choosing a turns ratio for the transformer:  
n = 0.25 x NumCells  
In the typical application, the forward transformer for the EMB1499Q has a minimum primary side inductance of  
190µH. To ensure proper operation, it is recommended to use this as the minimum inductance specification for a  
14 cell solution. It is reasonable to scale this inductance with the number of cells in the stack. For example, for a  
7 cell stack a minimum primary inductance of 95µH can be used. It is also recommended that the leakage  
inductance of the transformer be less than or equal to 1% of the winding inductance.  
In a typical 5A design, the primary side DC winding resistance should be less than typical 60m, and the  
secondary side resistance typical 12m. In order to ensure reasonable efficiency and to ensure properly gauged  
wires are used in the transformer, it is recommended to follow this specification. It is reasonable to scale these  
resistance specifications for constant DC power dissipation with different balancing currents.  
Power MOSFET Selection  
For optimal balance transfer efficiency, the power MOSFETs should be selected to provide the lowest possible  
conduction and switching power losses. For the purpose of MOSFET selection, a good criterion to use is the  
tradeoff between switch on resistance (RDSON) and gate charge (QG). These parameters can be used to estimate  
the total conduction and gate charge losses for each MOSFET, which should be minimized:  
PLOSS = IRMS2 x RDSON + QG x FSW  
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Where FSW is the switching frequency of the EMB1499Q (typically 250kHz), and IDS is the RMS drain current in  
each MOSFET during steady state. The following equations can be used to provide a first order estimation of the  
RMS drain current in each MOSFET: Primary switching NMOS:  
Ibalancing  
IRMS  
|
2 x NumCells  
Secondary switching NMOS:  
Ibalancing  
IRMS  
|
2
Active Clamp PMOS:  
IRMS 25ms x VCELL_MAX  
Where VCELL_MAX is the maximum operating voltage of any cell in the stack.  
In addition to power dissipation concerns, and assuming that the transformer turns ratio has been chosen  
correctly (see the Transformer Selection section), the power MOSFETs have the following additional  
requirements:  
All power MOSFETS must have absolute max rating for VGS of at least 20V  
Primary MOSFETS (switching and active clamp) must have drain-source voltage rating of at least 2.5 times  
the maximum operating stack voltage.  
Secondary MOSFETs must have a drain-source voltage rating of at least 30V, gate resistance no more than  
3, and be avalanche robust (i.e., have an Avalanche Energy rating (EAR) specified in the datasheet).  
Input Capacitor Selection  
Ceramic capacitors are required for proper operation due to their low ESR (equivalent series resistance). The  
voltage rating of the capacitor should exceed the maximum stack voltage in an application with proper de-rating.  
For example, in a 14 cell Li-ion application, the maximum stack voltage would be approximately 60V. Therefore,  
a 100V rated capacitor would be recommended. It is advisable to use at least 6.6µF of capacitance. Optimum  
performance will be achieved by using multiple smaller value capacitors in parallel to minimize series resistance  
and inductance.  
For proper performance, X5R or X7R ceramics are recommended.  
Output Capacitor Selection  
As with the input capacitors, ceramic capacitors are required (X5R or X7R recommended). Since the maximum  
operating cell voltage of a Li-ion cell is 4.2V, a voltage rating of 6.3V or higher is recommended.  
It is required to use at least 10µF of capacitance. Optimum performance will be achieved by using multiple  
smaller value capacitors in parallel to minimize series resistance and inductance.  
Clamp Capacitor Selection  
As with the input and output capacitors, a ceramic capacitor is also required for the clamp capacitor. Assuming  
that the transformer turns ratio has been chosen correctly (see the Transformer Selection section), the voltage  
rating of the capacitor should be at least 2.5 times the maximum operating voltage of the battery stack.  
For example, in a 14 cell solution with a maximum operating cell voltage of 4.2V, the maximum operating voltage  
of the stack is 58.8V. Therefore, the voltage rating of the capacitor should be at least 2.5 * 58.8V = 147V. So for  
a 14 cell solution, a voltage rating of 200V (the next closest common voltage rating) is recommended. The  
recommended capacitance value for the clamp capacitor is 0.1µF.  
Active Clamp Driver  
The active clamp driver path consists of a delay circuit, gate driver, and a passive level shifting network. See  
Figure 8 below for the recommended circuit.  
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The delay network should provide approximately 300ns to 400ns delay to the turn-on transition of the clamp  
PFET, and minimal delay to the turn-off transition. The recommended driver for this application is the EMB1412  
from Texas Instruments. It is important to configure the driver in an inverting configuration. A passive level-  
shifting network is required in order to provide a negative gate voltage for the clamp PFET. It consists of a 0.1µF  
AC coupling capacitor, a clamping diode, and a 1kresistor to provide a DC path to ground for the gate of the  
clamp PFET.  
Level Shifting Network  
Gate Driver  
Level Shifting Network  
+12V  
25.5 k:  
0.1 PF  
PWM_CLAMP  
Signal From  
EMB1499  
To Clamp  
FET  
U1  
U2  
47 pF  
Figure 8. Active Clamp Driver Circuit  
Continuous Balancing Operation  
If it is desired to continually balance a particular cell for longer than the internal watchdog timeout of the  
EMB1499Q (typically 8 seconds), the EN pin of the EMB1499Q needs to be toggled within a period less than 8  
seconds.  
At the system level, this can be done by sending a “stop balancing” command to the EMB1428 gate driver chip,  
followed by “start balancing” command prior to the EMB1499Q timeout. Simply sending a new “start balancing”  
command without first sending the “stop balancing” command will not cause the EN pin of the EMB1499Q to  
toggle. If the EN pin does not toggle, the balancing will time out.  
PCB Layout Recommendations  
Besides following general switching power supply layout practices, below are recommendations for the  
EMB1499Q:  
1. Run the gate traces in parallel with their associated ground planes for as much of the total runs as possible  
2. Keep current sensing traces away from high dv/dt nodes such as the drains of power FETs  
3. Place adequate copper underneath power FETs to help with thermal dissipation  
4. Place numerous 8-mil vias in the PCB pad beneath the EMB1499Q and connect them to the corresponding  
ground plane(s) on all layers to help with thermal dissipation  
5. Place the EMB1499Q within a couple inches of the power FETs to reduce board parasitics.  
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REVISION HISTORY  
Changes from Revision A (May 213) to Revision B  
Page  
Changed package drawing from PW to PWP, and package type from TSSOP to HTSSOP .............................................. 2  
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PACKAGE OPTION ADDENDUM  
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31-Oct-2013  
PACKAGING INFORMATION  
Orderable Device  
EMB1499QMH/NOPB  
EMB1499QMHE/NOPB  
EMB1499QMHX/NOPB  
Status Package Type Package Pins Package  
Eco Plan  
Lead/Ball Finish  
MSL Peak Temp  
Op Temp (°C)  
-40 to 125  
Device Marking  
Samples  
Drawing  
Qty  
(1)  
(2)  
(6)  
(3)  
(4/5)  
ACTIVE  
HTSSOP  
HTSSOP  
HTSSOP  
PWP  
28  
28  
28  
48  
Green (RoHS  
& no Sb/Br)  
CU SN  
CU SN  
CU SN  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
EMB1499  
QMH  
ACTIVE  
ACTIVE  
PWP  
PWP  
250  
Green (RoHS  
& no Sb/Br)  
-40 to 125  
EMB1499  
QMH  
2500  
Green (RoHS  
& no Sb/Br)  
-40 to 125  
EMB1499  
QMH  
(1) The marketing status values are defined as follows:  
ACTIVE: Product device recommended for new designs.  
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.  
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.  
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.  
OBSOLETE: TI has discontinued the production of the device.  
(2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability  
information and additional product content details.  
TBD: The Pb-Free/Green conversion plan has not been defined.  
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that  
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.  
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between  
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.  
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight  
in homogeneous material)  
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.  
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.  
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation  
of the previous line and the two combined represent the entire Device Marking for that device.  
(6) Lead/Ball Finish - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead/Ball Finish values may wrap to two lines if the finish  
value exceeds the maximum column width.  
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information  
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and  
Addendum-Page 1  
PACKAGE OPTION ADDENDUM  
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31-Oct-2013  
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.  
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.  
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.  
Addendum-Page 2  
PACKAGE MATERIALS INFORMATION  
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31-Oct-2013  
TAPE AND REEL INFORMATION  
*All dimensions are nominal  
Device  
Package Package Pins  
Type Drawing  
SPQ  
Reel  
Reel  
A0  
B0  
K0  
P1  
W
Pin1  
Diameter Width (mm) (mm) (mm) (mm) (mm) Quadrant  
(mm) W1 (mm)  
EMB1499QMHE/NOPB HTSSOP PWP  
EMB1499QMHX/NOPB HTSSOP PWP  
28  
28  
250  
178.0  
330.0  
16.4  
16.4  
6.8  
6.8  
10.2  
10.2  
1.6  
1.6  
8.0  
8.0  
16.0  
16.0  
Q1  
Q1  
2500  
Pack Materials-Page 1  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
31-Oct-2013  
*All dimensions are nominal  
Device  
Package Type Package Drawing Pins  
SPQ  
Length (mm) Width (mm) Height (mm)  
EMB1499QMHE/NOPB  
EMB1499QMHX/NOPB  
HTSSOP  
HTSSOP  
PWP  
PWP  
28  
28  
250  
210.0  
367.0  
185.0  
367.0  
35.0  
35.0  
2500  
Pack Materials-Page 2  
MECHANICAL DATA  
PWP0028A  
MXA28A (Rev D)  
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